Digital ΔΣ Input from CS5378 Digital Filter
Selectable Differential Analog Outputs
• Precision output (OUT±) for electronics tests
• Buffered output (BUF±) for sensor tests
Multiple AC and DC Operational Modes
• Output signal bandwidth: DC to 100 Hz
• Max AC amplitude: 5 V
• Max DC amplitude: + 2.5 V
Selectable Attenuation to Match CS3301A/02A
• 1, 1/2, 1/4, 1/8, 1/16, 1/32, 1/64
Outstanding Performance
• OUT AC: -115 dB THD typical, -112 dB maximum
• BUF AC: -105 dB THD typical, -95 dB maximum
• OUT DC: Differential VREF ± 10 mV typical
• BUF DC: Differential VREF ± 25 mV typical
Low Power Consumption
• AC modes / DC modes: 40 mW / 25 mW
• Sleep mode / Power down: 2.5 mW / 600 µW
differential
pp
differential
dc
differential
pp
differential
dc
ΔΣ
Modulator and Test DAC
Description
The CS5373A is a high-performance, fourth-order ΔΣ
modulator integrated with a ΔΣ digital-to-analog converter (DAC). When combined with a CS3301A/02A
differential amplifier and the CS5378 digital filter, a
small, low-power, self-testing, high-accuracy, singlechannel measurement system results.
The modulator has high dynamic range and low total harmonic distortion with very low power consumption. It
converts differential analog input signals from the
CS3301A/02A amplifier to an oversampled serial bit
stream at 512 kbits per second. This oversampled bit
stream is then decimated by the CS5378 digital filter to a
24-bit output at the selected output word rate.
The test DAC operates in either AC or DC test modes.
AC test modes measure system dynamic perfo rmance
through THD and CMRR tests while DC test modes are
for gain calibration and pulse tests. It has two sets of differential analog outputs, OUT and BUF, as dedicated
outputs for testing the electronics channel and for incircuit sensor tests. Output attenuation settings are
binary weighted and match the gain settings of the
CS3301A/02A differential amplifiers for full-scale testing
at all gain ranges.
ORDERING INFORMATION
See page 39.
Common Features
Extremely Small Footprint
• 28-pin SSOP package, 8 mm x 10 mm
Bipolar Power Supply Configuration
http://www.cirrus.com
• VA+ = +2.5 V; VA- = -2.5 V; VD = +3.3 V
Copyright Cirrus Logic, Inc. 2010
(All Rights Reserved)
OCT ‘10
DS703F2
TABLE OF CONTENTS
1. CHARACTERISTICS AND SPECIFICATIONS ........................................................................4
Notes: 1. VA- must always be the most-negative input voltage to avoid potential SCR latch-up conditions.
4DS703F2
2. By design, a 2.500 V voltage reference input results in the best signal-to-noise performance.
3. Full-scale accuracy is directly proportional to the voltage reference absolute accuracy.
4. VREF inputs must satisfy: VA- <
VREF- < VREF+ < VA+.
CS5373A
TEMPERATURE CONDITIONS
ParameterSymbol Min TypMaxUnit
Ambient Operating TemperatureT
Storage Temperature RangeT
Allowable Junction TemperatureT
Junction to Ambient Thermal Impedance (4-layer PCB)Θ
A
STR
JCT
JA
ABSOLUTE MAXIMUM RATINGS
ParameterSymbolMinMaxParameter
DC Power SuppliesPositive Analog
Negative Analog
Digital
Analog Supply Differential(VA+) - (VA-)VA
Digital Supply Differential(VD) - (VA-)VD
Input Current, Power Supplies(Note 5)I
Input Current, Any Pin Except Supplies(Note 5, 6)I
Output Current(Note 5)I
Power DissipationPDN-500mW
Analog Input VoltagesV
Digital Input VoltagesV
VA+
VA-
VD
DIFF
DIFF
PWR
IN
OUT
INA
IND
-40-85ºC
-65-150ºC
--125ºC
-65-ºC/W
-0.5
-6.8
-0.5
6.8
0.5
6.8
V
V
V
-6.8V
-7.6V
-±50mA
-±10mA
-±25mA
(VA-) - 0.5(VA+) + 0.5V
-0.5(VD) + 0.5V
WARNING: Operation at or beyond these limits may result in permanent damage to the device.
Normal operation is not guaranteed at these extremes.
Notes: 5. Transient currents up to ±100 mA will not cause SCR latch-up.
6. Includes continuous over-voltage conditions at the modulator analog input pins.
Notes: 7. Maximum integrated noise over the measurement bandwidth for the voltage reference device attached
to the VREF
± inputs.
8. The modulator analog inputs are normally driven by a CS3301A/02A amplifier.
9. Differential anti-alias capacitors are discrete external components and must be of good quality (C0G,
NPO, poly). Poor quality capacitors will degrade total harmonic distortion (THD) performance.
6DS703F2
ANALOG OUTPUT CHARACTERISTICS
ParameterSymbol Min TypMaxUnit
DAC Analog OUT±
Analog External Load at OUT
(Note 10, 11)Load Capacitance
Differential Output Impedance1/1
Single-ended Output Impedance1/1
High-Z ImpedanceHZ
Crosstalk to BUF
DAC Analog BUF± Output
Analog External Load at BUF
(Note 10)Load Capacitance
Notes: 10. Guaranteed by design and/or characterization.
11. Load on the precision OUT± outputs is normally from a CS3301A/02A amplifier, which has 2 GΩ/1 TΩ
typical input impedance and 18 pF typical input capacitance.
12. Single-ended output impedance at 1/64 is different for BUF+ and BUF- due to the output attenuator
architecture.
DS703F27
CS5373A
MODULATOR CHARACTERISTICS
ParameterSymbol Min TypMaxUnit
Input Characteristics
Input Signal Frequencies(Note 10, 13)V
Full Scale Differential AC Input(Note 10)V
Full Scale Differential DC Input(Note 10)V
Input Voltage Range (Signal + Vcm)(Note 10, 14)V
Input Common Mode Voltage(Note 15)V
BW
AC
DC
RNG
CM
Dynamic Performance
Dynamic RangeDC to 1720 Hz
SNR-
(Note 16)DCto860Hz
DC to 430 Hz
DC to 215 Hz
DC to 108 Hz
DC to54 Hz
DC to27 Hz
Channel to Channel Gain Accuracy(Note 3)CGAChannel Gain Drift(Note 19)CGA
TC
Offset
Offset Voltage, DifferentialOFST-100-mV
Offset Voltage Drift(Note 19)OFST
Offset after Calibration(Note 20)OFST
Offset Calibration Range(Note 21)OFST
TC
CAL
RNG
DC-1720Hz
--5V
-2.5-2.5V
(VA-)+0.7
-(VA+)-1.25V
-(VA-)+2.5-V
dB
dB
dB
dB
dB
dB
dB
-
121
-
-
-
-
109
121
124
127
130
133
136
0.000126 0.000251
-
-
-
-
-
-
-
±1±2%
-5-ppm/°C
-0.1-μV/°C
-±1- μV
-100- %FS
pp
dc
%
Notes: 13. The upper bandwidth limit is determined by the CS5378 digital filter cut-off frequency.
14. No signals operating from external power supplies should be applied to pins of the device prior to its
own supplies being established. Connecting any terminal to voltages greater than VA+ or less than VAmay cause destructive latch-up.
15. Common mode voltage is defined as the mid-point of the differential signal.
16. Dynamic Range defined as 20 log [ (RMS full scale) / (RMS idle noise) ] where idle noise is measured
from a CS3301A/02A amplifier terminated input at 1x gain.
17. Signal Dependent Noise defined as 20 log [ (RMS full scale) / (RMS signal noise) ] where signal noise
is measured by subtracting the signal power at the fundamental and harmonic frequencies.
18. Tested with a 31.25 Hz sine wave at -1 dB amplitude.
19. Specification is for the parameter over the specified temperature range and is for the device only. It does
not include the effects of external comp o ne nt s.
20. This specification applies to the effective offset voltage calculated from the output codes of the CS5378
digital filter following offset calibration and correction.
