Texas Instruments CD74ACT86M96, CD74ACT86M, CD74ACT86E, CD74AC86M, CD74AC86E Datasheet

...
1
Data sheet acquired from Harris Semiconductor SCHS232A
Features
• Buffered Inputs
• Typical Propagation Delay
- 3.2ns at V
CC
= 5V, TA = 25oC, CL = 50pF
• Exceeds 2kV ESD Protection MIL-STD-883, Method 3015
• SCR-Latchup-Resistant CMOS Process and Circuit Design
• Speed of Bipolar FAST™/AS/S with Significantly Reduced Power Consumption
• Balanced Propagation Delays
• AC Types Feature 1.5V to 5.5V Operation and Balanced Noise Immunity at 30% of the Supply
±24mA Output Drive Current
- Fanout to 15 FAST™ ICs
- Drives 50 Transmission Lines
Description
The CD74AC86 and ’ACT86 are quad 2-input Exclusive-OR gates that utilize Advanced CMOS Logic technology
Pinout
CD54ACT86
(CERDIP)
CD74AC86, CD74ACT86
(PDIP, SOIC)
TOP VIEW
Functional Diagram
Ordering Information
PART
NUMBER TEMP. RANGE (oC) PACKAGE
CD74AC86E 0 to 70oC, -40 to 85,
-55 to 125
14 Ld PDIP
CD74AC86M 0 to 70oC, -40 to 85,
-55 to 125
14 Ld SOIC
CD54ACT86F3A -55 to 125 14 Ld CERDIP CD74ACT86E 0 to 70oC, -40 to 85,
-55 to 125
14 Ld PDIP
CD74ACT86M 0 to 70oC, -40 to 85,
-55 to 125
14 Ld SOIC
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to obtain the variant in the tape and reel.
2. Waf erand die for this partnumber is available which meets all electrical specifications. Please contact your local TI sales office or customer service for ordering information.
1A 1B 1Y 2A 2B 2Y
GND
V
CC
4B 4A 4Y 3B 3A 3Y
1 2 3 4 5 6 7
14 13 12 11 10
9 8
TRUTH TABLE
INPUTS OUTPUT
nA nB nY
LLL HHL HLH LHH
1A
1B
2A
2B
2Y
GND
1
2
3
4
5
6
14
13
12
11
V
CC
4Y
3Y
3B
4A
4B
10
8
7
9
3A
1Y
September 1998 - Revised May 2000
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. FAST™ is a Trademark of Fairchild Semiconductor.
Copyright
© 2000, Texas Instruments Incorporated
CD74AC86,
CD54/74ACT86
Quad 2-Input Exclusive-OR Gate
[ /Title (CD74 AC86, CD74 ACT86 ) /
Sub-
j
ect (Quad 2-Input Exclu­sive­OR Gate) /
Autho r () /
Key­words (Har­ris Semi­con­ductor, Advan ced CMOS ,Harris Semi­con­ductor, Advan ced TTL) /
Cre­ator () /
DOCI NFO pdf-
2
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 6V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±50mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±50mA
DC VCC or Ground Current, I
CC orIGND
(Note 3) . . . . . . . . .±100mA
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC (Note 4). . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
CC
Input Rise and Fall Slew Rate, dt/dv
4.5V to 5.5V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10ns (Max)
Thermal Resistance (Typical, Note 5) θJA (oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175
Maximum Junction Temperature (Plastic Package) . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
