HP 8517B User Manual

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HP 8517B S-Parameter Test Set

Operating and Service Manual

PrintedinUSA 12 August 1998 HP part number 08517-90054

Notice

The information contained in this document is subject to change without notice.

Hewlett-Packard makes no warranty of any kind with regard to this material, including, but not limited to, the implied warranties of merchantability and fitnessfor a particular purpose. Hewlett-Packard shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material.

Hewlett-Packard assumes no responsibility for the use or reliability of its software on equipment that is not furnished by Hewlett-Packard.

This document contains proprietary information which is protected by copyright. All rights are reserved. No part of this document may be photocopied, reproduced, or translated to another language without prior written consent of Hewlett-Packard Company.

Restricted Rights Legend

Use, duplication, or disclosure by the U.S. Government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at DFARS 252.227-7013 for DOD agencies, and subparagraphs (c)(1) and (c)(2) of the Commercial Computer Software Restricted Rights clause at FAR 52.227-19 for other agencies.

Hewlett-Packard Company Santa Rosa Systems Division 1400 Fountaingrove Parkway Santa Rosa, CA 95403-1799, U.S.A.

HP 8517B S-Parameter Test Set Manual

What You’ll Find in This Manual…

HP 8517B S-Parameter Test Set

Chapters 1 and 2 • Test set description and installation information Chapters 3 and 4 • Principles of operation and specifications

Chapters 5, 6, and 7 • Troubleshooting, replacement procedures, and replaceable parts

information

HP 8517B S-Parameter Test Set Manual

iii

Warranty

Certification Hewlett-Packard Company certifies that this product met its published

specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology (NIST, formerly NBS), to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.

Warranty This Hewlett-Packard system product is warranted against defects in

materials and workmanship for a period corresponding to the individual warranty periods of its component products. Instruments are warranted for a period of one year. During the warranty period, Hewlett-Packard Company will, at its option, either repair or replace products that prove to be defective.

Warranty service for products installed by HP and certain other products designated by HP will be performed at Buyer’s facility at no charge within HP service travel areas. Outside HP service travel areas, warranty service will be performed at Buyer’s facility only upon HP’s prior agreement and Buyer shall pay HP’s round trip travel expenses. In all other areas, products must be returned to a service facility designated by HP.

For products returned to HP for warranty service, Buyer shall prepay shipping charges to HP and HP shall pay shipping charges t o return the product to Buyer.However,Buyer shall pay all shipping charges, duties, and taxes for products returned to HP from another country.

HP warrants that its software and firmware designated by HP for use with an instrument will execute its programming instructions when properly installed on that instrument. HP does not warrant that the operation of the instrument, or software, or firmware will be uninterrupted or error free.

LIMITATION OF WARRANTY. The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by Buyer, Buyer-supplied software or interfacing, unauthorized modification or misuse, operation outside of the environmental specifications for the product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OR MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.

EXCLUSIVE REMEDIES. THE REMEDIES PROVIDED HEREIN ARE BUYER’S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR

HP 8517B S-Parameter Test Set Manual

CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT, TORT, OR ANY OTHER LEGAL THEORY.

Assistance Product maintenance agreements and other customer assistance agreements

are available for Hewlett-Packard products. For assistance, call your local Hewlett-Packard Sales and Service Office

(refer to “Service and Support”).

HP 8517B S-Parameter Test Set Manual

Service and Support

Any adjustment, maintenance, or repair of this product must be performed by qualified personnel. Contact your customer engineer through your local HP Service Center. You can find a list of HP Service Centers on the web at

http://www.hp.com/go/tmdir.

If you do not have access to the Internet, one of these HP centers can direct you to your nearest HP r epresentative:

United States: Hewlett-Packard Company

Test and Measurement Call Center PO Box 4026 Englewood, CO 80155-4026 (800) 452 4844 (toll-free in US)

Canada: Hewlett-Packard Canada Ltd.

5150 Spectrum Way Mississauga, Ontario L4W 5G1 (905) 206 4725

Europe: Hewlett-Packard European Marketing Centre

Postbox 999 1180 AZ Amstelveen The Netherlands (31 20) 547 9900

Japan: Hewlett-Packard Ltd.

Measurement Assistance Center 9-1, Takakura-Cho, Hachioji-Shi Tokyo 192, Japan (81) 426 56 7832 (81) 426 56 7840 (FAX)

Latin America: Hewlett-Packard Latin American Region Headquarters

5200 Blue Lagoon Drive, 9th Floor Miami, Florida 33126, U.S.A. (305) 267 4245, (305) 267-4220 (305) 267 4288 (FAX)

Australia/New Zealand: Hewlett-Packard Australia Ltd.

31-41 Joseph Street Blackburn, Victoria 3130 Australia 1 800 629 485 (Australia) 0800 738 378 (New Zealand) (61 3) 9210 5489 (FAX)

Asia-Pacific: Hewlett-Packard Asia Pacific Ltd.

17-21/F Shell Tower, Times Square 1 Matheson Street, Causeway Bay Hong Kong (852) 2599 7777 (852) 2506 9285 (FAX)

HP 8517B S-Parameter Test Set Manual

Safety and Regulatory Information

Review this product and related documentation to familiarize yourself with safety markings and instructions before you operate the instrument. This product has been designed and tested in accordance with international standards.

WARNING

CAUTION

Instrument Markings

The WARNING notice denotes a hazard. It calls attention to a procedure, practice, or the like, that, if not correctly performed or adh ered to, could result in personal injury. Do not proceed beyond a WARNING notice until the indicated conditions are fully understood and met.

The CAUTION notice denotes a hazard. It calls attention to an operating procedure, practice, or the like, which, if not correctly performed or adhered to, could result in damage to the product or loss of important data. Do not proceed beyond a CAUTION notice until the indicated conditions are fully understood and met.

When you see this symbol on your instrument, you should refer to the instrument’s

instruction manual for important information.

This symbol indicates hazardous voltages.

The laser radiation symbol is marked on products that have a laser output.

This symbol indicates that the instrument requires alternating current (ac) input.

The CE mark is a registered trademark of the European Community. If it is accompanied by a year, it indicates the year the design was proven.

The CSA mark is a registered trademark of the Canadian Standards Association.

1SM1-A This text indicates that the instrument is an Industrial Scientific and Medical Group 1

Class A product (CISPER 11, Clause 4). This symbol indicates that the power line switch is ON.

This symbol indicates that the power line switch is OFF or in STANDBY position.

HP 8517B S-Parameter Test Set Manual

vii

Safety Earth Ground

This is a Safety Class I product (provided with a protectiveearthing terminal). An uninterruptible safety earth ground must be provided from the main power source to the product input wiring terminals, power cord, or supplied power cord set. Whenever it is likely that the protection has been impaired, the product must be made inoperative and secured against any unintended operation.

Before Applying Power Verify that the product is configured to match the available main power

source as described in the input power configuration instructions in this manual. If this product is to be powered by auto-transformer, make sure the common terminal is connected to the neutral (grounded) side of the ac power supply.

viii

HP 8517B S-Parameter Test Set Manual

Typeface Conventions

Not all of the following conventions may appear within this manual, however, refer to this listing whenever you encounter on of the special font characters.

Italics

• Used to emphasize important information:

Use this software only with the HP 8517B Test Set.

• Used for the title of a publication:

Refer to the HP 8517B S-Parameter Test Set Manual

• Used to indicate a variable:

LOAD BIN filename.

Type

Instrument Display • Used to show on-screen prompts and messages that you will see on the

display of an instrument:

The HP 8517B will display the message

Keycap

Softkey

User Entry • Used to indicate text that you will enter using the computer keyboard;

• Used for labeled keys on the front panel of an instrument or on a

computer keyboard:

[Return]

Press

• Used for simulated keys that appear on an instrument display:

{Prior Menu}

Press

text shown in this typeface must be typed exactly as printed:

LOAD PARMFILE

Type

CAL1 SAVED.

Path Name

Computer Display

• Used for examples of programming code:

#endif // ifndef NO_CLASS

• Used for a subdirectory name or file path:

Edit the file

usr/local/bin/sample.txt

• Used to show messages, prompts, and window labels that appear on a

computer monitor:

Edit Parameters

The

window will appear on the screen.

• Used for menus, lists, dialog boxes, and button boxes on a computer

monitor from which you make selections using the mouse or keyboard:

EXIT

Double-click

to quit the program.

