Analog Devices AD53522 a Datasheet

High Speed

FEATURES 1000 MHz Toggle Rate Driver/Comparator/Active Load and Dynamic Clamp

Included Inhibit Mode Function 100-Lead LQFP Package with Built-In Heat Sink Driver

48  Output Resistance

800 ps Tr/Tf for a 3 V Step Comparator

1.1 ns Propagation Delay at 3 V

Load

40 mA Voltage Programmable Current Range

50 ns Settling Time to 15 mV

APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation and Characterization Equipment

PRODUCT DESCRIPTION

The AD53522 is a complete, high speed, single-chip solution that performs the pin electronics functions of driver, comparator, and active load (DCL) for ATE applications. In addition, the driver contains a dynamic clamp function and the active load contains an integrated Schottky diode bridge.

The driver is a proprietary design that features three active states: Data High mode, Data Low mode, and Term mode, as well as an Inhibit State. In conjunction with the integrated dynamic clamp, this facilitates the implementation of a high speed active termination. The output voltage range is –0.5 V to +6.5 V to accommodate a wide variety of test devices.

The dual comparator, with an input range equal to the driver output range, features PECL compatible outputs. Signal tracking capability is in the range of 3 V/ns.

The active load can be set for up to 40 mA load current. I and the buffered VCOM are independently adjustable. On-board Schottky diodes provide high speed switching and low capacitance.

Also included is an on-board temperature sensor that gives an indication of the silicon surface temperature of the DCL. This information can be used to measure ␪

and ␪JA or flag an alarm

if proper cooling is lost. Output from the sensor is a current sink

, IOL,

Dual Pin Electronic

AD53522

FUNCTIONAL BLOCK DIAGRAM (One-Half)

VEEVEEV

AD53522

1.0A/K

VCH

VHDCPL

OUT

VLDCPL

VCL

VCOM_S

PROT_LO

PROT_HI

THERM*

CCVCCVCC

VTERM

DATA

DATAB

IOD

IODB

RLD

RLDB

PWRD

HCOMP

VCCO

QHB

QLB

LCOMP

VCOM

IOLC

IOXRTN

INHL

INHLB

IOHC

V/I

GND_ROTDR_GND THERMSTART

*ONLY 1 (ONE) THERM PER DEVICE

DRIVER

COMPARATOR

ACTIVE LOAD

PWRGND9HQGND

that is proportional to absolute temperature. The gain is trimmed to a nominal value of 1.0 µA/K. As an example, the output current can be sensed by using a 10 kΩ resistor connected from 10 V to the THERM (I

) pin. A voltage drop across the resistor will

OUT

be developed that equals 10 kΩ ⫻ 1 µA/°K = 10 mV/°K=2.98V at room temperature.

REV. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

AD53522–SPECIFICATIONS

DRIVER

Spec Spec

(TJ = 85C  5C, +VS = +10.5 V  1%, –VS = –4.5 V  1%, VCCO = 3.3 V, unless otherwise noted.)

No. Parameter Conditions Min Typ2Max Unit Perf

DIFFERENTIAL INPUT CHARACTERISTICS (DATA to DATAB, IOD to IODB, RLD to RLDB)

