Analog Devices AD7869 Datasheet

LC2MOS
RO DAC
RI DAC
DGND
AD7869
R
R
RO ADC
AGND
CLOCK
R
R
14 - BIT
DAC
DAC
SERIAL
INTERFACE
ADC SERIAL INTERFACE
14 - BIT
ADC
DAC 3V
REFERENCE
ADC 3V
REFERENCE
TRACK/HOLD
V
SS
V
DD
V
IN
V
OUT
LDAC
TFS
TCLK
DT
CONTROL
RFS
RCLK
DR
CLK
CONVST
a
Complete, 14-Bit Analog I/O System
FEATURES Complete 14-Bit l/O System, Comprising
14-Bit ADC with Track/Hold Amplifier
83 kHz Throughput Rate
14-Bit DAC with Output Amplifier
3.5 ms Settling Time
On-Chip Voltage Reference Operates from 65 V Supplies Low Power—130 mW typ Small 0.3" Wide DIP
APPLICATIONS Digital Signal Processing Speech Recognition and Synthesis Spectrum Analysis High Speed Modems DSP Servo Control
GENERAL DESCRIPTION
The AD7869 is a complete 14-bit I/O system containing a DAC and an ADC. The ADC is a successive approximation type with a track-and-hold amplifier, having a combined throughput rate of 83 kHz. The DAC has an output buffer amplifier with a set­tling time of 4 µs to 14 bits. Temperature compensated 3 V bur- ied Zener references provide precision references for the DAC and ADC.
Interfacing to both the DAC and ADC is serial, minimizing pin count and giving a small 24-pin package size. Standard control signals allow serial interfacing to most DSP machines.
Asynchronous ADC conversion control and DAC updating is made possible with the
CONVST and LDAC logic inputs.
The AD7869 operates from ±5 V power supplies; the analog in­put/output range of the ADC/DAC is ±3 V. The part is fully specified for dynamic parameters such as signal-to-noise ratio and harmonic distortion as well as traditional dc specifications.
The part is available in a 24-pin, 0.3 inch wide, plastic or her­metic dual-in-line package (DIP) and in a 28-pin, plastic SOIC package.
AD7869
FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. Complete 14-Bit I/O System. The AD7869 contains a 14-bit ADC with a track-and-hold amplifier and a 14-bit DAC with output amplifier. Also in cluded are separate on-chip voltage references for the DAC and the ADC.
2. Dynamic Specifications for DSP Users. In addition to traditional dc specifications, the AD7869 is specified for ac parameters, including signal-to-noise ratio and harmonic distortion. These parameters, along with im­portant timing parameters, are tested on every device.
3. Small Package. The AD7869 is available in a 24-pin DIP and a 28-pin SOIC package.
REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 World Wide Web Site: http://www.analog.com Fax: 617/326-8703 © Analog Devices, Inc., 1996
AD7869–SPECIFICA TIONS
(VDD = +5 V 6 5%, VSS = –5 V 6 5%, AGND = DGND = 0 V, f
ADC SECTION
Parameter J Version1A Version1Units Test Conditions/Comments
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
T
to T
MIN
Total Harmonic Distortion (THD) –86 –86 dB typ V Peak Harmonic or Spurious Noise –86 –86 dB typ V Intermodulation Distortion (IMD)
Second Order Terms –86 –86 dB typ fa = 9 kHz, fb = 9.5 kHz, f Third Order Terms –88 –88 dB typ fa = 9 kHz, fb = 9.5 kHz, f
Track/Hold Acquisition Time 2 2 µs max
DC ACCURACY
Resolution 14 14 Bits Minimum Resolution 14 14 Bits No Missing Codes Are Guaranteed Integral Nonlinearity ±2 ±2 LSB max Differential Nonlinearity ±1 ±1 LSB max Bipolar Zero Error ±20 ±20 LSB max Positive Gain Error Negative Gain Error
ANALOG INPUT
Input Voltage Range ±3 ±3 Volts Input Current ±1 ±1 mA max
REFERENCE OUTPUT
RO ADC @ +25°C 2.99/3.01 2.99/3.01 V min/ V max RO ADC TC ±25 ±25 ppm/°C typ
Reference Load Sensitivity
(RO ADC vs. I) –1.5 –1.5 mV max Reference Load Current Change (0–500 µA),
LOGIC INPUTS
(
CONVST, CLK, CONTROL)
Input High Voltage, V Input Low Voltage, V Input Current, I Input Current7 (CONTROL & CLK) ±10 ±10 µA max VIN = VSS to DGND Input Capacitance, C
LOGIC OUTPUTS
DR,
Output Low Voltage, V
RCLK Output
Output Low Voltage, V
DR,
Floating-State Leakage Current ±10 ±10 µA max Floating-State Output Capacitance
CONVERSION TIME
External Clock 10 10 µs max Internal Clock 10 10 µs max The Internal Clock Has a Nominal Value of 2.0 MHz
POWER REQUIREMENTS For Both DAC and ADC
V
DD
V
SS
I
DD
I
SS
Total Power Dissipation 170 170 mW max Typically 130 mW
NOTES
1
Temperature ranges are as follows: J Version, 0°C to +70° C; A Version, –40°C to +85 °C.
