NSC SCANPSC110FE-QV, SCANPSC110FFMQB, SCANPSC110FJ-QV, SCANPSC110FLMQB, SCANPSC110FW-QV Datasheet

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SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

General Description

The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANPSC110F Bridge supports up to 3 local scan rings which can be accessed individually or combined serially.Addressingis accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.

Features

n True IEEE1149.1 hierarchical and multidrop addressable

capability

n The 6 slot inputs support up to 59 unique addresses, a

Broadcast Address, and 4 Multi-cast Group Addresses

n 3 IEEE 1149.1-compatible configurable local scan ports n Mode Register allows local TAPs to be bypassed,

selected for insertion into the scan chain individually, or serially in groups of two or three

n 32-bit TCK counter n 16-bit LFSR Signature Compactor n Local TAPs can be tri-stated via the OE input to allow

an alternate test master to take control of the local TAPs

n The IP version of this device supports features not

described in this datasheet such as 8 slot inputs for enhanced address capability and additional instructions. For a completed description of the additional instructions supported, refer to the SCANPSC110 supplemental datasheet.

Connection Diagrams

TRI-STATE®is a registeredtrademark of National Semiconductor Corporation.

28-Pin

CDIP and Flatpak

DS100327-1

Pin Assignment for LCC

DS100327-2

October 1999

SCANPSC110F SCAN Bridge

Connection Diagrams (Continued)

Order Number Description

SCANPSC110FFMQB Military Flatpak SCANPSC110FDMQB Military DIP SCANPSC110FLMQB Military Leadless Chip Carrier

Names

Description

TCK

Backplane Test Clock Input

TMS

Backplane Test Mode Select Input

TDI

Backplane Test Data Input

TDO

Backplane Test Data Output

TRST

Asynchronous Test Reset Input (Active low)

(0,5)

Address Select Port

Local Scan Port Output Enable (Active low)

TCK

L(1–3)

Local Port Test Clock Output

TMS

L(1–3)

Local Port Test Mode Select Output

TDI

L(1–3)

Local Port Test Data Input

TDO

L(1–3)

Local Port Test Data Output

Table of Contents

1. GLOSSARY OF TERMS: 2

2. DETAILED PIN DESCRIPTION TABLE: 3

3. OVERVIEW OF SCAN BRIDGE FUNCTIONS: 4 A. SCANPSC110F Bridge Architecture: 4 B. SCANPSC110F Bridge State Machines: 4

4. TESTER/SCANPSC110F BRIDGE INTERFACE: 8

5. REGISTER SET: 8

6. ADDRESSING SCHEME: 8

7. HIERARCHICAL TEST SUPPORT: 9

8. LEVEL 1 PROTOCOL: 9 A. Addressing Modes: 9 B. Direct Addressing: 10 C. Broadcast Addressing: 10 D. Multi-Cast Addressing: 10

9. LEVEL 2 PROTOCOL: 11 A. Level 2 Instruction Types: 11

B. Level 2 Instruction Descriptions: 12

10. REGISTER DESCRIPTIONS: 14

11. SPECIAL FEATURES: 16 A. BIST Support: 16 B. RESET: 16 C. Port Synchronization: 16

12. ABSOLUTE MAXIMUM RATINGS: 18

13. RECOMMENDED OPERATING CONDITIONS: 18

14. DC ELECTRICAL CHARACTERISTICS: 18

15. AC ELECTRICAL CHARACTERISTICS: 20

16. AC WAVEFORMS: 22

17. APPENDIX: 24 A. State Diagram for Boundary-Scan TAP Control-

ler: 24

18. APPLICATIONS EXAMPLE: 24

TABLE 1. Glossary of Terms

LFSR Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial

test data.

LSP Local Scan Port. A four signal port that drives a “local” (i.e. non-backplane) scan chain. (e.g.,

TCK

, TMSL1, TDOL1, TDIL1)

Local Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge

Test Access Port that drives them. The term “local” was adopted from the system test architecture that the ’PSC110F Bridge will most commonly be used in; namely, a system test backplane with a ’PSC110F Bridge on each card driving up to 3 “local” scan rings per card. (Each card can contain multiple ’PSC110Fs, with 3 local scan ports per ’PSC110F.)

