ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter Symbol Limit Unit
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (T
Pulsed Drain Current
= 150 °C)
J
a
Avalanche Current
Repetitive Avalanche Energy
Continuous Source-Drain Diode Current
Maximum Power Dissipationa
Operating Junction and Storage Temperature Range
TC = 25 °C
= 70 °C
T
C
T
= 25 °C
A
TA = 70 °C
L = 0.1 mH
= 25 °C
T
C
= 25 °C
T
A
T
= 25 °C
C
T
= 70 °C
C
T
= 25 °C
A
TA = 70 °C
V
DS
V
GS
20
± 8
V
6.1
I
D
I
DM
I
AS
E
AS
I
S
4.9
b, c
4.6
3.7
b, c
A
20
10
5mJ
1.3
2.3
b, c
A
2.8
P
D
, T
T
J
stg
1.5
1.0
1.8
b, c
b, c
W
- 55 to 150°C
THERMAL RESISTANCE RATINGS
Parameter Symbol Typical Maximum Unit
Maximum Junction-to-Ambient
Maximum Junction-to-Foot (Drain)Steady State
Notes:
a. Based on T
b. Surface Mounted on 1" x 1" FR4 board.
c. t = 5 sec.
d. Maximum under Steady State conditions is 125 °C/W.
= 25 °C.
C
b, d
t ≤ 5 sec
R
thJA
R
thJF
6080
3445
°C/W
Document Number: 73788
S-61085–Rev. C, 19-Jun-06
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1
Si1488DH
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min TypMaxUnit
Static
V
= 0 V, ID = 250 µA
GS
ID = 250 µA
V
= VGS, ID = 250 µA
DS
VDS = 0 V, VGS = ± 8 V
V
= 20 V, VGS = 0 V
DS
= 20 V, V
V
DS
V
GS
V
GS
V
GS
V
DS
= 10 V, V
DS
= 10 V, V
DS
= 10 V, V
= 0 V, TJ = 85 °C
GS
= ≥ 5 V, V
= 4.5 V20A
GS
= 4.5 V, ID = 4.6 A
= 2.5 V, ID = 4.3 A
= 1.8 V, ID = 3.9 A
= 10 V, ID = 4.6 A
= 0 V, f = 1 MHz
GS
= 5 V, ID = 4.6 A
GS
= 4.5 V, ID = 4.6 A
GS
f = 1 MHz7.311Ω
V
= 10 V, RL = 2.7 Ω
DD
= 4.5 V, Rg = 1 Ω
GEN
TC = 25 °C
IS = 2.2 A
IF = 3.2 A, di/dt = 100 A/µs
20V
20.2
- 2.75
mV/°C
0.450.95V
± 100nA
1µA
10µA
0.0410.049
0.0470.056
0.0540.065
15mS
530
100
48
6.610
69
1.5
0.9
8.513
4568
3553
82123
2.3
20
0.81.2V
10.616nC
3.75.7
6.2
4.4
Ω
pFOutput Capacitance
pC
ns
A
nsReverse Recovery Fall Time
ΔV
V
I
I
I
r
DS(on)
C
t
t
V
DS
GS(th)
T
J
GS(th)
GSS
DSS
D(on)
g
fs
C
iss
oss
C
rss
Q
g
Q
gs
Q
gd
R
g
d(on)
t
r
d(off)
t
f
J
/
Drain-Source Breakdown Voltage
V
Temperature CoefficientΔVDS/T
DS
Temperature Coefficient
V
GS(th)
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
Drain-Source On-State Resistance
a
a
Forward Transconductance
Dynamic
b
Input Capacitance
Reverse Transfer Capacitance
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Gate Resistance
Tur n - O n D e l ay Time
Rise Time
Turn-Off DelayTime
Fall Ti me
Drain-Source Body Diode Characteristics
Continous Source-Drain Diode Current
Pulse Diode Forward Current
a
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Rise Time
I
S
I
SM
V
SD
t
rr
Q
rr
t
a
t
b
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
V
DS
V
V
V
DS
≅ 3.7 A, V
I
D
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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2
Document Number: 73788
S-61085–Rev. C, 19-Jun-06
TYPICAL CHARACTERISTICS TA = 25 °C, unless otherwise noted
20
VGS = 5 V thru 2.5 V
15
)A( tnerruC niarD –I
10
VGS = 1.5 V
VGS = 2 V
)A( tnerruC niarD –I
Si1488DH
Vishay Siliconix
5
4
3
2
5
D
VGS = 1 V
0
0.00.61.21.82.43.0
– Drain-to-Source Voltage (V)
V
DS
Output Characteristics
0.09
0.08
( ecnatsi
0.07
s
eR-nO –)
0.06
)no
0.05
(
SD
r
0.04
0.03
048121620
VGS = 1.8 V
– Drain Current (A)
I
D
VGS = 2.5 V
On-Resistance vs. Drain Current
VGS = 4.5 V
D
1
0
0.00.40.81.21.62.0
TJ = 25 °C
TJ = 125 °C
TJ = - 55 °C
VGS – Gate-to-Source Voltage (V)
Transfer Characteristics curves vs. Temp
800
)Fp( ecnat
600
icapa
400
C
– C
200
C
rss
0
0 4 8 121620
C
iss
C
oss
VDS – Drain-Source Voltage (V)
Capacitance
5
)V
(
ega
t
loV
e
c
r
uoS
-ot
-e
taG –
SG
V
ID = 4.6 A
4
3
2
1
0
02468
Document Number: 73788
S-61085–Rev. C, 19-Jun-06
VDS = 10 V
VDS = 16 V
Qg – Total Gate Charge (nC)
- Gate Charge
Q
g
1.8
1.6
ec
1.4
n
)
atsiseR-nO
dez
i
lam
1.2
ro
N
(
–
)n
1.0
o
(S
D
r
0.8
0.6
- 50- 250255075100125150
VGS = 2.5 V, ID = 4.3 A
V
= 1.8 V, ID = 3.9 A
GS
VGS = 4.5 V, ID = 4.6 A
TJ– Junction Temperature (°C)
On-Resistance vs. Junction Temperature
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Si1488DH
Vishay Siliconix
TYPICAL CHARACTERISTICS TA = 25 °C, unless otherwise noted
20
10
0.12
ID = 4.6 A
)A( tnerruC ecruoS –I
1
T
= 150 °C
0.1
S
0.01
0.001
J
0.0 0.2 0.4 0.6 0.8 1.0 1.2
V
– Source-to-Drain Voltage (V)
SD
T
= 25 °C
J
Source-Drain Diode Forward Voltage
1.0
0.8
)V( ecna
0.6
i
r
a
V
)ht(SG
0.4
V
0.2
ID = 250 µA
0.09
( ecnatsiseR-nO –Ω)
0.06
)no(SD
0.03
r
0.00
012345
r
30
25
20
)W(
rewoP
15
10
5
TA = 25 °C
VGS – Gate-to-Source Voltage (V)
vs VGS vs Temperature
DS(on)
TA = 125 °C
0.0
- 50- 250255075100125150
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4
TJ – Temperature (°C)
Threshold Voltage
)
A(tner
r
uCniarD–
D
I
0
100
* Limited by r
10
1
0.1
0.01
Single Pulse
0.001
0.11100
* V
GS
DS(on)
BVDSS Limited
TA = 25 °C
– Drain-to-Source Voltage (V)
V
DS
> minimum VGS at which r
10
DS(on)
1 ms
10 ms
100 ms
1 s
10 s
dc
is specified
Safe Operating Area, Junction-to-Ambient
0.1
16001000.001
Time (sec)
Single Pulse Power
Document Number: 73788
S-61085–Rev. C, 19-Jun-06
100.01
TYPICAL CHARACTERISTICS TA = 25 °C, unless otherwise noted
8
3.5
Si1488DH
Vishay Siliconix
6
)A( tnerruC niarD –
Package Limited
4
D
I
2
0
0255075100125150
TC – Case Temperature (°C)
Current Derating*
2.8
)W( noitapissiD rewoP
2.1
1.4
0.7
0.0
0255075100125150
T
– Case Temperature (°C)
C
Power Derating
* The power dissipation PD is based on T
sipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
= 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper dis-
J(max)
limit.
Document Number: 73788
www.vishay.com
S-61085–Rev. C, 19-Jun-06
5
Si1488DH
Vishay Siliconix
TYPICAL CHARACTERISTICS TA = 25 °C, unless otherwise noted
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability
data, see http://www.vishay.com/ppg?73788.
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Document Number: 73788
S-61085–Rev. C, 19-Jun-06
Legal Disclaimer Notice
Vishay
Notice
Specifications of the products displayed herein are subject to change without notice. Vishay Intertechnology, Inc.,
or anyone on its behalf, assumes no responsibility or liability for any errors or inaccuracies.
Information contained herein is intended to provide a product description only. No license, express or implied, by
estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Vishay's
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Customers using or selling these products for use in such applications do so at their own risk and agree to fully
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