Datasheet NTE8212 Datasheet (NTE)

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NTE8212
Integrated Circuit
Schottky, 8–Bit Input/Output Port
Description:
The NTE8212 input/output port is an integrated circuit in a 24–Lead DIP type package and consists of an 8–bit latch with three–state output buffers along with control and device selection logic. Also included is a service request f lip–fl op f or t he c ontrol a nd g eneration o f i nterrupts t o t he m icroprocessor.
Features:
Absolute Maximum Ratings: (TA = +25°C, Note 1 unless otherwise specified)
All Output or Supply Voltages –0.5V to +7V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
All Input Voltages –1.0V to +5.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Currents 125mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating Temperature Range 0° to +70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage Temperature Range –65° to +150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Note 1. Stress above those listed under “Absolute Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Electrical Characteristics: (TA = 0° to +70°C, VCC = 5V ±5% unless otherwise specified)
Parameter Symbol Test Conditions Min Typ Max Unit
DC Characteristics
Input Load Current
STB, DS MD Input |IL2| –0.75 mA DS1 Input |IL3| –1.0 mA
Input Leakage Current
STB, DS, CLR, DI1 – DI8 Inputs |IH1| VR = 5.25V 10 µA MD Input |IH2| 30 µA DS1 Input |IH3| 40 µA
, CLR, DI1 – DI8 Inputs |IL1| VF = 0.45V –0.25 mA
2
Input Forward Voltge Clamp V Input Low V oltage V Input High V oltage V Output Low Voltage V Output High V oltage V
IC = –5mA –1.0 V
C IL
IH
OLIOL
OHIOH
= 15mA 0.48 V
= –1mA 3.65 V
0.85 V
2.0 V
Short Circuit Output Current IO5 VO = 0V, VCC = 5V –15 –75 mA Output Leakage Current, High Impedance
I
VO = 0.45V/5.25V 20 µA
O
State (DO0 – DO8)
Power Supply Current I
CC
130 mA
AC Characteritics
Pulse Width t
pw
Data to Output Delay t Write Enable to Output Delay t data Setup Time t
we
set
Data Hold Time t Reset to Output Delay t Set to Output Delay t Output Enable/Disable Time (Note 2) te/t Clear to Output Delay t
Input Pulse Amplitude = 2.5V, Input Rise & Fall Times = 5ns,
pd
Between 1V and 2V
Between 1V and 2V Measurement made at 1.5V with 15mA and 30pF Test Load
h
r
s
d
c
30 ns
30 ns 40 ns
15 ns 20 ns
40 ns 30 ns 45 ns 55 ns
Note 2. R1 = 300Ω/10KΩ; R2 = 600Ω/1KΩ
Capacitance: (TA = +25°C, VCC = 5V, V
Parameter Symbol Test Conditions Min Typ Max Unit
Input Capacitance C Input Capacitance C Output Capacitance C
IN IN
OUT
= 2.5V, f = 1MHz, Note 3 unless otherwise specified)
BIAS
DS1, MD 12 pF DS2, CLR, STB, DI1 – DI DO1 – DO
8
8
Note 3. This parameter is periodically sampled and not 100% tested.
9 pF 12 pF
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Functional Description: Data Latch
The 8 flip–flops that compose the data latch are of a “D” type design. The output (Q) of the flip–flop follows the data input (D) while the clock input (C) is high. Latching occurs when the clock (C) returns low.
The data latch is cleared by an asynchronous reset input (CLR (NOTE: Clock (C) overrides Reset (CLR
Output Buffer
The outputs of the data latch (Q) are connected to three–state, non–inverting output buffers. These buffers have a common control line (EN); enabling the buffer to transmit the data from the outputs of the data latch (Q) or disabling the buffer, forcing the output into a high impedance state (three–state).
This high–impedance state allows the designer to connect the NTE8212 directly to the microproces­sor bi–directional data bus.
Control Logic
The NTE8212 has four control inputs: DS1, DS2, MD and STB. These inputs are employed to control device selection, data latching, output buffer state and the service request flip–flop.
DS1, DS2 (Device Select)
These two inputs are employed for device selection. When DS1 is low and DS2 is high (DS1 DS2) the device is selected. In the selected state the output buffer is enabled and the service request flip– flop (SR) is asynchronously set.
).)
).
Service Request Flip–Flop (SR)
The (SR) flip–flop is employed to generate and control interrupts in microcomputer systems. It is asyn­chronously set by the CLR input (active low). When the (SR) flip–flop is set it is in the non–interrupting state.
The output (Q) of the (SR) flip–flop is connected to an inverting input of a NOR gate. The other input of the “NOR” gate is non–inverting and is connected to the device selection logic (DS1 DS2). The output of the NOR gate (INT ) is active low (interrupting state) for connection to active low input prior­ity generating circuits.
MD (Mode)
This input is employed to control the state of the output buffer and to determine the source of the clock (C) to the data latch.
When MD is in the output mode (high) the output buffers are enabled and the source of clock (C) to the data latch is from the device selection logic (DS1 DS2).
When MD is i n the input mode (low) the output buf fer state is determined by the device selection logic (DS1 DS2) and the source of clock (C) to the data latch is the STB (Strobe) input.
STB (Strobe)
STB is employed as the clock (C) to the data latch for the input mode (MD = 0) and to synchronously reset the service request (SR) flip–flop.
Note that the SR flip–flop triggers on the negative edge of STB which overrides CLR.
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Pin Connection Diagram
DS
MD
DI
DO
DI
DO
DI
DO
DI
DO
STB
GND
1
1
2 3
1
4
1
5
2
6
2
7
3
8
3
9 16
4
10
4
11
12 13
24 23 22 21 20 19 18 17
15 14
V
CC
INT DI
8
DO DI
7
DO DI
6
DO DI
5
DO CLR
DS
8
7
6
5
2
24 13
112
1.300 (33.02) Max .520 (13.2)
.225
(5.73)
Max
.100 (2.54)
.126
(3.22)
Min
.600 (15.24)1.100 (27.94)
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