21. Offset calibration is performed in the CS5378 digital filter and includes the full-scale signal range.
8DS703F2
PERFORMANCE PLOTS
Figure 1. Modulator Noise Performance
Figure 2. Modulator + Test DAC Dynamic Performance
Common Mode(Note 15)VAC
Common Mode Drift(Note 15, 19)VAC
CS5373A
-
-
-
-
-
-
-
5
2.5
1.25
625
312.5
156.25
78.125
-
-
-
-
-
-
-
--100Hz
---20dBfs
-+1+2%FS
-+1+2%FS
-8-μV/°C
-(VA-)+2.35-V
-2-μV/°C
V
V
V
mV
mV
mV
mV
pp
pp
pp
pp
pp
pp
pp
Notes: 22. Maximum amplitude for DAC operation above 100 Hz. A reduced amplitude for higher frequencies is
required to guarantee stability of the low-power ΔΣ DAC architecture.
23. Full-scale accuracy tests the matching of 1/1 attenuation across multiple devices.
24. Relative accuracy tests the tracking of 1/1,1/2,1/4,1/16,1/32,1/64 attenuation relative to 1 /8 attenuation
on a single device.
10DS703F2
DAC AC DIFFERENTIAL MODES 1, 2, 3 (CONT.)
ParameterSymbol Min TypMaxUnit
Signal to Noise
1/4
1/8
1/4
1/8
1/4
1/8
1/4
1/8
SNR
SNR
SNR
THD
THD
THD
OUT
BUF
BUFL
OUT
BUF
BUFL
Signal to Noise (OUT
(Note 25) 1/2
Signal to Noise (BUF
(Note 25, 26) 1/2
Signal to Noise (BUF
(Note 25, 26)
Total Harmonic Distortion
Total Harmonic Distortion (OUT
(Note 18, 27)1/2
Total Harmonic Distortion (BUF
(Note 18, 26, 27) 1/2
Total Harmonic Distortion (BUF
(Note 18, 26, 27)
± Unloaded) 1/1
1/16
1/32
1/64
± Unloaded) 1/1
1/16
1/32
1/64
± 1kΩ load) 1/1
± Unloaded) 1/1
1/16
1/32
1/64
± Unloaded)1/1
1/16
1/32
1/64
± 1kΩ load)1/1
110
-
-
-
-
-
-
100
-
-
-
-
-
-
100110-dB
-
-
-
-
-
-
-
-
-
-
-
-
-
-
--95-85 dB
114
114
114
113
111
107
102
111
107
102
96
90
84
78
-115
-118
-116
-111
-109
-107
-101
-111
-107
-102
-97
-92
-86
-80
-112
-95
CS5373A
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
Notes: 25. Specification measured using CS3301A amplifier at corresponding gain with the modulator measuring
a 400 Hz bandwidth. Amplified noise dominates for x16, x32, x64 amplifier gains.
26. Buffered outputs (BUF
27. Specification measured using CS3301A amplifier at corresponding gain using the modulator measuring
a 400 Hz bandwidth. Amplified noise in the harmonic bins dominates THD measurements for x16, x32,
x64 amplifier gains.
DS703F211
±) include 1/f noise not present on the prec isio n ou tp ut s (OU T±).
DAC DC COMMON MODE 4
ParameterSymbol Min TypMaxUnit
DC Common Mode Characteristics
Common Mode OutputVDC
Common Mode Drift(Note 19)VDC
MSYNC Setup Time to MCLK Rising(Note 10, 33)t
MSYNC Period(Note 10, 33)t
MSYNC Hold Time after MCLK Falling(Note 10, 33)t
MSYNC Instant to TDATA Start(Note 34)t
MDATA Output
MDATA Output Bit Ratef
MDATA Output One’s Density Range(Note 10)MDAT
Full-scale Output Code(Note 35)MDAT
TDATA Input
TDATA Input Bit Rate(Note 36)f
TDATA Input One’s Density Range(Note 10)TBS
TBSGAIN Full-scale Code(Note 37)TBS
TBSGAIN -20 dB Code(Note 37)TBS
CLK
mclk
DC
RISE
FALL
IBJ
OBJ
mss
msync
msh
tdata
mdata
OD
tdata
OD
FS
-20dB
FS
CS5373A
-2.048- MHz
-488- ns
40-60%
--50ns
--50ns
--300ps
--1ns
20122-ns
40976-ns
20122-ns
-1220-ns
-512-kbits/s
14-86%
0xA2EAAE
-256-kbits/s
25-75%
-
-
-
0x04B8F2
0x0078E5
0x5D1C41
-
-
Notes: 32. MCLK is generated by the CS5378 digital filter. If MCLK is disabled, the device automatically enters a
power-down state.
33. MSYNC is generated by the CS5378 digital filter and is latched on MCLK rising edge, synchronization
instant (t
) on next MCLK rising edge.
0
34. TDATA can be delayed from 0 to 63 full bit periods by the test bit stream generator in the CS5378 digital
filter. The timing diagrams show no TBSDATA delay.
35. Decimated, filtered, and offset corrected 24-bit output word from th e CS5 37 8 dig ita l fi lt er .
36. TDATA is generated by the test bit stream generator in the CS5378 digital filter.
37. TBSGAIN register value in the CS5378 digital filter.
16DS703F2
DIGITAL CHARACTERISTICS (CONT.)
MCLK
MSYNC
t
MDATA
TDATA
0
(2.048 MHz)
(512 kHz)
(256 kHz)
SYNC
MFLAG
Figure 4. System Timing Diagram
MCLK
MSYNC
t
TDATA
0
(2.048 MHz)
(256 kHz)
t
mss
t
mclk
t
msync
t
msh
MDATA
(2.048 MHz)
MFLAG
t
tdata
Figure 5. MCLK / MSYNC Timing Detail
CS5373A
DS703F217
CS5373A
POWER SUPPLY CHARACTERISTICS
ParameterSymbol Min TypMaxUnit
Modulator Power Supply Current
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
A
D
DAC AC Mode Supply Current
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
A
D
DAC DC Mode Supply Current
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
A
D
Modulator Sleep Current
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
A
D
DAC Sleep Current
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
A
D
Power Down Current (MCLK = 0)
Analog Power Supply Current(Note 38)I
Digital Power Supply Current(Note 38)I
Time to Enter Power Down (MCLK disabled) (Note 10)PD
A
D
TC
Power Supply Rejection
Power Supply Rejection Ratio(Note 39)PSRR-90-dB
-57mA
-200300 μA
-7.810 mA
-200- μA
-4.8- mA
-200- μA
-200- μA
-20- μA
-400- μA
-100- μA
-100- μA
-20- μA
-40- μS
Notes: 38. All outputs unloaded. Digital inputs forced to VD or GND respectively.
39. Power supply rejection is characterized by applying a 100 mVp-p 50-Hz sine wave to each supply.
18DS703F2
CS5373A
24-Bit
ΔΣ
Test DAC
Attenuator
1/1 to 1/64
Clock
Generator
VA+
MODE(0, 1, 2)ATT(0, 1, 2)
VD
VA-
VREF+ VREF-
GND
MCLK
MSYNC
24-Bit
ΔΣ
Modulator
OUT+
OUTBUF+
BUF-
TDATA
CAP+
CAP-
MDATA
MFLAG
INR+
INF+
INFINR-
Figure 6. CS5373A Block Diagram
2. GENERAL DESCRIPTION
The CS5373A is a high-performance, fourthorder ΔΣ modulator integrated with a digital-toanalog converter (DAC). When combined with
a CS3301A/02A differential amplifier and the
CS5378 digital filter, a small low-power selftesting high-accuracy single-channel measurement system results.
(MODE 1, 2, 3, 6) are used to measure system THD and CMRR performance. DC test
modes (MODE 4, 5) are for gain calibration
and pulse tests. The digital filter also provides
clock and syncronization signals as well as
GPIO control signals to set the operational
mode and analog output attenuation.
Two sets of differential analog outputs, OUT
and BUF, simplify system design as dedicated
2.1 Delta-Si gma Modulator
The CS5373A modulator has high dynamic
range and low total harmonic distortion with
very low power consumption, and is optimized
for extremely high-resolution measurement of
5Vpp or smaller differential signals. It converts
analog input signals between DC and 1720 Hz
to an oversampled serial bit stream at
512 kbits per second.
