Yield, and Unsurpassed Reliability Ensured
Using Ti-W Fuses
•AC and DC Testing Done at the Factory
Utilizing Special Designed-In Test Features
•Dependable Texas Instruments Quality and
Reliability
•Package Options Include Plastic
Dual-In-Line and Chip Carrier Packages
description
The TIBPAL22VP10’ is equivalent to the
TIBPAL22V10A but offers additional flexibility in
the output structure. The improved output
macrocell uses the registered outputs as inputs
when in a high-impedance condition. This
provides two additional output configurations for a
total of six possible macrocell configurations all of
which are shown in Figure 1.
These devices contain up to 22 inputs and 10 outputs. They incorporate the unique capability of defining and
programming the architecture of each output on an individual basis. Outputs may be registered or nonregistered
and inverting or noninverting. In addition, the data may be fed back into the array from either the register or the
I/O port. The ten potential outputs are enabled through the use of individual product terms.
Further advantages can be seen in the introduction of variable product term distribution. This technique
allocates from 8 to 16 logical product terms to each output for an average of 12 product terms per output. This
variable allocation of terms allows far more complex functions to be implemented than in previously available
devices.
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
(TOP VIEW)
CC
I
I
3212827
426
5
I
6
I
7
I
8
NC
9
I
10
I
11
I
12 13
14 15 16 1718
I
I
NC – No internal connection
Pin assignments in operating mode
V
CLK/INCI/O/Q
NC
GND
I
I/O/Q
25
24
23
22
21
20
19
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
NC
I/O/Q
I/O/Q
I/O/Q
These devices are covered by U.S. Patent 4,410,987.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
description (continued)
Circuit design is enhanced by the addition of a synchronous set and an asynchronous reset product term. These
functions are common to all registers. When the synchronous set product term is a logic 1, the output registers
are loaded with a logic 1 on the next low-to-high clock transition. When the asynchronous reset product term
is a logic 1, the output registers are loaded with a logic 0. The output logic level after set or reset depends on
the polarity selected during programming. Output registers can be preloaded to any desired state during testing.
Preloading permits full logical verification during product testing.
With features such as programmable output logic macrocells and variable product term distribution, the
TIBP AL22VP10’ of fers quick design and development of custom LSI functions with complexities of 500 to 800
equivalent gates. Since each of the ten output pins may be individually configured as inputs on either a
temporary or permanent basis, functions requiring up to 21 inputs and a single output or down to 12 inputs and
10 outputs are possible.
A power-up clear function is supplied that forces all registered outputs to a predetermined state after power is
applied to the device. Registered outputs selected as active-low power-up with their outputs high. Registered
outputs selected as active-high power-up with their outputs low.
A single security fuse is provided on each device to discourage unauthorized copying of fuse patterns. Once
blown, the verification circuitry is disabled and all other fuses will appear to be open.
IMPACT-X
PROGRAMMABLE ARRAY LOGIC CIRCUITS
The TIBPAL22V10-20C is characterized for operation from 0°C to 75°C. The TIBPAL22V10-25M is
characterized for operation over the full military temperature range of –55°C to 125°C.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
HIGH-PERFORMANCE
IMPACT-X
functional block diagram (positive logic)
TIBPAL22VP10-20C, TIBPAL22VP10-25M
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
output logic macrocell diagram
IMPACT-X
PROGRAMMABLE ARRAY LOGIC CIRCUITS
Output Logic Macrocell
MUX
2
S1
S0
3
0
1
0
1
G
3
0
I = 0
S2
R
1D
C1
1S
MUX
1/2/3
0
1
G
3
0
†
AR
SS
From Clock Buffer
AR = asynchronous reset
SS = synchronous set
†
This fuse is unique to the Texas Instruments TIBPAL22VP10’. It allows feedback from the I/O port using registered outputs as shown in the
macrocell fusing logic function table.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
HIGH-PERFORMANCE
IMPACT-X
TIBPAL22VP10-20C, TIBPAL22VP10-25M
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
IMPACT-X
MACROCELL FEEDBACK AND OUTPUT FUNCTION TABLE
PROGRAMMABLE ARRAY LOGIC CIRCUITS
FUSE SELECT
S2S1S0
000Register feedbackRegisteredActive low
001Register feedbackRegisteredActive high
100I/O feedbackRegisteredActive low
101I/O feedbackRegisteredActive high
X10I/O feedbackCombinational Active low
X11I/O feedbackCombinational Active high
0 = unblown fuse, 1 = blown fuse, X = unblown or blown fuse
S2, S1 and S0 are select-function fuses as shown in the output logic macrocell diagram.