HP 8517B S-Parameter Test Set Manual

Notice ..................................................... ii

RestrictedRightsLegend................................ ii

WhatYou’llFindinThisManual…..............................iii

HP8517BS-ParameterTestSet ..........................iii

Warranty ...................................................iv

Certification .............................................iv

Warranty ................................................iv

Assistance............................................... v

Service and Support . .........................................vi

SafetyandRegulatoryInformation.............................. vii

Safety Earth Ground . . . ...................................viii

BeforeApplyingPower ...................................viii

Typeface Conventions ........................................ix

1. Getting Started

HowtoUseThisManual .....................................1-1

TestSetDescription .........................................1-2

Figure 1-1. Standard HP 8517B Test Set Block Diagram .........1-2

Figure 1-2. Option 004, HP 8517B Test Set Block Diagram .......1-3

Figure 1-3. Option 007, HP 8517B Test Set Block Diagram .......1-3

HP8517BTestSetOptions ...................................1-4

Table 1-1. HP 8517B Options and Descriptions ................1-4

VerifyingTestSetOperation ..................................1-5

Table 1-2. Test Set Operation Verification .....................1-5

CheckingSystemOperation.............................1-5

CheckingSpecifications................................1-5

Troubleshooting the Test Set . . ..........................1-5

MaintainingMeasurementAccuracy ............................1-6

InstrumentsSupportedbyThisManual ..........................1-7

Figure 1-4. Instrument Serial-Number Label Example ...........1-7

InstrumentFirmwareCompatibility .............................1-8

Table 1-3. Source Firmware Revision Compatibility Matrix .......1-8

Service and Support Options Available ..........................1-9

Table 1-4. Service and Support Options ......................1-9

Accessories ...............................................1-10

RecommendedTestEquipment ...............................1-12

Table 1-6. Recommended Test Equipment ....................1-12

OperatingandSafetyPrecautions..............................1-13

Table 1-7. Maximum Input Power Levels ....................1-13

SafetyPrecautions ......................................1-13

HP 8517B S-Parameter Test Set Manual

Contents-1

2. Installation

InitialInspection ........................................... 2-2

OperatingEnvironment................................... 2-2

StoringtheTestSet ...................................... 2-2

AccessoriesSupplied .................................... 2-2

Figure 2-1. Accessories Supplied with the HP 8517B Test Set .... 2-3

Table 2-1. Accessories in Figure 2-1 ........................ 2-3

InstallingtheTestSetIntoaSystemRack ....................... 2-4

InstallingtheTestSetonaBench........................... 2-4

Figure 2-2. Recommended Static-Free Workstation Configuration .2-4

ConfiguringtheTestSetinaSystem ........................... 2-5

Figure 2-3. Configuring an HP 8517B Test Set in a System ...... 2-5

ConnectingtheSystemCables ............................. 2-6

Table 2-2. Connection Instructions and Connector Descriptions .. 2-6

ConnectSystemPower................................ 2-6

andControlCables ................................... 2-6

Signal Path Connections . .............................. 2-6

TestPortConnectors.................................. 2-6

Anti-RotationClamp.................................. 2-6

ReplacingO-RingsinAnti-RotationClamps .................. 2-6

PackagingtheTestSet....................................... 2-7

3. Operating the HP 8517B Test Set

Front-PanelFeatures ........................................ 3-1

Figure 3-1. Front-Panel Features of the HP 8517B Test Set ...... 3-1

Table 3-1. Front-Panel Description ......................... 3-1

Rear-PanelFeatures......................................... 3-2

Figure 3-2. Rear-Panel Features of the HP 8517B Test Set ....... 3-2

Table 3-2. Rear-Panel Descriptions ......................... 3-2

ControllingMultipleTestSets ................................ 3-3

Figure 3-3. RF and IF Switching with Two Test Sets ............ 3-4

Table 3-3. RF and IF Switch Settings in Figure 3-3, Above ....... 3-4

Multiple Test-Set Connections . . .............................. 3-5

InitializationatPower-Up................................. 3-5

SelectingaTestSet ...................................... 3-5

Table 3-4. Selecting a Test Set When Multiple Units are Configured 3-6

TestSetIFSwitching ................................. 3-6

TestSetAddressing................................... 3-6

RFSwitchDriverControl.............................. 3-6

Figure3-4. RFandIFSwitchingwithFourTestSets........ 3-7

Table 3-5. Coaxial Switch Settings for Figure 3-4, Above ........ 3-7

MeasurementCalibration .................................... 3-8

MeasuringHigh-PowerDeviceswithOption004 ................. 3-9

ChangingSignalPathStatesAfterSystemCalibration............. 3-10

ChangingtheTestPortAttenuators ........................ 3-10

StoringTraceMemories ................................. 3-11

ViewingNormalizedParameters........................... 3-11

Contents-2

HP 8517B S-Parameter Test Set Manual

MakingOperationalChecks ..................................3-13

PerformanceVerification ....................................3-14

UsingAnti-RotationClamps .................................3-15

Attachthefirstclamp.................................3-15

Figure 3-5. Using a Torque Wrench Correctly ................3-16

Positioningthethumb-screw ...........................3-16

Figure 3-6. Visually Aligning Clamp and Nut Flats ............3-17

Positioning the connector .............................3-17

Figure 3-7. Mating the Clamp and Nut Flats .................3-17

Aligningthethumb-screw .............................3-18

Figure 3-8. Aligning the Thumbscrew With the Counter-SinkHole 3-18

Attachingthesecondclamp............................3-18

4. Specifications

MechanicalSpecifications ....................................4-1

SupplementalCharacteristics ..................................4-1

Table 4-1. HP 8510/HP 8517B Mechanical Specifications .......4-1

Table 4-2. HP 8510/HP 8517B Supplemental Characteristics .....4-1

5. Troubleshooting the Test Set

TheoryofOperation .........................................5-2

Figure 5-1. Standard HP 8517B RF Block Diagram ............5-2

TheRFSourcePower.....................................5-2

TheReferenceSignalPath.................................5-3

TheTestSignalPath......................................5-3

The S

and S21Measurements .............................5-3

TheSamplerControlSwitching.............................5-3

TheLOSignalControl....................................5-4

Troubleshooting Sequence . ...................................5-5

Figure 5-2. Troubleshooting Flowchart ......................5-5

Equipment Needed But Not Supplied . . ......................5-6

Table 5-1. Equipment Required, But Not Supplied ..............5-6

Troubleshooting Procedures ...................................5-7

Table 5-2. Power Supply Voltages to A15 .....................5-7

Table 5-3. Power Supply Voltages to A27 .....................5-7

Figure 5-3. Power Supply Fuses and Test Points ...............5-8

HP-IBAddressSwitch ....................................5-8

Figure 5-4. Instrument HP-IB Switch Setting ..................5-9

FuseLocation ...........................................5-9

Figure 5-5. Fuse and Voltage Cam Location ...................5-9

Figure 5-6. The ACTIVE LED Location .....................5-10

IftheSelf-TestFailstoRunProperly ....................5-10

Figure 5-7. HP 8518B Test Set, A4 Board Assembly LEDs .......5-11

Table 5-4. Instrument Self-Test Indicator State Definitions ......5-11

Figure 5-8. Service Adapter Connections ....................5-12

UsingtheServiceAdapter.............................5-12

ServiceAdapterConclusions...........................5-13

Table 5-5. Results Observations ...........................5-13

HP 8517B S-Parameter Test Set Manual

Contents-3

UnratioedPowerTest................................ 5-14

Figure 5-9. Diagram of IF Signal Path ..................... 5-14

IsolatingSignalPathProblems............................ 5-14

TestingSignalPaths1-4.............................. 5-14

TestingPaths5and6 ................................ 5-16

Figure 5-10. RF Path 1 and Path 2, HP 8517B Standard Test Set .5-17 Figure 5-11. RF Path 3 and Path 4, HP 8517B Standard Test Set .5-18 Figure 5-12. RF Path 5 and Path 6, HP 8517B Standard Test Set .5-19 Figure 5-13. RF Path 1 through Path 4,

HP 8517B Option 007 Test Set ......................... 5-20

Figure 5-14. RF Signal for Path 1 through Path 4,

HP 8517B Option 007 ............................... 5-21

Figure 5-15. RF Path 5 and Path 6, HP 8517B Option 007 ...... 5-22

Table 5-6. Test Results for Path 1 through Path 6 ............. 5-23

SampleDiagnostics..................................... 5-23

Table 5-7. Most Probable Failures

(B indicates Bad; — indicates Good) .................... 5-23

6. HP 8517B Test Set Replacement Procedures

Figure 6-1. ESD-Safe Workstation Configuration .............. 6-2

PerformanceTests .......................................... 6-2

Adjustments............................................... 6-2

Equipment Needed But Not Supplied . .......................... 6-3

Table 6-1. Replacement-Procedure Tools Needed .............. 6-3

Figure 6-2. HP 8517B Major Assembly Location Diagram ...... 6-4

AssemblyReplacementProcedures............................. 6-5

InitialPrecautions ....................................... 6-5

Switch/SplitterReplacement............................... 6-5

A18Switch/SplitterAssembly .......................... 6-5

FrequencyConverterReplacement.......................... 6-5

A14,A10toA13FrequencyConverterAssembly .......... 6-5

RegulatorBoardReplacement ............................. 6-6

A15RegulatorBoardAssembly......................... 6-6

FilterCapacitorReplacement .............................. 6-6

C1toC4FilterCapacitors ............................. 6-6

TestPortConnectorReplacement........................... 6-7

2.4mmTestPortConnectors........................... 6-7

Figure 6-3. Diagram of 2.4 mm Test Port Connector ............ 6-7

FanAssemblyReplacement ............................... 6-8

B1FanAssembly .................................... 6-8

PowerTransformerReplacement ........................... 6-8

T1PowerTransformer ................................ 6-8

Figure 6-4. Wire Connections to FL1 Line Module ............. 6-9

O-RingReplacement.................................... 6-10

Figure 6-5. Positioning the O-Ring Within the Clamp .......... 6-10

FrontPanelandInterfaceBoardReplacement ................ 6-10

A1FrontPanelandInterfaceBoardAssembly ............ 6-10

Contents-4

HP 8517B S-Parameter Test Set Manual

BiasTeesReplacement...................................6-11

A7andA9BiasTees .................................6-11

TestPortCouplerReplacement ............................6-11

A6andA8TestPortCouplers..........................6-11

TestPortAttenuatorReplacement ..........................6-11

A16orA17PortAttenuators...........................6-11

Input Amplifier Replacement ..............................6-12

A22InputAmplifierAssembly .........................6-12

BufferAmplifierReplacement.............................6-12

A23toA26BufferAmplifiers..........................6-12

PostRegulatorBoardReplacement .........................6-13

A27PostRegulatorBoardAssembly ....................6-13

7. HP 8517B Replaceable Parts

Introduction................................................7-1

Rebuilt-ExchangeAssemblies ..............................7-1

ReplaceablePartsList ....................................7-1

OrderingInformation..................................7-2

ToOrderParts....Fast!...............................7-2

Table 7-1. Reference Designation Abbreviations ..............7-2

Table 7-2. Manufacturer Names and Addresses ................7-3

Table 7-3. Standard Abbreviations ..........................7-4

Table 7-4. Multipliers, Abbreviation and Description ...........7-10

Figure 7-1. Power Cable and Plug Part Numbers ..............7-11

Table 7-5. Instrument Fuses ..............................7-12

Figure 7-2. The Low Cost Rebuilt-Exchange Procedure .........7-13

Table 7-6. Major AssemblyReference Designator and PartsInformation

7-14

Figure 7-3. Major Assembly Locations in the Standard

HP 8517B Test Set ...................................7-15

Table 7-7. Semi-Rigid Cable Assemblies in the Standard

HP 8517B Test Set ...................................7-16

Table 7-8. Flexible Cable Assemblies in the Standard

HP 8517B Test Set ...................................7-17

Table 7-9. Miscellaneous Parts, Front Panel HP 8517B Test Set ..7-19

Table 7-10. Test Port Connector Assembly Components .........7-20

Table 7-11. Miscellaneous Parts, Rear Panel HP 8517B Test Set ..7-21

Figure 7-4. Detailed Views of Hardware Stack-Ups ............7-23

Table 7-12. Miscellaneous Parts, Top Internal View ............7-24

Table 7-13. Miscellaneous Parts, Motherboard ...............7-25

Table 7-14. Parts Unique to HP 8517B Option 001 Test Set ......7-27

Table 7-15. Parts Unique to HP 8417B Option 002 Test Set ......7-29

Table 7-16. Parts Unique to HP 8517B Option 004 Test Set ......7-30

Table 7-17. Parts Unique to HP 8517B Option 007 Test Set ......7-31

Table 7-18. Parts Unique to Option 002 “plus” Option 007 .....7-33

Table 7-19. Parts Unique to Option 004 “plus” Option 007 .....7-34

Table 7-20. Instrument Chassis Replaceable Parts .............7-35

HP 8517B S-Parameter Test Set Manual

Contents-5

Contents-6

HP 8517B S-Parameter Test Set Manual

Getting Started

This is the operating and service manual for the HP 8517B S-parameter test set. It is to be used in conjunction with the HP 8510C Network Analyzer Operating and Service Manual. Together, these manuals provide information needed to configure the system and make measurements.

How to Use This Manual

Step 1. Review Chapter 1, “Getting Started” and Chapter 2, “Installation” of this manual to

learn about:

• Using this test set

• Using options of the test set

• Preparing the site for operation

• Understanding safety considerations

• Unpacking the instrument and checking it for shipment damages

• Configuring the HP 8517B test set with the HP 8510C Network Analyzer

Step 2. Insert the contents of this manual into the HP 8510C Test Sets and Accessories

binder behind the tab labeled “Test Sets.”

Step 3. Review the

supplied with the HP 8510C manuals set. Refer to the calibration kit documentation for complete information about care, cleaning, gaging, and connecting precision devices. Knowledge and application of proper connector care is essential to achieving good connections and maintaining maximum performance quality with your precision calibration devices.

Step 4. Read Chapter 3, “Operation,” to learn about test set front- and rear-panel features.

This chapter also has information about controlling multiple test sets, measuring high power devices, using the anti-rotation clamps on the cables, and connecting devices to the test set.

Step 5. Refer to Chapters 4 through 7 for reference information about specifications,

troubleshooting, replacement procedures, and replacement parts information.

Connector Care Quick Reference Card

(HP part number 08510-90360)

HP 8517B S-Parameter Test Set Manual

1-1

Getting Started

Test Set Description

The HP 8517B test set configured with an HP 8510B/C network analyzer and an HP 8360 series source, creates a system capable of making S-parameter measurements from 45 MHz to 50 GHz. The system is particularly suited for making two-port device measurements. You can measure all four S-parameters without physically reversing the DUT (device under test).

The system is also designed for making measurements on non-reciprocal devices or components like transistors, amplifiers or isolators where S measurements are required.

Two directional couplers are used for signal separation. The configuration is illustrated in the following figures:

• Figure 1-1, “Standard HP 8517B Test Set Block Diagram"

• Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram"

• Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"

For active-device measurements, two bias tees apply external DC bias to both test port center conductors.

Figure 1-1 Standard HP 8517B Test Set Block Diagram

1-2

HP 8517B S-Parameter Test Set Manual

Getting Started

Test Set Description

Figure 1-2 Option 004, HP 8517B Test Set Block Diagram

Figure 1-3 Option 007, HP 8517B Test Set Block Diagram

HP 8517B S-Parameter Test Set Manual

1-3

Getting Started

HP 8517B Test Set Options

Options for the HP 8517B test set are described in Table 1-1, below.

Table 1-1 HP 8517B Options and Descriptions

Options HP 8517B Test Set Option Description

Option 001 Adds IF switching capability for up to four test set connections to the HP 8510C Network

Analyzer. The test set used is selected from the network analyzer. Refer to “Controlling Multiple Test Sets” in Chapter 3, “Operation” of this manual for more information.

Option 002 Deletes the programmable attenuators and bias tees.

Note:

If bias is required but attenuation is not, the bias can be applied externally by using an

HP 11612B bias tee.

Option 004 Moves P ort 2 attenuator in front of the b2 sampler, allowing devices with output power up to 30

dBm (1 W) to be measured. Adds a 3 dB attenuator which protects the switch splitter from high power into Port 2.

Option 007 Adds five amplifiers, two 10 dB attenuators, two 6 dB attenuators, and two tapered attenuators.

These components increase the available power and dynamic range of the test set.

Option 908 Supplies the hardware required for rack mounting the test set when its handles are removed.

Refer to Chapter 2, “Installation” for more information. Option 910 Adds a duplicate copy of this manual to the shipment. Option 913 Supplies the hardware required for rack mounting the test set with its handles attached. Refer

to Chapter 2, “Installation” for more information. Option 002 “plus” 007 Removes the bias tee, and retains the high dynamic range capability in the test set. Option 004 “plus” 007 Adds high-dynamic range and high power measurement capability to Port 2.

1-4

HP 8517B S-Parameter Test Set Manual

Verifying Test Set Operation

The test set is designed to operate with an HP 8510C network analyzer. You canverifyitsoperationby:

Table 1-2 Test Set Operation Verification

Getting Started

Verifying Test Set Operation

Checking System Operation Perform a system calibration as described in the

Programming Manual

therefore the test set, are operating properly.

Checking Specifications Specifications for the test set, and the system, can be determined by running

the specification and performance verification software described in the

8510C On-Site Service Manual

Verification”. Additional mechanical specifications and supplemental characteristics are in Chapter 4, “Specifications” of this manual.

Troubleshooting the Test Set To troubleshoot the test set, refer to the

Use the information in that manual to determine if the test set is at fault. If the test set is at fault, refer to Chapter 5, “Troubleshooting the Test Set” in this manual to isolate the trouble.