The CS5378 digital filter generates the clock
and synchronization inputs for the modulator
while receiving the modulator one-bit data and
over-range flag outputs. The digital filter then
decimates the modulator’s oversampled output bit stream to a 24-bit output at the selected
output word rate.
2.2 Digital-to-Analog Converter
The CS5373A test DAC is driven by a digital
ΔΣ bit stream from the CS5378 digital filter’s
test bit stream (TBS) generator and operates
in either AC or DC test modes. AC test modes
DS703F219
outputs for testing the electronics channel and
for in-circuit sensor tests. Output attenuator
settings are binary weighted (1, 1/2, 1/4, 1/8,
1/16, 1/32, 1/64) and match the CS3301A/02A
amplifier input levels for full-scale testing at all
gain ranges.
For maximum performance, the precision outputs (OUT±) must drive only high-impedance
loads such as the CS3301A/02A amplifier inputs. The buffered outputs (BUF±) can drive
lower-impedance loads, down to 1 kΩ, but with
reduced performance compared to the precision outputs.
The test DAC is optimized for low-power operation and has a restricted operational bandwidth in the AC modes. For stable operation,
full-scale AC test signals must not contain frequencies above 100 Hz. AC test signals above
100 Hz (TBS impulse mode, for example)
must have a -20 dB reduced amplitude to ensure stability of the low-power ΔΣ architecture.
3. SYSTEM DIAGRAM
CS5373A
TDATA
CAP+
CAP-
BUF+
BUF-
OUT +
OUT -
MCLK
MSYNC
GND
MODE1
MODE2
ATT 0
ATT 1
MODE0
ATT 2
VA-
2.5 V
VREF
10 Ω
VREF +
VREF -
100 µF
0.1µF
VA+
VA+VD
0.1µF
0.1µF
VDVA+
10nF
C0G
GPIO
CS5378
SIGNALS
MCLK
MSYN C
TBSDAT A
GPIO
GPIO
GPIO
GPIO
GPIO
SENSOR
TEST OUTPUT
ELECTRONICS
TEST OUTPUT
VA-
+
VA-
Route VREF as diff pair
Route OUT as diff pair
Route BUF as diff pair
MDATA
MFLAG
MDATA
MFLAG
INR+
INF+
INFINR-
20nF
*
C0G
20nF
*
C0G
INPUT FROM
CS3301A/02 A
AMPLIFIER
*Populate with 2 x 10nF or
1 x 22nF C0 G or better .
680 Ω
680 Ω
680 Ω
680 Ω
Figure 8. Connection Diagram
Digital Filter
w/ PLL
AMP
Geophone
or
Hydrophone
Sensor
M
U
X
μController
or
Configuration
EEPROM
Communication
Interface
CS3301A
CS3302A
CS5378
System
Telemetry
ΔΣ
Modulator
and
Test DAC
CS5373A
20nF
C0G
680 Ω
680 Ω
Figure 7. System Diagram
CS5373A
20DS703F2
4. POWER MODES
POWER DOWN
MCLK = OFF
MODE = XXX
SLEEP MODE
MCLK = ON
MODE = 7
AC TEST MODES
MCLK = ON
MODE = 1, 2, 3, 6
DC TEST MODES
MCLK = ON
MODE = 4, 5
MODULATOR MODE
MCLK = ON
MODE = 0
Figure 9. Power Mode Diagram
CS5373A
The CS5373A has five power modes. Modulator mode, AC test modes, and DC test modes
are operational modes, while power down and
sleep mode are non-operational standby
modes.
4.1 Power Down
If MCLK is stopped, an internal loss-of-clock
detection circuit automatically places the
CS5373A into power down. Power down is independent of the MODE and ATT pin settings,
and is automatically invoked after approximately 40 µs without an incoming MCLK edge.
In power down the modulator, AC test circuitry
and DC test circuitry are inactive and all outputs are high impedance. When used with the
CS5378 digital filter, the CS5373A is in power
down immediately after reset since MCLK is
disabled by default.
4.2 Sleep Mode
With MCLK active, selecting sleep mode
(MODE 7) places the CS5373A into a micropower sleep state. In sleep mode the modulator, AC test circuitry and DC test circuitry are
inactive and all outputs are high impedance.
4.3 Modulator Mode
With MCLK active, selecting modulator mode
(MODE 0) enables the CS5373A modulator
and places the AC and DC test circuitry into a
micro-power sleep state with the analog test
outputs high impedance. Following completion
of AC and DC system self-tests, the CS5373A
is typically set into modulator mode for normal
data acquisition.
4.4 AC Test Modes
With MCLK and TDATA active, selecting an
AC test mode (MODE 1, 2, 3, 6) enables the
modulator and causes the DAC to output AC
waveforms on the analog test outputs. AC test
modes use the low-power ΔΣ DAC circuitry in
the CS5373A to create precision differential or
common mode analog AC output signals from
the encoded digital test bit stream (TBS) input.
4.5 DC Test Modes
With MCLK active, selecting a DC test mode
(MODE 4, 5) enables the modulator and
causes the DAC to generate precision DC voltages on the analog test outputs. DC test
modes use switch-capacitor level-shifting buffer circuitry in the CS5373A to create differential or common mode DC analog output
voltages from the voltage reference input.
DS703F221
CS5373A
Table 2. Operational Modes
Modes of Operation
Selection
MODE
[2:0]Mode Description
0000
Modulator: enabled.
DAC: sleep.
1001
Modulator: enabled.
DAC: AC OUT and BUF outputs.
2010
Modulator: enabled.
DAC: AC OUT only, BUF high-z.
3011
Modulator: enabled.
DAC: AC BUF only, OUT high-z.
4100
Modulator: enabled.
DAC: DC common mode output.
5101
Modulator: enabled.
DAC: DC differential output.
6110
Modulator: enabled.
DAC: AC common mode output.
7111
Modulator: sleep.
DAC: sleep.
Table 3. Output Coding for the CS5373A
Modulator and CS5378 Digital Filter Combination
Modulator
Differential Analog
Input Signal
CS5378 Digital Filter
Output Code
Offset
Corrected
+100 mV
Offset
> + (VREF + 5%)Error Flag Possible
+ VREF5D1C4160D5B4
0 V00000003B973
- VREFA2EAAEA6A421
> - (VREF + 5%)Error Flag Possible
5. OPERATIONAL MODES
The CS5373A has seven operational modes
and one sleep mode selected by the MODE2,
MODE1, and MODE0 pins.
bit stream output, i.e. an 86% one’s density
has, on average, a ‘1’ value in 86 of every 100
output data bits. The MDATA output has a
nominal 50% one’s density for a mid-scale differential input, approximately 86% one’s density for a positive full-scale input, and
approximately 14% one’s density for a negative full-scale input.
5.1.2Modulator Decimated Output
When the CS5373A modulator operates with
the CS5378 digital filter, the final decimated,
24-bit, full-scale output code range depends if
digital offset correction is enabled. With digital
offset correction enabled, amplifier offset and
the modulator internal offset are removed from
the final conversion result.
5.1 Modulator Mode
Modulator mode (MODE 0) enables the ΔΣ
modulator and disables the DAC AC and DC
test circuitry to save power. This mode is used
for normal sensor measurements after selftests are completed.
5.1.1Modulator One’s Density
In modulator mode (and whenever the modulator is enabled) the differential analog input
signal is converted to an oversampled ΔΣ serial bit stream on the MDATA output, with a
one’s density proportional to the differential
amplitude of the analog input signal.
One’s density of the MDATA output is defined
as the ratio of ‘1’ bits to total bits in the serial
22DS703F2
5.1.3Modulator Synchronization
The modulator is designed to operate synchronously with other modulators in a measurement network, so a rising edge on the MSYNC
input resets the internal conversion state machine to synchronize analog sample timing.
MSYNC is automatically generated by the
CS5378 digital filter after receiving a synchronization signal from the external system, and
is chip-to-chip accurate within ± 1 MCLK period.
CS5373A
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 1
Maximum
5 Vpp
Differential
Maximum
5 Vpp
Differential
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 2
Maximum
5 Vpp
Differential
High
Impedance
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 3
High
Impedance
Maximum
5 Vpp
Differential
Figure 10. AC Differential Modes
5.1.4Modulator Idle Tones
The CS5373A modulator is ΔΣ type and so can
produce ‘idle tones’ in the measurement bandwidth when the differential input signal is a
steady-state DC signal within ± 50 mV of midscale. Idle tones result from low-frequency
patterns in the output bit stream and appear in
the measurement spectrum as small tones
about -135 dB down from full scale.
