Unauthorized duplication of Teledyne LeCroy documentation materials other than for internal sales and
distribution purposes is strictly prohibited. However, clients are encouraged to distribute and duplicate
Teledyne LeCroy documentation for their own internal educational purposes.
WavePro, WaveRunner, and Teledyne LeCroy are registered trademarks of Teledyne LeCroy, Inc. Windows is a
registered trademark of Microsoft Corporation. Other product or brand names are trademarks or requested
trademarks of their respective holders. Information in this publication supersedes all earlier versions.
Specifications are subject to change without notice.
Warranty
Teledyne LeCroy warrants this oscilloscope accessory for normal use and operation within specification for a
period of one year from the date of shipment. Spare parts, replacement parts and repairs are warranted for 90
days.
In exercising its warranty, Teledyne LeCroy, at its option, will either repair or replace any assembly returned
within its warranty period to the Customer Service Department or an authorized service center. However, this
will be done only if the product is determined by Teledyne LeCroy’s examination to be defective due to
workmanship or materials, and the defect is not caused by misuse, neglect, accident, abnormal conditions of
operation, or damage resulting from attempted repair or modifications by a non-authorized service facility.
The customer will be responsible for the transportation and insurance charges for the return of products to
the service facility. Teledyne LeCroy will return all products under warranty with transportation charges
prepaid.
This warranty replaces all other warranties, expressed or implied, including but not limited to any implied
warranty of merchantability, fitness or adequacy for any particular purposes or use. Teledyne LeCroy shall not
be liable for any special, incidental, or consequential damages, whether in contract or otherwise.
Appendix A ........................................................................................................... 37
Performance Verification Test Record .................................................................... 37
ii 922251-00 RevA
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Operator’s Manual
WARNING. High Voltage, risk of electric shock.
CAUTION. Potential for damage to probe or instrument it is connected to. Attend to the
accompanying information to protect against personal injury or damage. Do not proceed until
conditions are fully understood and met.
ELECTROSTATIC DISCHARGE (ESD) HAZARD. The probe is susceptible to damage if anti-static
measures are not taken.
DOUBLE INSULATION
PROTECTIVE (EARTH) TERMINAL
Safety Instructions
This section contains instructions that must be observed to keep this oscilloscope accessory
operating in a correct and safe condition. You are required to follow generally accepted safety
procedures in addition to the precautions specified in this section. The overall safety of any system
incorporating this accessory is the responsibility of the assembler of the system.
Symbols
These symbols may appear on the probe body or in this manual to alert you to important safety
considerations.
Precautions
To avoid personal injury or damage to probe or the instrument it is connected to, review and comply
with the following safety precautions.
Use product only as specified.
Connect and disconnect properly. Connect probe to the measurement instrument before
connecting the test leads to a circuit/signal being tested.
Use only accessories compatible with the probe. Use only accessories that are rated for the
application. Ensure connections between probe input leads and probe accessories are secure
before connecting them to a voltage source.
Comply with voltage derating curve. When measuring higher frequency signals, comply with the
Input Voltage vs. Frequency Curve (see Figure 1).
922251-00 Rev A 1
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HFP1000 High Frequency Probe
Do not overload. To avoid electric shock or damage to probe or instrument it is connected to, do
not apply any potential that exceeds the maximum rating of the probe and/or the probe accessory,
whichever is less. Observe all terminal ratings of the instrument before connecting the probe.
Be careful not to damage the insulation surface when making measurements.
Use only within operational environment listed. Do not use in wet or explosive atmospheres. Keep
product surfaces clean and dry. Use indoors only.
Handle with care. Probe accessory tips are sharp. They can puncture skin or cause other bodily
injury if not handled properly.
Keep fingers behind the finger guard of the probe accessories.
Do not operate with suspected failures. Before each use, inspect the probe and accessories for any
damage such as tears or other defects in the probe body, cable jacket, accessories, etc. If any part is
damaged, cease operation immediately and sequester the probe from inadvertent use.
Operating Environment
The accessory is intended for indoor use and should be operated in a clean, dry environment. Before
using this product, ensure that its operating environment is maintained within these parameters:
Temperature: 0° to 50° C.
Humidity: ≤ 80% max up to 31 °C, decreasing linearly to 45% max at 50 °C
Altitude: up to 2000 m (6562 feet)
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Operator’s Manual
Introduction
The 1 GHz HFP1000 is a small, high frequency active probe designed to meet today’s increasing
demand for measurements on a variety of test points. With low input capacitance and high input
resistance, circuit loading is minimized.
The HFP1000 can be used with Teledyne LeCroy’s WavePro™, Waverunner™ and LC series
oscilloscopes with firmware version 8.7.0 or higher.
When the probe is used with any of these oscilloscopes, an AutoColor ID feature automatically
illuminates the probe head in the default trace color of the channel to which the probe is connected,
eliminating the need for color bands or other markers.
With the ProBus interface, the HFP1000 becomes an integral part of the oscilloscope. The probe can
be controlled from the oscilloscope’s front panel. The oscilloscope provides power to the probe, so
there is no need for a separate power supply or batteries.