. A successful calibration indica tes that the system, and

, Chapter 8, “Specification and Performance

HP 8510C Operating and

HP 8510C On-Site Service Manual

HP 8517B S-Parameter Test Set Manual

1-5

Getting Started

Maintaining Measurement Accuracy

Precision measurements rely on a precision calibration of the network analyzer. As a general rule, the shorter the time lapse between a calibration and a device measurement, the more precise the measurement results will be (within the limitations of your system).

Hewlett-Packard recommends calibrating your system every few hours, or at least re-verifying your system’s calibration this frequently. Doing so helps retain measurement precision.

The frequency of calibrations is determined by both the location of the system and the ambient temperature stability in its operating area.

1-6

HP 8517B S-Parameter Test Set Manual

Getting Started

Instruments Supported by This Manual

A serial number label is attached to the rear panel of the test set. There are two parts to the serial number: a prefix, and a suffix. See Figure 1-4, and read the following descriptions:

• The prefix includes the first four digits of the serial number, plus the

letter. The contents of this manual apply directly to test sets with the same serial number prefix as the one(s) on the title page.

• The suffix includes the last five digits of the serial number, which is

sequential and unique to each test set. You will need this part of the number to report test-set problems to an HP sales and service engineer.

Figure 1-4 Instrument Serial-Number Label Example

serial.tif

HP 8517B S-Parameter Test Set Manual

1-7

Getting Started

Instrument Firmware Compatibility

To use the HP 8517B test set at f requencies up to 50 GHz, use an HP 83650B or HP 83651B source.

If your network analyzer or source do not meet the required frequency ranges for your measurement needs, you need to upgrade your system.

Please contact an HP Sales and Service representativeforinformation.These offices are listed in “Service and Support” on page vi at the front of this manual

Table 1-3 Source Firmware Revision Compatibility Matrix

Instrument Model Number and Name

HP 8517B Test Set HP 8510B Network Analyzer

HP 8517B, Option 007 Test Set

Compatible With Model: Firmware Revision

HP 8510C Network Analyzer HP 8510C Network Analyzer 7.0 or higher, only Yes, up to the higher

B.06.00 and higher C.06.00 and higher

Compatible With HP 8340 Series Sources?

Yes, up to the higher frequency limits.

frequency limits.

Compatible With HP 8350 Series Sources?

Yes, up to the higher frequency limits.

No, not compatible

1-8

HP 8517B S-Parameter Test Set Manual

Getting Started

Service and Support Options Available

A variety of service and support products are available for coverage of repair, calibration, and verificationissues. Contact your HP sales and service engineer for details. Their office addresses and phone numbers are listed in the front of this document.

The purchase of an HP 8517B includes a one year on-site service warranty. In the event of failure, Hewlett-Packard provides service for the system.

NOTE

System installation is not included.

Table 1-4 Service and Support Options

Option Number Option Description

Option W30 Adds a three year customer return-repair coverage warranty to the instrument.

Customers may return the instrument to HP within that three year period for repair.

Option W31 Adds a three year on-site repair coverage warranty for next-day on-site repair of the

instrument. Customers may return the instrument to HP within that three year period for repair and get next-day service on their instrument.

Option 1BN Adds to the instrument a MIL-STD 45662A Certificate of Calibration.

ordered when the instrument order is placed

Option 1BP Adds to the instrument a MIL-STD 45662A Certificate of Calibration and the

corresponding calibration data.

placed

Option UK6 Adds a certificate of calibration (rather than the MIL-STD certificate) and the

corresponding calibration data to the instrument.

instrument order is placed.

This option must be ordered when the instrument order is

This option must be ordered when the

This option must be

HP 8517B S-Parameter Test Set Manual

1-9

Getting Started

Accessories

The accessories supplied with the test set, including part numbers, are listed in “Accessories Supplied” in this section and in the “Replaceable Parts List” of this manual.

Accessories Available Table 1-5 describes accessories available for the HP 8517B test set. For

additional HP 8510C system accessories information,refer to the HP 8510C manual set.

Table 1-5 HP 8517B Test Set Accessories Available

Accessory Type Accessory Model Number Contents or Description

Calibration Kit

Verification Kit

HP 85056A 2.4 mm Calibration Kit Contains open and short circuits

Fixed and sliding loads (2)

2.4 mm to 2.4 mm adapters

2.4 mm connector tools and gauges

HP 85057S 2.4 mm Verification Kit Contains precision airline, mismatched airline,

20 dB and 40 dB attenuators

Cables HP 85133C 2.4 mm Test Port Return

Cable

HP 85133D 2.4 mm Test Port Return Cable Set

HP 85133E 2.4 mm Flexible Test Port Return Cable

HP 85133F 2.4 mm Flexible Test Port Return Cable Set

HP 85134D 3.5 mm Test Port Return Cable Set

HP 85134E 3.5 mm Flexible Test Port Return Cable

HP 85134F 3.5 mm Flexible Test Port Return Cable Set

HP 85135C 7 mm Test Port Return Cable

Used when measuring a 2.4 mm-ported device connected directly to Port 1 of the test set. The test port return cable is connected between the device under test and Port 2.

Used when measuring a 2.4 mm-ported device connected between the cable ends.

Used when measuring a 2.4 mm-ported device connected directly to Port 1 of the test set. The test port return cable is connected between the device under test and Port 2.

Used when measuring a 2.4 mm-ported device connected between the cable ends.

Used when measuring a 3.5 mm device under test connected between the cable ends.

Used when measuring one end of a 3.5 mm device connected directly to an HP 85130F adapter at Port 1. The test-port return cable is connected between the device and Port 2.

Used when measuring a 3.5 mm device connected between the cable ends.

Used when measuring one end of a 7 mm device connected directly to an HP 85130E adapter at Port 1. The test port return cable is connected between the device and Port 2.

Cables (Continued) HP 85135D 7 mm Test Port Return

Cable Set

1-10

HP 8517B S-Parameter Test Set Manual

Used when measuring a 7 mm device connected between the cable ends.

Table 1-5 HP 8517B Test Set Accessories Available (Continued)

Accessory Type Accessory Model Number Contents or Description

Getting Started

Accessories

HP 85135E 7 mm Flexible Test Port Return Cable

HP 85135F 7 mm Flexible Test Port Return Cable Set

Adapters HP 85130E Special 2.4 mm to 7 mm

Adapter Set HP 85130F Special 2.4 mm to 3.5 mm

Adapter Set HP 85130G Special 2.4 mm to 2.4 mm

Adapter Set

HP 11904S 2.4 mm to K-2.9 mm Adapter Kit

Test Fixture Kit HP 85041A Transistor Test Fixture Kit

(TTF)

Used when measuring one end of a 7 mm device connected directly to an HP 85130E adapter at Port 1. The test port return cable is connected between the device and Port 2.

Used when measuring a 7 mm device connected between the cable ends.

Used to convert special 2.4 mm test set ports into a 7 mm connector interface (m or f).

Used to convert special 2.4 mm ports of the test set into a 3.5 mm connector interface (m or f).

Used to convert special 2.4 mm ports of the test set into a standard

2.4 mm connector interface (m or f). These adapters function as “test port savers.”

Used to calibrate the test set using 2.4 mm devices, then to change the test ports to 2.92 mm and perform fully error corrected measurements. The kit contains (2) 2.4 mm to 2.92 mm (m) adapters and (2) 2.4 mm to 2.92 (f) adapters.

A comprehensive measurement system for testing and characterizing stripline packaged microwave transistors. Although the fixture contains 7 mm connectors and its frequency limit is 18 GHz, the kit may be adapted for use with the test set. Use HP 85135C or HP 85135E cables with the HP 85130E adapter set. Please consult your HP Sales and Service representative for recommendations.

NOTE

1. NIST traceable data and uncertainties are available.

2. The K-connector is developed and manufactured by the Wiltron Company (Morgan Hill, California).

For more information about other 2.4 mm adapters, refer to the “2.4 mm Adapters and Calibration Accessories,” Operating Note, (HP part number

11900-90003).

HP 8517B S-Parameter Test Set Manual

1-11

Getting Started

Recommended Test Equipment

Additional equipment and accessories required for use with the test set are listed in Table 1-6. The table lists which items are required to verify the performance of the test set and which are required to operate it. O ther equipment may be substituted if their specifications meet or exceed those listed in the critical specifications column

Table 1-6 Recommended Test Equipment

Item

Network Analyzer no substitute HP 8510B or HP 8510C O, P, T Source no substitute HP 83651B O, P, T Controller no substitute HP 9000 Series 200 or 300 with 3 Mbyte RAM and

Disk Drive is compatible with the

Multimeter range: 0 to 50 V HP 3456A T Oscilloscope 50 MHz bandwidth HP 1740A T

O = Operation; P = Performance Test; T = Troubleshooting

Critical Specifications

controller

Recommended Model Use

N/A HP BASIC 3.0 or higher or PCC-305 or PC-308 HP BASIC Controller with 3 Mbyte Basic Language Processor RAM

is compatible with the controller P

1-12

HP 8517B S-Parameter Test Set Manual

Operating and Safety Precautions

Getting Started

CAUTION

ESD Sensitive Assemblies

Test set assemblies are very sensitivetodamage from electrostatic discharge.

They may or may not continue to function if subjected to electrostatic discharge. Their reliability, however, will be impaired. Handle the instrument devices at static-safe work stations, only.

Operating Precautions Observe the following normal precautions when handling and operating the

test set:

• Do not exceed the input power levels listed below:

Table 1-7 Maximum Input Power Levels

Power Level Test Port

+17 dBm Port 1 +17 dBm Port 2

+30 dBm

1. This is the maximum input power allowed with HP 8517B Option 004, or Option 004 “plus” Option 007, when the attenuator is set to attenuation, the maximum input power allowed is +17 dBm.

Port 2 (Option 004, or Option 004 “plus” 007)

≤

20 dB. Without

• Do not exceed +15 dBm into the test set with the source RF input.

• Never apply a dc voltage to the source RF input of the test set.

• Do not torque any connection at the test port connectors to more than

90 N-cm (8 in-lb). The wrench supplied with your accessory kit is calibrated for 90 N-cm (8 in-lb) torque.

• Do not torque any connection to more than 90 N-cm (8 in-lb) at the

source RF input or on the back of your test set.

Safety Precautions The voltages inside this test set warrant normal caution for operator safety.

Nevertheless, service should be performed by qualified personnel, only. Service strategy, troubleshooting procedures, replaceable parts, and other information about the test set are provided in this manual or the HP 8510C On-Site Service Manual.

HP 8517B S-Parameter Test Set Manual

1-13

Getting Started

Operating and Safety Precautions

1-14

HP 8517B S-Parameter Test Set Manual

Installation

This chapter contains installation information. Topics include initial inspection,environmental considerations,testset location when using it with the HP 8510C network analyzer, and making connections to the test set.

Refer to “Installation” in the HP 8510C On-Site Service Manual for complete system connection and turn-on instructions.

Refer to “Packaging the Test Set” for information about shipping the instrument.

HP 8517B S-Parameter Test Set Manual

2-1

Installation

Initial Inspection

Inspect the shipping container and cushioning materials for damage. If there is damage, keep the container until you have checked the contents for completeness.

If shipping materials are damaged, complete the performance tests outlined in the HP 8510C On-Site Service Manual. If the test set fails the performance tests, or is damaged or defective, keep the shipping materials. Notify both the carrier and the nearest Hewlett-Packard Sales and Service Office (listed in “Service and Support” at the front of this manual).

The office can arrange for repair or replacement of the test set without waiting for the claim settlement.

Operating Environment

For the HP 8517B to operate within specifications, the ambient temperature must remain between 0 95% (at 40 operated at altitudes up to 4,500 meters (15,000 feet).

° C dry bulb temperature, maximum). The instrument can be

° Cand+55° C. Keep relative humidity to less than

Storing the Test Set Acceptable storage temperatures range from –40° Cto+75° C, with relative

humidity up to 15,240 meters (50,000 feet).

≤90% at +65° C (maximum dry bulb temperature) and at altitudes

Accessories Supplied Figure 2-1 illustrates accessories supplied with the test set. If you did not

receive one of these accessories with the test set, notify your nearest HP Sales and Service Office so that the m issing parts can be sent to you.

2-2

HP 8517B S-Parameter Test Set Manual

Installation

Initial Inspection

Figure 2-1 Accessories Supplied with the HP 8517B Te st Set

Table 2-1 Accessories in Figure 2-1

(1) Power Cord U.S.A. only (6) Female 2.4 mm to Female 2.4 mm Adapter (2) Test Set Interconnect Cable (7) 20 mm, 98 N-cm (8 in-lb) Torque Wrench (3) HP-IB Cable (8) 1/2” x 9/16” Open End Wrench (4) Specification and Performance Verification Software (9) RF Source Cable, Bench-top Configuration (5) Anti-rotation Clamps (10) RF Source Cable, Rack Configuration

CAUTION

Assemblies in the test set are extremely sensitive to damage by static electricity. They may or may not continue to function if subjected to an electrostatic discharge. Their reliability, however, will be impaired.

