Mitsubishi M5M564R16DTP-12, M5M564R16DTP-10, M5M564R16DJ-15, M5M564R16DJ-12, M5M564R16DJ-10 Datasheet

1998.6.18 Ver.A
PRELIMINARY
Notice: This is not a final specification. Some parametric limits are subject to change.
DESCRIPTION
The M5M564R16D is a family of 65536-word by 16-bit static RAMs, fabricated with the high performance CMOS process and designed for high speed application. These devices operate on a single 3.3V supply, and are directly TTL compatible. They include a power down feature as well. In write and read cycles, the lower and upper bytes are able to be controled either togethe or separately by LB and UB.
FEATURES
•Fast access time M5M564R16DJ,TP-10 ... 10ns(max) M5M564R16DJ,TP-12 ... 12ns(max) M5M564R16DJ,TP-15 ... 15ns(max)
•Low power dissipation Active .................. 363mW(typ)
•Single +3.3V power supply
•Fully static operation : No clocks, No refresh
•Common data I/O
•Easy memory expansion by S
•Three-state outputs : OR-tie capability
•OE prevents data contention in the I/O bus
•Directly TTL compatible : All inputs and outputs
•Separate control of lower and upper bytes by LB and UB
1048576-BIT (65536-WORD BY 16-BIT) CMOS STATIC RAM
MITSUBISHI LSIs
M5M564R16DJ,TP-10,-12,-15
44
A15
ADDRESS
A14
43
A13
42
OE
41 40
UB
LB
39
M5M564R16DJ,TP
38
DQ16
37
DQ15
36
DQ14 DQ13
35
GND
34
33
VCC
32
DQ12
31
DQ11 DQ10
30
DQ9
29
N.C
28
A12
27
A11
26
A10
25
A9
24
N.CN.C
23
INPUTS
OUTPUT ENABLE
INPUT
BYTE CONTROL
INPUTS
DATA INPUTS/
OUTPUTS
(0V) (3.3V)
DATA INPUTS/
OUTPUTS
ADDRESS
INPUTS
ADDRESS
INPUTS
CHIP SELECT
INPUTS
DATA
INPUTS/
OUTPUTS
(3.3V)
DATA
INPUTS/
OUTPUTS
WRITE CONTROL
INPUT
ADDRESS
INPUTS
A0
1
A1
2
A2
3
A3
4
A4
5
S
W
A5 A6 A7 A8
6 7
8
9 10 11
12 13 14 15
16
17
18 19 20 21 22
(0V)
DQ1 DQ2 DQ3
DQ4
VCC
GND
DQ5 DQ6 DQ7
DQ8
Outline 44P0K(J)
44P3W-H(TP)
APPLICATION
High-speed memory system
PACKAGE
M5M564R16DJ M5M564R16DTP
FUNCTION
The operation mode of the M5M564R16D is determined by a combination of the device control inputs S, W, OE, LB, and UB. Each mode is summarized in the function table. A write cycle is executed whenever the low level W overlaps with low level LB and/or low level UB and low level S. The address must be set-up before write cycle and must be stable during the entire cycle. The data is latched into a cell on the traling edge of W, LB, UB or S, whichever occurs first, requiring the set-up and hold time relative to these edge to be maintained. The output enable input OE directly controls the output stage. Setting the OE at a high level, the output stage is in a high impedance state, and the data bus contention problem in the write cycle is eliminated. A read cycle is excuted by setting W at a high level and OE at a low level while LB and/or UB and S are in an active
MITSUBISHI ELECTRIC
state. (LB and/or UB=L, S=L) When setting LB at a high level and other pins are in an active state, upper-Byte are in a selectable mode in which both reading and writing are enable, and lower-Byte are in a non-selectable mode. And when setting UB at a high level and other pins are in an active state, lower-Byte are in a selectable mode in which both reading and writing are enable, and upper­Byte are in a non-selectable mode. When setting LB and UB at a high level or S at high level, the chip is in a non-selectable mode in which both reading and writing are disabled. In this mode, the output stage is in a high-impedance state, allowing OR-tie with other chips and memory expansion by LB, UB and S. Signal-S controls the power-down feature. When S goes high, power dissapation is reduced extremely. The access time from S is equivalent to the address access time.
