MOTOROLA MPC5200, MPC5200D Technical data

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MPC5200/D Rev. 2, 5/2004
MPC5200 Hardware Specifications
Freescale Semiconductor, Inc.
Top ic Pa ge
1 Overview ......................................1
2 Features .......................................1
3 Electrical and Thermal
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Characteristics..............................5
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4 Package Description ..................60
5 System Design Information ........69
6 Ordering Information ..................74
7 Document Revision History ........75
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NOTE:
The information in this document is subject to change. For the latest data on the MPC5200, visit www.mobilegt.com and proceed to the MPC5200 Product Summary Page.
1 Overview
The MPC5200 integrates a high performance MPC603e series G2_LE core with a rich set of peripheral functions focused on communications and systems integration. The G2_LE core design is based on the PowerPC MPC5200 incorporates an innovative BestComm I/O subsystem, which isolates routine maintenance of peripheral functions from the embedded G2_LE core. The MPC5200 contains a SDRAM/ DDR Memory Controller, a flexible External Bus Interface, PCI Controller, USB, ATA, Ethernet, six Programmable Serial Controllers (PSC), I
2
C, SPI, CAN, J1850, Timers, and GPIOs.
®
core architecture.
2Features
Key features are shown below.
MPC603e series G2_LE core
— Superscalar architecture
o
— 760 MIPS at 400 MHz (-40 to +85 — 16 k Instruction cache, 16 k Data cache — Double precision FPU — Instruction and Data MMU — Standard and Critical interrupt capability
SDRAM / DDR Memory Interface
— up to 132-MHz operation — SDRAM and DDR SDRAM support — 256-MByte addressing range per CS, two CS available — 32-bit data bus — Built-in initialization and refresh
Flexible multi-function External Bus Interface
— Supports interfacing to ROM/Flash/SRAM memories or other memory
mapped devices
C)
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Features
— 8 programmable Chip Selects — Non multiplexed data access using 8/16/32 bit databus with up to 26-bit address — Short or Long Burst capable — Multiplexed data access using 8/16/32 bit databus with up to 25-bit address
Peripheral Component Interconnect (PCI) Controller
— Version 2.2 PCI compatibility — PCI initiator and target operation — 32-bit PCI Address/Data bus — 33- and 66-MHz operation — PCI arbitration function
ATA Controller
— Version 4 ATA compatible external interface—IDE Disk Drive connectivity
BestComm DMA subsystem
— Intelligent virtual DMA Controller — Dedicated DMA channels to control peripheral reception and transmission — Local memory (SRAM 16 kBytes)
6 Programmable Serial Controllers (PSC), configurable for the following:
— UART or RS232 interface — CODEC interface for Soft Modem, Master/Slave CODEC Mode, I — Full duplex SPI mode — IrDA mode from 2400 bps to 4 Mbps
Fast Ethernet Controller (FEC)
— Supports 100Mbps IEEE 802.3 MII, 10 Mbps IEEE 802.3 MII, 10 Mbps 7-wire interface
Universal Serial Bus Controller (USB)
— USB Revision 1.1 Host
— Open Host Controller Interface (OHCI)
— Integrated USB Hub, with two ports.
Two Inter-Integrated Circuit Interfaces (I
Serial Peripheral Interface (SPI)
Dual CAN 2.0 A /B Controller (MSCAN)
— Motorola Scalable Controller Area Network (MSCAN) architecture — Implementation of version 2.0A/ B CAN protocol — Standard and extended data frames
J1850 Byte Data Link Controller (BDLC)
— J1850 Class B data communication network interface compatible and ISO compatible for low
speed (<125 kbps) serial data communications in automotive applications. — Supports 4X mode, 41.6 kbps — In-frame response (IFR) types 0, 1, 2, and 3 supported
2
C)
2
S and AC97
2 MPC5200 Hardware Specifications M O T O R O L A
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Systems level features
— Interrupt Controller supports four external interrupt request lines and 47 internal interrupt
sources
— GPIO/Timer functions
– Up to 56 total GPIO pins (depending on functional multiplexing selections ) that support a
variety of interrupt /WakeUp capabilities.
– Eight GPIO pins with timer capability supporting input capture, output compare, and pulse
width modulation (PWM) functions
— Real-time Clock with one-second resolution — Systems Protection ( watch dog timer, bus monitor ) — Individual control of functional block clock sources — Power management: Nap, Doze, Sleep, Deep Sleep modes — Support of WakeUp from low power modes by different sources (GPIO, RTC, CAN)
Test/ Debug features
— JTAG (IEEE 1149.1 test access port )
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— Common On-chip Processor (COP ) debug port
On-board PLL and clock generation
Features
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Figure 1 shows a simplified MPC5200 block diagram.
