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touch, test, invent Series Instruments
28775 Aurora Road
Cleveland, Ohio 44139
1-800-935-5595
tek.com/keithley
Declassification and Security Instructions
Introduction
If you have data security concerns, this document tells you how to clear or sanitize instrument m em ory devices
in the Keithley touch, test, invent
that is not functioning.
The procedures in this document are written to meet the req ui rements specified in:
NISPOM, DoD 5220.22-M, chapter 8
ISFO Process Manual for Certification and Accreditation of Classified Systems under NISPO M
Products
This document contains procedures for the followi ng Keithley Instruments models:
®
(TTI) series of instruments. It also explain s how to declassify an instrument
2450, 2450-NFP, 2450-NFP-RACK, and 2450-RACK
2460, 2460-NFP, 2460-NFP-RACK, and 2460-RACK
2461, 2461-NFP, 2461-NFP-RACK, and 2461-RACK
2461-SYS
2470 and 2470-RACK
DMM7510, DMM7510-NFP, DMM7510-NFP-RACK, and DMM7510-RACK
Contact information
If you have any questions after you review the information in this documentation, please contact your local
Keithley Instruments office, sales partner, or distributor. You can also call the corporate headq uart ers of
Keithley Instruments (toll-free inside the U.S. and Can ada onl y) at 1-800-935-5595, or from outside the U.S. at
+1-440-248-0400. For worldwide contact numbers, visit the Keithley Instruments website (tek.com/keithley
).
*P077086201*
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touch, test, invent Series Instruments Declassification and Security Instructions
Terminology
The following terms may be used in this document:
Clear: Removes data on media or in memory before reusing it in a secured area. Clears all reusabl
m
emory to deny access to previously unsecured info rmation.
Demo setups: Demonstration applications that come loaded on the instrument; you cannot modi f y them.
Direct method of modification: You can modify data directly.
Erase: Equivalent to clear (see above).
Indirect method of modification: The instrument system reso urces modify the data; you cannot modify
it.
Instrument declassification: Procedures that must be completed before an instrument can b e remove
rom a secure environment. Declassification procedures include memory sanitization and memory
f
removal.
Media storage and data export device: Devices that can be used to store or export data from the
i
nstrument, such as a USB port.
Nonvolatile memory: Data is retained when the instrume nt power is turned off.
Protected user data area: Contains data that is protected by a password.
Remove: Clears instrument data by physically removing the memory device from the instrument.
Sanitize: Eradicates instrument data from media and memory so it cannot be recovered by other means
or technology. This is typically used when the device wil l be m oved (temporarily or permanently) from
ecured area to a nonsecured area.
s
Scrub: Directly retrieve and clear the contents of the mem ory device.
User accessible: You can directly retriev e the contents of the memory device.
User data: Measurement data that represents signals that you connect to the instrument.
User modifiable: You can write to the memory device during normal instrument operation using t
front-panel interface or remote control.
User settings: Instrument settings that y ou can change.
Volatile memory: Temporary memory; data is lost when the instrument is turned of f.
e
a
he
d
Description of memory
All of these instruments share common volatile and n onvolatile memory components. This document and these
instructions work for all instruments listed in the Products (on page 1
All of these instruments contain three sets of volatile and nonvolatile memory as described below.
The MASTER (U13 on the 2450-140 board) contains instrument logic, calibration data, and customer s cripts,
readings, and data:
Two 16 MB nonvolatile NOR FLASH chips on the Digital board
Two 128 MB volatile DDR2 SDRAM chips on the Digit al board
2 077086201 / July 2019
) section.