2 Features .......................................1
3 Electrical and Thermal
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Characteristics..............................5
I
4 Package Description ..................60
5 System Design Information ........69
6 Ordering Information ..................74
7 Document Revision History ........75
cale Semiconductor,
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NOTE:
The information in this document is subject to
change. For the latest data on the MPC5200, visit
www.mobilegt.com and proceed to the MPC5200
Product Summary Page.
1Overview
The MPC5200 integrates a high performance MPC603e series G2_LE core with a
rich set of peripheral functions focused on communications and systems
integration. The G2_LE core design is based on the PowerPC
MPC5200 incorporates an innovative BestComm I/O subsystem, which isolates
routine maintenance of peripheral functions from the embedded G2_LE core. The
MPC5200 contains a SDRAM/ DDR Memory Controller, a flexible External Bus
Interface, PCI Controller, USB, ATA, Ethernet, six Programmable Serial Controllers
(PSC), I
2
C, SPI, CAN, J1850, Timers, and GPIOs.
®
core architecture.
2Features
Key features are shown below.
•MPC603e series G2_LE core
— Superscalar architecture
o
— 760 MIPS at 400 MHz (-40 to +85
— 16 k Instruction cache, 16 k Data cache
— Double precision FPU
— Instruction and Data MMU
— Standard and Critical interrupt capability
•SDRAM / DDR Memory Interface
— up to 132-MHz operation
— SDRAM and DDR SDRAM support
— 256-MByte addressing range per CS, two CS available
— 32-bit data bus
— Built-in initialization and refresh
•Flexible multi-function External Bus Interface
— Supports interfacing to ROM/Flash/SRAM memories or other memory
mapped devices
C)
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Features
— 8 programmable Chip Selects
— Non multiplexed data access using 8/16/32 bit databus with up to 26-bit address
— Short or Long Burst capable
— Multiplexed data access using 8/16/32 bit databus with up to 25-bit address
— Version 2.2 PCI compatibility
— PCI initiator and target operation
— 32-bit PCI Address/Data bus
— 33- and 66-MHz operation
— PCI arbitration function
•ATA Controller
— Version 4 ATA compatible external interface—IDE Disk Drive connectivity
•BestComm DMA subsystem
— Intelligent virtual DMA Controller
— Dedicated DMA channels to control peripheral reception and transmission
— Local memory (SRAM 16 kBytes)
•6 Programmable Serial Controllers (PSC), configurable for the following:
— UART or RS232 interface
— CODEC interface for Soft Modem, Master/Slave CODEC Mode, I
— Full duplex SPI mode
— IrDA mode from 2400 bps to 4 Mbps
— Motorola Scalable Controller Area Network (MSCAN) architecture
— Implementation of version 2.0A/ B CAN protocol
— Standard and extended data frames
•J1850 Byte Data Link Controller (BDLC)
— J1850 Class B data communication network interface compatible and ISO compatible for low
speed (<125 kbps) serial data communications in automotive applications.
— Supports 4X mode, 41.6 kbps
— In-frame response (IFR) types 0, 1, 2, and 3 supported
2
C)
2
S and AC97
2MPC5200 Hardware Specifications M O T O R O L A
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•Systems level features
— Interrupt Controller supports four external interrupt request lines and 47 internal interrupt
sources
— GPIO/Timer functions
– Up to 56 total GPIO pins (depending on functional multiplexing selections ) that support a
variety of interrupt /WakeUp capabilities.
– Eight GPIO pins with timer capability supporting input capture, output compare, and pulse
width modulation (PWM) functions
— Real-time Clock with one-second resolution
— Systems Protection ( watch dog timer, bus monitor )
— Individual control of functional block clock sources
— Power management: Nap, Doze, Sleep, Deep Sleep modes
— Support of WakeUp from low power modes by different sources (GPIO, RTC, CAN)
•Test/ Debug features
— JTAG (IEEE 1149.1 test access port )
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— Common On-chip Processor (COP ) debug port
•On-board PLL and clock generation
Features
cale Semiconductor,
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Figure 1 shows a simplified MPC5200 block diagram.
MOTOROLAMPC5200 Hardware Specifications 3
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Features
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Bus
Local
MSCAN
2x
J1850
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SDRAM / DDR
Systems Interface Unit (SIU )
Real-Time Clock
SDRAM / DDR
Memory Controller
USB
2x
SPI
System Functions
Interrupt Controller
GPIO/Timers
Local Plus Controller
PCI Bus Controller
BestComm DMA
SRAM 16K
ATA Host Controller
I2C
2x
Ethernet
PSC
6x
CommBus
603
G2_LE Core
Figure 1 Simplified Block Diagram—MPC5200
4MPC5200 Hardware Specifications M O T O R O L A
Interface
JTAG / COP
Generation
Reset / Clock
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Electrical and Thermal Characteristics
3Electrical and Thermal Characteristics
3.1DC Electrical Characteristics
3.1.1 Absolute Maximum Ratings
The tables in this section describe the MPC5200 DC Electrical characteristics. Table 1 gives the absolute
maximum ratings.
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cale Semiconductor,
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Table 1 Absolute Maximum Ratings
CharacteristicSymbolMinMaxUnitSpecID
Supply voltage - G2_LE core and peripheral logicVDD_CORE–0.31.8VD1.1
Supply voltage - I/O buffersVDD_IO,
VDD_MEM_IO
Supply voltage - System APLLSYS_PLL_AVDD–0.32.1VD1.3
Supply voltage - G2_LE APLLCORE_PLL_AVDD–0.32.1VD1.4
Input voltage (VDD_IO)Vin–0.3VDD_IO + 0.3VD1.5
Input voltage (VDD_MEM_IO)Vin–0.3VDD_MEM_IO
Input voltage overshoot Vinos–1.0VD1.7
Input voltage undershoot Vinus–1.0VD1.8
Storage temperature rangeTstg–55150
1Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed. Stresses
beyond those listed may affect device reliability or cause permanent damage.
1
–0.33.6VD1.2
VD1.6
+ 0.3
o
D1.9
C
3.1.2 Recommended Operating Conditions
Table 2 gives the recommended operating conditions.
Table 2 Recommended Operating Conditions
CharacteristicSymbol
Supply voltage - G2_LE core and peripheral logic
Supply voltage - standard I/O buffersVDD_IO3.03.6VD2.2
Supply voltage - memory I/ O buffers
(SDR)
Supply voltage - memory I/O buffers
(DDR)
VDD_CORE1.421.58VD2.1
VDD_MEM_IO
VDD_MEM_IO
SDR
DDR
1
Min
3.03.6VD2.3
2.422.63VD2.4
Max
1
UnitSpecID
Supply voltage - System APLLSYS_PLL_AVDD1.421.58VD2.5
Supply voltage - G2_LE APLLCORE_PLL_AVDD1.421.58VD2.6
Input voltage - standard I/O buffersVin0VDD_IOVD2.7
1Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive.
2See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 51.
3All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to main-
tain the power supply within the specified voltage range.
Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this limit
can cause disruption of normal operation.
IOH is driver dependent
VDD_IO, VDD_IO_MEM
IOH is driver dependent
IOL is driver dependent
VDD_IO, VDD_IO_MEM
IOL is driver dependent
PULLUP
VDD_IO
Vin = 0
PULLUP_MEM
VDD_IO_MEM
Vin = 0
PULLDOWN
VDD_IO
Vin = VDD_IO
VDD_IO_MEM
VDD_IO_MEM
SDR
2
SDR
2
DDR
2
SDR
2
DDR
I
I
I
INpu
I
INpu
I
INpd
V
V
OHDDR
V
V
OLDDR
I
CS
IN
IN
OH
OL
—+10µAD3.14
—+10µAD3.15
40109µAD3.16
41111µAD3.17
36106µAD3.18
2.4—VD3.19
1.7—VD3.20
—0.4VD3.21
—0.4VD3.22
-1.01.0mAD3.23
in
—15pFD3.24
Frees
Table 4 Drive Capability of MPC5200 Output Pins
Driver TypeSupply Voltage
DRV4VDD_IO = 3.3V44mAD3.25
DRV8VDD_IO = 3.3V88mAD3.26
DRV8_ODVDD_IO = 3.3V-8mAD3.27
DRV16_MEMVDD_IO_MEM = 3.3V1616mAD3.28
DRV16_MEMVDD_IO_MEM = 2.5V1616mAD3.29
PCIVDD_IO = 3.3V1616mAD3.30
I
OH
MOTOROLAMPC5200 Hardware Specifications 7
I
OL
Unit SpecID
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Electrical and Thermal Characteristics
3.1.4 Electrostatic Discharge
— CAUTION —
This device contains circuitry that protects against damage due to high-static voltage
or electrical fields. However, it is advised that normal precautions be taken to avoid
application of any voltages higher than maximum-rated voltages. Operational reliability
is enhanced if unused inputs are tied to an appropriate logic voltage level (i.e., either
GND or V
SymRatingMinMaxUnitSpecID
). Table 7 gives package thermal characteristics for this device.