FEEDBACK AND OUTPUT CONFIGURATION
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Hold time, input, preset, or feedback after clock↑00ns
Operating free-air temperature075–55125°C
†
+
tsu)
+
twhigh)twlow
3725MHz
Clock high or low1020
Asynchronous Reset high or low2030
Input1520
Feedback1520
Synchronous Preset (active)1520
Asynchronous Reset (inactive)2025
1
tpd(CLK to Q)
1
, f
without feedback can be calculated as
clock
.
UNIT
ns
ns
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TIBPAL22VP10-20C
HIGH-PERFORMANCE
electrical characteristics over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
V
IK
V
OH
V
OL
I
OZH
I
OZLµA
I
I
I
IH
I
IL
I
OS
I
CC
Any output–100
Any I/O–250
‡
switching characteristicsover recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
§
f
max
t
pd
t
pd
t
pd
t
en
t
dis
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
CLKQR2 = 390 Ω,812ns
I, I/OI/O, QSee Figure 41220ns
I, I/OI/O, Q1220ns
+
tsu)
+
twhigh)twlow
1
tpd(CLK to Q)
1
IMPACT-X
TO
(OUTPUT)
, f
max
.
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
TEST CONDITIONMIN TYP†MAXUNIT
CL = 50 pF,1220ns
without feedback can be calculated as
3750MHz
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
TIBPAL22VP10-25M
HIGH-PERFORMANCE
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
electrical characteristics over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
V
IK
V
OH
V
OL
I
OZH
I
OZL
I
I
I
IH
I
IL
‡
I
OS
I
CC
switching characteristicsover recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
§
f
max
t
pd
t
pd
t
pd
t
en
t
dis
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
CLKQR2 = 750 Ω,815ns
I, I/OI/O, QSee Figure 41225ns
I, I/OI/O, Q1225ns
tsu)
+
twhigh)twlow
1
tpd(CLK to Q)
1
PROGRAMMABLE ARRAY LOGIC CIRCUITS
TO
(OUTPUT)
, f
max
.
without feedback can be calculated as
TEST CONDITIONMIN TYP†MAXUNIT
2550MHz
CL = 50 pF,1225ns
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TIBPAL22VP10-20C, TIBPAL22VP10-25M
HIGH-PERFORMANCE
preload procedure for registered outputs (see Notes 2 and 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below:
IMPACT-X
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
Step 1. With VCC at 5 V and pin 1 at VIL, raise pin 13 to V
Step 2. Apply either V
or VIH to the output corresponding to the register to be preloaded.
IL
IHH
.
Step 3. Pulse pin 1, clocking in preload data.
Step 4. Remove output voltage, then lower pin 13 to V
. Preload can be verified by observing the voltage level
IL
at the output pin.
V
Pin 13
t
t
d
Pin 1
Registered I/OInputOutput
su
t
w
t
d
V
IH
V
IL
IHH
V
IL
V
IH
V
IL
V
OH
V
OL
Figure 2. Preload Waveforms
NOTES: 2. Pin numbers shown are for JT and NT packages only. If chip-carrier socket adapter is not used, pin numbers must be changed
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
power-up reset
Following power up, all registers are reset to zero. The output level depends on the polarity selected during
programming. This feature provides extra flexibility to the system designer and is especially valuable in
simplifying state-machine initialization. To ensure a valid power-up reset, it is important that the rise of V
monotonic. Following power-up reset, a low-to-high clock transition must not occur until all applicable input and
feedback setup times are met.
