Preliminary specification
Supersedes data of 1998 Jul 29
File under Integrated Circuits, IC19
1999 Aug 24
Page 2
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
FEATURES
• 155 Mbits/s data input,both Current-Mode Logic (CML)
and Positive Emitter Coupled Logic (PECL) compatible;
maximum 800 mV (p-p)
• Adaptive laser output control with dual loop, stabilizing
optical ONE and ZERO levels
• Optionalexternalcontroloflasermodulation and biasing
currents (non-adaptive)
• Automatic laser shutdown
• Few external components required
• Rise and fall times of 120 ps (typical value)
• Jitter <50 mUI (p-p)
• RF output current sinking capability of 60 mA
• Bias current sinking capability of 90 mA
• Power dissipation of 430 mW (typical value)
• Low cost LQFP32 plastic package
• Single 5 V power supply.
TZA3031AHL
• Laser alarm outputfor signalling extremely low and high
bias current conditions.
TZA3031BHL
TZA3031AHL; TZA3031BHL;
TZA3031U
APPLICATIONS
• SDH/SONET STM1/OC3 optical transmission systems
• SDH/SONET STM1/OC3 optical laser modules.
GENERAL DESCRIPTION
The TZA3031AHL, TZA3031BHL and TZA3031U are fully
integrated laser drivers for STM1/OC3 (155 Mbits/s)
systems, incorporating the RF path between the data
multiplexer and the laser diode. Since the dual loop bias
and modulation control circuits are integrated on the IC,
the external component count is low. Only decoupling
capacitors and adjustment resistors are required.
TheTZA3031AHL features analarm function for signalling
extreme bias current conditions. The alarm low and high
threshold levels can be adjusted to suit the application
using only a resistor or a current Digital-to-Analog
Converter (DAC).
The TZA3031BHL is provided with an additional RF data
input to facilitate remote (loop mode) system testing.
The TZA3031U is a bare die version for use in compact
laser module designs. The die contains 40 pads and
features the combined functionality of the TZA3031AHL
and the TZA3031BHL.
• ExtraSTM1 155 Mbits/s loop modeinput; both CML and
PECL compatible.
TZA3031U
• Bare die version with combined bias alarm and loop
mode functionality.
GND111ground
MONIN222monitor photodiode current input
GND333ground
IGM−−4not used; leave unbonded
TONE445connection for external capacitor used to set optical
TZERO556connection for external capacitor used to set optical
BGAP667connection for external band gap decoupling capacitor
V
CC(G)
V
CC(G)
GND8810ground
GND9911ground
V
V
CC(B)
CC(B)
101012supply voltage (blue domain)
GND111114ground
LAQ121215laser modulation output inverted
LA131316laser modulation output
GND141417ground
BIAS151518laser bias current output
GND161619ground
GND171720ground
GND−−21ground
ALARMHI18−22maximum bias current alarm reference level input
V
CC(R)
V
CC(R)
19−−supply voltage (red domain)
DLOOP−1924loop mode data input
V
CC(R)
20−−supply voltage (red domain)
DLOOPQ−2025loop mode data input inverted
V
CC(R)
ALARMLO21−27minimum bias current alarm reference level input
V
CC(R)
ONE222228optical ONE reference level input
ZERO232329optical ZERO reference level input
GND242430ground
GND252531ground
ALARM26−32alarm output
ENL−2633loop mode enable input
V
CC(R)
272734supply voltage (red domain)
PINPAD
DESCRIPTION
ONE control loop time constant (optional)
ZERO control loop time constant (optional)
778supply voltage (green domain)
−−9supply voltage (green domain)
−−13supply voltage (blue domain)
−1823supply voltage (red domain)
−−26supply voltage (red domain)
−21−supply voltage (red domain)
1999 Aug 244
Page 5
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
TZA3031AHL; TZA3031BHL;
SYMBOL
TZA3031AHL TZA3031BHLTZA3031U
DIN282835data input
DINQ292936data input inverted
V
CC(R)
303037supply voltage (red domain)
ALS313138automatic laser shutdown input
GND323239ground
GND−−40ground
handbook, full pagewidth
PINPAD
ALS
GND
31
32
1
GND
GND
TONE
BGAP
CC(G)
GND
2
3
4
5
6
7
8
TZA3031AHL
MONIN
TZERO
V
CC(R)
V
30
DINQ
29
DIN
28
CC(R)
V
27
ALARM
26
GND
25
DESCRIPTION
GND
24
ZERO
23
ONE
22
ALARMLO
21
V
20
CC(R)
V
19
CC(R)
ALARMHI
18
17
GND
TZA3031U
9
GND
10
CC(B)
V
11
GND
12
LAQ
Fig.3 Pin configuration of TZA3031AHL.