1 Voltage Range Note: Inputs are from Same Logic 0 +3.3 V N

Type Family

2 Differential Voltage with Note: AC Tests Performed ± 400 ± 600 ± 1000 mV P

LVPECL Levels

3 Bias Current V

REFERENCE INPUTS

4 Bias Currents Max Value Measured during –50 +50 µAP

OUTPUT CHARACTERISTICS

10 Logic High Range Data = H, VH = –0.4 V to +6.5 V, –0.4 +6.5 V P

11 Logic Low Range Data = L, VL = –0.5 V to +6.4 V, –0.5 +6.4 V P

12 Amplitude [VH–VL] VL = –0.05 V, VH = +0.05 V, +0.1 +7.0 V P

ABSOLUTE ACCURACY

20 VH Offset Data = H, VH = 0 V, VL = –0.5 V, –50 +50 mV P

21 VH Gain Error Data = H, VH = –0.4 V to +6.5 V, –0.3 +0.3 % of VH P

22 Linearity Error Data = H, VH = –0.4 V to +6.5 V, –5 +5 mV P

30 VL Offset Data = L, VL = 0 V, VH = +6.5 V, –50 +50 mV P

31 VL Gain Error Data = L, VL = –0.5 V to +6.4 V, –0.3 +0.3 % of VL P

32 Linearity Error Data = L, VL = –0.5 V to +6.4 V, –5 +5 mV P

33 Offset Temperature Coefficient VL = 0 V, VH = +5 V, VT = 0 V +0.5 mV/°CN

OUTPUT RESISTANCE

40 VH = –0.3 V VL = –0.5 V, VT = 0 V, I

41 VH = +6.5 V VL = –0.5 V, VT = 0 V, I

42 VL = –0.5 V VH = +6.5 V, VT = 0 V, I

43 VL = +6.4 V VH = +6.5 V, VT = 0 V, I

44 VH = +2.5 V VL = 0 V, VT = 0 V, I

50 Dynamic Current Limit Cbyp = 39 nF, VH = +6.5 V, +100 mA N

51 Static Current Limit Output to –0.5 V, VH = +6.5 V, –120 –60 mA P

52 Static Current Limit Output to +6.5 V, VH = +6.5 V, +60 +120 mA P

= 1.5 V, 2.5 V –250 +250 µAP

Linearity Tests

Vl = –0.5 V (VT = 0 V, VH Meets Test 20, 21, and 22 Specs)

VH = 6.5 V (VT = 0 V, VL Meets Test 30, 31, and 32 Specs)

VT = 0 V and VL = –0.5 V, VH = +6.5 V, VT = 0 V

VT = +3 V

VL = –0.5 V, VT = +3 V

VT = +3 V

VH = +6.5 V, VT = +3 V

= +1, +46 +50 Ω N

+30 mA

–30 mA

+30 mA

–30 mA

(Trim Point)

VL = –0.5 V, VT = 0 V

VL = –0.5 V, VT = 0 V, DATA = H

VL = –0.5 V, VT = 0 V, DATA = L

OUT

= –1, +46 +50 Ω P

OUT

= +1, +46 +50 Ω P

OUT

= –1, +46 +50 Ω N

OUT

= –30 mA +47.5 Ω P

OUT

–2–

REV. A

AD53522

DRIVER

Spec Spec

(continued)

No. Parameter Conditions Min Typ2Max Unit Perf

VTERM

60 Voltage Range Term Mode, VTERM = –0.3 V –0.3 +6.3 V P

to +6.3 V, VL = 0 V, VH = +3 V (VTERM Meets Test 61, 62, and 63 specs)

61 VTERM Offset Term Mode, VTERM = 0 V, –50 +50 mV P

VL = 0 V, VH = +3 V

62 VTERM Gain Error Term Mode, VTERM = –0.3 V –0.3 +0.3 % of V

63 VTERM Linearity Error

64 Offset Temperature Coefficient VTERM = 0 V, VL = 0 V, VH = +3 V +0.5 mV/°CN 70 Output Resistance DC I

72 PSRR, Drive, or Term Mode +V 73 Static Current Limit Output to –0.3 V, VTERM = +6.3 V –120 –60 mA P 74 Static Current Limit Output to +6.3 V, VTERM = –0.3 V +60 +120 mA P

DYNAMIC PERFORMANCE, DRIVE (VH and VL)

80 Propagation Delay Time Measured at 50%, VL = 0 V, 1.25 1.4 1.55 ns P

81 Propagation Delay T.C. Measured at 50%, VL = 0 V, 2 ps/°CN

82 Delay Matching, Edge-to-Edge Measured at 50%, VL = 0 V, 200 ps P

RISE AND FALL TIMES

90 200 mV Swing Measured 20%–80%, VL = –0.1 V, 0.25 ns N

91 1 V Swing Measured 20%–80%, VL = 0 V, 0.3 ns N

92 3 V Swing Measured 10%–90%, VL = 0 V, 0.8 ns N

93 3 V Swing Measured 10%–90%, VL = 0 V, 0.8 ns N

93A 3 V Swing Measured 20%–80%, VL = 0 V, 0.450 0.560 0.670 ns P

94 5 V Swing Measured 10%–90%, VL = 0 V, 1.2 1.5 ns N

RISE AND FALL TIME TEMPERATURE COEFFICIENT 100 1 V Swing (Per Test 91) ± 2 ps/°CN 101 3 V Swing (Per Test 92) ± 2 ps/°CN 102 5 V Swing (Per Test 94) ± 4 ps/°CN 110 Overshoot and Preshoot VL, VH = –0.1 V, +0.1 V, 0 – 50 0 + 50 % of Step N

SETTLING TIME 120 to 15 mV VL = 0 V, VH = 0.5 V, 50 ns N

121 to 4 mV VL = 0 V, VH = 0.5 V 10 µsN 130 Delay Change vs. Pulse Width VL/VH = 0/3, PW = 2.5 ns/7.5 ns, 25 75 ps N

