Analog Devices AD7569AR, AD7569AQ, AD7569AN, AD7569TQ, AD7569TE Datasheet

...
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
a
LC2MOS
Complete, 8-Bit Analog I/0 Systems
AD7569/AD7669
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 World Wide Web Site: http://www.analog.com Fax: 617/326-8703 © Analog Devices, Inc., 1996
FEATURES 2 ms ADC with Track/Hold 1 ms DAC with Output Amplifier
AD7569, Single DAC Output
AD7669, Dual DAC Output On-Chip Bandgap Reference Fast Bus Interface Single or Dual 5 V Supplies
GENERAL DESCRIPTION
The AD7569/AD7669 is a complete, 8-bit, analog I/O system on a single monolithic chip. The AD7569 contains a high speed successive approximation ADC with 2 µs conversion time, a track/ hold with 200 kHz bandwidth, a DAC and an output buffer ampli­fier with 1 µs settling time. A temperature-compensated 1.25 V bandgap reference provides a precision reference voltage for the ADC and the DAC. The AD7669 is similar, but contains two DACs with output buffer amplifiers.
A choice of analog input/output ranges is available. Using a sup­ply voltage of +5 V, input and output ranges of zero to 1.25 V and zero to 2.5 volts may be programmed using the RANGE in­put pin. Using a ±5 V supply, bipolar ranges of ±1.25 V or ±2.5 V may be programmed.
Digital interfacing is via an 8-bit I/O port and standard micro­processor control lines. Bus interface timing is extremely fast, al­lowing easy connection to all popular 8-bit microprocessors. A separate start convert line controls the track/hold and ADC to give precise control of the sampling period.
The AD7569/AD7669 is fabricated in Linear-Compatible CMOS (LC
2
MOS), an advanced, mixed technology process combining precision bipolar circuits with low power CMOS logic. The AD7569 is packaged in a 24-pin, 0.3" wide “skinny” DIP, a 24-terminal SOIC and 28-terminal PLCC and LCCC packages. The AD7669 is available in a 28-pin, 0.6" plastic DIP, 28-terminal SOIC and 28-terminal PLCC package.
AD7569 FUNCTIONAL BLOCK DIAGRAM
AD7669 FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. Complete Analog I/O on a Single Chip. The AD7569/AD7669 provides everything necessary to interface a microprocessor to the analog world. No external components or user trims are required and the overall accu­racy of the system is tightly specified, eliminating the need to calculate error budgets from individual component specifications.
2. Dynamic Specifications for DSP Users. In addition to the traditional ADC and DAC specifications, the AD7569/AD7669 is specified for ac parameters, includ­ing signal-to-noise ratio, distortion and input bandwidth.
3. Fast Microprocessor Interface. The AD7569/AD7669 has bus interface timing compatible with all modern microprocessors, with bus access and relin­quish times less than 75 ns and write pulse width less than 80 ns.
DAC SPECIFICATIONS
1
AD7569 J, A Versions
3
AD7569
AD7669 K, B AD7569 AD7569
Parameter J Version Versions S Version T Version Units Conditions/Comments
STATIC PERFORMANCE
Resolution
4
8 8 8 8 Bits
Total Unadjusted Error
5
± 2 ± 2 ± 3 ± 3 LSB typ
Relative Accuracy
5
± 1 ± 1/2 ±1 ±1/2 LSB max
Differential Nonlinearity
5
± 1 ± 3/4 ±1 ±3/4 LSB max Guaranteed Monotonic