CAUTION

Always use an anti-static wrist strap when calibrating or verifying the test set or while using the test set to measure devices. Never touch test port center conductors. Use a wrist strap when connecting the extended center conductor of a sliding load termination.

HP 8517B S-Parameter Test Set Manual

2-3

Installation

Installing the Test Set Into a System Rack

The HP 85043C system rack is the recommended model to use. To rack-mount the test set into a system configured with the H P 8510C, refer to the “Installation” chapter of the HP 8510C On-Site Service Manual and to the HP 85043C System Rack Manual.

Installing the Test Set on a Bench

When installing the test set for use on a bench, place it on a grounded anti-static work surface to reduce the chance of ESD damage. The antistatic surface should extend far enough in front of the test set to provide effective protection for the test ports and cable ends. See Figure 2-2.

A grounding receptacle is provided on the test set as an alternate grounding point for your anti-static wrist-strap.

Figure 2-2 Recommended Static-Free Workstation Configuration

2-4

HP 8517B S-Parameter Test Set Manual

Installation

Configuring the Test Set in a System

Figure 2-3 illustrates the cable connections for installing an HP 8517B in a system. Refer to the information that follows to install the test set.

Figure 2-3 Configuring an HP 8517B Test Set in a System

HP 8517B S-Parameter Test Set Manual

2-5

ConnectingtheSystem Cables

Table 2-2 Connection Instructions and Connector Descriptions

Installation

Configuring the Test Set in a System

Connect System Power and Control Cables

Signal Path Connections The IF interconnect cable transmits IF signals from the test set to the HP 85102 IF detector.

Test Port Connectors Port 1 and Port 2 are male, NMD-2.4 mm connectors, and mate to female 2.4 mm connectors. Anti-Rotation Clamps Use the anti-rotation clamps (item 5, Figure 2-1) to stabilize the test port or RF cable at the

Check the test-set line module (see item (1) in Chapter 3, Figure 3-2 of this manual). It must be set for the correct voltage in your region. Refer to Chapter 5, “Troubleshooting” of this manual for information about changing the voltage selection or replacing the line fuse.

• After setting or confirming the line-voltage module, connect the test set power cord to an electrical outlet.

• Attach the HP 8517B IF-interconnect cable from J11 TEST SET INTERCONNECT (on the test set’s rear panel) to J1 TEST SET INTERCONNECT on the rear panel of the HP 85102 IF detector.

• Attach the system bus cable from HP 8517B J12 HP 8510 SYSTEM BUS connector to HP 8510C INTERCONNECT on the HP 85101 display/processor.

The test set IF interconnect cable and the system bus cable transmit control signals between the test set and the network analyzer.

• Attach one end of the 2.4 mm RF cable (item 9 or 10, Figure 2-1) to the RF output on the rear panel of the HP 83651 Synthesized Sweeper.

• Attach the other end of the RF cable to the RF input on the HP 8517B Test Set.

connection, or to stabilize an adapter at the connection.

• Connect test port cables or adapters to the test ports.

• Torque the connections to 90 N-cm (8 in lb).

• Loosen the anti-rotation clamp thumb screw enough to slip the clamp over the cable and up to the front panel. The clamp end with the flats should come to rest on the flats of the test port shoulder.

• Finger-tighten the thumb screws to prevent further loosening or tightening of the test port/RF cable connection. Refer to Chapter 3, “Operation” of this manual for additional information.

Replacing O-Rings in Anti-Rotation Clamps

The anti-rotationclamp’s internal O-ring is a field-replaceable part. There is no need to disassemble the anti-rotation clamp.

When the O-ring no longer holds the RF cable securely, replace it by following the instructions in Chapter 6, “ Replacement Procedures.”

2-6

HP 8517B S-Parameter Test Set Manual

Installation

Packaging the Test Set

To repackage the test set, use its original factory packaging. Refer to the test set using its complete model and serial numbers in any

correspondence to an HP Sales and Service Office. Containers and materials identical to those used in the original shipment by

the factory are available through Hewlett-PackardSales and Service Offices. However, commercially available, comparable packaging materials may be used, also.

1. Wrap the test set in heavy paper or anti-static plastic.

2. If you are shipping the test set to an HP Sales or Service office, complete and attach a service tag (located in the HP 8510C manual set).

3. Use sufficient shock absorbing material on all sides of the test set to provide a thick, firm cushion and prevent movement.

4. Seal the shipping container securely and mark it “FRAGILE.”

HP 8517B S-Parameter Test Set Manual

2-7

Installation

Packaging the Test Set

2-8

HP 8517B S-Parameter Test Set Manual

Operating the HP 8517B Test Set

This chapter contains illustrations and descriptions of the HP 8517B frontand rear-panel features. Information about operating multiple test sets (Option 001) is also provided.

Front-Panel Features

Figure 3-1 Front-Panel Features of the HP 8517B Test Set

Table 3-1 Front-Panel Description

(1) Line Switch This switch turns the test set on or off. When the side of the switch labeled “0” is depressed, the

test set is OFF; when the side labeled “1” is depressed, the test set is ON. (2) Line LED This LED is lit when the test set line switch is ON and not lit when the test set line switch is OFF. (3) Active LED This LED lights about two seconds after power is turned on, following the successful conclusion of

the self-test. If the test set is used with other test sets (Option 001) and is not addressed by the HP

8510C, then this light remains off. (4) Port 1 This test port transmits RF energy from the source to the DUT and receives reflected or transmitted

RF energy from the DUT. The reflected RF energy is coupled to a sampler within the instrument.

Connections made to this input must be torqued to 90 N-cm (8 in-lb), and no more. (5) Bias Fuse The fuses that limit bias applied to Port 1 and Port 2 are located in these holders (see the

instrument front panel or the replaceable parts list for the fuse values).

HP 8517B S-Parameter Test Set Manual

3-1

Table 3-1 Front-Panel Description (Continued)

(6) a1 LED This LED indicates that the test set is internally switched to the S11 or S21 mode and source power

is switched to Port 1. (7) a2 LED This LED indicates that the test set is internally switched to the S

is switched to Port 2. (8) Port 2 This test port transmits RF energy from the source to the DUT and receives reflected or transmitted

RF energy from the DUT.

or S12 mode and source power

Rear-Panel Features

Figure3-2 Rear-Panel Features of the HP 8517B Test Set

Table 3-2 Rear-Panel Descriptions

(1) Line Module Houses the line cord connector, line fuse and line voltage selector. Pull out the right side

of the line module cover to replace or change the fuse or to change the voltage selection. Remove the voltage selector drum to rotate it to a different voltage setting. Recommended fuse values are printed on the rear panel.

(2) RF Input A 2.4 mm connector that receives RF energy from the source. Connections made to this

input must be torqued no more than 90 N-cm (8 in-lb).

(3) J10 Test Set Interconnect Used only in test sets with Option 001. It allows connecting another test set to the option

001 test set. Up to four test sets can be serially connected to the analyzer. The HP 8510C system automatically selects the IF output from the chosen test set for processing and display. Refer to “Controlling Multiple Test Sets” in this chapter for more information.

(4) J11 Test Set Interconnect Transmits the IF signal from the test set to the HP 85102 IF detector. It also transmits

control signals bi-directionally.

(5) HP 8510 System Bus Address Switch A five-pole binary-weighted switch sets the test-set’s system bus address. The binary

weight of each pole is indicated on the rear panel. So are the On and Off positions. The default setting is decimal twenty (off-off-on-off-on, from left to right).

HP 8517B S-Parameter Test Set Manual

3-2

Table 3-2 Rear-Panel Descriptions (Continued)

(6) J12 8510 System Bus Connector Used for HP-IB communications with the HP 85101 display/processor. (7) Port 2 Bias A female BNC connector used to supply bias through the center conductor of Port 2 to

active devices under test.

(8) Port 1 Bias A female BNC connector used to supply bias through the center conductor of Port 1 to

active devices under test.

Controlling Multiple Test Sets

HP 851X Series, Option 001 test sets allow an HP 8510C to alternately control up to four test sets connected to it. For example:

• While a measurement is underway on test set number 1 (equipped with

Option 001), a test device can be connected to test set number 2 (which does not need Option 001).

• When the measurement on test set number 1 is complete, the HP 8510C

can then control test set number 2.

In a standard test set, the 20 MHz IF and control signals are applied directly to J11 TEST SET INTERCONNECT, which is attached to the HP 8510C.

Option 001 adds a set of IF switches, control switches, and the J10 TEST SET INTERCONNECT attachment. This configuration allows the selection of the 20 MHz test set IF signal.

As shown in Figure 3-3 on page 3-4, test set number 1 can:

• apply its IF signal to the HP 8510C, or it can

• switch to pass the IF signal from test set number 2, through J10 TEST

SET INTERCONNECT, and into the HP 8510C.

HP 8517B S-Parameter Test Set Manual

3-3

Figure 3-3 RF and IF Switching with Two Test Sets

Table 3-3 RF and IF Switch Settings in Figure 3-3, Above

New ADDRESS of Test Set

20 Number 1 Port 1 21 Number 2 Port 2

1. Not all system connections are illustrated.

2. In dual source configurations, the second source may be multiplexed in a similar manner. If only one

1, 2

dual source test set is used, the second source may be connected directly to the appropriate test set.

Test Set Number Selected

Coaxial Switch Port Selected

HP 8517B S-Parameter Test Set Manual

3-4

Multiple Test-Set Connections

For dual test-set configurations, set each rear panel address switch on each test set to the address shown in Figure 3-3. Refer to Figure 3-4 on page 3-7 for the configuration of two or more test sets.

• Use the supplied test set interconnect cable to attach test set number 1,

J11 to the network analyzer.

• Use the supplied test set interconnect cable to attach test set number 2,

J11 to test set number 1, J10.

You may connect up to four test sets in a series if the total length of all test set interconnect cables does not exceed 13 meters (about 40 feet). The last test set connected in the chain does not require Option 001.

If the RF coaxial switch is not incorporated into the system, the RF input to the test set must be manually switched to the active test set.

Initialization at Power-Up

At power-up, configure the IF switches so that only one system test set is active. T o verify which test set is active, use the following steps:

1. Verify that all system test set LEDs are lit.

2. View the network analyzer’s test set address by pressing the INSTRUMENT STATE, address of the test set is displayed on the screen.

The address displayed must match the address of the test set selected. If not, enter the correct address using the network analyzer’s key pad.

3. If an unselected test set’s LEDs are lit, deactivate it. Do this by entering its address, pressing

[x1]

followed by

[LOCAL]

[x1]

, t hen entering the address of the test set desired,

key, then press

{TEST SET}

The HP-IB

Selecting a Test Set To select another test set, follow the procedure in Table 3-4 on page 3-6 of

this chapter.

HP 8517B S-Parameter Test Set Manual

3-5

Table 3-4 Selecting a Test Set When Multiple Units are Configured

Test Set IF Switching A test set is selected via the built-in capability of the analyzer to generate an addressed

command to each test set. Each time you change the function (refer to LOCAL [MENU] in the network analyzer does the following:

HP 8510C Operation and Service Manual

• switches the IF signal of the previously addressed test set to external

• switches the IF signal of the newly addressed test set to internal

• sets the test set’s front panel ACTIVE LED to indicate test-set status

• applies the active test set’ s IF signals directly to J11 T EST SET INTERCONNECT

• passes the inactive test set’s IF signals at J10 through to J11 and on to the next test set or to the network analyzer

Test Set Addressing You can change the test set address via program control, or via the network analyzer front

panel keys. You must also change the mechanical switches on the test-set’s rear panel. Here’s how:

1. Change the test set address via the network analyzer keys; a. On the analyzer’s front panel, press the INSTRUMENT STATE [LOCAL] key, then

{TEST SET}

press

b. Using the key pad, enter the desired address for the test set, then press [x1]. The new

HP-IB address appears on the display.

2. Change the test set address via the HP-IB command:

. The test set’s address appears on the display.

From the controller, enter the HP-IB ADDRESS; command, followed by the address value. Refer to the command reference for programming details.

3. Reset the mechanical switches on the test-set’s rear panel. Set the switches to match the new HP-IB address displayed on the network analyzer screen.

{HP-IB ADDRESS} {TEST SET}

), the

RF Switch Driver Control When the

generates a code sequence. The code sequence is automatically issued across the HP 8510C system bus to the device at the ADDRESS of RF SWITCH .

In the recommended configuration, the device is an HP 11713A attenuator/switch driver. The switch/driver in turn controls one or more coaxial switches. These switches, (shown in a Figure 3-3, and Figure 3-4) are used to choose which test set receives the RF output from the network analyzer source.

The exact command issued depends upon the new value of the

{TEST SET}

{HP-IB ADDRESS} {TEST SET}

value, also shown in shown in a Figure 3-3 and Figure 3-4.

function is changed, the network analyzer

{HP-IB ADDRESS}

HP 8517B S-Parameter Test Set Manual

3-6

Figure 3-4 RF and IF Switching with Four Test Sets

Table 3-5 Coaxial Switch Settings for Figure 3-4, Above

New ADDRESS of Test Set

20 1 Port 1 Port 1 21 2 Port 1 Port 2 22 3 Port 2 Port 1 23 4 Port 2 Port 2

1. Not all system connections are shown.

2. In dual source configurations, the second source can be multiplexed in a similar manner.

3. If only one dual source test set is used, the second source can be directly connected to the

1, 2, 3

appropriate test set.

