Datasheet SP574B, SP674B, SP1674B, SP774B Datasheet (Sipex)

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SP574B/674B/1674B/774B
12–Bit Sampling A/D Con verters
Complete Monolithic 12–Bit A/D Converters
with Sample–Hold, Reference, Clock and Tri– state Outputs
Full Nyquist Sampling at All Sample Rates
Choice of Sampling Rates — 40kHz, 66kHz,
100kHz or 125kHz
Low Power Dissipation — 110mW
Commercial, Industrial and Military Tempera-
ture Ranges
Next–Generation Replacement for 574A, 674A,
1674A, 774A Devices
DESCRIPTION…
The SP574B/674B/1674B/774B (SPx74B) Series are complete 12–bit successive–approxi­mation A/D converters integrated on a single die with tri-state output latches, an internal reference, clock and a sample–hold. The new “B–Series” features true Nyquist sampling while maintaining compatibility with prior versions. They are drop–in replacements for the older 574A/ 674A/1674A/774A type devices.
STS DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 DGND
28 1516171819202122232425
27
26
NIBBLE A NIBBLE B NIBBLE C
CONTROL LOGIC
1 1413121110987654
2
3
V
12/8 CS A0R/C CE VCCREF
LOGIC
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
THREE–STATE BUFFERS AND CONTROL
OSC
COMP
12–BIT SAR
REF
AGND REFINVEEBIP
OUT
OFFSET/GAIN
TRIM
7.5K
N/C
12–BIT
CAPACITANCE
DAC
10VIN20V
OFF
7.5K 15K15K
7.5K
IN
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ABSOLUTE MAXIMUM RATINGS
VCC to Digital Common .................................................. 0 to +16.5V
V
to Digital Common ................................................... 0 to +7V
LOGIC
Analog Common to Digital Common ......................................... ±1V
Control Inputs to Digital Common ................. –0.5V to V
(CE, CS, A0, 12/8, R/C)
Analog Input Voltage Range ........................................... ±FS ±30%
Analog Inputs to Analog Common ...................................... ±16.5V
(REF IN, BIP OFF, 10VIN)
20VIN to Analog Common........................................................ ±24V
REF OUT ...............................................Indefinite short to common
................................................................... Momentary short to V
Power Dissipation ............................................................. 1000mW
Lead Temperature, Soldering .................................. 300˚C, 10Sec
J/C ..................................................................................... 45˚C/W
MTBF–25˚C Ground Base ................................ 2.915 million hours
MTBF–125˚C Missile Launch ...................... 10.16 thousand hours
Inputs exceeding +30% or –30% of FS will cause erratic performance.
LOGIC
+0.5V
CAUTION:
ESD (ElectroStatic Discharge) sensitive
device. Permanent damage may occur on
unconnected devices subject to high energy
electrostatic fields. Unused devices must be
CC
stored in conductive foam or shunts. Personnel should be properly grounded prior to handling this device. The protective foam should be discharged to the destination
socket before devices are removed.
SPECIFICATIONS
(Typical @ 25°C with VCC = +15V, VEE = 0V, V
PARAMETER MIN. TYP. MAX. UNIT CONDITIONS RESOLUTION
All models 12 Bits
ANALOG INPUTS
Input Ranges
Bipolar ±5, ±10 V Unipolar 0 to +10, 0 to +20 V
Input Impedance
SP574B/SP674B
10 Volt Input 3.75 6.25 k 20 Volt Input 15 25 k
SP1674B/SP774B
10 Volt Input 1.875 3.125 k 20 Volt Input 7.45 12.42 k
Nyquist Frequency
SP574B 20 kHz SP674B 33 kHz SP1674B 50 kHz SP774B 62.5 kHz
DIGITAL INPUTS
Logic Inputs CE, CS R/C, AO, 12/8
Logic 1 +2.4 +5.5 V Logic 0 –0.3 +0.8 V Current ±0.1 ±50 µA –0.3V to +5.5V Input
Capacitance 5 pF 12/8 Control Input Hardwire to V
DIGITAL OUTPUTS
Logic Outputs DB11–DB0, STS
Logic 1 +2.4 V I Logic 0 +0.4 V I Leakage (High Z State) ±40 µA Data bits only Capacitance 5 pF
Parallel Data Output Codes
Unipolar Positive true binary Bipolar Positive true offset binary
INTERNAL REFERENCE
Output Voltage 10.00 ±0.1 V Output Current 2 mA Note 1
= +5V unless otherwise noted.)