Unipolar Offset Error DAC data is all 0s; V
SS
= 0 V
@ +25°C ± 2 ±1.5 ±2 ±1.5 LSB max Typical tempco is 10 µV/°C for +1.25 V range T
MIN
to T
MAX
±2.5 ±2 ±2.5 ±2 LSB max
Bipolar Zero Offset Error DAC data is all 0s; V
SS
= –5 V
@ +25°C ± 2 ±1 5 ±2 ±1.5 LSB max Typical tempco is 20 µV/°C for ±1.25 V range T
MIN
to T
MAX
±2.5 ±2 ±2.5 ±2 LSB max
Full-Scale Error
6
(AD7569 Only) VDD = 5 V
@ +25°C ± 2 ±1 ±2 ±1 LSB max T
MIN
to T
MAX
±3 ±2 ±4 ±3 LSB max
Full-Scale Error
6
(AD7669 Only) VDD = 5 V
@ +25°C ± 3 LSB max T
MIN
to T
MAX
±4.5 LSB max
DACA/DACB Full-Scale Error Match
6
(AD7669 Only) ± 2.5 LSB max VDD = 5 V
Full Scale/V
DD
, TA = +25°C 0.5 0.5 0.5 0.5 LSB max V
OUT
= 2.5 V; VDD = ±5%
Full Scale/V
SS
, TA = +25°C 0.5 0.5 0.5 0.5 LSB max V
OUT
= –2.5 V; VSS = ±5%
Load Regulation at Full Scale 0.2 0.2 0.2 0.2 LSB max RL = 2 k to °/C
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
5
(SNR) 44 46 44 46 dB min V
OUT
= 20 kHz full-scale sine wave with f
SAMPLING
= 400 kHz
Total Harmonic Distortion
5
(THD) 48 48 48 48 dB max V
OUT
= 20 kHz full-scale sine wave with f
SAMPLING
= 400 kHz
Intermodulation Distortion5 (IMD) 55 55 55 55 dB typ fa = 18.4 kHz, fb = 14.5 kHz with f
SAMPLING
= 400 kHz
ANALOG OUTPUT
Output Voltage Ranges
Unipolar 0 to +1.25/2.5 Volts V
DD
= +5 V, VSS = 0 V
Bipolar ±1.25/±2.5 Volts VDD = +5 V, VSS = –5 V
LOGIC INPUTS
CS, X/B,WR, RANGE, RESET, DB0–DB7
Input Low Voltage, V
INL
0.8 0.8 0.8 0.8 V max
Input High Voltage, V
INH
2.4 2.4 2.4 2.4 V min
Input Leakage Current 10 10 10 10 µA max V
IN
= 0 to V
DD
Input Capacitance
7
10 10 10 10 pF max
DB0–DB7
Input Coding (Single Supply) Binary Input Coding (Dual Supply) 2s Complement
AC CHARACTERlSTICS
7
Voltage Output Settling Time Settling time to within ±1/2 LSB of final value
Positive Full-Scale Change 2 2 2 2 µs max Typically 1 µs Negative Full-Scale Change (Single Supply) 4 4 4 4 µs max Typically 2 µs Negative Full-Scale Change (Dual Supply) 2 2 2 2 µs max Typically 1 µs
Digital-to-Analog Glitch Impulse
5
15 15 15 15 nV secs typ
Digital Feedthrough
5
1 1 1 1 nV secs typ
V
IN
to V
OUT
Isolation 60 60 60 60 dB typ VIN = ±2.5 V, 50 kHz Sine Wave
DAC to DAC Crosstalk
5
(AD7669 Only) 1 nV secs typ
DACA to DACB Isolation5 (AD7669 Only) –70 dB max
POWER REQUIREMENTS
V
DD
Range 4.75/5.25 4.75/5.25 4.75/5.25 4.75/5.25 V min/V max For Specified Performance
V
SS
Range (Dual Supplies) –4.75/–5.25 –4.75/–5.25 –4.75/–5.25 –4.75/–5.25 V min/V max Specified Performance also applies to VSS = 0 V
for unipolar ranges.
I
DD
V
OUT
= VIN = 2.5 V; Logic Inputs = 2.4 V; CLK = 0.8 V (AD7569) 13 13 13 13 mA max Output unloaded (AD7669) 18 mA max Outputs unloaded
I
SS
(Dual Supplies) V
OUT
= VIN = –2.5 V; Logic Inputs = 2.4 V; CLK = 0.8 V (AD7569) 4 4 4 4 mA max Output unloaded (AD7669) 6 mA max Outputs unloaded
DAC/ADC MATCHING
Gain Matching
6
VIN to V
OUT
match with VIN = ±2.5 V,
@ +25°C 1 111% typ20 kHz sine wave T
MIN
to T
MAX
1 111% typ
NOTES
1
Specifications apply to both DACs in the AD7669. V
OUT
applies to both V
OUT
A and V
OUT
B of the AD7669.
2
Except where noted, specifications apply for all output ranges including bipolar ranges with dual supply operation.
