C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
I
I
I
NC
I
I
I
12
TIBPAL20L8’
(TOP VIEW)
I
I
I
3212827
426
5
6
7
8
9
10
11
12 13
14 15 16 17 18
I
I
GND
NC
– No internal connection
Pin assignments in operating mode
I/O
I/O
I/O
NC
I/O
I/O
I/O
These programmable array logic devices feature high speed and functional equivalency when compared with
currently available devices. These IMPACT-X circuits combine the latest Advanced Low-Power Schottky
technology with proven titanium-tungsten fuses to provide reliable, high-performance substitutes for
conventional TTL logic. Their easy programmability allows for quick design of custom functions and typically
results in a more compact circuit board. In addition, chip carriers are available for futher reduction in board
space.
All of the register outputs are set to a low level during power-up. Extra circuitry has been provided to allow loading
of each register asynchronously to either a high or low state. This feature simplifies testing because the registers
can be set to an initial state prior to executing the test sequence.
The TIBPAL20’ C series is characterized from 0°C to 75°C. The TIBPAL20’ M series is characterized for
operation over the full military temperature range of –55°C to 125°C.
These devices are covered by U.S. Patent 4,410,987.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PAL is a registered trademark of Advanced Micro Devices Inc.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard
warranty. Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
TIBPAL20R4-7C, TIBPAL20R6-7C, TIBPAL20R8-7C
TIBPAL20R4-10M, TIBPAL20R6-10M, TIBPAL20R8-10M
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
CIRCUITS
TIBPAL20R4’
C SUFFIX . . . JT OR NT PACKAGE
M SUFFIX . . . JT PACKAGE
(TOP VIEW)
24
23
22
21
20
19
18
17
16
15
14
13
24
23
22
21
20
19
18
17
16
15
14
13
V
I
I/O
I/O
Q
Q
Q
Q
I/O
I/O
I
OE
V
I
I/O
Q
Q
Q
Q
Q
Q
I/O
I
OE
CC
CC
1
CLK
2
I
3
I
4
I
5
I
6
I
7
I
8
I
9
I
10
I
11
I
12
GND
TIBPAL20R6’
C SUFFIX . . . JT OR NT PACKAGE
M SUFFIX . . . JT PACKAGE
(TOP VIEW)
1
CLK
2
I
3
I
4
I
5
I
6
I
7
I
8
I
9
I
10
I
11
I
12
GND
TIBPAL20R4’
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
(TOP VIEW)
CC
I
I
4
3 2 1 282726
5I/O
I
6
I
7
I
8
NC
9
I
10
I
11
I
12 13 14 15 16 17 18
I
I
TIBPAL20R6’
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
(TOP VIEW)
I
I
4
3 2 1 282726
5Q
I
6
I
7
I
8
NC
9
I
10
I
1119
I
12 13 14 15 16 17 18
I
I
V
CLKNCI
NC
OE
GND
CC
V
CLKNCI
OE
NC
GND
I/O
25
Q
24
Q
23
NC
22
Q
21
Q
20
19
I/O
I
I/O
I/O
25
Q
24
Q
23
NC
22
Q
21
Q
20
Q
I
I/O
TIBPAL20R8’
C SUFFIX . . . JT OR NT PACKAGE
M SUFFIX . . . JT PACKAGE
(TOP VIEW)
1
CLK
2
I
3
I
4
I
5
I
6
I
7
I
8
I
9
I
10
I
11
I
12
GND
Pin assignments in operating mode
2
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
I
Q
Q
Q
Q
Q
Q
Q
Q
I
OE
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TIBPAL20R8’
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
(TOP VIEW)
I
I
4
3 2 1 282726
5Q
I
6
I
7
I
8
NC
9
I
10
I
1119
I
12 13 14 15 16 17 18
I
I
NC – No internal connection
CC
CLKNCI
V
OE
NC
GND
Q
25
Q
24
Q
23
NC
22
Q
21
Q
20
Q
I
Q
functional block diagrams (positive logic)
TIBPAL20L8-7C, TIBPAL20R4-7C
TIBPAL20L8-10M, TIBPAL20R4-10M
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
TIBPAL20L8’
CIRCUITS
OE
CLK
1420
I
20 x
&
40 X 64
206
TIBPAL20R4’
7
7
7
7
7
7
7
7
6
EN
≥1
O
O
I/O
I/O
I/O
I/O
I/O
I/O
EN 2
C1
denotes fused inputs
1220
I
