Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW),
Ceramic Chip Carriers (FK) and
Flatpacks (W), and Standard Plastic (N) and
OE
1D
2D
3D
4D
5D
6D
7D
8D
GND
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
V
CC
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
CLK
Ceramic (J) DIPs
SN54ACT564 . . . FK PACKAGE
description
The ’ACT564 are octal D-type edge-triggered
(TOP VIEW)
2D1DOE
V
CC
1Q
flip-flops that feature 3-state outputs designed
specifically for driving highly capacitive or
relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O
ports, bidirectional bus drivers, and working
registers.
On the positive transition of the clock (CLK) input,
the Q
outputs are set to the complements of the
logic levels set up at the data (D) inputs.
A buffered output-enable (OE
) input places the eight outputs in either a normal logic state (high or low logic
3D
4D
5D
6D
7D
3 2 1 20 19
4
5
6
7
8
910111213
8D
CLK
GND
8Q
18
17
16
15
14
7Q
2Q
3Q
4Q
5Q
6Q
levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines
significantly. The high-impedance state and increased drive provide the capability to drive bus lines without
interface or pullup components.
OE
does not affect internal operations of the flip-flops. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
The SN54ACT564 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74ACT564 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each flip-flop)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
INPUTS
OECLKD
L↑HL
L↑LH
LH or LXQ
HXXZ
OUTPUT
Q
0
Copyright 1996, Texas Instruments Incorporated
1
SN54ACT564, SN74ACT564
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCAS549A – NOVEMBER 1995 – REVISED MA Y 1996
logic symbol
OE
CLK
1D
2D
3D
4D
5D
6D
7D
8D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
†
1
11
2
3
4
5
6
7
8
9
EN
1D
C1
1
19
18
17
16
15
14
13
12
logic diagram (positive logic)
1
OE
11
CLK
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
1D
2
C1
1D
To Seven Other Channels
19
1Q
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Maximum power dissipation at TA = 55°C (in still air) (see Note 2): DB package 0.6 W. . . . . . . . . . . . . . . . .
Storage temperature range, T
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils,
except for the N package, which has a trace length of zero.
IOL = 50 mA
IOL = 75 mA
VO = VCC or GND5.5 V±0.25±5±2.5µA
VI = VCC or GND5.5 V±0.1±1±1µA
VI = VCC or GND,IO = 05.5 V48040µA
‡
One input at 3.4 V ,
Other inputs at GND or V
VI = VCC or GND5 V4.5pF
VO = VCC or GND5 V15pF
†
†
†
†
CC
4.5 V4.44.494.44.4
5.5 V5.45.495.45.4
4.5 V3.863.73.76
5.5 V4.864.74.76
5.5 V3.85
5.5 V3.85
4.5 V0.10.10.1
5.5 V0.10.10.1
4.5 V0.360.50.44
5.5 V0.360.50.44
5.5 V1.65
5.5 V1.65
5.5 V0.61.61.5mA
CC
CC
0V
0V
CC
CC
V
V
timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V
(unless otherwise noted) (see Figure 1)
t
w
t
su
t
h
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
TA = 25°CSN54ACT564SN74ACT564
MINMAXMINMAXMINMAX
Pulse duration, CLK high or low353.5ns
Setup time, data before CLK↑2.53.53ns
Hold time, data after CLK↑12.51ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ACT564, SN74ACT564
PARAMETER
UNIT
CLK
Q
ns
OE
Q
ns
OE
Q
ns
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCAS549A – NOVEMBER 1995 – REVISED MA Y 1996
switching characteristics over recommended operating free-air temperature range,
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
V
CC
FROMTO
(INPUT)(OUTPUT)
f
max
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
operating characteristics, VCC = 5 V, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitanceCL = 50 pF, f = 1 MHz50pF
pd
TA = 25°CSN54ACT564SN74ACT564
MINTYPMAXMINMAXMINMAX
85906575MHz
26.510.5112.51.511.5
1.569.5111.51.510.5
1.55.59110.51.59.5
1.55.58.5110.519.5
1.5710.5112.51.511.5
1.55819.518.5
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
Input
PARAMETER MEASUREMENT INFORMATION
500 Ω
500 Ω
LOAD CIRCUIT
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
S1
2 × V
3 V
0 V
SN54ACT564, SN74ACT564
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCAS549A – NOVEMBER 1995 – REVISED MA Y 1996
CC
Open
Timing Input
Data Input
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
Open
2 × V
Open
CC
t
h
3 V
0 V
3 V
0 V
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V1.5 V
50% V
CC
VOLTAGE WAVEFORMS
Figure 1. Load Circuit and Voltage Waveforms
t
PHL
50% V
CC
3 V
0 V
V
V
OH
OL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
CC
t
PZL
t
PZH
1.5 V1.5 V
t
PLZ
50% V
CC
t
PHZ
50% V
CC
VOLTAGE WAVEFORMS
VOL + 0.3 V
VOH – 0.3 V
3 V
0 V
[
V
V
[
V
OL
OH
0 V
CC
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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