Active High
Registered Output
Active Low
Registered Output
IMPACT-X
V
CC
CLK
PROGRAMMABLE ARRAY LOGIC CIRCUITS
4 V
†
tpd
(600 ns typ, 1000 ns MAX)
State Unknown
State Unknown
1.5 V
1.5 V
1.5 V
tsu
t
w
‡
1.5 V
5 V
V
V
V
V
V
V
OH
OL
OH
OL
IH
IL
CC
be
†
This is the power-up reset time and applies to registered outputs only. The values shown are from characterization data.
‡
This is the setup time for input or feedback.
Figure 3. Power-Up Reset Waveforms
programming information
Texas Instruments programmable logic devices can be programmed using widely available software and
inexpensive device programmers.
When the additional fuses are not being used, the TIBPAL22VP10 can be programmed using the
TIBP AL22V10/10A programming algorithm. The fuse configuration data can either be from a JEDEC file (format
per JEDEC Standard No. 3-A) or a TIBPAL22V10/10A master.
Complete programming specifications, algorithms, and the latest information on hardware, software, and
firmware are available upon request. Information on programmers capable of programming T exas Instruments
programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI
distributor, or by calling Texas Instruments at (214) 997-5666.
12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
HIGH-PERFORMANCE
IMPACT-X
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
TIBPAL22VP10-20C, TIBPAL22VP10-25M
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 – D2943, FEBRUARY 1987 – REVISED JUNE 1991
5 V
S1
R1
Test
Point
Timing
Input
Data
Input
Input
In-Phase
Output
Out-of-Phase
Output
(see Note D)
1.5 V
t
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
t
pd
1.5 V
t
pd
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
(see Note A)
(3.5 V) [3 V]
(0.3 V) [0]
t
h
(3.5 V) [3 V]
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
t
pd
V
OH
1.5 V
V
OL
t
pd
V
OH
V
OL
C
L
LOAD CIRCUIT FOR
3-STATE OUTPUTS
High-Level
Output
Control
(low–level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
R2
(3.5 V) [3 V]
Pulse
Low-Level
Pulse
VOLTAGE WAVEFORMS
t
en
1.5 V1.5 V
t
w
1.5 V1.5 V
PULSE DURATIONS
1.5 V1.5 V
t
dis
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
≈ 3.3 V
1.5 V
t
t
en
dis
1.5 V
VOL +0.5 V
V
V
VOH –0.5 V
≈ 0 V
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
OL
OH
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. W aveform 2
is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses have the following characteristics: For C suffix, use the voltage levels indicated in parentheses ( ). PRR ≤ 1 MHz,
tr = tf ≤ 2 ns, duty cycle = 50%. For M suffix, use the voltage levels indicated in brackets [ ]. PRR ≤ 10 MHz, tr and tf ≤ 2 ns,
duty cycle = 50%.
D. When measuring propagation delay times of 3-state outputs, switch S1 is closed.
E. Equivalent loads may be used for testing.
Figure 4. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
dis
.
13
TI Worldwide
Sales Offices
ALABAMA: Huntsville: 4960 Corporate Drive,
Suite 150, Huntsville, AL 35805, (205) 837-7530.
ARIZONA: Phoenix: 8825 N. 23rd Avenue, Suite 100,
Phoenix, AZ 85021, (602) 995-1007.
CALIFORNIA: Irvine: 1920 Main Street, Suite 900,
Irvine, CA 92714, (714) 660-1200;
San Diego: 5625 Ruffin Road, Suite 100,
San Diego, CA 92123, (619) 278-9600;
Santa Clara: 5353 Betsy Ross Drive,
Santa Clara, CA 95054, (408) 980-9000;
Woodland Hills: 21550 Oxnard Street, Suite 700,
Woodland Hills, CA 91367, (818) 704-8100.