Test Set Selected

1, 2, 3

Coaxial Port Selected with Switch #1

Coaxial Port Selected with Switch #2

HP 8517B S-Parameter Test Set Manual

3-7

Measurement Calibration

After selecting the active test set, complete the system calibration procedure as usual. When you select a different test set, make sure that you recall the cal set that applies to that test set.

NOTE

Since the cal-set limited instrument state does not include the number of the active test set, a cal set which does not apply to the current test set can be turned on without displaying the HP 8510C caution messages. However, this causes errors in the data displayed because incorrect error coefficients are applied to the measured data.

For convenience, store a hardware-state file and an instrument-state file for each combination of test set to cal set. You may also store your hardware state file on a tape or disk for future use.

To change the configuration, recall the appropriate hardware state file. The hardware state file:

• sets the address of test set

• issues the RF switch c ommand, then

• recalls the appropriate instrument state file which

• recalls the cal set

HP 8517B S-Parameter Test Set Manual

3-8

Measuring High-Power Devices with Option 004

The HP 8517B, Option 004 test set enables devices with output power up to 30 dBm (1 watt) to be measured at Port 2, without adding external attenuators. Reverse dynamic range (S

When measuring devices having greater than +17 dBm output power, you must use the Port 2 step attenuator to decrease the power to

The step attenuator has to be set during calibration for the value needed during device measurements. However, this setting may cause inadequate power level during calibration. Refer to “Changing Signal Path States After System Calibration” on page 3-10 for additional information.

) degrades by approximately 3 dB.

≤+17 dBm.

HP 8517B S-Parameter Test Set Manual

3-9

Changing Signal Path States After System Calibration

Changing an internal attenuator or any external equipment after completing the calibration means the measurement results cannot be specified.You must use your own estimation of the potential error contribution due to the change.

For example, when the port attenuation is changed with correction ON, the message whether the error is tolerable in the particular application and how to compensate for the change.

The application question is: “Does increasing the signal level during calibrationimprovethe calibration enough to risk a possible increase in error contributions when you change the setup?”

The only reason for changing an internal attenuator or external equipment between calibrations and measurements is to maximize the signal level under both conditions, thus minimizing uncertainty due to noise.

CAUTION: CORRECTION MAY BE INVALID displays. You must judge

Changing the Test Port Attenuators

Many factors enter into a setup-change decision, for example:

• is it more accurate to calibrate at a low signal level without changing the

setup, or

• is it more accurate to change the setup to optimize levels for both the

calibration and measurement

Changing attenuators at Port 1 or Port 2 does not change the test set mismatch, directivity, or isolation characteristics severely. It does change the frequency response magnitude and phase, however. The difference between frequencyresponsecalibrationand measurement can be normalized by using HP 8510C trace memories.

If only the attenuators at Port 1 or Port 2 are changed, use the following procedure to minimize errors:

1. Connect a short, or a thru, and set Port 1 and Port 2 attenuators for the best IF signal levels during calibration.

2. Perform the appropriate measurement calibration.

3. Connect the correct calibration standard, set Port 1 and Port 2 attenuators to the value required for operating the test device.

HP 8517B S-Parameter Test Set Manual

3-10

If you view the response of a short circuit, notice that:

Storing Trace Memories

• Changing Port 1 attenuator has negligible effect on S

• Changing Port 2 attenuator has negligible effect on S

marker reading

This is due to the way the attenuators are paired. Both the reference and the test signal are changed by approximately equal amounts.

When viewing S

or S12, however, changing Port 1 or Port 2 attenuators

offsets the marker reading by the difference value between Port 1 attenuator and Port 2 attenuator.

To compensate for the main frequency response effects due to changing the attenuators, use the HP 8510C trace memories and trace mathematics function, as explained below:

1. Connect the thru used for calibration and set the port attenuators to the value used for device measurement.

2. Recheck the user parameter levels, then press PARAMETER [

3. Press MENUS

DISPLAY:

Press

[DISPLAY]

{DATA-->MEMORY n}

,then

{DATA AND MEMORIES}

to store the S21trace in default trace

memory 1. This trace represents the frequency response difference between the S

signal path calibration and the measurement.

Viewing Normalized Parameters

[S12]

4. Press PARAMETER

{SELECT DEFAULTS} {DEFAULT to MEMORY: 2}

{DATA-->MEMORY 2}

, then press the following DISPLAY: menu keys:

The S12trace is now stored in trace memory 2. This trace is the frequency response difference of the S

signal path between calibration

and measurement.

Use the traces stored in memory 1 and memory 2 to normalize the corrected data to the new levels after the attenuation is changed. The next example uses normalization for S

1. Press MENUS

[DISPLAY]

2. Press PARAMETER

3. Press PARAMETER

4. Press PARAMETER

{SELECT DEFAULTS}

or S

[S11] [S22] [S21]

only. To view the corrected parameters:

12,

,then

{DATA AND MEMORIES}

and view the S11measurement. and view the S22measurement.

, then the following DISPLAY: menu keys:

{DEFAULT to MEMORY: 1} {MATH ( / ) }

HP 8517B S-Parameter Test Set Manual

3-11

5. View the S21measurement. If the thru is connected, the transmission coefficient should be 1

6. Press PARAMETER

{SELECT DEFAULTS} {DEFAULT to MEMORY: 2}

∠0°.

[S12]

, then press the following DISPLAY: menu keys:

7. Press PARAMETER connected, the transmission coefficient should be 1

Normalization is turned OFF for S

[S12]

to view the S12measurement. If the thru is

∠0°.

and S22measurements. Then the

appropriate memory is selected and normalization is turned on to view S and S12.

Since these are accurate, repeatable attenuators, this sequence may be effective in your application. If other parts of the test must be changed, especially components connected to the test ports, this procedure may require additional steps to adequately compensate for the changes.

HP 8517B S-Parameter Test Set Manual

3-12

Making Operational Checks

To check the operation of multiple test-set configurations, do the following:

1. Connect a device with a known response to test set number 1. Press the following HP 8510C front-panel keys:

INSTRUMENT STATE AUXILIARY MENUS

{HP-IB ADDRESSES} {TEST SET}

2. When the message TEST SET HP-IB ADDRESS appears, enter address of test set number 1, then press

[LOCAL]

[SYSTEM]

[20]

[x1]

. The measurementtrace from

,the

test-set number 1 should display.

3. Store the trace in memory by pressing the following keys: MENU

{DATA AND MEMORIES} {DATA --> MEMORY n}

DISPLAY

4. Next, enter the HP-IB address of test s et number 2, followed by re-enter the address of test set number 1 followed by

[DISPLAY]

: {DATA and MEMORY]

[x1]

,then

5. Repeat the above procedure for each of the other test sets in the system.

Observe any difference in the response between the stored trace and the results trace by switching back and f orth between the test sets.

Any differences in data that you suspect are due to the IF switch (Option

001) or to RF switching, must be checked out. Refer to Chapter 5,

“Troubleshooting the Test Set” in this manual.

HP 8517B S-Parameter Test Set Manual

3-13

Performance Verification

Standard system performanceverification procedures verifythe operationof an Option 001 test set used as test set number 1.

To verify the performance of a different test set in the configuration, enter its HP-IB address (as explained in “Making Operational Checks” on page 3-13) to select it, then continue with this procedure.

Refer to the HP 8510C On-Site Service Manual for its performance verification procedure.

HP 8517B S-Parameter Test Set Manual

3-14

Using Anti-Rotation Clamps

During the performance verification procedure, use anti-rotation clamps to secure RF connections at the test ports of each test set. While installed, each clamp stabilizes the connector on RF cable to the large nut on the test set’s RF test port. I f an adapter is used, the clamp stabilizes the adapter to the front panel RF port connector.

Without these clamps, the test port connections can loosen when a device under test is moved. As a result, the loosening can invalidate calibrationsand measurements.

NOTE

These instructions refer to an installation using HP RF cables. However, the anti-rotation clamps may also be used with front panel adapters. Adapter installations are similar. There are two anti-rotation clamps included in the test set accessories box.

Attach the first clamp

Remove one anti-rotation clamp from the accessories box. Loosen its thumb-screw until it is nearly freed from the counter-sink socket in the clamp body. The clamp is shown as item (5) in Figure 2-1, “Accessories Supplied with the HP 8517B Test Set.”

1. Gently push the clamp (round-hole end first) over and past the RF cable connector to be used.

2. Fit the rubber O-ring in the round end of the clamp over the connector.

If the O-ring is not snug or is damaged, refer to the Chapter 6, “Replacement Procedures” for instructions about replacing the internal O-ring.

3. Wiggle the clamp to ease it over the connector.

NOTE

4. Attach the cable to the test port and tighten it as specified in the cable manual.

Do not twist the cable as you attach it to the test port.

Use the torque wrench supplied with your calibration kit to tighten the cable to 90 N-cm (8 in-lb). Do not over-torque the connection. See Figure 3-5.

HP 8517B S-Parameter Test Set Manual

3-15

CAUTION

Important! The test set RF connector becomes loosened easily. Hold the RF cable securely throughout the remainder of this procedure. Do not allow the cable to rotate.

Figure 3-5 Using a Torque Wrench Correctly

Positioning the thumb-screw

See Figure 3-6. Position the clamp so the thumb-screw is positioned at the top of the clamp.

• Turn the clamp to visually align the clamp flats with the flats on the test

port connector nut.

• This positioning minimizes rotating the connector in the procedure step.

HP 8517B S-Parameter Test Set Manual

3-16

NOTE

The flats may actually be in any orientation, with respect to the front panel.

Figure 3-6 Visually Aligning Clamp and Nut Flats

Positioning the connector

See Figure 3-7. Maneuver the clamp over the RF connector and onto the test port connector.

1. Hold the test cable with one hand. Use the other hand to press the clamp gently and steadily, as you wiggle it into position straight over the RF connector and onto the test port connector nut.

NOTE

Be sure to loosen the clamp when you are slipping it over the connector.

2. Fit the internal flats in the clamp over the flats on the test port connector nut.

3. Avoid rotatingthe clamp as you position it so the RF connection remains tight (remember it loosens easily).

Figure 3-7 Mating the Clamp and Nut Flats

HP 8517B S-Parameter Test Set Manual

3-17

Operating the HP 8517B Test Set

Using Anti-Rotation Clamps

Aligning the thumb-screw

See Figure 3-8. Ensure that the thumb-screwis aligned with the counter-sink hole on the clamp’s body.

1. Push the clamp toward the test set front panel.

2. Finger-tighten the thumb-screw. The cable cannot be damaged if the thumb-screw is tightened too tightly.

Figure 3-8 Aligning the Thumbscrew With the Counter-Sink Hole

Attaching the second clamp

To complete the anti-rotation clamp installation, repeat the steps above, beginning at step 1 to attach the second clamp.

3-18

HP 8517B S-Parameter Test Set Manual

-1

Specifications

Specifications describe the warranted performance of the instrument. The electrical specifications of the test set when used with an HP 8510 network analyzer, are defined in the HP 8510C On-Site Service Manual.

Mechanical Specifications

Table 4-1 HP 8510/HP 8517B Mechanical Specifications

Test Port Description Specification

Connector Type:

Precision, rugged male test-port connector Center Pin Recession

1. Precision rugged make test-port connector.

2. Refer to the calibration kit manual to learn about measuring the pin depth.

2.4 mm

+0.00254 mm to +0.0178 mm +0.0001 inches to +0.007 inches

Supplemental Characteristics

Supplemental characteristics listed in Table 4-2 provide useful information by giving typical, but non-warranted, performance parameters.

Table 4-2 HP 8510/HP 8517B Supplemental Characteristics

Front Pa nel Test Ports

Connector type precision 2.4 mm, male Connector torque 90 N-cm (8 in-lb), maximum

Ω,

Impedance 50 Damage-input level

DC bias 500 mA, 40 Vdc, maximum Nominal source operating power level

Nominal connector-nut size 20 mm

nominal

At Port 1 and Port 2 At Port 2 with Option 004:

2 dBm to –20 dBm,

with flatness correction off, depending on frequency

: +17 dBm CW, RF

30 dBm CW (1 watt) CW, RF

HP 8517B S-Parameter Test Set Manual

4-2

Specifications

Table 4-2 HP 8510/HP 8517B Supplemental Characteristics (Continued)

Rear Panel RF Connectors

Connector type precision 2.4 mm female Recommended connection torque 90 N-cm (8 in-lb), maximum for precision-2.4 mm hardware Damage input level 15 dBm Nominal connector-nut size 8 mm

User 1 Power Levels for Reference Channel Phase Lock

Minimum power level –45 dBm Maximum power level –10 dBm to –20 dBm, depending on frequency

HP 8517B Power Requirements and Physical Characteristics

Operating temperature range 0° C to 55° C Input Power (AC) 110, 120, 220, or 240 Vac, ±10%

Line frequency from 47 to 66 Hz

Dimensions 460 mm (High) × 133 mm (Wide) × 609 mm (Deep)

(18.1 inches H

Weight 15 kg (35 lb), net

1. This must be AC coupled.

5.25 inches W × 24 inches D)

4-3

HP 8517B S-Parameter Test Set Manual

Specifications

HP 8517B S-Parameter Test Set Manual

4-4

Troubleshooting the Test Set

The troubleshooting strategy for the HP 8517B S-Parameter test set is a systematic sequence of procedures. The information may be used after system-level troubleshooting has identified the test set as the problem instrument.