2
VIN = ±3 V.
3
SNR calculation includes distortion and noise components.
4
SNR degradation due to asynchronous DAC updating during conversion is 0.1 dB typ.
5
Measured with respect to internal reference.
6
For capacitive loads greater than 50 pF, a series resistor is required (see Internal Reference section).
7
Tying the CONTROL input to VDD places the device in a factory test mode where normal operation is not exhibited.
8
Sample tested @ +25°C to ensure compliance.
Specifications subject to change without notice.
MAX
RFS Outputs
RFS, RCLK Outputs
All specifications T
2
3, 4
(SNR) @ +25°C 78 78 dB min VIN = 10 kHz Sine Wave, f
MIN
to T
unless otherwise noted.)
MAX
78 77 dB min
5
5
6
±20 ±20 LSB max ±20 ±20 LSB max
±40 ±ppm/°C max
INH
INL
IN
8
IN
OL
OL
2.4 2.4 V min VDD = 5 V ± 5%
0.8 0.8 V max VDD = 5 V ± 5% ±10 ±10 µA max VIN = 0 V to V
10 10 pF max
0.4 0.4 V max I
0.4 0.4 V max I
8
15 15 pF max
+5 +5 V nom ±5% for Specified Performance –5 –5 V nom ±5% for Specified Performance 22 22 mA max Cumulative Current from the Two VDD Pins 12 12 mA max Cumulative Current from the Two VSS Pins
= 2.0 MHz external.
CLK
= 10 kHz Sine Wave, f
IN
= 10 kHz Sine Wave, f
IN
Reference Load Should Not Be Changed During Conversion
DD
= 1.6 mA, Pull-Up Resistor = 4.7 k
SINK
= 2.6 mA, Pull-Up Resistor = 2 k
SINK
SAMPLE
SAMPLE SAMPLE
SAMPLE SAMPLE
= 83 kHz = 83 kHz
= 83 kHz = 50 kHz
= 50 kHz
–2–
REV. A
AD7869
(VDD = +5 V 6 5%, VSS = –5 V 6 5%, AGND = DGND = 0 V, Rl DAC = +3 V and decoupled as shown in Figure 2, V
DAC SECTION
Load to AGND; = 2 kV, CL = 100 pF. All specifications T
OUT
Parameter J Versions1A Version1Units Test Conditions/Comments
DYNAMIC PERFORMANCE
2
Signal-to-Noise Ratio3 (SNR) @ +25°C 78 78 dB min V
to T
T
MIN
MAX
78 77 dB min Typically 82 dB at +25°C for 0 < V
Total Harmonic Distortion (THD) –86 –86 dB typ V Peak Harmonic or Spurious Noise –86 –86 dB typ V
DC ACCURACY
Resolution 14 14 Bits Integral Nonlinearity ±2 ± 2 LSB max Differential Nonlinearity ±1 ± 1 LSB max Guaranteed Monotonic Bipolar Zero Error ±10 ±10 LSB max Positive Full-Scale Error Negative Full-Scale Error
REFERENCE OUTPUT
5
5
6
±10 ±10 LSB max ±10 ±10 LSB max
RO DAC @ +25°C 2.99/3.01 2.99/3.01 V min/V max RO DAC TC ±25 ±25 ppm/°C typ
±40 ppm/°C max
Reference Load Change
(RO DAC vs. I) –1.5 –1.5 mV max Reference Load Current Change (0 µA–500 µA)
REFERENCE INPUT
RI DAC Input Range 2.85/3.15 2.85/3.15 V min/V max 3 V ± 5% Input Current 1 1 µA max
LOGIC INPUTS
LDAC, TFS, TCLK, DT)
(
Input High Voltage, V Input Low Voltage, V Input Current, I Input Capacitance, C
INL
IN
IN
INH
7
2.4 2.4 V min VDD = 5 V ± 5%
0.8 0.8 V max VDD = 5 V ± 5% ±10 ±10 µA max VIN = 0 V to V 10 10 pF max
ANALOG OUTPUT
Output Voltage Range ±3 ±3 V nom DC Output Impedance 0.3 0.3 typ Short-Circuit Current 20 20 mA typ
AC CHARACTERISTICS
7
Voltage Output Settling-Time Settling Time to Within ±1/2 LSB of Final Value
Positive Full-Scale Change 4 4 µs max Typically 3 µs
Negative Full-Scale Change 4 4 µs max Typically 3.5 µs Digital-to-Analog Glitch Impulse 10 10 nV secs typ DAC Code Change All 1s to All 0s Digital Feedthrough 2 2 nV secs typ VIN to V
Isolation 100 100 dB typ VIN = ±3 V, 41.5 kHz Sine Wave
OUT
POWER REQUIREMENTS As per ADC Section
NOTES
1
Temperature ranges are as follows: J Version, 0°C to +70° C; A Version, –40°C to +85 °C.
