Datasheet TZA3033T Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
DATA SH EET
TZA3033
SDH/SONET STM1/OC3 transimpedance amplifier
Objective specification File under Integrated Circuits, IC19
1998 Jul 08
Page 2
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

FEATURES

Low equivalent input noise, typically 1 pA/Hz
Wide dynamic range, typically 0.25 µA to 1.6 mA
Differential transimpedance of 117 k
Bandwidth minimum 150 MHz
Differential outputs
On-chip AGC (Automatic Gain Control)
No external components required
Single supply voltage from 3.0 to 5.5 V
Bias voltage for PIN diode
Pin compatible with SA5223.

APPLICATIONS

Digital fibre optic receiver in short, medium and long haul optical telecommunications transmission systems or in high speed data networks
Wideband RF gain block.

GENERAL DESCRIPTION

The TZA3033 is a low-noise transimpedance amplifier with AGC designed to be used in STM1/OC3 fibre optic links. It amplifies the current generated by a photo detector (PIN diode or avalanche photodiode) and converts it to a differential output voltage.

ORDERING INFORMATION

TYPE
NUMBER
NAME DESCRIPTION VERSION
PACKAGE
TZA3033T SO8 plastic small outline package; 8 leads; body width 3.9 mm SOT96-1 TZA3033U naked die die in waffle pack carriers; die dimensions 0.960 × 1.210 mm

BLOCK DIAGRAM

handbook, full pagewidth
V
CC
1 nF
1 (1)
DREF
3 (5)IPhoto
(1) AGC analog I/O is only available on the TZA3033U (pad 15). The numbers in brackets refer to the pad numbers of the naked die version.
2 k
65 pF
3
GND
GAIN
CONTROL
A1
low noise
TZA3033
2, 4, 5 (3, 4, 7, 8, 9, 10)

Fig.1 Block diagram.

(1)
AGC
peak detector
A2
amplifier single-ended to
differential converter
BIASING
V
CC
8 (13, 14)(15)
(12) 7 OUTQ (11) 6 OUT
MGR368
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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

PINNING

SYMBOL PIN TYPE DESCRIPTION
DREF 1 analog output bias voltage for PIN diode (V GND 2 ground ground IPhoto 3 analog input current input; anode of PIN diode should be connected to this pin; DC bias
voltage is 1048 mV GND 4 ground ground GND 5 ground ground OUT 6 data output data output; OUT goes HIGH when current flows into IPhoto (pin 3) OUTQ 7 data output compliment of OUT (pin6) V
CC
8 supply supply voltage
); cathode should be connected to this pin
CC
handbook, halfpage
DREF
1 2
TZA3033T
3
IPhoto
4
GND
MGR369

Fig.2 Pin configuration.

V
8
CC
OUTQGND
7
OUT
6
GND
5
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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
PAD CONFIGURATION Bonding pad locations
handbook, full pagewidth
18
DREF
V
CC
GND
IPhoto
GND
Pad 15 (AGC) is not bonded.
2
TESTA
TESTB
36
AGC
15
1 2
3
TZA3033U
4
5 6
7
89
7
OUTQ
13
14
12 11
10
OUT
GND
45
MGR371

Fig.3 Bonding diagram TZA3033U.

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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

Pad centre locations

COORDINATES
(1)
SYMBOL PAD
xy
DREF 1 95 881 TESTA 2 95 735 GND 3 95 618 GND 4 95 473 IPhoto 5 95 285 TESTB 6 95 147 GND 7 215 95 GND 8 360 95 GND 9 549 95 GND 10 691 95 OUT 11 785 501 OUTQ 12 785 641 V
CC
V
CC
13 567 1055 14 424 1055
AGC 15 259 1055
Note
1. All coordinates (µm) are measured with respect to the bottom left-hand corner of the die.

