This N-Channel MOSFET has been designed
specifically to improve the overall efficiency of DC/DC
converters using either synchronous or conventional
switching PWM controllers. It has been optimized for
low gate charge, low R
and fast switching speed.
DS(ON)
Applications
• DC/DC converter
D
D
D
D
D
D
D
D
SO-8
Pin 1
SO-8
S
Absolute Maximum RatingsT
G
G
S
S
S
S
S
o
=25
C unless otherwise noted
A
Features
• 10.8 A, 40 V. R
• Low gate charge (30 nC)
• High performance trench technology for extremely
DS(ON)
5
6
7
8
low R
• High power and current handling capability
= 10.5 mΩ @ VGS = 10 V
DS(ON)
4
3
2
1
Symbol Parameter Ratings Units
V
Drain-Source Voltage 40 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a) 10.8 A
– Pulsed 45
PD
TJ, T
STG
Power Dissipation for Single Operation (Note 1a) 2.5
(Note 1b)
Operating and Storage Junction Temperature Range –55 to +150
EAS Drain-Source Avalanche Energy Single Pulse, VDD=20V, ID=10.8A 240 mJ
IAS Drain-Source Avalanche Current 10.8 A
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆TJ
I
Zero Gate Voltage Drain Current VDS = 32 V, VGS = 0 V 1
DSS
I
GSSF
I
GSSR
Breakdown Voltage Temperature
Coefficient
Gate–Body Leakage, Forward VGS = 20 V, VDS = 0 V 100 nA
Gate–Body Leakage, Reverse VGS = –20 V, VDS = 0 V –100 nA
VGS = 0 V, ID = 250 µA
ID = 250 µA, Referenced to 25°C
40 V
42
mV/°C
µA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
I
D(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source On–Resistance
On–State Drain Current VGS = 10 V, VDS = 5 V 22 A
VDS = VGS, ID = 250 µA
ID = 250 µA, Referenced to 25°C
VGS = 10 V, ID = 10.8 A
= 10 V,ID = 10.8 A, TJ=115°C
V
GS
2 3.9 5 V
–8
8
10.5
13
21
mV/°C
mΩ
gFS Forward Transconductance VDS = 10 V, ID = 10.8 A 36 S
Dynamic Characteristics
C
Input Capacitance 1686 pF
iss
C
Output Capacitance 384 pF
oss
C
Reverse Transfer Capacitance
rss
V
= 20 V, V
DS
f = 1.0 MHz
= 0 V,
GS
185 pF
Switching Characteristics (Note 2)
t
Turn–On Delay Time 11 22 ns
d(on)
tr Turn–On Rise Time 9 18 ns
t
Turn–Off Delay Time 30 48 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 30 40 nC
Qgs Gate–Source Charge 9 nC
Qgd Gate–Drain Charge
V
= 20 V, ID = 1 A,
DD
= 10 V, R
V
GS
GEN
= 6 Ω
VDS = 20 V, ID = 10.8 A,
VGS = 10 V
15 27 ns
10 nC
FDS4780 Rev B (W)
Page 3
FDS4780
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions MinTyp Max Units
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 2.1 A
VSD
Drain–Source Diode Forward
Voltage
= 0 V, IS = 2.1 A (Note 2) 0.7 1.2 V
V
GS
trr Diode Reverse Recovery Time IF = 10.8 A, diF/dt = 100 A/µs 27 nS
Qrr Diode Reverse Recovery Charge 58 nC
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
R
(t) = r(t) * R
JA
0.2
0.1
0.01
THERMAL RESISTANCE
r(t), NORMALIZED EFFECTIVE TRANSIENT
0.001
0.1
0.05
0.02
0.01
SINGLE PULSE
θ
R
JA
θ
P(pk
- TA = P * R
T
J
Duty Cycle, D = t
0.00010.0010.010.11101001000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
= 125oC/W
t
1
t
2
θ
JA
θ
(t)
JA
/ t
1
2
FDS4780 Rev B (W)
Page 6
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not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I2
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