The OP27 and OP37 operational amplifiers
combine outstanding noise performance with
excellent precision and high-speed specifications.
The wideband noise is only 3 nV/√Hz
1/f noise corner at 2.7 Hz, low noise is maintained
for all low-frequency applications.
The outstanding characteristics of the OP27 and
OP37 make these devices excellent choices
for low-noise amplifier applications requiring
precision performance and reliability . Additionally ,
the OP37 is free of latch-up in high-gain,
large-capacitive-feedback configurations.
The OP27 series is compensated for unity gain.
The OP37 series is decompensated for increased
bandwidth and slew rate and is stable down to a
gain of 5.
The OP27A, OP27C, OP37A, and OP37C are
characterized for operation over the full military
temperature range of –55°C to 125°C. The
OP27E, OP27G, OP37E, and OP37G are
characterized for operation from – 25°C to 85°C.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Lead temperature 1,6 mm (1/16 inch) from case for 60 seconds: JG or FK package 300°C. . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds : P package 260°C. . . . . . . . . . . . . . . . . . . .
NOTES: 1. All voltage values are with respect to the midpoint between V
2. The inputs are protected by back-to-back diodes. Current-limiting resistors are not used in order to achieve low noise. Excessive
input current will flow if a differential input voltage in excess of approximately ± 0.7 V is applied between the inputs unless some
limiting resistance is used.
4. Long-term drift of input offset voltage refers to the average trend line of offset voltage versus time over extended periods after the
first 30 days of operation. Excluding the initial hour of operation, changes in VIO during the first 30 days are typically 2.5 µV
(see Figure 3).
4. Long-term drift of input offset voltage refers to the average trend line of offset voltage versus time over extended periods after the
first 30 days of operation. Excluding the initial hour of operation, changes in VIO during the first 30 days are typically 2.5 µV
(see Figure 3).
The OP27 and OP37 series devices can be inserted directly onto OP07, OP05, µA725, and SE5534 sockets
with or without removing external compensation or nulling components. In addition, the OP27 and OP37 can
be fitted to µA741 sockets by removing or modifying external nulling components.
noise testing
Figure 34 shows a test circuit for 0.1-Hz to 10-Hz peak-to-peak noise measurement of the OP27 and OP37. The
frequency response of this noise tester indicates that the 0.1-Hz corner is defined by only one zero. Because
the time limit acts as an additional zero to eliminate noise contributions from the frequency band below 0.1 Hz,
the test time to measure 0.1-Hz to 10-Hz noise should not exceed 10 seconds.
Measuring the typical 80-nV peak-to-peak noise performance of the OP27 and OP37 requires the following
special test precautions:
1. The device should be warmed up for at least five minutes. As the operational amplifier warms up, the
offset voltage typically changes 4 µV due to the chip temperature increasing from 10°C to 20°C starting
from the moment the power supplies are turned on. In the 10-s measurement interval, these
temperature-induced effects can easily exceed tens of nanovolts.
2. For similar reasons, the device should be well shielded from air currents to eliminate the possibility of
thermoelectric effects in excess of a few nanovolts, which would invalidate the measurements.
3. Sudden motion in the vicinity of the device should be avoided, as it produces a feedthrough effect that
increases observed noise.
When measuring noise on a large number of units, a noise-voltage density test is recommended. A 10-Hz
noise-voltage density measurement correlates well with a 0.1-Hz to 10-Hz peak-to-peak noise reading since
both results are determined by the white noise and the location of the 1/f corner frequency.
Figure 35 shows a circuit measuring current noise and the formula for calculating current noise.
10kΩ
100 Ω500 kΩ
500 kΩ
–
+
V
no
In =
[V
no
2
– (130 nV)2]
1 MΩ × 100
1/2
Figure 35. Current Noise Test Circuit and Formula
offset voltage adjustment
The input offset voltage and temperature coefficient of the OP27 and OP37 are permanently trimmed to a low
level at wafer testing. However, if further adjustment of V
as shown in Figure 36 does not degrade the temperature coefficient α
creates an α
of VIO/300 µV/°C. For example, if VIO is adjusted to 300 µV, the change in α
VIO
The adjustment range with a 10-kΩ potentiometer is approximately ±2.5 mV. If a smaller adjustment range is
needed, the sensitivity and resolution of the nulling can be improved by using a smaller potentiometer in
conjunction with fixed resistors. The example in Figure 37 has an approximate null range of ±200 µV.
10 kΩ
15 V
1
2
8
Input
–
3
+
–15 V
7
6
Output
4
Figure 36. Standard Input Offset
Voltage Adjustment
is necessary , using a 10-kΩ nulling potentiometer
IO
Input
. Trimming to a value other than zero
VIO
VIO
4.7 kΩ
1 kΩ
15 V
4.7 kΩ
1
2
3
–15 V
8
7
6
Output
4
is 1 µV/°C.
Figure 37. Input Offset Voltage Adjustment With
Improved Sensitivity
offset voltage and drift
Unless proper care is exercised, thermoelectric effects caused by temperature gradients across dissimilar
metals at the contacts to the input terminals can exceed the inherent temperature coefficient ∝V
amplifier. Air currents should be minimized, package leads should be short, and the two input leads should be
close together and at the same temperature.
The circuit shown in Figure 38 measures offset voltage. This circuit can also be used as the burn-in configuration
for the OP27 and OP37 with the supply voltage increased to 20 V, R1 = R3 = 10 kΩ, R2 = 200 Ω, and
A
= 100.
VD
R1
50 kΩ
15 V
R2
100 Ω
R3
50 kΩ
2
3
–
+
–15 V
7
6
4
VO = 1000 V
IO
NOTE A: Resistors must have low thermoelectric potential.
Figure 38. Test Circuit for Offset Voltage and Offset Voltage
Temperature Coefficient
unity gain buffer applications
The resulting output waveform, when R
is shown in the pulsed-operation diagram in Figure 39.
R
f
–
+
OP27
During the initial (fast-feedthrough-like) portion of the output waveform, the input protection diodes effectively
short the output to the input, and a current, limited only by the output short-circuit protection, is drawn by the
signal generator. When R
≥ 500 Ω, the output is capable of handling the current requirements (load
f
current ≤ 20 mA at 10 V), the amplifier stays in its active mode, and a smooth transition occurs. When
R
> 2 kΩ, a pole is created with Rf and the amplifier’s input capacitance, creating additional phase shift and
f
reducing the phase margin. A small capacitor (20 pF to 50 pF) in parallel with R
≤ 100 Ω and the input is driven with a fast large-signal pulse (> 1 V),
NOTE A: If 24 channels are multiplexed per second and the output is required to settle to 0.1 % accuracy, the amplifier’s bandwidth cannot be
limited to less than 30 Hz. The peak-to-peak noise contribution of the OP27 will still be only 0.1 1 µV, which is equivalent to an error
of only 0.02°C.
To Gate
Drive
Typical
Multiplexing
FET Switches
Cold-Junction
Circuitry
+
–
AVD = 10,000
+
OP27
–
0.05 µF
High-Quality
Single-Point Ground
Output
100 kΩ
10 Ω
Figure 40. Low-Noise, Multiplexed Thermocouple Amplifier and 0.1-Hz To 10-Hz
Peak-to-Peak Noise Voltage
2–20
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251–1443
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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In order to minimize risks associated with the customer’s applications, adequate design and operating
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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