2 Features .......................................1
3 Electrical and Thermal
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Characteristics..............................5
I
4 Package Description ..................60
5 System Design Information ........69
6 Ordering Information ..................74
7 Document Revision History ........75
cale Semiconductor,
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NOTE:
The information in this document is subject to
change. For the latest data on the MPC5200, visit
www.mobilegt.com and proceed to the MPC5200
Product Summary Page.
1Overview
The MPC5200 integrates a high performance MPC603e series G2_LE core with a
rich set of peripheral functions focused on communications and systems
integration. The G2_LE core design is based on the PowerPC
MPC5200 incorporates an innovative BestComm I/O subsystem, which isolates
routine maintenance of peripheral functions from the embedded G2_LE core. The
MPC5200 contains a SDRAM/ DDR Memory Controller, a flexible External Bus
Interface, PCI Controller, USB, ATA, Ethernet, six Programmable Serial Controllers
(PSC), I
2
C, SPI, CAN, J1850, Timers, and GPIOs.
®
core architecture.
2Features
Key features are shown below.
•MPC603e series G2_LE core
— Superscalar architecture
o
— 760 MIPS at 400 MHz (-40 to +85
— 16 k Instruction cache, 16 k Data cache
— Double precision FPU
— Instruction and Data MMU
— Standard and Critical interrupt capability
•SDRAM / DDR Memory Interface
— up to 132-MHz operation
— SDRAM and DDR SDRAM support
— 256-MByte addressing range per CS, two CS available
— 32-bit data bus
— Built-in initialization and refresh
•Flexible multi-function External Bus Interface
— Supports interfacing to ROM/Flash/SRAM memories or other memory
mapped devices
C)
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Features
— 8 programmable Chip Selects
— Non multiplexed data access using 8/16/32 bit databus with up to 26-bit address
— Short or Long Burst capable
— Multiplexed data access using 8/16/32 bit databus with up to 25-bit address
— Version 2.2 PCI compatibility
— PCI initiator and target operation
— 32-bit PCI Address/Data bus
— 33- and 66-MHz operation
— PCI arbitration function
•ATA Controller
— Version 4 ATA compatible external interface—IDE Disk Drive connectivity
•BestComm DMA subsystem
— Intelligent virtual DMA Controller
— Dedicated DMA channels to control peripheral reception and transmission
— Local memory (SRAM 16 kBytes)
•6 Programmable Serial Controllers (PSC), configurable for the following:
— UART or RS232 interface
— CODEC interface for Soft Modem, Master/Slave CODEC Mode, I
— Full duplex SPI mode
— IrDA mode from 2400 bps to 4 Mbps
— Motorola Scalable Controller Area Network (MSCAN) architecture
— Implementation of version 2.0A/ B CAN protocol
— Standard and extended data frames
•J1850 Byte Data Link Controller (BDLC)
— J1850 Class B data communication network interface compatible and ISO compatible for low
speed (<125 kbps) serial data communications in automotive applications.
— Supports 4X mode, 41.6 kbps
— In-frame response (IFR) types 0, 1, 2, and 3 supported
2
C)
2
S and AC97
2MPC5200 Hardware Specifications M O T O R O L A
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•Systems level features
— Interrupt Controller supports four external interrupt request lines and 47 internal interrupt
sources
— GPIO/Timer functions
– Up to 56 total GPIO pins (depending on functional multiplexing selections ) that support a
variety of interrupt /WakeUp capabilities.
– Eight GPIO pins with timer capability supporting input capture, output compare, and pulse
width modulation (PWM) functions
— Real-time Clock with one-second resolution
— Systems Protection ( watch dog timer, bus monitor )
— Individual control of functional block clock sources
— Power management: Nap, Doze, Sleep, Deep Sleep modes
— Support of WakeUp from low power modes by different sources (GPIO, RTC, CAN)
•Test/ Debug features
— JTAG (IEEE 1149.1 test access port )
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— Common On-chip Processor (COP ) debug port
•On-board PLL and clock generation
Features
cale Semiconductor,
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Figure 1 shows a simplified MPC5200 block diagram.
