The µPA1458 is NPN silicon epitaxial Darlington
Power Transistor Array that built in Surge Absorber and
4 circuits designed for driving solenoid, relay, lamp and
so on.
FEATURES
• Surge Absorber (C - B) built in.
• Easy mount by 0.1 inch of terminal interval.
• High hFE for Darlington Transistor.
ORDERING INFORMATION
Part NumberPackageQuality Grade
µ
PA1458H10 Pin SIPStandard
Please refer to "Quality grade on NEC Semiconductor Devices"
(Document number IEI-1209) published by NEC Corporation to
know the specification of quality grade on the devices and its
recommended applications.
ABSOLUTE MAXIMUM RATINGS (Ta = 25 ˚C)
Collector to Base VoltageVCBO60 ±10V
Collector to Emitter VoltageV
Emitter to Base VoltageV
Surge Sustaining EnergyE
Collector Current (DC)I
Collector Current (pulse)I
Collector CurrentI
Base Current (DC)I
Total Power DissipationP
Total Power DissipationP
Junction TemperatureT
Storage TemperatureT
CHARACTERISTICSYMBOLMIN.TYP.MAX.UNITTEST CONDITIONS
Collector Leakage CurrentICES10
Emitter Leakage CurrentIEBO10mAV EB = 5 V, IC = 0
Collector to EmitterVCEO(sus)506070VIC = 3 A, L = 1 mH
Sustaining Voltage
DC Current GainhFE1
DC Current GainhFE2
Collector Saturation VoltageVCE(sat)
Base Saturation VoltageVBE(sat)
Turn On Timeton1
Storage Timetstg7
Fall Timetf2
COLLECTOR SATURATION VOLTAGE vs.
COLLECTOR CURRENT
10
1
VCE (sat) - Collector Saturation Voltage - V
0.1
0.1
I
C - Collector Current - A
IC = 1000·IB
Pulse Test
Ta = –25 ˚C
75 ˚C
25 ˚C
125 ˚C
110
3
Page 4
100
g
10
V
CE≤ 10 V
10
BASE SATURATION VOLTAGE vs.
COLLECTOR CURRENTTRANSIENT THERMAL RESISTANCE
IC = 1000·IB
Pulse Test
µ
PA1458
1.0
Rth (j-c) - Transient Thermal Resistance - ˚C/W
0.1
0.1
COLLECTOR CURRENT vs.
COLLECTOR TO EMITTER VOLTAGE
5
4
3
2
IC - Collector Current - A
1
1
VBE (sat) - Base Saturation Voltage - V
0.1
110100110
PW - Pulse Width - ms
1.4
2.0
1.0
0.8
0.6
= 0.2 mA
B
I
0.4
0.1
C - Collector Current - A
I
Ta = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
0
12345
CE - Collector to Emitter Volta
V
e - V
4
Page 5
µ
PA1458
REFERENCE
Document NameDocument No.
NEC semiconductor device reliability/quality control system.TEI-1202
Quality grade on NEC semiconductor devices.IEI-1209
Semiconductor device mounting technology manual.IEI-1207
Semiconductor device package manual.IEI-1213
Guide to quality assurance for semiconductor devices.MEI-1202
Semiconductor selection guide.MF-1134
5
Page 6
[MEMO]
µ
PA1458
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
The devices listed in this document are not suitable for use in aerospace equipment, submarine cables, nuclear
reactor control systems and life support systems. If customers intend to use NEC devices for above applications
or they intend to use "Standard" quality grade NEC devices for applications not intended by NEC, please contact
our sales people in advance.
Application examples recommended by NEC Corporation
Standard: Computer, Office equipment, Communication equipment, Test and Measurement equipment,
Machine tools, Industrial robots, Audio and Visual equipment, Other consumer products, etc.
Special: Automotive and Transportation equipment, Traffic control systems, Antidisaster systems, Anticrime
systems, etc.
M4 92.6
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