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Preliminary Specification, Version 1.0, 2003-02-18
TDA5251 F1
ASK/FSK 315MHz Wireless
Transceiver
Wireless Components
Never stop thinking.
Preliminary Specification
Confidential
Revision History:2003-02-18TDA5251 F1
Previous Version:
PageSubjects (major changes since last revision)
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Confidential
ASK/FSK 315MHz Wireless Transceiver
TDA5251 F1
Product Info
General Description
The IC is a low power consumption single chip FSK/ASK
Transceiver for half duplex low datarate communication in the
315MHz band. The IC offers a very high level of in tegr ation an d
needs only a few external components. It contains a highly
efficient power amplifier, a low noise amplifier (LNA) with AGC,
a double balanced mixer, a complex direct conversion stage, I/
Q limiters with RSSI generation, an FSK demodulator, a fully
integrated VCO and PLL synthesizer, a tuneable crystal
oscillator, an onboard data filter, a data comparator (slicer),
positive and negative peak detectors, a data rate detection
circuit and a 2/3-wire bu s interface. Ad ditionally th ere is a power
down feature to save battery power.
Version 1.0
Features
– Low supp ly c u rre nt (Is = 9mA typ. receive, I
= 13mA typ. transmit mode)
– Supply voltage range 2.1 - 5.5V
– Power down mode with very low supply
current consumption
– FSK and ASK modulation and demodulation
capability
– Fully integrated VCO and PLL
synthesizer and loop filter on-chip with on
chip crystal oscillator tuning
Application
– Low Bitrate Communication
Systems
– Keyless Entry Systems
– Remote Control Systems
–Alarm Systems
– Telemetry Systems
2
–I
s
C/3-wire µController Interface
– On-chip low pass channel select filter and
data filter with tuneable bandwidth
– Data slicer with self-adjusting threshold and
2 peak detectors
– FSK sensitivity <-109dBm, ASK sensitivity <
–109dBm
– Transmit power up to +13dBm
– Self-polling logic with ultra fast data rate
The IC is a low power consumption single chip FSK/ASK Transceiver for the frequency band
315MHz. The IC combines a very high level of integration and minimum external part count. The
device contains a low nois e amplifier (LNA), a d ouble balanced mixe r, a fully integrated VC O, a PLL
synthesizer, a crystal oscillator with FSK modulator, a limiter with RSSI generator, an FSK
demodulator, a dat a filter, a data comp ara tor (slicer), a posi tive an d a negative data peak detector,
a highly efficient power amplifier and a complex digital timing and control unit with I
microcontroller interface. Additionally there is a power down feature to save battery power.
The transmit section uses direct ASK modulation by switching the power amplifier, and crystal
oscillator detuning for FSK modulation. The necessary detuning load capacitors are external. The
capacitors for fine tuning are integrated. The receive section is using a novel single-conversion/
direct-conversion scheme that is combining the advantages of both receive topologies. The IF is
contained on the chip, no RF channel filters are necessary as the channel filter is also on the chip.
The self-polling logi c can be used to le t the device operate autonomously as a master for a dec oding
microcontroller.
2
C/3-wire
1.2Features
– Low supply current (Is = 9 mA typ. receive, Is = 13mA typ. transmit mode, both at 3 V supply
voltage, 25°C)
– Supply voltage range 2.1 V to 5.5 V
– Operating temperatur e range -40°C to +85°C
– Power down mode with very low supply current consumption
– FSK and ASK modulation and demodulation capability without external circuitry changes, FM
demodulation capability
– Fully integrated VCO and PLL synthesizer and loop filter on-chip with on-chip crystal oscillator
tuning, therefore no additional external components necessary
– Differential receive signal path completely on-chip, therefore no external filters are necessary
– On-chip low pass channel select and data filter with tuneable bandwith
– Data slicer with self-adjusting threshold and 2 peak detectors
– Self-polling logic with adjustable duty cycle and ultrafast data rate detection and timer mode
providing periodical interrupt
– FSK and ASK sensitivity < -109 dBm
– Adjustable LNA gain
– Digital RSSI and Battery Voltage Readout
– Provides Clock Out Pin for external microcontroller
– Transmit power up to +13 dBm in 50W load at 5V supply voltage
2
–I
C/3-wire microcontroller interface, working at max. 400kbit/s
Preliminary Specification82003-02-18
TDA5251 F1
Version 1.0
Confidential
1.3Application
– Low Bitrate Communication Systems
– Keyless Entry Systems
– Remote Control Systems
–Alarm Systems
– Telemetry Systems
– Electronic Metering
– Home Automation Systems
1.4Package Outlines
Product Description
P-TSSOP-38-1.EPS
Figure 1-1P-TSSOP-38-1 package outlines
Preliminary Specification92003-02-18
TDA5251 F1
Version 1.0
Confidential
2Functional Description
2.1Pin Configuration
VCC
BUSMODE
LF
____
ASKFSK
__
RxTx
LNI
LNIx
GND1
GNDPA
PA
VCC1
PDN
PDP
SLC
VDD
BUSDATA
BUSCLK
VSS
XOUT
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
Functional Description
CI1
CI1x
CQ1
CQ1x
CI2
CI2x
CQ2
CQ2x
GND
RSSI
DATA
___
PWDDD
CLKDIV
______
RESET
___
EN
XGND
XSWA
XIN
XSWF
5251F1_pin_conf.wmf
Figure 2-1Pin Configuration
Preliminary Specification102003-02-18
TDA5251 F1
Version 1.0
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2.2Pin Definitions and Functions
Table 2-1Pin Definition and Function
Pin No.
1
2
SymbolEquivalent I/O-SchematicFunction
VCCAnalog su pply (antiparallel diode s
111
BUSMODEBus mode selection (I²C/ 3 wire bus
350
2
Functional Description
between VCC, VCC1, VDD)
15
mode selection)
3
4
LFLoop filter and VCO control volt age
3
200
ASKFSKASK/FSK- mode switch input
4
350
Preliminary Specification112003-02-18
TDA5251 F1
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Functional Description
5RXTXRX/TX-mode switch input/output
5
6
LNIRF input to differential Low Noise
350
TX
Amplifier (LNA))
5k5k
6
PWDN
7
LNIXsee Pin 6Complementary RF i np u t to
1.1V
7
180180
PWDN
differential LNA
8
GND1Ground return for LNA and Power
Amplifier (PA) dirver stage
9
10
11
30
8
18
9
GNDPAsee Pin 8Ground return for PA output stage
PAPA output stage
10
10
W
9
GndPA
VCC1see Pin 1Supply for LNA and PA
Preliminary Specification122003-02-18
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Functional Description
12PDNOutput of the negative peak
detector
13
14
PWDN
12
350
50k
3k
PDPOutput of the positive peakdetector
50k
13
350
3k
PWDN
SLCSlicer level for the data slicer
1.2uA
14
350
50k
50k50k
50k
50k
50k
15
16
17
1.2uA
50k50k
VDDsee Pin 1Digital supply
BUSDATABus data in/output
The power amplifier is operating in C-mode. It can be used in either high or low power mode. In
high-power mode the transmit power is approximately +13dBm into 50 Ohm at 5V and +6dBm at
2.1V supply voltage. In low power mode the transmit power is approximately +12dBm at 5V and 34dBm at 2.1V supply voltage using the same matching network. The transmit power is controlled
by the D0-bit of the CONFIG register (subaddress 00H) as shown in the following Table 2-2. The
default output power mode is high power mode.
Table 2-2Sub Address 00H: CONFIG
Bit
D0
In case of ASK modulation the power amplifier is turned fully on and off by the transmit baseband
data, i.e. 100% On-Off-Keying.
Function DescriptionDefault
PA_PWR 0= low TX Power, 1= high TX Power1
2.4.2Low Noise Amplifier (LNA)
The LNA is an on- chip cascode amplifi er wit h a voltage gain of 15 to 2 0dB and symmetrical i npu ts.
It is possible to reduce the gain to 0 dB via logic.
Table 2-3Sub Address 00H: CONFIG
Bit
D4
Function DescriptionDefault
LNA_GAIN 0= low Gain, 1= high Gain1
2.4.3Downconverter 1st Mixer
The Double Balanced 1st Mixer converts the input frequency (RF) in the range of 31 5M Hz dow n to
the intermediate frequency (IF) at approximately 105MHz. The local oscillator frequency is
generated by the PLL synthesizer that is fully implemented on-chip as described in Section 2.4.5.
This local oscillator operates at approximately 420MHz in receive mode providing the above
mentioned IF frequency of 105MHz. The mixer is followed by a low pass filter with a corner
frequency of approximately 175MHz in order to prevent RF and LO signals from appearing in the
105MHz IF signal.
2.4.4Downconverter 2nd I/Q Mixers
The Low pass filter is followed by 2 mixers (inphase I and quadrature Q) that convert the 105MHz
IF signal down to zero-IF. These two mi xer s are driv en by a sig nal that is generate d by di viding the
local oscillator signal by 4, thus equalling the IF frequency.
Preliminary Specification182003-02-18
TDA5251 F1
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Functional Description
2.4.5PLL Synthesizer
The Phase Locked Loop synthesizer consists of two VCOs (i.e. transmit and receive VCO), a
divider by 4, an asynchronous divider chain with selectable overall division ratio, a phase detector
with charge pump and a lo op filter and is fully implem en ted on-chip. The VCOs are includ ing spiral
inductors and varactor diodes. The center frequency of the transmit VCO is 630MHz, the center
frequency of the receive VCO is 840MHz.
Generally in receive mode the relationship between local oscillator frequency f
frequency fRF and the IF freq uency fIF and thus the frequency that is applied to the I/Q Mixers is
given in the following formula:
f
osc
2
f 4 f 4/3
==
IFRF
[2 – 1]
The VCO signal is applied to a divider by 2 and afterwards by 4 which is producing approximately
105MHz signals in quad rature. The overa ll divisio n ratio of the div ider chai n following the divider by
2 and 4 is 6 in transmit mode and 8 in receive mode as the nominal crystal oscillator frequency is
13.125MHz. The division ratio is controlled by the RxTx
pin (pin 5) and the D10 bit in the CONFIG
register.
, the receive RF
osc
2.4.6I/Q Filters
The I/Q IF to zero-IF mixers are followed by baseband 6th order low pass filters that are used for
RF-channel filtering.