MOTOROLAMPC5200 Hardware Specifications 3
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Features
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Bus
Local
MSCAN
2x
J1850
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SDRAM / DDR
Systems Interface Unit (SIU )
Real-Time Clock
SDRAM / DDR
Memory Controller
USB
2x
SPI
System Functions
Interrupt Controller
GPIO/Timers
Local Plus Controller
PCI Bus Controller
BestComm DMA
SRAM 16K
ATA Host Controller
I2C
2x
Ethernet
PSC
6x
CommBus
603
G2_LE Core
Figure 1 Simplified Block Diagram—MPC5200
4MPC5200 Hardware Specifications M O T O R O L A
Interface
JTAG / COP
Generation
Reset / Clock
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Electrical and Thermal Characteristics
3Electrical and Thermal Characteristics
3.1DC Electrical Characteristics
3.1.1 Absolute Maximum Ratings
The tables in this section describe the MPC5200 DC Electrical characteristics. Table 1 gives the absolute
maximum ratings.
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cale Semiconductor,
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Table 1 Absolute Maximum Ratings
CharacteristicSymbolMinMaxUnitSpecID
Supply voltage - G2_LE core and peripheral logicVDD_CORE–0.31.8VD1.1
Supply voltage - I/O buffersVDD_IO,
VDD_MEM_IO
Supply voltage - System APLLSYS_PLL_AVDD–0.32.1VD1.3
Supply voltage - G2_LE APLLCORE_PLL_AVDD–0.32.1VD1.4
Input voltage (VDD_IO)Vin–0.3VDD_IO + 0.3VD1.5
Input voltage (VDD_MEM_IO)Vin–0.3VDD_MEM_IO
Input voltage overshoot Vinos–1.0VD1.7
Input voltage undershoot Vinus–1.0VD1.8
Storage temperature rangeTstg–55150
1Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed. Stresses
beyond those listed may affect device reliability or cause permanent damage.
1
–0.33.6VD1.2
VD1.6
+ 0.3
o
D1.9
C
3.1.2 Recommended Operating Conditions
Table 2 gives the recommended operating conditions.
Table 2 Recommended Operating Conditions
CharacteristicSymbol
Supply voltage - G2_LE core and peripheral logic
Supply voltage - standard I/O buffersVDD_IO3.03.6VD2.2
Supply voltage - memory I/ O buffers
(SDR)
Supply voltage - memory I/O buffers
(DDR)
VDD_CORE1.421.58VD2.1
VDD_MEM_IO
VDD_MEM_IO
SDR
DDR
1
Min
3.03.6VD2.3
2.422.63VD2.4
Max
1
UnitSpecID
Supply voltage - System APLLSYS_PLL_AVDD1.421.58VD2.5
Supply voltage - G2_LE APLLCORE_PLL_AVDD1.421.58VD2.6
Input voltage - standard I/O buffersVin0VDD_IOVD2.7
1Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive.
2See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 51.
3All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to main-
tain the power supply within the specified voltage range.
Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this limit
can cause disruption of normal operation.