4
20 x
1D
I = 0
2
Q
Q
Q
Q
I/O
I/O
I/O
I/O
&
40 X 64
204
8
8
8
8
7
7
7
7
4
≥1
≥1
EN
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
TIBPAL20R6-7C, TIBPAL20R8-7C
TIBPAL20R6-10M, TIBPAL20R8-10M
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
functional block diagrams (positive logic)
CIRCUITS
TIBPAL20R6’
OE
CLK
1220
I
6
20 x
EN 2
C1
1D
I = 0
2
Q
Q
Q
Q
Q
Q
I/O
I/O
&
40 X 64
202
8
8
8
8
8
8
7
7
2
≥1
≥1
EN
6
CLK
denotes fused inputs
OE
1220
I
20 x
TIBPAL20R8’
EN 2
C1
1D
I = 0
2
Q
Q
Q
Q
Q
Q
Q
Q
&
40 X 64
208
8
8
8
8
8
8
8
8
8
≥1
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
1
I
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
Increment
TIBPAL20L8-7C
TIBPAL20L8-10M
CIRCUITS
2
I
First Fuse
Numbers
120
160
200
240
280
3
I
320
360
400
440
480
520
560
600
4
I
640
680
720
760
800
840
880
920
5
I
960
1000
1040
1080
1120
1160
1200
1240
6
I
1280
1320
1360
1400
1440
1480
1520
1560
7
I
1600
1640
1680
1720
1760
1800
1840
1880
8
I
1920
1960
2000
2040
2080
2120
2160
2200
9
I
2240
2280
2320
2360
2400
2440
2480
2520
10
I
11
I
48121620242832
0
40
80
36390
23
I
22
O
21
I/O
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
O
14
I
13
I
Fuse number = First fuse number + Increment
Pin numbers shown are for JT and NT packages.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
TIBPAL20R4-7C
TIBPAL20R4-10M
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
logic diagram (positive logic)
1
CLK
Increment
CIRCUITS
2
I
First Fuse
Numbers
0
40
80
120
160
200
240
280
3
I
320
360
400
440
480
520
560
600
4
I
640
680
720
760
800
840
880
920
5
I
960
1000
1040
1080
1120
1160
1200
1240
6
I
1280
1320
1360
1400
1440
1480
1520
1560
7
I
1600
1640
1680
1720
1760
1800
1840
1880
8
I
1920
1960
2000
2040
2080
2120
2160
2200
9
I
2240
2280
2320
2360
2400
2440
2480
2520
10
I
11
I
Fuse number = First fuse number + Increment
Pin numbers shown are for JT and NT packages.
48121620242832
36390
23
I
22
I/O
21
I/O
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
20
19
18
17
16
15
14
13
Q
Q
Q
Q
I/O
I/O
I
OE
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
1
CLK
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
Increment
TIBPAL20R6-7C
TIBPAL20R6-10M
CIRCUITS
2
I
First Fuse
Numbers
0
40
80
120
160
200
240
280
3
I
320
360
400
440
480
520
560
600
4
I
640
680
720
760
800
840
880
920
5
I
960
1000
1040
1080
1120
1160
1200
1240
6
I
1280
1320
1360
1400
1440
1480
1520
1560
7
I
1600
1640
1680
1720
1760
1800
1840
1880
8
I
1920
1960
2000
2040
2080
2120
2160
2200
9
I
2240
2280
2320
2360
2400
2440
2480
2520
10
I
11
I
Fuse number = First fuse number + Increment
Pin numbers shown are for JT and NT packages.
48121620242832
36390
23
I
22
I/O
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
I = 0
1D
C1
21
20
19
18
17
16
15
14
13
Q
Q
Q
Q
Q
Q
I/O
I
OE
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
TIBPAL20R8-7C
TIBPAL20R8-10M
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
logic diagram (positive logic)
1
CLK
Increment
CIRCUITS
2
I
First Fuse
Numbers
0
40
80
120
160
200
240
280
3
I
320
360
400
440
480
520
560
600
4
I
640
680
720
760
800
840
880
920
5
I
960
1000
1040
1080
1120
1160
1200
1240
6
I
1280
1320
1360
1400
1440
1480
1520
1560
7
I
1600
1640
1680
1720
1760
1800
1840
1880
8
I
1920
1960
2000
2040
2080
2120
2160
2200
9
I
2240
2280
2320
2360
2400
2440
2480
2520
10
I
11
I
Fuse number = First fuse number + Increment
Pin numbers shown are for JT and NT packages.
