Datasheet 2SK2736 Datasheet (HIT)

Page 1
Features
Low on-resistance
R
= 20 mtyp. (VGS = 10V, ID = 15 A)
4V gate drive devices.
High speed switching
Outline
2SK2736
Silicon N Channel DV–L MOS FET
High Speed Power Switching
ADE-208-544
1st. Edition
TO–220CFM
G
D
1
2
3
S
1. Gate
2. Drain
3. Source
Page 2
2SK2736
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body to drain diode reverse drain current I Channel dissipation Pch*
DSS
GSS
D
D(pulse)
DR
1
*
2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
30 V ±20 V 30 A 120 A 30 A 25 W
2
Page 3
2SK2736
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
30——V I
voltage Gate to source breakdown
V
(BR)GSS
±20——V I
voltage Zero gate voltege drain
I
DSS
——10µAV
current Gate to source leak current I Gate to source cutoff voltage V Static drain to source on state R resistance R
GSS
GS(off)
DS(on)
DS(on)
——±10 µAV
1.0 2.0 V ID = 1mA, VDS = 10V —2028mΩI
—3550mΩI Forward transfer admittance |yfs|1218—SI Input capacitance Ciss 750 pF VDS = 10V Output capacitance Coss 520 pF VGS = 0 Reverse transfer capacitance Crss 210 pF f = 1MHz Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body to drain diode forward
V
d(on)
r
d(off)
f
DF
16 ns VGS = 10V, ID = 15A
260 ns RL = 0.67
—85—ns
—90—ns
1.0 V IF = 30A, VGS = 0 voltage
Body to drain diode reverse
t
rr
45 ns IF = 30A, VGS = 0 recovery time
Note: 1. Pulse test
= 10mA, VGS = 0
D
= ±100µA, VDS = 0
G
= 30 V, VGS = 0
DS
= ±16V, VDS = 0
GS
= 15A, VGS = 10V*
D
= 15A, VGS = 4V*
D
= 15A, VDS = 10V*
D
diF/ dt = 50A/µs
1
1
1
See characteristics curves of 2SK2684
3
Page 4
2SK2736
Main Characteristics
Power vs. Temperature Derating
40
30
20
10
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Normalized Transient Thermal Impedance vs. Pulse Width
3
500
Maximum Safe Operation Area
200 100
D
50 20
DC Operation (Tc = 25°C)
10
5 2
1
0.5
Operation in this area is limited by R
Ta = 25 °C
Drain Current I (A)
0.1 0.3 1 Drain to Source Voltage V (V)
10 µs
100 µs
PW = 10 ms (1shot)
DS(on)
1 ms
3
10
30
DS
100
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.03
Normalized Transient Thermal Impedance
0.01 10 µ
0.1
0.05
0.02
0.01
1shot pulse
100 µ 1 m 10 m
4
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 5.0 °C/W, Tc = 25 °C
P
DM
Pulse Width PW (S)
Tc = 25°C
PW
D =
T
PW
T
100 m 1 10
Page 5
Switching Time Test Circuit Waveform
2SK2736
Vin Monitor
Vin 10 V
50
D.U.T.
R
L
V
DD
= 10 V
Vout Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
5
Page 6
2SK2736
Package Dimensions
Unit: mm
1.0 ± 0.2
1.15 ± 0.2
0.6 ± 0.1
2.54 ± 0.5
10.0 ± 0.3 f
3.2 ± 0.2
4.1 ± 0.3 12.0 ± 0.3
2.54 ± 0.5
4.45 ± 0.3
2.5 ± 0.2
2.7 ± 0.2
15.0 ± 0.3
13.6 ± 1.0
0.7 ± 0.1
Hitachi Code
EIAJ
JEDEC
TO–220CFM
— —
6
Page 7
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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