Park/Unpark Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the

state of the local TAP controllers (the “local TAP controllers” refers to the TAP controllers of the scan components that make up a local scan ring). Park is also used to describe the action of parking a LSP (transitioning into one of the Parked LSP controller states). It is important to understand that when a LSP controller is in one of the parked states, TMS

is held constant,

thereby holding or “parking” the local TAP controllers in a given state.

TAP Test Access Port as defined by IEEE Std. 1149.1 Selected/Unselected Selected and Unselected refers to the state of the ’PSC110F Bridge Selection Controller. A

selected ’PSC110F has been properly addressed and is ready to receive Level 2 protocol. Unselected ’PSC110Fs monitor the system test backplane, but do not accept Level 2 protocol (except for the

GOTOWAIT

instruction). The data registers and LSPs of unselected ’PSC110Fs are

not accessible from the system test master.

SCANPSC110F

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Table of Contents (Continued)

TABLE 1. Glossary of Terms (Continued)

Active Scan Chain The Active Scan Chain refers to the scan chain configuration as seen by the test master at a given

moment. When a ’PSC110F is selected with all of its LSPs parked, the active scan chain is the current scan bridge register only. When a LSP is unparked, the active scan chain becomes: TDI

→

the current ’PSC110F register→the local scan ring registers→a PAD bit→TDO

. Refer to

Table 4

for Unparked configurations of the LSP network.

Level 1 Protocol Level 1 is the protocol used to address a ’PSC110F. Level 2 Protocol Level 2 is the protocol that is used once a ’PSC110F is selected. Level 2 protocol is IEEE Std.

1149.1 compliant when an individual ’PSC110F is selected.

PAD A one bit register that is placed at the end of each local scan port scan-chain. The PAD bit

eliminates the prop delay that would be added by the ’PSC110F LSPN logic between TDI

and

TDO

L(n+1)

or TDOBby buffering and synchronizing the TDILinputs to the falling edge of TCKB,

thus allowing data to be scanned at higher frequencies without violating set-up and hold times.

LSB Least Significant Bit, the right-most position in a register (bit 0) MSB Most Significant Bit, the left-most position in a register

TABLE 2. Detailed Pin Description Table

Name I/O (Note 1) (SOIC Description

& LCC)

TMS

TTL Input w/Pull-Up Resistor

10 BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP

Controller of the SCANPSC110F Bridge. Also controls sequencing of the TAPs which are on the three (3) local scan chains.

TDI

TTL Input w/Pull-Up Resistor

12 BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the

’PSC110F through this input pin.

TDO

TRI-STATEable, 13 BACKPLANE TEST DATA OUTPUT: This output drives test data from the

’PSC110F and the local TAPs, back toward the scan master controller.

32 mA/64 mA Drive, Reduced-Swing, Output

TCK

TTL Schmitt Trigger Input

11 TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock

signal that controls all scan operations of the ’PSC110F and of the three (3) local scan ports.

TRST

TTL Input w/Pull-Up 9 TEST RESET: An asynchronous reset signal (active low) which initializes the

’PSC110F logic.

Resistor

(0–5)

TTL Inputs 2, 3, 4, SLOT IDENTIFICATION: The configuration of these six (6) pins is used to

identify (assign a unique address to) each ’PSC110F on the system backplane.

5, 6, 7

TTL Input 1 OUTPUT ENABLE for the Local Scan Ports, active low. When high, this

active-low control signal TRI-STATEs all three local scan ports on the ’PSC110F, to enable an alternate resource to access one or more of the three (3) local scan chains.

TDO

L(1–3)

TRI-STATEable, 15,19, TEST DATA OUTPUTS: Individual output for each of the three (3) local scan

ports.

24 mA/24 mA 24 Drive Outputs

TDI

L(1–3)

TTL Inputs w/Pull-Up 18, 23, TEST DATA INPUTS: Individual scan data input for each of the three (3) local

scan ports.

Resistors 27

TMS

L(1–3)

TRI-STATEable, 16, 20, TEST MODE SELECT OUTPUTS: Individual output for each of the three (3)

local scan ports. TMS

does not provide a pull-up resistor (which is assumed

to be present on a connected TMS input, per the IEEE 1149.1 requirement)

24 mA/24 mA 25 Drive Outputs

TCK

L(1–3)

TRI-STATEable, 17, 22, LOCAL TEST CLOCK OUTPUTS: Individual output for each of the three (3)

local scan ports. These are buffered versions of TCK

24 mA/24 mA 26 Drive Output

Power Supply Voltage 8, 28 Power supply pins, 5.0V±10%.