Use the troubleshooting flowchart in Figure 5-2 to help isolate the faulty assembly. Notice procedure numbers within some of the flow diagram blocks. These are keyed to troubleshooting procedures. Perform the numbered procedure associated with each block as you progress through the chart.

Refer to the block diagrams, located at the end of this section, to help you understand the test set’s operation.

HP 8517B S-Parameter Test Set Manual

5-1

Troubleshooting the Test Set

Theory of Operation

RF paths for Port 1 and Port 2 are similar. This section discusses in detail the source power signal, as it is routed via the RF IN connector, through the test set, and to Port 1 for S

and S21measurements.

Figure 5-1 Standard HP 8517B RF Block Diagram

TheRFSourcePower • RF source powerenters the test set through the rear panel. The RF power

is applied to the switch/splitter (A18).

• At the switch/splitter, the power is attenuated by approximately 7 to

14 dB, depending upon frequency.

• The switch/splitterreceivesitscontrol signals from the attenuator/switch

driver board (A5).

• The switch part of t he switch/splitter, which is a combination of two

power splitters and a solid-state switch, selects the power splitter to use and, therefore, the test port to receive the RF power.

• LEDs on the front panel and on the attenuator/switch driver board (A5)

indicate which test port is active.

5-2

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Theory of Operation

The Reference Signal Path

• The reference signal is routed from the switch/splitter through the

20-7 dB tapered pad (AT1) t o attenuate any VTO feed-through signals.

• The signal is then applied to A10, the a1 sampler assembly, where it is

down-converted to a 20 MHz IF (intermediate frequency).

• Because the RF power is being routed to Port 1, the a1 IF signal is used

to phase lock the network analyzer. Had the RF power been routed to Port2,thea2IFsignalwouldhavebeenusedtophaselockthenetwork analyzer.

The Test Signal Path • The test signal is routed from the switch/splitter (A18) to the 60 dB

programmable attenuator (A16) for Port 1.

• The signal may then be attenuated in 10 dB steps or passed through

without attenuation to Port 1 bias tee (A7).

• A bias supply t o provide dc voltage to Port 1 bias tee can be connected

to J8 on the rear panel of the test set, also.

• The RF signal rides this dc level which is used to turn active devices on

(bias ON) so their S-parameters can be measured.

• Beyond the bias tee, the test signal travels to the directional coupler

(A6).

The S11and S

Measurements

The Sampler Control Switching

• At the coupler, the incident RF power is applied to the device under test.

• The signal reflected from the DUT is separated from the signal incident

to the DUT by the Port 1 coupler (A6).

• The reflected signal exitsthe coupler and is applied to b1 sampler (A12),

then is down-converted to a 20 MHz IF signal.

• The S

samplers.

measurement is the ratio of the two IF signals from a1 and b1

• The incident signal is transmitted through the DUT, through Port 2

coupler, then into b2 sampler (A13).

• The incident signal is down-converted to a 20 MHz IF so S

measured. S

is the ratio of the two IF signals from samplers a1 and b2.

can be

• The samplers m ay be turned on and off, depending upon the parameter

being measured.

• Sampler switching is controlled bya microprocessor on the HP-IB board

assembly (A4). The default condition (test set power ON and no HP-IB commands sent by the network analyzer) is for the test set to be active with the RF signal applied to Port 1.

HP 8517B S-Parameter Test Set Manual

5-3

Troubleshooting the Test Set

Theory of Operation

• If the test set is equipped with Option 001 (multiple test set capability),

its begin state is inactive. That is, rather than using the test set’s internal IF, a switch is set in the test set to accept an IF from another test set.

The LO Signal Control The LO, generated by A14 VTO/driver, is phase locked to the source so the

desired VTO harmonic is 20 MHz greater than the source frequency. The phase-locked loop includes:

• Portions of the test set, such as the VTO summing-amp board (A3), the

VTO/driver (A14), and the a1 sampler assembly (A10), and

• The HP 8510C Network Analyzer

The VTO summing-amp board (A3) provides control voltages to tune the VTOtothecorrectLOfrequency.

The VTO also has an output LENDRA (Low END of RAnge) which is routed via the test set interconnect cable, to the HP 85102.

CAUTION

The LENDRA provides an indication to the network analyzer about whether or not the VTO is operating within its normal frequency range.

If the VTO exceeds its normal frequency range, the network analyzer displays the running error message

Electrostatic Discharge Sensitive (ESD) Assemblies

Assemblies you might handle in these troubleshooting procedures are extremely sensitive to damage from static electricity. They may or may not continue to function if they are subjected to electrostatic discharge. Their reliability, however, will be impaired.

VTO OVER RANGE.

5-4

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Sequence

Use this troubleshooting flowchart, along with the procedures in the followingsection, to help isolate faulty assemblies.

Figure 5-2 Troubleshooting Flowchart

HP 8517B S-Parameter Test Set Manual

5-5

Troubleshooting the Test Set

Troubleshooting Sequence

Equipment Needed But Not Supplied

Table 5-1 Equipment Required, But Not Supplied

Gather the equipment listed in Table 5-1 to use for troubleshooting the test set (these items are not supplied with the instrument at shipment).

Equipment Type HP Part Number

1-point, Pozidriv screwdriver 8710-0899 2-point, Pozidriv screwdriver 8710-0900 Service adapter 85105-60210 5/16-inch torque wrench 8710-1655 Oscilloscope HP 1740A

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HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

The troubleshooting procedures in this chapter are listed below:

• “A15 Primary Regulator Board Assembly” on page 5-7

• “A27 Post-Regulator Board Assembly” on page 5-7

• “Self-Test Indicators” on page 5-9

• “HP 85102 IF Amplifier Test” on page 5-12

• “Unratioed Power Test” on page 5-14

• “HP 8517B, Option 007 Unratioed Power Test” on page 5-20

• “Finding the Faulty Assembly” on page 5-23

A15 Primary Regulator

Board Assembly

Table 5-2 Power Supply Voltages to A15

A27 Post-Regulator Board

Assembly

Table 5-3 Power Supply Voltages to A27

Use a digital voltmeterto check the voltages and an oscilloscope to check for a maximum ripple level as listed in Table 5-2.

Nominal Voltage Test Point Voltage Range Maximum Ripple

Peak-to-Peak

+5.05 Vdc A15TP1 +4.75 to +5.25 2 mv –5.20 Vdc A15TP2 –4.90 to –5.50 2 mv +14.85 Vdc A15TP3 +14.10 to +15.60 2 mv –14.85 Vdc A15TP6 –14.10 to –15.60 2 mv

(Option 007, Only) Use a digital voltmeter to check the voltages and an

oscilloscope to check for a maximum ripple level as listed in Table 5-3.

Nominal Voltage Test Point Voltage Range Maximum Ripple

Peak-to-Peak

+5.0 Vdc A27TP1 +4.75 to +5.25 2 mv

–3.50 Vdc A27TP2 –3.26 to –3.75 2 mv

HP 8517B S-Parameter Test Set Manual

5-7

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-3 PowerSupply Fuses and Test Points

HP-IB Address Switch The HP-IB address switch is located on the rear-panel of the instrument. It is

easy to access, but unnecessary to change unless the error message

BUS ADDRESS ERROR appears on the system display.

To set the HP-IB address switch, position the switches as illustrated in Figure 5-4 (the LSB is on the left-hand side; the MSB is on the right-hand side). The default setting is decimal twenty, or binary 10100 as read from right-to-left (on, off, on, off, off). In the drawing, the dark-side is selected.

5-8

HP 8517B S-Parameter Test Set Manual

SYSTEM

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-4 Instrument HP-IB Switch Setting

Fuse Location The fuse is located inside the line module at the rear panel of the test set. The

value rating and part number of the fuse is listed in Chapter 7, “Replaceable Parts” of this manual. Review the information in Figure 5-5 to replace the line fuse or to set the voltage selector cam.

Figure 5-5 Fuse and Voltage Cam Location

Self-Test Indicators If the front-panel ACTIVE LED (shown in Figure 5-6) fails to light within

five seconds after turning the power on, or if it lights immediately, the instrument has failed self-test.

To determine the portion of the self-test that failed, note which LEDs on A4 board assembly are turned on. Figure 5-7 shows the location of the LEDs. See Table 5-4 for the condition description of the LED status indicators.

HP 8517B S-Parameter Test Set Manual

5-9

Troubleshooting the Test Set

Troubleshooting Procedures

Figure5-6 The ACTIVE LED Location

If the Self-Test Fails to Run Properly

If the portion of memory holding the self-test program is faulty, the self-test will not run properly. If any of the following conditions occur, it indicates thattheA4HP-IBboardislikelytobefaulty.

• All LEDs flash briefly, then turn off

• All LEDs flash briefly and stay on

• The ACTIVE LED turns on too quickly after power on

• The ACTIVE LED does not turn on at all

5-10

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-7 HP 8518B Test Set, A4 Board Assembly LEDs

Table 5-4 Instrument Self-Test Indicator State Definitions

Self-Test Indication LSN TLK SRQ REM Time (Following Power-On)

PWON ON ON ON ON 0 to 0.5 seconds Start ROM Test OFF ON ON ON on briefly (a flash)

HP 8517B S-Parameter Test Set Manual

5-11

Troubleshooting the Test Set

Troubleshooting Procedures

Table 5-4 Instrument Self-Test Indicator State Definitions

Self-Test Indication LSN TLK SRQ REM Time (Following Power-On)

Pass ROM Test OFF OFF ON ON 0.5 to 0.2 seconds Start RAM Test OFF OFF OFF ON N/A Pass RAM Test OFF OFF OFF OFF after 2 seconds

HP 85102 IF

Amplifier Test

The service adapter can substitute as a test set by returning the 20 MHz IF signal from the HP 85102 to the amplifier on the HP 85102. Doing this determines whether a fault is in the test set or is in the HP 85102.

Figure 5-8 Service Adapter Connections

Using the Service Adapter

1. Connect the service adapter as shown in Figure 5-8. On the network analyzer, press:

INSTRUMENT STATE MENUS STIMULUS

{STEP}

PARAMETER

[MARKER]

[MENU]

[PRESET]

2. Examine each user parameter by pressing the

{USER 4 b1}

softkeys to observe unratioed power level traces at each

{USER 1 a1}

through

channel.

3. The traces should be flat lines, quite close to one another,as indicated by the marker value (typically about –28 dB,

5-12

HP 8517B S-Parameter Test Set Manual

±5dB).

Service Adapter Conclusions

Table 5-5 Results Observations

If all channels look good The HP 85102 is working properly. The problem is

If one or more channels look bad The problem is most likely in the HP 85102. Refer to

Troubleshooting the Test Set

Troubleshooting Procedures

most likely in the source or the test set. Refer to Procedure 4, “Unratioed Power Tests” in this chapter.

the HP 8510C On-Site Service Manual for information about troubleshooting the HP 85102.

HP 8517B S-Parameter Test Set Manual

5-13

Troubleshooting the Test Set

Troubleshooting Procedures

Unratioed Power Test

We will examine six RF signal paths in the test set by observing their associated IF signals. Figure 5-10 through Figure 5-15 show the test set traces (and simplified block diagrams) that are typical for RF paths 1 through 6.

Isolating Signal Path Problems

Figure5-9 Diagram of IF Signal Path

Determining the RF component in the test set that is most likely the cause of a failure can be accomplished within four steps:

1. Run the signal-path tests on paths 1 through 6 using the procedures on the following pages.

2. Record your test results in Table 5-6 for each path.

3. Compare the results in Table 5-6 with those in Table 5-7.

4. Investigate the most probable cause, based on the information in Table 5-7.

Testing Signal Paths 1-4

1. Set the network analyzer to its factory default settings by pushing the front-panel TEST switch.

2. Set the source for s tep mode. Press the network analyzer keys: INSTRUMENT STATE

STIMULUS

{STEP}

[MENU]

[PRESET]

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HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

3. To examine each sampler’s IF signal, redefine which port and sampler the network analyzer uses for the phase lock. Use the following steps:

a. Redefining to Port 2, sampler a2, press:



PARAMETER



{USER 3 a2}



{DRIVE}



DRIVE:



{PHASE LOCK}



{a2}



{REDEFINE DONE}

{PORT 2}

[MENU]

then

{REDEFINE PARAMETER}

Observe the resulting a2 IF trace on the display. b. Redefining to Port 2, sampler b2, press:



{USER 2 b2}



{DRIVE}



DRIVE:



{PHASE LOCK}



{a2}



{REDEFINE DONE}

then

{REDEFINE PARAMETER}

{PORT 2}

Observe the resulting b2 IF trace on the display.

