Datasheet 2SK2928 Datasheet (HIT)

Page 1
Features
e
Low on-resistance
= 0.040typ.
DS(on)
4V gate drive devices.
High speed switching
Outline
2SK2928
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-551B (Z)
3rd. Edition
Jun 1998
TO–220AB
G
D
1
2
S
1. Gate
2. Drain(Flang
3. Source
3
Page 2
2SK2928
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Avalanche current I Avalanche energy E Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Ta = 25°C
3. Value at Tch = 25°C, Rg 50
60 V ±20 V 15 A 60 A 15 A 15 A 19 mJ 40 W
2
Page 3
2SK2928
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V Gate to source breakdown voltage V Zero gate voltege drain current I Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state R resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
60——V I ±20——V I ——10µAVDS = 60 V, VGS = 0 ——±10 µAVGS = ±16V, VDS = 0
1.5 2.5 V ID = 1mA, VDS = 10V — 0.040 0.052 ID = 8A, VGS = 10V
0.060 0.105 ID = 8A, VGS = 4V Forward transfer admittance |yfs| 7 11 S ID = 8A, VDS = 10V Input capacitance Ciss 500 pF VDS = 10V Output capacitance Coss 260 pF VGS = 0 Reverse transfer capacitance Crss 110 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body–drain diode forward voltage V Body–drain diode reverse recovery
t
d(on)
r
d(off)
f
DF
rr
10 ns VGS = 10V, ID = 8A
80 ns RL = 3.75
100 ns
110 ns
0.9 V IF = 15A, VGS = 0
50 ns IF = 15A, VGS = 0 time
Note: 4. Pulse test
= 10mA, VGS = 0
D
= ±100µA, VDS = 0
G
diF/ dt =50A/µs
Note4
Note4
Note4
3
Page 4
2SK2928
Main Characteristics
Power vs. Temperature Derating
80
0
60
40
20
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
10 V
6 V 5 V
20
4 .5 V
16
4 V
Pulse Test
1000
Maximum Safe Operation Area
300 100
D
30 10
3 1
Operation in this area is limited by R
Ta = 25°C
Drain Current I (A)
0.3
0.1
0.1 0.3 1 Drain to Source Voltage V (V)
Typical Transfer Characteristics
20
V = 10 V
DS
Pulse Test
16
10 µs
10
100 µs
1 ms
30
DS
PW = 10 ms (1shot)
DC Operation (Tc = 25°C)
DS(on)
3
100
D
12
8
Drain Current I (A)
4
0
Drain to Source Voltage V (V)
4
3.5 V
3 V
V = 2.5 V
GS
246810
DS
D
12
8
Drain Current I (A)
4
0
Tc = 75°C
12345
Gate to Source Voltage V (V)
25°C
–25°C
GS
Page 5
2SK2928
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
2.0
1.6
DS(on)
V (V)
1.2
0.8
0.4
Drain to Source Saturation Voltage
0
48
12
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.20 Pulse Test
W
0.16
DS(on)
R ( )
0.12
I = 10 A
D
Static Drain to Source on State Resistance
1.0
vs. Drain Current
Pulse Test
0.5
DS(on)
0.2
R ( )W
I = 20 A
D
0.1 V = 4 V
GS
0.05
10 A
5 A
0.02
Drain to Source On State Resistance
0.01
16 20 5 20 100110502
GS
Drain Current I (A)
Forward Transfer Admittance vs.
20
fs
5 A
10
5
Tc = –25 °C
Pulse Test
10 V
D
Drain Current
25 °C
V = 4 V
0.08
GS
0.04 10 V
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
2
5 A20 A 10 A
1
Forward Transfer Admittance |y | (S)
0.5
0.1 0.2 1 5
75 °C
V = 10 V
DS
Pulse Test
0.5 2
Drain Current I (A)
D
10
20
5
Page 6
2SK2928
Body–Drain Diode Reverse
500
Recovery Time
di / dt = 50 A / µs V = 0, Ta = 25 °C
200
GS
100
50
20
10
Reverse Recovery Time trr (ns)
5
0.1 0.5 1 2 100.2 5 Reverse Drain Current I (A)
Dynamic Input Characteristics
100
I = 15A
D
80
DS
60
V
DS
V
GS
V = 10 V
DD
40
20
Drain to Source Voltage V (V)
0
V = 50 V
DD
25 V 10 V
8 16 24 32 400
Gate Charge Qg (nc)
DR
25 V 50 V
Typical Capacitance vs. Drain to Source Voltage
2000 1000
500
200 100
50
Capacitance C (pF)
20
V = 0
GS
f = 1 MHz
10
20
01020304050
Drain to Source Voltage V (V)
20
16
GS
1000
300
Switching Characteristics
100
12
30
8
10
4
Switching Time t (ns)
3
Gate to Source Voltage V (V)
0
1
0.1 0.2 1 5 10
Ciss
Coss
Crss
t
d(off)
t
f
t
r
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1 %
0.5
Drain Current I (A)
2
D
DS
20
6
Page 7
2SK2928
Reverse Drain Current vs.
Source to Drain Voltage
20
16
12
10 V
5 V
DR
8
4
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin 15 V
50W
V = 0, –5 V
GS
Pulse Test
SD
L
I
AP
Monitor
D. U. T
Maximun Avalanche Energy vs.
Channel Temperature Derating
25
I = 15 A
AR
20
AP
V = 25 V
DD
duty < 0.1 % Rg > 50
W
15
10
5
0
Repetitive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
V
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
DSS
V – V
DSS DD
V
DS
V
(BR)DSS
7
Page 8
2SK2928
3
1
0.3
0.1
0.03
Normalized Transient Thermal Impidance @ `
0.01 10 µ
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Normalized Transient THermal Impedance vs. Width
q g q
ch – c(t) = s (t) • ch – c
q
ch – c = 3.12 °C/W, Tc = 25 °C
P
DM
PW
T
100 µ 1 m 10 m
100 m 1 10
Pulse Width @PW (S)
Tc = 25°C
PW
D =
T
Switching Time Test Circuit
Vin Monitor
Vout Monitor
D.U.T.
R
L
V
Vin 10 V
50W
DD
= 30 V
Vin
Vout
td(on)
10%
10%
Waveform
90%
tr
90%
td(off)
90%
10%
t
f
8
Page 9
Package Dimensions
2SK2928
Unit: mm
2.79 ±0.2
1.27
18.5 ±0.57.8 ±0.5
1.2±0.1
2.54 ±0.5
10.16±0.2
9.5
8.0
1.27±0.1
1.5 max
0.76 ±0.1
2.54 ±0.5
f 3.6
+ 0.2
– 0.1
6.4
+ 0.1 – 0.08
15.0 ±0.3
0.5±0.1
14.0 ±0.5
2.7 max
4.44±0.2
1.26±0.15
Hitachi Code
EIAJ
JEDEC
TO–220AB
SC–46
9
Page 10
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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