1999 Aug 245
LA
13
14
15
16
MBK846
GND
BIAS
GND
Page 6
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
handbook, full pagewidth
GND
MONIN
GND
TONE
TZERO
BGAP
V
CC(G)
GND
GND
32
1
2
3
4
5
6
7
8
9
GND
CC(R)
ALS
V
31
30
TZA3031BHL
11
10
GND
CC(B)
V
DINQ
29
12
LAQ
DIN
28
13
LA
TZA3031AHL; TZA3031BHL;
TZA3031U
CC(R)
ENL
V
27
14
GND
26
15
BIAS
GND
25
16
GND
24
23
22
21
20
19
18
17
MBK845
GND
ZERO
ONE
V
CC(R)
DLOOPQ
DLOOP
V
CC(R)
GND
Fig.4 Pin configuration of TZA3031BHL.
FUNCTIONAL DESCRIPTION
The TZA3031AHL, TZA3031BHL and TZA3031U laser
drivers accept a 155 Mbits/s STM1 Non-Return to Zero
(NRZ) input data stream and generate an output signal
with sufficient current to drive a solid state Fabry Perot
(FP) or Distributed FeedBack (DFB) laser. They also
contain dual loop control circuitry for stabilizing the true
laser optical power levels representing logic 1 and logic 0.
The input buffers present a high impedance to the data
stream on the differential inputs (pins DIN and DINQ).
The input signal can be at CML level of approximately
200 mV (p-p) below the supply voltage, or at PECL level
upto800 mV (p-p).Theinputs can be configured to accept
CML signals by connecting external 50 Ω pull-up resistors
between pins DIN and DINQ to V
CC(R)
. If PECL
compatibility is required, the usual Thevenin termination
can be applied.
For ECL signals (negative and referenced to ground) the
inputs should be AC-coupled to the signal source.
If AC-coupling is applied, a constant input signal (either
low of high) will bring the device in an undefined state.
To avoid this, it is recommended to apply a slight offset to
the input stage.The applied offset must be higher thanthe
specified value in Chapter “Characteristics”, but much
lower than the applied input voltage swing.
The RF path is fully differential and contains a differential
preamplifier and a main amplifier. The main amplifier is
designed to handle large peak currents required at the
output laser driving stage and is insensitive to supply
voltage variations. The output signal from the main
amplifier drives a current switch which supplies a
guaranteed maximum modulation current of 60 mA at
pins LA and LAQ. Pin BIAS delivers a guaranteed
maximum DC bias current of up to 90 mA for adjustingthe
optical laser output to a level above its light emitting
threshold.
Automatic laser control
A laser with a Monitor PhotoDiode (MPD) is required for
the laser control circuit (see Figs 6 and 7).
The MPD current is proportional to the laser emission and
is applied to pin MONIN. The MPD current range is from
100 to 1000 µA (p-p).Theinputbufferis optimized to cope
with MPD capacitances up to 50 pF. To prevent the input
buffer breaking into oscillation with a low MPD
capacitance, it is required to increase the capacitance to
the minimum value specified in Chapter “Characteristics”
by connecting an extra capacitor between pin MONIN and
V
.
