ZETEX ZXMN3A14F Technical data

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30V N-CHANNEL ENHANCEMENT MODE MOSFET
SUMMARY
V
(BR)DSS
DESCRIPTION
This new generation of Trench MOSFETs from Zetex utilizes a unique structure that combines the benefits of low on-resistance with fast switching speed. This makes them ideal for high efficiency, low voltage, power management applications.
=30V : RDS(on)=0.065 ; ID=3.9A
ZXMN3A14F
FEATURES
Low on-resistance
Fast switching speed
Low threshold
Low gate drive
SOT23 package
APPLICATIONS
DC-DC Converters
Power Management functions
Disconnect switches
Motor control
ORDERING INFORMATION
DEVICE REEL
SIZE
ZXMN3A14FTA 7” 8mm 3000 units ZXMN3A14FTC 13” 8mm 10000 units
TAPE
WIDTH
QUANTITY
PER REEL
3
2
T
O
S
PINOUT
DEVICE MARKING
314
PROVISIONAL ISSUE B - SEPTEMBER 2003
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SEMICONDUCTORS
ZXMN3A14F
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL LIMIT UNIT
Drain-Source Voltage V Gate-Source Voltage V Continuous Drain Current @ V
= 10V; TA=25°C
GS
@VGS= 10V; TA=70°C @VGS= 10V; TA=25°C
Pulsed Drain Current
(c)
Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Power Dissipation at T
A
=25°C
(c)
(a)
(b)
(b) (b) (a)
I
I I I P
DSS GS
D
DM S SM
D
Linear Derating Factor Power Dissipation at T
A
=25°C
(b)
P
D
Linear Derating Factor Operating and Storage Temperature Range T
j,Tstg
THERMAL RESISTANCE
PARAMETER SYMBOL VALUE UNIT
Junction to Ambient Junction to Ambient
NOTES (a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions. (b) For a device surface mounted on FR4 PCB measured at t 5 sec. (c) Repetitive rating - 25mm x 25mm FR4 PCB, D=0.02, pulse width 300s - pulse width limited by maximum junction temperature.
(a)
(b)
R R
JA
JA
30 V
20 V
3.9
3.2
3.2 18 A
2.3 A 18 A
1 8
mW/°C
1.5 12
mW/°C
-55 to +150 °C
125 °C/W
83 °C/W
A A A
W
W
SEMICONDUCTORS
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CHARACTERISTICS
ZXMN3A14F
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SEMICONDUCTORS
ZXMN3A14F
ELECTRICAL CHARACTERISTICS (at T
= 25°C unless otherwise stated)
amb
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS STATIC
Drain-Source Breakdown Voltage V Zero Gate Voltage Drain Current I Gate-Body Leakage I Gate-Source Threshold Voltage V Static Drain-Source On-State
Resistance Forward Transconductance
DYNAMIC
(1)
(1) (3)
(3)
Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C
SWITCHING
(2) (3)
Turn-On-Delay Time t Rise Time t Turn-Off Delay Time t Fall Time t Total Gate Charge Q Gate-Source Charge Q Gate Drain Charge Q
(BR)DSS DSS GSS
GS(th)
R
DS(on)
g
fs
iss
oss
rss
d(on) r d(off) f
g gs gd
30 V ID= 250A, VGS=0V
1 A
100 nA
1.0 V
0.048
0.065
0.069
0.095
7.1 S
448 pF
82 pF 49 pF
2.4 ns
2.5 ns
13.1 ns
5.3 ns
8.6 nC
1.4 nC
VDS= 30V, VGS=0V VGS=12V, VDS=0V ID= 250A, VDS=V
VGS= 10V, ID=3.2A
= 4.5V, ID=2.6A
V
GS
VDS= 15V, ID=3.2A
VDS= 15V, VGS=0V f=1MHz
VDD= 15V, VGS= 10V
ID=1A
R
6.0
G
VDS= 15V, VGS= 10V
=3.2A
I
D
1.8 nC
SOURCE-DRAIN DIODE
Diode Forward Voltage
Reverse Recovery Time Reverse Recovery Charge
(1)
(3)
(3)
V
SD
t
rr
Q
rr
0.85 0.95 V
13 ns
7NC
Tj=25°C, IS= (2.5)A, V
=0V
GS
Tj=25°C, IF= (1.6)A, di/dt=100A/␮s
GS
NOTES
(1) Measured under pulsed conditions. Pulse width 300s; duty cycle 2%. (2) Switching characteristics are independent of operating junction temperature. (3) For design aid only, not subject to production testing.
PROVISIONAL ISSUE B - SEPTEMBER 2003
SEMICONDUCTORS
4
TYPICAL CHARACTERISTICS
ZXMN3A14F
PROVISIONAL ISSUE B - SEPTEMBER 2003
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SEMICONDUCTORS
ZXMN3A14F
TYPICAL CHARACTERISTICS
SEMICONDUCTORS
PROVISIONAL ISSUE B - SEPTEMBER 2003
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ZXMN3A14F
PACKAGE OUTLINE PAD LAYOUT
Controlling dimensions are in millimetres. Approximate conversions are given in inches
PACKAGE DIMENSIONS
MILLIMETRES INCHES
DIM
MIN MAX MIN MAX MIN MAX MIN MAX
A 2.67 3.05 0.105 0.120 H 0.33 0.51 0.013 0.020 B 1.20 1.40 0.047 0.055 K 0.01 0.10 0.0004 0.004 C 1.10 0.043 L 2.10 2.50 0.083 0.0985 D 0.37 0.53 0.015 0.021 M 0.45 0.64 0.018 0.025 F 0.085 0.15 0.0034 0.0059 N 0.95 NOM 0.0375 NOM G 1.90 NOM 0.075 NOM 10TYP 10TYP
MILLIMETRES INCHES
DIM
© Zetex plc 2003
Europe
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PROVISIONAL ISSUE B - SEPTEMBER 2003
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SEMICONDUCTORS
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