LOGIC
LOGIC
±5 µA 0V to +5.5V Input
or DIGITAL COMMON
500µA
SOURCE
1.6mA
SINK
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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SPECIFICATIONS
(Typical @ 25°C with VCC = +15V, VEE = 0V, V
(continued)
= +5V unless otherwise noted.)
LOGIC
PARAMETER MIN. TYP. MAX. UNIT CONDITIONS CONVERSION TIME
SP574B
12–Bit Conversion 13 25 µs 8–Bit Conversion 10 19 µs
SP674B
12–Bit Conversion 9 15 µs 8–Bit Conversion 6 11.2 µs
SP1674B
12–Bit Conversion 5 10 µs 8–Bit Conversion 4 7.6 µs
SP774B
12–Bit Conversion 4 8 µs 8–Bit Conversion 3 6 µs
ACCURACY
Linearity Error
–A, –J, –S ±1.0 LSB @ 25°C and T –B, –K, –T ±0.5 LSB @ 25°C and T
Differential Linearity Error Note 2
–A, –J, –S 11 Bits @ 25°C –B, –K, –T 12 Bits @ 25°C
11 Bits T 12 Bits T
Offset Note 3
MIN
MIN
to T to T
MAX
MAX
Unipolar ±3 LSB Bipolar –A, –J, –S ±10 LSB –B, –K, –T ±4 LSB
Full Scale (Gain) Error % of full scale; T
±0.3 %FS Note 4
–A ±0.6 %FS No adjustment @ 25°C
±0.3 %FS With adjustment @ 25°C
–B ±0.45 %FS No adjustment @ 25°C
±0.15 %FS With adjustment @ 25°C
–J ±0.5 %FS No adjustment @ 25°C
±0.22 %FS With adjustment @ 25°C
–K ±0.4 %FS No adjustment @ 25°C
±0.12 %FS With adjustment @ 25°C
–S ±0.8 %FS No adjustment @ 25°C
±0.5 %FS With adjustment @ 25°C
–T ±0.6 %FS No adjustment @ 25°C
±0.25 %FS With adjustment @ 25°C
STABILITY
Unipolar Offset
–J ±10 ppm/°CT –K, –A, –S ±5 ppm/°CT –B, –T ±2.5 ppm/°CT
Bipolar Offset
–J, –A, –S ±10 ppm/°CT –K, –B, –T ±5 ppm/°CT
Gain (Scale Factor)
–J, –A, –S ±50 ppm/°CT –K, –B, –T ±25 ppm/°CT
MIN MIN MIN
MIN MIN
MIN MIN
to T to T to T
to T to T
to T to T
MAX MAX MAX
MAX MAX
MAX MAX
MIN MIN
to T to T
MIN
to T
MAX MAX
MAX
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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SPECIFICATIONS
(Typical @ 25°C with VCC = +15V, VEE = 0V, V
(continued)
= +5V unless otherwise noted.)
LOGIC
PARAMETER MIN. TYP. MAX. UNIT CONDITIONS POWER REQUIREMENTS
V
LOGIC
I
LOGIC
SP574B 13 mA
+4.5 +5.5 V
SP674B 13 mA SP1674B 13 mA SP774B 13 mA
V
CC
I
CC
SP574B 79 mA
+11.4 +16.5 V
SP674B 79 mA SP1674B 10 12.5 mA SP774B 10 12.5 mA
POWER DISSIPATION
SP574B 110 150 mW SP674B 110 150 mW SP1674B 155 200 mW SP774B 155 200 mW
ENVIRONMENTAL
Operating Temperature Range
–J, –K 0 +70 °C –A, –B –40 +85 °C –S, –T –55 +125 °C
Storage Temperature Range
–J, –K –40 +85 °C –A, –B, –S, –T –65 +150 °C
Notes:
1. Available for external loads. External load should not change during conversion. When supplying an external load and operating on a +12V supply, a buffer amplifier must be provided for the reference output.
2. Minimum resolution for which no missing codes are guaranteed.
3. Externally adjustable to zero. See
Calibration
information.
