TEXAS INSTRUMENTS SN54BCT25244, SN74BCT25244 Technical data

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SN54BCT25244, SN74BCT25244
25-Ω OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS064A – JUNE 1990 – REVISED NOVEMBER 1993
State-of-the-Art BiCMOS Design
CCZ
ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
Designed to Facilitate Incident-Wave
Switching for Line Impedances of 25 or Greater
Distributed V
and GND Pins Minimize
CC
Noise Generated by the Simultaneous Switching of Outputs
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
description
These 25-Ω octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.
These buffers are capable of sinking 188-mA IOL, which facilitates switching 25- transmission lines on the incident wave. The distributed V and GND pins minimize switching noise for more reliable system operation.
When the output-enable (1OE are low, the device transmits data from the A inputs to the Y outputs. When 1OE high, the outputs are in the high-impedance state.
and 2OE) inputs
and 2OE are
CC
SN54BCT25244 . . . JT OR W PACKAGE
SN74BCT25244 . . . DW OR NT PACKAGE
SN54BCT25244 . . . FK PACKAGE
1A3
V
CC
1A2
NC
1A1
1OE
1Y1
NC – No internal connection
(TOP VIEW)
1
24
1Y1
GND
GND
GND
GND
2 3
1Y2
4
1Y3
5 6
1Y4
7
2Y1
8 9
2Y2
10
2Y3
11 12
2Y4
(TOP VIEW)
1A4
2A1
2A2
3212827
426
5 6 7 8 9 10 11
12 13
14 15 16 17
1Y2
1Y3
GND
1OE
23
1A1
22
1A2
21
V
CC
20
1A3
19
1A4
18
2A1
17
2A2
16
V
CC
15
2A3
14
2A4
13
2OE
CC
NCV2A3
18
NC
1Y4
GND
2A4
25 24 23 22 21 20 19
2Y1
2OE 2Y4 GND NC 2Y3 2Y2 GND
The SN54BCT25244 is characterized for operation over the full military temperature range of –55°C to 125°C. The SN74BCT25244 is characterized for operation from 0°C to 70°C.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
FUNCTION TABLE
(each buffer/driver)
INPUTS
OE A
L H H L LL
H X Z
OUTPUT
Y
Copyright 1993, Texas Instruments Incorporated
2–1
SN54BCT25244, SN74BCT25244 25- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SCBS064A – JUNE 1990 – REVISED NOVEMBER 1993
24
23 22 20 19
13
18 17 15 14
EN
1
EN
1
logic symbol
1OE
1A1 1A2 1A3 1A4
2OE
2A1 2A2 2A3 2A4
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
10 12
logic diagram (positive logic)
1OE
1
1Y1
3
1Y2
4
1Y3
6
1Y4
7
2Y1
9
2Y2 2Y3 2Y4
2OE
24
23 1
1A1
22 3
1A2
20 4
1A3
19 6
1A4
13
18 7
2A1
17 9
2A2 2Y2
1Y1
1Y2
1Y3
1Y4
2Y1
Pin numbers shown are for the DW, JT, NT, and W packages.
15 10
2A3
14 12
2A4
2Y3
2Y4
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, VI (see Note 1) –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the disabled or power-off state, V Voltage range applied to any output in the high state, V Input clamp current, I
(V
< 0) –30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
IK
I
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
O
Current into any output in the low state, IO: SN54BCT25244 250 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74BCT25244 376 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range: SN54BCT25244 –55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74BCT25244 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–0.5 V to 5.5 V. . . . . . . . . . . . . . . .
–0.5 V to V
CC
2–2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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