OP
INTERNAL BUS
iq_filter.wmf
Figure 2-3One I/Q Filter stage
The bandwidth of the filters is controlled by the values set in the filter-register. It can be adjusted
between 50 and 350kHz in 50kHz steps via the bits D1 to D3 of the LPF register (subaddress 03H).
Preliminary Specification192003-02-18
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Functional Description
2.4.7I/Q Limiters
The I/Q Limiters are DC coupled multistage amplifiers with offset-compensating feedback circuit
and an overall gain of approximately 80dB each in the frequency range of 100Hz up to 350kHz.
Receive Signal Streng th Indicator (RSSI) gene rators are included in both limiters which produ ce DC
voltages that are directly proportional to the input signal level in the respective channels. The
resulting I- and Q-channel RSSI-signals are summed to the nominal RSSI signal.
2.4.8FSK Demodulator
The output differential si gnals of the I/Q limiters are fed to a quadrature corr elator circuit that is used
to demodulate frequency shift keyed (FSK) signals. The demodulator gain is 2.4mV/kHz, the
maximum frequency deviation is ±300kHz as shown in Figure 2-4 below.
The demodulated signa l is ap plie d to the ASK/FSK mode switch whic h is co nne cted to the input of
the data filte r. The swit ch ca n be c ontrol led by the ASKFSK
CONFIG register.
The modulation index m must be larger than 2 for correct demodulation of the signal.
The 2-pole data filter has a Sallen-Key arc hitecture and is impl emented fully on-chip. T he bandwidth
can be adjusted betw een ap proxim ately 5 kHz an d 102k Hz via the bits D4 to D7 of the LPF register
as shown in Table 3-10.
ASK / FSK
OTA
INTER NAL BU S
data_filter.wmf
Figure 2-5Data Filter architecture
2.4.10Data Slicer
The data slic er is a fast comparat or with a bandwidth of 100kHz. The self-a djusting thres hold is
generated by a RC-network (LPF) or by use of one or both peak detectors depending on the
baseband coding scheme as de scr ibed in Section 3.6. This can be controlled by the D15 bit of the
CONFIG register as shown in the following table.
Table 2-4Sub Address 00H: CONFIG
Bit
D15
Function DescriptionDefault
SLICER 0= Lowpass Filter, 1= Peak Detector0
2.4.11Peak Detectors
Two separate Peak Detectors are available. They are generating DC voltages in a fast-attack and
slow-release manner that are proportional to the positive and negative peak voltages appearing in
the data signal. These voltages may be used to generate a threshold voltage for non-Manchester
encoded signals, for example. The time-constant of the fast-attack/slow-release action is
determined by the RC network with external capacitor.
2.4.12Crystal Oscillator
The reference oscillator is an NIC oscillator type (Negative Impedance Converter) with a crystal
operating in serial resonan ce. The no minal opera ting frequenc y of 13.125MH z and the freque ncies
for FSK modulation ca n be adjus ted via 3 external c apacitors . Via micr ocontrolle r and bus interface
the chip-internal capacitors can be used for finetuning of the nominal and the FSK modulation
frequencies. This finetuning of the crystal oscillator allows to eliminate frequency errors due to
crystal or component tolerances.
Preliminary Specification212003-02-18
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Functional Description
2.4.13Bandgap Reference Circuitry and Powerdown
A Bandgap Reference Circ uit provides a temperature s tab le 1.2V reference voltage for the d evice.
A power down mode is available to switch off all subcircuits that are controlled by the bidirectional
Powerdown&DataDetect PwdDD
pin (pin 27) as shown in the following table. Power down mode
can either be ac tivated b y pin 27 or b it D1 4 in Re gister 00 . In p ower do wn mode a lso p in 28 (D ATA)
is affected (see Section 2.4.17).
Table 2-5PwdDD Pin Operating States
PwdDD
VDD
Ground/VSS
Operating State
Powerdown Mode
Device On
2.4.14Timing and Data Control Unit
The timing and data control unit contains a wake-up logic unit, an I2C/3-wire microcontroller
interface, a “data valid” detection unit and a set of configuration registers as shown in the
subsequent figure.
REGISTERS
RF - BLOCK
RSSI
RX DATA
FSK DATA
ASK DATA
BLOCK ENABLE
ASK / FSK
RX / TX
INTERNAL BUS
6 Bit
ADC
BusData
BusCLK
EN
I2C / 3Wire
INTERFACE
DATA VALID
DETECTOR
AMPLITUDE
threshold TH 3
FREQUENCY
window
TH1<T
<TH2
GATE
DATA
ENABLE
CONTROL
LOGIC
POWER ON
SEQUENCER
BusMode
13.125 MHz
XTAL-Osz
WAKEUP
LOGIC
RC-Osz.
VALID
.
32kHz
CLKDiv
PwdDD
Data
AskFsk
RxTx
Reset
logic.wmf
Figure 2-6Timing and Data Control Unit
Preliminary Specification222003-02-18
TDA5251 F1
Version 1.0
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Functional Description
The I2C / 3-wire Bus Interface gives an external microcontroller full control over important system
parameters at any time.
It is possible to set the device in three different modes: Slave Mode, Self Polling Mode and Timer
Mode. This is done by a state machine which is implemented in the WAKEUP LOGIC unit. A
detailed description is given in Section 2.4.16.
The DATA VALID DETECTOR contains a frequency window counter and an RSSI threshold
comparator. The window counter uses the incoming data signal from the data slicer as the gating
signal and the crystal oscillator frequency as the timebase to determine the actual datarate. The
result is compared with the expected datarate.
The threshold comparator compares the actual RSSI level with the expected RSSI level.
If both conditions are true the PwdDD
pin is set to LOW in self polling mode as you can see in
Section 2 .4.16. This signal can be used as an interrupt for an external µP. Because the PwdDD
pin is bidirectional and open drain driven by an internal pull-up resistor it is possible to apply an
external LOW thus enabling the device.
2.4.15Bus Interface and Register Definition
The TDA5251 supports the I2C bus protocol (2 wire) and a 3-wire bus protocol. Operation is
selectable by the BusMode pin (pin 2) as shown in the following table. All bus pins (BusData,
BusCLK, EN
where the output is open drain driven by an internal 15kW pull up resistor.
, BusMode) have a Schmitt-triggered input stage. The BusData pin is bidirectional
Table 2-6Bus Interface Format
Function
2
C Mode Low High= inactive,
I
3-wire Mode
BusMode EN BusCLK BusData
High
BusData
16
BusCLK
17
EN
24
BusMode
2
Figure 2-7Bus Interface
Low= active
I2C / 3-wire
INTERFACE
FRONTEND
1 1 1 0 0 0 0 0
CHIP ADDRESS
Clock input Data in/out
INTERNAL BUS
i2c_3w_bus.wmf
Note: The Interface is able to access the internal registers at any time, even in POWER DOWN
mode. There is no internal clock necessary for Interface operation.
Preliminary Specification232003-02-18
TDA5251 F1
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Functional Description
I2C Bus Mode
In this mode the BusMode pin (pin 2) = LOW and the EN pin (pin 24) = LOW.
Data Transition:
Data transition on the pin BusData c an only occur whe n BusCLK is LOW . BusData tran sitions while
BusCLK is HIGH will be interpreted as start or stop condition.
Start Condition (STA):
A start condition is defined b y a HIGH to LOW transition of the BusData lin e while BusCLK is HIG H.
This start condition must precede any command and initiate a data transfer onto the bus.
Stop Condition (STO):
A stop condition is defined by a LOW to HIGH transit ion of the BusData line whi le BusCLK is HIGH.
This condition termi nates the com munication be tween the devices an d forces t he bus inte rface into
the initial state.
Acknowledge (ACK):
Indicates a successfu l data tra nsf er. The transmitte r wil l releas e the bu s aft er send ing 8 bit o f data.
During the 9th clock cycle th e receive r will set th e SDA line to LOW lev el to indic ate it has rec eived
the 8 bits of data correctly.
Data Transfer Write Mode:
To start the communi cation, the b us master must initiate a st art condition (ST A), followed by the 8bit
chip address. The chip address for the TDA5251 is fixed as „1110000“ (MSB at first). The last bit
(LSB=A0) of the chip address byte defines the type of operation to be performed:
A0=0, a write operation is selected and A0=1 a read operation is selected.
After this comparison the TD A52 51 w ill ge ner ate an ACK and awaits the desired s ub ad dress byte
(00H...0FH) and data bytes. At the end of the data transition the master has to generate the stop
condition (STO).
Data Transfer Read Mode:
To start the communication in the read mode, the bus master must initiate a start condition (STA),
followed by the 8 bit chip address (write: A0=0), followed by the sub address to read (80H, 81H),
followed by the chip address (read:A0=1). After that procedure the data of the selected register
(80H, 81H) is read out. During this time the data line h as to be kept in HIGH state an d the chip sends
out the data. At the end of data transition the master has to generate the stop condition (STO).
D7
D6 COMP_IN 1 if TH1 < data rate < TH2
D5 COMP_HIGH 1 if TH2 < data rate
COMP_0,5*LOW 1 if data rate < 0,5*TH1
D4
D3 COMP_0,5*IN 1 if 0,5*TH1 < data rate < 0,5*TH2
D2
COMP_0,5*HIGH 1 if 0,5*TH2 < data rate
D1 RSSI=TH3 1 if RSSI value is equal TH3
D0
RSSI>TH3 1 if RSSI value is greater than TH3
REF_PD 1= power down Band Gap Reference1
RC_PD 1= power down RC Oscillator1
WINDOW_PD 1= power down Window Counter1
ADC_PD 1= power down ADC1
PEAK_DET_PD 1= power down Peak Detectors1
DATA_SLIC_PD 1= power down Data Slicer1
DATA_FIL_PD 1= power down Data Filter1
QUAD_PD 1= power down Quadri Correlator1
LIM_PD 1= power down Limiter1
I/Q_FIL_PD 1= power down I/Q Filters1
MIX2_PD 1= power down I/Q Mixer1
MIX1_PD 1= power down 1st Mixer1
LNA_PD 1= power down LNA1
PA_PD 1= power down Power Amplifier1
PLL_PD 1= power down PLL1
XTAL_PD 1= power down XTAL Oscillator1
Table 2-27 Sub Address 81H: ADC
Bit Function Description
D7
PD_ADC ADC power down feedback Bit
SELECT SELECT feedback Bit
D6
D5
D4
D3
D2
D1
D0
RSSI_5 RSSI value Bit5
RSSI_4 RSSI value Bit4
RSSI_3 RSSI value Bit3
RSSI_2 RSSI value Bit2
RSSI_1 RSSI value Bit1
RSSI_0 RSSI value Bit0
Preliminary Specification292003-02-18
TDA5251 F1
Version 1.0
Confidential
2.4.16Wakeup Logic
SLAVE MODE
(default)
MODE_1 = 0
MODE_2 = 0
SELF POLLING
MODE
MODE_1 = 1
MODE_2 = X
Figure 2-9Wakeup Logic States
Table 2-28 MODE settings: CONFIG register
MODE_1
0
0
1
MODE_2 Mode
0 SLAVE MODE
1 TIMER MODE
X SELF POLLING MODE
TIMER MODE
MODE_1 = 0
MODE_2 = 1
Functional Description
3_modes.wmf
SLAVE MODE: The receive and transmit operation is fully controlled by an external control device
via the respective RxTx
After RESET or 1
, AskFsk, PwdDD, and Data pins. The wakeup logic is inactive in this cas e.
st
Power-up the chip is in SLAV E MODE. By settin g MODE_1 and MO DE_2 in the
CONFIG register the mode may be changed.