4. Fixed 50 resistor between REF OUT and REF IN.
5. Specifications are identical for all models unless otherwise noted.
TYPICAL AC DYNAMICS
Measurement/Model SP574B SP674B SP1674B SP774B Unit
Test Conditions:
Sampling Rate 40 67 100 125 kHz Input Frequency (FIN )19314961kHz
SFDR 90 85 80 77 dB THD -80 -80 -77 -76 dB SINAD 72 72 71 71 dB SNR 72.5 72.5 72.5 72.5 dB
Note:
1. Refer to Figure 10, for typical FFT at Nyquist sampling rate.
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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PIN ASSIGNMENTS…
PIN FUNCTION PIN FUNCTION
1V 2 12/8 27 DB11(MSB) 3CS 26DB 4A 5 R/C 24 DB 6CE 23DB 7V 8 REF OUT 21 DB
9 ANA GND(AC) 20 DB 10 REF IN 19 DB 11 N/C* 18 DB 12 BIP OFF 17 DB 13 10V 14 20V
*This pin is not connected inside the device so it can be tied to –15V, ground, or left floating.
LOGIC
0
CC
IN
IN
28 STS
10
25 DB
22 DB
16 DB0(LSB) 15 DIG. GND
9
8
7
6
5
4
3
2
1
FEATURES…
The SPx74B Series feature standard bipolar and unipolar input ranges of 10V and 20V. Input ranges are controlled by a bipolar offset pin and laser-trimmed for specified linearity, gain and offset accuracy. Power requirements are +5V and +12V to +15V with a maximum dissipation of 150mW at the specified voltages. Conversion times of 8µs, 10µs, 15µs and 25µs are available, as are units with 10, 25 or 50ppm/°C tempera­ture coefficients for flexible matching to spe­cific application requirements.
The SPx74B Series are available in nine prod- uct grades for each conversion time. The –J and –K models are specified over 0˚C to + 70˚C commercial temperature range; the –A and –B models are specified over the –40˚C to +85˚C industrial temperature range; the –S and –T models are specified over the –55˚C to +125˚C military temperature range. Package options include 28–pin CDIP, 28–pin plastic DIP (both narrow and wide), 28-pin PLCC and 28–pin SOIC.
CIRCUIT OPERATION…
The SPx74B are complete monolithic capacitor DAC–based 12–bit analog-to-digital convert­ers with integral voltage reference, comparator, successive–approximation register (SAR), sample–and–hold, clock, output buffers and control circuitry. The high level of integration of the SPx74B Series means they require few external components.
When the control section of the SPx74B initiates a conversion command, the clock is enabled and the successive–approximation register is reset to all zeros. Once the conversion cycle begins, it can not be stopped or restarted and data is not available from the output buffers. The SAR, timed by the clock, sequences through the conversion cycle and returns an end–of–convert flag to the control sec­tion of the ADC. The clock is then disabled by the control section, the output status goes low, and the control section is enabled to allow the data to be read by external command.
The internal SPx74B 12–bit CDAC is sequenced by the SAR starting from the MSB to the LSB at the beginning of the conversion cycle to provide an output voltage from the CDAC that is equal to the input signal voltage (which is divided by the input voltage divider network). The com­parator determines whether the addition of each successively–weighted bit voltage causes the CDAC output voltage summation to be greater or less than the input voltage; if the sum is less, the bit is left on; if more, the bit is turned off. After testing all the bits, the SAR contains a 12– bit binary code which accurately represents the input signal to within ±1⁄2 LSB.
The internal reference provides the voltage refer­ence to the CDAC with excellent stability over temperature and time. The reference is trimmed to 10.00 Volts ±1% and can supply up to 2mA to an external load in addition to that required to drive the reference input resistor (1mA) and offset resistor (1mA) when operating with ±15V supplies. If the SPx74B is used with ±12V supplies, or if external current must be supplied over the full temperature range, an external buffer amplifier is recommended. Any external load on the SPx74B reference must remain constant during conversion.
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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SAMPLE–AND–HOLD FUNCTION
Although there is no sample–and–hold circuit in the classical sense, the sampling nature of the capacitive DAC makes the SPx74B appear to have a built–in sample–and–hold. The sample–and– hold function of the CDAC architecture is opti­mized to provide full Nyquist sampling at any maximum sampling rate. Because the S/H func­tion is included in the ADC circuitry, the majority of the S/H specifications are included within the A/ D specifications.