NOTE 1: These ratings apply except for programming pins during a programming cycle.
recommended operating conditions
MINNOMMAXUNIT
V
CC
V
IH
V
IL
I
OH
I
OL
f
clock
†
w
†
t
su
†
t
h
T
A
†
f
clock
NOTE 2: These are absolute voltage levels with respect to the ground pin of the device and include all overshoots due to system and/or tester
Supply voltage4.7555.25V
High-level input voltage (see Note 2)25.5V
Low-level input voltage (see Note 2)0.8V
High-level output current–3.2mA
Low-level output current24mA
†
Clock frequency0100MHz
Pulse duration, clock (see Note 2)t
Setup time, input or feedback before clock↑7ns
Hold time, input or feedback after clock↑0ns
Operating free-air temperature02575°C
, tw, tsu, and th do not apply for TIBPAL20L8’.
noise. Testing these parameters should not be attempted without suitable equipment.
High5
Low5
CIRCUITS
ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
TIBPAL20L8-7C, TIBPAL20R4-7C, TIBPAL20R6-7C, TIBPAL20R8-7C
HIGH-PERFORMANCE IMPACT-X PAL
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
electrical characteristics over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMINTYP†MAXUNIT
V
IK
V
OH
V
OL
‡
I
OZH
‡
I
OZL
I
I
‡
I
IH
‡
I
IL
§
I
OS
I
CC
C
i
C
o
C
clk
switching characteristicsover recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
¶
f
max
pd
t
pd
#
t
pd
t
en
t
dis
t
en
t
dis
||
t
sk(o)
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
I/O leakage is the worst case of I
§
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
¶
See section for f
#
This parameter applies to TIBPAL20R4’ and TIBPAL20R6’ only (see Figure 4 for illustration) and is calculated from the measured f
feedback in the counter configuration.
||
This parameter is the measurement of the difference between the fastest and slowest tpd (CLK-to-Q) observed when multiple registered outputs
are switching in the same direction.
f = 1 MHz,VI = 2 V5pF
f = 1 MHz,VO = 2 V6pF
f = 1 MHz,V
5.5
V,
CIRCUITS
Outputs open
OE = V
IH
= 2 V6pF
CLK
140220mA
µAVI = 2.7 V
switching characteristicsover recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
¶
f
max
t
pd
t
pd
#
t
pd
t
en
t
dis
t
en
t
dis
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
I/O leakage is the worst case of I
§
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
¶
See section for f
specification section.
#
This parameter applies to TIBPAL20R4’ and TIBPAL20R6’ only (see Figure 4 for illustration) and is calculated from the measured f
feedback in the counter configuration.
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
programming information
Texas Instruments programmable logic devices can be programmed using widely available software and
inexpensive device programmers.
Complete programming specifications, algorithms, and the latest information on hardware, software, and
firmware are available upon request. Information on programmers capable of programming T exas Instruments
programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI
distributor, or by calling Texas Instruments at (214) 997-5666.
preload procedure for registered outputs (see Figure 1 and Note 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below.
Step 1.With V
at 5 volts and Pin 1 at VIL, raise Pin 13 to V
CC
Step 2.Apply either VIL or VIH to the output corresponding to the register to be preloaded.
Step 3.Pulse Pin 1, clocking in preload data.
Step 4.Remove output voltage, then lower Pin 13 to VIL. Preload can be verified by observing the
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
power-up reset (see Figure 2)
Following power up, all registers are reset to zero. This feature provides extra flexibility to the system designer
and is especially valuable in simplifying state-machine initialization. To ensure a valid power-up reset, it is
important that the rise of VCC be monotonic. Following power-up reset, a low-to-high clock transition must not
occur until all applicable input and feedback setup times are met.
V
CC
Active Low
Registered Output
CLK
5 V
V
V
V
V
OH
OL
IH
IL
†
This is the power-up reset time and applies to registered outputs only. The values shown are from characterization data.