SELF POLLING MODE: The chip turns itself on periodically to receive using a built-in 32kHz RC
oscillator. The timing of this i s determined by the ON_TIME and OFF_TIME registers, the duty cycle
can be set between 0 and 100% in 31.2 5µs increments. T he data detect log ic is enabled a nd a 15µs
LOW impulse is provided at PwdDD
Action
PwdDD pin in
SELF POLLING MODE
pin (Pin 27), if the received data is valid.
ON_TIMEON_TIME
RX ON: valid Data
min. 2.6ms
15µs
OFF_TIME
RX ON: invalid Data
t
t
timing_selfpllmode.wmf
Figure 2-10Timing for Self Polling Mode (ADC & Data Detect in one shot mode)
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Confidential
Functional Description
Note: The time delay between start of ON time and the 15µs LOW impulse is 2.6ms + 3 period of
data rate.
If ADC & Data Detect Logic are in continuous mode the 15µs LOW impulse is applied at PwdDD
after each data valid decision.
In self polling mode if D9=0 (Register 00h) and when PwdDD
pin level is HIGH the CLK output is
on during ON time and off during OFF time. If D9=1, the CLK output is always on.
TIMER MODE: Only the internal Timer (determined by the ON_TIME and OFF_TIME registers) is
active to support an external logic with periodical Interrupts. After ON_TIME + OFF_TIME a 15µs
LOW impulse is appli ed at the PwdDD
ON_TIMEON_TIME
ActionRegister 04H
PwdDD pin in
TIMER MODE
15µs15µs
pin (Pin 27).
OFF_TIME
Register 05 H
Register 04H
t
t
timing_timermode.wmf
Figure 2-11Timing for Timer Mode
2.4.17Data Valid Detection, Data Pin
Data signals generate a typical spectrum and this can be used to determine if valid data is on air.
Amplitude
RSSI
Figure 2-12Frequency and RSSI Window
The “data valid” criterio n is generated from the result of RSSI-TH3 comparison and t
TH1 and TH2 result as s hown below . In c ase of M ancheste r coding the 0, 5*TH1 and 0,5*TH2 gives
improved performance.
The use of permanent data valid recognition makes it absolutely necessary to set the RSSI-ADC
and the Window counter into continuous mode (Register 00H, Bit D5 = D6 = 1).
Frequency & RSSI Window
f
DATA on air
no DATA on air
Frequency
data_rate_detect.wmf
between
GATE
Preliminary Specification312003-02-18
TDA5251 F1
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0,5*TH1 T
TH1 T
0,5*TH2
GATE
GATE
RSSI TH3
TH2
DATA VALID
Functional Description
data_valid.wmf
Figure 2-13Data Valid Circuit
D_OUT and RX_DATA_INV from the CONFIG register determine the output of data at Pin 28.
RxTx
int and TX_ON are internally generated signals.
In RX and power down mode Data pin (Pin 28) is tied to GND.
RxTxint
RX_DATA_INV
RX DATA
DATA VALID
D_OUT
Data
28
TX DATA
TX ON
data_switch.wmf
Figure 2-14Data Input/Output Circuit
2.4.18Sequence Timer
The sequence time r has to control all th e e nable signals of the a nalog components insi de the chip.
The time base is the 32 kHz RC oscillator.
After the first POWER ON or RE SET a 73 0kHz cl ock i s availa ble at the cl ock output pin . This clo ck
output can be used by an external mP to se t the system into the desired state an d outputs valid d ata
after 500 µs (see Figure 2-15 and Figure 2-16, t
CLKSU
There are two possibilities to start the device after a reset or first power on:
-PWDDD
-PWDDD
until the device is activated (PWDDD
t
SYSSU
pin is LOW: Normal operation timing is performed after t
pin is HIGH (device in power down mode): A clock is offered at the clock output pin
pin is pulled to LOW). After the first activation the time
is required until normal operation timing is performed (see Figure 2-16 ).
This could be used to extend the clock generation without device programming or activation.
)
SYSSU
(see Figure 2-15).
Note: It is required to activate the device for the duration of t
after first power on or a reset.
SYSSU
Only if this is done the normal operation timing is performed.
Preliminary Specification322003-02-18
TDA5251 F1
Version 1.0
Confidential
Functional Description
With default settings the clock generating units are disabled during PD, therefore no clock is
available at the clock output pin. It is possible to offer a clock signal at the clock output pin every
time (also during PD) if the CLK_EN Bit in the CONFIG register is set to HIGH.
RESET
st
POWER O N
or 1
PWDDD = low
STATUS
XTAL EN
TX activ or RX activ
CLOCK FOR EXTERNAL µP
PD
TX activ
RX activTX acti vRX activ
PD
**
DC OFFSET COMPENSATION
PEAK DETECTOR EN
DATADETECTION EN
POWER AMP EN
t
CLKSU
0.5ms
t
SYSSU
8ms
t
1.1ms
TXSU
if RX
if RX
if RX
if TX
t
RXSU
2.2ms
t
DDSU
2.6ms
t
CLKSU
0.5ms
t
TXSU
1.1ms
t
CLKSU
0.5ms
t
TXSU
1.1ms
t
RXSU
2.2ms
t
DDSU
2.6ms
Sequenzer_Timing_pupstart.wmf
t
RXSU
2.2ms
t
DDSU
2.6ms
Figure 2-151
st
start or reset in active mode
Note: The time values are typical values
RESET
st
POWER ON
or 1
PWDDD = high
STATU S
XTAL EN
DC OFFSET COMPENSATION
PEAK DETECTOR EN
DATADETECTION EN
POWE R AMP EN
t
CLKSU
0.5ms
PD
CLOCK FOR EXTERNAL µP
Figure 2-161st start or reset in PD mode
PWDDD = low
TX activ or RX activ
t
SYSSU
8ms
t
TXSU
1.1ms
if RX
if RX
if RX
if TX
PDTX activRX activ
*
t
CLKSU
0.5ms
t
RXSU
2.2ms
t
DDSU
2.6ms
t
TXSU
1.1ms
t
RXSU
2.2ms
t
DDSU
2.6ms
Sequenzer_Timing_pdstart.wmf
* State is either „I“ or „O“ depending on time of setting into powerdown
Note: The time values are typical values
Preliminary Specification332003-02-18
TDA5251 F1
Version 1.0
Confidential
This means that the device needs t
When activating TX it requires t
TXSU
setup time to start the data detection after RX is acti vated.
DDSU
setup time to enable the power amplifier.
Functional Description
For timing information refer to Table 4-3.
For test purposes a TE STMODE is provided by the Sequencer as w ell. In this mode the BL OCK_PD
register be set to various va lues. This will overrid e the Sequencer timi ng. Depending on t he settings
in Config Register 00H the corres ponding bui lding bl ocks are ena bled, as sh own in the su bsequent
figure.
CLK_EN
16
RC- OSC.
XTAL FREQU.
SELECT
ENABLE / DISABLE
BUILDING BLOCKS
sequencer_raw.wmf
RESET
32 kHz
RX ON
TX ON
ASK/FSK
INTERNAL BUS
TIMING
BLOCK_PD
2
16
DECODE
SWITCH
16
REGISTER
ALL_PD
TESTMOD E
Figure 2-17Sequencer‘s capability
2.4.19Clock Divider
It supports an external logic with a programmable Clock at pin 26 (CLKDIV).
INTERNAL BUS
13 MHz
4 BIT
COUNTER
WINDOW COUNT COMPLETE
DIVIDE
32 kHz
BY 2
Figure 2-18Clock Divider
The Output Selection and Divider Ratio can be set in the CLK_DIV register.
DIVMODE_0
DIVMODE_1
CLKDiv
26
SWITCH
clk_div.wmf
Preliminary Specification342003-02-18
TDA5251 F1
Version 1.0
Confidential
Table 2-29 CLK_DIV Output Selecti on
D5 D4
0
0
1
1
Note: Data are valid 500 µs after the crystal oscillator is enabled (see Figure 2-15 and Figure 2-
16, t
Note: As long as default settings are used, there is no clock available at the clock output during
Power Down. It is possible to enable the clock during Power Down by setting CLK_EN (Bit D9) in
the Config Register (00H) to HIGH.
2.4.20RSSI and Supply Voltage Measuremen t
The input of the 6Bit-ADC can be switched betw een two different sources: the RSS I voltage (default
setting) or a resistor network dividing the V cc voltage by 5.
Table 2-31 Source for 6Bit-ADC Selection (Register 08H)
SELECT
0
1
Preliminary Specification352003-02-18
Input for 6Bit-ADC
Vcc / 5
RSSI (default)
TDA5251 F1
Version 1.0
Confidential
To prevent wrong inte rpretation of the ADC inform ation (read from Registe r 81H: ADC) y ou can use
the ADC- Power Down feedback Bit (D7) and the SELECT feedback Bit (D6) which correspond to
the actual measurement.
Note: As shown in Section 2.4.18 there is a setup time of 2.6ms after RX activating. Thus the
measurement of RSSI voltage does only make sense after this setup time.