MOTOROLA MPC5200 Hardware Specifications 3
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Features
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Bus
Local
MSCAN
2x
J1850
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SDRAM / DDR
Systems Interface Unit (SIU )
Real-Time Clock
SDRAM / DDR
Memory Controller
USB
2x
SPI
System Functions
Interrupt Controller
GPIO/Timers
Local Plus Controller
PCI Bus Controller
BestComm DMA
SRAM 16K
ATA Host Controller
I2C
2x
Ethernet
PSC
6x
CommBus
603
G2_LE Core
Figure 1 Simplified Block Diagram—MPC5200
4 MPC5200 Hardware Specifications M O T O R O L A
Interface
JTAG / COP
Generation
Reset / Clock
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Electrical and Thermal Characteristics
3 Electrical and Thermal Characteristics
3.1 DC Electrical Characteristics
3.1.1 Absolute Maximum Ratings
The tables in this section describe the MPC5200 DC Electrical characteristics. Table 1 gives the absolute maximum ratings.
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Table 1 Absolute Maximum Ratings
Characteristic Symbol Min Max Unit SpecID
Supply voltage - G2_LE core and peripheral logic VDD_CORE –0.3 1.8 V D1.1
Supply voltage - I/O buffers VDD_IO,
VDD_MEM_IO
Supply voltage - System APLL SYS_PLL_AVDD –0.3 2.1 V D1.3
Supply voltage - G2_LE APLL CORE_PLL_AVDD –0.3 2.1 V D1.4
Input voltage (VDD_IO) Vin –0.3 VDD_IO + 0.3 V D1.5
Input voltage (VDD_MEM_IO) Vin –0.3 VDD_MEM_IO
Input voltage overshoot Vinos 1.0 V D1.7
Input voltage undershoot Vinus 1.0 V D1.8
Storage temperature range Tstg –55 150
1 Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed. Stresses
beyond those listed may affect device reliability or cause permanent damage.
1
–0.3 3.6 V D1.2
V D1.6
+ 0.3
o
D1.9
C
3.1.2 Recommended Operating Conditions
Table 2 gives the recommended operating conditions.
Table 2 Recommended Operating Conditions
Characteristic Symbol
Supply voltage - G2_LE core and periph­eral logic
Supply voltage - standard I/O buffers VDD_IO 3.0 3.6 V D2.2
Supply voltage - memory I/ O buffers (SDR)
Supply voltage - memory I/O buffers (DDR)
VDD_CORE 1.42 1.58 V D2.1
VDD_MEM_IO
VDD_MEM_IO
SDR
DDR
1
Min
3.0 3.6 V D2.3
2.42 2.63 V D2.4
Max
1
Unit SpecID
Supply voltage - System APLL SYS_PLL_AVDD 1.42 1.58 V D2.5
Supply voltage - G2_LE APLL CORE_PLL_AVDD 1.42 1.58 V D2.6
Input voltage - standard I/O buffers Vin 0 VDD_IO V D2.7
Input voltage - memory I/O buffers (SDR) Vin
Input voltage - memory I/O buffers (DDR) Vin
MOTOROLA MPC5200 Hardware Specifications 5
SDR
DDR
0 VDD_MEM_IO
0 VDD_MEM_IO
SDR
DDR
VD2.8
VD2.9
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Electrical and Thermal Characteristics
Table 2 Recommended Operating Conditions (continued)
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Characteristic Symbol
Ambient operating temperature range
Extended ambient operating temperature
3
range
Die junction operating temperature range Tj -40 +115
Extended die junction operating tempera­ture range
1 These are recommended and tested operating conditions. Proper device operation outside these conditions is not guar-
anteed. 2 Maximum G2_LE core operating frequency is 400 MHz 3 Maximum G2_LE core operating frequency is 264 MHz
2
T
A
T
Aext
Tjext -40 +125
1
Min
-40 +85
-40 +105
Max
1
Unit SpecID
o
o
o
o
D2.10
C
D2.11
C
D2.12
C
D2.13
C
3.1.3 DC Electrical Specifications
Table 3 gives the DC Electrical characteristics for the MPC5200 at recommended operating conditions
(see Table 2).
