Aeroflex 6210 Datasheet
Microwave
6210 Reflection Analyzer
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• Excellent directivity and test port match
for precise measurements of reflection
coefficient
• Time domain software for pinpointing
impedance discontinuities in devices or
systems
• Polar and Smith Chart displays to facilitate matching of devices in circuits
• Fast sweep rate to speed up alignment of
components in production test
• Wide range of calibration kits for 3.5 mm,
Type N and 7 mm connectors
• Works with standard 6200 series
Microwave Test Set for easy upgrade
route
The 6210 Reflection Analyzer is designed specifically for precision measurements of reflection
coefficient from 250 MHz to 26.5 GHz. 6210 fits
underneath a 6200B series Microwave Test Set
(MTS) which provides the synthesized signal
source and analyzer display to form a single integrated test system. 6210 consists of additional
hardware and software to enable error corrected
reflection coefficient measurements with both
cartesian and polar displays.
an autotester. An analysis of return loss measurements using an
autotester shows that errors are dominated by test port match and
directivity. The 6210 Reflection Analyzer makes error corrected
return loss measurements to give improved accuracy and reduced
uncertainty. The test port match and directivity achieved with 6210
is significantly better than that obtainable from autotesters.
6210 performs precision reflection coefficient measurements
from 250 MHz to 26.5 GHz
Depending upon the test port connector and the quality of the calibration kit a test port match of >40 dB and directivity of >50 dB can
be achieved.
Accurate Return Loss Measurements
Reflection coefficient is the primary performance
test for microwave systems and components.
Return loss and VSWR are derivatives of reflection
coefficient, they can be measured with a standard
scalar analyzer and a directional RF bridge such as
For the very latest specifications visit www.aeroflex.com
Improvement of accuracy obtained with 6210 compared to an
autotester.
In production areas this means less stand off due to measurement
uncertainty resulting in higher yield and shorter test and rework time.
To design engineers it means greater confidence in the quality of the
initial design.
The measurement can be displayed in log magnitude, linear magnitude, VSWR, phase, polar, real, imaginary or Smith Chart formats.
Integration of the synthesized source, reflection analyzer and display
unit into one system makes the 6210 ideal for both production testing
and design work. The soft key menu structure leads the user through
the measurement and prompts appear when data has to be entered.
Measurement setups and calibrations can be stored in the instrument
memory. The macro facility reduces test time in production areas by
automating repetitive test methods.
Time Domain Analysis
For design engineers early iterations of systems or components often
need trouble shooting. A poor return loss can be the result of bad
connector assembly, unoptimized track layout or incorrect component design. Time domain software gives a display of reflection coefficient against time (or distance) which simplifies diagnosis and pinpoints the problem area. The nature of the problem, capacitive or
inductive, can be identified from the reflection coefficient value.
Engineers can easily see if the device under test is faulty or needs
improved impedance matching between adjacent components.
Time domain works by performing an inverse Fourier transform on
the frequency domain data. Both lowpass and bandpass modes are
available. Lowpass mode simulates a traditional Time Domain
Reflectometer (TDR). It can be set up for both step and impulse
responses. Low-pass mode can only be used on devices whose frequency characteristics extend down to DC. For frequency selective
devices such as waveguide, filters and antennas bandpass mode must
be used. The display zoom feature can be used to examine the frequency range of interest with greater clarity rather than the complete
range of the calibration.
To overcome the effects of dispersion in waveguide a non linear
(warped) frequency sweep can be selected. A normal linear sweep
would blur the position of a discontinuity. Warped sweeps allow the
discontinuity to be pinpointed accurately.
Time domain response and return loss measurement of a
microwave component
Once a discontinuity has been identified the gating and fencing functions can be used to isolate it mathematically. Fencing allows the user
to see what the return loss would be without the effect of a particular
fault. Conversely gating allows the user to see what the return loss of
a specific fault or discontinuity is. These features are very powerful
tools for diagnosing and improving the performance of a system.