CC
Table 5 ESD and Latch-Up Protection Characteristics
V
V
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V
I
I
3.1.5 Power Dissipation
Power dissipation of the MPC5200 is caused by 3 different components: the dissipation of the internal or
core digital logic (supplied by VDD_CORE), the dissipation of the analog circuitry (supplied by
SYS_PLL_AVDD and CORE_PLL_AVDD) and the dissipation of the IO logic (supplied by VDD_IO_MEM
and VDD_IO). Table 6 details typical measured core and analog power dissipation figures for a range of
operating modes. However, the dissipation due to the switching of the IO pins can not be given in general,
but must be calculated by the user for each application case using the following formula
cale Semiconductor,
Human Body Model (HBM)—JEDEC JESD22-A114-B2000—VD4.1
HBM
Machine Model (MM) —JEDEC JESD22-A115200—VD4.2
MM
Charge Device Model (CDM)— JEDEC JESD22-C101500—VD4.3
CDM
Latch-up Current at TA=85oC
LAT
positive
negative
Latch-up Current at TA=27oC
LAT
positive
negative
P
IO
P
IOint
∑
M
N
+CVDD_IO
+100
-100
+200
-200
2
f×××=
—mA
—mA
D4.4
D4.5
Frees
where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the
IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage.
The total power consumption of the MPC5200 processor
P
total
must not exceed the value, which would cause the maximum junction temperature to be exceeded.
8MPC5200 Hardware Specifications M O T O R O L A
P
++=
corePanalogPIO
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Electrical and Thermal Characteristics
Table 6 Power Dissipation
Core Power Supply (VDD_CORE)
SYS_XTAL/XLB/PCI/IPG/CORE (MHz)
TypTyp
SpecID
UnitNotes33/66/33/33/26433/132/66/132/396
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cale Semiconductor,
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Operational727.51080mW
Doze—600mW
Nap—225mW
Sleep—225mW
Deep-Sleep52.552.5mW
PLL Power Supplies (SYS_PLL_AVDD, CORE_PLL_AVDD)
ModeTypUnitNotes
Typical2mW
Unloaded I/O Power Supplies (VDD_IO, VDD_MEM_IO
ModeTypUnitNotes
Typical33mW
1Typical core power is measured at VDD_CORE = 1.5 V, Tj = 25 C
2Operational power is measured while running an entirely cache-resident program with floating-point multiplication
instructions in parallel with a continuous PCI transaction via BestComm.
3Doze power is measured with the G2_LE core in Doze mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
4Nap power is measured with the G2_LE core in Nap mode, the stem oscillator, System PLL and Core PLL are ac-
tive, all other system modules are inactive
5Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL and Core PLL are
active, all other system modules are inactive
6Deep-Sleep power is measured with the G2_LE core in Sleep mode, the stem oscillator, System PLL, Core PLL
and all other system modules are inactive
7Typical PLL power is measured at SYS_PLL_AVDD = CORE_PLL_AVDD = 1.5 V, Tj = 25 C
8IO power figures given in the table represent the worst case scenario. For the mem_io rail connected to 2.5V the
IO power is expected to be lower and bounded by the worst case with VDD_MEM_IO connected to 3.3V.
9Unloaded typical I/O power is measured in Deep-Sleep mode at VDD_IO = VDD_MEM_IO
8
)
1, 2
1, 3
1, 4
1, 5
1, 6
7
9
= 3.3 V, Tj = 25 C
SDR
D5.1
D5.2
D5.3
D5.4
D5.5
D5.6
D5.7
MOTOROLAMPC5200 Hardware Specifications 9
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Electrical and Thermal Characteristics
3.1.6 Thermal Characteristics
Table 7 Thermal Resistance Data
RatingValueUnitNotesSpecID
Junction to Ambient
Natural Convection
Junction to Ambient
Natural Convection
Junction to Ambient
(@200 ft/min)
Junction to Ambient
(@200 ft/min)
Junction to BoardR
Junction to Case R
Junction to Package Top Natural ConvectionΨ
1Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3Per JEDEC JESD51-6 with the board horizontal.
4Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is mea-
sured on the top surface of the board near the package.
5Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is
written as Psi-JT.
Single layer board
(1s)
Four layer board (2s2p)R
Single layer board
(1s)
Four layer board
(2s2p)
R
R
R
θJA
θJMA
θJMA
θJMA
θJB
θJC
JT
30°C/W 1,
22°C/W1,
24°C/W1,
19°C/W1,
14°C/W
8°C/W
2°C/W
3.1.6.1Heat Dissipation
An estimation of the chip-junction temperature, TJ, can be obtained from the following equation:
where:
T
R
P
TJ=TA+(R
= ambient temperature for the package ( ºC)
A
= junction to ambient thermal resistance (º C/W )
θJA
= power dissipation in package (W)
D
θJA
× P
) Eqn. 1
D
2
3
3
3
4
5
6
D6.1
D6.2
D6.3
D6.4
D6.5
D6.6
D6.7
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy
estimation of thermal performance. Unfortunately, there are two values in common usage: the value
determined on a single layer board, and the value obtained on a board with two planes. For packages such
as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power
dissipated by other components on the board. The value obtained on a single layer board is appropriate for
the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated.
Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal
resistance and a case to ambient thermal resistance:
10MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
R
where:
R
= junction to ambient thermal resistance ( ºC/ W)
θJA
R
= junction to case thermal resistance (ºC/ W)
θJC
R
= case to ambient thermal resistance (ºC/ W)
θCA
R
is device related and cannot be influenced by the user. The user controls the thermal environment to
θJC
change the case to ambient thermal resistance, R
around the device, add a heat sink, change the mounting arrangement on printed circuit board, or change
the thermal dissipation on the printed circuit board surrounding the device. This description is most useful
for ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink
to ambient. For most packages, a better model is required.
A more accurate thermal model can be constructed from the junction to board thermal resistance and the
junction to case thermal resistance
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I
used or where a substantial amount of heat is dissipated from the top of the package. The junction to
board thermal resistance describes the thermal performance when most of the heat is conducted to the
printed circuit board. This model can be used for either hand estimations or for a computational fluid
dynamics (CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (Ψ
measurement of the temperature at the top center of the package case using the following equation:
1-3
. The junction to case covers the situation where a heat sink will be
=R
θJA
) can be used to determine the junction temperature with a
JT
θJC+RθCA
. For instance, the user can change the air flow
θCA
Eqn. 2
cale Semiconductor,
Frees
TJ=T
where:
T
= thermocouple temperature on top of package (ºC)
T
Ψ
= thermal characterization parameter ( ºC/ W)
JT
P
= power dissipation in package ( W)
D
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over approximately one mm of wire extending from the junction. The
thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling
effects of the thermocouple wire.
+(ΨJT × P
T
) Eqn. 3
D
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Electrical and Thermal Characteristics
3.2Oscillator and PLL Electrical Characteristics
The MPC5200 System requires a system-level clock input SYS_XTAL. This clock input may be driven
directly from an external oscillator or with a crystal using the internal oscillator.
There is a separate oscillator for the independent Real-Time Clock (RTC) system.
The MPC5200 clock generation uses two phase locked loop (PLL) blocks.
•The system PLL (SYS_PLL) takes an external reference frequency and generates the internal
system clock. The system clock frequency is determined by the external reference frequency and
the settings of the SYS_PLL configuration.
•The G2_LE core PLL (CORE_PLL) generates a master clock for all of the CPU circuitry. The G2_LE
core clock frequency is determined by the system clock frequency and the settings of the
CORE_PLL configuration.
3.2.1 System Oscillator Electrical Characteristics
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Table 8 System Oscillator Electrical Characteristics
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
SYS_XTAL frequencyf
Oscillator start-up timet
sys_xtal
up_osc
15.633.335.0MHzO1.1
3.2.2 RTC Oscillator Electrical Characteristics
Table 9 RTC Oscillator Electrical Characteristics
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
RTC_XTAL frequencyf
rtc_xtal
——100µsO1.2
—32.768—kHzO2.1
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3.2.3 System PLL Electrical Characteristics
Table 10 System PLL Specifications
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
Electrical and Thermal Characteristics
SYS_XTAL frequencyf
SYS_XTAL cycle timeT
SYS_XTAL clock input jittert
System VCO frequencyf
System PLL relock timet
1The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency, CPU
(core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequen-
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cies.
2This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating frequency.
3Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
sys_xtal
sys_xtal
jitter
VCOsys
lock
cale Semiconductor,
1
1
2
1
3
15.633.335.0MHzO3.1
66.630.028.5nsO3.2
——150psO3.3
250533800MHzO3.4
——100µsO3.5
Frees
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Electrical and Thermal Characteristics
3.2.4 G2_LE Core PLL Electrical Characteristics
The internal clocking of the G2_LE core is generated from and synchronized to the system clock by means
of a voltage-controlled core PLL.
Table 11 G2_LE PLL Specifications
CharacteristicSymbolNotesMinTypicalMaxUnitSpecID
G2_LE frequencyf
G2_LE cycle timet
G2_LE VCO frequencyf
G2_LE input clock frequencyf
G2_LE input clock cycle timet
G2_LE input clock jittert
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G2_LE PLL relock timet
1The SYSCLK frequency and G2_LE PLL Configuration bits must be chosen such that the resulting system frequencies,
CPU (core) frequency, and G2_LE PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequencies.
2This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating frequency.
3Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
core
core
VCOcore
SYSCLK
SYSCLK
jitter
lock
cale Semiconductor,
1
1
1
2
3
50—550MHzO4.1
2.85—40.0nsO4.2
400—1200MHzO4.3
25—367MHzO4.4
2.73—50.0nsO4.5
——150psO4.6
——100µsO4.7
Frees
14MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3AC Electrical Characteristics
Hyperlinks to the indicated timing specification sections are provided below.
•AC Operating Frequency Data•USB
•Clock AC Specifications•SPI
•Resets•MSCAN
•External Interrupts
•SDRAM•J1850
•PCI•PSC
•Local Plus Bus•GPIOs and Timers
•ATA•IEEE 1149.1 (JTAG) AC Specifications
•Ethernet
2
•I
C
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cale Semiconductor,
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AC Test Timing Conditions:
Unless otherwise noted, all test conditions are as follows:
o
•TA = -40 to 85
•Tj = -40 to 115
•VDD_CORE = 1.42 to 1.58 V
VDD_IO = 3.0 to 3.6 V
•Input conditions:
All Inputs: tr, tf <= TBD
•Output Loading:
All Outputs: 50 pF
C
o
C
3.3.1 AC Operating Frequency Data
Table 12 provides the operating frequency information for the MPC5200.
Table 12 Clock Frequencies
MinMaxUnitsSpecID
1G2_LE Processor Core—400MHzA1.1
2SDRAM Clock—133MHzA1.2
3XL Bus Clock—133MHzA1.3
4IP Bus Clock—133MHzA1.4
5PCI / Local Plus Bus Clock—66MHzA1.5
6PLL Input Range15.635MHzA1.6
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Electrical and Thermal Characteristics
3.3.2 Clock AC Specifications
t
CYCLE
t
FAL L
SYSCLK
V
t
DUTY
M
V
t
DUTY
M
t
RISE
CV
IH
V
M
CV
IL
Figure 2 Timing Diagram—SYS_XTAL_IN
Table 13 SYS_XTAL_IN Timing
SymDescriptionMinMaxUnits SpecID
t
CYCLE
SYS_XTAL_IN cycle time.
1
28.664.1nsA2.1
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t
RISE
t
FALL
t
DUTY
CV
CV
1CAUTION—The SYS_XTAL_IN frequency and system PLL_CFG[0-6] settings must be chosen such that the resulting
2SYS_XTAL_IN duty cycle is measured at VM.
SYS_XTAL_IN rise time.—5.0nsA2.2
SYS_XTAL_IN fall time.—5.0nsA2.3
SYS_XTAL_IN duty cycle (measured at VM). 2
SYS_XTAL_IN input voltage high2.0—VA2.5
IH
SYS_XTAL_IN input voltage low—0.8VA2.6
IL
system frequencies do not exceed their respective maximum or minimum operating frequencies. See the MPC5200
User Manual [1].
40.060.0%A2.4
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3.3.3 Resets
The MPC5200 has three reset pins:
Electrical and Thermal Characteristics
•PORESET
•HRESET
•SRESET
These signals are asynchronous I /O signals and can be asserted at any time. The input side uses a
Schmitt trigger and requires the same input characteristics as other MPC5200 inputs, as specified in the
DC Electrical Specifications section. Table 14 specifies the pulse widths of the Reset inputs.
- Power on Reset
- Hard Reset
- Software Reset
Table 14 Reset Pulse Width
NameDescriptionMin Pulse Width
PORESET
nc...
I
HRESET
SRESET
Notes:
1.For PORESET
wards its minimum pulse width equals the minimum given for HRESET
2.The t
3.For t
4.For t
5.Following the deassertion of PORESET
6.The deassertion of HRESET
4096 clock cycles.
Power On Reset t
Hardware Reset4 clock cycles—SYS_XTAL_INA3.2
Software Reset4 clock cycles—SYS_XTAL_INA3.3
the value of the minimum pulse width reflects the power on sequence. If PORESET is asserted after-
VDD_stable
lock,
up_osc,
describes the time which is needed to get all power supplies stable.
refer to the Oscillator/PLL section of this specification for further details.
refer to the Oscillator/PLL section of this specification for further details.
VDD_stable+tup_osc+tlock
, HRESET and SRESET remain low for 4096 reference clock cycles.
for at least the minimum pulse width forces the internal resets to be active for an additional
NOTE:
As long as VDD is not stable the HRESET
Table 15 Reset Rise / Fall Timing
DescriptionMinMax UnitSpecID
cale Semiconductor,
PORESET
PORESET
HRESET
fall time—1msA3.4
rise time—1msA3.5
fall time—TBDnsA3.6
Max Pulse
Width
—SYS_XTAL_INA3.1
related to the same reference clock.
Reference ClockSpecID
output is not stable.
Frees
HRESET
SRESET
SRESET
For additional information, see the MPC5200 User Manual [1].
MOTOROLAMPC5200 Hardware Specifications 1 7
rise time—TBDnsA3.7
fall time—TBDnsA3.8
rise time—TBDnsA3.9
NOTE:
Make sure that the PORESET
has no filter to prevent them from getting into the chip.
does not carry any glitches. The MPC5200
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Electrical and Thermal Characteristics
3.3.3.1Reset Configuration Word
During reset (HRESET and PORESET) the Reset Configuration Word is cached in the related Reset
Configuration Word Register with each rising edge of the SYS_XTAL signal. If both resets (HRESET
PORESET
(see Figure 3).
) are inactive (high), the contents of this register get locked after two further SYS_XTAL cycles
SYS_XTAL
PORESET
HRESET
RST_CFG_WRD
4096 clocks2 clocks
and
nc...
I
cale Semiconductor,
Frees
sample
Beware of changing the values on the pins of the reset configuration word
after the deassertion of PORESET
may change the internal clock ratios and so extend the PLL locking
process.
sample
sample
Figure 3 Reset Configuration Word Locking
samplesample
sample
sample
samplesample
NOTE:
. This may cause problems because it
sample
sample
sample
LOCK
18MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3.4 External Interrupts
The MPC5200 provides three different kinds of external interrupts:
•Four IRQ interrupts
•Eight GPIO interrupts with simple interrupt capability (not available in power-down mode)
•Eight WakeUp interrupts (special GPIO pins)
The propagation of these three kinds of interrupts to the core is shown in the following graphic:
nc...
I
cale Semiconductor,
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IRQ0
8 GPIOs
8 GPIOsGPIO WakeUp
IRQ1
IRQ2
IRQ3
Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of
external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table
specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock
Distribution Module (see Note Table 16).
1)The frequency of IP_CLK depends on register settings in Clock Distribution Module. See the MPC5200 User Manual [1].
2) The interrupt latency descriptions in the table above are related to non competitive, non masked but enabled external
interrupt sources. Take care of interrupt prioritization which may increase the latencies.
Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of
these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Table 17 Minimum pulse width for external interrupts to be recognized
NameMin Pulse Width Max Pulse Width Reference Clock SpecID
All external interrupts (IRQs, GPIOs)> 1 clock cycle—IP_CLKA4.22
Notes:
1)The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200 User
Manual [1] for further information.
2)If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second
interrupt will not be recognized at all.
Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its
associated interrupt service routine also depends on the following conditions: To get a minimum interrupt
service response time, it is recommended to enable the instruction cache and set up the maximum core
clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is
advisable to execute an interrupt handler, which has been implemented in assembly code.
The SDRAM Memory Controller uses an internally skewed clock for reading DDR memory. The
programmable bits in the Reset Configuration Register used to account for unknown board delays are in
the CDM module. The internal read clock can be delayed up to 3 ns under worst operating conditions in 32
increments of 95 ps, (1.4 ns in 45 ps increments under best case operating conditions) by programming
the CDM Reset Configuration Register tap delay bits. Note: These bits in the CDM Reset Configuration
register are not ‘reset configured’ but have a hard coded reset value and are writable during operation.