2
V
(p-p) = ±3 V.
OUT
3
SNR calculation includes distortion and noise components.
4
Using external sample and hold, see Figures 13 to 15.
5
Measured with respect to REF IN and includes bipolar offset error.
6
For capacitive loads greater than 50 pF a series resistor is required (see Internal Reference section).
7
Sample tested @ +25°C to ensure compliance.
Specifications subject to change without notice
to T
MIN
unless otherwise noted.)
MAX
= 1 kHz Sine Wave, f
OUT
= 1 kHz Sine Wave, f
OUT
Typically –84 dB at +25°C for 0 < V
= 1 kHz, f
OUT
SAMPLE
Typically –84 dB at +25°C for 0 < V
DD
SAMPLE
SAMPLE
= 83 kHz
= 83 kHz
< 20 kHz
OUT
= 83 kHz
< 20 kHz
OUT
< 20 kHz
OUT
4
4
4
REV. A
–3–
AD7869
MIN
1, 2
(VDD = +5 V 6 5%, VSS = –5 V 6 5%, AGND = DGND = 0 V)
, T
MAX
TIMING SPECIFICATIONS
Limit at T
Parameter (All Versions) Units Conditions/Comments
ADC TIMING
t
1
3
t
2
t
3
t
4
4
t
5
t
6
5
t
13
DAC TIMING
t
7
t
8
t
9
t
10
t
11
t
l2
NOTES
1
Timing specifications are sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
Serial timing is measured with a 4.7 k pull-up resistor on DR and RFS and a 2 k pull-up resistor on RCLK. The capacitance on all three outputs is 35 pF.
3
When using internal clock, RCLK mark/space ratio (measured form a voltage level of 1.6 V) range is 40/60 to 60/40. For external clock, RCLK mark/space ratio = external clock mark/space ratio.
4
DR will drive higher capacitance loads but this will add to t5 since it increases the external RC time constant (4.7 k //CL) and hence the time to reach 2.4 V.
5
Time 2 RCLK to 3 RCLK depends on conversion start to ADC clock synchronization.
6
TCLK mark/space ratio is 40/60 to 60/40.
50 ns min CONVST Pulse Width 440 ns min RCLK Cycle Time, Internal Clock 100 ns min RFS to RCLK Falling Edge Setup Time 20 ns min RCLK Rising Edge to RFS 100 ns max 155 ns max RCLK to Valid Data Delay, CL = 35 pF 4 ns min Bus Relinquish Time after RCLK 100 ns max 2 RCLK + 200 to ns typ CONVST to RFS Delay 3 RCLK + 200
50 ns min TFS to TCLK Falling Edge 75 ns min TCLK Falling Edge to TFS 150 ns min TCLK Cycle Time 30 ns min Data Valid to TCLK Setup Time 75 ns min Data Valid to TCLK Hold Time 40 ns min LDAC Pulse Width
ABSOLUTE MAXIMUM RATINGS*
(TA = + 25°C unless otherwise noted)
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V
SS
AGND to DGND . . . . . . . . . . . . . . . . –0.3 V to V
V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . VSS to V
OUT
VIN to AGND . . . . . . . . . . . . . . . . V
–0.3 V to VDD + 0.3 V
SS
RO ADC to AGND . . . . . . . . . . . . . . . –0.3 V to V
RO DAC to AGND . . . . . . . . . . . . . . . –0.3 V to V
RI DAC to AGND . . . . . . . . . . . . . . . –0.3 V to V
Digital Inputs to DGND . . . . . . . . . . . –0.3 V to V
Digital Outputs to DGND . . . . . . . . . . –0.3 V to V
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
DD
Operating Temperature Range
J Version . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
A Version . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . . 1000 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7869 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE
Signal-
Temperature to-Noise Relative Package
Model Range Ratio (SNR) Accuracy Option*
AD7869JN 0°C to +70°C 78 dB ±2 LSB max N-24 AD7869JR 0°C to +70°C 78 dB ±2 LSB max R-28 AD7869AQ –40°C to +85°C 77 dB ±2 LSB max Q-24
*N = Plastic DIP; Q = Cerdip; R = Small Outline IC (SOIC).
WARNING!