NOTE

4. Connect an open (or short) to Port 1 and Port 2. Power is reflected back to b1 and b2 samplers through the coupler.

To check each sampler trace, press:



{USER 1 a1}



{USER 2 b2}



{USER 3 a2}



{USER 4 b1}

5. Record your results for paths 1 thru 4 (

{USER 1}to{USER 4}

)inTable5-6.

See Figure 5-10 for an RF signal-path 1 trace example. For Option 007, see Figure 5-13.

HP 8517B S-Parameter Test Set Manual

5-15

Troubleshooting the Test Set

Troubleshooting Procedures

TestingPaths5and6

1. Connect a cable between Port 1 and Port 2.

2. To observe the b1 power-level trace through path 5, press:



PARAMETER



{USER 4 b1}



{DRIVE}



DRIVE:



{PHASE LOCK}



{a2}



{REDEFINE DONE}

The b1 path signal is illustrated in Figure 5-12. Typically, each trace should resemble the examples in Figure 5-12, (

3. Record your results in Figure 5-6.

4. To observe the b2 power level t race through path 6, press:



PARAMETER



{USER 2 b2}



{DRIVE}



DRIVE:



{PHASELOCK}



{a1}



{REDEFINE DONE}

[MENU]

then

{REDEFINE PARAMETER}

{PORT 2}

[MENU]

then

{REDEFINE PARAMETER}

{PORT 1}

±5dB).

NOTE

The b2 path signal is illustrated in Figure 5-12. Typically, each trace should resemble the examples in Figure 5-12, (

±5dB).

5. Record your results in Figure 5-6.

Be sure that you return the parameters to their original conditions for a1, b1, a2, and b2. Use the redefine function to achieve this, or push the instrument TEST switch to restore factory default conditions.

5-16

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-10 RF Path 1 and Path 2, HP 8517B Standard Test Set

HP 8517B S-Parameter Test Set Manual

5-17

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-11 RF Path 3 and Path 4, HP 8517B Standard Test Set

5-18

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-12 RF Path 5 and Path 6, HP 8517B Standard Test Set

HP 8517B S-Parameter Test Set Manual

5-19

Troubleshooting the Test Set

Troubleshooting Procedures

HP 8517B, Option 007

Unratioed Power Test

Figure 5-13 through Figure 5-15 illustrate the signal path and trace display for the unratioed power tests on HP 8517B, Option 007 model test sets.

Figure 5-13 RF Path 1 through Path 4, HP 8517B Option 007 Test Set

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HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-14 RF Signal for Path 1 through Path 4, HP 8517B Option 007

HP 8517B S-Parameter Test Set Manual

5-21

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-15 RF Path 5 and Path 6, HP 8517B Option 007

5-22

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Finding the Faulty

Assembly

Compare the results recorded in Table 5-6 with the matrix in Table 5-7. There are 32 possible combinations, twelve of which point to probable failures. These are shown in Table 5-7.

Table 5-6 Test Results for Path 1 through Path 6

Path1

Path2

Path 3

Path 4

b1 thru

Path5

b2 thru

Path6

Sample Diagnostics Suppose you have determined that paths 3 and 5 are bad. Paths 1, 2, 4, and 6

are good. Refer to Table 5-7. Notice that the most likely cause for the failure is the b1 sampler.

Table 5-7 Most Probable Failures (Bindicates Bad;—indicates Good)

Path Most Probable Failur e

Path1

——————The HP 8517B test set is not the problem

B B B B B B The source, source cable, VTO, cables from rear

— B — B B — The switch splitter

B—B——BThe switch splitter

——B—B—b1 sampler

B—————a1 sampler —B————a2 sampler ———B—Bb2 sampler — — B — B B Port 1 connector or directional coupler ——B—B BA1, T1 ———B B —A2, T2 — — — B B B Port 2 connector or directional coupler

Path2

Path 3

Path 4

b1 thru

Path5

b2 thru

Path6

Assembly, or Description of Condition

panel to switch splitter

HP 8517B S-Parameter Test Set Manual

5-23

Troubleshooting the Test Set

Troubleshooting Procedures

5-24

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

The replacement procedures in this chapter are listed below:

1 “A18 Switch/Splitter Assembly” on page 6-5 2 “A14, A10 to A13 Frequency Converter Assembly” on page 6-5 3 “A15 Regulator Board Assembly” on page 6-6 4 “C1 to C4 Filter Capacitors” on page 6-6 5 “2.4 mm Test Port Connectors” on page 6-7 6 “Fan Assembly Replacement” on page 6-8 7 “T1 Power Transformer” on page 6-8 8 “Anti-Rotation Clamp O-Ring Replacement” on page 6-10 9 “A1 Front Panel and Interface Board Assembly” on page 6-10 10 “A7andA9BiasTees”onpage6-11 11 “A6 and A8 Test Port Couplers” on page 6-11

CAUTION

12 “A16 or A17 Port Attenuators” on page 6-11 13 “A22 Input Amplifier Assembly” on page 6-12 14 “A23 to A26 Buffer Amplifiers” on page 6-12 15 “A27 Post Regulator Board Assembly” on page 6-13

To preventelectrostatic discharge(ESD) damage, earth ground the work area and yourself. Some of the assemblies being handled in the following procedures are very sensitive to damage resulting from static discharges. Assemblies exposed to ESD may or may not continue to operate properly. Their reliability, however , will be degraded. Refer to Figure 6-1 for ESD-safe workstation recommendations.

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HP 8517B Test Set Replacement Procedures

Figure 6-1 ESD-Safe Workstation Configuration

Performance Tests

Performance test information and procedures are located in Chapter 8 of the HP 8510C On-Site Service Manual.

Note that the HP 8510C performance test software (shipped w ith the test set) is required to test the test set. The results generated during the HP 8517B performance-testare based on its operation as part of the HP 8510C system. The HP 8510C includes the test set, cables, calibration kit, and so forth.

Adjustments

The HP 8517B Test Set has no adjustments. Specifically, no attempt should be made to adjust the samplers.

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HP 8517B Test Set Replacement Procedures

Equipment Needed But Not Supplied

Table 6-1 lists the equipment needed to replace the assemblies documented in the following procedures. See Figure 6-2 to locate the test set assemblies.

Table 6-1 Replacement-Procedure Tools Needed

Tools Used for Procedure: HP Part Number

2 point Pozidriv screwdriver all components 8710-0900 1 point Pozidriv screwdriver all components 8710-0899 5/16 inch torque wrench, 90 N-cm (8 in-lb) all components and 3.5 mm semi-rigid cables, 2.4/1.85

mm cables 5/16 inch torque wrench, 112 N-cm (10 in-lb) HP 8516A 2.4 mm semi-rigid cables 8710-1655 1/2 inch torque wrench, 280 N-cm (25 in-lb) 7 mm, 2.4 mm, 1.85 mm test port connectors 8710-1581 9/16 inch torque wrench, 470 N-cm (42 in-lb) HP 8517B rear panel 2.4 mm connectors 8710-1580 20 mm torque wrench, 90 N-cm (8 in-lb) 2.4 mm and 1.85 mm test port connectors 8710-1764

2.9 mm gage kit port connectors Part of HP 85056A Cal Kit anti-static mat all components 9300-0797 wrist strap all components 9300-1257 clip lead C1-C4 capacitors any supplier needle nose pliers couplers any supplier wire cutters couplers, B1 fan any supplier T-10 Torx screwdriver all components 8710-1623 T-15 Torx screwdriver all components 8710-1622 9/16 inch 50 in-lb torque wrench test ports 8710-1948 9/16 inch nut driver connector repair 8720-0008

8710-1765

1/2 inch torque wrench, 280 N-cm (25 in-lb) connector repair 8710-1581

Ω

, 20 watt resistor C1-C4 capacitor removal 0819-0019

100 1 inch torque wrench, 800 N-cm (72 in-lb) coupler removal and test port connector flange removal MTB 100 72 lb-in E 5/16 inch open end wrench fan replacement and test port connector removal any supplier 1/2 inch open-end wrench RF input connector any supplier 1/2 x 9/16 inch thin wrench, fixed Test port connector removal 8710-1770 5/16 inch thin wrench 3.5 mm, 2.4 mm, 1.85 mm semi-rigid connector

removal

1. Order from Mountz Company, 1080 North 11th Street, San Jose, CA 95112, phone (408) 292-2214, or contact Mountz through the

internet at http://www.mountztorque.com/html/home.htm

8710-2079

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HP 8517B Test Set Replacement Procedures

Figure 6-2 HP 8517B Major Assembly Location Diagram

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HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Initial Precautions Before beginning any of the procedures in this chapter, do the following:

1. Turn off the HP 8517B test set.

2. Disconnect the test set’s power cord.

3. Remove the top- and side-covers, trim strips, and handles.

4. Do not exceed the maximum torque necessary to secure a connector. Refer to Table 6-1 for torque specifications.

5. Exercise caution with semi-rigid cables; they can be bent very easily.

6. Reverse an assembly’s removal procedure for reinstallation, unless otherwise instructed.

Switch/Splitter Replacement

Frequency Converter Replacement

A18 Switch/Splitter Assembly

1. See Table 6-2 for component locations.

2. Remove the five semi-rigid cables and the three flexible cables from the switch/splitter. (Reposition cables as required to ease removal.)

3. Remove the two fixed attenuators from the switch/splitter (note that there are three fixed attenuatorsin Option 007, and in Option 004 “plus”

007).

4. Remove the two screws that attach the switch/splitter to the bracket.

5. Remove the switch/splitter from the test set.

A14, A10 to A13 Frequency Converter Assembly

The frequency converter consists of the A14 VTO (voltage-tuned oscillator) assembly and four samplers, A10 through A13. See Figure 6-2 for component locations.

1. Remove the semi-rigid cable attached to each of the four samplers.

2. Remove the four in-line attenuators from the samplers (only in Options 007, Option 002 “plus” 007, and Option 004 “plus” 007).

3. Remove the six flexible cables from the frequency converter by pulling gently on the gold connector.

4. Remove the four frequency converter mounting plate screws and the bracket screw that fastens the frequency converter to the chassis.

5. Unplug the ribbon cable near the front panel.

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

6. Unplug the four harnessed (multi-colored) wire and socket assemblies.

7. Lift the frequency converter out of the test set.

8. Remove the frequency converter bracket by removing the two Pozidriv screws.

Regulator Board Replacement

Filter Capacitor Replacement

A15 Regulator Board Assembly

1. See Figure 6-2 for component locations.

2. Unplug the transformer socket from the regulator board.

3. Unplug the amplifier socket from the regulator board (only in Options 007, Option 002 “plus” 007, and Option 004 “plus” 007).

4. Remove the three mounting screws from the t op edge of the regulator board.

5. Remove the regulator board. (You may need to partially back out one of the transformer mounting screws for clearance.)

C1 to C4 Filter Capacitors

1. With the test set in an upright position, pull the metal and plastic cover off the 4 capacitors. See Figure 6-2 for the location of the filter capacitors.

2. Turn the test set over and remove the bottom cover.

3. To discharge the capacitors, do the following: a. Attach one end of an insulated clip lead to the chassis of the

instrument. b. Attach the other end of the clip lead to a 100 Þ c. Use the resistor to discharge each capacitor terminal (the large

Pozidrivscrewon the bottom side of the test set). Each capacitor has

two terminals. d. Dischargeall capacitor terminals. It takesapproximatelysix seconds

per capacitor to discharge.

4. To remove a capacitor, remove the correspondingpair of screws and pull the capacitor out of the test set.

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HP 8517B S-Parameter Test Set Manual

Ω20-watt resistor.

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Test Port Connector Replacement

NOTE

2.4 mm Test Port Connectors

1. Incline the rear of the test set approximately four inches and support it with a stable, solid object (such as a thick book).

2. Using a 9/16-inch open-end w rench, unscrew the test port connector nut.

3. Pull out the center conductor assembly and replace it with a new assembly. Do not touch e ither end of the new assembly. Part numbers for the test port connector components are located on page 7-16.

4. Replace the test port connector nut and torque it to 562 N-cm (50 in-lb).

5. Measure the pin depth of each port using a 2.4 mm female pin-depth gage. Refer to the connector care information in the calibration kit manual for more information about using the gage.

If the center pin protrudes, or if the depth is less than 0.0001 inch, remove the connector assembly and increase or decrease shims to adjust the pin depth to between 0.0001 and 0.0007 inch. When measuring the pin depth be sure to include the uncertainty calculation of your gage.

6. If you added or removed shims, regage the test port connector assembly.

Figure 6-3 Diagram of 2.4 mm Test Port Connector

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Fan Assembly Replacement

WARNING

B1 Fan Assembly

Turn off the test set and disconnect the power cord from the ac-power mains.

Electrocution can result if ac power remains connected to the test set during this procedure. Disconnect the ac power cord before starting.

