Supervisory Circuits with I2C Serial 2k-bit CMOS EEPROM and Manual Reset
FEATURES
■ Precision power supply voltage monitor
— 5V, 3.3V and 3V systems
— Five threshold voltage options
■ Active high or low reset
— Valid reset guaranteed at V
■ 400kHz I
2
C bus
CC
= 1V
■ 3.0V to 5.5V operation
■ Low power CMOS technology
DESCRIPTION
The CAT1024 and CAT1025 are complete memory and
supervisory solutions for microcontroller-based systems.
A 2k-bit serial EEPROM memory and a system power
supervisor with brown-out protection are integrated
together in low power CMOS technology. Memory
interface is via a 400kHz I2C bus.
The CAT1025 provides a precision VCC sense circuit
and two open drain outputs: one (RESET) drives high
and the other (RESET) drives low whenever VCC falls
below the reset threshold voltage. The CAT1025 also
has a Write Protect input (WP). Write operations are
disabled if WP is connected to a logic high.
The CAT1024 also provides a precision VCC sense
circuit, but has only a RESET output and does not have
a Write Protect input.
The power supply monitor and reset circuit protect
memory and system controllers during power up/down
and against brownout conditions. Five reset threshold
■ 16-Byte page write buffer
■ Built-in inadvertent write protection
— WP pin (CAT1025)
■ 1,000,000 Program/Erase cycles
■ Manual reset input
■ 100 year data retention
■ 8-pin DIP, SOIC, TSSOP, MSOP &
TDFN (3x3mm foot print) packages
■ Industrial and extended temperature ranges
voltages support 5V, 3.3V and 3V systems. If power supply
voltages are out of tolerance reset signals become active,
preventing the system microcontroller, ASIC or peripherals
from operating. Reset signals become inactive typically 200
ms after the supply voltage exceeds the reset threshold
level. With both active high and low reset signals, interface
to microcontrollers and other ICs is simple. In addition, the
RESET pin or a separate input, MR, can be used as an input
for push-button manual reset capability.
The CAT1024/25 memory features a 16-byte page. In
addition, hardware data protection is provided by a V
sense circuit that prevents writes to memory whenever V
falls below the reset threshold or until VCC reaches the reset
threshold during power up.
Available packages include an 8-pin DIP, 8-pin SOIC, 8-pin
TSSOP, 8-pin TDFN and 8-pin MSOP. The TDFN package
thickness is 0.8mm maximum. TDFN footprint is 3x3mm.
These are open drain pins and RESET can be used as a
manual reset trigger input. By forcing a reset condition on
the pin the device will initiate and maintain a reset condition.
The RESET pin must be connected through a pull-down
resistor, and the RESET pin must be connected through a
pull-up resistor.
SDA:SERIAL DATA ADDRESS
The bidirectional serial data/address pin is used to transfer
all data into and out of the device. The SDA pin is an open
drain output and can be wire-ORed with other open drain
or open collector outputs.
SCL:SERIAL CLOCK
Serial clock input.
CAT10XX FAMILY OVERVIEW
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MR:MR:
MR:MANUAL RESET INPUT
MR:MR:
Manual Reset input is a debounced input that can be
connected to an external source for Manual Reset.
Pulling the MR input low will generate a Reset condition.
Reset outputs are active while MR input is low and for
the reset timeout period after MR returns to high. The
input has an internal pull-up resistor.
WP (CAT1025 Only):WRITE PROTECT INPUT
When tied to V
or left unconnected write operations
SS
to the entire array are allowed. When tied to VCC, the
entire array is protected. This input has an internal pull
down resistor.
For supervisory circuits with embedded 16k EEPROM, please refer to the CAT1161, CAT1162 and CAT1163
data sheets.
3
Doc No. 3008, Rev. M
CAT1024, CAT1025
ABSOLUTE MAXIMUM RATINGS
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature....................... –65°C to +150°C
Voltage on any Pin with
Respect to Ground
with Respect to Ground ............... –2.0V to +7.0V
V
CC
Package Power Dissipation
Capability (T
(1)
............ –2.0V to +VCC +2.0V
= 25°C) ................................... 1.0W
A
Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions
outside of those listed in the operational sections of this specification
is not implied. Exposure to any absolute maximum rating for extended
periods may affect device performance and reliability.
Note:
(1) The minimum DC input voltage is –0.5V. During transitions,
inputs may undershoot to –2.0V for periods of less than 20 ns.
Maximum DC voltage on output pins is VCC +0.5V, which may
overshoot to V
(2) Output shorted for no more than one second. No more than
one output shorted at a time.
+2.0V for periods of less than 20 ns.
CC
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current
(2)
........................ 100 mA
D.C. OPERATING CHARACTERISTICS
VCC = +3.0V to +5.5V and over the recommended temperature conditions unless otherwise specified.
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Notes:
1. VIL min and VIH max are reference values only and are not tested.
2. This parameter is tested initially and after a design or process change that affects the parameter. Not 100% tested.
1. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
2. Test Conditions according to “AC Test Conditions” table.
3. The write cycle time is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the write
cycle, the bus interface circuits are disabled, SDA is allowed to remain high and the device does not respond to its slave address.
1. Test Conditions according to “AC Test Conditions” table.
2. Power-up, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
3. Power-Down, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
4. VCC Glitch Reference Voltage = V
5. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
6. t
and t
PUR
7. Latch-up protection is provided for stresses up to 100mA on input and output pins from -1V to VCC + 1V.
EnduranceMIL-STD-883, Test Method 1033 1,000,000Cycles/Byte
Data RetentionMIL-STD-883, Test Method 1008100Years
ESD SusceptibilityMIL-STD-883, Test Method 30152000Volts
Latch-UpJEDEC Standard 17100mA
; Based on characterization data
THmin
are the delays required from the time VCC is stable until the specified memory operation can be initiated.
PUW
Doc. No. 3008, Rev. M
6
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