Functional Description
Preliminary Specification362003-02-18
TDA5251 F1
Version 1.0
Confidential
3Application
3.1LNA and PA Matching
3.1.1RX/TX Switch
Application
RX/TX_Switch.wmf
Figure 3-1RX/TX Switch
The RX/TX-switch combines the PA-output and the LNA-input into a single 50 Ohm SMAconnector. Two pin-dio des are u sed as sw itching elemen ts. If no cur ren t flows thr ough a pi n diode,
it works as a high impeda nce for R F with very lo w capa citance . If the p in-di ode is forward biased , it
provides a low impedance path for RF. (some W)
3.1.2Switch in RX-Mode
The RX/TX-switch is set to the receive mode by either applying a high level or an open to the RX/
TX-jumper on the evalboard or by leaving it open. Then both pin-diodes are not biased and
therefore have a high impedance.
Preliminary Specification372003-02-18
TDA5251 F1
Version 1.0
Confidential
Figure 3-2RX-Mode
The RF-signal is able to run f rom the RF-inp ut-SMA-conn ector t o the LN A-input-pin LNI via C1, C2,
C7, L3 and C9. R1 does not affect the ma tching cir cuit due to its high res istance. The oth er input of
the differ entia l LNA LN IX ca n alwa ys be A C-gro unded using a lar ge capa cito r with out any loss of
performance. In this case the differential LNA can be used as a single ended LNA, which is easier
to match. The S11 of the LNA at pin LNI on the evalboard is 0.97 / -17° (equals a resistor of
3.3kOhm in parallel to a capac itor of 1.5pF) for both high an d low -gain-m ode of the LNA. (pin LN IX
AC-grounded) This im pedanc e has to be ma tched to 50 Ohm w ith the parts C9, L 3, C7 and C2. C1
is a DC-decoupling-capacitor. On the evalboard the most important matching components are
(shunt) L3 and (series)C7, C2. The capacitors is mainly a DC-decoupling-capacitor and may be
used for some fine tuning of the matching circuit. A good CAE tool (featuring smith-chart) may be
used for the calculatio n of the v alues o f the com ponen ts. Howeve r, the fin al valu es of the matchi ng
components always have to be found on the board because of the parasitics of the board, which
highly influence the matching circuit at RF.
Application
RX_Mode.wmf
Preliminary Specification382003-02-18
TDA5251 F1
Version 1.0
Confidential
Measured Magnitude of S11 of evalboard:
Application
S11_measured_315.pcx.
Figure 3-3S11 measured
Above you can see the measured S11 of the evalboard. The –3dB-points are at 288MHz and
344MHz. So the 3dB-bandwidth is:
[3 – 1]
f
fB56288344=-=-=
L
U
The loaded Q of the resonant circuit is:
f
Q
center
L
B
315
56
MHz
MHz
===
MHzMHzMHz
[3 – 2]
6,5
The unloaded Q of the resonant circuit is equal to the Q of the inductor due to its losses.
Q315@27»=
U
Q
INDUCTOR
MHz
[3 – 3]
An approximation of the losses of the input matching network can be made with the formula:
é
LOSS2
ê
ê
ë
ù
Q
L
ú
--=
Q
ú
U
û
é
ê
ê
ë
ù
6,5
1log*201log*20=
--=
ú
27
ú
û
dB
[3 – 4]
Preliminary Specification392003-02-18
TDA5251 F1
4
Version 1.0
Confidential
Application
The noise figure of the LNA-input-matching network is equal to its losses. The input matching
network is always a compromis e of sensitivit y and selectivi ty. The load ed Q should not get too high
because of 2 reasons:
more losses in the matching network and hence less sensitivity
tolerances of components af fect matching too muc h. This will cause probl ems in a tuning-free ma ss
production of the app lica tion. A good CAE-tool w ill help to see the effec ts of component tolerances
on the input matching more accurate by tweaking each value.
A very high selectivity can be rea ched by usi ng SAW-fi lters at the expens e of higher c ost and low er
sensitivity which will be reduced by the losses of the SAW-Filter of approx. 4dB.
Image-suppression:
Due to the quite high 1
st
-IF of the frontend, the image frequency is quite far away. The image
frequency of the receiver is at:
f525105*2315*2=+=+=
IMAGE
f
SIGNAL
f
IF
MHzMHz
[3 – 5]
The image suppression on the evalboard is about 12dB.
LO-leakage:
The LO of the 1st Mixer is at:
f
f420
LO
RECEIVE
4
*===
3
4
*315
3
MHzMHz
[3 – 6]
The LO-leakage of the evalboard on the RF-input is about –102dBm.
3.1.3Switch in TX-Mode
The evalboard can be set into the TX-Mode by grounding the RX/TX-jumper on the evalboard or
programming the TDA5251 to operate in the TX-Mode. If the IC is programmed to operate in the
TX-Mode, the RX/TX-p in will act as an open drain output at a log ical LOW. Then a DC-current can
flow from VCC to GND via L1, L2, D1, R1 and D2.
*2
CC
V
-
,
DIODEPINFORWARD
R
1
-
[3 – 7]
I
DIODEPIN
-
V
=
Now both pin-diodes are biased with a current of approx. 0.3mA@3V and have a very low
impedance for RF.
Preliminary Specification402003-02-18
TDA5251 F1
Version 1.0
Confidential
Figure 3-4TX_Mode
Application
TX_Mode.wmf
R1 does not influence the matching because of its very high resistance. Due to the large
capacitance of C1, C6 and C5 the circuit can be further simplified for RF:
TX_Mode_simplified.wmf
Figure 3-5TX_Mode_simplified
The LNA-matching is RF-grounded now, so no power is lost in the LNA-input. The PA-matching
consists of C2, C3 L2, C4 and L1.
When designing the matching of the PA, C2 must not be changed anymore because its value is
already fixed by the LNA-input-ma tch ing.
Preliminary Specification412003-02-18
TDA5251 F1
Version 1.0
Confidential
Application
3.1.4Power-Amplifier
The power amplifier operates in a high efficient class C mode. This mode is characterized by a
pulsed operation of the power amplifier transistor at a current flow angle of q<<p. A frequency
selective network at th e amplifier outp ut passes the funda mental frequen cy component of the pulse
spectrum of the collector current to the load. The load and its resonance transformation to the
collector of the power amplifier can be generalized by the equ ivalent circui t of Figur e 3 -6. The tank
circuit L//C//RL in parallel to the output impedance of the transistor should be in resonance at the
operating frequency of the tran smitter.
V
S
CL
R
L
Equivalent_power_wmf.
Figure 3-6Equivalent power amplifier tank circuit
The optimum load at the collector of the power amplifier for “critical” operation under idealized
conditions at resonance is:
R=
LC
22P
S
0
[3 – 8]
V
A typical value of RLC for an RF output power of Po= 13mW is:
2
LC
*
013.02
3
=350
R
W=
[3 – 9]
Critical” operation i s characterized by the RF peak voltage swing at th e collector of the PA tran sistor
to just reach the supply voltage V
. The high efficiency under “critical” operating conditions can be
S
explained by the low power loss at the transistor.
During the conducting phase of the transistor there is no or only a very small collector voltage
present, thus minimizing the power loss of the transistor (i
current flow angles of q<<p
parasitics will reduce the “critical” R
. In practice the RF-saturation voltage of the PA transistor and other
.
LC
). This is particularly true for low
C*uCE
Preliminary Specification422003-02-18
TDA5251 F1
Version 1.0
Confidential
Application
The output po wer Po will be reduced when operating in an “overcritical” mode at a RL > RLC. As
shown in Figure 3-7, however, power efficiency E (and bandwidth) will increase by some degree
when operating at higher RL. The collector efficiency E is defined as
E0=
The diagram of Figure 3-7 has b een mea sur ed directly at the PA-outpu t at V
P
I
V
C
S
[3 – 10]
=3V. A power loss in
S
the matching circuit of about 3dB will decrease the output power. As shown in the diagram, 250
Ohm is the optimum impedance for operation at 3V. For an approximation of R
OPT
and P
OUT
at
other supply voltages those 2 formulas can be used:
[3 – 11]
OPT
S
VR~
and
RP~
OPTOUT
[3 – 12]
Power_E_vs_RL_315.wmf
Figure 3-7Output power Po (mW) and collector efficiency E vs. load resistor RL.
The DC collector current Ic of the power amplifier and the RF output power Po vary with the load
resistor RL. This is typical for overcritical operation of class C amplifiers. The collector current will
show a characteristic dip at the resonance frequency for this type of “overcritical” operation. The
depth of this dip will increase with higher values of RL.
Preliminary Specification432003-02-18
TDA5251 F1
Version 1.0
Confidential
As Figur e 3-8 sh ows, detuning beyond the band width of the match ing circui t results in a significa nt
increase of collector c urrent of the power ampli fier and in some loss of out put pow er. This diagram
shows the data for the circuit of the test board at the frequency of 315MHz. The effective load
resistor of this circuit is RL= 250Ohm, which is the optimum im pedance for operation at 3V. Thi s will
lead to a dip of the collector current of approx. 20%.
Application
pout_vs_frequ_315.wmf
Figure 3-8Power output and collector current vs. frequency
C4, L2 and C3||C2 are the main matching components which are used to transform the 50 Ohm
load at the SMA-RF-connector to a higher impedance at the PA-output (250Ohm@3V). L1 can be
used for finetuning of the resonance frequency but should not be too low in order to keep its loss
low.
The transformed impedance of 250Ohm+j0 at the PA-output-pin can be verified with a network
analyzer using this measurement procedure:
1. Calibrate your network analyzer.
2. Connect a short, low-l oss 50 Ohm cable to you r networ k analyzer with an open end on one si de.
Semirigid cable works best.
3. Use the „Port Extension“ feature of your network analyzer to shift the reference plane of your
network analyzer to the open end of the cable.
4. Connect the center-c onducto r of the cable to the sol der pad of the pin „PA“ of the IC . The shield
has to be grounded. Very short connections must be used. Do not remove the IC or any part of
the matching-components!
5. Screw a 50Ohm-dummy-load on the RF-I/O-SMA-connector
6. The TDA5251 has to be in ASK-TX-Mode, Data-Input=LOW.
7. Be sure that your network analyzer is AC-coupled and turn on the power supply of the IC.
8. Measure the S-parameter
Preliminary Specification442003-02-18
TDA5251 F1
Version 1.0
Confidential
Application
Sparam_measured_315.pcx
Figure 3-9Sparam_measured_100M
Above you can see the measurement of the evalboard with a span of 100MHz. The evalboard has
been optimized for 3V. The load is about 250+j0 at 315MHz.