Table 20 DDR SDRAM Memory Read Timing
SymDescriptionMinMaxUnits SpecID
t
mem_clk
t
valid
t
hold
nc...
I
data
data
cale Semiconductor,
MDQS (Data Strobe)
MEM_CLK period7.5—nsA5.15
Control Signals, Address and MBA
valid after rising edge of MEM_CLK
Control Signals, Address and MBA
hold after rising edge of MEM_CLK
Setup time skewed by CDM Reset
setup
Config Reg [3:7] = 0b00010
Hold time skewed by CDM Reset Con-
hold
fig Reg [3:7] = 0b00010
MEM_CLK
MEM_CLK
t
valid
Control Signals
ActiveNOPREADNOPNOPNOPNOPNOP
t
hold
—t
t
mem_clk
*0.5—nsA5.17
—0.4nsA5.18
2.34—nsA5.19
mem_clk
*0.5+0.4nsA5.16
Frees
data
MDQ (Data)
t
valid
MA (Address)
t
valid
MBA (Bank Selects)
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
MEM_CLK period7.5—ns
Delay from write command to first rising
edge of MDQS
Write
t
dqss
Figure 8 DDR SDRAM Memory Write Timing
Write
—t
mem_clk
+0.4ns
WriteWrite
A5.20
A5.21
Frees
24MPC5200 Hardware Specifications M O T O R O L A
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Electrical and Thermal Characteristics
3.3.6 PCI
The PCI interface on the MPC5200 is designed to PCI Version 2.2 and supports 33-MHz and 66-MHz PCI
operations. See the PCI Local Bus Specification [4]; the component section specifies the electrical and
timing parameters for PCI components with the intent that components connect directly together whether
on the planar or an expansion board, without any external buffers or other “glue logic.” Parameters apply at
the package pins, not at expansion board edge connectors.
The MPC5200 is always the source of the PCI CLK. The clock waveform must be delivered to each
33-MHz or 66-MHz PCI component in the system. Figure 9 shows the clock waveform and required
measurement points for 3.3 V signaling environments. Tab le 2 2 summarizes the clock specifications.
T
cyc
T
high
0.5Vcc
PCI CLK
nc...
I
0.4Vcc
0.3Vcc
Figure 9 PCI CLK Waveform
0.6Vcc
T
low
0.2Vcc
0.4Vcc, p-to-p
(minimum)
cale Semiconductor,
Frees
Table 22 PCI CLK Specifications
66 MHz33 MHz
SymDescription
MinMaxMinMax
T
T
t
PCI CLK Cycle Time153030ns1,3A6.1
cyc
PCI CLK High Time611nsA6.2
high
PCI CLK Low Time6A6.3
low
-PCI CLK Slew Rate1.5414V/ns2A6.4
NOTES:
1.In general, all 66-MHz PCI components must work with any clock frequency up to 66 MHz. CLK requirements vary depending upon whether the clock frequency is above 33 MHz.
2.Rise and fall times are specified in terms of the edge rate measured in V/ns. This slew rate must be met across the
minimum peak-to-peak portion of the clock waveform as shown in
3.The minimum clock period must not be violated for any single clock cycle, i.e., accounting for all system jitter.
Figure 9.
UnitsNotesSpecID
Table 23 PCI Timing Parameters
66 MHz33 MHz
SymDescription
T
CLK to Signal Valid Delay -
val
bused signals
MinMaxMinMax
26211ns1,2,3A6.5
UnitsNotesSpecID
T
(ptp) CLK to Signal Valid Delay -
val
T
T
MOTOROLAMPC5200 Hardware Specifications 2 5
point to point
Float to Active Delay22ns1A6.7
on
Active to Float Delay1428ns1A6.8
off
26212ns1,2,3A6.6
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Electrical and Thermal Characteristics
Table 23 PCI Timing Parameters (continued)
SymDescription
66 MHz33 MHz
UnitsNotesSpecID
MinMaxMinMax
nc...
I
cale Semiconductor,
Frees
T
T
su
T
For Measurement and Test Conditions, see the PCI Local Bus Specification [4].
Input Setup Time to CLK -
su
bused signals
(ptp) Input Setup Time to CLK -
point to point
Input Hold Time from CLK00ns4A6.11
h
NOTES:
1.See the timing measurement conditions in the PCI Local Bus Specification [4]. It is important that all driven signal transitions drive to their Voh or Vol level within one Tcyc.
2.Minimum times are measured at the package pin with the load circuit, and maximum times are measured with the load
circuit as shown in the PCI Local Bus Specification [4].
3.REQ# and GNT# are point-to-point signals and have different input setup times than do bused signals. GNT# and REQ#
have a setup of 5 ns at 66 MHz. All other signals are bused.
4.See the timing measurement conditions in the PCI Local Bus Specification [4].
37ns3,4A6.9
510,12ns3,4A6.10
3.3.7 Local Plus Bus
The Local Plus Bus is the external bus interface of the MPC5200. Eight configurable Chip-selects are
provided. There are two main modes of operation: non-MUXed and MUXED. The reference clock is the
PCI CLK. Refer to PCI CLK specification. The maximum bus frequency is 66 MHz.
The following timing numbers indicate when data will be latched or driven onto the external bus, relative to
the PCI CLK.
PCI CLK
2
1
OUTPUT
SIGNALS
3
1 PCI CLK to Signal hold
2 PCI CLK to Signal valid
3 PCI CLK to Signal Hi Z
Figure 10 Output Signals Timing
3.3.7.1Non-MUXed Mode
Table 24 Non-MUXed Mode Timing
SymDescriptionMinMaxUnitsNotes SpecID
t
t
26MPC5200 Hardware Specifications M O T O R O L A
PCI CLK to ADDR valid-2nsA7.1
AV
PCI CLK to ADDR hold1-nsA7.2
AH
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Electrical and Thermal Characteristics
Table 24 Non-MUXed Mode Timing (continued)
SymDescriptionMinMaxUnitsNotes SpecID
t
t
t
CSA
t
CSN
t
OEA
t
OEN
t
RWV
t
RWH
t
TSIZV
t
nc...
I
TSIZH
t
t
NOTES:
1.Wait states for Reads and Writes can be specified as 0 to 127.
2.Dead cycles can be specified as 0 to 3. Dead cycles will be added to the end of Chip Select read access and will occur
3.Transfer Size TSIZE(1:0) are available in Non-MUXed mode for MOST Graphics or Large Flash Modes only.
For understanding the different hold/valid/assertion/negation times refer to Figure 10.
The timing values in the above table are for a clock ratio of IP_CLK : PCI_CLK = 1 : 1 only.
The values will be different for other IP_CLK : PCI_CLK clock ratios.
cale Semiconductor,
PCI CLK to DATA output valid-2nsA7.3
DV
PCI CLK to DATA output Hi Z-2nsA7.4
DZ
PCI CLK to CS assertion-1.8nsA7.5
PCI CLK to CS negation-1.8nsA7.6
PCI CLK to OE assertion-1.5nsA7.7
PCI CLK to OE negation-1.5nsA7.8
PCI CLK to RW valid-1nsA7.9
PCI CLK to RW hold1-nsA7.10
PCI CLK to TSIZ valid-2nsA7.11
PCI CLK to TSIZ hold1-nsA7.12
DATA input to PCI CLK setup2-nsA7.13
DS
DATA input to PCI CLK hold-1nsA7.14
DH
in addition to any cycles which may already exist. These cycles provide a peripheral additional time to tri-state its bus
after a read operation. This is for all access types.
Frees
MOTOROLAMPC5200 Hardware Specifications 2 7
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Electrical and Thermal Characteristics
PCI_CLK
nc...
I
cale Semiconductor,
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ADDR
CS[x]
R/W
DATA (wr)Valid Write Data
DATA (rd)
t
OE
OE
Note: 1. The tRD/tWR is wait states as programmed for corresponding access and chip select.