SCANPSC110F

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Table of Contents (Continued)

TABLE 2. Detailed Pin Description Table (Continued)

Name I/O (Note 1) (SOIC Description

& LCC)

GND Ground potential 14, 21 Power supply pins 0V.

Note 1: All pins are active HIGH unless otherwise noted.

Overview of SCANPSC110F Bridge Functions

SCANPSC110F BRIDGE ARCHITECTURE

Figure 1

shows the basic architecture of the ’PSC110F. The device’s major functional blocks are illustrated here. The TAPController, a 16-state state machine, is the central control for the device. The instruction register and various test data registers can be scanned to exercise the various functions of the ’PSC110F (these registers behave as defined in IEEE Std. 1149.1).

The ’PSC110F selection controller provides the functionality that allows the 1149.1protocol to be used in a multi-drop environment. It primarily compares the address inputto the slot identification and enables the ’PSC110F for subsequent scan operations.

The Local Scan Port Network (LSPN) contains multiplexing logic used to select different port configurations. The LSPN control block contains the Local Scan Port Controllers (LSPC) for each Local Scan Port (LSP

, LSP2, and LSP3). This control block receives input from the ’PSC110F instruction register, mode register, and the TAP controller. Each local portcontains all four (4) boundary scan signals needed to interface with the local TAPs.

SCANPSC110F BRIDGE STATE MACHINES

The ’PSC110Fis IEEE 1149.1-compatible,in that it supports all required 1149.1 operations. In addition, it supports a higher level of protocol, (Level 1), that extends the IEEE

1149.1 Std. to a multi-drop environment.

DS100327-3

FIGURE 1. SCANPSC110F Bridge Architecture

SCANPSC110F

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Overview of SCANPSC110F Bridge Functions

(Continued)

In multi-drop scan systems, a scan tester can select individual ’PSC110Fs for participation in upcoming scan operations. ’PSC110F “selection” is accomplished by simultaneously scanning a device address out to multiple

’PSC110Fs. Through an on-chip address matching process, only those ’PSC110Fs whose statically-assigned address matches the scanned-out address become selected to receive further instructions from the scan tester. ’PSC110F selection is done using a “Level-1” protocol, while follow-on instructions are sent to selected ’PSC110Fs by using a “Level-2” protocol.

The ’PSC110F contains three distinct but coupled state-machines (see

Figure 2

). The first of these is the TAP-control state-machine, which is used to drive the ’PSC110Fsscan ports in conformance with the 1149.1 Standard (see

Figure 17

of appendix). The second is the

’PSC110F-selection state-machine (

Figure 3

). The third state-machine actually consists of three identical but independent state-machines (see

Figure 4

), one per ’PSC110F local scan port. Each of these scan port-selection state-machines allows individual local ports to be inserted into and removed from the ’PSC110Fs overall scan chain.

The ’PSC110F selection state-machine performs the address matching which gives the ’PSC110F its multi-drop capability. That logic supports single-’PSC110F access, multi-cast, and broadcast. The ’PSC110F-selection state-machine implements the chip’s Level-1 protocol.

DS100327-4

FIGURE 2. SCANPSC110F Bridge State Machines

SCANPSC110F

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Overview of SCANPSC110F Bridge Functions (Continued)

The ’PSC110F’s scan port-configuration state-machine is used to control the insertion of local scan ports into the overall scan chain, or the isolation of local ports from the chain. From the perspective of a system’s (single) scan controller, each ’PSC110F presents only one scan chain to the master. The ’PSC110F architecture allows one or more of the ’PSC110F’s local ports to be included in the active scan chain.

Each local port can be “parked” in one of four stable states

(Parked-TLR, Parked-RTI, Parked-Pause-DR or Parked-Pause-IR)

, either individually or simultaneously with

other local ports. Parking a chain removes that local chain from the active scan chain. Conversely, a parked chain can be “unparked”, causing the corresponding local port to be inserted into the active scan chain.