COLORADO: Aurora: 1400 S. Potomac Street, Suite 101,
Aurora, CO 80012, (303) 368-8000.
CONNECTICUT: W allingford: 9 Barnes Industrial Park
So., Wallingford, CT 06492, (203) 269-0074.
FLORIDA: Altamonte Springs: 370 S. North Lake
Boulevard, Suite 1008, Altamonte Springs, FL 32701,
(407) 260-2116;
Fort Lauderdale: 2950 N.W. 62nd Street,
Suite 100, Fort Lauderdale, FL 33309,
(305) 973-8502; Tampa: 4803 George Road, Suite 390,
Tampa, FL 33634-6234, (813) 885-7588.
GEORGIA: Norcross: 5515 Spalding Drive,
Norcross, GA 30092-2560, (404) 662-7967.
ILLINOIS: Arlington Heights: 515 West Algonquin,
Arlington Heights, IL 60005, (708) 640-6925.
INDIANA: Carmel: 550 Congressional Drive, Suite 100,
Carmel, IN 46032, (317) 573-6400;
Fort Wayne: 103 Airport North Office Park,
Fort Wayne, IN 46825, (219) 489-4697.
KANSAS: Overland Park: 7300 College Boulevard,
Lighton Plaza, Suite 150, Overland Park, KS 66210,
(913) 451-4511.
MARYLAND: Columbia: 8815 Centre Park Drive,
Suite 100, Columbia, MD 21045, (410) 964-2003.
MASSACHUSETTS: Waltham: Bay Colony Corporate
Center 950 Winter Street, Suite 2800, Waltham, MA 02154,
(617) 895-9100.
MICHIGAN: Farmington Hills: 33737 W. 12 Mile Road,
Farmington Hills, MI 48018, (313) 553-1581.
MINNESOTA: Eden Prairie: 11000 W. 78th Street,
Suite 100, Eden Prairie, MN 55344, (612) 828-9300.
MISSOURI: St. Louis: 12412 Powerscourt Drive,
Suite 125, St. Louis, MO 63131, (314) 821-8400.
NEW JERSEY: Iselin: Metropolitan Corporate Plaza, 485
Bldg E. U.S. 1 South, Iselin, NJ 08830, (908) 750-1050.
NEW MEXICO: Albuquerque: 2709 J. Pan American
Freeway, N.E., Albuquerque, NM 87101, (505) 345-2555.
NEW YORK: East Syracuse: 6365 Collamer Drive,
East Syracuse, NY 13057, (315) 463-9291;
Fishkill: 300 Westage Business Center, Suite 140,
Fishkill, NY 12524, (914) 897-2900;
Melville: 48 South Service Road, Suite 100, Melville, NY
11747, (516) 454-6601;
Pittsford: 2851 Clover Street, Pittsford, NY 14534,
(716) 385-6770.
NORTH CAROLINA: Charlotte: 8 Woodlawn Green,
Suite 100, Charlotte, NC 28217, (704) 527-0930;
Raleigh: 2809 Highwoods Boulevard, Suite 100,
Raleigh, NC 27625, (919) 876-2725.
UTAH: Salt Lake City: 2180 South 1300 East, Sute 335,
Salt Lake City, UT 54106, (801) 466-8972.
WISCONSIN: Waukesha: 20825 Swenson Drive,
Suite 900, Waukesha WI 53186, (414) 798-1001.
CANADA: Nepean: 301 Moodie Drive, Suite 102, Mallom
Center, Nepean, Ontario, Canada K2H 9C4,
(613) 726-1970;
Richmond Hill: 280 Centre Street East, Richmond Hill,
Ontario, Canada L4C 1B1, (416) 884-9181;
St. Laurent: 9460 Trans Canada Highway, St. Laurent,
Quebec, Canada H4S 1R7, (514) 335-8392.