Table 3 DC Electrical Specifications
Characteristic Condition Symbol Min Max Unit SpecID
Input high voltage Input type = TTL
VDD_IO/VDD_MEM_IO
Input high voltage Input type = TTL
VDD_MEM_IO
Input high voltage Input type = PCI
VDD_IO
Input high voltage Input type = SCHMITT
VDD_IO
Input high voltage SYS_XTAL_IN CV
Input high voltage RTC_XTAL_IN CV
Input low voltage Input type = TTL
VDD_IO/VDD_MEM_IO
Input low voltage Input type = TTL
VDD_MEM_IO
Input low voltage Input type = PCI
VDD_IO
SDR
DDR
SDR
DDR
V
IH
V
IH
V
IH
V
IH
IH
IH
V
IL
V
IL
V
IL
2.0 V D3.1
1.7 V D3.2
2.0 V D3.3
2.0 V D3.4
2.0 V D3.5
2.0 V D3.6
—0.8VD3.7
—0.7VD3.8
—0.8VD3.9
Input low voltage Input type = SCHMITT
VDD_IO
Input low voltage SYS_XTAL_IN CV
Input low voltage RTC_XTAL_IN CV
Input leakage current Vin = 0 or
VDD_IO/VDD_IO_MEM
(depending on input type 1)
SDR
V
I
IL
IL
IL
IN
—0.8VD3.10
—0.8VD3.11
—0.8VD3.12
—+10 µAD3.13
6 MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
Table 3 DC Electrical Specifications (continued)
Characteristic Condition Symbol Min Max Unit SpecID
Input leakage current SYS_XTAL_IN
Vin = 0 or VDD_IO
Input leakage current RTC_XTAL_IN
Vin = 0 or VDD_IO
Input current, pullup resis­tor
Input current, pullup resis­tor - memory I/O buffers
Input current, pulldown resistor
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Output high voltage
Output high voltage
Output low voltage
Output low voltage
DC Injection Current Per
3
Pin
Capacitance Vin = 0V, f = 1 MHz C
1 Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive. 2 See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 51.
3 All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to main-
tain the power supply within the specified voltage range. Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this limit can cause disruption of normal operation.
IOH is driver dependent
VDD_IO, VDD_IO_MEM
IOH is driver dependent
IOL is driver dependent
VDD_IO, VDD_IO_MEM
IOL is driver dependent
PULLUP VDD_IO
Vin = 0
PULLUP_MEM
VDD_IO_MEM
Vin = 0
PULLDOWN
VDD_IO
Vin = VDD_IO
VDD_IO_MEM
VDD_IO_MEM
SDR
2
SDR
2
DDR
2
SDR
2
DDR
I
I
I
INpu
I
INpu
I
INpd
V
V
OHDDR
V
V
OLDDR
I
CS
IN
IN
OH
OL
—+10 µAD3.14
—+10 µAD3.15
40 109 µAD3.16
41 111 µAD3.17
36 106 µAD3.18
2.4 V D3.19
1.7 V D3.20
—0.4VD3.21
—0.4VD3.22
-1.0 1.0 mA D3.23
in
—15pFD3.24
Frees
Table 4 Drive Capability of MPC5200 Output Pins
Driver Type Supply Voltage
DRV4 VDD_IO = 3.3V 4 4 mA D3.25
DRV8 VDD_IO = 3.3V 8 8 mA D3.26
DRV8_OD VDD_IO = 3.3V - 8 mA D3.27
DRV16_MEM VDD_IO_MEM = 3.3V 16 16 mA D3.28
DRV16_MEM VDD_IO_MEM = 2.5V 16 16 mA D3.29
PCI VDD_IO = 3.3V 16 16 mA D3.30
I
OH
MOTOROLA MPC5200 Hardware Specifications 7
I
OL
Unit SpecID
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Electrical and Thermal Characteristics
3.1.4 Electrostatic Discharge
— CAUTION —
This device contains circuitry that protects against damage due to high-static voltage or electrical fields. However, it is advised that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages. Operational reliability is enhanced if unused inputs are tied to an appropriate logic voltage level (i.e., either GND or V
Sym Rating Min Max Unit SpecID
). Table 7 gives package thermal characteristics for this device.
CC
Table 5 ESD and Latch-Up Protection Characteristics
V
V
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V
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3.1.5 Power Dissipation
Power dissipation of the MPC5200 is caused by 3 different components: the dissipation of the internal or core digital logic (supplied by VDD_CORE), the dissipation of the analog circuitry (supplied by SYS_PLL_AVDD and CORE_PLL_AVDD) and the dissipation of the IO logic (supplied by VDD_IO_MEM and VDD_IO). Table 6 details typical measured core and analog power dissipation figures for a range of operating modes. However, the dissipation due to the switching of the IO pins can not be given in general, but must be calculated by the user for each application case using the following formula
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Human Body Model (HBM)—JEDEC JESD22-A114-B 2000 V D4.1
HBM
Machine Model (MM) —JEDEC JESD22-A115 200 V D4.2
MM
Charge Device Model (CDM)— JEDEC JESD22-C101 500 V D4.3
CDM
Latch-up Current at TA=85oC
LAT
positive negative
Latch-up Current at TA=27oC
LAT
positive negative
P
IO
P
IOint
M
N
+ C VDD_IO
+100
-100
+200
-200
2
f×××=
—mA
—mA
D4.4
D4.5
Frees
where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage. The total power consumption of the MPC5200 processor
P
total
must not exceed the value, which would cause the maximum junction temperature to be exceeded.