ESD SENSITIVE DEVICE
–4–
REV. A
AD7869
0.01 (0.254)
0.006 (0.15)
0.019 (0.49)
0.014 (0.35)
0.096 (2.44)
0.089 (2.26)
0.05 (1.27) BSC
0.013 (0.32)
0.009 (0.23)
0.042 (1.067)
0.018 (0.457)
6° 0°
0.03 (0.76)
0.02 (0.51)
x 45°
0.708 (18.02)
0.696 (17.67)
0.414 (10.52)
0.398 (10.10)
0.299 (7.6)
0.291 (7.39)
28 15
141
1. LEAD NO. 1 INDENTIFIED BY A DOT.
2. SOIC LEADS WILL BE EITHER TIN PLATED OR SOLDER DIPPED IN ACCORDANCE WITH MIL-M-38510 REQUIREMENTS.
AD7869 PIN FUNCTION DESCRIPTION
DIP Pin Number Mnemonic Function
POWER SUPPLY 7 & 23 V
10 & 22 V
DD SS
8 & 19 AGND Analog Ground. Both AGND pins must be tied together. 6 & 17 DGND Digital Ground. Both DGND pins must be tied together.
ANALOG SIGNAL AND REFERENCE 21 V
9V
IN OUT
20 RO ADC Voltage Reference Output. The internal ADC 3 V reference is provided at this pin. This output may be used as a
11 RO DAC DAC Voltage Reference Output. This is one of two internal voltage references. To operate the DAC with this
12 RI DAC DAC Voltage Reference Input. The voltage reference for the DAC must be applied to this pin. It is internally
ADC INTERFACE AND CONTROL 2 CLK Clock Input. An external TTL-compatible clock may be applied to this input. Alternatively, tying this pin to V
3
RFS Receive Frame Synchronization, Logic Output. This is an active low open-drain output that provides a framing
4 RCLK Receive Clock, Logic Output. RCLK is the gated serial clock output that is derived from the internal or external
5 DR Receive Data, Logic Output. This is an open-drain data output used in conjunction with
1
CONVST Convert Start, Logic Input. A low to high transition on this input puts the track-and-hold amplifier into the hold
24 CONTROL Control, Logic Input. With this pin at 0 V, the RCLK is noncontinuous. With this pin at –5 V, the RCLK is contin-
DAC INTERFACE AND CONTROL 14
TFS Transmit Frame Synchronization, Logic Input. This is a frame or synchronization signal for the DAC with serial 15 DT Transmit Data, Logic Input. This is the data input that is used in conjunction with 16 TCLK Transmit Clock, Logic Input. Serial data bits are latched on the falling edge of TCLK when
13
LDAC Load DAC, Logic Input. A new word is transferred into the DAC latch from the input latch on the falling edge 18 NC No Connect.
Positive Power Supply, 5 V ± 5%. Both VDD pins must be tied together. Negative Power Supply, –5 V ± 5%. Both VSS pins must be tied together.
ADC Analog Input. The ADC input range is ±3 V. Analog Output Voltage from DAC. This output comes from a buffer amplifier. The range is bipolar, ±3 V
with RI DAC = +3 V.
reference for the DAC by connecting it to the RI DAC input. The external load capability of this reference is 500 µA.
internal reference, RO DAC should be connected to RI DAC. The external load capability of the reference is 500 µA.
buffered before being applied to the DAC. The nominal reference voltage for correct operation of the AD7869 is 3 V.
enables the internal laser-trimmed oscillator.
SS
pulse for serial data. An external 4.7 k pull-up resistor is required on
ADC clock. If the CONTROL input is at V
, the clock runs continuously. With the CONTROL input at DGND,
SS
RFS.
the RCLK output is gated off (three-state) after serial transmission is complete. RCLK is an open-drain output and requires an external 2 k pull-up resistor.
RFS and RCLK to transmit
data from the ADC. Serial data is valid on the falling edge of RCLK when
RFS is low. An external 4.7 k resistor is
required on the DR output.
mode and starts an ADC conversion. This input is asynchronous to the CLK input.
uous. Note, tying this pin to VDD places the part in a factory test mode where normal operation is not exhibited.
data expected after the falling edge of this signal.
TFS and TCLK to transfer
serial data to the input latch.
TFS is low.
of this signal.
CONVST
REV. A
RCLK
DGND
AGND
RO DAC
RI DAC
V
CLK RFS
V
V
DR
OUT
1 2 3 4 5 6 7
DD
8 9
10
SS
11 12
DIP
AD7869
TOP VIEW
(Not to Scale)
NC = NO CONNECT
24 23 22 21 20 19 18 17 16 15 14 13
CONTROL V
DD
V
SS
V
IN
RO ADC AGND NC DGND TCLK DT TFS
LDAC
PIN CONFIGURATIONS
SOIC
–5–
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