Note that some system architectures may use an external sample–and–hold. The built–in S/H func­tion of the SPx74B will provide additional isola­tion. Once the internal sample is taken by the CDAC capacitance, the input of the SPx74B is disconnected from the input. This prevents tran­sients occurring during conversion from being inflicted upon the attached buffer. All other 574/ 674–type circuits will cause a transient load cur­rent on the input which will upset the buffer output and may add error to the conversion itself. In addition, the isolation of the input after the acqui­sition time in the SPx74B allows you the opportu­nity to release the HOLD on an external sample– and–hold and start it tracking the next sample. This will increase system throughput with your existing components.
When using an external S/H, the SPx74B acts as any other 574–type device because the internal S/ H is transparent. The sample/hold function in the SPx74B is inherent to the capacitor DAC struc­ture, and its timing characteristics are determined by the internally generated clock. However, for multiplexer operation, the internal S/H may elimi­nate the need for an external S/H. The operation of the S/H function is internal to the SPx74B and is
CE
R/C
ACQUISITION
WAIT FOR
CONVERT SIGNAL
V
IN
CDAC VOLTAGE
0 VOLTS
Figure 1. Sample–and–Hold Function
TIME
t
(ACQ)
CONVERSION
ACQUISITION TIME = APERTURE DELAY TIME =
0.12 x t
CONVERT
WAIT FOR BUS READ
controlled through the normal R/C control line (refer to Figure 1). When the R/C line makes a negative transition, the SPx74B starts the timing of the sampling and conversion. The first two clock cycles are allocated to signal acquisition of the input by the CDAC (this time is defined as t
). Following these two cycles, the input sample
ACQ
is taken and held. The A/D conversion follows this cycle with the duration controlled by the internal clock cycle, which is determined by the specific product model. Note that because the sample is taken relative to the R/C transition, t traditional “aperture delay” of this internal sample and hold. Since t its duration will vary with the internal clock fre-
is measured in clock cycles,
ACQ
is also the
ACQ
quency. Offset, gain and linearity errors of the S/H circuit,
as well as the effects of its droop rate, are included in the overall specs for the SPx74B.
USING THE SPX74B SERIES Typical Interface Circuit
The SPx74B is a complete A/D converter that is fully operational when powered up and issued a Start Convert Signal. Only a few external compo­nents are necessary. The SPx74B Series have four standard input ranges: 0V to +10V, 0V to +20V, ±5V and ±10V. Figure 2 depicts a typical interface circuit for operating the SPx74B in a unipolar input mode. Figure 3 depicts a typical interface circuit for operating the SPx74B in a bipolar input mode. Further information is given in the follow­ing sections on these connections, but first a few considerations concerning board layout to achieve the best operation.
For each application of this device, strict attention must be given to power supply decoupling, board layout (to reduce pickup between analog and digi­tal sections), and grounding. Digital timing, cali­bration and the analog signal source must be considered for correct operation.
To achieve specified accuracy, a double–sided printed circuit board with a copper ground plane on the component side is recommended. Keep analog signal traces away from digital lines. It is best to lay the PC board out such that there is an analog section and a digital section with a single point ground connection between the two through an RF bead. If this is not possible, run analog
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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R1
100K
-15V +15V
100K
100
ANALOG INPUTS
0 TO 10V
0 TO 20V
100
R2
Figure 2. Unipolar Input Connections
MSB LSB
2
12/8
3
CS
4
CONTROL
A
0
LOGIC
5
R/C
6
CE
OSCILLATOR
10V
13
IN
20V
IN
14
BIP OFF
12
V
REF
8
OUT
10
V
REF IN
711
V
CC
+
+15V
27 26 25 24 23 22 21 20 19 18 17 16
SAMPLE/HOLD
MSB
REF REF AMP
10µF 0.1µF
AGND
OUTPUT BITS
NIBBLE A NIBBLE B NIBBLE C
THREE–STATE BUFFERS AND CONTROL
12–BITS
12–BIT SAR
STROBE
12–BITS
CDAC
V
EE
N.C.
9
LSB
OFFSET/GAIN
TRIM NETWORK
COMP
28
STS
V
1
LOGIC
+
10µF 0.1µF
DGND
15
+5V
signals between ground traces and cross digital lines at right angles only.
