Datasheet 2SK2959 Datasheet (HIT)

Page 1
Features
e
Low on-resistance
= 7mtyp.
DS(on)
4V gate drive devices.
High speed switching
Outline
2SK2959
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-569C (Z)
4th. Edition
Aug 1998
TO–220AB
G
D
1
2
S
1. Gate
2. Drain(Flang
3. Source
3
Page 2
2SK2959
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note1
Note2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V Gate to source breakdown voltage V Zero gate voltege drain current I Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
R
DS(on)
resistance Static drain to source on state
R
DS(on)
resistance Forward transfer admittance |yfs|2545—S ID = 25A, VDS = 10V Input capacitance Ciss 2000 pF VDS = 10V Output capacitance Coss 1500 pF VGS = 0 Reverse transfer capacitance Crss 350 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body–drain diode forward voltage V Body–drain diode reverse
t
d(on)
r
d(off)
f
DF
rr
recovery time Note: 3. Pulse test
30——V I ±20——V I ——10µAVDS = 30 V, VGS = 0 ——±10 µAVGS = ±16V, VDS = 0
1.0 2.0 V ID = 1mA, VDS = 10V — 7.0 10 m ID = 25A, VGS = 10V
—1218mΩID = 25A, VGS = 4V
20 ns VGS = 10V, ID = 25A — 330 ns RL = 0.4 190 ns — 190 ns — 0.95 V IF = 50A, VGS = 0 — 60 ns IF = 50A, VGS = 0
30 V ±20 V 50 A 200 A 50 A 75 W
= 10mA, VGS = 0
D
= ±100µA, VDS = 0
G
diF/ dt =50A/µs
Note3
Note3
Note3
2
Page 3
Main Characteristics
2SK2959
100
Power vs. Temperature Derating
75
50
25
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
10 V
50
5 V
4 V
40
D
3.5 V
30
Pulse Test
3 V
1000
Maximum Safe Operation Area
300 100
D
30 10
Operation in
3
this area is
Drain Current I (A)
limited by R
1
0.3 Ta = 25°C
0.1
0.1 0.3 1 Drain to Source Voltage V (V)
Typical Transfer Characteristics
50
V = 10 V
DS
Pulse Test
40
D
30
10 µs
PW = 10 ms (1 shot)
DC Operation
(Tc = 25°C)
DS(on)
100 µs
1 ms
3
10
DS
30
100
20
Drain Current I (A)
10
0
246810
Drain to Source Voltage V (V)
2.5 V
V = 2 V
GS
DS
20
75°C
Drain Current I (A)
10
0
12345
Gate to Source Voltage V (V)
25°C
Tc = –25°C
GS
3
Page 4
2SK2959
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
0.5 Pulse Test
0.4
DS(on)
V (V)
0.3
0.2
I = 20 A
D
0.1
10 A
Drain to Source Saturation Voltage
0
48
Gate to Source Voltage V (V)
12
16 20 1
GS
Static Drain to Source on State Resistance
vs. Temperature
20
W
Pulse Test
I = 5, 10, 20 A
D
16
DS(on)
R (m )
V = 4 V
GS
12
8
10 V
4
5 ,10, 20 A
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
5 A
Static Drain to Source on State Resistance
vs. Drain Current
500
Pulse Test
W
500
DS(on)
100
R (m )
50
20
V = 4 V
GS
10
Drain to Source On State Resistance
5
Drain Current I (A)
10
10 V
205
D
Forward Transfer Admittance vs.
Drain Current
50
fs
20
10
Tc = –25 °C
25 °C
5
75 °C
2
1
Forward Transfer Admittance |y | (S)
0.5
0.1
0.2 1 2 10
0.5 5 Drain Current I (A)
V = 10 V
DS
Pulse Test
D
100250
200
20
50
4
Page 5
2SK2959
Body–Drain Diode Reverse
Recovery Time
100
50
20
10
5
2
Reverse Recovery Time trr (ns)
1
di / dt = 50 A / µs V = 0, Ta = 25 °C
GS
0.1 0.3 1 3 10 30 100
Reverse Drain Current I (A)
DR
Dynamic Input Characteristics
50
I = 50 A
D
40
DS
V
GS
30
V
DS
V = 5 V
DD
20
10 V 25 V
20
16
12
8
10000
3000
1000
300
100
Capacitance C (pF)
300
10
01020304050
Drain to Source Voltage V (V)
1000
500
GS
200
100
50
Typical Capacitance vs. Drain to Source Voltage
Ciss
Coss
Crss
V = 0
GS
f = 1 MHz
Switching Characteristics
V = 10 V, V = 10 V
GS
DD
PW = 5 µs, duty < 1 %
t
d(off)
t
f
t
r
DS
10
Drain to Source Voltage V (V)
0
V = 25 V
DD
10 V
5 V
20 40 60 80 100
Gate Charge Qg (nc)
4
Switching Time t (ns)
20
Gate to Source Voltage V (V)
0
10
0.1 0.2 2 10 50
0.5 5 Drain Current I (A)
t
d(on)
201
D
5
Page 6
2SK2959
Reverse Drain Current vs.
Source to Drain Voltage
50
3
s (t)
1
g
0.3
D = 1
0.5
40
DR
30
10 V
5 V
V = 0, –5 V
GS
20
10
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Pulse Test
SD
Normalized Transient Thermal Impedance vs. Pulse Width
Tc = 25°C
0.2
q g q
0.1
0.1
ch – c(t) = s (t) • ch – c
q
ch – c = 1.67 °C/W, Tc = 25 °C
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
P
DM
PW T
D =
PW
T
0.01 10 µ
100 µ 1 m 10 m
100 m 1 10
Pulse Width PW (S)
6
Page 7
Switching Time Test Circuit Waveform
2SK2959
Vin Monitor
Vin 10 V
50W
D.U.T.
R
L
V
DD
= 10 V
Vout Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
7
Page 8
2SK2959
Package Dimensions
Unit: mm
2.79 ±0.2
1.27
18.5 ±0.57.8 ±0.5
1.2±0.1
2.54 ±0.5
10.16±0.2
9.5
8.0
1.27±0.1
1.5 max
0.76 ±0.1
2.54 ±0.5
f 3.6
+ 0.2
– 0.1
6.4
+ 0.1 – 0.08
15.0 ±0.3
0.5±0.1
14.0 ±0.5
2.7 max
4.44±0.2
1.26±0.15
Hitachi Code
EIAJ
JEDEC
TO–220AB
SC–46
8
Page 9
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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