TC74AC112P/F/FN
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74AC112P,TC74AC112F,TC74AC112FN
Dual J-K Flip Flop with Preset and Clear
The TC74AC112 is an advanced high speed CMOS DUAL J-K
FLIP FLOP fabricated with silicon gate and double-layer metal
wiring C
Bipolar Schottky TTL while maintaining the CMOS low power
dissipation.
device changes state on negative going transition of the clock
pulse.
accomplished by a low logic level on the corresponding input.
discharge or transient excess voltage.
2
MOS technology.
It achieves the high speed operation similar to equivalent
In accordance with the logic level given J and K input this
CLEAR
All inputs are equipped with protection circuits against static
and
PRESET
are independent of the clock and
Features
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC74AC112P
TC74AC112F
• High speed: f
• Low power dissipation: I
• High noise immunity: V
• Symmetrical output impedance: |IOH| = IOL = 24 mA (min)
Capability of driving 50 Ω
transmission lines.
• Balanced propagation delays: t
• Wide operating voltage range: V
• Pin and function compatible with 74F112
= 170 MHz (typ.) at VCC = 5 V
max
= 4 μA (max) at Ta = 25°C
CC
NIH
= V
= 28% VCC (min)
NIL
∼
t
−
pLH
pHL
(opr) = 2 to 5.5 V
CC
Pin Assignment
TC74AC112FN
Weight
DIP16-P-300-2.54A : 1.00 g (typ.)
SOP16-P-300-1.27A : 0.18 g (typ.)
SOL16-P-150-1.27 : 0.13 g (typ.)
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2007-10-01
TC74AC112P/F/FN
Absolute Maximum Ratings (Note 1)
Characteristics Symbol Rating Unit
Supply voltage range VCC −0.5 to 7.0 V
DC input voltage VIN −0.5 to VCC + 0.5 V
DC output voltage V
Input diode current IIK ±20 mA
Output diode current IOK ±50 mA
DC output current I
DC VCC/ground current ICC ±100 mA
Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW
Storage temperature T
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
−0.5 to VCC + 0.5 V
OUT
±50 mA
OUT
−65 to 150 °C
stg
Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be
applied up to 300 mW.
Operating Ranges (Note)
Characteristics Symbol Rating Unit
Supply voltage VCC 2.0 to 5.5 V
Input voltage VIN 0 to V
Output voltage V
Operating temperature T
Input rise and fall time dt/dV
0 to V
OUT
opr
0 to 100 (V
0 to 20 (V
CC
CC
−40 to 85 °C
= 3.3 ± 0.3 V)
CC
= 5 ± 0.5 V)
CC
Note: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
V
V
ns/V
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2007-10-01