Max r
Max r
Max r
Max r
Low profile - 0.8 mm maximum - in the new package MicroFET
2x2 mm
HBM ESD protection level >2kV (Note 3)
RoHS Compliant
Free from halogenated compounds and antimony
oxides
= 90 mΩ at VGS = -4.5 V, ID = -2.9 A
DS(on)
= 130 mΩ at VGS = -2.5 V, ID = -2.6 A
DS(on)
= 170 mΩ at VGS = -1.8 V, ID = -1.7 A
DS(on)
= 240 mΩ at VGS = -1.5 V, ID = -1.0 A
DS(on)
General Description
This device is designed specifically as a single package solution
for the battery charge switch in cellular handset and other
ultra-portable applications. It features two independent
P-Channel MOSFETs with low on-state resistance for minimum
conduction losses. When connected in the typical common
source configuration, bi-directional current flow is possible.
The MicroFET 2X2 package offers exceptional thermal
performance for its physical size and is well suited to linear mode
applications.
FDMA3023PZ Dual P-Channel PowerTrench
December 2008
®
MOSFET
PIN 1
S1G1 D2
1
S1
1
1
1
1
1
1
D1D2
2
G1
2
2
2
2
2
2
D2
3
3
3
3
3
3
D1 G2
MicroFET 2x2
MOSFET Maximum RatingsT
SymbolParameterRatingsUnits
V
DS
V
GS
I
D
P
D
, T
T
J
STG
Drain to Source Voltage-30V
Gate to Source Voltage±8V
Drain Current -Continuous (Note 1a)-2.9
-Pulsed-6
Power Dissipation (Note 1a)1.4
Power Dissipation (Note 1b)0.7
Operating and Storage Junction Temperature Range-55 to +150°C
A
S2
= 25 °C unless otherwise noted
3
6
D1
6
6
6
6
6
6
G2
5
5
5
5
5
5
5
S2
4
4
4
4
4
4
4
Thermal Characteristics
R
θJA
R
θJA
R
θJA
R
θJA
Thermal Resistance for Single Operation, Junction to Ambient (Note 1a)86
Thermal Resistance for Single Operation, Junction to Ambient (Note 1b)173
Thermal Resistance for Dual Operation, Junction to Ambient (Note 1c)69
Thermal Resistance for Dual Operation, Junction to Ambient (Note 1d)151
Drain to Source Breakdown VoltageID = -250 µA, VGS = 0 V-30V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain CurrentVDS = -24 V, V
Gate to Source Leakage CurrentVGS = ±8 V, V
I
= -250 µA, referenced to 25 °C-24mV/°C
D
= 0 V-1µA
GS
= 0 V±100nA
DS
On Characteristics
V
GS(th)
∆V
∆T
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold VoltageVGS = VDS, ID = -250 µA-0.4-0.6-1.0V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= -250 µA, referenced to 25 °C3mV/°C
D
= -4.5 V, ID = -2.9 A7190
V
GS
V
= -2.5 V, ID = -2.6 A97130
GS
= -1.8 V, ID = -1.7 A122170
V
GS
= -1.5 V, ID = -1.0 A151240
V
GS
= -4.5 V, ID = -2.9 A, TJ = 125 °C110140
V
GS
Forward TransconductanceVDS = -5 V, ID = -2.9 A10S
Dynamic Characteristics
C
iss
C
oss
C
rss
Input Capacitance
Output Capacitance5570pF
Reverse Transfer Capacitance4565pF
= -15 V, VGS = 0 V,
V
DS
f = 1 MHz
400530pF
mΩ
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g(TOT)
Q
gs
Q
gd
Turn-On Delay Time
Rise Time 410ns
Turn-Off Delay Time62100ns
Fall Time 1833ns
Total Gate Charge
Gate to Source Charge0.9nC
Gate to Drain “Miller” Charge1.9nC
Drain-Source Diode Characteristics
I
S
V
SD
t
rr
Q
rr
Maximum Continuous Drain-Source Diode Forward Current-1.1A
Source to Drain Diode Forward VoltageV
Reverse Recovery Time
Reverse Recovery Charge6.613nC
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intended to be an exhaustive list of all such trademarks.
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EcoSPARK
EfficentMax™
EZSWITCH™ *
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®
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are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
®
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Definition of Terms
.
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PreliminaryFirst Production
No Identification NeededFull Production
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Datasheet contains the design specifications f or product development. S pecifications may
change in any manner without notice.
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