8 MPC5200 Hardware Specifications M O T O R O L A
P
++=
corePanalogPIO
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Electrical and Thermal Characteristics
Table 6 Power Dissipation
Core Power Supply (VDD_CORE)
SYS_XTAL/XLB/PCI/IPG/CORE (MHz)
Typ Typ
SpecID
Unit Notes33/66/33/33/264 33/132/66/132/396
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Operational 727.5 1080 mW
Doze 600 mW
Nap 225 mW
Sleep 225 mW
Deep-Sleep 52.5 52.5 mW
PLL Power Supplies (SYS_PLL_AVDD, CORE_PLL_AVDD)
Mode Typ Unit Notes
Typical 2 mW
Unloaded I/O Power Supplies (VDD_IO, VDD_MEM_IO
Mode Typ Unit Notes
Typical 33 mW
1 Typical core power is measured at VDD_CORE = 1.5 V, Tj = 25 C 2 Operational power is measured while running an entirely cache-resident program with floating-point multiplication
instructions in parallel with a continuous PCI transaction via BestComm.
3 Doze power is measured with the G2_LE core in Doze mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
4 Nap power is measured with the G2_LE core in Nap mode, the stem oscillator, System PLL and Core PLL are ac-
tive, all other system modules are inactive
5 Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL and Core PLL are
active, all other system modules are inactive
6 Deep-Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL, Core PLL
and all other system modules are inactive 7 Typical PLL power is measured at SYS_PLL_AVDD = CORE_PLL_AVDD = 1.5 V, Tj = 25 C 8 IO power figures given in the table represent the worst case scenario. For the mem_io rail connected to 2.5V the
IO power is expected to be lower and bounded by the worst case with VDD_MEM_IO connected to 3.3V. 9 Unloaded typical I/O power is measured in Deep-Sleep mode at VDD_IO = VDD_MEM_IO
8
)
1, 2
1, 3
1, 4
1, 5
1, 6
7
9
= 3.3 V, Tj = 25 C
SDR
D5.1
D5.2
D5.3
D5.4
D5.5
D5.6
D5.7
MOTOROLA MPC5200 Hardware Specifications 9
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Electrical and Thermal Characteristics
3.1.6 Thermal Characteristics
Table 7 Thermal Resistance Data
Rating Value Unit Notes SpecID
Junction to Ambient Natural Convection
Junction to Ambient Natural Convection
Junction to Ambient (@200 ft/min)
Junction to Ambient (@200 ft/min)
Junction to Board R
Junction to Case R
Junction to Package Top Natural Convection Ψ
1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance. 2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal. 3 Per JEDEC JESD51-6 with the board horizontal. 4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is mea-
sured on the top surface of the board near the package. 5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1). 6 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is
written as Psi-JT.
Single layer board (1s)
Four layer board (2s2p) R
Single layer board (1s)
Four layer board (2s2p)
R
R
R
θJA
θJMA
θJMA
θJMA
θJB θJC
JT
30 °C/W 1,
22 °C/W1,
24 °C/W1,
19 °C/W1,
14 °C/W
C/W
C/W
3.1.6.1 Heat Dissipation
An estimation of the chip-junction temperature, TJ, can be obtained from the following equation:
where:
T
R
P
TJ=TA+(R
= ambient temperature for the package ( ºC)
A
= junction to ambient thermal resistance (º C/W )
θJA
= power dissipation in package (W)
D
θJA
× P
) Eqn. 1
D
2
3
3
3
4
5
6
D6.1
D6.2
D6.3
D6.4
D6.5
D6.6
D6.7
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy estimation of thermal performance. Unfortunately, there are two values in common usage: the value determined on a single layer board, and the value obtained on a board with two planes. For packages such as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power dissipated by other components on the board. The value obtained on a single layer board is appropriate for the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually appropriate if the board has low power dissipation and the components are well separated.
Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal resistance and a case to ambient thermal resistance:
10 MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
R
where:
R
= junction to ambient thermal resistance ( ºC/ W)
θJA
R
= junction to case thermal resistance (ºC/ W)
θJC
R
= case to ambient thermal resistance (ºC/ W)
θCA
R
is device related and cannot be influenced by the user. The user controls the thermal environment to
θJC
change the case to ambient thermal resistance, R around the device, add a heat sink, change the mounting arrangement on printed circuit board, or change the thermal dissipation on the printed circuit board surrounding the device. This description is most useful for ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink to ambient. For most packages, a better model is required.
