IDT IDT54FCT3827B, IDT74FCT3827B, IDT54FCT3827A, IDT74FCT3827A User Manual

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3.3V CMOS 10-BIT
BUFFERS

Integrated Device Technology, Inc.

FEATURES:

• 0.5 MICRON CMOS Technology

• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)

• 25 mil Center SSOP Packages

• Extended commercial range of -40°C to +85°C

•V

CC = 3.3V ±0.3V, Normal Range or

VCC = 2.7V to 3.6V, Extended Range

• CMOS power levels (0.4µW typ. static)

• Rail-to-Rail output swing for increased noise margin

• Military product compliant to MIL-STD-883, Class B

FUNCTIONAL BLOCK DIAGRAM

IDT54/74FCT3827A/B

DESCRIPTION:

The FCT3827A/B 10-bit bus drivers are built using an
advanced dual metal CMOS technology. These high speed,
low power buffers are ideal for high-performance bus interface
buffering for wide data/address paths or buses carrying parity.
The 10-bit buffers have NAND-ed output enables for maxi­mum control flexibility.

All of the FCT3827 high performance interface compo­nents are designed for high-capacitance load drive capability,
while providing low-capacitance bus loading at both inputs
and outputs.

Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 Y9

D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 OE1 OE2

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The IDT logo is a registered trademark of Integrated Device Technology, Inc.

MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1995

1995 Integrated Device Technology, Inc. 8.15 DSC-4651/-

1

IDT54/74FCT3827A/B

3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES

PIN CONFIGURATIONS

VCC1

OE1

2

D0

3

D1

4

D2
D3
D4
D5
D6
D7
D
D9

8

5
6

SO24-2

7

SO24-7

8

SO24-8

9
10

11

P24-1

D24-1

12

DIP/SOIC/SSOP/QSOP

TOP VIEW

ABSOLUTE MAXIMUM RATINGS

Symbol Rating Commercial Military Unit

(2)

VTERM

VTERM

VTERM

TA Operating

TBIAS Temperature

TSTG Storage

PT Power Dissipation 1.0 1.0 W
IOUT DC Output

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for ex­tended periods may affect reliability.

2. Vcc terminals.

3. Input terminals.

4. Output and I/O terminals.

Terminal Voltage
with Respect to
GND

(3)

Terminal Voltage
with Respect to
GND

(4)

Terminal Voltage
with Respect to
GND

Temperature

Under Bias

Temperature

Current

24
23

Y0

22

Y1

21

Y2

20

Y3

19

Y4

18

Y5

17

&

16
15
14
13

Y6
Y7
Y8
Y9
OE2GND

3092 drw 02

(1)

–0.5 to +4.6 –0.5 to +4.6 V

–0.5 to +7.0 –0.5 to +7.0 V

–0.5 to

CC + 0.5

V

–0.5 to

VCC + 0.5

V

–40 to +85 –55 to +125 °C

–55 to +125 –65 to +135 °C

–55 to +125 –65 to +150 °C

–60 to +60 –60 to +60 mA

3092 lnk 03

PIN DESCRIPTION

Names I/O Description

OE

I I When both are LOW the outputs are

enabled. When either one or both are
HIGH the outputs are High Z.

DI I 10-bit data input.
YI O 10-bit data output.

FUNCTION TABLE

(1)

Inputs Output

OE

1

OE

OE

L

L
H
X

NOTE:

1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance

2 DI YI Function

OE

L

L
X
H

L
H
X
X

L

Transparent

H

Z

Three-State

Z

CAPACITANCE (TA = +25°C, f = 1.0MHz)

Symbol Parameter

CIN Input

Capacitance

COUT Output

Capacitance

NOTE:

1. This parameter is measured at characterization but not tested.

(1)

Conditions Typ. Max. Unit

VIN = 0V 3.5 6.0 pF

VOUT = 0V 4.0 8.0 pF

3092 tbl 01

3092 tbl 02

3092 lnk 04

8.15 2

IDT54/74FCT3827A/B

3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V; Military: TA = –55°C to +125°C, VCC = 2.7V to 3.6V

Symbol Parameter Test Conditions

(1)

Min. Typ.

VIH Input HIGH Level (Input pins) Guaranteed Logic HIGH Level 2.0 — 5.5 V

Input HIGH Level (I/O pins) 2.0 — VCC+0.5

VIL Input LOW Level Guaranteed Logic LOW Level –0.5 — 0.8 V

(Input and I/O pins)

(6)

(6)

(6)

VCC = Max. VI = 5.5V — — ±1 µA

VI = VCC — — ±1

(6)

VI = GND — — ±1
VI = GND — — ±1

II H Input HIGH Current (Input pins)

Input HIGH Current (I/O pins)

II L Input LOW Current (Input pins)

Input LOW Current (I/O pins)
IOZH High Impedance Output Current VCC = Max. VO = VCC — — ±1 µA
IOZL (3-State Output pins)

(6)

VO = GND — — ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IODH Output HIGH Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
IODL Output LOW Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V

(3)
(3)

–36 –60 –110 mA

50 90 200 mA

VOH Output HIGH Voltage VCC = Min. IOH = –0.1mA VCC–0.2 — — V

VIN = VIH or VIL IOH = –3mA 2.4 3.0 —

(5)

VCC = 3.0V

IN = VIH or VIL

V

IOH = –6mA MIL.

OH = –8mA COM'L.

I

2.4

VOL Output LOW Voltage VCC = Min. IOL = 0.1mA — — 0.2 V

VIN = VIH or VIL IOL = 16mA — 0.2 0.4

IOL = 24mA — 0.3 0.55

IOS Short Circuit Current

(4)

VCC = 3.0V

IN = VIH or VIL

V
VCC = Max., VO = GND

IOL = 24mA — 0.3 0.50

(3)

–60 –135 –240 mA
VH Input Hysteresis — — 150 — mV
ICCL

ICCH

Quiescent Power Supply Current VCC = Max.,

IN = GND or VCC

V

COM'L. — 0.1 10 µA

ICCZ MIL. — 0.1 100

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at Vcc = 3.3V, +25°C ambient.

3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.

4. This parameter is guaranteed but not tested.

5. V

OH = VCC –0.6V at rated current.

6. The test limits for this parameter is ± 5µA at T

A = –55°C.

(2)

Max. Unit

3.0 —

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8.15 3