Analog Devices AD53508 a Datasheet

a

PPMU Circuit

AD53508

FEATURES
Dual Measurement Channels
Precision Four-Quadrant-Per-Pin V/I Source
Programmable Current Force Ranges

ⴞ204.8 ␮A and ⴞ2.048 mA

Five Current Measurement Ranges

204.8 nA to ⴞ2.048 mA
Output Voltage Range: –4 V to +9 V
Power Supplies: +15 V, +5 V, and –10 V
44-Lead Plastic J-Leaded Chip Carrier Package

APPLICATIONS
Can Be Used with the AD53032 DCL to Extend Current

Force Range to 35 mA

GENERAL DESCRIPTION

The AD53508 is a custom dual-channel parametric measure­ment circuit for use in semiconductor automatic test equipment.
It contains programmable modes to force a pin voltage and
measure its current or to integrate and hold a current value.
Alternatively, a current can be forced and the compliance volt­age measured.

FUNCTIONAL BLOCK DIAGRAM

VM

IM

SENSE

VF S4

IF

MAIN

S5

1.25R

DIFF

1.25R

MEAS

DAC1

DAC2

DSR

OUT

+2.5V

S1

CON

S6

S7

ENABLE

OUTPUT

AD53508

S2

S3

The device provides a remote force/sense capability to ensure
accuracy at the tester pin. A guard output is available to drive
the shield of a force/sense pair.

Two input references per channel permit controlled switching to
different voltage or current levels. The forced voltage or current
levels can be switched back to the measurement system to read
back the analog levels for system calibration.

The circuit is powered by +15 V, +5 V, and –10 V supplies and
dissipates 230 mW nominally.

Recommended Use of the PPMU with AD53032 DCL

The PPMU can be used with the AD53032 DCL to extend the
Current Force Range beyond 2 mA VCOM can be set to the
maximum spec allowance of 8 V, which would allow the maxi­mum Current Force of IOL of 35 mA. The combination of the
PPMU and the DCL would have a few benefits including:

1. Accurately measuring low currents.

2. Can take parallel measurements by using one PMU per pin.

EXT RC

R

R

40pF

S10

INTEGRATE

1k⍀
2mA

10k⍀

200␮A

UNITY

S8

S9

C1

INT/IM

S11

R1

R2

S12

S13

S14

S15

S16

GUARD

S18

SENSE

FORCE

S17

GUARD

REV. A

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] © Analog Devices, Inc., 2001

AD53508–SPECIFICATIONS

Parameter Condition Min Typ Max Unit

VOLTAGE FORCE/MEASURE MODE

Voltage Swing, ± 2 mA Range

± 2 mA Drive –4+9V
± 100 µA Drive –5 +12 V

ACCURACY

Gain (± 0.1% Tolerance) 0.999 1.001 V/V
Offset Error ± 15 mV
Gain Nonlinearity (Relative to Endpoints) ± 0.02 % of Span
Current Measure CMRR (at MEAS_OUT) ± 0.31 mV/V

DRIFT

Gain Error Temperature Coefficient ± 20 ppm (PV

Offset Drift ± 100 µV/°C

CURRENT FORCE/MEASURE MODE RANGES

0 (High) ± 2.0 mA
1 (Low) ± 200 µA

ACCURACY—HIGH RANGE

Transconductance (± 3% Tolerance) Force Mode 0.776 0.8 0.824 mA/V
Transresistance (± 3% Tolerance) Measure Mode 1.21 1.25 1.29 V/mA
Offset Error ± 40 µA
Gain Nonlinearity (Relative to Endpoints) ± 0.05 % of Span
Output Compliance Voltage-Induced

Transconductance/Error Force Mode –0.2 +0.4 µA/V

DRIFT—HIGH RANGE

Gain Error Temperature Coefficient +10/–60 ppm (PV

Offset Drift ± 400 nA/°C

ACCURACY—LOW RANGE

Transconductance (± 3% Tolerance) Force Mode 77.6 80 82.4 µA/V
Transresistance (± 3% Tolerance) Measure Mode 12.1 12.5 12.9 V/mA
Offset Error ± 4 µA
Gain Nonlinearity (Relative to Endpoints) ± 0.05 % of Span
Output Compliance Voltage-Induced