3
Temperature ranges as follows: J, K versions; 0°C to +70°C
A, B versions; –40°C to +85°C S, T versions; –55°C to +125°C
4
1 LSB = 4.88 mV for 0 V to +1.25 V output range, 9.76 mV for 0 V to +2.5 V and ±1.25 V ranges and 19.5 mV for ±2.5 V range.
5
See Terminology.
6
Includes internal voltage reference error and is calculated after offset error has been adjusted out. Ideal unipolar full-scale voltage is (FS – 1 LSB); ideal bipolar positive full-scale voltage is (FS/2 – 1 LSB)
and ideal bipolar negative full-scale voltage is –FS/2.
7
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
–2–
REV. B
AD7569/AD7669–SPECIFICATIONS
(VDD = +5 V 6 5%; V
SS
2
= RANGE = AGND
DAC
= AGND
ADC
= DGND = 0 V; RL = 2 kV, CL = 100 pF to AGND
DAC
unless otherwise noted. All specifications T
MIN
to T
MAX
unless otherwise noted.)
ADC SPECIFICATIONS
AD7569 J, A Versions
3
AD7569
AD7669 K, B AD7569 AD7569
Parameter J Version Versions S Version T Version Units Conditions/Comments
DC ACCURACY
Resolution
3
8 8 8 8 Bits
Total Unadjusted Error
4
± 3 ± 3 ±4 ±4 LSB typ
Relative Accuracy
4
± 1 ± 1/2 ± 1 ± 1/2 LSB max
Differential Nonlinearity
4
± 1 ± 3/4 ± 1 ± 3/4 LSB max No Missing Codes
Unipolar Offset Error Typical tempco is 10 µV/°C for +1.25 V range; V
SS
= 0 V
@ +25°C ±2 ± 1.5 ±2 ± 1.5 LSB max T
MIN
to T
MAX
± 3 ±2.5 ±3 ±2.5 LSB max
Bipolar Zero Offset Error Typical tempco is 20 µV/°C for + 1.25 V range; V
SS
= –5 V
@ +25°C ±3 ± 2.5 ±3 ± 2.5 LSB max T
MIN
to T
MAX
±3.5 ±3 ±4 ± 3.5 LSB max
Full-Scale Error
5
VDD = 5 V
@ +25°C –4, +0 –4, +0 –4, +0 –4, +0 LSB max T
MIN
to T
MAX
–5.5, +1.5 –5.5, +1.5 –7.5, +2 –7.5, +2 LSB max
Full Scale/V
DD
, TA = +25°C 0.5 0.5 0.5 0.5 LSB max VIN = +2.5 V; VDD = ±5%
Full Scale/VSS, TA = +25°C 0.5 0.5 0.5 0.5 LSB max VIN = –2.5 V; VSS = ± 5%
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
4
(SNR) 44 46 44 45 dB min VIN = 100 kHz full-scale sine wave with f
SAMPLING
= 400 kHz
6
Total Harmonic Distortion4 (THD) 48 48 48 48 dB max VIN = 100 kHz full-scale sine wave with f
SAMPLING
= 400 kHz
6
Intermodulation Distortion4 (IMD) 60 60 60 60 dB typ fa = 99 kHz, fb = 96.7 kHz with f
SAMPLING
= 400 kHz
Frequency Response 0.1 0.1 0.1 0.1 dB typ V
IN
= ±2.5 V, dc to 200 kHz sine wave
Track/Hold Acquisition Time
7
200 200 300 300 ns typ
ANALOG INPUT
Input Voltage Ranges
Unipolar 0 to +1.25/ +2.5 Volts V
DD
= +5 V; VSS = 0 V
Bipolar ± 1.25/±2.5 Volts V
DD
= +5 V; VSS = –5 V
Input Current ±300 ± 300 ±300 ±300 µA max See equivalent circuit Figure 5 Input Capacitance 10 10 10 10 pF typ
LOGIC INPUTS
CS, RD, ST, CLK, RESET, RANGE
Input Low Voltage, V
INL
0.8 0.8 0.8 0.8 V max
Input High Voltage, V
INH
2.4 2.4 2.4 2.4 V min
Input Capacitance
8
10 10 10 10 pF max
CS, RD, ST, RANGE, RESET
Input Leakage Current 10 10 10 10 µA max V
IN
= 0 to V
DD
CLK
Input Current
I
INL
–1.6 –1.6 –1.6 –1.6 mA max VIN = 0 V
I
INH
40 40 40 40 µA max VIN = V
DD
LOGIC OUTPUTS
DB0–DB7,
INT, BUSY
VOL, Output Low Voltage 0.4 0.4 0.4 0.4 V max I
SINK
= 1.6 mA
V
OH
, Output High Voltage 4.0 4.0 4.0 4.0 V min I
SOURCE
= 200 µA
DB0–DB7
Floating State Leakage Current 10 10 10 10 µA max Floating State Output Capacitance
8
10 10 10 10 pF max Output Coding (Single Supply) Binary Output Coding (Dual Supply) 2s Complement
CONVERSION TIME
With External Clock 2 2 2 2 µs max f
CLK
= 5 MHz
With Internal Clock, T
A
= +25°C 1.6 1.6 1.6 1.6 µs min Using recommended clock components shown in Figure 21.