2. OE is active during Read only, tOE is the Output Enable to Output Delay time
3. Read data has nominal setup/hold requirements around the CS negation.
Valid Address
tRD or t
WR
Valid Read Data
Figure 11 Timing Diagram—Non-MUXed Mode
3.3.7.2MUXed Mode
Table 25 MUXed Mode Timing
SymDescriptionMinMaxUnitsNotes SpecID
t
t
t
t
t
CSA
t
CSN
t
OEA
t
OEN
t
RWV
t
RWH
t
ALEA
t
ALEN
t
PCI CLK to ADDR valid
AV
PCI CLK to ADDR hold
AH
PCI CLK to DATA output valid
DV
PCI CLK to DATA output Hi Z
DZ
PCI CLK to CS assertion
PCI CLK to CS negation
PCI CLK to OE assertion
PCI CLK to OE negation
PCI CLK to RW valid
PCI CLK to RW hold
PCI CLK to ALE assertion
PCI CLK to ALE negation
DATA input to PCI CLK setup
DS
-2nsA7.15
1-nsA7.16
-2nsA7.17
-2nsA7.18
-1.8nsA7.19
-1.8nsA7.20
-1.5nsA7.21
-1.5nsA7.22
-1nsA7.23
1-nsA7.24
-2nsA7.25
-2nsA7.26
2-nsA7.27
28MPC5200 Hardware Specifications M O T O R O L A
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Table 25 MUXed Mode Timing (continued)
SymDescriptionMinMaxUnitsNotes SpecID
Electrical and Thermal Characteristics
nc...
I
cale Semiconductor,
Frees
t
NOTES:
1.Wait states for Reads and Writes can be inserted when configured.
2.Dead cycles can be specified as 0 to 3. Dead cycles will be added to the end of Chip Select read access and will occur
3.Transfer Size TSIZE(1:0) are available in Non-MUXed mode for MOST Graphics or Large Flash Modes only.
For understanding the different hold/valid/assertion/negation times refer to Figure 10.
The timing values in the above table are for a clock ratio of IP_CLK : PCI_CLK = 1 : 1 only.
The values will be different for other IP_CLK : PCI_CLK clock ratios.
DATA input to PCI CLK hold
DH
in addition to any cycles which may already exist. These cycles provide a peripheral additional time to tri-state its bus
after a read operation. This is for all access types.
-1nsA7.28
Start Bus TenureEnd Bus Tenure
PCI CLK
AD[31,27]
AD[30:28]
AD[26:25]
AD[24:0]
ALE
TS
TSIZ[0:2] bits
Bank[0:1] bits
Address[7:31]
short
long
short
Data or tri-state
Data or tri-state
Data or tri-state
Data or tri-state
long
Wait States
(0-127)
Dead Cycles
(0-3)
CSx
RW
tri-state
tri-state
tri-state
tri-state
ACK Input
Address "tenure"
Figure 12 Timing Diagram - MUXed Mode
MOTOROLAMPC5200 Hardware Specifications 2 9
Data "tenure"
"Dack"
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Electrical and Thermal Characteristics
3.3.8 ATA
The MPC5200 ATA Controller is completely software programmable. It can be programmed to operate with
ATA protocols using their respective timing, as described in the ANSI ATA-4 specification. The ATA
interface is completely asynchronous in nature. Signal relationships are based on specific fixed timing in
terms of timing units (nano seconds).
ATA data setup and hold times, with respect to Read/Write strobes, are software programmable inside the
ATA Controller. Data setup and hold times are implemented using counters. The counters count the
number of ATA clock cycles needed to meet the ANSI ATA-4 timing specifications. For details, see the
ANSI ATA-4 specification [5] and how to program an ATA Controller and ATA drive for different ATA
protocols and their respective timing. See the MPC5200 User Manual
The MPC5200 ATA Host Controller design makes data available coincidentally with the active edge of the
WRITE strobe in PIO and Multiword DMA modes.
•Write data is latched by the drive at the inactive edge of the WRITE strobe. This gives ample
setup-time beyond that required by the ATA-4 specification.
•Data is held unchanged until the next active edge of the WRITE strobe. This gives ample hold-time
nc...
I
All ATA transfers are programmed in terms of system clock cycles (IP bus clocks) in the ATA Host
Controller timing registers. This puts constraints on the ATA protocols and their respective timing modes in
which the ATA Controller can communicate with the drive.
beyond that required by the ATA-4 specification.
[1].
cale Semiconductor,
Frees
Faster ATA modes (i.e., UDMA 0, 1, 2) are supported when the system is running at a sufficient frequency
to provide adequate data transfer rates. Adequate data transfer rates are a function of the following:
•The MPC5200 operating frequency (IP bus clock frequency )
•Internal MPC5200 bus latencies
•Other system load dependent variables
The ATA clock is the same frequency as the IP bus clock in MPC5200. See the MPC5200 User Manual [1].
NOTE:
All output timing numbers are specified for nominal 50 pF loads.
Table 26 PIO Mode Timing Specifications
Min/Ma
PIO Timing Parameter
(ns)
t0Cycle Timemin600383240180120A8.1
t1Address valid to DIOR
setup
t2DIOR
/DIOW pulse width 16-bit
/DIOW
8-bit
min7050303025A8.2
min
min
Mode 0
x
(ns)
165
290
Mode 1
(ns)
125
290
Mode 2
(ns)
100
290
Mode 3
(ns)
80
80
Mode 4
(ns)
70
70
SpecID
A8.3
t2iDIOR
t3DIOW
t4DIOW
t5DIOR
t6DIOR
30MPC5200 Hardware Specifications M O T O R O L A
/DIOW recovery timemin———7025A8.4
data setupmin6045303020A8.5
data holdmin3020151010A8.6
data setupmin5035202020A8.7
data holdmin55555A8.8
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Table 26 PIO Mode Timing Specifications (continued)
NOTE:The directionof signalassertionis towardsthe
top of the page, and the direction of negation is
towards the bottom of the page, irrespective of the
electrical properties of the signal.
/DIOW to DMACK holdmin2055A8.20
negated pulse widthmin505025A8.21
negated pulse widthmin2155025A8.22
to DMARQ delaymax1204035A8.23
to DMARQ delaymax404035A8.24
DMARQ
(Drive)
tC
(Host)
tItD
DIOR
DIOW
(Host)
tE
RDATA
(Drive)
WDATA
(Host)
tG
t0
tF
tH
tK
tS
tL
tJ
Figure 14 Multiword DMA Timing
Table 28 Ultra DMA Timing Specification
MODE 0
Name
(t)
2CYC
32MPC5200 Hardware Specifications M O T O R O L A
(ns)
MinMaxMinMaxMinMax
240—160—120—Typical sustained average two cycle time.A8.25
waiting for the other agent to respond with a signal before proceeding.
nc...
I
2All timing parameters are measured at the connector of the drive to which the parameter applies. For example, the sender
shall stop generating STROBE edges t
ments are taken at the connector of the sender. Even though the sender stops generating STROBE edges, the receiver
may receive additional STROBE edges due to propagation delays. All timing measurement switching points (low to high
and high to low) are taken at 1.5 V.
cale Semiconductor,
(ns)
MinMaxMinMaxMinMax
0—0—0—Minimum time drive waits before driving
20—20—20—Setup and hold times for DMACK, before
50—50—50—Time from STROBE edge to negation of
, tLI indicate sender-to-recipient or recipient-to-sender interlocks. That is, one agent (either sender or recipient) is
MLI
•t
is an unlimited interlock that has no maximum time value.
UI
is a limited time-out that has a defined minimum.
•t
MLI
•t
is a limited time-out that has a defined maximum.
LI
DMARQ
(device)
DMACK
(device)
STOP
(host)
HDMARDY
(host)
MODE 1
(ns)
MODE 2
(ns)
IORDY
assertion or negation.
DMARQ or assertion of STOP, when sender
terminates a burst.
after negation of DMARDY. Both STROBE and DMARDY timing measure-
RFS
t
UI
t
t
t
ZIORDY
ACK
ACK
t
ENV
t
ENV
t
t
ZAD
ZAD
CommentSpecID
t
FS
t
FS
A8.44
A8.45
A8.46
Frees
DSTROBE
(device)
DD(0 :15 )
DA0, DA1, DA2,
[0:1]1
CS
t
ACK
t
AZ
t
DVS
t
DVH
Figure 15 Timing Diagram—Initiating an Ultra DMA Data In Burst
34MPC5200 Hardware Specifications M O T O R O L A
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DSTROBE
at device
DD(0:15 )
at device
DSTROBE
at host
Freescale Semiconductor, Inc.
t
DVH
t
CYC
t
DVS
t
2CYC
t
DVH
t
CYC
Electrical and Thermal Characteristics
t
DVS
t
DVH
t
2CYC
nc...
I
cale Semiconductor,
Frees
DD(0:15 )
at host
t
DH
t
DS
t
DH
t
DS
t
DH
Figure 16 Timing Diagram—Sustained Ultra DMA Data In Burst
DMARQ
(device)
DMARQ
(host)
STOP
(host)
HDMARDY
(host)
DSTROBE
(device)
DD[0:15]
(device)
t
SR
t
RFS
t
RP
Figure 17 Timing Diagram—Host Pausing an Ultra DMA Data In Burst
MOTOROLAMPC5200 Hardware Specifications 3 5
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Electrical and Thermal Characteristics
DMARQ
(device)
DMACK
(host)
STOP
(host)
HDMARDY
(host)
DSTROBE
(device)
nc...