As shown in

Figure 4

, the ’PSC110F’s three scan port-configuration state-machines allow each of the part’s local ports tooccupy a different state atany given time. For example, some ports may be parked, perhaps in different states, while other ports participate in scan operations. The state-diagram shows that some state transitions depend on the current state of the TAP-control state-machine.As an ex-

DS100327-5

KEY

+=OR &=AND ADDR=6-bit address in the Instruction Register SLOT=Static address in the ’PSC110F Selection Controller

FIGURE 3. State Machine for SCANPSC110F Bridge Selection Controller

DS100327-12

FIGURE 4. Local SCANPSC110F Bridge Port Configuration State Machine

SCANPSC110F

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Overview of SCANPSC110F Bridge Functions

(Continued)

ample, a local portwhich is presently in the

Parked-RTI

state

does not become unparked (i.e., enter the

Unparked

state)

until the ’PSC110F receives an

UNPARK

instruction and the

’PSC110F’s TAP state-machine enters the

Run-Test/Idle

state. Similarly, certain transitions of the scan port-configuration

state-machine can force the ’PSC110F’s TAP-control state-machine into specific states. For example, when a local port is in the

Unparked

state and the ’PSC110F receives

a PARKRTI instruction, the Local Port controller enters the

Parked-RTI

state in which TMSLnwill be held low until the

port is later unparked. While TMS

is held low, all devices on that local scan chain remain in their current TAP State (the

RTI

TAP controller state in this example).

The ’PSC110F’s scan port-configuration state-machine implements part of the ’PSC110F’s Level-2 protocol. In addition, the ’PSC110F providesa number of Level-2 instructions for functions other than local scan port confguration. These instructions provide access to and control of various registers within the ’PSC110F. This set instructions includes:

BYPASS CNTRSEL EXTEST LFSRON SAMPLE/PRELOAD LFSROFF IDCODE CNTRON MODESEL CNTROFF MCGRSEL GOTOWAIT LFSRSEL

Figure 5

illustrates how the ’PSC110F’s state-machines interact. The ’PSC110F-selection state-machine enables or disables operation of the chip’s three port-selection state-machines. In ’PSC110Fs which are selected via Level-1 protocol (either as individual ’PSC110Fs or as members of broadcast or multi-cast groups), Level-2 protocol commands can be used to park or unpark local scan ports. Note that most transitions of the port-configuration state-machines are gated by particular states of the ’PSC110F’sTAP-control state-machine, as shown in

Figures

4, 5

DS100327-6

FIGURE 5. Relationship Between SCANPSC110F Bridge State Machines

SCANPSC110F

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Overview of SCANPSC110F Bridge Functions

(Continued)

Following a hardware reset, the TAP controller state-machine is in the

Test-Logic-Reset (TLR)

state; the

’PSC110F-selection state-machine is in the

Wait-For-Address

state; and each of the three port-selection

state-machines is in the

Parked-TLR

state. The ’PSC110Fis then ready to receive Level-1 protocol, followed by Level-2 protocol.

Tester/SCANPSC110F Bridge Interface

An IEEE 1149.1 system tester sends instructions to a ’PSC110F via that ’PSC110F’s backplane scan-port. Following test logic reset, the ’PSC110F’s selection state-machine is in the

Wait-For-Address

state. When the ’PSC110F’sTAP controller is sequenced to the Shift-IR state, data shifted in through the TDI

input is shifted into the ’PSC110F’sinstruction register. Note that prior to successful selection of a ’PSC110F, data is not shifted out of the instruction register and out through the ’PSC110F’s TDO

output, as it is during normal scan operations. Instead, as each new bit enters the instruction register’s most-significant bit, data shifted out from the least-significant bit is discarded.

When the instruction register is updated with the address data, the ’PSC110F’s address-recognition logic compares the six least-significant bitsof the instruction register with the 6-bit assigned address which is statically present on the S

(0–5)

inputs. Simultaneously, the scanned-in address is compared with the reserved Broadcast and Multi-cast addresses. If an address match is detected, the ’PSC110F-selectionstate-machine enters one of the two selected states. If the scanned address does not match a valid single-slot address or one of the reserved broadcast/ multi-cast addresses, the ’PSC110F-selection state-machine enters the

Unselected

state.