IOH is driver dependent
VDD_IO, VDD_IO_MEM
IOH is driver dependent
IOL is driver dependent
VDD_IO, VDD_IO_MEM
IOL is driver dependent
PULLUP
VDD_IO
Vin = 0
PULLUP_MEM
VDD_IO_MEM
Vin = 0
PULLDOWN
VDD_IO
Vin = VDD_IO
VDD_IO_MEM
VDD_IO_MEM
SDR
2
SDR
2
DDR
2
SDR
2
DDR
I
I
I
INpu
I
INpu
I
INpd
V
V
OHDDR
V
V
OLDDR
I
CS
IN
IN
OH
OL
—+10µAD3.14
—+10µAD3.15
40109µAD3.16
41111µAD3.17
36106µAD3.18
2.4—VD3.19
1.7—VD3.20
—0.4VD3.21
—0.4VD3.22
-1.01.0mAD3.23
in
—15pFD3.24
Frees
Table 4 Drive Capability of MPC5200 Output Pins
Driver TypeSupply Voltage
DRV4VDD_IO = 3.3V44mAD3.25
DRV8VDD_IO = 3.3V88mAD3.26
DRV8_ODVDD_IO = 3.3V-8mAD3.27
DRV16_MEMVDD_IO_MEM = 3.3V1616mAD3.28
DRV16_MEMVDD_IO_MEM = 2.5V1616mAD3.29
PCIVDD_IO = 3.3V1616mAD3.30
I
OH
MOTOROLAMPC5200 Hardware Specifications 7
I
OL
Unit SpecID
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Electrical and Thermal Characteristics
3.1.4 Electrostatic Discharge
— CAUTION —
This device contains circuitry that protects against damage due to high-static voltage
or electrical fields. However, it is advised that normal precautions be taken to avoid
application of any voltages higher than maximum-rated voltages. Operational reliability
is enhanced if unused inputs are tied to an appropriate logic voltage level (i.e., either
GND or V
SymRatingMinMaxUnitSpecID
). Table 7 gives package thermal characteristics for this device.
CC
Table 5 ESD and Latch-Up Protection Characteristics
V
V
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V
I
I
3.1.5 Power Dissipation
Power dissipation of the MPC5200 is caused by 3 different components: the dissipation of the internal or
core digital logic (supplied by VDD_CORE), the dissipation of the analog circuitry (supplied by
SYS_PLL_AVDD and CORE_PLL_AVDD) and the dissipation of the IO logic (supplied by VDD_IO_MEM
and VDD_IO). Table 6 details typical measured core and analog power dissipation figures for a range of
operating modes. However, the dissipation due to the switching of the IO pins can not be given in general,
but must be calculated by the user for each application case using the following formula
cale Semiconductor,
Human Body Model (HBM)—JEDEC JESD22-A114-B2000—VD4.1
HBM
Machine Model (MM) —JEDEC JESD22-A115200—VD4.2
MM
Charge Device Model (CDM)— JEDEC JESD22-C101500—VD4.3
CDM
Latch-up Current at TA=85oC
LAT
positive
negative
Latch-up Current at TA=27oC
LAT
positive
negative
P
IO
P
IOint
∑
M
N
+CVDD_IO
+100
-100
+200
-200
2
f×××=
—mA
—mA
D4.4
D4.5
Frees
where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the
IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage.
The total power consumption of the MPC5200 processor
P
total
must not exceed the value, which would cause the maximum junction temperature to be exceeded.
8MPC5200 Hardware Specifications M O T O R O L A
P
++=
corePanalogPIO
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Electrical and Thermal Characteristics
Table 6 Power Dissipation
Core Power Supply (VDD_CORE)
SYS_XTAL/XLB/PCI/IPG/CORE (MHz)
TypTyp
SpecID
UnitNotes33/66/33/33/26433/132/66/132/396
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cale Semiconductor,
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Operational727.51080mW
Doze—600mW
Nap—225mW
Sleep—225mW
Deep-Sleep52.552.5mW
PLL Power Supplies (SYS_PLL_AVDD, CORE_PLL_AVDD)
ModeTypUnitNotes
Typical2mW
Unloaded I/O Power Supplies (VDD_IO, VDD_MEM_IO
ModeTypUnitNotes
Typical33mW
1Typical core power is measured at VDD_CORE = 1.5 V, Tj = 25 C
2Operational power is measured while running an entirely cache-resident program with floating-point multiplication
instructions in parallel with a continuous PCI transaction via BestComm.