2.6 2.6 2.6 2.6 µs max Clock frequency can be adjusted by varying R
CLK
.
POWER REQUIREMENTS As per DAC Specifications
NOTES
1
Except where noted, specifications apply for all ranges including bipolar ranges with dual supply operation.
2
Temperature ranges are as follows: J, K versions; 0°C to +70°C
A, B versions; –40°C to +85°C S, T versions; –55°C to +125°C
3
1 LSB = 4.88 mV for 0 V to +1.25 V range, 9.76 mV for 0 V to +2.5 V and ±1.25 V ranges and 19.5 mV for +2.5 V range.
4
See Terminology.
5
Includes internal voltage reference error and is calculated after offset error has been adjusted out. Ideal unipolar last code transition occurs at (FS – 3/2 LSB). Ideal bipolar last code transition occurs at (FS/2 – 3/2 LSB).
6
Exact frequencies are 101 kHz and 384 kHz to avoid harmonics coinciding with sampling frequency.
7
Rising edge of BUSY to falling edge of ST. The time given refers to the acquisition time, which gives a 3 dB degradation in SNR from the tested figure.
8
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
(VDD = +5 V 6 5%; V
SS
1
= RANGE = AGND
DAC
= AGND
DAC
= DGND = 0 V; f
CLK
= 5 MHz external unless other-
wise noted. All specifications T
MIN
to T
MAX
unless otherwise noted.) Specifications apply to Mode 1 interface.
AD7569/AD7669
–3–
REV. B
AD7569/AD7669–TIMING CHARACTERISTICS
1
Limit at Limit at
Limit at T
MIN
, T
MAX
T
MIN
, T
MAX
Parameter 258C (All Grades) (J, K, A, B Grades) (S, T Grades) Units Test Conditions/Comments
DAC Timing
t
1
80 80 90 ns min WR Pulse Width
t
2
0 0 0 ns min CS, A/B to WR Setup Time
t
3
0 0 0 ns min CS, A/B to WR Hold Time
t
4
60 70 80 ns min Data Valid to WR Setup Time
t
5
10 10 10 ns min Data Valid to WR Hold Time
ADC Timing
t
6
50 50 50 ns min ST Pulse Width
t
7
110 130 150 ns max ST to BUSY Delay
t
8
20 30 30 ns max BUSY to INT Delay
t
9
0 0 0 ns min BUSY to CS Delay
t
10
0 0 0 ns min CS to RD Setup Time
t
11
60 75 90 ns min RD Pulse Width Determined by t13.
t
12
0 0 0 ns min CS to RD Hold Time
t
13
2
60 75 90 ns max Data Access Time after RD; CL = 20 pF 95 120 135 ns max Data Access Time after
RD; CL = 100 pF
t
14
3
10 10 10 ns min Bus Relinquish Time after RD 60 75 85 ns max
t
15
65 75 85 ns max RD to INT Delay
t
16
120 140 160 ns max RD to BUSY Delay
t
17
2
60 75 90 ns max Data Valid Time after BUSY; CL = 20 pF 90 115 135 ns max Data Valid Time after BUSY; CL = 100 pF
NOTES
1
Sample tested at +25°C to ensure compliance. All input control signals are specified with tR = tF = 5 ns (10% to 90% of +5 V) and timed from a voltage level of 1.6 V.