A more accurate thermal model can be constructed from the junction to board thermal resistance and the junction to case thermal resistance
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used or where a substantial amount of heat is dissipated from the top of the package. The junction to board thermal resistance describes the thermal performance when most of the heat is conducted to the printed circuit board. This model can be used for either hand estimations or for a computational fluid dynamics (CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (Ψ
measurement of the temperature at the top center of the package case using the following equation:
1-3
. The junction to case covers the situation where a heat sink will be
=R
θJA
) can be used to determine the junction temperature with a
JT
θJC+RθCA
. For instance, the user can change the air flow
θCA
Eqn. 2
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TJ=T
where:
T
= thermocouple temperature on top of package (ºC)
T
Ψ
= thermal characterization parameter ( ºC/ W)
JT
P
= power dissipation in package ( W)
D
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and over approximately one mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire.
+(ΨJT × P
T
) Eqn. 3
D
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Electrical and Thermal Characteristics
3.2 Oscillator and PLL Electrical Characteristics
The MPC5200 System requires a system-level clock input SYS_XTAL. This clock input may be driven directly from an external oscillator or with a crystal using the internal oscillator.
There is a separate oscillator for the independent Real-Time Clock (RTC) system.
The MPC5200 clock generation uses two phase locked loop (PLL) blocks.
The system PLL (SYS_PLL) takes an external reference frequency and generates the internal system clock. The system clock frequency is determined by the external reference frequency and the settings of the SYS_PLL configuration.
The G2_LE core PLL (CORE_PLL) generates a master clock for all of the CPU circuitry. The G2_LE core clock frequency is determined by the system clock frequency and the settings of the CORE_PLL configuration.
3.2.1 System Oscillator Electrical Characteristics
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Table 8 System Oscillator Electrical Characteristics
Characteristic Symbol Notes Min Typical Max Unit SpecID
SYS_XTAL frequency f
Oscillator start-up time t
sys_xtal
up_osc
15.6 33.3 35.0 MHz O1.1
3.2.2 RTC Oscillator Electrical Characteristics
Table 9 RTC Oscillator Electrical Characteristics
Characteristic Symbol Notes Min Typical Max Unit SpecID
RTC_XTAL frequency f
rtc_xtal
100 µsO1.2
32.768 kHz O2.1
12 MPC5200 Hardware Specifications M O T O R O L A
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3.2.3 System PLL Electrical Characteristics
Table 10 System PLL Specifications
Characteristic Symbol Notes Min Typical Max Unit SpecID
Electrical and Thermal Characteristics
SYS_XTAL frequency f
SYS_XTAL cycle time T
SYS_XTAL clock input jitter t
System VCO frequency f
System PLL relock time t
1 The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency, CPU
(core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequen-
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cies.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL. Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating fre­quency.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
sys_xtal
sys_xtal
jitter
VCOsys
lock
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1
1
2
1
3
15.6 33.3 35.0 MHz O3.1
66.6 30.0 28.5 ns O3.2
150 ps O3.3
250 533 800 MHz O3.4
——100µsO3.5
Frees
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Electrical and Thermal Characteristics
3.2.4 G2_LE Core PLL Electrical Characteristics
The internal clocking of the G2_LE core is generated from and synchronized to the system clock by means of a voltage-controlled core PLL.
Table 11 G2_LE PLL Specifications
Characteristic Symbol Notes Min Typical Max Unit SpecID
G2_LE frequency f
G2_LE cycle time t
G2_LE VCO frequency f
G2_LE input clock frequency f
G2_LE input clock cycle time t
G2_LE input clock jitter t
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G2_LE PLL relock time t
1 The SYSCLK frequency and G2_LE PLL Configuration bits must be chosen such that the resulting system frequencies,
CPU (core) frequency, and G2_LE PLL (VCO) frequency do not exceed their respective maximum or minimum oper­ating frequencies.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL. Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating fre­quency.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
core
core
VCOcore
SYSCLK
SYSCLK
jitter
lock
cale Semiconductor,
1
1
1
2
3
50 550 MHz O4.1
2.85 40.0 ns O4.2
400 1200 MHz O4.3
25 367 MHz O4.4
2.73 50.0 ns O4.5
150 ps O4.6
100 µsO4.7
Frees
14 MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3 AC Electrical Characteristics
Hyperlinks to the indicated timing specification sections are provided below.
AC Operating Frequency Data USB
Clock AC Specifications SPI
Resets MSCAN
External Interrupts
SDRAM J1850
•PCI •PSC
Local Plus Bus GPIOs and Timers
ATA IEEE 1149.1 (JTAG) AC Specifications
Ethernet
2
•I
C
nc...