A tuning-free realization requires a careful design of the components within the matching network.
A simple linear CAE-tool will help to see the influence of tolerances of matching components.
Suppression of spurious harmonics may require some additional filtering within the antenna
matching circuit. Both can be seen in Figure 3-10 and Figure 3-11 The total spectrum of the
evalboard can be summarized as:
The equivalent schematic of the crystal with its parameters specified by the crystal manufacturer
can be taken from the subsequent figure.
Here also the load capacitan ce of the crystal CL, which the crystal wants to see in order to os cillate
at the desired frequency, can be seen.
C
1
R
1
1
C
0
C
L
Crystal.wmf
Figure 3-12Crystal
L
-R
L
:motional inductance of the crystal
1
C
:motional capa citance of the crystal
1
C
:shunt capacitance of the crystal
0
Therefore the Resonant Frequency fs of the crystal is defined as:
f
S
1
=
*2
CL
p
11
[3 – 13]
The Series Load Resonant Frequency fS‘ of the crystal is defined as:
f
`
S
1
*2
p
CL
11
C
1*
1
+=
CC
+
L
0
[3 – 14]
regarding Figure 3-12
fs’ is the nominal frequency of the crystal with a specified load when tested by the crystal
manufacturer.
Pulling Sensitivity of the crystal is defined as the magnitude of the relative change in frequency
relating to the variation of the load capacitor.
Preliminary Specification472003-02-18
TDA5251 F1
Version 1.0
Confidential
f
d
D
d
C
d
S
d
C
L
´
-
f
S
==
L
C
1
2
+
()
2
CC
0
L
[3 – 15]
Application
Choosing CL as large as possible res ults in a small pullin g sensitivity. O n the other hand a small C
keeps the influence o f the se rial inductance and the tolerances associated to it sm all ( see formula
[3-17]).
Start-up Time
t
Start
~
1
RR
--
ext
[3 – 16]
L
where:-R: is the negative impedance of the oscillator
see Figure 3-13
R
:is the sum of all external resistances (e.g. R1 or any
ext
other resistance that may be present in the circuit,
see Figure 3-12
L
The proportionality of L1 and C1 of the crystal is defined by formula [3-13]. For a crystal with a small
C1 the start -up time will also be slower. Typically the lower the value of the crystal frequency, the
lower the C1.
A short conclusion regarding crystal and crystal oscillator dependencies is shown in the following
table:
Table 3-1Crystal and crystal oscilator dependency
Result
Independent variable
C1 >
C0 >
frequency of quartz >
L
OSC
>
CL >
Relative Tolerance Maximum Deviationt
>>>><
<<-
>>>><<
>>>-
><-
Start-up
The crystal oscillator in the TDA5251 is a NIC (negative impedance converter) oscillator type. The
input impedance of this o scillator is a negative impedanc e in series to an induc tance. The refore the
load capacitance of the crystal C
capacitance C
as shown in formula [3-17].
v
(specified by the crystal supplier) is transformed to the
L
Preliminary Specification482003-02-18
TDA5251 F1
Version 1.0
Confidential
-R
Figure 3-13Crystal Oscillator
C
=
L
1
1
C
L
-
V
C
=«
V
OSC
:crystal load capacitance for nominal frequency
C
L
1
C
w:angular frequency
L
:inductivity of the crystal oscillator - typ: 2.2mH with pad of board
OSC
L
L
TDA 5250
1
22
L
ww+
OSC
OSC
f, C
Application
C
L
V
QOSZ_NIC.wmf
[3 – 17]
2.1µH without pad
With the aid of this formula it becomes obvious that the higher the serial capacitance CV is, the
higher is the influence of L
OSC
.
The tolerance of the inter nal oscillat or inductivity i s much higher, so the inductivity is th e dominating
value for the tolerance.
FSK modulation and tuning are achieved by a variation of C
.
v
In case of small frequency deviations (up to +/- 1000 ppm), the desired load capacitances for FSK
modulation are frequency depending and can be calculated with the formula below.
In ASK receive mode the crystal osc illator is set to frequency f
offset to receive the ASK signal at f
To set the 3 different frequencies 3 different C
*N (N: division ratio of the PLL).
0
are necessary. Via internal switches 3 external
v
capacitors can be combined to generate the necessary C
to realize the necessary freq uency
2
in case of ASK- or FSK-modulation.
v
Internal banks of switchable capacitors allow the finetuning of these frequencies.
3.2.2Transmit/Receive ASK/FSK Frequency Assignment
Depending on whether the device operates in transmit or receive mode or whether it operates in
ASK or FSK the following cases can be distinguished:
3.2.2.1FSK-mode
In transmit mode the two frequencies representing logical HIGH and LOW data states have to be
adjusted depending on the intended frequency deviation and separately according to the following
formulas:
f
COSC HI
= (fRF + f
) / 24 f
DEV
COSC LOW
= (fRF - f
DEV
) / 24
[3 – 19]
Preliminary Specification502003-02-18
TDA5251 F1
Version 1.0
Confidential
Application
e.g.
f
COSC HI
f
COSC LOW
= (315E6 + 30E3) / 24= 13.12625MHz
= (315E6 - 30E3) / 24= 13.12375MHz
with a frequency deviation of 30kHz.
Figure 3-15 shows the configuration of the switches and the capacitors to achieve the 2 desired
frequencies. Gray parts of the schematics indicate inactive parts. For FSK modulation the ASKswitch is always open.
For FSK LOW the FSK- switch is closed a nd C
and C
v2
are bypassed. The e ffective Cv- is given
tune2
by:
-
For finetuning C
CCC+=
11tunevV
can be varied over a range of 8 pF in steps of 125fF. The switche s of this C-
tune1
[3 – 20]
bank are controlled by the bits D0 to D5 in the FSK register (subaddress 01H, see Table 3-6).
For FSK HIGH the FSK-switch is open. So the effective C
is given by:
v+
Cv1C
C
v+
The C-bank C
+()C
-------------------------------------------------------------------------------------- -=
C
tune2
tune1
+C
v1Ctune1
can be varied over a range of 16 pF in ste ps of 250fF for finetu ning of the F SK
+()×
v2Ctune2
++
v2Ctune2
[3 – 21]
HIGH frequency. The switches of this C-bank are controlled by the bits D8 to D13 in the FSK
register (subaddress 01H, see Table 3-6).
XOUT 19
f, C
L
XIN 21
C
V1
XSWF 20
XSWA 22
C
C
V2
V3
XGND 23
ASK-
switch
-RL
C
V1
C
tune1
C
V2
C
tune2
FSK-
switch
f, C
C
L
V3
XOUT 19
XIN 21
XSWF 20
XSWA 22
XGND 23
ASK-
switch
-RL
C
tune1
C
tune2
FSK-
switch
FSK LOW
FSK HIGH
QOSC_FSK.wmf
Figure 3-15FSK modulation
Preliminary Specification512003-02-18
TDA5251 F1
Version 1.0
Confidential
Application
In receive mode the crystal oscillator frequency is set to yield a direct-to-zero conversion of the
receive data. Thus the frequency may be calculated as
f
= fRF / 24,
COSC
e.g.
f
= 315E6 / 24= 13.123MHz
COSC
[3 – 22]
which is identical to the ASK transmit case.
-RL
C
tune1
C
tune2
FSK-
switch
C
V1
C
V2CV3
f, C
XOUT 19
L
XSWF 20
XSWA 22
XGND 23
XIN 21
ASK-
switch
QOSC_ASK.wmf
Figure 3-16FSK receive
In this case the ASK-switch is closed. The necessary C
C
The C-bank C
+()C
C
vm
tune2
v1Ctune1
------------------------------------------------------------------------------------------------------- -=
C
+C
v1Ctune1
can be varied over a range of 16 pF in steps of 250fF for finetuning of the FSK
v2
v2
C+
C
+()×
tune2
v3
C+
C
++
tune2
v3
is given by:
vm
[3 – 23]
receive frequency. In this cas e the switches of the C-bank are cont rolled by the bits D0 to D5 of the
XTAL_TUNING register (subaddress 02H, see Table 3-5).
3.2.2.2ASK-mode:
In transmit mode the crystal oscillator frequency is the same as in the FSK receive case, see
Figure 3-16.
In receive mode a receive frequency offset is necessary as the limiters feedback is AC-coupled.
This offset is achieved by setting the osc illator fr equ ency to th e FSK HIGH transmi t frequen cy, seeFigure 3-15.
Preliminary Specification522003-02-18
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Version 1.0
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Application
3.2.3Parasitics
For the correct calculation of the external capacitors the parasitic capacitances of the pins and the
switches (C
-----------------------------------------------------------------------------------------------------------------------------------------C21+=
C
+C
v1Ctune1
++=
v2C20
v2C20
v2C20
v2C20
FSK-: 2,8 pF / FSK+&ASK: 2.2pF
can be calculated:
v
+()×
++
C+
tune2
C+
tune2
C++v3C22C+
+()×
C++v3C22C+
++
Value
4,6 pF
1 pF
tune2
tune2
QOSC_parasitics.wmf
[3 – 24]
[3 – 25][3 – 25]
[3 – 26]
Note: Please keep in mind also to include the Pad parasitics of the circuit board.
Preliminary Specification532003-02-18
TDA5251 F1
C
C
+C
–=
C
C
+
C
–
C
C
+
C
–
Version 1.0
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Application
3.2.4Calculation of the external capacitors
1. Determination of necessary crystal frequency using formula [3-19].
e.g. f
2. Determine corresponding C
e.g. C
3. Necessary CV using formula [3-17].
e.g.
1. When the nec es sary Cv for the 3 frequencies ( Cv- for FSK LOW, Cv+ for FSK HIGH and Cvm for
FSK-receive) are known the external capacitors and the internal tuning caps can be calculated
using the following formulas:
-FSK:
FSK-
L FSK
= f
COSC LOW
- = C
C
V
-
v1
L ±
C
tune1
1
FSKL
,--
applying formula [3-18].