CC(G)
1999 Aug 246
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Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
DC reference currents are applied topins ZERO and ONE
to set the MPD reference levels for laser LOW and laser
HIGH.Aresistor connected between pin ZERO and V
and a resistor connected between pin ONE and V
sufficient, but current DACs can also be used.
The voltages on pins ZERO and ONE are heldconstant at
a level of 1.5 V below V
. The reference current
CC(R)
applied to pin ZERO is multiplied by 4 and the reference
current flowing into pin ONE is multiplied internally by 16.
The reference current and the resistor for the optical ONE
regulation loop (modulation current control) can be
calculated using the following formulae:
I
ONE
R
1
×=A[]
I
------
MPD (ONE)
16
1.5
==Ω[]
ONE
----------I
ONE
24
------------------------I
MPD (ONE)
The reference current and resistor for the optical ZERO
regulation loop (bias current control) can be calculated
using the following formulae:
1
×=A[]
I
ZERO
I
-- 4
MPD (ZERO)
CC(R)
CC(R)
is
(1)
(2)
(3)
TZA3031AHL; TZA3031BHL;
TZA3031U
Itshould be noted thattheMPD current is stabilized,rather
than the actual laser optical output power. Deviations
between optical output power and MPD current, known as
‘tracking errors’, cannot be corrected.
Designing the modulation and bias loop
Theoptical ONE and ZEROregulation loop time constants
are determined by on-chip capacitances. If the resulting
time constants are found to be too small in a specific
application, they can be increased by connecting external
capacitors to pins TZERO and TONE, respectively.
The optical ONEloop time constant and bandwidth can be
estimated using the following formulae:
represent the
monitor photodiode current during an optical ONE and an
optical ZERO, respectively.
Example: A laser is operating at optical output power
levels of 0.3 mW for laser HIGH and 0.03 mW for laser
LOW (extinction ratio of 10 dB). Suppose the
corresponding MPD currents for this type of laser are
260 and 30 µA, respectively.
In this example the reference current is
I
ONE
1
260×16.25 µA==
-----16
and flows into pin ONE.
This current canbe set usinga current source or simplyby
a resistor of the appropriate value connected between
pin ONE and V
R
ONE
1.5
----------------
16.25
. In this example the resistor would be
CC(R)
92.3 kΩ==
The reference current at pin ZERO in this example is
I
ZERO
R
ZERO
1
30×7.5˙µA==
-- 4
1.5
--------- -
7.5
and can be set using a resistor
200 kΩ==
The optical ZERO loop time constant and bandwidth can
be estimated using the following formulae:
•ηEO is the electro-optical efficiency which accounts for
the steepness of the laser slope. It is the amount of the
extra optical output power in W/A of modulation current
optical output power.
• R is the monitor photodiode responsivity. It is the
amount of the extra monitor photodiode current in A/W
optical output power.
(7)
(8)
1999 Aug 247
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Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
Example: A laser with an MPD has the following
specifications: PO= 1 mW, Ith=25mA,ηEO= 30 mW/A,
R = 500 mA/W. The term I
current to switch-on the laser. If the laser operates just
above the threshold level, it may be assumed that η
around the optical ZERO level is 50% of ηEO around the
optical ONE level, due to the decreasing slope near the
threshold level.
Inthis example the resultingbandwidthfor the optical ONE
regulation loop, without external capacitance, would be:
It is not necessary to add additional capacitance with this
type of laser.
Monitoring the bias and modulation current
Although not recommended, the bias and modulation
currentsgenerated by thelaserdriver can be monitoredby
measuring the voltages on pins TZERO and TONE,
respectively. The relations between these voltages and
thecorresponding currents are given astransconductance
values and are specified in Chapter “Characteristics”.
The voltages on pins TZERO and TONE range from
1.4 to 3.4 V. The impedance connected at these pins
should have an extremely high value. It is mandatory to
use a CMOS buffer or an amplifier with an input
impedance higher than 100 GΩ and an extremely low
input leakage current (pA range).
Manual laser override
The automatic laser control function can be overridden by
connecting voltage sources to pins TZERO and TONE to
take direct control of, respectively, the bias current source
and the modulation current source. The control voltages
should be in the range from 1.4 to 3.4 V to sweep the
is the required threshold
th
12–
12–
750 Hz≈=
600 Hz≈=
EO
TZA3031AHL; TZA3031BHL;
TZA3031U
modulationcurrent through therange from 1 to 60 mA and
the bias current through the rangefrom 1 to 90 mA. These
current ranges are guaranteed. Depending on the
temperature and manufacturing process spread, current
values higher than the specified ranges can be achieved.
However, bias and modulation currents in excess of the
specified range are not supported and should be avoided.
Currents into or out pins TZERO and TONE in excess of
10 µA must be avoided to prevent damage of the circuit.
Automatic laser shut-down and laser slow start
The laser modulation and bias currents can be rapidly
switched off when a HIGH-level (CMOS) is applied to
pin ALS. This functionallows the circuit to be shut-down in
the event of an optical system malfunction. A 25 kΩ
pull-down resistor defaults the input of pin ALS to the
non active state.
When a LOW-level is applied to pin ALS, the modulation
and bias currentslowly increase to the desired values with
the typical time constants of τ
ONE
and τ
This can be used as a laser slow start.
Bias alarm for TZA3031AHL
The bias current alarm circuit detects and flags whenever
thebias current isoutside a predefinedrange. This feature
can detect excessive bias current due to laser aging and
lasermalfunctioning. The maximumpermittedbias current
should be applied to pin ALARMHI with an attenuation
ratio of 1500; the minimum to pin ALARMLO with an
attenuation ratio of 300.
Like the reference currents for the laser current control
loop, the alarm reference currents can be set using
external resistors connected between pins ALARMHI
or ALARMLO and V
. The resistor values can be
CC(R)
calculated using the following formulae:
R
ALARMHI
R
ALARMLO
1.5 1500×
=Ω[]
--------------------------- I
BIAS(max)
1.5 300×
=Ω[]
-----------------------I
BIAS(min)
, respectively.
ZERO
(9)
(10)
1999 Aug 248
Page 9
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
Example: The following referencecurrents are required to
limit the bias current range between 6 and 90 mA:
I
ALARMLO
I
ALARMHI
The corresponding resistor values are:
R
ALARMHI
R
ALARMLO
If the alarm condition is true, the voltage on pin ALARM
goesto HIGH-level (CMOS).Thissignal could beused,for
example, to disable the laser driver by driving pin ALS
(a latch is needed in between to prevent oscillation).
Loop mode for TZA3031BHL
In the loop mode the total system application can be
tested. It allows for uninhibited optical transmission
through the fibre front-end (from the photodiode through
thetransimpedance stage and the dataandclockrecovery
unit, to the laser driver and via the laser back to the fibre).
It should be noted that the optical receiver used in
conjunction with the TZA3031BHL must havea loop mode
output in order to complete the test loop.
AHIGH-levelon pin ENL selects the loopmode.Bydefault
pin ENL is pulled at LOW-level by a 25 kΩ pull-down
resistor.
Power supply connections
Three separate supply domains [labelled V
and V
high-current outputs, the PECL or CML inputs, and the
monitor photodiode current input. The three domains
should be individually filtered before being connected to a
central VCC (see Figs 6 and 7). All supply pins need tobe connected. The supply levels should be equal and in
accordance with the values specified in
Chapter “Characteristics”.
6 mA
------------- 300
90 mA
---------------- 1500
1.5 V 1500×
---------------------------------
1.5 V 300×
------------------------------
] are used to provide isolation between the
CC(R)
90 mA
6 mA
20 µA==
60 µA==
and
25 kΩ==
and
75 kΩ==
CC(B)
, V
CC(G)
TZA3031AHL; TZA3031BHL;
TZA3031U
To maximize power supply isolation, the MPD cathode on
the laser should be connected to V
diode anode to V
. It is recommended to provide the
CC(B)
laser anode with a separate decoupling capacitor C11.
The inverted laser driver modulation pin LAQ is generally
not used. To properly balance the output stage, an
equalizationnetwork Z1 with an impedance comparableto
the laser is connected between pin LAQ and V
All external components should be SMD, preferably of
size 0603 or smaller. The components must be mounted
as close tothe IC aspossible. It is specially recommended
to mount the following components very close to the IC:
• Power supply decoupling capacitors C2, C4 and C6
• Input matching network on pins DIN and DINQ
• Capacitor C7 on pin MONIN
• Output matching network Z1 at the unused output.
Grounding bare die
In addition to the separate VCC domains, the bare die
contains three corresponding ground domains. Isolation
between the GND domains is limited due to the finite
substrate conductance.
Mountthe die ona,preferably large and highlyconductive,
grounded die pad. All pads GND have to be bonded tothe die pad. The external ground is thus optimally
combined with the die ground, avoiding ground bouncing
problems.
Layout recommendations
Layout recommendations for the TZA3031AHL and
TZA3031BHL can be found in application note
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CC
V
n
I
n
T
amb
T
j
T
stg
supply voltage−0.5+6V
DC voltage on
pin MONIN1.3VCC+ 0.5V
pins TONE and TZERO−0.5VCC+ 0.5V
pin BGAP−0.5+3.2V
pin BIAS−0.5VCC+ 0.5V
pins LA and LAQ1.3VCC+ 0.5V
pin ALS−0.5VCC+ 0.5V
pins ONE and ZERO−0.5VCC+ 0.5V
pins DIN and DINQ−0.5VCC+ 0.5V
pin ALARMTZA3031AHL−0.5VCC+ 0.5V
pins ALARMHI and ALARMLOTZA3031AHL−0.5VCC+ 0.5V
pins DLOOP and DLOOPQTZA3031BHL−0.5VCC+ 0.5V
pin ENLTZA3031BHL−0.5VCC+ 0.5V
DC current on
pin MONIN−0.5+2.5mA
pins TONE and TZERO−0.5+0.5mA
pin BGAP−2.0+2.5mA
pin BIAS−0.5+200mA
pins LA and LAQ−0.5+100mA
pin ALS−0.5+0.5mA
pins ONE and ZERO−0.5+0.5mA
pins DIN and DINQ−0.5+0.5mA
pin ALARMTZA3031AHL−0.5+10mA
pins ALARMHI and ALARMLOTZA3031AHL−0.5+0.5mA
pins DLOOP and DLOOPQTZA3031BHL−0.5+0.5mA
DC input voltage1.51.82.0V
monitor photodiode currentlaser optical ‘0’24−260µA
laser optical ‘1’96−1040µA
monitor photodiode capacitance note 330−50pF
reference current on pin ONEnote 46−65µA
reference voltage on pin ONEreferenced to V
CC(R)
−1.55−1.5−1.45V
reference current on pin ZEROnote 46−65µA
reference voltage on pin ZEROreferenced to V
CC(R)
−1.55−1.5−1.45V
voltage on pin TONEfloating output1.4−3.4V
transconductance of pin TONEnote 5−100−mA/V
voltage on pin TZEROfloating output1.4−3.4V
transconductance of pin TZERO note 6−160−mA/V
1999 Aug 2411
Page 12
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
TZA3031AHL; TZA3031BHL;
TZA3031U
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Laser modulation outputs: pins LA and LAQ
I
O
I
O(off)
V
O
t
r
t
f
J
o(p-p)
Bias current output: pin BIAS
I
O
I
O(off)
t
res(off)
V
O
Alarm threshold inputs: pin ALARMHI and ALARMLO (on TZA3031AHL)
I
ref(ALARMLO)
V
ref(ALARMLO)
I
ref(ALARMHI)
V
ref(ALARMHI)
modulation output currentnote 73−60mA
output current during laser
−−10µA
shutdown
output voltage2−5V
current rise timenote 8−120300ps
current fall timenote 8−120300ps
intrinsic electrical output jitter
note 9−−50mUI
(peak-to-peak value)
output currentnote 102.5−90mA
output current during laser
−−10µA
shutdown
response time after laser
shutdown
I
= 90 mA;
BIAS
note 11
−−1µs
output voltage1−5V
threshold reference current on
lower alarm; note 12 6−65µA
pin ALARMLO
optical reference voltage on
referenced to V
CC(R)
−1.55−1.5−1.45V
pin ALARMLO
threshold reference current on
pin ALARMHI
optical reference voltage on
higher alarm;
note 12
referenced to V
CC(R)
6−65µA
−1.55−1.5−1.45V
pin ALARMHI
Notes
1. Remarks to the supply current:
a) The value for ICC does not include the modulation and bias currents through pins LA, LAQ and BIAS.
b) Typical value for ICC refers to, but does not include, I
c) The maximum value of ICC refers to, but does not include, I
= 30 mA and I
MOD
MOD
BIAS
= 60 mA and I
= 45 mA.
= 90 mA.
BIAS
2. Remarks to the power dissipation:
a) The value for P
b) The typical value for P
V
= 1 V and typical process parameters.
BIAS
c) The maximumvaluefor P
V
= 1 V and worst case process parameters.
BIAS
includes the modulation and bias currents through pins LA, LAQ and BIAS.
tot
is the on-chip dissipation with I
tot
isthe on-chip dissipation withI
tot
= 30 mA and VLA=V
MOD
=60mAandVLA=V
MOD
LAQ
LAQ
= 2 V, I
=2V,I
= 45 mA and
BIAS
=90mAand
BIAS
3. The minimum value of the capacitance on pin MONIN is required to prevent instability.
4. The reference currents can be set using a resistor connected between pins ONE or ZERO and V
CC
(see Section “Automatic laser control”). The corresponding ZERO level MPD current range is from 24 to 260 µA.
The ONE level MPD current range is from 96 to 1040 µA.
5. The specified transconductance is the ratio between the modulation current at pins LA or LAQ and the voltage at
pin TONE, under small signal conditions.
1999 Aug 2412
Page 13
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
TZA3031AHL; TZA3031BHL;
TZA3031U
6. The specified transconductance is the ratio between the biasing current at pin BIAS and the voltage at pin TZERO,
under small signal conditions.
7. The values indicate the guaranteed interval, i.e. the lowest attainable output current is always lower than 3 mA and
the highest output current always higher than 60 mA.
8. The voltage rise and fall times can be larger, due to capacitive effects. Specifications are guaranteed by design and
characterization. Each device is tested at full operating speed to guarantee the RF functionality.
9. Measured in a frequency band from 250 kHz to 5 MHz, according to
The electrically generated (current) jitter is assumed to be less than 50% of the optical output jitter. The specification
is guaranteed by design.
10. The values indicate the guaranteed interval, i.e. the lowest output current always is less than 2.5 mA and the highest
output current is always more than 90 mA.
11. The response time is defined as the delay between the onset of theramp on pin ALS (at 10% of the HIGH-level) and
the extinction of the bias current (at 10% of the original value).
12. The reference currents can be set by using a resistor between V
see Section “Bias alarm for TZA3031AHL” for detailed information. The corresponding range of low-bias thresholds
is between 1.8 and 19.5 mA. The high-bias threshold range is from 9 to 97.5 mA.
“ITU-T Recommendation G.813”
and pins ALARMLO or ALARMHI;
CC(R)
.
handbook, full pagewidth
V
I(max)
V
I(min)
V
IO
V
CC(R)
V
i(p-p)
MGK274
Fig.5 Logic level symbol definitions for data inputs.
1999 Aug 2413
Page 14
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
APPLICATION INFORMATION
L1
handbook, full pagewidth
V
CC
C7
C1
1 µF
C3
1 µF
C5
1 µF
(1)
C8
C9
L2
L3
C10
(2)
(3)
22 nF
C2
22 nF
C4
22 nF
C6
22 nF
MONIN
TONE
TZERO
BGAP
2
4
5
6
V
CC(G)
4
CC(B)
V
19, 20,
27, 30
CC(R)
V
TZA3031AHL
1, 3, 8, 9, 11,
14, 16, 17,
24, 25, 32
11
151312
GNDBIASLALAQ
R5
18 Ω
data inputs
normal mode
(CML/PECL compatible)
ALS
DINQ29DIN28ALARM
31710
(6)
Z1
TZA3031AHL; TZA3031BHL;
TZA3031U
(4)
26
23
22
21
18
ZERO
ONE
ALARMLO
ALARMHI
R1
(4)R3(5)
R2
R4
(5)
L1
C11
MPD
(1) C7 is required to meet the minimum capacitance value on pin MONIN (optional, see Section “Automatic laser control”).
(2) C8 enhances modulation control loop time constant (optional).
(3) C9 enhances bias control loop time constant (optional).
(4) R1 and R2 are used for optical ZERO and ONE reference currents setting (see Section “Automatic laser control”).
(5) R3 and R4 are used for minimum and maximum bias currents setting (see Section “Bias alarm for TZA3031AHL”).
(6) Z1 is required for balancing the output stage (see Section “Power supply connections”).
laser
Fig.6 Application diagram showing the TZA3031AHL configured for 155 Mbits/s (STM1/OC3).
1999 Aug 2414
MBK848
Page 15
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
L1
handbook, full pagewidth
V
CC
C7
C1
1 µF
C3
1 µF
C5
1 µF
(1)
L2
L3
C8
C9
C10
(2)
(3)
22 nF
C2
22 nF
C4
22 nF
C6
22 nF
MONIN
TONE
TZERO
BGAP
2
4
5
6
V
CC(G)
4
CC(B)
V
18, 21,
27, 30
CC(R)
V
TZA3031BHL
1, 3, 8, 9, 11,
14, 16, 17,
24, 25, 32
11
151312
GNDBIASLALAQ
R3
18 Ω
data inputs
normal mode
(CML/PECL compatible)
ALS
DINQ29DIN28ENL
31710
(5)
Z1
TZA3031AHL; TZA3031BHL;
TZA3031U
(4)
(4)
R2
26
23
22
20
19
ZERO
ONE
DLOOPQ
DLOOP
R1
loop mode inputs
(CML/PECL
compatible)
L1
C11
MPD
(1) C7 is required to meet the minimum capacitance value on pin MONIN (optional, see Section “Automatic laser control”).
(2) C8 enhances modulation control loop time constant (optional).
(3) C9 enhances bias control loop time constant (optional).
(4) R1 and R2 are used for optical ZERO and ONE reference currents setting (see Section “Automatic laser control”).
(5) Z1 is required for balancing the output stage (see Section “Power supply connections”).
laser
Fig.7 Application diagram showing the TZA3031BHL configured for 155 Mbits/s (STM1/OC3).
1999 Aug 2415
MBK847
Page 16
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
BONDING PADS
SYMBOLPAD
COORDINATES
XY
GND1−664−910
MONIN2−524−910
GND3−367−910
IGM4−227−910
TONE5−70−910
TZERO6+87−910
BGAP7+244−910
V
1. All x and y coordinates represent the position of the
centreof the pad inµmwith respect to thecentreof the
die (see Fig.8).
(1)
1999 Aug 2416
Page 17
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
handbook, full pagewidth
ALARMLO
ZERO
GND
ALARM
ENL
V
CC(R)
DIN
DINQ
V
CC(R)
ALS
GND
GND
GND
31
32
33
34
35
36
37
38
39
40
ONE
x
TZA3031U
2 mm
V
0
0
y
CC(R)
(1)
DLOOP
DLOOPQ
TZA3031AHL; TZA3031BHL;
TZA3031U
CC(R)
V
GND
ALARMHI
21222324252627282930
20
GND
GND
19
18
BIAS
17
GND
16
LA
15
LAQ
14
GND
V
13
CC(B)
12
V
CC(B)
11
GND
2 mm
(1)
125 6 78910
3
4
MBK849
(1) Typical value.
GND
GND
MONIN
IGM
TONE
BGAP
TZERO
CC(G)
V
CC(G)
V
GND
Fig.8 Bonding pad locations of TZA3031U.
Table 1 Physical characteristics of bare die
PARAMETERVALUE
Glass passivation2.1 µm PSG (PhosphoSilicate Glass) on top of 0.7 µm silicon nitride
Bonding pad dimensionminimum dimension of exposed metallization is 90 × 90 µm (pad size = 100 × 100 µm)
Metallization1.2 µm AlCu (1% Cu)
Thickness380 µm nominal
Size2.000 × 2.000 mm (4.000 mm2)
Backingsilicon; electrically connected to GND potential through substrate contacts
Attache temperature<430 °C; recommended die attache is glue
Attache time<15 s
1999 Aug 2417
Page 18
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
TZA3031AHL; TZA3031BHL;
PACKAGE OUTLINE
LQFP32: plastic low profile quad flat package; 32 leads; body 5 x 5 x 1.4 mm
c
y
X
24
25
17
Z
16
E
A
TZA3031U
SOT401-1
e
pin 1 index
32
1
e
DIMENSIONS (mm are the original dimensions)
mm
A
max.
1.60
A
1A2A3bp
0.15
1.5
1.3
0.25
0.05
UNIT
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
w M
b
p
D
H
D
cE
0.27
0.18
0.17
0.12
9
8
Z
D
B
02.55 mm
(1)(1)(1)
D
5.1
4.9
w M
b
p
v M
v M
scale
(1)
eHELL
H
5.1
4.9
0.5
7.15
6.85
H
E
E
A
B
D
7.15
1.0
6.85
A
0.75
0.45
A
2
A
1
detail X
p
0.2
0.12 0.1
Z
0.95
0.55
D
L
p
L
Zywvθ
E
0.95
0.55
(A )
o
7
o
0
3
θ
OUTLINE
VERSION
SOT401-1
IEC JEDEC EIAJ
REFERENCES
1999 Aug 2418
EUROPEAN
PROJECTION
ISSUE DATE
95-12-19
97-08-04
Page 19
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
SOLDERING
Introduction to soldering surface mount packages
Thistextgives a very briefinsighttoa complex technology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering isnot always suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
tothe printed-circuit board byscreen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating,soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended
for surface mount devices () or printed-circuit boards with
a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
TZA3031AHL; TZA3031BHL;
TZA3031U
If wave soldering is used the following conditions must be
observed for optimal results:
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackageswith leads on four sides,thefootprintmust
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement andbefore soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
1999 Aug 2419
Page 20
Philips SemiconductorsPreliminary specification
SDH/SONET STM1/OC3 laser drivers
TZA3031AHL; TZA3031BHL;
TZA3031U
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, SQFPnot suitablesuitable
HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to orlarger than0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
BARE DIE DISCLAIMER
All die are tested and are guaranteed to comply with all data sheet limits up to the point of wafer sawing for a period of
ninety (90) days from the date of Philips' delivery. If there are data sheet limits not guaranteed, these will be separately
indicated in the data sheet. There is no post waffle pack testing performed on individual die. Although the most modern
processes are utilized for wafer sawing and die pick and place into waffle pack carriers, Philips Semiconductors has no
control of third party procedures in the handling, packing or assembly of the die. Accordingly, Philips Semiconductors
assumes no liability for device functionality or performance of the die or systems after handling, packing or assembly of
the die. It is the responsibility of the customer to test and qualify their application in which the die is used.
1999 Aug 2421
Page 22
Philips Semiconductors – a w orldwide compan y
Argentina: see South America
Australia: 3 Figtree Drive, HOMEBUSH, NSW 2140,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 62 5344, Fax.+381 11 63 5777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
1999
Internet: http://www.semiconductors.philips.com
67
Printed in The Netherlands465012/02/pp24 Date of release: 1999 Aug 24Document order number: 9397 750 05283
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