Note that the SLOT inputs

should not be set

to a value cor-

responding to

a multi-cast group

,ortothe

broadcast ad-

dress

. Also note that the single-’PSC110F selection process must be performed for all ’PSC110Fs which are subsequently to be addressed in multi-cast mode. This is required because each such device’s Multi-cast Group Register (MCGR) must be programmed with a multi-cast group number,and the MCGR is notaccessible to the test controller until that ’PSC110F has first entered the

Selected-Single-’PSC110F

state.

Once a ’PSC110F has been selected, Level-2 protocol is used to issue commands and to access the chip’s various registers.

The SCANPSC110F Bridge includes a number of registers which are used for ’PSC110F selection and configuration, scan datamanipulation, and scan-support operations. These registers can be grouped as shown in

Table 3

The specific fields and functions of each of these registers are detailed in the section of this document titled “Data Register Descriptions”.

Note that when any of these registers is selected for insertion into the ’PSC110F’s scan-chain, scan data enters through that register’s most-significant bit. Similarly, data that is shifted outof the register is fed to the scan inputof the next-downstream device in the scan-chain.

TABLE 3. Registers

Instruction Register INSTRUCTION ’PSC110F addressing and instruction-decode

IEEE Std. 1149.1 required register Boundary-Scan Register BOUNDARY IEEE Std. 1149.1 required register Bypass Register BYPASS IEEE Std. 1149.1 required register Device Identification Register IDCODE IEEE Std. 1149.1 optional register Multi-Cast Group Register MCGR ’PSC110F-group address assignment Mode Register MODE ’PSC110F local-port configuration and control bits Linear-Feedback Shift Register LFSR ’PSC110F scan-data compaction (signature generation) TCK Counter Register CNTR Local-port TCK clock-gating (for BIST)

Addressing Scheme

The SCANPSC110F Bridge architecture extends the functionality of the IEEE 1149.1 Standard by supplementing that protocol with an addressing scheme which allowsa test controller to communicate with specific ’PSC110Fs within a network of ’PSC110Fs. That network can include both multi-drop and hierarchical connectivity. In effect, the ’PSC110Farchitecture allows a test controller to dynamically select specific portions of such a network for participation in scan operations. This allows a complex system to be partitioned into smaller blocks for testing purposes.

The ’PSC110F provides two levels of test-network partitioning capability. First, a test controller can select entire indi-

vidual ’PSC110Fs, specific sets of ’PSC110Fs (multi-cast groups), or all ’PSC110Fs (broadcast). This ’PSC110F-selection process is supported by a “Level-1” communication protocol. Second, within each selected ’PSC110F, a test controller can select one or more of the chip’s three local scan-ports. That is, individual local ports can be selected forinclusion in the (single) scan-chain which a ’PSC110F presents to the test controller. This mechanism allows a controller to select specific terminal scan-chains within theoverall scan network. The port-selectionprocess is supported by a “Level-2” protocol.

SCANPSC110F

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Hierarchical Test Support

Multiple SCANPSC110FBridges can be used to assemble a hierarchical boundary-scan tree. In such a configuration, the system tester can configure the local ports of a set of ’PSC110Fs so as to connect a specific set of local scan-chains to the active scan chain. Using this capability, the tester can selectively communicate with specific portions of a target system.

The tester’s scan port is connected to the backplane scan port of a “root” layer of ’PSC110Fs,each of which can be selected using multi-drop addressing. A second tier of ’PSC110Fs can be connected to this root layer, by connecting a local port (LSP) of a root-layer ’PSC110F to the backplane port of a second-tier ’PSC110F. This process can be continued to construct a multi-level scan hierarchy.

’PSC110F local ports which are not cascaded into higher-level ’PSC110Fs can be thought of as the terminal “leaves” of a scan “tree”. The test master can select one or more target leaves by selecting and configuring the local ports of an appropriate set of ’PSC110Fs in the test tree.

Level 1 Protocol

ADDRESSING MODES

The SCANPSC110F Bridge supports “single” and “multiple” modes of addressing a ’PSC110F.The “single” mode will select one ’PSC110F and is called Direct Addressing. More than one ’PSC110F device can be selected via the Broadcast and Multi-Cast Addressing modes.

SCANPSC110F

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