Load
1
()
+=p
2
v-C21
Lf
*2
OSCFSK
[3 – 27]
()
+FSK:
C
v2
C
+
tune2
v1
----------------------------------------------------------------------C20–=
C
v1
()
FSK_RX:
To compensate frequenc y err ors due to cryst al an d comp onent t oler ance C
be varied. To enable this correction, half of the necessary capacitance variation has to be realized
with the internal C-banks.
If no finetuning is intended it is recommended to leave XIN (Pin 21) open. So the parasitic
capacitance of Pin 21 has no effect.
Note: Please keep in mind also to include the Pad parasitics of the circuit board.
In the suitable range for the serial capacitor, either capacitors with a tolerance of 0.1pF or 1% are
available.
A spreadsheet, which c an be used to predict the total frequen cy error by s imply ente ring the crys tal
specification, may be obtained from Infineon.
C
v3
C
+
tune2
------------------------------------------------------------------------ -C
C
tune1
C
+()C
tune1
v1
v1Ctune1
tune1
+()C
()×
v+C21
v+C21
()×
vmC21
vm
–()–
[3 – 28]
–C
C21–()–
–C
20
–=
v2
, Cv2 and Cv3 have to
v1
22
[3 – 29]
3.2.5FSK-switch modes
The FSK-switch can be used either in a bipolar or in a FET mode. The mode of this switch is
controlled by bit D0 of the XTAL_CONFIG register (subaddress 0EH).
In the bipolar mode the FSK-sw itch can be controlled by a ramp function. Th is ra mp func tion is set
by the bits D1 and D2 of the XTAL_CONFIG register (subadress 0EH). With these modes of the
FSK-switch the bandwidth of the FSK spectrum can be influenced.
When working in the FET mode the power consumption can be reduced by about 200 mA.
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The default mode is b ipolar switch with n o ramp fu nction (D0 = 1, D1 = D2 = 0) , which is suit able
for all bitrates.
Table 3-8Default Setup (without internal tuning & without Pin21 usage)
Part
Internal capacitors (+/- 10%)
Inductivity of the crystal oscillator
Temperature (-40...+85C)
Supply Voltage (2.1...5.5V)
Total
Tolerance values in Table 3-8 are valid, if pin 21 is not connected. Establishing the connection to
pin 21 the tolerances increase by +/- 16ppm (internal capacitors), if internal tuning is not used.
Concerning the frequency tolerances of the whole system also crystal tolerances (tuning
tolerances, temperature stability, tolerance of CL) have to be considered.
In addition to the chip tolerances also the crystal and external component tolerances have to be
considered in the tuning and non-tuning case.
In case of internal tuning: The crystal on the evaluation board has a temperature stability of +/20ppm (or +/- 6.3kHz), which must be added to the total tolerances in worst case. It’s possible to
choose a crystal compensating the oscillators temperature drift in a certain range and thus the
overall temperature tolerances are minimized.
In case of default setup (without internal tuning and without usage of pin 21) the temperature
stability and tuning tolerance of the crystal as well as the tolerance of the external capacitors (+/-
0.1pF) have to be added. The crystal on the evaluation board has a temperature stability of +/20ppm (or +/- 6.3kHz) an d a tuning tole rance of + /- 10ppm (or +/- 3.2 kHz) . The exter nal capacito rs
add a tolerance of +/- 3.5p pm (or + /- 1.1 kH z). H ere also the overall temperature tolerance s ca n be
reduced when applying an appropriate temperature drift of the crystal.
The frequency sta bili ties of both the rece ive r a nd the transmitter a nd the m od ulation bandwidth set
the limit for the bandwidth of the IQ filter. To achieve a high receiver sensitivity and efficient
suppression of adjacent interference signals, the narrowest possible IQ bandwidth should be
realized (see Section 3.3).
Application
3.3IQ-Filter
The IQ-Filter should be se t to va lue s corresponding to the RF-ba ndw idt h of the received RF signal
via the D1 to D3 bits of the LPF register (subaddress 03H).
Table 3-93dB cutoff frequencies I/Q Filter
D3
0
001 350700
0
0
1
1
1
1
D2D1 nominal f
(programmable)
00 not us ed
10 250500
11 200400
00 150 (default)300
01 100200
10 50100
11 not us ed
-3dB
in kHz
resulting effective
channel
bandwidth in kHz
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10
0
-10
-2 0
-3 0
-4 0
-5 0
-6 0
-7 0
-8 0
1010 010 0 010 00 0
Figure 3-18I/Q Filter Characteristics
effective channel bandwidth
Application
50kHz
100kHz
150 kH z
200kHz
250kHz
350kHz
f [kHz]
iq_filter_curve.wmf
-f
-f
3dB
IQ Filter
f
3dB
IQ Filter
f
iq_char.wmf
Figure 3-19IQ Filter and frequency characteristics of the receive system
3.4Data Filter
The Data-Filter should be set to values corresponding to the bandwidth of the transmitted Data
signal via the D4 to D7 bits of the LPF register (subaddress 03H).
The I/Q Limiters are DC coupled multistage amplifiers with offset-compensating feedback circuit
and an overall gain of approximately 80dB each in the frequency range of 100Hz up to 350kHz.
Receive Signal Streng th Indicator (RSSI) gene rators are included in both limiters which produ ce DC
voltages that are directly proportional to the input signal level in the respective channels. The
resulting I- and Q-channel RSSI-signals are summed to the nominal RSSI signal.
C
c
I- Filter
C
c
38
37
CI1x
CI1
f
g
363534
CQ1
C
c
CI2
CQ1x
Limiter
C
c
CQ2
333231
CI2x
I
C
RSSI
CQ2x
Quadr.
Corr.
RSSI29
37k
SUM
Q- Filter
Q
f
g
Limiter
Quadr.
Corr.
limiter input.wmf
Figure 3-20Limiter and Pinning
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Application
The DC offset compensation needs 2.2ms after Power On or Tx/Rx switch . This t ime i s har d wir ed
and independent from external capacitors CC on pins 31 to 38. The maximum value for this
capacitors is 47nF.
RSSI accuracy settling time = 2.2ms + 5*RC=2.2ms+5*37k*2.2 nF =2 .6m s
R - internal resistor; C - external capacitor at Pin 29
Table 3-11Limiter Bandwidth
Cc
[nF]
220
100
47
22
f3dB
lower limit
[Hz]
f3dB
upper
limit
Comment
100IQ Filtersetup time not guaranteed
220- ll -setup time not guaranteed
470- ll -Eval Board
1000- ll -
10 2200- ll -
v [dB]
80
0
f
3dB
f
3dB
IQ Filter
Figure 3-21Limiter frequency characteristics
f
3dB
Limiterlower limit
f
limiter_char.wmf
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1300
1200
1100
1000
900
800
700
600
RSSI /mV
500
400
300
200
100
0
-120 -1 10 -10 0 -90-8 0-70-60-50-40-3 0- 20
Figure 3-22Typ. RSSI Level (Eval Board) @3V
RF / dBm
Application
ADC
high gain
low gain
RSSI.wmf
3.6Data Slicer - Slicing Level
The data slicer is an analog-to -digital converter. It is necessary to genera te a threshold value for the
negative comparator in put (data slicer). The TDA52 51 offers an RC integrator and a peak detector
which can be selected via logic. Independent of the choice, the peak detector outputs are always
active.
3.6.1RC Integrator
Table 3-12Sub Address 00H: CONFIG
Bit
D15
Necessary external component (Pin14): C
This integrator generates the mean value of the data filter output. For a stable threshold value, the
cut-off frequency has to be lower than the lo west signal frequency . The cutoff freque ncy results from
the internal resistance R=100kW and the external capacitor C
Cut-off frequency:
Function Description DefaultSET
SLICER 0= LP, 1= Peak Detector00
SLC
on Pin14.
SLC
{}
f<
=
offcut
-
10021p
Ck
×W×
SLC
fMin
Signal
[3 – 30]
Component calculation: (rule of thumb)
T
– longest period of no signal change
L
×
T
3
100
L
W
k
³
C
SLC
[3 – 31]
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DataSlicer
+
-
Slicer Thresho ld
+ Peak
Detector
100k
Data
Filter
Figure 3-23Slicer Level using RC Integrator
Signal
R
- Peak
Detector
Contr.
Logic
100k
100k
Vcc
DATA
28
PDP
13
SLC
14
PDN
12
Application
C
SLC
SLC_RC.wmf
3.6.2Peak Detectors
Table 3-13 Sub Address 00H: CONFIG
Bit
D15
The TDA5251 has two peak detectors built in, one for positive peaks in the data stream and the
other for the negative ones.
Necessary external components: - Pin12: C
Function Description DefaultSET
SLICER 0= LP, 1= Peak Detector01
N
- Pin13: C
P
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DataSlicer
+
-
Slicer Threshold
+ Peak
Detector
Data
Filter
Figure 3-24Slicer Level using Peak Detector
Signal
100k
R
- Peak
Detector
R1
R2
Contr.
Logic
100k
100k
Vcc
DATA
28
PDP
13
SLC
14
PDN
12
Vcc
Application
C
P
C
N
SLC_PkD.wmf
For applications requiring fast attack and slow release from the threshold value it is reasonable to
use the peak detectors. T he threshold valu e is generated by a n internal voltage divider. The relea se
time is defined by the internal resistance values and the external capacitors.
[3 – 32]
[3 – 33]
Signal
Signal
negPkD
Ck×W= 100
Ck×W= 100t
t
pposPkD
nnegPkD
posPkD
Pos. Peak Detector (pin13)
Threshold SLC(pin14)
Neg. Peak Detector (pin12)
t
PkD_timing.wmf
Figure 3-25Peak Detector timing
Preliminary Specification632003-02-18
TDA5251 F1
[3
35]
Version 1.0
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Application
Component calculation: (rule of thumb)
T
*2
L
100
100
1
W³k
T
– longest period of no signal change (LOW signal)
L1
T
*2
L
2
W³k
T
– longest period of no signal change (HIGH signal)
L2
C
P
C
n
[3 – 34]
–
3.6.3Peak Detector - Analog output signa l
The TDA5251 data output ca n be digital (pin 28) or in analog form by using the p eak detector output
and changing some settings.
To get an analog data output the slicer must be set to lowpass mode (Reg. 0, D15 = LP = 0) and
the peak detector capacitor at pin 12 or 13 has to be changed to a resistor of about 47kOhm.
DataSlicer
+
-
Slicer T hreshold
Contr.