Grounding Considerations
Any ground path from the analog and digital ground should be as low resistance as possible to accommodate the ground currents present with this device.
The analog ground current is approximately 6mA DC while the digital ground is 3mA DC. The analog and digital common pins should be tied together as close to the package as possible to guarantee best performance. The code–de­pendent currents flow through the V VCC terminals and not through the analog and
LOGIC
and
digital common pins.
Power Supplies
The supply voltages for the SPx74B must be kept as quiet as possible from noise pickup and also regulated from transients or drops. Because the part has 12–bit accuracy, voltage spikes on the supply lines can cause several LSB deviations on the output. Switching power supply noise can be a problem. Careful filtering and shielding should be employed to prevent the noise from being picked up by the converter.
Capacitor bypass pairs are needed from each sup­ply pin to its respective ground to filter noise and counter the problems caused by the variations in supply current. A 10µF tantalum and a 0.1µF ceramic type in parallel between V digital common (pin15), and VCC (pin 7) and
LOGIC
(pin 1) and
analog common (pin 9) is sufficient. VEE is gener­ated internally so pin 11 may be grounded or connected to a negative supply if the SPx74B is being used to upgrade an already existing design.
CALIBRATION AND CONNECTION PROCEDURES Unipolar
The calibration procedure consists of adjusting the converter’s most negative output to its ideal value for offset adjustment, and then adjusting the most positive output to its ideal value for gain adjustment.
Starting with offset adjustment and referring to Figure 2, the midpoint of the first LSB increment should be positioned at the origin to get an output code of all 0s. To do this, an input of +1⁄2 LSB or +1.22mV for the 10V range and +2.44mV for the 20V range should be applied to the SPx74B. Adjust the offset potentiometer R1 for code transi­tion flickers between 0000 0000 0000 and 0000 0000 0001.
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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The gain adjustment should be done at positive full scale. The ideal input corresponding to the last code change is applied. This is 11⁄2LSB below the nominal full scale which is +9.9963V for the 10V range and +19.9927V for the 20V range. Adjust the gain potentiometer R2 for flicker between codes 1111 1111 1110 and 1111 1111 1111. If calibration is not necessary for the intended appli­cation, replace R2 with a 50, 1% metal film resistor and remove the network analog input to pin 13 for the 0V to 10V range or to pin 14 for the 0V to 20V range.
Bipolar
The gain and offset errors listed in the specifica­tions may be adjusted to zero using the potentiom­eters R1 and R2 (See Figure 3). If adjustment is not needed, either or both pots may be replaced by a 50, 1% metal film resistor.
To calibrate, connect the analog input signal to pin 13 for a ±5V range or to pin 14 for a ±10V range. First apply a DC input voltage 1⁄2 LSB above negative full scale which is –4.9988V for the ±5V range or –9.9976V for the ±10V range. Adjust the offset potentiometer R1 for flicker between output codes 0000 0000 0000 and 0000 0000 0001. Next, apply a DC input voltage 11⁄2 LSB below positive full scale which is +4.9963V for the ±5 range or
+9.9927V for the ±10V range. Adjust the gain potentiometer R2 for flicker between codes 1111 1110 and 1111 1111 1111.
Alternative
The 100 potentiometer R2 provides gain adjust for 10V and 20V ranges. In some applications, a full scale of 10.24V (for and LSB of 2.5mV) or
20.48 (for an LSB of 5.0mV) is more convenient. For these, replace R2 by a 50, 1% metal film resistor. Then to provide gain adjust for the 10.24 range, add a 200 potentiometer in series with pin
13. For the 20.48V range, add a 1000 potentiom­eter in series with pin 14.
CONTROLLING THE SPx74B
The SPx74B can be operated by most micropro- cessor systems due to the control input pins and on–chip logic. It may also be operated in the “stand–alone” mode and enabled by the R/C input pin. Full microprocessor control consists of selecting an 8– or 12–bit conversion cycle, initiating the conversion, and reading the output data when ready. The output read has the options of choosing either 12–bits at once or 8–bits fol­lowed by 4–bits in a left–justified format. All five control inputs are TTL/CMOS compatible and include 12/8, CS, A0, R/C and CE. The use of these inputs in controlling the converter’s operation is
OUTPUT BITS
NIBBLE A NIBBLE B NIBBLE C
THREE–STATE BUFFERS AND CONTROL
12–BITS
12–BIT SAR
12–BITS
9
STROBE
CDAC
LSB
OFFSET/GAIN
TRIM NETWORK
V
EE
N.C.
