MCM32A732/764•MCM32A832/864•MCM32A932/964
6
MOTOROLA FAST SRAM
CAPACITANCE (f = 1 MHz, dV = 3 V, T
A
= 25°C, Periodically sampled rather than 100% tested)
Characteristic
Symbol Max Unit
Cache Address Input Capacitance C
in
48 pF
Control Pin Input Capacitance (E, W) C
in
8 pF
I/O Capacitance C
I/O
8 pF
Tag Address Input Capacitance C
in
18 pF
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 5 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load Figure 1A Unless Otherwise Noted. . . . . . . . . . . . . . . .
READ CYCLE (See Notes 1 and 2)
Data Tag/Valid Dirty
Parameter Symbol Min Max Min Max Min Max Unit Notes
Read Cycle Time t
AVAV
30 — 30 — 30 — ns 3
Address Access Time xCA2–3
(Transparent Mode) A4 – A19
t
AVQV
t
AVQV
——2025——1212———25ns 9
Chip Select Access Time t
ELQV
— 20 — 12 — 20 ns 4
Output Enable to Output Valid t
GLQV
— 10 — 6 — — ns
Output Hold from Address Change t
AXQX
4 — 4 — 4 — ns 5,6,7
Enable Low to Output Active t
ELQX
4 — 4 — 4 — ns 5,6,7
Enable High to Output High–Z t
EHQZ
— 9 — 7 — 9 ns 5,6,7
Output Enable Low to Output Active t
GLQX
0 — 0 — 0 — ns 5,6,7
Output Enable High to Output High–Z t
GHQZ
— 8 — 6 — — ns 5,6,7
NOTES:
1. W
is high for read cycle.
2. E
= Exx, ET; W = Wxx, WT, WA; G = GA, GB
3. All timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E
going low.
5. At any given voltage and temperature, t
EHQZ
(max) is less than t
ELQX
(min), and t
GHQZ
(max) is less than t
GLQX
(min), both for a given
device and from device to device.
6. Transition is measured ±500 mV from steady–state voltage with load of Figure 1B.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E
= VIL, G = VIL).
9. TAG Address Access Time t
AVTV
.
AC TEST LOADS
OUTPUT
Z0 = 50
Ω
50
Ω
VL = 1.5 V
Figure 1A Figure 1B
5 pF
+5 V
OUTPUT
255
Ω
480
Ω
TIMING LIMITS
The table of timing values shows either a
minimum or a maximum limit for each parameter. Input requirements are specified from
the external system point of view. Thus, address setup time is shown as a minimum
since the system must supply at least that
much time (even though most devices do not
require it). On the other hand, responses from
the memory are specified from the device
point of view. Thus, the access time is shown
as a maximum since the device never provides data later than that time.