AUSTRALIA (& NEW ZEALAND): T exas Instruments
Australia Ltd., 6-10 Talavera Road, North Ryde (Sydney),
New South Wales, Australia 2113, 2-878-9000; 14th Floor,
380 Street, Kilda Road, Melbourne, Victoria, Australia 3004,
3-696-1211; 171 Philip Highway, Elizabeth, South Australia
5112, 8 255-2066.
ITALY: Texas Instruments Italia S.p.A., Centro Direzionale
Colleoni, Palazzo Perseo-Via Paracelso 12, 20041 Agrate
Brianza (Mi), Italy, (039) 63221; Via Castello della Magliana,
38, 00148 Roma, Italy (06) 6572651; Via Amendola, 17,
40100 Bologna, Italy (051) 554004.
JAPAN: Texas Instruments Japan Ltd., Aoyama Fuji
Building 3-6-12 Kita-Aoyama Minato-ku, Tokyo, Japan 107,
03-498-2111; MS Shibaura Building 9F, 4-13-23 Shibaura,
Minato-ku, Tokyo, Japan 108, 03-769-8700; Nissho-iwai
Building 5F, 2-5-8 Imabashi, Chuou-ku, Osaka, Japan 541,
06-204-1881; Dai-ni Toyota Building Nishi-kan 7F, 4-10-27
Meieki, Nakamura-ku, Nagoya, Japan 450, 052-583-8691;
Kanazawa Oyama-cho Daiichi Seimei Building 6F, 3-10
Oyama-cho, Kanazawa, Ishikawa, Japan 920,
0762-23-5471; Matsumoto Showa Building 6F, 1-2-11
Fukashi, Matsumoto, Nagano, Japan 390, 0263-33-1060;
Daiichi Olympic Tachikawa Building 6F, 1-25-12,
Akebono-cho, Tachikawa, Tokyo, Japan 190,
0425-27-6760; Yokohama Business Park East Tower 10F,
134 Goudo-cho Hodogaya-ku, Yokohama-shi, Kanagawa,
Japan 240, 045-338-1220; Nihon Seimei Kyoto Yasaka
Building 5F, 843-2, Higashi Shiokohji-cho, Higashi-iru,
Nishinotoh-in, Shiokohji-dori, Shimogyo-ku, Kyoto, Japan
600, 075-341-7713; Sumitomo Seimei Kumagaya Building
8F, 2-44 Yayoi, Kumagaya, Saitama, Japan 360,
0485-22-2440; 2597-1, Aza Harudai, Oaza Yasaka, Kitsuki,
Oita, Japan 873, 09786-3-3211.
MALAYSIA: Texas Instruments Malaysia, Sdn. Bhd., Asia
Pacific, Lot 36.1 #Box 93, Menara Maybank, 100 Jalan Tun
Perak, 50050 Kuala Llumpur, Malaysia, 2306001.
MEXICO: Texas Instruments de Mexico S.A., de C.V.,
Alfonso Reyes 115, Col. Hipodromo Condesa, Mexico, D.F.,
Mexico 06170, 5-515-6081.
NORWAY: Texas Instruments Norge A/S, P.B. 106, Refstad
(Sinsenveien 53), 0513 Oslo 5, Norway, (02) 155 090.
T exas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor
product or service without notice, and advises its customers to obtain the latest version of relevant information
to verify, before placing orders, that the information being relied on is current.
TI warrants performance of its semiconductor products and related software to the specifications applicable at
the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are
utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each
device is not necessarily performed, except those mandated by government requirements.
Certain applications using semiconductor products may involve potential risks of death, personal injury, or
severe property or environmental damage (“Critical Applications”).
TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED
TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS.
Inclusion of TI products in such applications is understood to be fully at the risk of the customer. Use of TI
products in such applications requires the written approval of an appropriate TI officer . Questions concerning
potential risk applications should be directed to TI through a local SC sales office.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards should be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance, customer product design, software performance, or
infringement of patents or services described herein. Nor does TI warrant or represent that any license, either
express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property
right of TI covering or relating to any combination, machine, or process in which such semiconductor products
or services might be or are used.
Copyright 1996, Texas Instruments Incorporated
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.