Knowing the position and severity of faults in a device means that they
can be modified in the shortest possible time, speeding up design
cycles.
For the same device shown previously, this display shows time
domain response with fence around fault and return loss of
device with effect of discontinuity removed
Complex Reflection Coefficient
When building up systems which include devices such as transistors,
PIN diodes, varactor diodes, capacitors and resistors, it is often necessary to fully characterize these devices. This allows prediction of
the performance of a circuit at an early stage of the design reducing
the number of design iterations. In order to match consecutive
devices in a circuit it is essential to have knowledge of the complex
reflection coefficient of each stage (input and output). This enables
a matching circuit to be designed to ensure the overall circuit performance meets its specification. 6210 can display complex reflection
coefficient in either polar or Smith Chart format. The accuracy of the
device characterization can be enhanced by using the time domain
gating function and electrical delay.
Smith Chart gives impedance information to aid design of
matching circuits
The electrical delay facility of 6210 allows the user to shift the reference plane. When characterizing devices on a substrate or in a test
fixture it is often necessary to shift the reference plane to the input of
the device. This removes the response of the length of transmission
line between the test port and the device input resulting in a display
of input impedance of the device.
Phase Display
Phase characteristics and open circuit return loss measurement
on a phase stable cable
The display can be formatted to show phase in degrees against frequency. This facility is invaluable for testing the phase stability of
cables and for phase matching lengths of transmission line such as
semi-rigid coax.
A cable with poor phase stability will introduce errors into measurements if moved after a calibration. Storing the phase characteristics
of a cable into a trace memory and then comparing with a live trace
enables the quality of the cable to be evaluated quickly.
Fast Calibration
An intuitive menu structure enables the user to quickly calibrate the
6210. Calibration kits are available for coaxial 3.5 mm, Type N and 7
mm connectors. Waveguide calibrations are also supported. A sliding load can give directivities of over 50 dB for coaxial measurements.
Screen displays lead the user through the calibration procedure
The overall performance of the 6210 is determined by the specification of the calibration kit used. The directivity, source match and
response errors can be characterized by measuring known standards.
Error correction routines in the 6210 then minimize errors during
normal measurements. IFR offer full calibration kits including short
and open circuits, fixed and sliding loads, connector gauges, test port
adapters and torque spanners. To verify calibrations optional airlines
are also available. The calibration kits are supplied in a protective
wooden storage box.
Economy calibration kits which include open and short circuits and
fixed loads are also available.
Active Device Measurement
For testing some active devices such as PIN and varactor diodes and
transistors it is necessary to have a biasing voltage on the output of the
test port. The optional bias tee (option 011) allows voltages to be
applied to the test port. The internal voltage/current source of the
MTS can be used as the supply.
Test Port Flexibility
The use of adapters at the test port to provide the most suitable test
port connector does not degrade measurement accuracy. This is
because calibration removes the effect of the adapter. Errors associated with scalar analyzers and autotesters using test port adapters are
therefore not encountered when using the 6210 Reflection Analyzer.
A range of ruggedized test port cables are available. Test port cables
allow error corrected measurements to be made remote from the
front panel connector with the choice of test port connectors including 3.5 mm male and female and Type N male and female or 7 mm.
All test port cables are phase stable so that repositioning the cable
after a calibration will still give good measurement accuracy.
Comprehensive Measurement System
A 6210 can be added to any 6200B series Microwave Test Set. All the
features of the 6200B are retained including absolute power measurement, frequency counter, voltage/current source, standard scalar
analyzer and synthesized sweep generator. The synthesizer can also
be used as a CW signal source.
6210 can be added to an MTS at any time giving an easy upgrade
route for users whose measurement requirements become more
demanding. The comprehensive marker functions, limit lines, scaling and plotting functions are all available when using the 6210
Reflection Analyzer.
For the very latest specifications visit www.aeroflex.com
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