COMP
28
STS V
1
+
10µF 0.1µF
DGND
15
LOGIC
+5V
ANALOG
INPUTS
2
12/8
3
CS
4
A
0
5
R/C
6
CE
10V
±5V
13
IN
20V
±10V
IN
14
BIP OFF
12
100
R1
V
REF
8
OUT
100
R2
10
V
REF IN
V
CC
+15V
MSB LSB
27 26 25 24 23 22 21 20 19 18 17 16
CONTROL
LOGIC
OSCILLATOR
SAMPLE/HOLD
MSB
REF REF AMP
711
+
10µF 0.1µF
AGND
Figure 3. Bipolar Input Connections
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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shown in Table 1, and the internal control logic is shown in a simplified schematic in Figure 4.
Conversion Start
A conversion may be initiated by a logic transition on any of the three inputs: CE, CS R/C, as shown in Table 1. The last of the three to reach the correct state starts the conversion, so one, two or all three may be dynamically controlled. The nominal de­lay from each is the same and all three may change state simultaneously. In order to assure that a particular input controls the start of conversion, the other two should be setup at least 50ns earlier. Refer to the convert mode timing specifications. The Convert Start timing diagram is shown in Figure 6.
The output signal STS is the status flag and goes high only when a conversion is in progress. While STS is high, the output buffers remain in a high impedance state so that data can not be read. Also, when STS is high, an additional Start Convert will not reset the converter or reinitiate a conversion. Note, if A0 changes state after a conversion begins, an additional Start Convert command will latch the new state of A0 and possibly cause a wrong cycle length for that conversion (8–versus 12–bits).
CE CS R/C 12/8 A
0xxxxNone x 1 x x x None
0 0 x 0 Initiate 12–Bit Conversion 0 0 x 1 Initiate 8–Bit Conversion
0
OPERATION
Conversion Length
A conversion start transition latches the state of A as shown in Figure 4 and Table 1. The latched state determines if the conversion stops with 8–bits (A high) or continues for 12–bits (A0 low). If all 12– bits are read following an 8–bit conversion, the three LSB’s will be a logic “0” and DB3 will be a logic “1”. A0 is latched because it is also involved in enabling the output buffers as explained else­where. No other control inputs are latched.
Stand–Alone Operation
The simplest interface is a control line connected to R/C. The other controls must be tied to known states as follows: CE and 12/8 are wired high, A and CS are wired low. The output data arrives in words of 12–bits each. The limits on R/C duty cycle are shown in Figures 8 and 9. The duty cycle may be within and including the extremes shown in the specifications. In general, data may be read when R/C is high unless STS is also high, indicat­ing a conversion is in progress.
Reading Output Data
The output data buffers remain in a high imped­ance state until the following four conditions are met: R/C is high, STS is low, CE is high and CS is low. The data lines become active in response to these four conditions, and output data according to the conditions of the control lines 12/8 and A0. The timing diagram for this process is shown in Figure
7. When 12/8 is high, all 12 data outputs become active simultaneously and the A0 input is ignored. The 12/8 input is usually tied high or low; it is TTL/ CMOS compatible. When 12/8 is low, the output is separated into two 8–bit bytes as shown below:
BYTE 1 BYTE2 xxxx xxxx xxxx 0000
0
0
0
1 0 x 0 Initiate 12–Bit Conversion 1 0 x 1 Initiate 8–Bit Conversion
This configuration makes it easy to connect to an
MSB LSB
8–bit data bus as shown in Figure 5. The A0 control
10 x 0 Initiate 12–Bit Conversion 10 x 1 Initiate 8–Bit Conversion 1 0 1 1 x Enable 12–Bit Output 10100Enable 8 MSB's Only 10101Enable 4 LSB's plus 4
Trailing Zeroes
Table 1. SPx74B Control Input Truth Table
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
can be connected to the least significant bit of the address bus in order to store the output data into two consecutive memory locations. When A0 is pulled low, the 8 MSB’s are enabled only. When A0 is high, the 8 MSB’s are disabled, bits 4 through 7 are forced to a zero and the four LSB’s are enabled. The two byte format is “left justified data” as shown above and can be considered to have a decimal point or binary to the left of byte 1.