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cale Semiconductor,
Frees
AC Test Timing Conditions:
Unless otherwise noted, all test conditions are as follows:
o
TA = -40 to 85
Tj = -40 to 115
VDD_CORE = 1.42 to 1.58 V VDD_IO = 3.0 to 3.6 V
Input conditions: All Inputs: tr, tf <= TBD
Output Loading: All Outputs: 50 pF
C
o
C
3.3.1 AC Operating Frequency Data
Table 12 provides the operating frequency information for the MPC5200.
Table 12 Clock Frequencies
Min Max Units SpecID
1 G2_LE Processor Core 400 MHz A1.1
2 SDRAM Clock 133 MHz A1.2
3 XL Bus Clock 133 MHz A1.3
4 IP Bus Clock 133 MHz A1.4
5 PCI / Local Plus Bus Clock 66 MHz A1.5
6 PLL Input Range 15.6 35 MHz A1.6
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Electrical and Thermal Characteristics
3.3.2 Clock AC Specifications
t
CYCLE
t
FAL L
SYSCLK
V
t
DUTY
M
V
t
DUTY
M
t
RISE
CV
IH
V
M
CV
IL
Figure 2 Timing Diagram—SYS_XTAL_IN
Table 13 SYS_XTAL_IN Timing
Sym Description Min Max Units SpecID
t
CYCLE
SYS_XTAL_IN cycle time.
1
28.6 64.1 ns A2.1
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cale Semiconductor,
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t
RISE
t
FALL
t
DUTY
CV
CV
1 CAUTION—The SYS_XTAL_IN frequency and system PLL_CFG[0-6] settings must be chosen such that the resulting
2 SYS_XTAL_IN duty cycle is measured at VM.
SYS_XTAL_IN rise time. 5.0 ns A2.2
SYS_XTAL_IN fall time. 5.0 ns A2.3
SYS_XTAL_IN duty cycle (measured at VM). 2
SYS_XTAL_IN input voltage high 2.0 V A2.5
IH
SYS_XTAL_IN input voltage low 0.8 V A2.6
IL
system frequencies do not exceed their respective maximum or minimum operating frequencies. See the MPC5200 User Manual [1].
40.0 60.0 % A2.4
16 MPC5200 Hardware Specifications M O T O R O L A
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3.3.3 Resets
The MPC5200 has three reset pins:
Electrical and Thermal Characteristics
PORESET
HRESET
SRESET
These signals are asynchronous I /O signals and can be asserted at any time. The input side uses a Schmitt trigger and requires the same input characteristics as other MPC5200 inputs, as specified in the DC Electrical Specifications section. Table 14 specifies the pulse widths of the Reset inputs.
- Power on Reset
- Hard Reset
- Software Reset
Table 14 Reset Pulse Width
Name Description Min Pulse Width
PORESET
nc...
I
HRESET
SRESET
Notes:
1. For PORESET wards its minimum pulse width equals the minimum given for HRESET
2. The t
3. For t
4. For t
5. Following the deassertion of PORESET
6. The deassertion of HRESET 4096 clock cycles.
Power On Reset t
Hardware Reset 4 clock cycles SYS_XTAL_IN A3.2
Software Reset 4 clock cycles SYS_XTAL_IN A3.3
the value of the minimum pulse width reflects the power on sequence. If PORESET is asserted after-
VDD_stable
lock,
up_osc,
describes the time which is needed to get all power supplies stable.
refer to the Oscillator/PLL section of this specification for further details.
refer to the Oscillator/PLL section of this specification for further details.
VDD_stable+tup_osc+tlock
, HRESET and SRESET remain low for 4096 reference clock cycles.
for at least the minimum pulse width forces the internal resets to be active for an additional
NOTE:
As long as VDD is not stable the HRESET
Table 15 Reset Rise / Fall Timing
Description Min Max Unit SpecID
cale Semiconductor,
PORESET
PORESET
HRESET
fall time 1 ms A3.4
rise time 1 ms A3.5
fall time TBD ns A3.6
Max Pulse
Width
SYS_XTAL_IN A3.1
related to the same reference clock.
Reference Clock SpecID
output is not stable.
Frees
HRESET
SRESET
SRESET
For additional information, see the MPC5200 User Manual [1].
MOTOROLA MPC5200 Hardware Specifications 1 7
rise time TBD ns A3.7
fall time TBD ns A3.8
rise time TBD ns A3.9
NOTE:
Make sure that the PORESET has no filter to prevent them from getting into the chip.
does not carry any glitches. The MPC5200
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Electrical and Thermal Characteristics
3.3.3.1 Reset Configuration Word
During reset (HRESET and PORESET) the Reset Configuration Word is cached in the related Reset Configuration Word Register with each rising edge of the SYS_XTAL signal. If both resets (HRESET PORESET (see Figure 3).