3Doze power is measured with the G2_LE core in Doze mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
4Nap power is measured with the G2_LE core in Nap mode, the stem oscillator, System PLL and Core PLL are ac-
tive, all other system modules are inactive
5Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL and Core PLL are
active, all other system modules are inactive
6Deep-Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL, Core PLL
and all other system modules are inactive
7Typical PLL power is measured at SYS_PLL_AVDD = CORE_PLL_AVDD = 1.5 V, Tj = 25 C
8IO power figures given in the table represent the worst case scenario. For the mem_io rail connected to 2.5V the
IO power is expected to be lower and bounded by the worst case with VDD_MEM_IO connected to 3.3V.
9Unloaded typical I/O power is measured in Deep-Sleep mode at VDD_IO = VDD_MEM_IO
8
)
1, 2
1, 3
1, 4
1, 5
1, 6
7
9
= 3.3 V, Tj = 25 C
SDR
D5.1
D5.2
D5.3
D5.4
D5.5
D5.6
D5.7
MOTOROLAMPC5200 Hardware Specifications 9
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Electrical and Thermal Characteristics
3.1.6 Thermal Characteristics
Table 7 Thermal Resistance Data
RatingValueUnitNotesSpecID
Junction to Ambient
Natural Convection
Junction to Ambient
Natural Convection
Junction to Ambient
(@200 ft/min)
Junction to Ambient
(@200 ft/min)
Junction to BoardR
Junction to Case R
Junction to Package Top Natural ConvectionΨ
1Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3Per JEDEC JESD51-6 with the board horizontal.
4Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is mea-
sured on the top surface of the board near the package.
5Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is
written as Psi-JT.
Single layer board
(1s)
Four layer board (2s2p)R
Single layer board
(1s)
Four layer board
(2s2p)
R
R
R
θJA
θJMA
θJMA
θJMA
θJB
θJC
JT
30°C/W 1,
22°C/W1,
24°C/W1,
19°C/W1,
14°C/W
8°C/W
2°C/W
3.1.6.1Heat Dissipation
An estimation of the chip-junction temperature, TJ, can be obtained from the following equation:
where:
T
R
P
TJ=TA+(R
= ambient temperature for the package ( ºC)
A
= junction to ambient thermal resistance (º C/W )
θJA
= power dissipation in package (W)
D
θJA
× P
) Eqn. 1
D
2
3
3
3
4
5
6
D6.1
D6.2
D6.3
D6.4
D6.5
D6.6
D6.7
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy
estimation of thermal performance. Unfortunately, there are two values in common usage: the value
determined on a single layer board, and the value obtained on a board with two planes. For packages such
as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power
dissipated by other components on the board. The value obtained on a single layer board is appropriate for
the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated.
Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal
resistance and a case to ambient thermal resistance:
10MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
R
where:
R
= junction to ambient thermal resistance ( ºC/ W)
θJA
R
= junction to case thermal resistance (ºC/ W)
θJC
R
= case to ambient thermal resistance (ºC/ W)
θCA
R
is device related and cannot be influenced by the user. The user controls the thermal environment to
θJC
change the case to ambient thermal resistance, R
around the device, add a heat sink, change the mounting arrangement on printed circuit board, or change
the thermal dissipation on the printed circuit board surrounding the device. This description is most useful
for ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink
to ambient. For most packages, a better model is required.
A more accurate thermal model can be constructed from the junction to board thermal resistance and the
junction to case thermal resistance
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I
used or where a substantial amount of heat is dissipated from the top of the package. The junction to
board thermal resistance describes the thermal performance when most of the heat is conducted to the
printed circuit board. This model can be used for either hand estimations or for a computational fluid
dynamics (CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (Ψ
measurement of the temperature at the top center of the package case using the following equation:
1-3
. The junction to case covers the situation where a heat sink will be
=R
θJA
) can be used to determine the junction temperature with a
JT
θJC+RθCA
. For instance, the user can change the air flow
θCA
Eqn. 2
cale Semiconductor,
Frees
TJ=T
where:
T
= thermocouple temperature on top of package (ºC)
T
Ψ
= thermal characterization parameter ( ºC/ W)
JT
P
= power dissipation in package ( W)
D
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over approximately one mm of wire extending from the junction. The
thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling
effects of the thermocouple wire.