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A0 may be toggled without damage to the con-
28
27
26
25
24
23
22
21
20
19
18
17
16
15
STS
DB11 (MSB)
DB0 (LSB)
DIG
COM
SPx74B
2 4
A
0
ADDRESS BUS
A
0
12/8
DATA
BUS
verter at any time. Break–before–make action is guaranteed between the two data bytes. This as­sures that the outputs which are strapped together in Figure 5 will never be enabled at the same time.
In Figure 7, it can be seen that a read operation usually begins after the conversion is complete and STS is low. If earlier access is needed, the read can begin no later than the addition of times tDD and t before STS goes low.
INPUT BUFFERS
12/8
CK
Q
Q
READ CONTROL
H
EOC8
EOC12
CS A
R/C CE
0
D
A0 LATCH
"NYQUIST" SAMPLING
Each of the SPx74B analog-to-digital convert­ers has been designed to provide Nyquist sam­pling (highest input frequency is 1/2 of the sampling rate) data conversion with no degra­dation in DC performance. This is shown in Figure 10. Note that the Differential Linearity and Integral Linearity min/max values are well within the ± 1/2 LSB limits of a K-version
HS
Converter. Also, the Typical FFT at Nyquist rates shown on Figure 10 reflect the values listed in the Typical AC Dynamics table.
NIBBLE B ZERO OVERRIDE
NIBBLE A, B
NIBBLE C
Q
D CK
R
DELAY
STS
Figure 4. SPx74B Control Logic
10
Figure 5. Interfacing SPx74B to 8–Bit Interface Bus
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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CONVERT MODE TIMING
CE
t
SSC
t
SRC
A
0
t
SAC
t
HAC
t
DSC
0
HIGH IMPEDANCE
DB
CS
R/C
STS
11
DB
CHARACTERISTICS
Typical @ 25˚C, VCC = +15V or +10V, V
PARAMETER MIN. TYP. MAX. UNITS CONDITIONS
t
STS Delay from CE 200 ns
DSC
t
CE Pulse Width 50 ns
HEC
t
CS to CE Setup 50 ns
SSC
t
CS Low during CE High 50 ns
HSC
t
R/C to CE Setup 50 ns
SRC
t
R/C Low during CE High 50 ns
HRC
t
to CE Setup 0 ns
SACA0
t
Valid during CE High 50 ns
HACA0
tCConversion Time
1, 3, 4
= +5V, VEE = 0V, unless otherwise specified.
LOGIC
See specifications
t
HRC
t
HEC
t
C
NOTES:
1. Parameters guaranteed by design and sample tested.
2. Parameters 100% tested @ 25˚C on special orders.
3. 100% tested.
4. T
MIN
to T
MAX
.
Figure 6. Convert Mode Timing
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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READ MODE TIMING
CE
CS
t
SSR
R/C
t
SRR
A
0
t
SAR
STS
DB11–
DB0
HIGH IMPEDANCE
t
DD
CHARACTERISTICS
Typical @ 25˚C, VCC = +15V or +12V, V
PARAMETER MIN. TYP. MAX. UNITS CONDITIONS
t
Access Time From CE
DD
t
Data Valid After CE Low
HD
t
Output Float Delay
HL
t
CS to CE Setup 50 0 ns
SSR
t
R/C to CE Setup 0 0 ns
SRR
t t t t t
to CE Setup 50 ns
SARA0
CS Valid After CE Low 0 0 ns
HSR
R/C High After CE Low 0 50 ns
HRR HARA0 HS
Valid After CE Low 50 ns
STS Delay After Data Valid 300 1000 ns
= +5V, VEE = 0V, unless otherwise specified.
LOGIC
2
2
25 ns
2
t
HSR
t
HRR
t
HAR
DATA VALID
150 ns
150 ns
t
HL
t
HD
NOTES:
1. Parameters guaranteed by design and sample tested.
2. Parameters 100% tested @ 25˚C on special orders.
Figure 7. Read Mode Timing
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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STAND–ALONE MODE TIMING CHARACTERISTICS
R/C
STS
DB11–DB0
t
HRL
DATA VALID
t
DS
DATA VALID
t
C
t
HS
t
HDR
Typical @ 25˚C, VCC= +15V or +12V, V
= +5V, VEE =0V, unless otherwise specified.