) are inactive (high), the contents of this register get locked after two further SYS_XTAL cycles
SYS_XTAL
PORESET
HRESET
RST_CFG_WRD
4096 clocks 2 clocks
and
nc...
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cale Semiconductor,
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sample
Beware of changing the values on the pins of the reset configuration word after the deassertion of PORESET may change the internal clock ratios and so extend the PLL locking process.
sample
sample
Figure 3 Reset Configuration Word Locking
sample sample
sample
sample
sample sample
NOTE:
. This may cause problems because it
sample
sample
sample
LOCK
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Electrical and Thermal Characteristics
3.3.4 External Interrupts
The MPC5200 provides three different kinds of external interrupts:
Four IRQ interrupts
Eight GPIO interrupts with simple interrupt capability (not available in power-down mode)
Eight WakeUp interrupts (special GPIO pins)
The propagation of these three kinds of interrupts to the core is shown in the following graphic:
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cale Semiconductor,
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IRQ0
8 GPIOs
8 GPIOs GPIO WakeUp
IRQ1
IRQ2
IRQ3
Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock Distribution Module (see Note Table 16).
Interrupt Type Pin Name Clock Cycles Reference Clock Core Interrupt SpecID
Interrupt Requests IRQ0 10 IP_CLK critical (cint) A4.1
8
8
GPIO Std
Notes:
1. PIs = Programmable Inputs
2. Grouper and Encoder functions imply programmability in software
Figure 4 External interrupt scheme
Table 16 External interrupt latencies
IRQ0 10 IP_CLK normal (int) A4.2
IRQ1 10 IP_CLK normal (int) A4.3
cint
int
PIs
Main Interrupt
Controller
Encoder
Grouper Encoder
core_cint
core_int
G2_LE Core
IRQ2 10 IP_CLK normal (int) A4.5
IRQ3 10 IP_CLK normal (int) A4.6
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Electrical and Thermal Characteristics
Table 16 External interrupt latencies (continued)
Interrupt Type Pin Name Clock Cycles Reference Clock Core Interrupt SpecID
Standard GPIO Interrupts GPIO_PSC3_4 12 IP_CLK normal (int) A4.7
GPIO_PSC3_5 12 IP_CLK normal (int) A4.8
GPIO_PSC3_8 12 IP_CLK normal (int) A4.9
GPIO_USB_9 12 IP_CLK normal (int) A4.10
GPIO_ETHI_4 12 IP_CLK normal (int) A4.11
GPIO_ETHI_5 12 IP_CLK normal (int) A4.12
GPIO_ETHI_6 12 IP_CLK normal (int) A4.13
GPIO_ETHI_7 12 IP_CLK normal (int) A4.14
GPIO WakeUp Interrupts GPIO_PSC1_4 12 IP_CLK normal (int) A4.15
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cale Semiconductor,
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GPIO_PSC2_4 12 IP_CLK normal (int) A4.16
GPIO_PSC3_9 12 IP_CLK normal (int) A4.17
GPIO_ETHI_8 12 IP_CLK normal (int) A4.18
GPIO_IRDA_0 12 IP_CLK normal (int) A4.19
DGP_IN0 12 IP_CLK normal (int) A4.20
DGP_IN1 12 IP_CLK normal (int) A4.21
Notes:
1) The frequency of IP_CLK depends on register settings in Clock Distribution Module. See the MPC5200 User Manual [1].
2) The interrupt latency descriptions in the table above are related to non competitive, non masked but enabled external interrupt sources. Take care of interrupt prioritization which may increase the latencies.
Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Table 17 Minimum pulse width for external interrupts to be recognized
Name Min Pulse Width Max Pulse Width Reference Clock SpecID
All external interrupts (IRQs, GPIOs) > 1 clock cycle IP_CLK A4.22
Notes:
1) The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200 User Manual [1] for further information.
2) If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second interrupt will not be recognized at all.
Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its associated interrupt service routine also depends on the following conditions: To get a minimum interrupt service response time, it is recommended to enable the instruction cache and set up the maximum core clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is advisable to execute an interrupt handler, which has been implemented in assembly code.