I
DD[0:15]
t
SS
t
t
LI
t
LI
ZAH
t
LI
t
AZ
t
DVS
t
MLI
CRC
t
ACK
t
ACK
t
IORDYZ
t
DVH
cale Semiconductor,
Frees
DA0,DA1,DA2,
CS
[0:1]
Figure 18 Timing Diagram—Drive Terminating Ultra DMA Data In Burst
DMARQ
(device)
DMACK
(host)
STOP
(host)
HDMARDY
(host)
DSTROBE
(device)
DD[0:15]
t
t
RFS
RP
t
ACK
ZAH
t
t
MLI
MLI
t
DVS
CRC
t
DVH
t
ACK
t
ACK
t
IORDYZ
t
LI
t
t
AZ
t
LI
t
DA0,DA1,DA2,
CS[0:1]
ACK
Figure 19 Timing Diagram—Host Terminating Ultra DMA Data In Burst
36MPC5200 Hardware Specifications M O T O R O L A
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nc...
I
cale Semiconductor,
Frees
DMARQ
(device)
DMACK
(host)
STOP
(host)
DDMARDY
(host)
HSTROBE
(device)
DD[0:15]
(host)
DA0,DA1,DA2,
CS[0:1]
HSTROBE
(host)
DD[0:15]
(host)
HSTROBE
(device)
DD[0:15]
(device)
Freescale Semiconductor, Inc.
t
ZIORDY
Electrical and Thermal Characteristics
t
UI
t
t
ACK
t
ACK
t
ACK
ENV
t
LI
t
UI
t
DVS
t
DVH
Figure 20 Timing Diagram—Initiating an Ultra DMA Data Out Burst
t
2CYC
t
DVH
t
CYC
t
DVS
t
t
DH
DS
t
DVH
t
DH
t
CYC
t
2CYC
t
DVS
t
DS
t
DVH
t
DH
Figure 21 Timing Diagram—Sustained Ultra DMA Data Out Burst
MOTOROLAMPC5200 Hardware Specifications 3 7
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Electrical and Thermal Characteristics
DMARQ
(device)
DMACK
(host)
STOP
(host)
DDMARDY
(device)
HSTROBE
t
SR
t
RFS
t
RP
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cale Semiconductor,
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DD[0:15]
(host)
Figure 22 Timing Diagram—Drive Pausing an Ultra DMA Data Out Burst
DMARQ
(device)
DMACK
(host)
STOP
(host)
DDMARDY
(device)
HSTROBE
(host)
DD[0:15]
(host)
t
LI
t
SS
t
LI
t
LI
t
DVS
t
MLI
CRC
t
t
ACK
ACK
t
IORDYZ
t
DVH
t
DA0,DA1,DA2,
CS
[0:1]
ACK
Figure 23 Timing Diagram—Host Terminating Ultra DMA Data Out Burst
38MPC5200 Hardware Specifications M O T O R O L A
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DMARQ
(device)
DMACK
(host)
STOP
(host)
DDMARDY
(device)
Freescale Semiconductor, Inc.
Electrical and Thermal Characteristics
t
LI
t
RP
t
MLI
t
IORDYZ
t
ACK
t
RFS
HSTROBE
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I
(host)
DD[0:15]
(host)
DA0,DA1,DA2,
CS
[0:1]
t
LI
Figure 24 Timing Diagram—Drive Terminating Ultra DMA Data Out Burst
Table 29 Timing Specification ata_isolation
SymDescriptionMinMaxUnitsSpecID
1ata_isolation setup time7-IP Bus cyclesA8.47
2ata_isolation hold time19-IP Bus cyclesA8.48
cale Semiconductor,
t
MLI
t
DVS
CRC
t
ACK
t
ACK
t
DVH
Frees
DIOR
ATA_ISOLATION
1
2
Figure 25 Timing Diagram-ATA-ISOLATION
MOTOROLAMPC5200 Hardware Specifications 3 9
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Electrical and Thermal Characteristics
3.3.9 Ethernet
AC Test Timing Conditions:
•Output Loading
All Outputs: 25 pF
Table 30 MII Rx Signal Timing
SymDescriptionMinMaxUnitSpecID
M1RXD[3:0 ], RX_DV, RX_ER to RX_CLK setup10—nsA9.1
M2RX_CLK to RXD[ 3:0], RX_DV, RX_ER hold10—nsA9.2
M3RX_CLK pulse width high35%65%
M4RX_CLK pulse width low35%65%
1RX_CLK shall have a frequency of 25% of data rate of the received signal. See the IEEE 802.3 Specification [6].
RX_CLK Period
RX_CLK Period
1
A9.3
1
A9.4
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cale Semiconductor,
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M3
RX_CLK (Input)
RXD[3:0] (inputs)
RX_DV
RX_ER
M1
Figure 26 Ethernet Timing Diagram—MII Rx Signal
Table 31 MII Tx Signal Timing
SymDescriptionMinMaxUnitSpecID
M5TX_CLK rising edge to TXD[3 :0], TX_EN,
TX_ER Delay
M6TX_CLK pulse width high35%65%
M7TX_CLK pulse width low35%65%
M2
M4
025nsA9.5
1
TX_CLK Period
TX_CLK Period
A9.6
1
A9.7
40MPC5200 Hardware Specifications M O T O R O L A
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1the TX_CLK frequency shall be 25% of the nominal transmit frequency, e.g., a PHY operating at 100 Mb/s must provide
a TX_CLK frequency of 25 MHz and a PHY operating at 10 Mb/s must provide a TX_CLK frequency of 2.5 MHz. See the
IEEE 802.3 Specification [6].
TX_CLK (Input)
TXD[3:0] (Outputs)
TX_EN
TX_ER
Figure 27 Ethernet Timing Diagram—MII Tx Signal
M5
Electrical and Thermal Characteristics
M6
M7
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cale Semiconductor,
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Table 32 MII Async Signal Timing
SymDescriptionMinMaxUnitSpecID
M8CRS, COL minimum pulse width1.5—TX_CLK PeriodA9.8
CRS, COL
M8
Figure 28 Ethernet Timing Diagram—MII Async
Table 33 MII Serial Management Channel Signal Timing
SymDescriptionMinMaxUnitSpecID
M9MDC falling edge to MDIO output delay025nsA9.9
M10MDIO ( input) to MDC rising edge setup10—nsA9.10
M11MDIO ( input) to MDC rising edge hold10—nsA9.11
M12MDC pulse width high
M13MDC pulse width low
M14MDC period
2
1
1
160—nsA9.12
160—nsA9.13
400—nsA9.14
1MDC is generated by MPC5200 with a duty cycle of 50% except when MII_SPEED in the FEC MII_SPEED control
register is changed during operation. See the MPC5200 User Manual [1].
MOTOROLAMPC5200 Hardware Specifications 4 1
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Electrical and Thermal Characteristics
2The MDC period must be set to a value of less then or equal to 2.5 MHz (to be compliant with the IEEE MII character-
istic) by programming the FEC MII_SPEED control register. See the MPC5200 User Manual [1].
MDC (Output)
MDIO (Output)
MDIO (Input)
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Figure 29 Ethernet Timing Diagram—MII Serial Management
M10
M12
M13
M14
M9
M11
cale Semiconductor,
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3.3.10 USB
Table 34 Timing Specifications—USB Output Line
SymDescriptionMinMaxUnitsSpecID
1USB Bit width
2Transceiver enable time83.3667nsA10.2
3Signal falling time—7.9nsA10.3
4Signal rising time—7.9nsA10.4
1Defined in the USB config register, (12 Mbit/s or 1.5 Mbit/s mode).
1
NOTE:
Output timing was specified at a nominal 50 pF load.
The CAN functions are available as RX and TX pins at normal IO pads (I2C1+GPTimer or PSC2). There is
no filter for the WakeUp dominant pulse. Any High-to-Low edge can cause WakeUp, if configured.
3.3.13 I2C
Table 39 I2C Input Timing Specifications—SCL and SDA
SymDescriptionMinMaxUnitsSpecID
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1Start condition hold time2—IP-Bus
1
Cycle
2Clock low period8—IP-Bus
1
Cycle
4Data hold time0.0—nsA13.3
6Clock high time4—IP-Bus
1
Cycle
7Data setup time0.0—nsA13.5
8Start condition setup time (for repeated start con-
dition only )
9Stop condition setup time2—IP-Bus
1Inter Peripheral Clock is defined in the MPC5200 User Manual [1].