+(ΨJT × P
T
) Eqn. 3
D
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Electrical and Thermal Characteristics
3.2Oscillator and PLL Electrical Characteristics
The MPC5200 System requires a system-level clock input SYS_XTAL. This clock input may be driven
directly from an external oscillator or with a crystal using the internal oscillator.
There is a separate oscillator for the independent Real-Time Clock (RTC) system.
The MPC5200 clock generation uses two phase locked loop (PLL) blocks.
•The system PLL (SYS_PLL) takes an external reference frequency and generates the internal
system clock. The system clock frequency is determined by the external reference frequency and
the settings of the SYS_PLL configuration.
•The G2_LE core PLL (CORE_PLL) generates a master clock for all of the CPU circuitry. The G2_LE
core clock frequency is determined by the system clock frequency and the settings of the
CORE_PLL configuration.
3.2.1 System Oscillator Electrical Characteristics
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Table 8 System Oscillator Electrical Characteristics
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
SYS_XTAL frequencyf
Oscillator start-up timet
sys_xtal
up_osc
15.633.335.0MHzO1.1
3.2.2 RTC Oscillator Electrical Characteristics
Table 9 RTC Oscillator Electrical Characteristics
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
RTC_XTAL frequencyf
rtc_xtal
——100µsO1.2
—32.768—kHzO2.1
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3.2.3 System PLL Electrical Characteristics
Table 10 System PLL Specifications
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
Electrical and Thermal Characteristics
SYS_XTAL frequencyf
SYS_XTAL cycle timeT
SYS_XTAL clock input jittert
System VCO frequencyf
System PLL relock timet
1The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency, CPU
(core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequen-
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cies.
2This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating frequency.
3Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
sys_xtal
sys_xtal
jitter
VCOsys
lock
cale Semiconductor,
1
1
2
1
3
15.633.335.0MHzO3.1
66.630.028.5nsO3.2
——150psO3.3
250533800MHzO3.4
——100µsO3.5
Frees
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Electrical and Thermal Characteristics
3.2.4 G2_LE Core PLL Electrical Characteristics
The internal clocking of the G2_LE core is generated from and synchronized to the system clock by means
of a voltage-controlled core PLL.
Table 11 G2_LE PLL Specifications
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
G2_LE frequencyf
G2_LE cycle timet
G2_LE VCO frequencyf
G2_LE input clock frequencyf
G2_LE input clock cycle timet
G2_LE input clock jittert
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G2_LE PLL relock timet
1The SYSCLK frequency and G2_LE PLL Configuration bits must be chosen such that the resulting system frequencies,
CPU (core) frequency, and G2_LE PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequencies.
2This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating frequency.
3Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
core
core
VCOcore
SYSCLK
SYSCLK
jitter
lock
cale Semiconductor,
1
1
1
2
3
50—550MHzO4.1
2.85—40.0nsO4.2
400—1200MHzO4.3
25—367MHzO4.4
2.73—50.0nsO4.5
——150psO4.6
——100µsO4.7
Frees
14MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3AC Electrical Characteristics
Hyperlinks to the indicated timing specification sections are provided below.
•AC Operating Frequency Data•USB
•Clock AC Specifications•SPI
•Resets•MSCAN
•External Interrupts
•SDRAM•J1850
•PCI•PSC
•Local Plus Bus•GPIOs and Timers
•ATA•IEEE 1149.1 (JTAG) AC Specifications
•Ethernet
2
•I
C
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cale Semiconductor,
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AC Test Timing Conditions:
Unless otherwise noted, all test conditions are as follows:
o
•TA = -40 to 85
•Tj = -40 to 115
•VDD_CORE = 1.42 to 1.58 V
VDD_IO = 3.0 to 3.6 V
•Input conditions:
All Inputs: tr, tf <= TBD
•Output Loading:
All Outputs: 50 pF
C
o
C
3.3.1 AC Operating Frequency Data
Table 12 provides the operating frequency information for the MPC5200.