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
f
SPECIFICATIONS
max
without feedback, see Figure 3
f
max
In this mode, data is presented at the input to the flip-flop and clocked through to the Q output with no feedback.
Under this condition, the clock period is limited by the sum of the data setup time and the data hold time (t
However, the minimum f
f
Thus,
without feedback
max
is determined by the minimum clock period (tw high + tw low).
max
+
(twhigh
1
)
twlow)
CLK
or
1
(tsu)
th)
.
CIRCUITS
su
+ th).
f
with internal feedback, see Figure 4
max
LOGIC
ARRAY
tsu + t
tw high + tw low
Figure 3. f
h
or
Without Feedback
max
C1
1D
This configuration is most popular in counters and on-chip state-machine designs. The flip-flop inputs are
defined by the device inputs and flip-flop outputs. Under this condition, the period is limited by the internal delay
from the flip-flop outputs through the internal feedback and logic array to the inputs of the next flip-flop.
Thus,
f
with internal feedback
max
+
(tsu)
1
tpdCLK*to*FB)
.
Where tpd CLK-to-FB is the deduced value of the delay from CLK to the input of the logic array.
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
with external feedback, see Figure 5
f
max
This configuration is a typical state-machine design with feedback signals sent off-chip. This external feedback
could go back to the device inputs or to a second device in a multi-chip state machine. The slowest path defining
the period is the sum of the clock-to-output time and the input setup time for the external signals
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
PARAMETER MEASUREMENT INFORMATION
5 V
S1
R1
From Output
Under Test
Test
Point
CIRCUITS
Timing
Input
Data
Input
Input
In-Phase
Output
Out-of-Phase
Output
(see Note D)
1.5 V
t
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
t
pd
1.5 V
t
pd
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
(see Note A)
(3.5 V) [3 V]
(0.3 V) [0]
t
h
(3.5 V) [3 V]
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
t
pd
V
OH
1.5 V
V
OL
t
pd
V
OH
V
OL
C
L
LOAD CIRCUIT FOR
3-STATE OUTPUTS
High-Level
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
R2
(3.5 V) [3 V]
Pulse
Low-Level
Pulse
VOLTAGE WAVEFORMS
t
en
1.5 V1.5 V
t
w
1.5 V1.5 V
PULSE DURATIONS
1.5 V1.5 V
t
dis
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
(3.5 V) [3 V]
(0.3 V) [0]
≈ 3.3 V
1.5 V
t
t
en
dis
1.5 V
VOL +0.5 V
V
V
VOH –0.5 V
≈ 0 V
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
OL
OH
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. W aveform 2
is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses have the following characteristics: PRR ≤ 10 MHz, tr and tf ≤ 2 ns, duty cycle = 50%. For C suffix, use the voltage levels
indicated inparentheses ( ). For M suffix, use the voltage levels indicated in brackets [ ].
D. When measuring propagation delay times of 3-state outputs, switch S1 is closed.
E. Equivalent loads may be used for testing.
SRPS005D – D3307, OCTOBER 1989 – REVISED NOVEMBER 1995
PROPAGATION DELAY TIME
vs
NUMBER OF OUTPUTS SWITCHING
0.8
VCC = 5 V
TA = 25 °C
0.7
R1 = 200 Ω
R2 = 390 Ω
CL = 50 pF
0.6
8-Bit Counter
0.5
†
800
– Power Dissipation – mW
700
D
P
600
141040100
TA = 25 °C
TA = 80 °C
F – Frequency – MHz
Figure 11
NUMBER OF OUTPUTS SWITCHING
8
7
6
t
PLH
5
0.4
0.3
0.2
– Skew Between Outputs Switching – ns
0.1
skew
t
PROPAGATION DELAY TIME
vs
t
(I, I/O to O, I/O)
PHL
(I, I/O to O, I/O)
0
23 4 5 6
Number of Outputs Switching
Figure 12
78
4
3
2
Propagation Delay Time – ns
1
0
†
Outputs switching in the same direction (t
t
PHL
t
(CLK to Q)
PLH
VCC = 5 V
TA = 25 °C
CL = 50 pF
R1 = 200 Ω
R2 = 390 Ω
012345
Number of Outputs Switching
Figure 13
PLH compared to
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
t
PLH/tPHL to
t
(CLK to Q)
678
PHL)
19
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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