Idle tones are eliminated within the CS5373A
modulator by automatically adding +100 mV of
internal differential offset during conversion to
push idle tones out of the measurement bandwidth. Care should be taken to ensure external
offset voltages do not negate the internally
added differential offset.
5.1.5Modulator Stability
The CS5373A’s ΔΣ modulator has a 4th order
architecture which is conditionally stable and
may go into an oscillatory condition if the analog inputs are over-ranged more than 5% past
either positive or negative full scale.
differential or common mode analog AC signals by the CS5373A’s test DAC.
5.2.1AC Differential
The first three AC test modes (MODE 1, 2, 3)
enable the modulator and AC test circuitry to
create precision differential analog signals for
THD and impulse testing of the measurement
channel. In mode 1, both sets of differential analog outputs (OUT and BUF) are enabled. In
mode 2 only the OUT analog output is en-
abled, and the BUF output is high impedance.
In mode 3 only the BUF analog output is enabled, and the OUT output is high impedance.
If an unstable condition is detected, the modulator collapses to a 1st order system and transitions the MFLAG output low-to-high to signal
an error condition to the CS5378 digital filter.
The analog input signal must be reduced to
within the full-scale range for at least 32 MCLK
cycles for the modulator to recover from an oscillatory condition. If the analog input remains
over-ranged for an extended period, the modulator will cycle between 4
der operation and the MFLAG output will be
seen to pulse.
5.2 AC Test Modes
AC test modes (MODE 1, 2, 3, 6) enable the
modulator and use the digital test bit stream
(TBS) input from the CS5378 digital filter to
construct analog AC waveforms. The digital bit
stream input to the TDATA pin encodes the
analog waveform as over-sampled one-bit ΔΣ
data, which is then converted into precision
DS703F223
th
order and 1st or-
CS5373A
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 6
Maximum
2.5 Vpp
Common
Mode
Maximum
2.5 Vpp
Common
Mode
Figure 11. AC Common Mode
Differential AC test signals out of the CS5373A
consist of two halves with equal but opposite
magnitude, varying about a common mode
voltage. A full-scale 5 VPP differential AC signal centered on a -0.15 V common mode voltage will have:
SIG+ = -0.15 V + 1.25 V = +1.1 V
SIG- = -0.15 V - 1.25 V = -1.4 V
SIG+ is +2.5 V relative to SIG-
For the opposite case:
SIG+ = -0.15 V - 1.25 V = -1.4 V
SIG- = -0.15 V + 1.25 V = +1.1 V
SIG+ is -2.5 V relative to SIG-
So the total swing for SIG+ relative to SIG- is
(+2.5 V) - (-2.5 V) = 5 Vpp differential. A similar
calculation can be done for SIG- relative to
SIG+. It’s important to note that a 5 Vpp differential signal centered on a -0.15 V common
mode voltage never exceeds +1.1 V with respect to ground and never drops below -1.4 V
with respect to ground on either half. By definition, differential voltages are measured with
respect to the opposite half, not relative to
ground. A voltmeter differentially measuring
between SIG+ and SIG- in the above example
would correctly read 1.767 V
, or 5 Vpp.
rms
mode 6, both sets of analog outputs (OUT and
BUF) are enabled. There is no AC common
mode output for an attenuator setting of 1/64.
Gross leakage in the sensor channel can be
detected by applying a full-scale AC common
mode signal. If there is a significant differential
mismatch in the channel due to sensor leakage, the AC common mode signal will be converted to a measurable differential signal at
the fundamental frequency.
5.2.3DAC Stability
For the CS5373A’s low-power ΔΣ DAC architecture to remain stable, the TDATA input bit
stream should only encode 100 Hz or lower
bandwidth analog signals. For TDATA bit
stream frequencies above 100 Hz (for example, TBS impulse mode), the encoded amplitude must be reduced -20 dB below full scale
to guarantee stability.
If the CS5373A’s low-power ΔΣ DAC architecture becomes unstable, persistent elevated
noise will be present on the analog outputs
and AC linearity will be poor. To recover stability, place the CS5373A into power down or
sleep mode and restart the CS5378 test bit
stream generator before placing the CS5373A
back into an AC test mode.
5.2.2AC Common Mode
The final AC test mode (MODE 6) enables the
modulator and AC test circuitry to create a
matched AC common mode analog signal for
CMRR testing of the measurement channel. In
5.3 DC Test Modes
DC test modes enable the modulator and DC
test circuitry to create precision level-shifted
and buffered versions of the voltage reference
input as precision DC common mode and DC
differential analog outputs. The absolute accuracy of the DC test modes is highly dependent
on the absolute accuracy of the voltage reference input voltage.
5.3.1DC Common Mode
The first DC test mode (MODE 4) enables the
24DS703F2
modulator and DC test circuitry to create a
matched DC common mode analog output
voltage as a baseline measurement for gain
CS5373A
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 4
Approx
-0.15 V
DC
Common
Mode
Approx
-0.15 V
DC
Common
Mode
OUT+
OUT-
BUF+
BUF-
CS5373A
MODE 5
Maximum
2.5 V
DC
Differential
Maximum
2.5 V
DC
Differential
Figure 12. DC Test Modes
calibration and differential pulse tests. In mode
4, both sets of analog outputs (OUT and BUF)
are enabled.
5.3.2DC Differential
The second DC test mode (MODE 5) enables
the modulator and DC test circuitry to create a
precision differential DC analog output voltage
as the final measurement for gain calibration
and as the step/pulse output for differential
pulse tests. In mode 5, both sets of analog outputs (OUT and BUF) are enabled.
In DC differential mode (MODE 5) the levelshifting buffer circuitry adds low-level 32 kHz
switched-capacitor noise to the DC output.
This noise is out of the measurement bandwidth for systems designed with a
CS3301A/02A amplifier and CS5373A modulator and is rejected by the CS5378 digital filter. This 32 kHz switched-capacitor noise
does not affect DC system tests, though it may
be visible on an oscilloscope at high gain levels.
By measuring both DC test modes
(MODE 4, 5), precision gain-calibration coefficients can be calculated for the measurement
channel. By first measuring the differential offset of the DC common mode output (MODE 4)
and then measuring the DC differential mode
amplitude (MODE 5), a precise offset-corrected, volts-to-codes conversion ratio can be calculated. This known ratio is then used along
with the CS5378 digital filter GAIN register to
normalize the full-scale amplitude to match
other channels in the measurement network.
By switching between DC common mode
(MODE 4) and DC differential mode
(MODE 5), pulse waveforms can be created to
characterize the step response of the measurement channel. If a pulse test requires precise timing control, an external controller
should directly toggle the MODE pins of the
CS5373A to avoid delays associated with writing to the CS5378 digital filter GPIO register.
Sensor impedance can be measured using
DC differential mode (MODE 5), provided
matched series resistors are installed between
the BUF analog outputs and the sensor. Applying the known DC differential voltage to the
resistor-sensor-resistor string permits a ratiometric sensor impedance calculation from the
measured voltage drop across the sensor.
Switching between DC differential mode
(MODE 5) and modulator mode (MODE 0) can,
in the case of a moving-coil geophone, test basic
parameters of the electro-mechanical transfer
function. The voltage relaxation characteristic of
the sensor when switching the analog outputs
from a differential DC voltage to high impedance
depends primarily on the geophone resonant
frequency and damping factor.
5.4 Sleep Mode
Sleep mode (MODE 7) saves system power
when measurements are not required by turning
off the modulator, AC test circuitry, and DC test
DS703F225
circuitry. In sleep mode the modulator digital outputs and the BUF and OUT analog outputs are
high impedance.