2—IP-Bus
1
Cycle
1
Cycle
A13.1
A13.2
A13.4
A13.6
A13.7
Table 40 I2C Output Timing Specifications—SCL and SDA
SymDescriptionMinMaxUnitsSpecID
1
1
2
3
Start condition hold time6—IP-Bus
Cycle
1
Clock low period10—IP-Bus
Cycle
2
SCL/SDA rise time—7.9nsA13.10
1
Data hold time7—IP-Bus
4
Cycle
1
SCL/ SDA fall time—7.9nsA13.12
5
1
Clock high time10—IP-Bus
6
Cycle
1
Data setup time2—IP-Bus
7
Cycle
1
Start condition setup time (for repeated start con-
8
dition only )
1
Stop condition setup time10—IP-Bus
9
20—IP-Bus
Cycle
Cycle
3
A13.8
3
A13.9
3
A13.11
3
A13.13
3
A13.14
3
A13.15
3
A13.16
48MPC5200 Hardware Specifications M O T O R O L A
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1Programming IFDR with the maximum frequency ( IFDR=0x20 ) results in the minimum output timings listed. The I2C
interface is designed to scale the data transition time, moving it to the middle of the SCL low period. The actual position is affected by the prescale and division values programmed in IFDR.
2Because SCL and SDA are open-drain-type outputs, which the processor can only actively drive low, the time SCL
or SDA takes to reach a high level depends on external signal capacitance and pull-up resistor values
3Inter Peripheral Clock is defined in the MPC5200 User Manual [1].
Output timing was specified at a nominal 50 pF load.
Electrical and Thermal Characteristics
NOTE:
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cale Semiconductor,
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SCL
SDA
2
1
Figure 35 Timing Diagram—I2C Input/Output
4
7
56
8
3
9
3.3.14 J1850
See the MPC5200 User Manual [1].
3.3.15 PSC
3.3.15.1Codec Mode (8,16,24 and 32-bit) / I2S Mode
The MPC5200 contains several sets if I/Os that do not require special setup, hold, or valid requirements.
Most of these are asynchronous to the system clock. The following numbers are provided for test and
validation purposes only, and they assume a 133 MHz internal bus frequency.
Figure 44 shows the GPIO Timing Diagram. Table 49 gives the timing specifications.
Table 49 Asynchronous Signals
SymDescriptionMinMaxUnitsSpecID
t
CK
t
t
t
t
IH
DV
DH
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cale Semiconductor,
Clock Period7.52—nsA16.1
Input Setup for Async Signal12—nsA16.2
IS
Input Hold for Async Signals1—nsA16.3
Output Valid—15.33nsA16.4
Output Hold1—nsA16.5
t
CK
t
Output
Input
t
DV
t
IS
valid
valid
DH
t
IH
Frees
Figure 44 Timing Diagram—Asynchronous Signals
3.3.17 IEEE 1149.1 (JTAG) AC Specifications
Table 50 JTAG Timing Specification
SymCharacteristicMinMaxUnitSpecID
—TCK frequency of operation.025MHzA17.1
1TCK cycle time.40—nsA17.2
2TCK clock pulse width measured at 1.5V.1.08—nsA17.3
3TCK rise and fall times.03nsA17.4
MOTOROLAMPC5200 Hardware Specifications 5 7
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Electrical and Thermal Characteristics
Table 50 JTAG Timing Specification (continued)
SymCharacteristicMinMaxUnitSpecID
4TRST setup time to tck falling edge 1.10—nsA17.5
5TRST
6Input data setup time
7Input data hold time
8TCK to output data valid
9TCK to output high impedance
10TMS, TDI data setup time.5—nsA17.11
11TMS, TDI data hold time.1—nsA17.12
12TCK to TDO data valid.015nsA17.13
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13TCK to TDO high impedance.015nsA17.14
1TRST is an asynchronous signal. The setup time is for test purposes only.
2Non-test, other than TDI and TMS, signal input timing with respect to TCK.
3Non-test, other than TDO, signal output timing with respect to TCK.
cale Semiconductor,
assert time.5—nsA17.6
2
.5—nsA17.7
2
.15—nsA17.8
3
. 030nsA17.9
3
.030nsA17.10
1
22
TCK
3
Figure 45 Timing Diagram—JTAG Clock Input
3
VM = Midpoint Voltage
Numbers shown reference Table 50.
VMVMVM
Frees
TCK
4
TRST
5
Numbers shown reference Table 50.
Figure 46 Timing Diagram—JTAG TRST
58MPC5200 Hardware Specifications M O T O R O L A
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TCK
Freescale Semiconductor, Inc.
Electrical and Thermal Characteristics
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cale Semiconductor,
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DATA INPUTS
DATA OUTPUTS
DATA OUTPUTS
TCK
TDI, TMS
TDO
TDO
6
INPUT DATA VALID
8
OUTPUT DATA VALID
9
Numbers shown reference Table 50.
Figure 47 Timing Diagram—JTAG Boundary Scan
10
INPUT DATA VALID
12
OUTPUT DATA VALID
13
Numbers shown reference Table 50.
Figure 48 Timing Diagram—Test Access Port
11
7
MOTOROLAMPC5200 Hardware Specifications 5 9
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Package Description
Freescale Semiconductor, Inc.
4Package Description
4.1Package Parameters
The MPC5200 uses a 27 mm x 27 mm TE-PBGA package. The package parameters are as provided in the
following list:
•Package outline27 mm x 27 mm
•Interconnects272
•Pitch1.27 mm
4.2Mechanical Dimensions
Figure 49 provides the mechanical dimensions, top surface, side profile, and pinout for the MPC5200, 272
TE-PBGA package.
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cale Semiconductor,
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60MPC5200 Hardware Specifications M O T O R O L A
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Package Description
PIN A1
INDEX
4X
0.2
E
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I
(E1)
cale Semiconductor,
B
19X
e
4X
e
/2
123 54 678910111213141516171819
D
D2
TOP VIEW
(D1)
19X
e
BOTTOM VIEW
C
A
272X
A
0.2
A
M
0.3
0.15
A
A3
b
M
M
0.35
CB
SIDE VIEW
3
A
A
NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME
Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. DIMENSION IS MEASURED AT THE MAXIMUM
SOLDER BALL DIAMETER PARALLEL TO
PRIMARY DATUM A.
4. PRIMARY DATUM A AND THE SEATING PLANE
ARE DEFINED BY THE SPHERICAL CROWNS OF
THE SOLDER BALLS.
MILLIMETERS
DIMMINMAX
A2.052.65
A10.500.70
A20.500.70
A31.051.25
b0.600.90
D27.00 BSC
D124.13 REF
D223.3024.70
E27.00 BSC
E124.13 REF
E223.3024.70
e1.27 BSC
A1
A2
A
CB
E2
0.2
Y
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
20
272X
Frees
CASE 1135A–01
ISSUE B
DATE 10/15/1997
Figure 49 Mechanical Dimensions and Pinout Assignments for the MPC5200, 272
1All “open drain” outputs of the MPC5200 are actually regular three-state output drivers with the output data tied low
and the output enable controlled. Thus, unlike a true open drain, there is a current path from the external system to the
MPC5200 I/O power rail if the external signal is driven above the MPC5200 I/O power rail voltage.
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Power
Supply
cale Semiconductor,
Output
Driver Type
Input
Type
Pull-up/
down
Frees
68MPC5200 Hardware Specifications M O T O R O L A
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System Design Information
6System Design Information
6.1Power UP/Down Sequencing
Figure 50 shows situations in sequencing the I/O VDD (VDD_IO), Memory VDD (VDD_IO_MEM), PLL
VDD (PLL_AVDD), and Core VDD (VDD_CORE).
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cale Semiconductor,
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3.3V
2.5V
1
1.5V
DC Power Supply Voltage
2
0
Note:
1.VDD_CORE should not exceed VDD_IO, VDD_IO_MEM or PLL_AVDD by more than 0.4 V at any time,
including power-up.
2.It is recommended that VDD_CORE/PLL_AVDD should track VDD_IO/VDD_IO_MEM up to 0.9 V
then separate for completion of ramps.
3.Input voltage must not be greater than the supply voltage (VDD_IO, VDD_IO_MEM, VDD_CORE, or
PLL_AVDD) by more than 0.5 V at any time, including during power-up.
4.Use 1 microsecond or slower rise time for all supplies.
Figure 50 Supply Voltage Sequencing
The relationship between VDD_IO_MEM and VDD_IO is non-critical during power-up and power-down
sequences. Both VDD_IO_MEM (2.5 V or 3.3 V) and VDD_IO are specified relative to VDD_CORE.