FUNCTIONAL DESCRIPTION

The TZA3033 is a transimpedance amplifier intended for use in fibre optic links for signal recovery in STM1/OC3 applications. It amplifies the current generated by a photo detector (PIN diode or avalanche photodiode) and transforms it into a differential output voltage. The most important characteristics of the TZA3033 are high receiver sensitivity and wide dynamic range.
High receiver sensitivity is achieved by minimizing noise in the transimpedance amplifier.
The signal current generated by a PIN diode can vary between 0.25 µA to 1.6 mA (peak-to-peak value). An AGC loop (see Fig.1) is implemented to make it possible to handle such a wide dynamic range. The AGC loop increases the dynamic range of the receiver by reducing the feedback resistance of the preamplifier. The AGC loop hold capacitor is integrated on-chip, so an external capacitor is not needed for AGC.
The AGC voltage can be monitored at pad 15 on the naked die (TZA3033U). Pad 15 is not bonded in the packaged device (TZA3033T). This pad can be left unconnected during normal operation. It can also be used to force an external AGC voltage. If pad 15 (AGC) is connected to
, the internal AGC loop is disabled and the receiver
V
CC
gain is at a maximum. The maximum input current is then about 10 µA.
A differential amplifier converts the output of the preamplifier to a differential voltage. The data output circuit is given in Fig.4.
The logic level symbol definitions are shown in Fig.5.
Page 6
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
handbook, full pagewidth
V
CC
800 800
2 mA
30 30
4.5 mA
4.5 mA
OUTQ OUT
MGR290

Fig.4 Data output circuit.

handbook, full pagewidth
V
O(max)
V
OQH
V
OH
V
OQL
V
OL
V
O(min)

Fig.5 Logic level symbol definitions for data outputs OUT and OUTQ.

V
CC
V
o(p-p)
V
OO
MGR243
Page 7
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER MIN. MAX. UNIT
V
CC
V
n
I
n
P
tot
T
stg
T
j
T
amb
supply voltage 0.5 +5.5 V DC voltage
pin 3/pad 5: IPhoto 0.5 +2 V pins 6 and 7/pads 11 and 12: OUT and OUTQ 0.5 V pad 15: AGC (TZA3033U only) 0.5 V pin 1/pad 1: DREF 0.5 V
+ 0.5 V
CC
+ 0.5 V
CC
+ 0.5 V
CC
DC current
pin 3/pad 5: IPhoto 1 +2.5 mA pins 6 and 7/pads 11 and 12: OUT and OUTQ 15 +15 mA pad 15: AGC (TZA3033U only) 0.2 +0.2 mA
pin 1/pad 1: DREF 2.5 +2.5 mA total power dissipation 300 mW storage temperature 65 +150 °C junction temperature 150 °C ambient temperature 40 +85 °C

THERMAL CHARACTERISTICS

SYMBOL PARAMETER VALUE UNIT
R R
th(j-s) th(j-a)
thermal resistance from junction to solder point tbf K/W thermal resistance from junction to ambient tbf K/W

CHARACTERISTICS

For typical values T
=25°C and VCC= 5 V; minimum and maximum values are valid over the entire ambient
amb
temperature range and process spread.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
CC
I
CC
P
tot
T
j
T
amb
R
tr
f
3dB(h)
supply voltage 3 5 5.5 V supply current AC coupled; RL=50Ω− 37 mA total power dissipation VCC=5V 185 mW
V
= 3.3 V 116 mW
CC
junction temperature 40 +120 °C ambient temperature 40 +25 +85 °C small-signal
transresistance of the receiver
high frequency
measured differentially; AC coupled
R
= ∞−234 k
L
R
=50Ω−117 k
L
Ci= 0.7 pF 120 150 MHz
3 dB point
Page 8
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
n(tot)
total integrated RMS noise current over bandwidth
R
/t AGC loop constant 1 dB/ms
tr
PSRR power supply rejection
ratio
Input: IPhoto
I
i(IPhoto)(p-p)
input current on pin IPhoto (peak-to-peak value)
V
bias(IPhoto)
input bias voltage on pin IPhoto
referred to input; note 1
f = 90 MHz 16 nAf = 120 MHz tbf nAf = 150MHz tbf nA
measured differentially; note 2
f = 100 kHz to 10 MHz 0.5 −µA/V f = 100 MHz 10 −µA/V
VCC=5V −500 +1 +1800 µA V
= 3.3 V 500 +1 +1600 µA
CC
1048 mV
Data outputs: OUT and OUTQ
V
O(CM)
common mode output
AC coupled; RL=50 VCC− 1.800 VCC− 1.700 VCC− 1.600 V
voltage
V
o(se)(p-p)
single-ended output
AC coupled; RL=50Ω− 150 260 mV voltage (peak-to-peak value)
V
OO
differential output offset
100 +100 mV
voltage
R
o
t
r
t
f
output resistance single-ended; DC tested 42 50 58 rise time 20% to 80% tbf ps fall time 80% to 20% tbf ps
Notes
1. All I
measurements were made with an input capacitance of Ci= 1 pF. This was comprised of 0.5 pF for the
n(tot)
photodiode itself, with 0.3 pF allowed for the printed-circuit board layout and 0.2 pF intrinsic to the package.
2. PSRR is defined as the ratio of the equivalent current change at the input (I I
IPhoto
PSRR
For example, a disturbance of +4 mV disturbance on V
=
--------------------
V
CC
at 10 MHz will typically add an extra 2 nA to the photodiode
CC
) to a change in supply voltage:
IPhoto
current. The external capacitor between DREF and GND has a large impact on PSRR. The specification is valid with an external capacitor of 1 nF.
Page 9
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