LOGIC
PARAMETER MIN. TYP . MAX. UNITS CONDITIONS
t
Low R/C Pulse Width
HRL
tDSSTS Delay from R/C t
Data Valid After R/C Low
HDR
2
2
50 ns
2
25 ns
200 ns
tHSSTS Delay After Data Valid 2300 1000 ns t
High R/C Pulse Width 150 ns
HRH
t
Data Access Time 150 ns
DDR
NOTES:
1. Parameters guaranteed by design and sample tested.
2. Parameters 100% tested @ 25˚C on special orders.
Figure 8. Low Pulse for R/C — Outputs Enabled After Conversion
R/C
t
HRH
STS
t
DB11–DB0
Figure 9. High Pulse For R/C — Outputs Enabled While R/C is High, Otherwise High Impedance
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
DDR
HIGH–Z
t
DS
t
HDR
DATA VALID
13
t
C
HIGH–Z
Page 14
Figure 10. Typical FFT at Nyquist Sampling Rates
Model Monotonicity Linearity Gain TC Temperature Range Package Types 25µs Conversion Time
SP574BJ ...............11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C ....................... 0°C to +70 °C ................................. L, N, P, S
SP574BK ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... 0°C to +70°C ................................. L, N, P, S
SP574BA ..............11 Bits .............................. ±1.0 LSB ......................50ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP574BB ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP574BS .............. 11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C .......................–5 5°C to +125°C ........................................ Q
SP574BT ............... 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –55°C to +125°C ........................................ Q
15µs Conversion Time
SP674BJ ...............11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C ....................... 0°C to +70 °C ................................. L, N, P, S
SP674BK ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... 0°C to +70°C ................................. L, N, P, S
SP674BA ..............11 Bits .............................. ±1.0 LSB ......................50ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP674BB ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP674BS .............. 11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C .......................–5 5°C to +125°C ........................................ Q
SP674BT ............... 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –55°C to +125°C ........................................ Q
10µs Conversion Time
SP1674BJ .............11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C....................... 0°C to +70°C ................................. L, N, P, S
SP1674BK ............ 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... 0°C to +70°C ................................. L, N, P, S
SP1674BA ............ 11 Bits .............................. ±1.0 LSB ......................50ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP1674BB ............ 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP1674BS ............11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C ....................... –55 °C to +125°C ........................................ Q
SP1674BT............. 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –55°C to +125°C ........................................ Q
8µs Conversion Time
SP774BJ ...............11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C ....................... 0°C to +70 °C ................................. L, N, P, S
SP774BK ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... 0°C to +70°C ................................. L, N, P, S
SP774BA ..............11 Bits .............................. ±1.0 LSB ......................50ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP774BB ..............12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –40°C to +85°C ............................. L, N, P, S
SP774BS .............. 11 Bits .............................. ±1.0 LSB ...................... 50ppm/°C .......................–5 5°C to +125°C ........................................ Q
SP774BT ............... 12 Bits .............................. ±0.5 LSB ......................25ppm/°C ....................... –55°C to +125°C ........................................ Q
N — 28–pin, 0.3" wide plastic DIP .................. L — 28-pin, PLCC ....... S — 28–pin, 0.3" SOIC
P — 28–pin, 0.6" wide plastic DIP ......................................................... Q — 28–pin, 0.6" Ceramic DIP (consult factory)
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
ORDERING INFORMATION
14
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Corporation
SIGNAL PROCESSING EXCELLENCE
Sipex Corporation Headquarters and
Sales Office
22 Linnell Circle Billerica, MA 01821 TEL: (978) 667-8700 FAX: (978) 670-9001 e-mail: sales@sipex.com
Sales Office
233 South Hillview Drive Milpitas, CA 95035 TEL: (408) 934-7500 FAX: (408) 935-7600
Sipex Corporation reserves the right to make changes to any products described herein. Sipex does not assume any liability arising out of the application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others.
SP574B/674B/1674B/774B 12–Bit Sampling A/D Converters © Copyright 2000 Sipex Corporation
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