Table 12 Clock Frequencies
MinMaxUnitsSpecID
1G2_LE Processor Core—400MHzA1.1
2SDRAM Clock—133MHzA1.2
3XL Bus Clock—133MHzA1.3
4IP Bus Clock—133MHzA1.4
5PCI / Local Plus Bus Clock—66MHzA1.5
6PLL Input Range15.635MHzA1.6
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Electrical and Thermal Characteristics
3.3.2 Clock AC Specifications
t
CYCLE
t
FAL L
SYSCLK
V
t
DUTY
M
V
t
DUTY
M
t
RISE
CV
IH
V
M
CV
IL
Figure 2 Timing Diagram—SYS_XTAL_IN
Table 13 SYS_XTAL_IN Timing
SymDescriptionMinMaxUnits SpecID
t
CYCLE
SYS_XTAL_IN cycle time.
1
28.664.1nsA2.1
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t
RISE
t
FALL
t
DUTY
CV
CV
1CAUTION—The SYS_XTAL_IN frequency and system PLL_CFG[0-6] settings must be chosen such that the resulting
2SYS_XTAL_IN duty cycle is measured at VM.
SYS_XTAL_IN rise time.—5.0nsA2.2
SYS_XTAL_IN fall time.—5.0nsA2.3
SYS_XTAL_IN duty cycle (measured at VM). 2
SYS_XTAL_IN input voltage high2.0—VA2.5
IH
SYS_XTAL_IN input voltage low—0.8VA2.6
IL
system frequencies do not exceed their respective maximum or minimum operating frequencies. See the MPC5200
User Manual [1].
40.060.0%A2.4
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3.3.3 Resets
The MPC5200 has three reset pins:
Electrical and Thermal Characteristics
•PORESET
•HRESET
•SRESET
These signals are asynchronous I /O signals and can be asserted at any time. The input side uses a
Schmitt trigger and requires the same input characteristics as other MPC5200 inputs, as specified in the
DC Electrical Specifications section. Table 14 specifies the pulse widths of the Reset inputs.
- Power on Reset
- Hard Reset
- Software Reset
Table 14 Reset Pulse Width
NameDescriptionMin Pulse Width
PORESET
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HRESET
SRESET
Notes:
1.For PORESET
wards its minimum pulse width equals the minimum given for HRESET
2.The t
3.For t
4.For t
5.Following the deassertion of PORESET
6.The deassertion of HRESET
4096 clock cycles.
Power On Reset t
Hardware Reset4 clock cycles—SYS_XTAL_INA3.2
Software Reset4 clock cycles—SYS_XTAL_INA3.3
the value of the minimum pulse width reflects the power on sequence. If PORESET is asserted after-
VDD_stable
lock,
up_osc,
describes the time which is needed to get all power supplies stable.
refer to the Oscillator/PLL section of this specification for further details.
refer to the Oscillator/PLL section of this specification for further details.
VDD_stable+tup_osc+tlock
, HRESET and SRESET remain low for 4096 reference clock cycles.
for at least the minimum pulse width forces the internal resets to be active for an additional
NOTE:
As long as VDD is not stable the HRESET
Table 15 Reset Rise / Fall Timing
DescriptionMinMax UnitSpecID
cale Semiconductor,
PORESET
PORESET
HRESET
fall time—1msA3.4
rise time—1msA3.5
fall time—TBDnsA3.6
Max Pulse
Width
—SYS_XTAL_INA3.1
related to the same reference clock.
Reference ClockSpecID
output is not stable.
Frees
HRESET
SRESET
SRESET
For additional information, see the MPC5200 User Manual [1].