6. DIGITAL SIGNALS
CS5373A
TDATA
CAP+
CAP-
BUF+
BUF-
OUT+
OUT-
MCLK
MSYNC
GND
MODE1
MODE2
ATT 0
ATT 1
MODE0
ATT 2
VA-
2.5 V
VREF
10 Ω
VREF +
VREF -
100 µ F
0.1µ F
VA+
VA+VD
0.1µ F
0.1µF
VDVA+
10nF
C0G
GPIO
CS5378
SIGNALS
MCLK
MSYNC
TBSDATA
GPIO
GPIO
GPIO
GPIO
GPIO
SENSOR
TEST OU TPUT
ELECTRON ICS
TEST OU TPUT
VA-
+
VA-
Route VR EF as diff pair
Route OU T as diff pair
Route BU F as diff pair
MDATA
MFLAG
MDATA
MFLAG
INR+
INF+
INFINR-
20nF
*
C0G
20nF
*
C0G
INPUT FROM
CS 3301 A/02A
AM PLIF IER
*Populate w ith 2 x 10nF or
1 x 22nF C0G or better .
680 Ω
680 Ω
680 Ω
680 Ω
Figure 13. Digital Signals
CS5373A
The CS5373A is designed to operate with the
CS5378 digital filter. The digital filter generates the master clock and synchronization signals (MCLK and MSYNC) while receiving back
the modulator one-bit ΔΣ conversion data
(MDATA) and over-range flag (MFLAG). It
also generates digital one-bit ΔΣ test bit
stream data for the test DAC (TDATA) and
controls GPIO pins to set the operational
mode (MODE) and attenuation (ATT).
6.1 MCLK Connection
The CS5378 digital filter generates the master
clock for CS5373A, typically 2.048 MHz, from
a synchronous CLK input from the external
system. By default, MCLK is disabled at reset
and is enabled by writing the digital filter CONFIG register. If MCLK is disabled during operation, the CS5373A will enter power down
µS.
after approximately 40
MCLK must have low in-band jitter to guaran-
tee full analog performance, requiring a crystal- or VCXO-based system clock into the
digital filter. Clock jitter on the digital filter external CLK input directly translates to jitter on
MCLK.
26DS703F2
6.2 MSYNC Connection
The CS5378 digital filter also provides a synchronization signal to the CS5373A. The
MSYNC signal is generated following a rising
edge received on the digital filter SYNC input.
By default MSYNC generation is disabled at
reset and is enabled by writing to the digital filter CONFIG register.
The input SYNC signal to the CS5378 digital
filter sets a common reference time t
for mea-
0
surement events, thereby synchronizing analog sampling across a measurement network.
The timing accuracy of the received SYNC signal from node to node must be +/- 1 MCLK to
maximize the MSYNC analog sample synchronization accuracy.
The CS5373A MSYNC input is rising-edge
triggered and resets the internal MCLK counter/divider to guarantee synchronous operation with other system devices. While the
MSYNC signal synchronizes the internal operation of the CS5373A, by default, it does not
synchronize the phase of the incoming encoded digital test bit stream (TBS) sine wave unless enabled in the digital filter TBSCFG
register.
CS5373A
6.3 MDATA Connection
The CS5373A modulator outputs a ΔΣ serial
bit stream to the MDATA pin, with a one’s density proportional to the differential amplitude of
the analog input signal. The output bit rate
from the MDATA output is a divide-by-four of
the input master clock, and so is nominally
512 kHz.
The MDATA output has a nominal 50% one’s
density for mid-scale input, approximately
86% one’s density for a positive full-scale input, and approximately 14% one’s density for
a negative full-scale input. One’s density of the
MDATA output is defined as the ratio of ‘1’ bits
to total bits in the serial bit stream output, i.e.
an 86% one’s density has, on average, a ‘1’
value in 86 of every 100 output data bits.
6.4 MFLAG Connection
The CS5373A ΔΣ modulator has a 4th order architecture which is conditionally stable and
may go into an oscillatory condition if the analog inputs are over-ranged more than 5% past
either positive or negative full-scale.
If an unstable condition is detected, the modulator collapses to a 1st order system and transitions the MFLAG output low-to-high to signal
an error condition to the CS5378 digital filter.
The analog signal must be reduced to within
the full-scale input range for at least 32 MCLK
cycles for the modulator to recover from an oscillatory condition. If the analog input remains
over-ranged for an extended period, the mod-
th
ulator will cycle between 4
order and 1st order operation and the MFLAG output will be
seen to pulse.
The MFLAG output connects to a dedicated input on the CS5378 digital filter, causing an error flag to be set in the status portion of the
next conversion output data word.
6.5 TDATA Connection
The TDATA digital input to the test DAC expects encoded one-bit ΔΣ data nominally at a
256 kHz rate. The one’s density input range is
approximately 25% minimum to 75% maximum, with differential mid-scale at 50% one’s
density.
The CS5378 digital filter test bit stream (TBS)
generator can encode two types of AC signals
as over-sampled, one-bit ΔΣ data – a pure sine
wave for THD and CMRR testing or a triggerable impulse waveform for synchronization
testing and impulse response characterization. In the AC test modes, the test DAC converts the over-sampled test bit stream digital
data into precision differential or common
mode analog AC signals.
The CS5378 TBS sine mode encodes an approximately 5 V
full-scale sine wave signal
pp
with a digital filter TBSGAIN register setting of
0x04B8F2. Because TBS impulse mode encodes frequencies above 100 Hz, a maximum
0x0078E5 TBSGAIN impulse mode register
setting is specified to guarantee stability of the
DAC low-power ΔΣ circuitry. Details on the setup and operation of the digital filter test bitstream (TBS) generator can be found in the
CS5378 data sheet.
6.6 GPIO Connections
The CS5378 controls 8 general-purpose input
output (GPIO) pins through the digital filter
GPCFG register. These GPIO pins are typically assigned to operate the CS5373A mode and
attenuator pins, along with the CS3301A/02A
amplifier input mux and gain pins. The gain
and attenuation settings of the CS3301A/02A
amplifiers and the CS5373A test DAC are
identically decoded to allow full-scale performance testing at all system gain ranges with
shared GAIN and ATT control signals.
If precise timing control of operational modes
is required (for example, switching between
DC modes for pulse generation), an external
controller should directly toggle the MODE
pins of the CS5373A to avoid the delay associated with writing to the CS5378 digital filter
GPCFG register.
DS703F227
7. ANALOG SIGNALS
Figure 14. Analog Signals
CS5373A
TDATA
CAP+
CAP-
BUF+
BUF-
OUT+
OUT-
MCLK
MSYNC
GND
MODE1
MODE2
ATT 0
ATT 1
MODE0
ATT 2
VA-
2.5 V
VREF
10 Ω
VREF +
VREF -
100 µ F
0.1µ F
VA+
VA+VD
0.1µ F
0.1µF
VDVA+
10nF
C0G
GPIO
CS5378
SIGNALS
MCLK
MSYNC
TBSDATA
GPIO
GPIO
GPIO
GPIO
GPIO
SENSOR
TEST OU TPUT
ELECTRON ICS
TEST OU TPUT
VA-
+
VA-
Route VR EF as diff pair
Route OU T as diff pair
Route BU F as diff pair
MDATA
MFLAG
MDATA
MFLAG
INR+
INF+
INFINR-
20nF
*
C0G
20nF
*
C0G
INPUT FROM
CS 3301 A/02A
AM PLIF IER
*Populate w ith 2 x 10nF or
1 x 22nF C0G or better .
680 Ω
680 Ω
680 Ω
680 Ω
•MCLK = 2.048 MHz
•INR± Input Cap = 20 pF
•Impedance = [1 / (2.048 MHz * 20 pF)] = 24 kΩ.
CS5373A
The CS5373A has multiple differential analog
inputs and outputs. The modulator analog inputs are separated into rough and fine charge
differential pairs (INR±, INF±) for maximum
sampling accuracy. Both sets of modulator inputs require a simple differential anti-alias RC
filter to ensure high-frequency signals do not
alias into the measurement bandwidth.
The test DAC has a precision differential output (OUT±) that provides the best analog performance, but with only minimal drive
capability. A buffered output (BUF±) can drive
an external load, but with reduced analog performance. Finally, the test DAC internal antialias filter requires a dedicated capacitor connection (CAP±) to eliminate undesired highfrequency signals.
7.1 INR±, INF± Modulator Inputs
The modulator analog inputs are separated
into differential rough and fine signals (INR±,
INF±). The positive half of the differential input
signal is connected to INR+ and INF+, while
the negative half is attached to INF- and INR-.
