SEMICONDUCTOR TECHNICAL DATA
1
REV 7
Motorola, Inc. 1997
2/97
$ $# #
#!$# &! %#
# $#"
High–Performance Silicon–Gate CMOS
The MC74HCT157A is identical in pinout to the LS157. This device may
be used as a level converter for interfacing TTL or NMOS outputs to High
Speed CMOS inputs.
This device routes 2 nibbles (A or B) to a single port (Y) as determined by
the Select input. The data is presented at the outputs in noninverted form. A
high level on the Output Enable input sets all four Y outputs to a low level.
The HCT157A is similar in function to the HC257 which has 3–state
outputs.
• Output Drive Capability: 10 LSTTL Loads
• TTL NMOS Compatible Input Levels
• Outputs Directly Interface to CMOS, NMOS and TTL
• Operating Voltage Range: 4.5 to 5.5 V
• Low Input Current: 1.0 µA
• In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
• Chip Complexity: 102 FETs or 25.5 Equivalent Gates
LOGIC DIAGRAM
2
5
11
14
3
6
10
13
4
7
9
12
1
15
A0
A1
A2
A3
B0
B1
B2
B3
Y0
Y1
Y2
Y3
SELECT
OUTPUT ENABLE
DATA
OUTPUTS
NIBBLE
A INPUTS
NIBBLE
B INPUTS
PIN 16 = V
CC
PIN 8 = GND
Internal Gate Propagation Delay
Internal Gate Power Dissipation
pJ
*Equivalent to a two input NAND gate.
FUNCTION TABLE
PIN ASSIGNMENT
Inputs
Output Outputs
Enable Select Y0 – Y3
X = don’t care
A0 – A3, B0 – B3 = the levels
of the respective Data–Word
Inputs.
13
14
15
16
9
10
11
125
4
3
2
1
8
7
6
SELECT
Y0
B0
A0
Y1
B1
A1
GND
Y3
B3
A3
OUTPUT
ENABLE
V
CC
B2
A2
Y2
H
L
L
X
L
H
L
A0–A3
B0–B3
D SUFFIX
SOIC PACKAGE
CASE 751B–05
N SUFFIX
PLASTIC PACKAGE
CASE 648–08
1
16
1
16
ORDERING INFORMATION
MC74HCTXXXAN
MC74HCTXXXAD
Plastic
SOIC
MC74HCT157A
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
2
DC Supply Voltage (Referenced to GND)
DC Input Voltage (Referenced to GND)
DC Output Voltage (Referenced to GND)
DC Input Current, per Pin
DC Output Current, per Pin
DC Supply Current, VCC and GND Pins
Power Dissipation in Still Air Plastic DIP†
SOIC Package†
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP or SOIC Package)
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage
(Referenced to GND)
Operating Temperature, All Package Types
Input Rise and Fall Time (Figure 1)
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Minimum High–Level Input
Voltage
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
Maximum Low–Level Input
Voltage
V
out
0.1 V or VCC – 0.1 V
|I
out
| v 20 mA
Minimum High–Level Output
Voltage
Vin = VIH or V
IL
|I
out
| v 20 mA
Vin = VIH or V
IL
|I
out
| v 4.0 mA
Maximum Low–Level Output
Voltage
Vin = VIH or V
IL
|I
out
| v 20 µA
Vin = VIH or V
IL
|I
out
| v 4.0 mA
Maximum Input Leakage Current
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
I
out
= 0 µA
Additional Quiescent Supply
Vin = 2.4 V, Any One Input
mA
NOTE:Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high–impedance circuit. For proper operation, Vin and
V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.