3. For up to 4 outputs per device, add ±25mA for each additional output.
4. Unless otherwise specified, all voltages are referenced to ground.
5. θJA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
PARAMETER SYMBOL
TEST
CONDITIONS
V
CC
(V)
25
o
C
-40oC TO 85oC
-55oC TO 125oC
UNITSV
I
(V) IO(mA) MIN MAX MIN MAX MIN MAX
AC TYPES
High Level Input Voltage V
IH
- - 1.5 1.2 - 1.2 - 1.2 - V 3 2.1 - 2.1 - 2.1 - V
5.5 3.85 - 3.85 - 3.85 - V
Low Level Input Voltage V
IL
- - 1.5 - 0.3 - 0.3 - 0.3 V 3 - 0.9 - 0.9 - 0.9 V
5.5 - 1.65 - 1.65 - 1.65 V
High Level Output Voltage V
OH
VIH or V
IL
-0.05 1.5 1.4 - 1.4 - 1.4 - V
-0.05 3 2.9 - 2.9 - 2.9 - V
-0.05 4.5 4.4 - 4.4 - 4.4 - V
-4 3 2.58 - 2.48 - 2.4 - V
-24 4.5 3.94 - 3.8 - 3.7 - V
-75
(Note 6, 7)
5.5 - - 3.85 - - - V
-50
(Note 6, 7)
5.5----3.85 - V
Low Level Output Voltage V
OL
VIH or V
IL
0.05 1.5 - 0.1 - 0.1 - 0.1 V
0.05 3 - 0.1 - 0.1 - 0.1 V
0.05 4.5 - 0.1 - 0.1 - 0.1 V 12 3 - 0.36 - 0.44 - 0.5 V 24 4.5 - 0.36 - 0.44 - 0.5 V 75
(Note 6, 7)
5.5 - - - 1.65 - - V
50
(Note 6, 7)
5.5-----1.65 V
CD74AC86, CD54/74ACT86
3
Input Leakage Current I
I
VCC or
GND
- 5.5 - ±0.1 - ±1-±1 µA
Quiescent Supply Current, FF
I
CC
VCC or
GND
0 5.5 - 4 - 40 - 80 µA
ACT TYPES
High Level Input Voltage V
IH
- - 4.5 to
5.5
2-2-2-V
Low Level Input Voltage V
IL
- - 4.5 to
5.5
- 0.8 - 0.8 - 0.8 V
High Level Output Voltage V
OH
VIH or V
IL
-0.05 4.5 4.4 - 4.4 - 4.4 - V
-24 4.5 3.94 - 3.8 - 3.7 - V
-75
(Note 6, 7)
5.5 - - 3.85 - - - V
-50
(Note 6, 7)
5.5----3.85 - V
Low Level Output Voltage V
OL
VIH or V
IL
0.05 4.5 - 0.1 - 0.1 - 0.1 V 24 4.5 - 0.36 - 0.44 - 0.5 V 75
(Note 6, 7)
5.5 - - - 1.65 - - V
50
(Note 6, 7)
5.5-----1.65 V
Input Leakage Current I
I
VCC or
GND
- 5.5 - ±0.1 - ±1-±1 µA
Quiescent Supply Current, FF
I
CC
VCC or
GND
0 5.5 - 4 - 40 - 80 µA
AdditionalSupply Current per Input Pin TTL Inputs High 1 Unit Load
I
CC
V
CC
-2.1
- 4.5 to
5.5
- 2.4 - 2.8 - 3 mA
NOTES:
6. Test one output at a time for a 1-second maximum duration. Measurement is made by forcing current and measuring voltage to minimize power dissipation.
7. Test verifies a minimum 50 transmission-line-drive capability at 85
o
C, 75 at 125oC.
ACT Input Load Table
INPUT UNIT LOAD
All 0.48
NOTE: Unit load is ∆ICClimit specified in DC Electrical Specifications Table, e.g., 2.4mA max at 25oC.
DC Electrical Specifications (Continued)
PARAMETER SYMBOL
TEST
CONDITIONS
V
CC
(V)
25
o
C
-40oC TO 85oC
-55oC TO 125oC
UNITSV
I
(V) IO(mA) MIN MAX MIN MAX MIN MAX
Switching Specifications Input t
r
, tf = 3ns, CL= 50pF (Worst Case)
PARAMETER SYMBOL V
CC
(V)
-40oC TO 85oC -55oC TO 125oC UNITSMIN TYP MAX MIN TYP MAX
AC TYPES
Propagation Delay, Input to Output
t
PHL
, t
PLH
1.5 - - 123 - - 135 ns
3.3
(Note 9)
3.9 - 13.7 3.8 - 15.1 ns
5
(Note 10)
2.8 - 9.8 2.7 - 10.8 ns
CD74AC86, CD54/74ACT86
4
Input Capacitance C
I
- - -10- -10pF
Power Dissipation Capacitance C
PD
(Note 11)
- - 57 - - 57 - pF
ACT TYPES
Propagation Delay, Input to Output
t
PHL
, t
PLH
5
(Note 10)
3.8 - 13.3 3.7 - 14.6 ns
Input Capacitance C
I
- - -10- -10pF
Power Dissipation Capacitance C
PD
(Note 11)
- - 57 - - 57 - pF
NOTES:
8. Limits tested at 100%.
9. 3.3V Min at 3.6V, Max at 3V.
10. 5V Min at 5.5V, Max at 4.5V.
11. CPD is used to determine the dynamic power consumption per gate. AC: PD = V
CC
2
fi(CPD + CL)
ACT: PD = V
CC
2
fi(CPD + CL) + VCC∆ICC where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
Switching Specifications Input t
r
, tf = 3ns, CL= 50pF (Worst Case) (Continued)
PARAMETER SYMBOL VCC (V)
-40oC TO 85oC -55oC TO 125oC UNITSMIN TYP MAX MIN TYP MAX
FIGURE 1.
90%
t
r
= 3ns
nA OR nB
t
PLH
OUTPUT nY
t
f
= 3ns
V
S
10%
t
PHL
V
S
DUT
OUTPUT
R
L
(NOTE)
OUTPUT
LOAD
500
C
L
50pF
NOTE: For AC Series Only: When VCC = 1.5V, RL = 1kΩ.
FIGURE 2. PROPAGATION DELAY TIMES
AC ACT
Input Level V
CC
3V
Input Switching Voltage, V
S
0.5 V
CC
1.5V
Output Switching Voltage, V
S
0.5 V
CC
0.5 V
CC
CD74AC86, CD54/74ACT86
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
Loading...