Logic
DATA
28
Data
Filter
Signal
+ Peak
Detector
100k
R
- Peak
Detector
100k
100k
Vcc
PDP
13
SLC
14
PDN
12
47k
C
SLC
PkD_analog.wmf
Figure 3-26Peak Detector as analog Buffer (v=1)
3.6.4Peak Detector – Power Down Mode
For a safe and fast threshold value generation the peak detector is turned on by the sequencer
circuit (see Section 2.4.18) only after the entire receiving path is active.
In the off state the output of the positive peak detector is tied down to GND and the output of the
negative peak detector is pulled up to VCC.
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Logic
Power Down Mode
+ Peak
Detector
off
Data
Filter
- Peak
Detector
off
Figure 3-27Peak detector - power down mode
Application
0V
PDP
13
R1
100k
SLC
100k
14
PDN
12
Vcc
R2
Vcc
Vcc
C
P
C
N
PKD_PWDN.wmff
Signal
Data Signal
Vcc
0
Power ONPower Down
Neg. Peak Detector (pin12)
Threshold (pin14)
Pos. Peak Detector (pin13)
2,2ms
Power ON
Peak Detector Power ON
t
PkD_PWDN3.wmf
Figure 3-28Power down mode
3.7Data Valid Detection
In order to detect valid data two criteria must be fulfilled.
One criteria is the data ra te, which can be s et in register 06h and 07h. The othe r one is the receiv ed
RF power level, which can be set in register 08h in form of the RSSI threshold voltage. Thus for
using the data valid detection FSK modulation is recommended.
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Application
Timing for data detection looks like the following. Two settings are possible: „Continuous“ and
„Single Shot“, which can be set by D5 and D6 in register 00H.
Data
Sequenzer enables
data detection
Counter Reset
Gate time
Compare with single
TH and latch result
Compare with double
TH and latch result
(Frequency) Window
Count Complete
rese trese t
countcount
comp.com p.
comp.
ready*
start of conversionpossible start of next conversion
Frequ_Detect_Timing_continuous.wmf
t
t
t
t
t
t
t
Figure 3-29Frequency Detection timing in continuous mode
Note 1: Chip internal signal „Sequencer enables data detection“ has a LOW to HIGH transition
about 2.6ms after RX is activated (see Figure 2-15).
Note 2: The positive ed ge of the „W indow Coun t Comple te“ sig nal la tche s the result of co mparis on
of the analog to digital conve rte d RS SI voltage with TH3 (register 08 H) . A logic combination of this
output and the result of the comparison with single/double THx defines the internal signal
„data_valid“.
Figure 3-29 shows that the log ic is ready for the next conversion after 3 periods of the d ata signal.
Timing in Single Shot mode can be seen in the subsequent figure:
Data
Sequenzer enables
data detection
Counter Reset
Gate time
Compare with single
TH and latch result
Compare with double
TH and latch result
(Frequency) Window
Count Complete
start of conversion
reset
count
no possible start of next conversion
comp.
comp.
rea d y*
because of Single Shot Mode
t
t
t
t
t
t
t
Frequ_Detect_Timing_singleShot_wmf
Figure 3-30Frequency Detection timing in Single Shot mode
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Application
3.7.1Frequency Window for Data Rate Detection
The high time of data is used to measure the frequency of the data signal. For Manchester coding
either the data frequency or half of the data frequency have to be detected corresponding to one
high time or twice the high time of data signal.
A time period of 3*2*T is necessary to decide about valid or invalid data.
T2*T
DATA
possible
GATE 1
possible
GATE 2
0010
T2
T1
0
2*T2
2*T1
01
t
t
t
window_count_timing.wmf
Figure 3-31Window Counter timing
Example to calculate the thresholds for a given data rate:
- Data signal manchester coded
- Data Rate: 2kbit//s
- f
= 13,125 MHz
clk
Then the period equals to
1
T2==×
2kbit/s
0,5ms
[3 – 36]
respectively the high time is 0,25ms.
We set the thresholds to +-10% and get: T1= 0,225ms and T2= 0,275ms
The thresholds TH1 and TH2 are calculated with following formulas
f
clk
T1TH1
×=
[3 – 37]
4
f
clk
T2TH2
×=
[3 – 38]
4
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Application
This yields the following results:
TH1~ 738= 001011100010
TH2~ 902= 001110000110
b
b
which have to be programmed into the D0 to D11 bits of the COUNT_TH1 and COUNT_TH2
registers (subaddresses 06H and 07H), respectively.
Default v alues (window counter inactive):
TH1= 000000000000
TH2= 000000000001
b
b
Note: The timing window of +-10% of a given high time T in general does not correspond to a
frequency window +-10% of the calculated data frequency.
3.7.2RSSI threshold voltage - RF input power
The RF input power leve l is corre spond ing to a ce rtai n RSSI v oltage, which ca n be see n in Secti on
3.5. The threshold TH3 of this RSSI voltage can be calculated with the following formula:
TH3
1.2V
voltagethresholdRSSIdesired
)12(6-×=
[3 – 39]
As an example a desired R SSI thre shold volta ge of 500mV result s in TH3~26=01 1010b, which has
to be written into D0 to D5 of the RSSI_TH3 register (sub address 08H).
Default value (RSSI detection inactive):
TH3=111111
The settings for Self Polling Mode depend very much on the timing of the transmitted Signal. To
create an example we consider following data structure transmitted in FSK.
4 Frames
DataDataDataData
50ms 50ms
400ms
t [ms ]
Frame-
details
Sync
Preamble
Syncronisation Preamble
Data
t [ms ]
t [ms ]
data_timing011.wmf
Figure 3-32Example for transmitted Data-structure
According to existing synchronization techniques there are some synchronization bursts in front of
the data added (code violation!). A minimum of 4 Frames is transmitted. Data are preferably
Manchester encoded to get fastest respond out of the Data Rate Detection.
Target Application:
- received Signal has code violation as described before
- total mean current consumption below 1mA
- data reception within max. 400ms after first transmitted frame
One possible Solution:
tON = 15ms, t
= 135ms
OFF
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Application
This gives 15ms ON time of a total period of 150ms which results in max. 0.9mA mean current
consumption in Self Polling Mode. The resulting worst case timing is shown in the following figure:
Case A:
Case B:
Case C:
DataDataDataData
50ms135m s15m sµP enables Receiver
DataDataDataData
50ms
DataDataDataData
50ms
... Receiver enabled
135ms15ms
135ms15ms
until Data completed
Interrupt
due PwdDD
µP enables Receiver
until Data completed
Interrupt
due PwdDD
µP enables Receiver
until Da ta c o m plet e d
Interrupt
due PwdDD
t [ms ]
t [ms ]
t [ms ]
data_timing021.wmf
Figure 3-333 possible timings
Description:
Assumption: the ON time comes right after the first frame (Case A). If OFF time is 135ms the
receiver turns on during Sync-pulses and the PwdDD
- pulse wakes up the µP.
If the ON time is in the ce nter of the 50ms gap of tr ans mis sio n (C as e B), the Data Detect Log ic w ill
wake up the µP 135ms later.
If ON time is over just before Sync-puls es (Cas e C), next ON time is during Data transmission and
Data Detect Logic will trigger a PwdDD
- pulse to wake up the µP.
Note: In this example it is recommended to use the Peak Detector for slicer threshold generation,
because of its fast attack and slow release characteristic. To overcome the data zero gap of 50ms
larger external capacitors than noted in Section 4.4 at pin12 and 13 are recommended. Further
information on calculating these components can be taken from Section 3.6.2.
3.10Sensitivity Measurements
3.10.1Test Setup
The test setup used for the measurements is shown in the following figure. In case of ASK
modulation the Rohde & Sc hwarz SMIQ generat or, which is a vector signal genera tor, is connect ed
to the I/Q modulation source AMIQ . This "bas eband signal generator" i s in turn con trolled by th e PC
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Application
based software WinQSIM via a GPIB interface. The AMIQ generator has a pseudo random binary
sequence (PRBS) gener ator and a bit error test set built in. T he r esu lting I/Q sig nals are applied to
the SMIQ to generate a ASK (OOK) spectrum at the desired RF frequency.
Data is demodulated by the TDA5251 and then sent back to the AMIQ to be compared with the
originally sent data. The bit error ra te is calcul ated by the bit error rate equipment in side the AMIQ .
Baseband coding in the form of Manchester is applied to the I signal as can be seen in the
subsequent figure.
Personal Computer
Software
WinIQSIM
GPIB /
RS 232
Marker Output
Rohde & Schw arz
I/Q M odulation Source
AMIQ
I
Q
AMIQ BERT
(Bit E rror R a te
T est Set)
Clock
Data
Manchester
Encoder
Rohde & Schw arz
Vector Signal Generator
SM IQ 0 3
ASK / FSK RF Signal
Manchester
Decoder
DATA out
RFin
DUT
Transceiver Testboard
TDA 525x
TestSetup.wmf
Figure 3-34BER Test Setup
In the following figures the RF power level shown is the average power level.
These investigations have been made on an Infineon evaluation board using a data rate of 4 kBit/
s with manchester en codi ng a nd a d ata fil ter bandwidth of 7 kHz. This is the standard configurati on
of our evaluation boards. All these measurements have been performed with several evaluation
boards, so that production scattering and component tolerances are already included in these
results.
Regarding the data filter bandwidth it has to be mentioned that a data rate of 4 kBit/s using
manchester encoding results in a data frequency of 2 kHz to 4 kHz depending on the occurring
data pattern. The test pattern given by the AMIQ is a pseudo random binary sequency (PRBS9)
with a 9 bit shift register. This pattern varies the resulting data frequency up to 4 kHz.
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The best sensitivity performance can be achieved using a data filter bandwidth of 1.25 times the
maximum occuring data frequency.
The IQ filter setting is depending on the modulation type. ASK needs an IQ filter of 50kHz, 30kHz
deviation at FSK recommend a 50kHz IQ filter.
A very practicable config uration is to set the chip -internal adjustab le IQ filter to the sum of FSK pe ak
deviation and maximum datafr equency. Concerni ng these aspects the bandwid th should be chosen
small enough. With respect to both, the crystal tolerances and the tolerances of the crystal oscillator
circuit of receiver and transmitter as well, a too small IQ filter bandwidth will reduce the sensitivity
again. So a compromise has to be made. For further details on chip tolerances see also Section
3.2.7
Application
3.10.2BER performance depending on Supply Voltage
Due to the wide supply voltage range of this transeiver chip also the sensitivity behaviour over this
parameter is documented is the subsequent graph.