2
t13 and t17 are measured with the load circuits of Figure 1 and defined as the time required for an output to cross either 0.8 V or 2.4 V.
3
tl4 is defined as the time required for the data line to change 0.5 V when loaded with the circuit of Figure 2.
Specifications subject to change without notice.
REV. B
–4–
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7569/AD7669 features proprietary ESD protection circuitry, permanent dam­age may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS
VDD to AGND
DAC
or AGND
ADC
. . . . . . . . . . . . .–0.3 V, +7 V
V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V
V
DD
to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +14 V
AGND
DAC
or AGND
ADC
to DGND . . . . –0.3 V, VDD + 0.3 V
AGND
DAC
to AGND
ADC
. . . . . . . . . . . . . . . . . . . . . . . . . ±5 V
Logic Voltage to DGND . . . . . . . . . . . . . –0.3 V, V
DD
+ 0.3 V
CLK Input Voltage to DGND . . . . . . . . . –0.3 V, V
DD
+ 0.3 V
V
OUT
(V
OUT
A, V
OUT
B) to
AGND
1
DAC
. . . . . . . . . . . . . . . . . VSS – 0.3 V, VDD + 0.3 V
V
IN
to AGND
ADC
. . . . . . . . . . . . . . . VSS – 0.3 V, VDD + 0.3 V
NOTE
1
Output may be shorted to any voltage in the range VSS to VDD provided that the power dissipation of the package is not exceeded. Typical short circuit current for a short to AGND or VSS is 50 mA.
Figure 1. Load Circuits for Data Access Time Test
a. High-Z to V
OH
Figure 2. Load Circuits for Bus Relinquish Time Test
b. High-Z to V
OL
a. VOH to High-Z b. VOL to High-Z
Power Dissipation (Any Package) to +75°C . . . . . . . . 450 mW
Derates above 75°C by . . . . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature Range
Commercial (J, K) . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Industrial (A, B) . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (S, T) . . . . . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other condition above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
(See Figures 8, 10, 12; VDD = 5 V 6 5%; VSS = 0 V or –5 V 6 5%)
AD7569/AD7669
–5–
REV. B
NOTE: The term DAC (Digital-to-Analog Converter) throughout the data sheet applies equally to the dual DACs in the AD7669 as well as to the single DAC of the AD7569 unless otherwise stated. It follows that the term V
OUT
applies to both V
OUT
A and
V
OUT
B of the AD7669 also.
TERMINOLOGY Total Unadjusted Error
Total unadjusted error is a comprehensive specification that in­cludes internal voltage reference error, relative accuracy, gain and offset errors.
Relative Accuracy (DAC)
Relative Accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after al­lowing for offset and gain errors. For the bipolar output ranges, the endpoints of the DAC transfer function are defined as those voltages that correspond to negative full-scale and positive full­scale codes. For the unipolar output ranges, the endpoints are code 1 and code 255. Code 1 is chosen because the amplifier is now working in single supply and, in cases where the true offset of the amplifier is negative, it cannot be seen at code 0. If the relative accuracy were calculated between code 0 and code 255, the “negative offset” would appear as a linearity error. If the off­set is negative and less than 1 LSB, it will appear at code 1, and hence the true linearity of the converter is seen between code 1 and code 255.
Relative Accuracy (ADC)
Relative Accuracy is the deviation of the ADC’s actual code transition points from a straight line drawn between the end­points of the ADC transfer function. For the bipolar input ranges, these points are the measured, negative, full-scale transi­tion point and the measured, positive, full-scale transition point. For the unipolar ranges, the straight line is drawn between the measured first LSB transition point and the measured full-scale transition point.
Differential Nonlinearity
Differential Nonlinearity is the difference between the measured change and an ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ± 1 LSB max en­sures monotonicity (DAC) or no missed codes (ADC). A differ­ential nonlinearity of ±3/4 LSB max ensures that the minimum step size (DAC) or code width (ADC) is 1/4 LSB, and the maxi­mum step size or code width is 3/4 LSB.
Digital-to-Analog Glitch Impulse
Digital-to-Analog Glitch Impulse is the impulse injected into the analog output when the digital inputs change state with the DAC selected. It is normally specified as the area of the glitch in nV secs and is measured when the digital input code is changed by 1 LSB at the major carry transition.