: 44pin 400mil SOJ
: 44pin 400mil TSOP(II)
1
FUNCTION TABLE
MITSUBISHI LSIs
M5M564R16DJ,TP-10,-12,-15
1048576-BIT (65536-WORD BY 16-BIT) CMOS STATIC RAM
W
LL
H Read cycle All Bytes LLH LL
H LL
LX LLX
L
H
X
L H
XX
BLOCK DIAGRAM
A0
1
A1
2
A2
3
A3
ADDRESS
INPUTS
CHIP SELECT INPUTS
WRITE CONTROL INPUT
OUTPUT ENABLE INPUT
UPPER BYTE CONTROL INPUTS
LOWER BYTE CONTROL INPUTS
A4 A5 A6
A7 A8
S
W
OE
UB
LB
4
5 18 19
20 21
6
17
41
40
39
OE
L
X
H X X
UB LB
L
L
L
H L
L H
L X H X
ROW INPUT BUFFERS
Read cycle Upper Bytes
H
Read cycle Lower Bytes
Write cycle All Bytes
L L
Write cycle Upper Bytes
H
Write cycle Lower Bytes X H
Output disable
Non selection Stand by
18
512
DECODERS
ROW ADDRESS
Mode
High-impedance Active
High-impedance
High-impedance High-impedance
MEMORY ARRAY 512 ROWS 2048 COLUMNS
2048
COLUMN I/O CIRCUITS
COLUMN ADDRESS DECODERS
14
COLUMN INPUT BUFFERS
25 26 27 42 4324 44
A15A14A13A12A11A10A9
DQ1~8 DQ9~16
D
OUT
D
OUT
D
IN
IN
D
OUT
D
OUT
High-impedance
D
IN
D
IN
High-impedanceD High-impedance
High-impedance
OUTPUT
BUFFERS
DATA
INPUT
BUFFERS
OUTPUT
BUFFERS
BUFFERS
DATA INPUT
IccS
Active
Active Active
Active Active
Active
7
DQ1
8
DQ2
9
DQ3
10 13 14 15 16
29 30 31 32 35 36 37
38
11 33
12 34
DQ4 DQ5 DQ6 DQ7 DQ8
DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQ16
V
CC
GND
DATA INPUTS/
OUTPUTS
DATA INPUTS/
OUTPUTS
(3.3V)
(0V)
ADDRESS INPUTS
MITSUBISHI ELECTRIC
2
ABSOLUTE MAXIMUM RATINGS
MITSUBISHI LSIs
M5M564R16DJ,TP-10,-12,-15
1048576-BIT (65536-WORD BY 16-BIT) CMOS STATIC RAM
Symbol UnitConditions
cc
V
Supply voltage VI VO
d
P Topr Tstg(bias)
Output voltage
Power dissipation
Operating temperature
Storage temperature(bias)
Parameter
Input voltage
With respect to GND
Ta=25°C
Tstg
*Pulse width 5ns, In case of DC: - 0.5V
DC ELECTRICAL CHARACTERISTICS
(Ta=0~70°C, Vcc=3.3V ,unless otherwise noted)
Symbol Parameter
V
IH
High-level input voltage
V
VOH VOL
I
I
ICC3
Low-level input voltage
IL
High-level output voltage Low-level output voltage
I
Input current
I
I
OZ
Output current in off-state
Active supply current
CC1
(TTL level)
Stand-by supply current
CC2
(TTL level)
Stand-by current (MOS level)
I
OH = - 4mA OL= 8mA
I
= 0 ~ Vcc
I
V VI (S)= VIH VO= 0 ~ Vcc
VI (S)= VIL other inputs VIH or VIL Output-open(duty 100%)
VI (S)= VIH
VI (S)= Vcc - 0.2V other inputs V or V
I≥Vcc - 0.2V
I≤0.2V
Note 1: Direction for current flowing into an IC is positive (no mark).
CAPACITANCE
(Ta=0~70°C
, Vcc=3.3V ,unless otherwise noted)
+10%
-5%
Symbol Parameter
CI CO
Note 2: C
Input capacitance
Output capacitance
I,CO are periodically sampled and are not 100% tested.
VI =GND,Vi =25mVrms,f=1MHz
o =GND,Vo =25mVrms,f=1MHz
V
Ratings
V V
V
mW
°C °C
°C
Min
2.0
Limits
MaxTyp
Vcc+0.3
Condition
*
- 2.0 ~ 4.6
*
- 2.0
~ Vcc+0.5
*
- 2.0 ~ 1000
0 ~ 70
- 10 ~ 85
- 65 ~ 150Storage temperature
Vcc
+10%
-5%
0.8
2.4
0.4
AC(10ns cycle) AC(12ns cycle)
AC(15ns cycle) DC AC(10ns cycle) AC(12ns cycle) AC(15ns cycle) DC
110
200 195 190 140
70 65 60 40
10
Test Condition Unit
Limit
MaxTypMin
68pF
Unit
V V V
V
uA
2 2
uA
mA
mA
mA
pF
AC ELECTRICAL CHARACTERISTICS (Ta= 0~70 °C ,VCC=3.3V ,unless otherwise noted)
+10%
-5%
(1) MEASUREMENT CONDITION
Input pulse levels ................................... VIH=3.0V,VIL=0.0V
Input rise and fall time Input timing reference levels
Output timing reference levels ................ VOH=1.5V, VOL=1.5V
Output loads
....................................................... Fig1 ,Fig2
................................................... 3ns
...................... VIH=1.5V,VIL=1.5V
OUTPUT
Z0=50
RL=50 VL=1.5V
Fig.1 Output load
DQ
DQ
Fig.2 Output load for t , t
255
MITSUBISHI ELECTRIC
5.0V
480
5pF Including
( )
scope and JIG
en dis
3
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