The INR± pins are switched-capacitor ‘rough
charge’ inputs that pre-charge the internal analog sampling capacitor before it is connected
to the INF± fine input pins.
28DS703F2
7.1.1Modulator Input Impedance
The modulator input has a dynamic switchedcapacitor architecture and so has a rough
charge input impedance that is inversely proportional to the input master clock frequency
and the input capacitor size, [1 / (f * C)].
Internal to the modulator, the rough inputs
(INR±) pre-charge the sampling capacitor
used by the fine inputs (INF±), therefore the input current to the fine inputs is very low and the
effective input impedance is orders of magnitude above the impedance of the rough inputs.
7.1.2Modulator Anti-alias Filter
The modulator inputs are required to be bandwidth limited to ensure modulator loop stability
and prevent high-frequency signals from aliasing into the measurement band. The use of
simple single-pole differential low-pass RC filters across the INR± and INF± inputs ensures
high-frequency signals are rejected before
they can alias into the measurement band.
The -3 dB corner of the input anti-alias filter is
•MCLK Frequency = 2.048 MHz
•Sampling Frequency = MCLK / 4 = 512 kHz
•-3 dB Filter Corner = Sample Freq / 64 = 8 kHz
•RC filter = 8 kHz = 1 / [ 2π *(2*R
series
)*C
diff
)]
Figure 15. DAC Output Attenuation Settings
Selection ATT[2:0]AttenuationdB
00001/10dB
10 0 11/2-6.02 dB
20101/4-12.04dB
30 1 11/8-18.06 dB
41 0 01/16-24.08 dB
51 0 11/32-30.10 dB
61 1 01/64-36.12 dB
71 11reservedreserved
nominally set to the internal analog sampling
rate divided by 64, which itself is a division by
4 of the MCLK input rate.
Figure 14 illustrates the CS5373A modulator
analog connections with input anti-alias filter
components. Filter components on the rough
and fine pins should be identical values for optimum performance, with the capacitor values
a minimum of 0.02 μF. The rough input can
use either X7R or C0G type capacitors, while
the fine input requires C0G type capacitors for
optimal linearity. Using X7R type capacitors on
the fine analog inputs will degrade total harmonic distortion significantly.
The CS3301A/02A differential amplifiers are
designed with separate rough and fine analog
outputs (OUTR±, OUTF±) that match the
rough and fine inputs to the modulator (INR±,
INF±). Internal anti-alias series resistors are
NOT included in the amplifier analog outputs,
therefore external differential capacitors as
well as 680 Ω resistors are required to create
the anti-alias RC filters.
7.2 DAC Output Attenuation
The CS5373A test DAC has seven analog output attenuation settings from 1/1 to 1/64 selected with the ATT2, ATT1, and ATT0 pins.
When enabled, attenuation is applied to both
the OUT± and BUF± differential analog outputs. At 1/64 attenuation in AC Common Mode
(MODE 6) there is no output signal amplitude
due to the attenuator architecture.
The OUT± pins connect directly into the internal attenuator resistors and so attenuation accuracy is highly sensitive to load impedance
DS703F229
CS5373A
on the OUT± pins. Loading on the BUF± pins
does not affect attenuator accuracy.
The attenuation settings of CS5373A match
the gain ranges of the CS3301A/02A differential amplifiers to enable full-scale testing at all
gain ranges. The CS3301A/02A amplifier gain
settings (GAIN) are decoded identical to the
CS5373A attenuator settings (ATT) and so
can share GPIO control signals from the
CS5378 digital filter.
7.3 DAC OUT± Precision Output
The test DAC OUT± pins are precision differential analog outputs for testing the high-performance electronics measurement channel.
These precision outputs have higher performance specifications than the BUF± outputs,
but with a much higher sensitivity to external
loading. Excessive resistive or capacitive loading on the OUT± pins will degrade the analog
performance characteristics of the test DAC in
all operational modes.
The OUT± precision output is optimized for direct connection to the CS3301A/02A amplifier
differential inputs, which have very high input
impedance. These amplifiers include a pincontrolled input multiplexer to switch between
an internal differential termination for noise
CS5373A
tests and two external differential inputs. One
external input is typically dedicated to sensor
measurements and the other to testing the
electronics channel.
The OUT± outputs are enabled in all operational modes except modulator mode
(MODE 0), “AC BUF Only” mode (MODE 3)
and sleep mode (MODE 7). In modulator
mode, AC BUF Only mode and sleep mode
the OUT± pins are high impedance.
7.4 DAC BUF± Buffered Output
The test DAC BUF± pins are buffered differential analog outputs for testing external sensors
such as geophones or hydrophones. The buffered outputs have reduced performance specifications compared with the OUT± outputs,
but are less sensitive to external loading.
The BUF± outputs are enabled in all operational modes except modulator mode (MODE 0),
“AC OUT Only” mode (MODE 2) and sleep
mode (MODE 7). In modulator mode,
AC OUT only and sleep mode the BUF± pins
are high impedance to ensure they do not interfere with sensor operation during normal
data acquisition.
For sensor impedance testing, it is required to
place matched series resistors in between the
BUF± outputs and the differential sensor. With
known series resistors and a known DC differential source voltage, sensor resistance can
be calculated ratiometrically from the measured voltage drop across the sensor.
7.5 DAC CAP± Connection
The CS5373A test DAC requires a 10 nF C0G
type capacitor to be connected differentially
across the CAP± pins. This capacitor creates
an internal anti-alias filter to eliminate high-fre-
quency signals from the OUT± and BUF± analog outputs and helps to maintain the stability
of the low-power ΔΣ DAC circuitry.
A COG, NPO or similar high-quality capacitor
is required for CAP± since other capacitor
types, such as X7R, do not have the required
linearity. Using a poor-quality capacitor on
CAP± will significantly degrade THD performance of the test DAC AC operational modes.
7.6 Analog Differential Signals
Differential AC test signals into and out of the
CS5373A consist of two halves with equal but
opposite magnitude varying about a common
mode voltage. A full-scale 5 VPP differential
AC signal centered on a -0.15 V common
mode voltage will have:
SIG+ = -0.15 V + 1.25 V = +1.1 V
SIG- = -0.15 V - 1.25 V = -1.4 V
SIG+ is +2.5 V relative to SIG-
For the opposite case:
SIG+ = -0.15 V - 1.25 V = -1.4 V
SIG- = -0.15 V + 1.25 V = +1.1 V
SIG+ is -2.5 V relative to SIG-
So the total swing for SIG+ relative to SIG- is
(+2.5 V) - (-2.5 V) = 5 Vpp differential. A similar
calculation can be done for SIG- relative to
SIG+. It’s important to note that a 5 Vpp differential signal centered on a -0.15 V common
mode voltage never exceeds +1.1 V with respect to ground and never drops below -1.4 V
with respect to ground on either half. By definition, differential voltages are measured with
respect to the opposite half, not relative to
ground. A voltmeter differentially measuring
between SIG+ and SIG- in the above example
would correctly read 1.767 V
, or 5 Vpp.
rms
30DS703F2
8. VOLTAGE REFERENCE
10
Ω
To VREF+
+
From VA+
Regulator
2.500 V
VREF
0.1 μF
To VREF-
0.1 μF
100 μF
0.1 μF
0.1 μF
0.1 μF
100 μF
100 μF
From VARegulator
Route VREF± as a differential pair
from the 100uF RC filter capacitor
Figure 16. Voltage Reference Circuit
CS5373A
The CS5373A requires a 2.500 V precision
voltage reference to be supplied to the VREF±
pins.
8.1 VREF Power Supply
To guarantee proper regulation headroom for
the voltage reference device, the voltage reference GND pin should be connected to VA- instead of system ground, as shown in
Figure 16. This connection results in a VREF-
voltage equal to VA- and a VREF+ voltage
very near ground [(VA-) + 2.500 VREF].
Power supply inputs to the voltage reference
device should be bypassed to system ground
with 0.1 μF capacitors placed as close as possible to the power and ground pins. In addition
to 0.1 μF local bypass capacitors, at least
100 μF of bulk capacitance to system ground
should be placed on each power supply near
the voltage regulator outputs. Bypass capacitors should be X7R, C0G, tantalum, or other
high-quality dielectric type.