Digital Feedthrough
Digital Feedthrough is also a measure of the impulse injected to the analog output from the digital inputs, but is measured when the DAC is not selected. It is essentially feedthrough across the die and package. It is also a measure of the glitch impulse trans­ferred to the analog output when data is read from the internal ADC. It is specified in nV secs and is measured with
WR high
and a digital code change from all 0s to all 1s.
DAC-to-DAC Crosstalk (AD7669 Only)
The glitch energy transferred to the output of one DAC due to an update at the output of the second DAC. The figure given is the worst case and is expressed in nV secs. It is measured with an update voltage of full scale.
DAC-to-DAC Isolation (AD7669 Only)
DAC-to-DAC Isolation is the proportion of a digitized sine wave from the output of one DAC, which appears at the output of the second DAC (loaded with all 1s). The figure given is the worst case for the second DAC output and is expressed as a ra­tio in dBs. It is measured with a digitized sine wave (f
SAMPLING
=
100 kHz) of 20 kHz at 2.5 V pk-pk.
Signal-to-Noise Ratio
Signal-to-Noise Ratio (SNR) is the measured signal to noise at the output of the converter. The signal is the rms magnitude of the fundamental. Noise is the rms sum of all the nonfundamen­tal signals (excluding dc) up to half the sampling frequency. SNR is dependent on the number of quantization levels used in the digitization process; the more levels, the smaller the quanti­zation noise. The theoretical SNR for a sine wave is given by
SNR = (6.02N + 1.76) dB
where N is the number of bits. Thus for an ideal 8-bit converter, SNR = 50 dB.
Harmonic Distortion
Harmonic Distortion is the ratio of the rms sum of harmonics to the fundamental. For the AD7569/AD7669, Total Harmonic Distortion (THD) is defined as
20 log
V
2
2
+V
3
2
+V
4
2
+V
5
2
+V
6
2
V
1
where V1 is the rms amplitude of the fundamental and V2, V3, V
4
, V5 and V6 are the rms amplitudes of the individual
harmonics.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and fb, any active device with nonlinearities will create distortion products, of order (m + n), at sum and difference frequencies of mfa ± nfb where m, n = 0, l, 2, 3,… . Intermodulation terms are those for which m or n is not equal to zero. For example, the second order terms include (fa + fb) and (fa – fb) and the third order terms include (2fa + fb), (2fa – fb), (fa + 2fb) and (fa – 2fb).
–6–
REV. B
AD7569/AD7669
ORDERING GUIDE
Relative
Temperature Accuracy Package
Model Range T
MIN –TMAX
Option
1
AD7569JN 0°C to +70°C ±1 LSB N-24 AD7569JR 0°C to +70°C ±1 LSB R-24 AD7569AQ –40°C to +85°C ±1 LSB Q-24 AD7569SQ
2
–55°C to +125°C ±1 LSB Q-24 AD7569BN –40°C to +85°C ±0.5 LSB N-24 AD7569KN 0°C to +70°C ±0.5 LSB N-24 AD7569BR –40°C to +85°C ±0.5 LSB R-24 AD7569BQ –40°C to +85°C ±0.5 LSB Q-24 AD7569TQ
2
–55°C to +125°C ±1/2 LSB Q-24 AD7569JP 0°C to +70°C ±1 LSB P-28A AD7569SE
2
–55°C to +125°C ±1 LSB E-28A AD7569KP 0°C to +70°C ±1/2 LSB P-28A AD7569TE
2
–55°C to +125°C ±1/2 LSB E-28A AD7669AN –40°C to +85°C ±1 LSB N-28
AD7669JN 0°C to +70°C ±1 LSB N-28 AD7669JP 0°C to +70°C ±1 LSB P-28A AD7669AR –40°C to +85°C ±1 LSB R-28 AD7669JR 0°C to +70°C ±1 LSB R-28
NOTES
1
E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = Small Outline SOIC.
2
To order MIL-STD-883, Class B processed parts, add /883B to part number. Contact your local sales office for military data sheet.
AD7569 PIN CONFIGURATIONS
DIP, SOIC
PLCC
LCCC
AD7669 PIN CONFIGURATIONS
DIP, SOIC
PLCC
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