HP ATF-13100-GP3 Datasheet

2–18 GHz Low Noise Gallium Arsenide FET
Technical Data
ATF-13100

Features

• Low Noise Figure:
1.1 dB Typical at 12 GHz
• High Associated Gain:
9.5 dB Typical at 12 GHz
17.5 dBm Typical P
at 12 GHz
1 dB

Description

The ATF-13100 is a high perfor­mance gallium arsenide Schottky­barrier-gate field effect transistor chip. This device is designed for use in low noise, wideband amplifier and oscillator applica­tions in the 2-18␣ GHz frequency range.
Electrical Specifications, T
Symbol Parameters and Test Conditions
NF
G
P
G
g
m
I
DSS
V
A
1 dB
1 dB
P
Optimum Noise Figure: VDS = 2.5 V, IDS = 20 mA f = 8.0 GHz dB 0.8
O
Gain @ NFO; VDS = 2.5 V, IDS = 20 mA f = 8.0 GHz dB 12.0
Power Output @ 1 dB Gain Compression f = 12.0 GHz dB m 17.5 VDS = 4 V, IDS = 40 mA
1 dB Compressed Gain; VDS = 4 V, IDS = 40 mA f = 12.0 GHz dB 8.5
Transconductance: VDS = 2.5 V, VGS = 0 V mmho 30 55
Saturated Drain Current; VDS = 2.5 V, VGS = 0 V mA 40 50 90
Pinchoff Voltage: VDS = 2.5 V, IDS = 1 mA V -3.0 -1.5 -0.8
This GaAs FET device has a nominal 0.3 micron gate length with a total gate periphery of 250␣ microns. Proven gold based metallization systems and nitride passivation assure a rugged, reliable device.
The recommended mounting procedure is to die attach at a
stage temperature of 300° C using
a gold-tin preform under forming gas. Assembly can be preformed with either wedge or ball bonding using 0.7 mil gold wire. See also “Chip Use” in the APPLICATIONS section.
= 25° C
A

Chip Outline

D
SS
G
[1]
f = 12.0 GHz dB 1.1 1.2 f = 15.0 GHz dB 1.5
f = 12.0 GHz dB 9.0 9.5 f = 15.0 GHz dB 8.0
Units Min. Typ. Max.
Note:
1.
RF performance is determined by assembling and testing 10 samples per wafer
5-33
.
5965-8694E

ATF-13100 Absolute Maximum Ratings

Absolute
Symbol Parameter Units Maximum
V
DS
V
GS
V
GD
I
DS
P
T
T
CH
T
STG
Drain-Source Voltage V +5 Gate-Source Voltage V -4 Gate-Drain Voltage V -6 Drain Current mA I Power Dissipation
[2,3]
m W 225
DSS
Channel Temperature °C 175 Storage Temperature °C -65 to +175
Thermal Resistance: θjc = 250°C/W; TCH = 150°C Liquid Crystal Measurement: 1 µm Spot Size
[4]

Part Number Ordering Information

Part Number Devices Per Tray
ATF-13100-GP3 50
[1]
Notes:
1. Permanent damage may occur if any of these limits are exceeded.
2. T
MOUNTING SURFACE
= 25°C.
3. Derate at 4 mW/°C for
T
MOUNTING SURFACE
> 119°C.
4. The small spot size of this tech­nique results in a higher, though
more accurate determination of θ
than do alternate methods. See MEASUREMENTS section for more information.
jc
ATF-13100 Noise Parameters: V
Freq. NF
GHz dB
O
Mag Ang
= 2.5 V, IDS = 20 mA
DS
Γ
opt
4.0 0.4 0.60 30 0.32
6.0 0.7 0.32 68 0.21
8.0 0.8 0.25 102 0.15
12.0 1.1 0.23 -165 0.09
16.0 1.5 0.32 -112 0.21
ATF-13100 Typical Performance, T
2.0
G
1.5
(dB)
1.0
O
NF
NF
0.5
0
2.0 6.04.0 8.0 10.0 12.0 16.0
Figure 1. Optimum Noise Figure and Associated Gain vs. Frequency. VDS = 2.5V, IDS = 20 mA, TA = 25°C.
A
O
FREQUENCY (GHz)
20
15
10
(dB)
A
G
5
0
= 25° C
A
4.0
3.0
(dB)
O
2.0
NF
1.0 010520302515 35
Figure 2. Optimum Noise Figure and Associated Gain vs. I VDS = 2.5V, f = 12.0 GHz.
NF
IDS (mA)
G
A
DS.
O
RN/50
12
10
(dB)
A
G
8
6
5-34
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