8.2 VREF RC Filter
A primary concern in selecting a precision voltage reference device is noise performance in
the measurement bandwidth. The Linear
Technology LT1019AIS8-2.5 voltage refer-
ence yields acceptable noise levels if the output is filtered with a low-pass RC filter.
A separate RC filter is required for each system device connected to a given voltage refer-
ence. By sharing a common RC filter, signaldependent sampling of the voltage reference
by one system device could cause unwanted
tones to appear in the measurement bandwidth of another system device via common
impedance coupling.
8.3 VREF PCB Routing
To minimize the possibility of outside noise
coupling into the CS5373A voltage reference
input, the VREF± traces should be routed as a
differential pair from the large capacitor of the
voltage reference RC filter. Careful control of
the voltage reference source and return currents by routing VREF± as a differential pair
will improve immunity from external noise.
To further improve noise rejection of the
VREF± routing, include 0.1 μF bypass ca-
pacitors to system ground as close as possible
to the VREF+ and VREF- pins of the
CS5373A.
8.4 VREF Input Impedance
The switched-capacitor input architecture of
the VREF
± inputs results in an input imped-
ance that depends on the internal capacitor
size and the clock frequency. With a 15 pF internal capacitor and a 2.048 MHz MCLK the
VREF input impedance is approximately
[1 / [(2.048 MHz) * (15 pF)]] = 32 kΩ. While
the size of the internal capacitor is fixed, the
voltage reference input impedance will vary
DS703F231
CS5373A
with MCLK.
The voltage reference external RC filter series
resistor creates a voltage divider with the
VREF input impedance to reduce the effective
applied input voltage. To minimize gain error
resulting from this voltage divider effect, the
RC filter series resistor should be the minimum
size recommended in the voltage reference
device data sheet.
8.5 VREF Accuracy
The nominal voltage reference input is specified as 2.500 V across the VREF± pins, and all
CS5373A gain accuracy specifications are
measured with a nominal voltage reference input. Any variation from a nominal VREF input
will proportionally vary the analog full-scale
gain accuracy.
Since temperature drift of the voltage reference results in gain drift of the analog full-scale
amplitude, care should be taken to minimize
temperature drift effects through careful selection of passive components and the voltage
reference device itself. Gain drift specifications
of the CS5373A do not include the tempera-
ture drift effects of external passive components or of the voltage reference device itself.
8.6 VREF Independence
If the test signal source is required to be fully
independent of the measurement channel, the
CS5373A device cannot be used. Instead, a
CS5371 modulator and a CS4373A test DAC
should be used and connected to two independent voltage reference devices. This will eliminate the possibility for undetected ratiometric
errors when the same voltage reference device is used by both the test signal source and
the measurement channel.
Because modern precision voltage references
are highly reliable, requirements for separate
modulator and test DAC voltage references
should be considered carefully. In the unlikely
event of voltage reference failure independent
of other system components, the CS5373A
volts-to-codes ratio will be out of spec and
measurement channel performance will be
poor during system self-tests.
32DS703F2
9. POWER SUPPLIES
CS5373A
VA+VD
VA-GND
0.1 uF100 uF0.1 uF100 uF
100 uF
0.1 uF
To VA+
Regulator
To VA-
Regulator
To VD
Regulator
Figure 17. Power Supply Diagram
CS5373A
The CS5373A has a positive analog power
supply pin (VA+), a negative analog power
supply pin (VA-), a digital power supply pin
(VD), and a ground pin (GND).
For proper operation, power must be supplied
to all power supply pins, and the ground pin
must be connected to system ground. The
CS5373A digital power supply (VD) and the
CS5378 digital power supply (VDDPAD) must
share a common power supply voltage.
9.1 Power Supply Bypassing
The VA+, VA-, and VD power supplies should
be bypassed to system ground with 0.1 μF capacitors placed as close as possible to the
power pins of the device. In addition to the
0.1 μF local bypass capacitors, at least 100 μF
bulk capacitance to system ground should be
placed on each power supply near the voltage
regulator output, with additional power supply
bulk capacitance placed among the analog
component route if space permits. Bypass capacitors should be X7R, C0G, tantalum, or
other high-quality dielectric type.
9.2 PCB Layers and Routing
The CS5373A is a high-performance device,
and special care must be taken to ensure power and ground routing is correct. Power can be
supplied either through dedicated power
planes or routed traces. When routing power
traces, it is recommended to use a “star” rout-
DS703F233
ing scheme with the star point either at the
voltage regulator output or at a local power
supply bulk capacitor.
It is also recommended to dedicate a full PCB
layer to a solid ground plane, without splits or
routing. All bypass capacitors should connect
between the power supply circuit and the solid
ground plane as near as possible to the device
power supply pins.
The CS5373A analog signals are differentially
routed and do not normally require connection
to a separate analog ground. However, if a
separate analog ground is required, it should
be routed using a “star” routing scheme on a
separate layer from the solid ground plane and
connected to the ground plane only at the star
point. Be sure all active devices and passive
components connected to the analog ground
are included in the “star” route to ensure sensitive analog currents do not return through the
ground plane.
9.3 Power Supply Rejection
Power supply rejection of the CS5373A is frequency dependent. The CS5378 digital filter
rejects power supply noise for frequencies
above the selected digital filter corner frequency. Power supply noise frequencies between
DC and the digital filter corner frequency are
rejected as specified in the
Power Supply Characteristics table.
9.4 SCR Latch-up
SNR = 20log
rms magnitude of full scale signal
rms magnitude of noise floor
(
(
THD = 10log
power of the fundamental frequency
sum of the powers of the harmonic frequencies
(
(
The VA- pin is tied to the CS5373A CMOS
substrate and must always be the most-negative voltage applied to the device to ensure
SCR latch-up does not occur. In general,
latch-up may occur when any pin voltage exceeds the limits specified in the
Absolute Maximum Ratings table.
It is recommended to connect the VA- power
supply to system ground (GND) with a reverse-biased Schottky diode. At power up, if
the VA+ power supply ramps before the VAsupply is established, the VA- pin voltage
could be pulled above ground potential
through the CS5373A device. If the VA- supply
is pulled 0.7 V or more above GND, SCR
latch-up can occur. A reverse-biased Schottky
diode will clamp the VA- voltage a maximum of
0.3 V above ground to ensure SCR latch-up
does not occur at power up.
9.5 DC-DC Converters
Many low-frequency measurement systems
are battery powered and utilize DC-DC con-
CS5373A
verters to efficiently generate power supply
voltages. To minimize interference effects, operate the DC-DC converter at a frequency
which is rejected by the digital filter, or operate
it synchronous to the MCLK rate.
A synchronous DC-DC converter whose operating frequency is derived from MCLK will theoretically minimize the potential for “beat
frequencies” to appear in themeasurement
bandwidth. However this requires the source
clock to remain jitter-free within the DC-DC
converter circuitry. If clock jitter can occur within the DC-DC converter (as in a PLL-based architecture), it’s better to use a nonsynchronous DC-DC converter whose switching frequency is rejected by the digital filter.
During PCB layout, do not place high-current
DC-DC converters near sensitive analog components. Carefully routing a separate DC-DC
“star” ground will help isolate noisy switching
currents away from the sensitive analog components.
10.TERMINOLOGY
•Signal-to-Noise Ratio (Dynamic Range) - Ratio of the rms magnitude of the full-scale signal to the integrated
rms noise from DC to 400 Hz. The following formula is used to calculate SNR:
•Total Harmonic Distortion - Ratio of the power of the fundamental frequency to the sum of the powers of all
harmonic frequencies from DC to 400 Hz. The following formula is used to calculate THD:
•Full-scale Bandwidth - The bandwidth in which the con verter can generate a full-scale signal while maintaining
performance specifications.
•Impulse Amplitude - The maximum amplitude of the output signal beyond the full-scale bandwidth.
•Differential Output Level - The voltage between the analog output pins of the device.
34DS703F2
CS5373A
full scale a ccu r ac y =
measured full scale voltage - theoretical full scale voltage
theor e tica l fu ll sc ale v olta g e
(
(
•100%
||
relative accuracy =
measured attenuated voltage - theoretical attenuated voltage
theoretical attenuated voltage (relative to the measured full scale voltage)
(
(
•100%
||
•Full-scale Accuracy - Variation in the measured output vo ltage from the theore tical full-scale outpu t voltage at
1x attenuation. The following formula is used to calculate full-scale accuracy:
•Relative Accuracy - Variation in the measured output voltage from the theoretical attenuated output voltage at
each of the attenuation ranges. The following formula is used to calculate relative accuracy:
•Full Scale Drift - The variation of the measured full-scale voltage across the specified temperature range.