To replace the B1 fan assembly, remove T1 transformerto expose the ends of the fan wires which must be de-soldered from the line module, FL1. Refer to Chapter 7, “Replaceable Parts” in this manual f or a detailed view of the fan and transformer hardware.

1. See Figure 6-2 for component locations.

2. Position the test set on its right-hand side.

3. Using a 5/16-inch open-end wrench, remove the hard-line cables connected between the couplers A7 and A9 and the bulkhead connectors J2 and J5.

4. Unplug the transformer connector at J2 on the A15 regulator board.

5. Using a large Pozidriv screwdriver, remove the four screws and washers that hold the transformer onto the rear panel.

NOTE

Power Transformer Replacement

6. Using a large Pozidriv screwdriver, remove the screw that holds the transformer angle bracket to the main deck.

The transformer wires soldered to the line module are short, so do not pull the transformer out too far.

7. Carefully remove the transformer from the test set and place it on the bench near the test set.

8. Strip the heat shrink tubing off the two fan wires, then de-solder the wires from the line module. Cut any cable ties restraining the fan wires.

9. Using a small Pozidriv screwdriver, remove the screw and lockwasher that secure the green/yellow fan ground wire to the top of the rear panel frame.

10. Using a small Pozidriv screwdriver, remove the four screws that hold the fan to the rear panel. Remove the fan assembly.

T1 Power Transformer

Turn off the test set and disconnect the power cord from the mains.

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

WARNING

NOTE

Electrocution can result if ac power remains connected to the test set during this procedure. Disconnect the ac power cord before starting.

1. See Figure 6-2 for component locations.

2. Position the test set onto its right-hand side.

3. Using a 5/16-inch open-end wrench, remove the hard-line cables connected between the coupler A7 and the bulkhead connector J2.

4. Unplug the transformer connector from J2 on the A15 regulator board.

5. Using a large Pozidriv screwdriver, remove the four screws and washers that hold the transformer onto the rear panel.

6. Using a large Pozidriv screwdriver, remove the screw that holds the transformer angle bracket to the main deck.

The transformer wires soldered to the line module are short, so do not pull the transformer out too far.

7. Carefully remove the transformer from the test set and place it on the bench near the test set.

8. Strip the heat shrink tubing off the transformer wires that are soldered to the line module, and de-solder the wires.

9. De-solder the transformer ground wire connected to the chassis side rail.

10. Remove the transformer. When you replace the transformer, refer to Figure 6-4 for the location of wires connected to the line module.

Figure 6-4 WireConnections to FL1 Line Module

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

O-Ring Replacement Anti-Rotation Clamp O-Ring Replacement

1. Pry the O-ring out of the clamp with fine tweezers or a similar tool.

2. To insert the new O-ring (HP part number 0900-0007), engage one side of the ring in the slot of the phenolic clamp donut (shown in Figure 6-5).

3. Use your fingers to seat the O-ring into the groove within the clamp.

Front Panel and Interface Board Replacement

Figure 6-5 Positioning the O-Ring Within the Clamp

A1 Front Panel and Interface Board Assembly

1. See Figure 6-2 for component locations.

2. Remove the four semi-rigid cables that connect to the coupler on the front panel.

3. Remove the ten screws that secure the front panel assembly to the front frame.

4. Grasp the test ports and pull the front panel assembly out, t ilting the top of the assembly toward you.

5. Unplug the ribbon cable attached to the board assembly on the front panel.

6. Grasp the cable attached to the line switch and carefully pull it toward the front of the instrument. This provides enough cable length for you to tilt the f ront panel assembly the rest of the way out of the test set frame.

7. Carefully remove the front panel assembly.

8. Lay the front panel assembly face down on the work surface.

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HP 8517B S-Parameter Test Set Manual

Bias Tees Replacement A7 and A9 Bias Tees

1. See Figure 6-2 for component locations.

2. Remove the two semi-rigid cables attached to the bias tee to be replaced.

3. De-solder the wires attached to the bias tee.

4. Remove the two screws that secure the bias tee to the bias-tee bracket.

5. Remove the bias tee.

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

NOTE

Test Port Coupler Replacement

Test Port Attenuator Replacement

NOTE

This procedure does not apply to Option 002 or Option 002 “plus” 007.

A6 and A8 T est Port Couplers

1. See Figure 6-2 for component locations.

2. Remove the front panel assembly as described in the procedure “A1 Front Panel and Interface Board Assembly”.

3. Remove the test port connector nut with a 1-inch wrench.

4. Remove the test port washer.

5. Remove the coupler from the front panel.

A16 or A17 Port Attenuators

This procedure does not apply to Option 002 or Option 002 “plus” 007.

1. See Figure 6-2 for component locations.

2. Remove the two semi-rigid cables attached to the attenuator.

3. Unplug the ribbon cable from the attenuator.

4. Remove the two screws that secure the attenuator bracket to the amplifier bracket.

5. Remove the attenuator/attenuator bracket from the instrument.

6. Remove the two screws that secure the attenuator to the attenuator bracket.

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Input Amplifier Replacement

NOTE

A22 Input Amplifier Assembly

This procedure is for Option 007, Option 002 “plus” 007, and Option 004 “plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the A22 amplifier.

2. Withoutdisconnecting AT1 and AT2 fixed attenuators, remove the other five semi-rigid cables attached to the A18 switch/splitter.

3. Remove the W45 semi-rigid cable between the A22 input amplifier and J7 rear-panel RF input connector.

4. Remove the two screws holding the switch/splitter to the amplifier mount bracket.

5. Remove the switch/splitter from the amplifier mount bracket.

6. Remove the four screws that secure the A22 input amplifier to the amplifier-mount bracket.

Buffer Amplifier Replacement

NOTE

A23 to A26 Buffer Amplifiers

This procedure is for Option 007, Option 002 “plus” 007, and Option 004 “plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the buffer amplifiers.

2. Remove the two semi-rigid cables from the buffer amplifier to be replaced.

3. Remove the four screws securing the buffer amplifier to the amplifier mount bracket.

4. Remove the buffer amplifier.

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HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Post Regulator Board Replacement

NOTE

A27 Post Regulator Board Assembly

This procedure is for Option 007, Option 002 “plus” 007, and Option 004 “plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the A22 amplifier bracket. The A27 board assembly is located beneath the A22 amplifier bracket.

2. Without removing the step attenuator from the bracket (this step is not applicable to Option 002 “plus” 007), remove the four semi-rigid cables attached to the attenuators at Port 1 and Port 2.

3. Remove the four buffer amplifiers from the bracket (refer to “A23 to A26 Buffer Amplifiers”).

4. Remove the A18 switch/splitter assembly (refer to “A18 Switch/Splitter Assembly”).

5. Remove the A22 input amplifier (refer to “A22 Input Amplifier Assembly”).

NOTE

6. Remove the four screws attaching the amplifier bracket to the test set.

7. Flip the amplifier bracket over. Note the A27 board assembly mounted to the underside of the bracket.

8. De-solder the two pins from the regulator to remove the A27 amplifier regulator board assembly.

9. Remove the five screws holding the board assembly to the bracket.

10. Remove the two screws holding the voltage regulator to the bracket.

11. Removethe regulator board assembly from the amplifiermount bracket.

Do not loosen the grommets (HP part number 3050-0003) located on the regulator board assembly.

12. For reassembly, install two grommets on the underside of the mount bracket. There are two cut-outs on the sheet metal for these grommet insulators.

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Assembly Replacement Procedures

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HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Introduction

This section provides information about ordering replacement parts. Parts that can be replaced include major assemblies and chassis hardware, but not individual pieces of major assemblies. Table 7-1 lists the major assembly reference designations and abbreviations used in the parts lists.

Rebuilt-Exchange Assemblies

Rebuilt-exchange assemblies (R-E assemblies) cost less than new assemblies. They are available through the rebuilt-exchange program. Factory rebuilt (repaired and tested) assemblies meet all factory specifications required of a new assembly. They are available on an exchange (trade-in) basis only. Defective assemblies must be returned for credit. Figure 7-2 illustrates the rebuilt-exchange procedure. The rest of the figures in this chapter provide parts information. If you have any questions, contact the HP Sales and Service office in your region.

Replaceable Parts List Use the illustrations in this chapter to help locate and identify HP 8517B

replaceable parts. Each illustration is accompanied by a replaceable parts list that includes the following information:

• Hewlett-Packard part number.

• Part quantity as shown in the corresponding figure. (There may or may

not be more of the same part located elsewhere in the instrument.)

• Part description, using the abbreviations found in Table 7-3.

NOTE

A typical manufacturer of the part is identified by a five-digit code (refer to the Manufacturers Code list in Table 7-2) and given only if a part is available from an alternate supplier (other than Hewlett-Packard).

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HP 8517B Replaceable Parts

Ordering Information

To order parts listed in the replaceable parts table, record the following information, then address the order to the nearest Hewlett-Packard Sales and Service Office:

the Hewlett-Packard part number the quantity required

To order parts not listed in the replaceable parts lists, record the following information:

the instrument model number the complete instrument serial number the description and function of the part, and the number of parts required

Address the order to the nearest Hewlett-Packard Sales and Service Office. The office addresses are provided in “Service and Support” of this manual.

ToOrderParts....Fast!

• Telephone 1-(800) 227-8164

• Monday through Friday, 6 am to 5 pm (Pacific Standard Time)

Hewlett-Packard Parts specialists have direct on-line access to replacement parts inventory corresponding to the replaceable parts list in this manual. There is a charge for one day delivery service. The standard delivery time is four days.

For after hours and holidays,phone (415) 968-2347. The fast-service applies to United States customers, only. Outside the United States, contact your nearest Hewlett-Packard Sales and Service Office.

Table 7-1 R eference Designation Abbreviations

AAssembly FFuse SSwitch

AT Attenuator, Isolator, Limiter,

Termination

B Fan, Motor HY Circulator TB Terminal Block

BT Battery J Electr ic al Connector

C Capacitor K Relay TP Test Point

FL Filter T Transformer

(Stationary Portion), Jack

TC Thermocouple

CP Coupler L Coil, Inductor U Integrated Circuit,

Microcircuit

CR Diode, Diode Thyristor, Step

Recovery Diode, Varactor

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HP 8517B S-Parameter Test Set Manual

M Meter V Electron Tube

HP 8517B User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Notice

Restricted Rights Legend

What You’ll Find in This Manual…

HP 8517B S-Parameter Test Set

Warranty

Certification Hewlett-Packard Company certifies that this product met its published

Warranty This Hewlett-Packard system product is warranted against defects in

Assistance Product maintenance agreements and other customer assistance agreements

Service and Support

Safety and Regulatory Information

Safety Earth Ground

Before Applying Power Verify that the product is configured to match the available main power

Typeface Conventions

Contents

Getting Started

Test Set Description

HP 8517B Test Set Options

Verifying Test Set Operation

Maintaining Measurement Accuracy

Instruments Supported by This Manual

Instrument Firmware Compatibility

Service and Support Options Available

Accessories

Accessories Available Table 1-5 describes accessories available for the HP 8517B test set. For

Recommended Test Equipment

Operating and Safety Precautions

Operating Precautions Observe the following normal precautions when handling and operating the

Safety Precautions The voltages inside this test set warrant normal caution for operator safety.

Installation

Initial Inspection

Operating Environment

Storing the Test Set Acceptable storage temperatures range from –40° Cto+75° C, with relative

Accessories Supplied Figure 2-1 illustrates accessories supplied with the test set. If you did not

Installing the Test Set Into a System Rack

Installing the Test Set on a Bench

Configuring the Test Set in a System

ConnectingtheSystem Cables

Replacing O-Rings in Anti-Rotation Clamps

Packaging the Test Set

Operating the HP 8517B Test Set

Multiple Test-Set Connections

Initialization at Power-Up

Selecting a Test Set To select another test set, follow the procedure in Table 3-4 on page 3-6 of

Measurement Calibration

Measuring High-Power Devices with Option 004

Changing Signal Path States After System Calibration

Changing the Test Port Attenuators

Storing Trace Memories

Viewing Normalized Parameters

Making Operational Checks

Performance Verification

Using Anti-Rotation Clamps

Attach the first clamp

Positioning the thumb-screw

Positioning the connector

Aligning the thumb-screw

Attaching the second clamp

Specifications

Troubleshooting the Test Set

Theory of Operation

TheRFSourcePower • RF source powerenters the test set through the rear panel. The RF power

The Reference Signal Path

The Test Signal Path • The test signal is routed from the switch/splitter (A18) to the 60 dB

The Sampler Control Switching

The LO Signal Control The LO, generated by A14 VTO/driver, is phase locked to the source so the

Troubleshooting Sequence

Equipment Needed But Not Supplied

Troubleshooting Procedures

HP-IB Address Switch The HP-IB address switch is located on the rear-panel of the instrument. It is

Fuse Location The fuse is located inside the line module at the rear panel of the test set. The

If the Self-Test Fails to Run Properly

Using the Service Adapter

Service Adapter Conclusions

Unratioed Power Test

Isolating Signal Path Problems

Testing Signal Paths 1-4