APPLICATION INFORMATION

handbook, full pagewidth
1 nF
DREF
IPhoto
10 µH
22 nF
V
CC
8
1
TZA3033T
3
4
2
GND
GND5GND
680 nF
V
P
7
6
OUTQ
OUT
Zo = 50
Zo = 50
100 nF
100 nF
R3 50
R4 50
MGR370

Fig.6 Application diagram.

Page 10
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

PACKAGE OUTLINE

SO8: plastic small outline package; 8 leads; body width 3.9 mm
D
c
y
Z
8
pin 1 index
1
e
5
A
2
A
4
w M
b
p
SOT96-1
E
H
E
1
L
detail X
A
X
v M
A
Q
(A )
L
p
A
3
θ
0 2.5 5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
mm
OUTLINE VERSION
SOT96-1
A
max.
1.75
0.069
A
1
0.25
0.10
0.010
0.004
A2A
1.45
1.25
0.057
0.049
IEC JEDEC EIAJ
076E03S MS-012AA
0.25
0.01
b
3
p
0.49
0.25
0.36
0.19
0.019
0.0100
0.014
0.0075
UNIT
inches
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
(1)E(2)
cD
5.0
4.8
0.20
0.19
REFERENCES
4.0
3.8
0.16
0.15
1.27
0.050
1998 Jul 08 10
eHELLpQZywv θ
1.05
1.0
0.4
0.039
0.016
0.7
0.6
0.028
0.024
0.25 0.10.25
0.010.010.041 0.004
EUROPEAN
PROJECTION
6.2
5.8
0.244
0.228
(1)
0.7
0.3
0.028
0.012
ISSUE DATE
95-02-04 97-05-22
o
8
o
0
Page 11
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
SOLDERING Introduction
There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used.
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our
“Data Handbook IC26; Integrated Circuit Packages”
(order code 9398 652 90011).
Reflow soldering
Reflow soldering techniques are suitable for all SO packages.
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several techniques exist for reflowing; for example, thermal conduction by heated belt. Dwell times vary between 50 and 300 seconds depending on heating method. Typical reflow temperatures range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 minutes at 45 °C.

Wave soldering

Wave soldering techniques can be used for all SO packages if the following conditions are observed:
A double-wave (a turbulent wave with high upward pressure followed by a smooth laminar wave) soldering technique should be used.
The longitudinal axis of the package footprint must be parallel to the solder flow.
The package footprint must incorporate solder thieves at the downstream end.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.

Repairing soldered joints

Fix the component by first soldering two diagonally­opposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
1998 Jul 08 11
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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1998 Jul 08 12
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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
NOTES
1998 Jul 08 13
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Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
NOTES
1998 Jul 08 14
Page 15
Philips Semiconductors Objective specification
SDH/SONET STM1/OC3 transimpedance amplifier TZA3033
NOTES
1998 Jul 08 15
Page 16
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Printed in The Netherlands 425102/1200/01/pp16 Date of release: 1998 Jul 08 Document order number: 9397 750 03878
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