VDD_IO,
VDD_IO_MEM (SDR)
VDD_IO_MEM (DDR)
VDD_CORE,
PLL_AVDD
Time
6.1.1 Power Up Sequence
If VDD_IO/VDD_IO_MEM are powered up with the VDD_CORE at 0V, the sense circuits in the I/O pads
will cause all pad output drivers connected to the VDD_IO/VDD_IO_MEM to be in a high-impedance state.
There is no limit to how long after VDD_IO/VDD_IO_MEM powers up before VDD_CORE must power up.
VDD_CORE should not lead the VDD_IO, VDD_IO_MEM or PLL_AVDD by more than 0.4 V during power
ramp up or there will be high current in the internal ESD protection diodes. The rise times on the power
supplies should be slower than 1 microsecond to avoid turning on the internal ESD protection clamp
diodes.
The recommended power up sequence is as follows:
Use one microsecond or slower rise time for all supplies.
MOTOROLAMPC5200 Hardware Specifications 6 9
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System Design Information
VDD_CORE/PLL_AVDD and VDD_IO/VDD_IO_MEM should track up to 0.9 V and then separate for the
completion of ramps with VDD_IO/VDD_IO_MEM going to the higher external voltages. One way to
accomplish this is to use a low drop-out voltage regulator.
6.1.2 Power Down Sequence
If VDD_CORE/PLL_AVDD are powered down first, then sense circuits in the I/O pads will cause all output
drivers to be in a high impedance state. There is no limit on how long after VDD_CORE and PLL_AVDD
power down before VDD_IO or VDD_IO_MEM must power down. VDD_CORE should not lag VDD_IO,
VDD_IO_MEM, or PLL_AVDD going low by more than 0.4V during power down or there will be undesired
high current in the ESD protection diodes. There are no requirements for the fall times of the power
supplies.
The recommended power down sequence is as follows:
Drop VDD_CORE/PLL_AVDD to 0V.
Drop VDD_IO/VDD_IO_MEM supplies.
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6.2System and CPU Core AVDD power supply filtering
Each of the independent PLL power supplies require filtering external to the device. The following drawing
is a recommendation for the required filter circuit.
cale Semiconductor,
Frees
< 1 Ω
AVDD device pinPower
200-400 pF
Supply
source
10 Ω
10 µF
Figure 51 Power Supply Filtering
6.3Pull-up/Pull-down Resistor Requirements
The MPC5200 requires external pull-up or pull-down resistors on certain pins.
6.3.1 Pull-down Resistor Requirements for TEST pins
The MPC5200 requires pull-down resistors on the test pins TEST_MODE_0, TEST_MODE_1,
TEST_SEL_1.
6.3.2 Pull-up Requirements for the PCI Control Lines
If the PCI interface is NOT used (and internally disabled) the PCI control pins must be terminated as
indicated by the PCI Local Bus specification [4]. This is also required for MOST/Graphics and Large Flash
Mode.
PCI control signals always require pull-up resistors on the motherboard (not the expansion board) to
ensure that they contain stable values when no agent is actively driving the bus. This includes
PCI_FRAME, PCI_TRDY, PCI_IRDY, PCI_DEVSEL, PCI_STOP, PCI_SERR, PCI_PERR, and PCI_REQ.
70MPC5200 Hardware Specifications M O T O R O L A
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System Design Information
6.3.3 Pull-up/Pull-down Requirements for MEM_MDQS pins (SDRAM)
The MEM_MDQS[3:0] signals are not used with SDR memories and require pull-up or pull-down resistors
in SDRAM mode.
6.4Information about JTAG_TRST
Boundary scan testing is enabled through the JTAG interface signals. The JTAG_TRST signal is optional
in the IEEE 1149.1 specification but is provided on all processors that implement the PowerPC
architecture. To obtain a reliable power-on reset performance, the JTAG_TRST signal must be asserted
during power-on reset.
6.4.1 JTAG_TRST and PORRESET
The JTAG interface can control the direction of the MPC5200 I/O pads via the boundary scan chain. The
JTAG module must be reset before the MPC5200 comes out of power-on reset; do this by asserting
JTAG_TRST before PORRESET is released.
For more details refer to the Reset and JTAG Timing Specification.
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cale Semiconductor,
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PORRESET
required assertion of JTAG_TRSToptional assertion of JTAG_TRST
JTAG_TRST
Figure 52 PORRESET vs. JTAG_TRST
6.5Connecting JTAG_TRST
The wiring of the JTAG_TRST is dependent of the existence of a board-related debug interface.
Normally this interface is implemented, using a COP (common on-chip processor) connector. The COP
allows a remote computer system (typically, a PC with dedicated hardware and debugging software) to
access and control the internal operations of the MPC5200. The COP port requires the ability to
independently assert HRESET
There are two possibilities to connect the JTAG interface: using it with a COP connector and without a
COP connector.
6.5.1 Boards interfacing the JTAG port via a COP connector
For a board with a COP (common on-chip processor) connector, which accesses the JTAG interface and
which needs to reset the JTAG module, simply wiring TRST and PORRESET
and JTAG_TRST in order to fully control the processor.
is not recommended.
To reset the MPC5200 via the COP connector, the HRESET
HRESET
The circuitry shown in Figure 53 allows the COP to assert HRESET
other board sources can drive PORRESET
MOTOROLAMPC5200 Hardware Specifications 7 1
pin of the MPC5200.
.
pin of the COP should be connected to the
or JTAG_TRST separately, while any
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System Design Information
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PORRESET
COP Header
COP Connector
Physical Pinout
1
2
3
4
5
6
7
8
9
10
11
12
13
K16Key
15
13
11
16
Key 14
12
6
15
5
2
10
HRESET
SRESET
TRST
4
TMS
9
TCK
7
2
TDI
3
CKSTP_OUT
TDO
1
halted
3
qack
4
8
10Kohm
10Kohm
10Kohm
10Kohm
10Kohm
VDD
10Kohm
NC
NC
NC
NC
PORRESET
HRESET
VDD
VDD
SRESET
VDD
JTAG_TRST
VDD
JTAG_TMS
VDD
JTAG_TCK
VDD
JTAG_TDI
TEST_SEL_0
JTAG_TDO
MPC5200
Figure 53 COP Connector Diagram
6.5.2 Boards without COP connector
If the JTAG interface is not used, JTAG_TRST should be tied to PORRESET, so that it is asserted when
the system reset signal (PORRESET
during power on. Figure 54 shows the connection of the JTAG interface without COP connector.
) is asserted. This ensures that the JTAG scan chain is initialized
72MPC5200 Hardware Specifications M O T O R O L A
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System Design Information
PORRESET
HRESET
SRESET
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Figure 54 JTAG_TRST wiring for boards without COP connector
10Kohm
10Kohm
10Kohm
10Kohm
10Kohm
cale Semiconductor,
PORRESET
HRESET
VDD
VDD
SRESET
JTAG_TRST
VDD
JTAG_TMS
VDD
JTAG_TCK
VDD
JTAG_TDI
TEST_SEL_0
JTAG_TDO
MPC5200
Frees
MOTOROLAMPC5200 Hardware Specifications 7 3
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Ordering Information
Freescale Semiconductor, Inc.
7Ordering Information
Table 52 Ordering Information
Part NumberSpeed Ambient TempQualification
MPC5200BV4004000C to 70CCommercial
MPC5200CBV266 266-40C to 85CIndustrial
MPC5200CBV400 400-40C to 85CIndustrial
SPC5200CBV400 400-40C to 85CAutomotive - AEC
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cale Semiconductor,
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74MPC5200 Hardware Specifications M O T O R O L A
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8Document Revision History
Ta ble 5 3 provides a revision history for this hardware specification.
Table 53 Document Revision History
Document Revision History
Rev.
No.
0.1First Preliminary release with some TBD’s in spec tables (6/2003)
0.2Added AC specs for missing modules, power-on sequence, misc other updates (7/2003)
0.2.1Corrected maximum core operating frequency (7/2003)
0.3Added Memory Interface Timing values, misc other updates (8/2003)
1.0Added Information about JTAG_TRST (11/2003)
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2.0Added Power Numbers (Section 3.1.5), updated Oscillator and PLL Characteristics (Section
3.2), updated SDRAM AC Characteristics (Section 3.3.5)
Substantive Change(s)
For more detailed information, refer to the following documentation:
[1] MPC5200 User Manual MPC5200UM
[2] PowerPC Microprocessor Family: The Programming Environments for 32-bit Microprocessors,
Rev. 2: MPCFPE32B/AD
[3] G2 Core Reference Manual, Rev. 0: G2CORERM/D
[4] PCI Local Bus Specification, Revision 2.2, December 18, 1998
[5] ANSI ATA-4 Specification
[6] IEEE 802.3 Specification (ETHERNET)
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