MOTOROLAMPC5200 Hardware Specifications 1 7
rise time—TBDnsA3.7
fall time—TBDnsA3.8
rise time—TBDnsA3.9
NOTE:
Make sure that the PORESET
has no filter to prevent them from getting into the chip.
does not carry any glitches. The MPC5200
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Electrical and Thermal Characteristics
3.3.3.1Reset Configuration Word
During reset (HRESET and PORESET) the Reset Configuration Word is cached in the related Reset
Configuration Word Register with each rising edge of the SYS_XTAL signal. If both resets (HRESET
PORESET
(see Figure 3).
) are inactive (high), the contents of this register get locked after two further SYS_XTAL cycles
SYS_XTAL
PORESET
HRESET
RST_CFG_WRD
4096 clocks2 clocks
and
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cale Semiconductor,
Frees
sample
Beware of changing the values on the pins of the reset configuration word
after the deassertion of PORESET
may change the internal clock ratios and so extend the PLL locking
process.
sample
sample
Figure 3 Reset Configuration Word Locking
samplesample
sample
sample
samplesample
NOTE:
. This may cause problems because it
sample
sample
sample
LOCK
18MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3.4 External Interrupts
The MPC5200 provides three different kinds of external interrupts:
•Four IRQ interrupts
•Eight GPIO interrupts with simple interrupt capability (not available in power-down mode)
•Eight WakeUp interrupts (special GPIO pins)
The propagation of these three kinds of interrupts to the core is shown in the following graphic:
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cale Semiconductor,
Frees
IRQ0
8 GPIOs
8 GPIOsGPIO WakeUp
IRQ1
IRQ2
IRQ3
Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of
external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table
specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock
Distribution Module (see Note Table 16).
1)The frequency of IP_CLK depends on register settings in Clock Distribution Module. See the MPC5200 User Manual [1].
2) The interrupt latency descriptions in the table above are related to non competitive, non masked but enabled external
interrupt sources. Take care of interrupt prioritization which may increase the latencies.
Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of
these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Table 17 Minimum pulse width for external interrupts to be recognized
NameMin Pulse Width Max Pulse Width Reference Clock SpecID
All external interrupts (IRQs, GPIOs)> 1 clock cycle—IP_CLKA4.22
Notes:
1)The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200 User
Manual [1] for further information.
2)If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second
interrupt will not be recognized at all.
Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its
associated interrupt service routine also depends on the following conditions: To get a minimum interrupt
service response time, it is recommended to enable the instruction cache and set up the maximum core
clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is
advisable to execute an interrupt handler, which has been implemented in assembly code.
The SDRAM Memory Controller uses an internally skewed clock for reading DDR memory. The
programmable bits in the Reset Configuration Register used to account for unknown board delays are in
the CDM module. The internal read clock can be delayed up to 3 ns under worst operating conditions in 32
increments of 95 ps, (1.4 ns in 45 ps increments under best case operating conditions) by programming
the CDM Reset Configuration Register tap delay bits. Note: These bits in the CDM Reset Configuration
register are not ‘reset configured’ but have a hard coded reset value and are writable during operation.
Table 20 DDR SDRAM Memory Read Timing
SymDescriptionMinMaxUnits SpecID
t
mem_clk
t
valid
t
hold
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data
data
cale Semiconductor,
MDQS (Data Strobe)
MEM_CLK period7.5—nsA5.15
Control Signals, Address and MBA
valid after rising edge of MEM_CLK
Control Signals, Address and MBA
hold after rising edge of MEM_CLK
Setup time skewed by CDM Reset
setup
Config Reg [3:7] = 0b00010
Hold time skewed by CDM Reset Con-
hold
fig Reg [3:7] = 0b00010
MEM_CLK
MEM_CLK
t
valid
Control Signals
ActiveNOPREADNOPNOPNOPNOPNOP
t
hold
—t
t
mem_clk
*0.5—nsA5.17
—0.4nsA5.18
2.34—nsA5.19
mem_clk
*0.5+0.4nsA5.16
Frees
data
MDQ (Data)
t
valid
MA (Address)
t
valid
MBA (Bank Selects)
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE