Datasheet TZA3000 Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
DATA SH EET
TZA3000
SDH/SONET STM4/OC12 optical receiver
Objective specification File under Integrated Circuits, IC19
1997 Oct 17
Page 2
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
FEATURES
Low equivalent input noise, typically 3.5 pA/Hz
Wide dynamic range, typically 1 µA to 1.5 mA
On-chip low-pass filter. The bandwidth can be varied
between 370 and 600 MHz using an external resistor. Default value is 470 MHz.
Differential transimpedance of 1.8 M
On-chip AGC (Automatic Gain Control)
PECL (Positive Emitter-Coupled Logic) or CML
(Current-Mode Logic) compatible data outputs
LOS (Loss-Of-Signal) detection
LOS threshold level can be adjusted using a single
external resistor
On-chip DC offset compensation
Single supply voltage from 3.0 to 5.5 V
Bias voltage for PIN diode.
ORDERING INFORMATION
TYPE
NUMBER
TZA3000HL LQFP32 plastic low profile quad flat package; 32 leads; body 5 × 5 × 1.4 mm SOT401-1 TZA3000U naked die die in waffle pack carriers; die dimensions 1.58 × 1.58 mm
NAME DESCRIPTION VERSION
APPLICATIONS
Digital fibre optic receiver in short, medium and long haul optical telecommunications transmission systems or in high speed data networks
Wideband RF gain block.
DESCRIPTION
The TZA3000 optical receiver is a low-noise transimpedance amplifier with AGC plus a limiting amplifier designed to be used in SDH/SONET fibre optic links. The TZA3000 amplifies the current generated by a photo detector (PIN diode or avalanche photodiode) and converts it to a differential output voltage.
PACKAGE
1997 Oct 17 2
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
BLOCK DIAGRAM
handbook, full pagewidth
DREF
V
CCA
2
k
4
7IPhoto
PREAMPLIFIER
AGC
2 2 2, 5 17, 2031
peak detector
GAIN-
CONTROL
V
CCD
A1 A2
LOS DETECTION
LIMITING
AMPLIFIER
DC-OFFSET
COMPENSATION
TTL
PECL
CML
PECL
29 LOSTH
LOSTTL
28
26 LOS
LOSQ
27
18 OUTCML 19 OUTQCML
OUTSEL
15
22 OUTPECL
OUTQPECL
23
BIASING
11
V
ref
AGND
1, 3, 6, 8 9, 30, 32
7
TESTING
14
RFTEST
Fig.1 Block diagram.
1997 Oct 17 3
BWC
TZA3000
10
DGND
13, 16, 21 24, 25
5
MGK881
Page 4
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
PINNING
SYMBOL PIN TYPE DESCRIPTION
AGND 1 ground analog ground V
CCA
AGND 3 ground analog ground DREF 4 analog output bias voltage for PIN diode (V V
CCA
AGND 6 ground analog ground IPhoto 7 analog input current input; connect the anode of PIN diode to this pin; DC bias level is
AGND 8 ground analog ground AGND 9 ground analog ground BWC 10 analog input bandwidth control pin; default bandwidth is 470 MHz; a resistor should be
V
ref
SUB 12 substrate substrate pin; to be connected to AGND DGND 13 ground digital ground RFTEST 14 analog input test pin; not used in application; not connected OUTSEL 15 CMOS input output select pin; when OUTSEL is HIGH, CML data outputs are active and
DGND 16 ground digital ground V
CCD
OUTCML 18 CML output CML data output; OUTCML goes HIGH when current flows into IPhoto (pin 7) OUTQCML 19 CML output CML compliment of OUTCML (pin 18) V
CCD
DGND 21 ground digital ground OUTPECL 22 PECL output PECL data output; OUTPECL goes HIGH when current flows into IPhoto (pin 7) OUTQPECL 23 PECL output PECL compliment of OUTPECL (pin 22) DGND 24 ground digital ground DGND 25 ground digital ground LOS 26 PECL output PECL-compatible LOS detection pin; LOS output is HIGH when the input signal
LOSQ 27 PECL output PECL compliment of LOS LOSTTL 28 TTL output CMOS-compatible LOS detection pin; the LOSTTL output is HIGH when the
LOSTH 29 analog I/O pin for setting input threshold level; nominal DC voltage is V
AGND 30 ground analog ground AGC 31 analog I/O AGC monitor voltage; the internal AGC circuit can be disabled by applying an
AGND 32 ground analog ground
2 supply analog supply voltage
); cathode should be connected to this pin
CCA
5 supply analog supply voltage
800 mV, one diode voltage above ground
connected between V
(pin 11) and BWC (pin 10) to decrease bandwidth, or
ref
between BWC (pin 10) and AGND to increase bandwidth
11 analog output band gap reference voltage; nominal value approximately 1.2 V
PECL data outputs are disabled; OUTSEL is pulled LOW if left unconnected, PECL data outputs will then be active and CML data outputs disabled
17 supply digital supply voltage
20 supply digital supply voltage
is below the user programmable threshold level
input signal is below the user programmable threshold level
CCA
threshold level set by connecting an external resistor between LOSTH and V
or by forcing a current into LOSTH; default value for this resistor is 86 k
CCA
external voltage to this pin
1.5 V;
1997 Oct 17 4
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
handbook, full pagewidth
AGND
V
CCA
AGND
DREF V
CCA
AGND IPhoto AGND
AGC
AGND 32
1 2 3 4
AGND
31
30
LOSTH 29
LOSTTL 28
TZA3000HL
5 6 7 8
9
AGND
10
BWC
11
12
13
ref
V
SUB
DGND
LOS
LOSQ 27
26
14
15
RFTEST
OUTSEL
DGND 25
16
DGND
DGND
24
OUTQPECL
23
OUTPECL
22 21
DGND V
20
CCD
19
OUTQCML
18
OUTCML V
17
CCD
MGK880
Fig.2 Pin configuration.
1997 Oct 17 5
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
CHIP DIMENSIONS AND BONDING PAD LOCATIONS
COORDINATES
(1)
SYMBOL PAD
xy
AGND 1 102 1251 V
CCA
2 102 1111 AGND 3 102 971 DREF 4 102 814 V
CCA
5 102 674 AGND 6 102 534 IPhoto 7 102 395 AGND 8 102 254 AGND 9 243 105 BWC 10 383 105 V
ref
11 523 105 SUB 12 663 105 DGND 13 803 105 RFTEST 14 943 105 OUTSEL 15 1100 105 DGND 16 1257 105 V
CCD
17 1398 263 OUTCML 18 1398 403
SYMBOL PAD
COORDINATES
xy
OUTQCML 19 1398 543 V
CCD
20 1398 683 DGND 21 1398 823 OUTPECL 22 1398 963 OUTQPECL 23 1398 1103 DGND 24 1398 1243 DGND 25 1283 1400 LOS 26 1143 1400 LOSQ 27 986 1400 LOSTTL 28 829 1400 LOSTH 29 671 1400 AGND 30 514 1400 AGC 31 357 1400 AGND 32 217 1400
Note
1. All coordinates are referenced, in µm, to the bottom left-hand corner of the die.
(1)
handbook, full pagewidth
AGND31AGC30AGND29LOSTH28LOSTTL27LOSQ26LOS25DGND
32
AGND 1
1.58 mm
V
AGND
DREF 4
V
AGND 6 IPhoto 7 AGND 8
x
CCA
CCA
2 3
TZA3000U
5
9
10
11
12
0
0
y
AGND
BWC
ref
V
Fig.3 Bonding pad locations: TZA3000U.
1997 Oct 17 6
13
SUB
1.58 mm
14
DGND
15
RFTEST
16
DGND
OUTSEL
DGND
24
OUTQPECL23
OUTPECL22 DGND21 V
20
17
CCD
OUTQCML19 OUTCML18 V
CCD
MGK882
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
FUNCTIONAL DESCRIPTION
The TZA3000 contains five functional blocks:
Preamplifier input stage
Low-pass filter
Limiting amplifier stage
Offset compensation loop
Loss-of-signal detection unit.
Preamplifier
The preamplifier provides low-noise amplification of the current generated by a photodiode connected to the IPhoto pin.
A differential amplifier converts the output of the preamplifier to a differential voltage. An AGC loop increases the dynamic range of the receiver by reducing the feedback resistance of the preamplifier. The AGC loop hold capacitor is integrated on-chip, so an external capacitor is not needed for AGC. The AGC voltage can be monitored at pin 31. This pin can be left unconnected for normal operation. It can also be used to force an external AGC voltage. If pin 31 (AGC) is connected to AGND, the internal AGC loop is disabled and the receiver gain is at a maximum. In this case, the maximum input current is about 50 µA.
Low-pass filter
A low-pass filter controls the bandwidth of the receiver, which can be varied between 300 and 600 MHz. The bandwidth is set to 470 MHz by default. It can be decreased by connecting a resistor between BWC (pin 10) and V
(pin 11) or increased by connecting a resistor
ref
between BWC and AGND.
Limiting amplifier
A limiting amplifier boosts the signal up to PECL levels. The output can be either CML or PECL compatible, selected by means of pin OUTSEL. When OUTSEL is HIGH, CML data outputs are active and PECL data outputs are disabled. If OUTSEL is left unconnected, it is pulled LOW and PECL data outputs are active while CML data outputs are disabled.
Offset cancellation loop
A control loop connected between the limiting amplifier output and the differential amplifier input cancels the DC offset. The loop bandwidth is fixed internally at 30 kHz.
Loss-of-signal detection (LOS)
The LOS section detects an input signal level below a fixed threshold. The threshold is determined by the current through pin LOSTH. If this current is increased, the threshold level will rise. An external resistor between LOSTH and V
can be used, or a current can be forced
CCA
into LOSTH. The default value for the external resistor is 86 k. In this case, the current through LOSTH will be approximately 17.4 µA since the voltage at pin LOSTH is regulated at 1.5 V below the supply voltage. This threshold corresponds to an input current of 0.96 µA. The ratio of LOSTH current to input current is thus approximately 18 : 1. When the input signal level falls below this threshold, the LOS (PECL compatible) and LOSTTL (TTL compatible) outputs go HIGH. The hysteresis is fixed internally at 3 dB. Response time is typically less than 20 µs.
1997 Oct 17 7
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER MIN. MAX. UNIT
V
CC
V
n
I
n
P
tot
T
stg
T
j
T
amb
supply voltage 0.5 +6 V DC voltage
pin 7: IPhoto 0.5 +1 V pin 14: RFTEST 0.5 V pins 22, 23, 26 and 27: OUTPECL, OUTQPECL, LOS and LOSQ V pins 18 and 19: OUTCML and OUTQCML V
2VCC+ 0.5 V
CC
2VCC+ 0.5 V
CC
pin 29: LOSTH 0.5 V
+ 0.5 V
CC
+ 0.5 V
CC
pin 10: BWC 0.5 +3.2 V pin 31: AGC 0.5 V pin 11: V
ref
0.5 +3.2 V pin 4: DREF 0.5 V pin 15: OUTSEL 0.5 V pin 28: LOSTTL 0.5 V
+ 0.5 V
CC
+ 0.5 V
CC
+ 0.5 V
CC
+ 0.5 V
CC
DC current
pin 7: IPhoto 1 +2.5 mA pin 14: RFTEST 2+2mA pins 22, 23, 26 and 27: OUTPECL, OUTQPECL, LOS and LOSQ 25 +10 mA pins 18,19: OUTCML and OUTQCML 15 +15 mA pin 29: LOSTH 2+2mA pin 10: BWC 1+1mA pin 31: AGC 0.2 +0.2 mA pin 11: V
ref
2 +2.5 mA pin 4: DREF 2.5 +2.5 mA pin 15: OUTSEL 0.5 +0.5 mA pin 28: LOSTTL 16 +16 mA
total power dissipation 600 mW storage temperature 65 +150 °C junction temperature 150 °C ambient temperature 40 +85 °C
THERMAL CHARACTERISTICS
SYMBOL PARAMETER VALUE UNIT
R R
th(j-s) th(j-a)
thermal resistance from junction to solder point tbf K/W thermal resistance from junction to ambient tbf K/W
1997 Oct 17 8
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
CHARACTERISTICS
For typical values T temperature range and process spread.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V I
CCD
I
CCA
P T T R
CC
tot j amb
tr
supply voltage 3 5 5.5 V digital supply current note 1 13 20 28 mA
analog supply current 24 36 51 mA total power dissipation −−525 mW junction temperature 40 +110 °C ambient temperature 40 +25 +85 °C small-signal transresistance
of the receiver
f
3dB(h)
f
3dB(l)
I
i(IPhoto)(p-p)
high frequency 3dB point pin BWC left
low frequency 3dB point 20 30 40 kHz input current on pin IPhoto
(peak-to-peak value)
V
bias(IPhoto)
input bias voltage on pin IPhoto
I
n(tot)
total integrated RMS noise current over bandwidth (referenced to input)
PSRR power supply rejection ratio
at V
R
/t AGC loop constant 1 dB/ms
tr
PECL outputs: OUTPECL and OUTQPECL
V
OL
V
OH
V
OO
LOW-level output voltage 50 to VCC− 2V VCC− 1100 − VCC− 900 mV HIGH-level output voltage 50 to VCC− 2V VCC− 1840 − VCC− 1620 mV differential output offset
voltage
t
r
t
f
rise time 20% to 80% 200 300 ps fall time 80% to 20% 140 250 ps
=25°C and VCC= 5 V; minimum and maximum values are valid over the entire ambient
amb
note 2 47 mA note 3 11 17 24 mA
measured differentially at
1800 k
PECL outputs measured differentially at
1100 k
CML outputs
470 MHz
unconnected; note 4
VCC=5V −400 +4 +1500 µA V
= 3.3 V 400 +4 +500 µA
CC
720 800 970 mV
Ci= 1.2 pF; note 5
f = 311 MHz 55 nAf = 450 MHz 80 nAf = 622 MHz 120 nA
measured differentially;
CC
note 6
f = 100 kHz to 10 MHz 12 µA/V f = 10 MHz to 100 MHz 25 µA/V f = 100 MHz to 1 GHz 5 100 µA/V
10 +10 mV
1997 Oct 17 9
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
PECL outputs: LOS and LOSQ
V
OL
V
OH
V
OO
t
r
t
f
CML outputs: OUTCML and OUTQCML
V
O
V
o(se)(p-p)
V
OO
R
o
t
r
t
f
LOW-level output voltage 50 to VCC− 2V VCC− 1100 − VCC− 900 mV HIGH-level output voltage 50 to VCC− 2V VCC− 1840 − VCC− 1620 mV differential output offset
10 +10 mV
voltage rise time 20% to 80% −−600 ns fall time 80% to 20% −−200 ns
single ended output voltage 50 to V single-ended output voltage
50 to V
CC CC
VCC− 260 V
CC
mV
150 200 260 mV
(peak-to-peak value) differential output offset
50 to V
CC
10 +10 mV
voltage single ended output
80 100 120
resistance rise time 20% to 80%;
92 ps
50 , 1 pF load
fall time 80% to 20%;
62 ps
50 , 1 pF load
CMOS input: OUTSEL
V
IL
V
IH
LOW-level input voltage 0.4 0.8 V HIGH-level input voltage VCC− 1VCC− 0.5 − V
CMOS output: LOSTTL
V
OL
V
OH
LOW-level output voltage 0 0.2 V HIGH-level output voltage VCC− 0.2 V
CC
V
Notes
1. OUTPECL, OUTQPECL, OUTCML, OUTQCML, LOS and LOSQ outputs are left unconnected. OUTPECL and OUTQPECL outputs are active.
2. OUTPECL and OUTQPECL outputs are terminated with 50 to VT. VT is an external termination voltage for PECL outputs and is 2 V below the supply voltage. OUTCML, OUTQCML, LOS and LOSQ outputs are left unconnected
3. OUTCML and OUTQCML outputs are terminated with 50 to V
; CML outputs are active. OUTPECL,
CCD
OUTQPECL, LOS and LOSQ outputs are left unconnected
4. The bandwidth is set to 470 MHz by default. It can be varied between 300 and 600 MHz by adjusting the voltage at pin BWC.
5. All I
measurements were made with an input capacitance of Ci= 1.2 pF. This was comprised of 0.7 pF for the
n(tot)
photodiode itself, with 0.3 pF allowed for the PCB layout and 0.2 pF intrinsic to the package.
6. PSRR is defined as the ratio of the equivalent current change at the input (I
I
PSRR
For example, a 1 mV disturbance on V
=
--------------------
IPhoto
V
CC
at 10 MHz will typically generate the equivalent of 2 nA extra photodiode
CC
) to a change in supply voltage:
IPhoto
current.
1997 Oct 17 10
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
APPLICATION INFORMATION
handbook, full pagewidth
DREF
IPhoto
22 nF
2 V
CCA
4
7
1, 3, 6, 8 9, 30, 32
AGND31AGC10BWC14RFTEST
7
Fig.4 Application diagram: PECL data outputs active.
86 k
LOSTH
TZA3000
680 nF
17, 20292, 5
11
V
ref
V
CC
2 V
15
10 µH10 µH
CCD
OUTSEL
22 nF
13, 16, 21
24, 25
DGND
5
LOSQ
27
LOS
26
LOSTTL
28
OUTQPECL
23
OUTPECL
22
OUTQCML
19
OUTCML
18
Zo = 50
R1 R1
Zo = 50
R2 R2
MGK883
handbook, full pagewidth
DREF
IPhoto
22 nF
2 V
CCA
4
7
1, 3, 6, 8 9, 30, 32
AGND31AGC10BWC14RFTEST
7
Fig.5 Application diagram: CML data outputs active.
86 k
LOSTH
TZA3000
680 nF
17, 20292, 5
11
V
ref
V
CC
2 V
15
10 µH10 µH
CCD
OUTSEL
22 nF
13, 16, 21
24, 25
DGND
5
LOSQ
27
LOS
26
LOSTTL
28
OUTQPECL
23
OUTPECL
22
OUTQCML
19
OUTCML
18
Zo = 50
Zo = 50
50Ω50
MGK884
1997 Oct 17 11
Page 12
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
handbook, full pagewidth
CML/PECL OUTPUT
V
CC
V
O(max)
V
OQH
V
OH
V
o (p-p)
V
V
O(min)
OQL
V
OL
V
OO
MGK885
Fig.6 Logic level symbol definitions for CML and PECL.
handbook, full pagewidth
OUTCML OUTQCML
V
CC
100 100
6 mA
V
CC
a. CML. b. PECL.
Fig.7 Output circuits.
1997 Oct 17 12
105 105
9 mA
OUTPECL OUTQPECL
0.5 mA
0.5 mA
MGK886
Page 13
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
PECL outputs: OUTPECL (22), OUTQPECL (23), LOS (26) and LOSQ (27)
handbook, full pagewidth
VCC = 3.3 V
R1 = 127
V
V
IQ
V
I
V
IQ
V
I
OQ
V
O
R2 = 82.5
GND
VCC = 5 V
R1 = 83.3
V
OQ
V
O
R2 = 125
R1 = 127
R2 = 82.5
R1 = 83.3
R2 = 125
Fig.8 PECL termination schemes.
1997 Oct 17 13
GND
MGK887
Page 14
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
CML outputs: OUTCML (18) and OUTQCML (19)
The output impedance of the CML output driver is 100 (see Figs 7 and 9), which doesn’t match the characteristic impedance of the strip line. While this means that the reflections of some incident edges will arrive at the driver output on the PCB, this value was selected to reduce power dissipation inside the IC. The parallel combination of 100 and 50 (33 Ω) will generate a signal swing of 200 mV peak-to-peak (single sided) with a tail current of 6 mA. If the output impedance was 50 rather than
handbook, full pagewidth
V
CC
100Ω100
generator
inside TZA3000
V
O
V
OQ
interconnect
100 , an 8 mA tail current would be needed to generate the same voltage swing. This would increase power dissipation by 33%.
If necessary, the output impedance of the generator can be matched to the line impedance by connecting an external 100 resistor in parallel with the output as shown in Fig.10. The magnitude of the output voltage swing will not change due to adaptive regulation. However, power dissipation will increase by 33%.
PCB
Zo = 50
Zo = 50
V
I
V
IQ
receiver
inside TZA3004
V
CC
50
50
handbook, full pagewidth
Fig.9 CML interface circuit without matched impedance; low power dissipation.
V
CC
100Ω100
generator
inside TZA3000
V
O
V
OQ
interconnect
100Ω100
PCB
Zo = 50
Zo = 50
receiver
inside TZA3004
V
V
50
I
50
IQ
Fig.10 CML interface circuit with matched impedance; higher power dissipation.
MGK888
V
CC
MGK889
1997 Oct 17 14
Page 15
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
PACKAGE OUTLINE
LQFP32: plastic low profile quad flat package; 32 leads; body 5 x 5 x 1.4 mm
c
y
X
A
H
E
E
A
2
A
A
25
32
24
17
Z
16
E
e
b
w M
p
pin 1 index
9
1
8
SOT401-1
(A )
1
L
L
detail X
3
θ
p
Z
e
w M
b
p
D
H
D
D
B
v M
v M
0 2.5 5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
mm
A
max.
1.60
A
1A2A3bp
0.15
1.5
1.3
0.25
0.05
cE
0.27
0.18
0.17
0.12
(1)
(1) (1)(1)
D
5.1
4.9
eH
H
5.1
4.9
0.5
7.15
6.85
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
OUTLINE VERSION
IEC JEDEC EIAJ
REFERENCES
SOT401-1
1997 Oct 17 15
D
A
B
E
7.15
6.85
LL
p
0.75
1.0
0.45
0.2
0.12 0.1
EUROPEAN
PROJECTION
Z
0.95
0.55
D
Zywv θ
E
0.95
0.55
o
7
o
0
ISSUE DATE
95-12-19 97-08-04
Page 16
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
SOLDERING Introduction
There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used.
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our
“IC Package Databook”
Reflow soldering
Reflow soldering techniques are suitable for all LQFP packages.
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several techniques exist for reflowing; for example, thermal conduction by heated belt. Dwell times vary between 50 and 300 seconds depending on heating method. Typical reflow temperatures range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 minutes at 45 °C.
Wave soldering
Wave soldering is not recommended for LQFP packages. This is because of the likelihood of solder bridging due to closely-spaced leads and the possibility of incomplete solder penetration in multi-lead devices.
(order code 9398 652 90011).
If wave soldering cannot be avoided, the following conditions must be observed:
A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave) soldering technique should be used.
The footprint must be at an angle of 45° to the board
direction and must incorporate solder thieves downstream and at the side corners.
Even with these conditions, do not consider wave soldering LQFP packages LQFP48 (SOT313-2), LQFP64 (SOT314-2) or LQFP80 (SOT315-1).
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonally­opposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
1997 Oct 17 16
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1997 Oct 17 17
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Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
NOTES
1997 Oct 17 18
Page 19
Philips Semiconductors Objective specification
SDH/SONET STM4/OC12 optical receiver TZA3000
NOTES
1997 Oct 17 19
Page 20
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Printed in The Netherlands 427027/300/01/pp20 Date of release: 1997Oct 17 Document order number: 9397 750 01679
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