BER_VCC.wmf
Figure 3-35BER supply voltage
Please notice the tiny sensitivity changes of less than 1dB, when variing the supply voltage.
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Application
3.11Default Se tup
Default setup is hard wired on chip and effective after a reset or return of power supply.
Table 3-14 Default Setup
Parameter
IQ-Filter Bandwidth150kHz
Data Filter Bandwidth7kHz
Limiter lower fg470Hz47nF
Slicing Level GenerationRC10nF
Nom. Frequency Capacity intern (ASK TX, FSK RX) 4.5pF315MHz
FSK+ Frequency Capacity intern (FSK+, ASK RX)2.5pF+30kHz
FSK- Frequency Capacity intern (FSK-)1.5pF-30kHz
LNA GainHIGH
Power AmplifierHIGH+10dBm
ValueIFX-BoardComment
RSSI accuracy settling time2.6ms2.2nF
ADC measurementRSSI
ON-Time10ms
OFF-Time100ms
Clock out RX PowerON0.73MHz
Clock out TX PowerON0.73MHz
Clock out RX PowerDOWN-
Clock out TX PowerDOWN-
XTAL modulation switchbipolar
XTAL modulation shapingoff
RX / TX-Jumper
ASK/FSK-Jumper
PwdDDPWDNJumper
removed
Operating ModeSlave
Preliminary Specification732003-02-18
TDA5251 F1
Version 1.0
Confidential
4Reference
4.1Electrical Data
4.1.1Absolute Maximum Ratings
WARNING
The maximum ratings may not be exceeded under any circumstances, not even
momentarily and individually, as permanent damage to the IC will result.
ParameterSymbolLimit ValuesUnit Test Conditions LItem
minmax
S
A
RX
TX
2.15.5V
-4085°C
312325MHz
312325MHz
TDA5251 F1
Version 1.0
Confidential
Reference
4.1.3AC/DC Characteristics
AC/DC characteristics involve the spread of values guaranteed within the specified voltage and
ambient temperature range. Typical characteristics are the median of the production.
1: without pin di ode current (RX/TX-switch)
130uA@2.1V; 310uA@3V; 720uA@5V
out_low
out_low
out_low
PWDN_TX
CLKSU
TXSU
P
clock
P
1st
2nd
3rd
-34dBm2.1V, low powerX
+2dBm3V, low powerX
+13dBm5V, low powerX
5nA5.5V, all power down
0.5ms stable CLKDIV output
signal
0.771.11.43 msPWDN-->PON or
RX-->TX
-75dBm3V, 50Ohm Board,
Default (730kHz)
-74dBm3V, 50Ohm BoardX
-38dBm3V, 50Ohm BoardX
-40dBm3V, 50Ohm BoardX
X
X
Preliminary Specification762003-02-18
TDA5251 F1
Version 1.0
Confidential
Table 4-4AC/DC Characteristics with TA = 25 °C, V
#
GENERAL Characteristics
1
2Power down current
3 Power down cu rrent with
4 Power down cu rrent with
532kHz oscillator freq.f
ParameterSymbolLimit ValuesUnitTest Condition s L Item
min typ max
Power down current
I
PWDN_32k
9uA3V, 32kHz clock on
timer mode (standby)
I
PWDN_32k
11uA5V, 32kHz clock on
timer mode (standby)
I
PWDN_Xtl
750uA3V, CONF IG9=1
XTAL ON
I
PWDN_Xtl
860uA5V, CONF IG9=1
XTAL ON
32kHz
243240kHz
= 2.1 ... 5.5 V
VCC
Reference
6XTAL startup timet
7Load capacitanceC
8Serial resistance of the
R
crystal
9Input inductance XOUTL
10 Input inductance XOUTL
11 FSK demodulator gainG
12RSSI@-120dBmU
13RSSI@-100dBmU
-120dBm
-100dBm
14RSSI@-70dBmU
15RSSI@-50dBmU
16RSSI GradientG
17IQ-Filter bandwidthf
18Data Filter bandwidthf
3dB_IQ
3dB_LP
XTAL
C0max
Rmax
OSC
OSC
FSK
-70dBm
-50dBm
RSSI
0.5ms
IFX Board with Crystal Q1 as
specified in Section 4.4
5pFX
100WX
2.2uH
2.1uH
with pad on evaluation board
without pad on evaluation
board
2.4mV/
kHz
0.45Vdefault setupX
0.5Vdefault setupX
0.9Vdefault setupX
1.2Vdefault setupX
11mV/
default setupX
dB
115 150 185 kHzDefault setupX
5.378.7kHzDefault setupX
X
X
X
19Vcc-Vtune RX, Pin3V
20Vcc-Vtune TX, Pin3V
cc-tune,RX
cc-tune,TX
0.5 0.67 1.6Vf
0.5 0.86 1.6Vf
=13.125MHz
Ref
=13.125MHz
Ref
Preliminary Specification772003-02-18
TDA5251 F1
p
m
BusMode = LOW
S
B
BUS_MODE = HIGH
Version 1.0
Confidential
4.1.4Digital Characteristics
I2C Bus Timing
t
BUF
Bus Data
t
R
t
LOW
t
HIGH
t
HD.STA
t
SU.ENAS DA
t
HD.DAT
t
HIGH
BusCLK
EN
ul sed or
andatory low
t
SU.ENAS DA
Reference
t
t
F
t
SU.DAT
t
SU.STA
HD.STAt
SP
t
SU.S TO
t
SU.ENA SDA
Figure 4-1I
3-wire Bus Timing
SDA
CL
US_ENA
Figure 4-23-wire Bus Timing
2
C Bus Timing
t
WHEN
t
LOW
t
SU.STA
t
t
R
t
HD.DAT
t
HI GH
t
F
t
SU.DAT
SP
t
SU.STO
Preliminary Specification782003-02-18
TDA5251 F1
Version 1.0
Confidential
Table 4-5Digital Characterist ics with TA = 25 °C, V
#
1Data rate TX ASKf
2
3
4Data rate RX FSKf
5Digital Inputs
High-level Input Voltage
6RXTX Pin 5
TX operation, int. controlled
7CLKDIV Pin 26
t
rise
t
fall
ParameterSymbolLimit ValuesUnitTest Conditions L Item
mintypmax
10kBaudPRBS9,
10kBaudPRBS9,
10kBaudPRBS9, Manch.X
10kBaudPRBS9, Manch.
0
0.4
Data rate TX FSKf
Data rate RX ASKf
Low-level Input Voltage
TX.ASK
TX.FSK
RX.ASK
RX.FSK
V
IH
V
IL
V
OL
Vdd-
0.2
1.15
(0.1*Vdd to 0.9*Vdd)
(0.9*Vdd to 0.1*Vdd)
Output High Voltage
Output Low V oltage
V
V
t
r
t
f
OH
OL
35
30
Vdd-
0.4
0.4
= 2.1 ... 5.5 V
Vdd
V
dd
0.2VV
V
V
ns
ns
V
V
Manch.@+9dBm
Manch.@+9dBm
@30kHz dev.
@30kHz dev.
@Vdd=3V
Isink=800uA
Isink=3mA
@Vdd=3V
load 10pF
load 10pF
I
source
I
sink
=350uA
=400uA
Reference
X1
X1
X
X
X
X
Bus Interface Characteristics
9 Pulse width of spikes which
t
SP
050nsVdd=5VX
must be suppressed by the
input filter
10 LOW level output voltage at
BusData
11SLC clock frequencyf
12 Bus free time between STOP
and START condition
13 Hold time (repeated) STAR T
condition.
V
OL
SLC
t
BUF
t
HO.STA
0.4V3mA sink current
V
=5V
dd
0400kHzVdd=5VX
1.3µsonly I2C mode
=5V
V
dd
0.6µsAfter this period, the
first clock pulse is
generated, only I
2
C
X
X
X
Preliminary Specification792003-02-18
TDA5251 F1
Version 1.0
Confidential
Table 4-5Digital Characterist ics with TA = 25 °C, V
#
14 LOW pe riod of BusCLK clockt
15HIGH period of BusCLK
16 Setup time for a repeated
17Data hold timet
18Data setup timet
19Rise, fall time of both
20
21 Capacitive load for ea ch bus
22 Setup time fo r BusCLK to EN t
23H-pulsewidth (EN)t
ParameterSymbolLimit ValuesUnitTest Conditions L Item
mintypmax
LOW
t
HIGH
1.3µsVdd=5VX
0.6µsVdd=5VX
clock
t
SU.STA
0.6µsonly I2C modeX
START condition
0nsVdd=5VX
100nsVdd=5VX
20+
F
0.1C
b
300nsVdd=5VX2
BusData and BusCLK
HD.DAT
SU.DAT
t
, t
R
signals
Setup time for STOP
t
SU.STO
0.6µsonly I2C mode
condition
C
b
400pFVdd=5VX
line
SU.SCLE
N
WHEN
0.6µsonly 3-wire mode
0.6µsVdd=5VX
= 2.1 ... 5.5 V
Vdd
Reference
X
V
=5V
dd
X
V
=5V
dd
1: limited by transmission channel bandwidth and depending on transmit power level; ETSI regulation EN 300 220
fullfilled, see Section 3.1
2: C
= capacitance of one bus line
b
Preliminary Specification802003-02-18
TDA5251 F1
Version 1.0
Confidential
Reference
4.2Test Circuit
The device performanc e parameters marke d with X in Section 4.1.3 were measu red on an Infineon
evaluation board (IFX board).
TDA5250_v42.schematic.pdf
Figure 4-3Schematic of the Evaluation Board
Preliminary Specification812003-02-18
TDA5251 F1
Version 1.0
Confidential
4.3Test Board Layout
Gerberfiles for this Testboard are available on request.
Reference
TDA5250_v42_layout.pdf
Figure 4-4Layout of the Evaluation Board
Note 1: The LNA and PA matching network was designed for minimum required space and
maximum performance and thus via holes were deliberately placed into solder pads.
In case of reproduction p lea se bear i n mind th at this m ay not be suitable for all au tomatic solderi ng
processes.
Note 2: Please keep in mind not to lay out the CLKDIV line directly in the neighborh ood of the crystal
and the associated components.
Note 3: The opto part (X4) should be supplied by connecting to X3.