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Electrical and Thermal Characteristics
3.3.5 SDRAM
3.3.5.4 Memory Interface Timing-Standard SDRAM Read Command
Table 18 Standard SDRAM Memory Read Timing
Sym Description Min Max Units SpecID
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cale Semiconductor,
Frees
t
mem_clk
t
valid
t
hold
DM
DM
data
data
MBA (Bank Selects)
MEM_CLK period 7.5 ns A5.1
Control Signals, Address and MBA Valid after rising edge of MEM_CLK
Control Signals, Address and MBA Hold after rising edge of MEM_CLK
DQM valid after rising edge of
valid
MEM_CLK
DQM hold after rising edge of MEM_CLK t
hold
MDQ setup to rising edge of MEM_CLK 0.3 ns A5.6
setup
MDQ hold after rising edge of MEM_CLK 0.2 ns A5.7
hold
MEM_CLK
Control Signals
DQM (Data Mask)
MDQ (Data)
MA (Address)
—t
t
mem_clk
mem_clk
t
t
valid
t
valid
valid
t
hold
Active NOP READ NOPNOPNOP NOP
DM
valid
t
hold
Row Column
t
hold
*0.5 ns A5.3
—t
*0.25-0.7 ns A5.5
DM
hold
data
setup
mem_clk
mem_clk
NOP
*0.5+0.4 ns A5.2
*0.25+0.4 ns A5.4
data
hold
NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
Figure 5 Timing Diagram—Standard SDRAM Memory Read Timing
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Electrical and Thermal Characteristics
3.3.5.5 Memory Interface Timing-Standard SDRAM Write Command
In Standard SDRAM, all signals are activated on the Mem_clk from the Memory Controller and captured on the Mem_clk clock at the memory device.
Table 19 Standard SDRAM Write Timing
Sym Description Min Max Units SpecID
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cale Semiconductor,
Frees
t
mem_clk
t
valid
t
hold
DM
valid
DM
hold
data
data
DQM (Data Mask)
MBA (Bank Selects)
MEM_CLK period 7.5 ns A5.8
Control Signals, Address and MBA Valid after rising edge of MEM_CLK
Control Signals, Address and MBA Hold after rising edge of MEM_CLK
DQM valid after rising edge of MEM_CLK
DQM hold after rising edge of Mem_clk t
MDQ valid after rising edge of
valid
MEM_CLK
MDQ hold after rising edge of
hold
MEM_CLK
MEM_CLK
Control Signals
MDQ (Data)
MA (Address)
—t
t
mem_clk
mem_clk
t
mem_clk
t
t
valid
t
valid
valid
t
hold
Active NOP WRITE NOPNOPNOPNOP NOP
DM
valid
data
valid
t
hold
Row Column
t
hold
*0.5 ns A5.10
—t
*0.25-0.7 ns A5.12
—t
*0.75-0.7 ns A5.14
DM
hold
data
hold
mem_clk
mem_clk
mem_clk
*0.5+0.4 ns A5.9
*0.25+0.4 ns A5.11
*0.75+0.4 ns A5.13
NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
Figure 6 Timing Diagram—Standard SDRAM Memory Write Timing
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Electrical and Thermal Characteristics
3.3.5.6 Memory Interface Timing-DDR SDRAM Read Command
The SDRAM Memory Controller uses an internally skewed clock for reading DDR memory. The programmable bits in the Reset Configuration Register used to account for unknown board delays are in the CDM module. The internal read clock can be delayed up to 3 ns under worst operating conditions in 32 increments of 95 ps, (1.4 ns in 45 ps increments under best case operating conditions) by programming the CDM Reset Configuration Register tap delay bits. Note: These bits in the CDM Reset Configuration register are not ‘reset configured’ but have a hard coded reset value and are writable during operation.
Table 20 DDR SDRAM Memory Read Timing
Sym Description Min Max Units SpecID
t
mem_clk
t
valid
t
hold
nc...
I
data
data
cale Semiconductor,
MDQS (Data Strobe)
MEM_CLK period 7.5 ns A5.15
Control Signals, Address and MBA valid after rising edge of MEM_CLK
Control Signals, Address and MBA hold after rising edge of MEM_CLK
Setup time skewed by CDM Reset
setup
Config Reg [3:7] = 0b00010
Hold time skewed by CDM Reset Con-
hold
fig Reg [3:7] = 0b00010
MEM_CLK
MEM_CLK
t
valid
Control Signals
Active NOP READ NOPNOPNOPNOP NOP
t
hold
—t
t
mem_clk
*0.5 ns A5.17
0.4 ns A5.18
2.34 ns A5.19
mem_clk
*0.5+0.4 ns A5.16
Frees
data
MDQ (Data)
t
valid
MA (Address)
t
valid
MBA (Bank Selects)
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE
Row Column
t
hold
t
hold
setup
, MEM_CS, MEM_CS1 and CLK_EN
data
hold
Figure 7 Timing Diagram—DDR SDRAM Memory Read Timing
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