Transconductance/Error Force Mode –0.02 +0.04 µA/V

DRIFT—LOW RANGE

Gain Error Temperature Coefficient +10/–60 ppm (PV

Offset Drift ± 40 nA/°C

CURRENT MEASURE INTEGRATE MODE RANGES

High ± 20.0 µA
Medium ± 2.0 µA
Low ± 200 nA

ACCURACY—HIGH RANGE

Transresistance Error (± 3% Tolerance) 0.121 0.125 0.129 V/µA
Offset Error ± 400 nA
Gain Nonlinearity (Relative to Endpoints) ± 0.05 % of Span
Output Compliance Voltage-Induced Transresistance Error ± 2.5 nA/V of Output

DRIFT—HIGH RANGE

Gain Error Temperature Coefficient ± 20 ppm MV/°C
Offset Drift ± 2 nA/°C

ACCURACY—MEDIUM RANGE

Transresistance Error (± 3% Tolerance) 1.21 1.25 1.29 V/µA
Offset Error ± 40 nA
Gain Nonlinearity (Relative to Endpoints) ± 0.05 % of Span
Output Compliance Voltage-Induced Transresistance Error ± 0.25 nA/V of Output

DRIFT— MEDIUM RANGE

Gain Error Temperature Coefficient ± 20 ppm MV/°C
Offset Drift ± 250 pA/°C

(TA = 25ⴗC, rated power supplies unless otherwise noted.)

1

or MV)/°C

or MV)/°C

or MV)/°C

–2–

REV. A

AD53508

Parameter Condition Min Typ Max Unit

ACCURACY—LOW RANGE

Transresistance Error (± 3% Tolerance) 0.0121 0.0125 0.0129 V/nA
Offset Error ± 4nA
Gain Nonlinearity (Relative to Endpoints) ± 0.05 % of Span
Output Compliance Voltage-Induced Transresistance Error ± 0.025 nA/V of Output

DRIFT—LOW RANGE

Gain Error Temperature Coefficient ± 20 ppm MV/°C
Offset Drift ± 70 pA/°C

DISABLE MODE

2

Voltage Swing, ± 2 mA Range

± 2 mA Drive –4+9V
± 100 µA Drive –5 +12 V

ACCURACY

Gain (± 0.1% Tolerance) 0.999 1.001 V/V
Offset Error ± 15 mV
Gain Nonlinearity (Relative to Endpoints) ± 0.02 % of Span
Current Measure CMRR (at MEAS_OUT) ± 0.31 mV/V

DRIFT

Gain Error Temperature Coefficient ± 20 ppm (PV or

Offset Drift ± 100 µV/°C

OTHER SPECIFICATIONS

Power Supply Rejection Ratio f < 40 Hz, V

f < 40 Hz, V
f = 40 kHz, V
f = 40 kHz, V

CURRENT MEASURE HOLD MODE LEAKAGE T

CROSSTALK

3

= 70°C ± 1.2 nA

AMB

CC

EE

CC

EE

70 dB
60 dB
35 dB
25 dB

± 0.02 % of Span

SETTLING TIMES TO 0.01%

Voltage Force and Guard Voltage C

Current Force (200 µA Range) Z
MEAS_OUT Pin C

= 100 pF 20 µs

LOAD

C

= 2000 pF 2 ms

LOAD

= 100 pF储50 kΩ 50 µs

LOAD

= 20 pF 2 µs

LOAD

SHORT CIRCUIT CURRENT LIMIT MAGNITUDE Any Output Except Guards 8.5 20 mA

GUARD SCC LIMIT MAGNITUDE 2.5 10 mA

GUARD OFFSET (FROM SENSE INPUT PIN) –65 –25 0 mV

IB (DAC1, DAC2) CURRENT ± 1.0 µA

DIGITAL INPUTS

V

IH

V

IL

2.4 V

0.8 V

IIN (Input leakage current) 10 µA

POWER SUPPLIES

VCC (Positive Analog Supply Voltage) 14.0 15.0 15.75 V
VEE (Negative Analog Supply Voltage) –10.5 –10.0 –9.0 V
V

(Logic Supply Voltage) 4.75 5.0 5.25 V

DD

ICC (Positive Analog Supply Current) 5 15 mA
I

(Negative Analog Supply Current) –15 –5mA

EE

IDD (Logic Supply Current Is 0 with Inputs at Rails,

Worst Case @ 2.4 VIN) 8mA

NOTES

1

PV = Programmed Value, MV = Measured Value, FSR = Full-Scale Range = span.

2

Output connected: DAC2 and 2 mA range selected, unconditionally.

3

f < 40 Hz, both channels in current force mode; other channel output voltage swinging rail to rail.

Specifications subject to change without notice.

1

MV)/°C

–3–REV. A