
Features
• Low on-resistance
R
= 0.040Ω typ.
DS(on)
• 4V gate drive devices.
• High speed switching
Outline
2SK2928
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-551B (Z)
3rd. Edition
Jun 1998
TO–220AB
G
D
1
2
S
1. Gate
2. Drain(Flang
3. Source
3

2SK2928
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
Gate to source voltage V
Drain current I
Drain peak current I
Body-drain diode reverse drain current I
Avalanche current I
Avalanche energy E
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Ta = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
60 V
±20 V
15 A
60 A
15 A
15 A
19 mJ
40 W
2

2SK2928
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Zero gate voltege drain current I
Gate to source leak current I
Gate to source cutoff voltage V
Static drain to source on state R
resistance R
(BR)DSS
(BR)GSS
DSS
GSS
GS(off)
DS(on)
DS(on)
60——V I
±20——V I
——10µAVDS = 60 V, VGS = 0
——±10 µAVGS = ±16V, VDS = 0
1.5 — 2.5 V ID = 1mA, VDS = 10V
— 0.040 0.052 Ω ID = 8A, VGS = 10V
— 0.060 0.105 Ω ID = 8A, VGS = 4V
Forward transfer admittance |yfs| 7 11 — S ID = 8A, VDS = 10V
Input capacitance Ciss — 500 — pF VDS = 10V
Output capacitance Coss — 260 — pF VGS = 0
Reverse transfer capacitance Crss — 110 — pF f = 1MHz
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
Body–drain diode forward voltage V
Body–drain diode reverse recovery
t
d(on)
r
d(off)
f
DF
rr
— 10 — ns VGS = 10V, ID = 8A
— 80 — ns RL = 3.75Ω
— 100 — ns
— 110 — ns
— 0.9 — V IF = 15A, VGS = 0
— 50 — ns IF = 15A, VGS = 0
time
Note: 4. Pulse test
= 10mA, VGS = 0
D
= ±100µA, VDS = 0
G
diF/ dt =50A/µs
Note4
Note4
Note4
3

2SK2928
Main Characteristics
Power vs. Temperature Derating
80
0
60
40
20
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
10 V
6 V 5 V
20
4 .5 V
16
4 V
Pulse Test
1000
Maximum Safe Operation Area
300
100
D
30
10
3
1
Operation in
this area is
limited by R
Ta = 25°C
Drain Current I (A)
0.3
0.1
0.1 0.3 1
Drain to Source Voltage V (V)
Typical Transfer Characteristics
20
V = 10 V
DS
Pulse Test
16
10 µs
10
100 µs
1 ms
30
DS
PW = 10 ms (1shot)
DC Operation (Tc = 25°C)
DS(on)
3
100
D
12
8
Drain Current I (A)
4
0
Drain to Source Voltage V (V)
4
3.5 V
3 V
V = 2.5 V
GS
246810
DS
D
12
8
Drain Current I (A)
4
0
Tc = 75°C
12345
Gate to Source Voltage V (V)
25°C
–25°C
GS

2SK2928
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
2.0
1.6
DS(on)
V (V)
1.2
0.8
0.4
Drain to Source Saturation Voltage
0
48
12
Gate to Source Voltage V (V)
Static Drain to Source on State Resistance
vs. Temperature
0.20
Pulse Test
W
0.16
DS(on)
R ( )
0.12
I = 10 A
D
Static Drain to Source on State Resistance
1.0
vs. Drain Current
Pulse Test
0.5
DS(on)
0.2
R ( )W
I = 20 A
D
0.1
V = 4 V
GS
0.05
10 A
5 A
0.02
Drain to Source On State Resistance
0.01
16 20 5 20 100110502
GS
Drain Current I (A)
Forward Transfer Admittance vs.
20
fs
5 A
10
5
Tc = –25 °C
Pulse Test
10 V
D
Drain Current
25 °C
V = 4 V
0.08
GS
0.04
10 V
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature Tc (°C)
2
5 A20 A 10 A
1
Forward Transfer Admittance |y | (S)
0.5
0.1 0.2 1 5
75 °C
V = 10 V
DS
Pulse Test
0.5 2
Drain Current I (A)
D
10
20
5

2SK2928
Body–Drain Diode Reverse
500
Recovery Time
di / dt = 50 A / µs
V = 0, Ta = 25 °C
200
GS
100
50
20
10
Reverse Recovery Time trr (ns)
5
0.1 0.5 1 2 100.2 5
Reverse Drain Current I (A)
Dynamic Input Characteristics
100
I = 15A
D
80
DS
60
V
DS
V
GS
V = 10 V
DD
40
20
Drain to Source Voltage V (V)
0
V = 50 V
DD
25 V
10 V
8 16 24 32 400
Gate Charge Qg (nc)
DR
25 V
50 V
Typical Capacitance vs.
Drain to Source Voltage
2000
1000
500
200
100
50
Capacitance C (pF)
20
V = 0
GS
f = 1 MHz
10
20
01020304050
Drain to Source Voltage V (V)
20
16
GS
1000
300
Switching Characteristics
100
12
30
8
10
4
Switching Time t (ns)
3
Gate to Source Voltage V (V)
0
1
0.1 0.2 1 5 10
Ciss
Coss
Crss
t
d(off)
t
f
t
r
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1 %
0.5
Drain Current I (A)
2
D
DS
20
6

2SK2928
Reverse Drain Current vs.
Source to Drain Voltage
20
16
12
10 V
5 V
DR
8
4
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Avalanche Test Circuit Avalanche Waveform
V
DS
Monitor
Rg
Vin
15 V
50W
V = 0, –5 V
GS
Pulse Test
SD
L
I
AP
Monitor
D. U. T
Maximun Avalanche Energy vs.
Channel Temperature Derating
25
I = 15 A
AR
20
AP
V = 25 V
DD
duty < 0.1 %
Rg > 50
W
15
10
5
0
Repetitive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
V
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
DSS
V – V
DSS DD
V
DS
V
(BR)DSS
7

2SK2928
3
1
0.3
0.1
0.03
Normalized Transient Thermal Impidance @ `
0.01
10 µ
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Normalized Transient THermal Impedance vs. Width
q g q
ch – c(t) = s (t) • ch – c
q
ch – c = 3.12 °C/W, Tc = 25 °C
P
DM
PW
T
100 µ 1 m 10 m
100 m 1 10
Pulse Width @PW (S)
Tc = 25°C
PW
D =
T
Switching Time Test Circuit
Vin Monitor
Vout
Monitor
D.U.T.
R
L
V
Vin
10 V
50W
DD
= 30 V
Vin
Vout
td(on)
10%
10%
Waveform
90%
tr
90%
td(off)
90%
10%
t
f
8

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