•Common Mode Drift - The variation in the measured common mode voltag e across the specified temp er ature
range.
DS703F235
11. PIN DESCRIPTION
1
2
3
4
5
6
7
821
22
23
24
25
26
27
28
9
10
11
1217
18
19
20
13
1415
16
Positive Capacitor OutputCAP+
Negative Capacitor OutputCAP-
Positive Buffered OutputBUF+
Negative Buffered OutputBUF-
Positive High Precision OutputOUT+
Negative High Precision OutputOUT-
Positive Analog Power SupplyVA+
Negative Analog Power SupplyVA-
Negative Voltage ReferenceVREF-
Positive Voltage ReferenceVREF+
Positive Analog Rough InputINR+
Positive Analog Fine InputINF+
Negative Analog Fine InputINF-
Negative Analog Rough InputINR-
GNDSystem Ground
MODE0Mode Select
MODE1Mode Select
MODE2Mode Select
ATT0Attenuation Range Select
ATT1Attenuation Range Select
ATT2Attenuation Range Select
TDATATest Bit Stream Input
VDPositive Digital Power Supply
GNDSystem Ground
MCLKMaster Clock Input
MSYNCMaster Sync Input
MDATAModulator Data Output
MFLAGModulator Over-range Indicator
CS5373A
Pin
Name
CAP+,
CAP-
BUF+,
BUF-
OUT+,
OUT-
VA+,
VA-
VREF-,
VREF+
INR+,
INF+
INF-,
INR-,
MFLAG
MDATA
MSYNC
MCLK
GND
VD
TDATA
36DS703F2
Pin # I/O
1
O
2
3
O
4
5
O
6
7
8
9
10
11
12
13
14
15O
16O
17I
18
19
20
21I
Capacitor connection for internal anti-alias filter.
Buffered differential analog output.
Precision differential analog output.
Analog power supply. Refer to the Specified Operating Conditions.
IVoltage reference input. Refer to the Specified Operating Conditions.
IAnalog differential rough and fine + inputs. From the + half of the differential anti-alias fil-
ter.
IAnalog differential rough and fine - inputs. From the - half of the differential anti-alias filter.
Amplitude overload indicator flag.
Oversampled ΔΣ bit stream conversion output.
Master sync input. Low to high transition resets the internal clock phasing.
IMaster clock input. CMOS compatible clock input.
System ground.
Digital power supply. Refer to the Specified Operating Conditions.
Test Bit Stream input from digital filter TBS generator.
Pin Description
CS5373A
Attenuation
SelectionATT[2:0]AttenuationdB
00 0 01/10 dB
10 0 11/2-6.02 dB
20101/4-12.04dB
30 111/8-18.06 dB
41 0 01/16-24.08 dB
51 0 11/32-30.10 dB
61 1 01/64-36.12 dB
71 1 1reservedreserved
Modes of Operation
Selection MODE[2:0]Mode Description
0000
Modulator: enabled.
DAC: sleep.
1001
Modulator: enabled.
DAC: AC OUT and BUF outputs.
2010
Modulator: enabled.
DAC: AC OUT only, BUF high-z.
3011
Modulator: enabled.
DAC: AC BUF only, OUT high-z.
4100
Modulator: enabled.
DAC: DC common mode output.
5101
Modulator: enabled.
DAC: DC differential output.
6110
Modulator: enabled.
DAC: AC common mode output.
7111
Modulator: sleep.
DAC: sleep.
Pin
Name
ATT2,
ATT1,
ATT0
MODE2,
MODE1,
MODE0
Pin # I/O
22,
23,
24
25,
26,
27
Pin Description
IAttenuation Range. Selects the output attenuation range.
IMode Selection. Determines the operational mode of the device.
Notes: 1. “D” and “E1” are reference datums and do not included mold flash or protrusions, but do include mold
mismatch and are measured at the parting line, mold flash or protrusions shall not exceed 0.20 mm per
side.
2. Dimension “b” does not include dambar protrusion/intrusion. Allowable dambar protrusion shall be
0.13 mm total in excess of “b” dimension at maximum material condition. Dambar intrusion shall not
reduce dimension “b” by more than 0.07 mm at least material condition.
3. These dimensions apply to the flat section of the lead between 0.10 and 0.25 mm from lead tips.
38DS703F2
CS5373A
13.ORDERING INFORMATION
ModelTemperaturePackage
CS5373A-ISZ (lead free)-40 to +85 °C28-pin SSOP
14.ENVIRONMENTAL, MANUFACTURING, & HANDLING INFORMATION
Model NumberPeak Reflow TempMSL Rating*Max Floor Life
CS5373A-ISZ (lead free)260 °C37 Days
* MSL (Moisture Sensitivity Level) as specified by IPC/JEDEC J-STD-020.
15.REVISION HISTORY
RevisionDateChanges
PP1NOV 2005Preliminary release for CS5373A.
PP2NOV 2005Correct voltage units of full-scale DC differential output and common mode AC
output at 1/4 attenuation. Add T
sizes in Figure 8. Correct definition of pin 28 in Pin Description table.
F1OCT 2010Removed reference to CS3301/02, replaced with CS3301A/02A.
Removed device ordering info for devices containing lead (Pb).
timing to Figure 5. Correct bypass capacitor
tdata
DS703F239
CS5373A
Contacting Cirrus Logic Support
For all product questions and inquiries contact a Cirrus Logic Sales Representative.
To find the one nearest to you go to www.cirrus.com
IMPORTANT NOTICE
Cirrus Logic, Inc. and its subsidiaries ("Cirrus") believe that the information contained in this document is accur at e and rel i a b le. Howeve r, th e inf ormat i on is sub jec t
to change without noti ce and is p rovided " AS IS" wi thout war ranty of any kind (express or impli ed). Cust omers ar e advised to obtain the latest version of relevant
information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale
supplied at the time of order acknowledgm ent, including tho se pertaining to war ranty, indemnific ation, and limitatio n of liability. No responsibility is assumed by Cirrus
for the use of this information, including use of this information as the basis for manufacture or sale of any items, or for infringement of patents or other rights of third
parties. This document is the property of Cirrus and by furnishing this information, Cirrus grants no license, express or implied under any patents, mask work rights,
copyrights, trademarks, trade secrets or other intellectual property rights. Cirrus owns the copyrights associated with the information contained herein and gives consent for copies to be made of the information only for use within your organization with respect to Cirrus integrated circuits or other products of Cirrus. This consent
does not extend to other copying such as copying for general distribution, advertising or promotional purposes, or for creating any work for resale.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEA TH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). CIRRUS PRODUCTS ARE NOT DESIGNED, AUTHORIZED OR WARRANTED FOR USE
IN PRODUCTS SURGICALLY IMPLANTED INTO THE BODY, AUTOMOTIVE SAFETY OR SECURITY DEVICES, LIFE SUPPORT PRODUCTS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF CIRRUS PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER'S RISK AND CIRRUS DISCLAIMS AND MAKES NO WARRANTY, EXPRESS, STATUTORY OR IMPLIED, INCLUDING THE IMPLIED W ARRANTIES OF MERCHANTAB ILITY AND
FITNESS FOR PARTICULAR PURPOSE, WITH REGARD TO ANY CIRRUS PRODUCT THAT IS USED IN SUCH A MANNER. IF THE CUSTOMER OR CUSTOMER'S CUSTOMER USES OR PERMITS THE USE OF CIRRUS PRODUCTS IN CRITICAL APPLICATIONS, CUSTOMER AGREES, BY SUCH USE, TO FULLY INDEMNIFY CIRRUS, ITS OFFICERS, DIRECTORS, EMPLOYEES, DISTRIBUTORS AND OTHER AGENTS FROM ANY AND ALL LIABIL ITY, INCLUDING
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Cirrus Logic, Cirrus, and the Cirrus Logic logo designs are trademarks of Cirrus Logic, Inc. All other brand and product names in this document may be trademarks
or service marks of their respective owners.
40DS703F2
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