These are N-Channel power MOSFETs manufacturedusing
the MegaFET process. This process, which uses feature
sizes approaching those of LSI integrated circuits gives
optimum utilization of silicon, resulting in outstanding
performance. They were designed for use in applications
such as switching regulators, switching converters, motor
drivers, relay drivers and emitter switches for bipolar
transistors. These transistors can be operated directly from
integrated circuits.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
40
100
Figures 4, 12, 13
160
1.07
-55 to 175
300
260
A
A
W
W/oC
o
C
o
C
o
C
NOTES:
1. TJ = 25oC to 150oC.
2. Repetitive Rating: pulse width limited by maximum junction temperature.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistancer
DS(ON)ID
Turn-On Timet
Turn-On Delay Timet
d(ON)
Rise Timet
Turn-Off Delay Timet
d(OFF)
Fall Timet
Turn-Off Timet
Total Gate ChargeQ
g(TOT)VGS
Gate Charge at 10VQ
Threshold Gate ChargeQ
Thermal Resistance Junction to CaseR
Thermal Resistance Junction to AmbientR
FIGURE 5. SATURATION CHARACTERISTICSFIGURE 6. TRANSFER CHARACTERISTICS
4-452
Page 4
RFG40N10, RFP40N10, RF1S40N10SM
Typical Performance Curves
2.5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
= 10V, ID = 40A
V
GS
2.0
1.5
1.0
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-50050100150200
TJ,JUNCTION TEMPERATURE (oC)
Unless Otherwise Specified (Continued)
FIGURE 7. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
2.0
ID = 250µA
1.5
1.50
VGS = V
DS
ID = 250µA
1.25
1.00
0.75
0.50
NORMALIZED GATE
THRESHOLD VOLTAGE
0.25
0
-50050100150200
TJ,JUNCTION TEMPERATURE (oC)
FIGURE 8. NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
6000
5000
4000
VGS = 0V, f = 1MHz
C
= CGS + C
C
C
ISS
RSS
OSS
= C
GD
≈ CDS + C
GD
GD
1.0
0.5
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0
-50050100150200
TJ,JUNCTION TEMPERATURE (oC)
FIGURE 9. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
100
75
50
25
DRAIN TO SOURCE VOLTAGE (V)
DS,
V
0
VDD = BV
20
I
g(REF)
I
g(ACT)
DSS
0.75 BV
0.50 BV
0.25 BV
NOTE: Refer to Intersil Application Notes AN7254 and AN7260.
FIGURE 11. NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT
DSS
DSS
DSS
RL = 2.5Ω
I
= 2.25mA
g(REF)
V
= 10V
GS
t, TIME (µs)
3000
2000
C, CAPACITANCE (pF)
1000
0
0510152025
C
ISS
C
OSS
C
RSS
VDS, DRAIN TO SOURCE VOLTAGE (V)
FIGURE 10. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
10
0.75 BV
0.50 BV
0.25 BV
VDD = BV
DSS
DSS
DSS
DSS
I
g(REF)
80
I
g(ACT)
7.5
5.0
2.5
0
GATE TO SOURCE VOLTAGE (V)
GS,
V
4-453
Page 5
RFG40N10, RFP40N10, RF1S40N10SM
Test Circuits and Waveforms
V
DS
BV
DSS
L
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
+
V
DD
-
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 12. UNCLAMPED ENERGY TEST CIRCUITFIGURE 13. UNCLAMPED ENERGY WAVEFORMS
t
P
I
AS
t
AV
V
DS
V
DD
t
ON
t
d(ON)
t
R
L
+
V
DD
-
R
GS
V
GS
DUT
V
DS
0
V
GS
10%
0
r
90%
10%
50%
PULSE WIDTH
FIGURE 14. SWITCHING TIME TEST CIRCUITFIGURE 15. RESISTIVE SWITCHING WAVEFORMS
V
I
g(REF)
DS
R
L
V
GS
+
V
DD
-
DUT
V
DD
VGS= 2V
0
Q
g(TOT)
V
DS
Q
g(10)
V
GS
Q
g(TH)
VGS = 10V
t
d(OFF)
90%
t
OFF
50%
t
f
10%
VGS= 20V
90%
I
g(REF)
0
FIGURE 16. GATE CHARGE TEST CIRCUITFIGURE 17. GATE CHARGE WAVEFORMS
4-454
Page 6
RFG40N10, RFP40N10, RF1S40N10SM
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.inter sil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
4-455
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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