131 Delay Change vs. Duty Cycle VL = 0 V, VH = 3 V, Duty Cycle 25 ps N

to +6.3 V, VL = 0 V, VH = +3 V Term Mode, VTERM = –0.3 V –5 +5 mV P to +6.3 V, VL = 0 V, VH = +3 V

= +30 mA, –1 mA, +46 +50 Ω

OUT

VTERM = –0.3 V, VH = +3 V, VL = 0 V N I

= –30 mA, +1 mA,

OUT

VTERM =+6.3 V, VH = +3 V, VL = 0 V N I

= ± 30 mA, ± 1 mA,

OUT

VTERM = +2.5 V, VH = +3 V, VL = 0 V P

, –VS ± 1% +17.8 mV/V N

VH = 3 V, into 500 Ω

VH = +0.1 V, into 50 Ω

VH = 1 V, into 50 Ω

VH = 3 V, into 50 Ω

VH = 3 V, into 500 Ω

VH = 5 V, into 500 Ω

Driver Terminated into 50 Ω + mV VL, VH = 0.0 V, 3 V, –6.0 – 50 +6.0 + 50 % of Step N Driver Terminated into 50 Ω + mV

Driver Terminated into 50 Ω

30 ns/90 ns, DC = 25%

(DC) 5% to 95%, T = 40 ns

SET

REV. A

–3–

AD53522

SPECIFICATIONS DRIVER

(continued)

Spec Spec No. Parameter Conditions Min Typ2Max Unit Perf

MINIMUM WIDTH PULSE

140 1 V Swing Measured at 50% point width 0.6 ns N

AC Swing = 0.9  V

141 3 V Swing Swing Terminated, 50 Ω Load on 1.5 ns N

142 Toggle Rate VH = 1 V, VL = 0 V, Terminated 1000 MHz N

DYNAMIC PERFORMANCE, INHIBIT

150 Delay Time, Active to Inhibit Measured at 50%, VH = 4 V, 1.7 2.0 ns P

151 Delay Time, Inhibit to Active Measured at 50%, VH = 4 V, 1.7 2.2 ns P

152 Delay Time Matching, Measured at 50%, VH = 4 V, 150 250 ps P

Inhibit to Active VL = 0 V, VTT = 2

153 Delay Time Matching, Measured at 50%, VH = 4 V, 150 250 ps P

Active to Inhibit VL = 0 V, VTT = 2 160 I/O Spike VH = 0 V, VL = 0 V 200 mV p-p N 170 Rise, Fall Time, Active to Inhibit VL = 0 V, VTT = 2 1.2 ns N

171 Rise, Fall Time, Inhibit to Active VH = 4 V, VL = 0 V, VTT = 2 0.6 ns N

DYNAMIC PERFORMANCE, VTERM

180 Delay Time, VH to VTERM Measured at 50%, VL = VH = 2 V, 1.5 1.9 ns P

181 Delay Time, VL to VTERM Measured at 50%, VL = VH = 0 V, 1.6 1.9 ns P

182 Delay Time, VTERM to VH Measured at 50%, VL = VH = 2 V, 1.6 2.0 ns P

183 Delay Time, VTERM to VL Measured at 50%, VL = VH = 0 V, 1.6 2.0 ns P

190 Overshoot and Preshoot VH/VL, VTERM = (0 V, 2 V), –6.0 + 50 +6.0 + 50 % of Step N

191A VTERM Rise Time, VL to VT, VL, VH = 0 V, VTERM = 2 V, 1.0 ns N

Normal Mode 20%–80%

191B VTERM Rise Time, VT to VH, VL, VH = 2 V, VTERM = 0 V, 0.6 ns N

Normal Mode 20%–80%

192A VTERM Fall Time, VT to VL, VL, VH = 0 V, VTERM = 2 V, 0.6 ns N

Normal Mode 20%–80%

192B VTERM Fall Time, VH to VT, VL, VH = 2V, VTERM = 0 V, 1.0 ns N

Normal Mode 20%–80%

OUT

Transmission Line

to 50 Ω,V

VL = 0 V, VTT = 2

(20%–80% of 1 V Output)

VTERM = 0 V, VTT = 0 V

VTERM = 2 V, VTT = 0 V

VTERM = 0 V, VTT = 0 V

VTERM = 2 V, VTT = 0 V

(0 V, 6 V) + mV

> 300 mV p-p

OUT

–4–

REV. A

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Analog Devices AD53522 a Datasheet

Specifications and Main Features

Frequently Asked Questions

User Manual

PRODUCT DESCRIPTION

DRIVER