•74ABTH16373B incorporates bus-hold data inputs which
eliminate the need for external pull-up resistors to hold unused
inputs
•Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs
•Output capability: +64mA/–32mA
•Latch-up protection exceeds 500mA per JEDEC Std 17
•ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 200V per Machine Model
DESCRIPTION
The 74ABT16374B high-performance BiCMOS device combines
low static and dynamic power dissipation with high speed and high
output drive.
The 74ABT16374B has two 8-bit, edge triggered registers, with each
register coupled to eight 3-State output buffers. The two sections of
each register are controlled independently by the clock (nCP) and
Output Enable (nOE
Each register is fully edge triggered. The state of each D input, one
set-up time before the Low-to-High clock transition, is transferred to
the corresponding flip-flop’s Q output.
The 3-State output buffers are designed to drive heavily loaded
3-State buses, MOS memories, or MOS microprocessors. Each
active-Low Output Enable (nOE
its register independent of the clock operation.
When nOE
register. When nOE is High, the outputs for that register are in the
High-impedance “OFF” state, which means they will neither drive
nor load the bus.
Two options are available, 74ABT16374B which does not have the
bus-hold feature and 74ABTH16374B which incorporates the
bus-hold feature.
) control gates.
is Low, the stored data appears at the outputs for that
PACKAGESTEMPERATURE RANGE OUTSIDE NORTH AMERICANORTH AMERICADWG NUMBER
48-Pin Plastic SSOP Type III–40°C to +85°C74ABT16374B DLBT16374B DLSOT370-1
48-Pin Plastic TSSOP Type II–40°C to +85°C74ABT16374B DGGBT16374B DGGSOT362-1
48-Pin Plastic SSOP Type III–40°C to +85°C74ABTH16374B DLBH16374B DLSOT370-1
48-Pin Plastic TSSOP Type II–40°C to +85°C74ABTH16374B DGGBH16374B DGGSOT362-1
H = High voltage level
h = High voltage level one set-up time prior to the High-to-Low E transition
L = Low voltage level
l= Low voltage level one set-up time prior to the High-to-Low E transition
NC= No change
X = Don’t care
Z = High impedance “off” state
↑ = Low-to-High clock transition
= Not a Low-to-High clock transition
↑
↑
↑
↑
↑
l
h
X
nDx
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
CC
I
IK
V
I
OK
V
OUT
OUT
T
stg
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
DC supply voltage–0.5 to +7.0V
DC input diode currentVI < 0–18mA
DC input voltage
I
DC output diode currentVO < 0–50mA
DC output voltage
High-level output voltageVCC = 5.0V; IOH = –3mA; VI = VIL or V
VCC = 4.5V; IOH = –32mA; VI = VIL or V
Low-level output voltageVCC = 4.5V; IOL = 64mA; VI = VIL or V
Power-up output voltage
I
nput leakage curren
3
VCC = 5.5V; IO = 1mA; VI = GND or V
;
= 5.5V;
CC
=
I
CC
VCC = 5.5V; VI = VCC or
I
p
74ABTH16374BVCC = 5.5V; VI = V
GND
CC
VCC = 5.5V; VI = 0
or
IH
IH
IH
IH
CC
Control pins±0.01±1±1
p
VCC = 4.5V; VI = 0.8V5050
I
HOLD
Bus Hold current inputs
74ABTH16374B
VCC = 4.5V; VI = 2.0V–75–75
VCC = 5.5V; VI = 0 to 5.5V±800
I
OFF
I
PU/PD
I
OZH
I
OZL
I
CEX
I
I
CCH
I
CCL
I
CCZ
∆I
∆I
O
CC
CC
Power-off leakage currentVCC = 0.0V; VO or VI ≤ 4.5V±5.0±100±100µA
Power-up/down 3-State
output current
4
3-State output High currentVCC = 5.5V; VO = 2.7V; VI = VIL or V
3-State output Low currentVCC = 5.5V; VO = 0.5V; VI = VIL or V
Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or V
Output current
1
Quiescent supply currentVCC = 5.5V; Outputs Low, VI = GND or V
VCC = 2.1V; VO = 0.5V;
VI = GND or VCC; VOE = GND
IH
IH
CC
VCC = 5.5V; VO = 2.5V–50–70–180–50–180mA
VCC = 5.5V; Outputs High, VI = GND or V
CC
CC
VCC = 5.5V; Outputs 3-State;
Additional supply current
per input pin
2
74ABT16374B
Additional supply current
per input pin
2
74ABTH16374B
VI = GND or V
VCC = 5.5V; one input at 3.4V, other inputs at
V
or GND
CC
VCC = 5.5V; one input at 3.4V, other inputs at
VCC or GND
CC
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any V
transition time of up to 100µsec is permitted.
5. Unused pins at V
6. This is the bus hold overdrive current required to force the input to the opposite logic state.
or GND.
CC
between 0V and 2.1V with a transition time of up to 10msec. From VCC = 2.1V to VCC = 5V ± 10% a
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
74ABT16374B
74ABTH16374B
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 05-96
Document order number:9397-750-03492
yyyy mmm dd
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