When used in combination with an ADPPS power supply, the HFP1000 probe can be used with nonTeledyne LeCroy instruments. (See Page 16 for detailed operation with an ADPPS adapter).
NOTE: The AutoColor ID feature will be disabled when the probe is used with an ADPPSadapter or a
Teledyne LeCroy LC series oscilloscope with firmware version lower than 8.7.0
Key Benefits
• High frequency performance
• Low input capacitance
• Wide dynamic range
• ProBus interface
• AutoColor ID feature matches the probe color to the oscilloscope’s default trace color
• Five interchangeable tips for probing a variety of test points (two standard, three optional
accessories)
• Replaceable probe tip socket
• Hands free probing with optional FreeHand Probe Holder
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Page 10
HFP1000 High Frequency Probe
Standard Accessories
The HFP1000 probe is shipped with the following standard accessories:
Item: Quantity:
Straight Tip 4
Sharp Tip 4
Clip, 0.8 mm 2
Square Pin Ground Spring 1
Short Right Angle Lead 1
Long Right Angle Lead 1
Replaceable Cartridge 1
Leaf Pogo Ground Assembly 1
Pogo Ground Lead 1
Pivot Ground Lead 1
Instruction Manual 1
Certificate of Calibration 1
Optional Accessories
The following items are available as optional accessories for the HFP1000 probe:
IC Lead Tip
SMD Discrete Tip
Bent Sharp Tip
Micro Clip
Ground Spring with Hook
FreeHand Probe Holder
High Frequency Cartridge
Soft Accessory Case
For part numbers of standard and optional accessories refer to page 18, Replaceable Parts List.
4 922251-00 RevA
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Operator’s Manual
Specifications
Nominal Characteristics
Nominal characteristics describe parameters and attributes that are guaranteed by design, but
donot have associated tolerances.
Input Dynamic range ±8 V
Maximum Input Voltage 1 40 V pk
Intended Output Load 50 Ω
Attenuation ÷10
Output Connector ProBus
Interface ProBus
Oscilloscope Full Compatibility Teledyne LeCroy WaveRunner and WavePro
oscilloscopes, and LC series oscilloscopes
with firmware version 8.7.0 or higher.
1
Subject to input voltage vs. frequency derating. See Figure 1.
Warranted Characteristics
Warranted characteristics are parameters with guaranteed performance. Unless otherwise noted,
tests are provided in the Performance Verification Procedure for all warranted specifications.
Low Frequency ±1% plus uncertainty of 50 Ω termination
Attenuation Accuracy
Output Zero ≤ 8 mV, referred to the input
Typical Characteristics
Typical characteristics are parameters with no guaranteed performance. Tests for typical
characteristics are not provided in the Performance Verification Procedure.
Output Zero ≤ 4 mV, referred to the input
Bandwidth (Probe only) 1.5 GHz
Input Capacitance 0.7 pF
DC Input Resistance 100 kΩ
922251-00 Rev A 5
Page 12
HFP1000 High Frequency Probe
Environmental Characteristics
Operating temperature 0 °C to 50 °C
Storage temperature -40 °C to 71 °C
Relative Humidity 80% max up to 31 °C,
Altitude up to 2000 m
Physical Characteristics
Probe Head Size:
Length 61 mm (2.4 in)
Width 7.3 mm (0.29 in)
Height 13.1 mm (0.52 in)
Cable Length 1.3 m (51.1 in)
Weight:
decreasing linearly to 45% max
at 50 °C
Probe only 100 g (3.5 oz.)
Shipping 0.85 kg (1.87 labs)
Input Sockets Signal and ground sockets are compatible
with 0.635 mm (0.025 in) square pins, and
0.91 mm (0.036 in) maximum diameter
round pins
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Operator’s Manual
Figure 1 Input Voltage vs. Frequency
922251-00 Rev A 7
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HFP1000 High Frequency Probe
The small, low mass probe head is designed for ease of use and
high performance.
The probe tip socket fits easily onto 0.025 inch square pins for
direct access to test points. Several different adapters are
available which connect directly in the probe socket.
The probe tip socket has a removable tip cartridge for easy
replacement in case the probe socket gets damaged.
The ground socket will accept several different ground leads to
provide a short ground path for high frequency performance.
The AutoColor ID consists of an LED inside the probe head which
illuminates the probe body in the default trace color of the
channel to which the probe is connected.
The AutoColor ID will only function when the probe is connected
to a Teledyne LeCroy oscilloscope supplied with the ProBus
interface and firmware version 8.7.0 or higher. The colors are
correct when factory default color scheme 1 is selected.
Features and Accessories
The HFP1000 probe is provided with numerous features and accessories to make probing and
connecting to different test points easier than ever.
Features
Probe Head
AutoColor ID
8 922251-00 Rev A
Page 15
Accessory Descriptions
The following Tip and Clip accessories can be pushed into the
probe tip socket, ground socket or any other socketed lead or
adapter.
STRAIGHT TIP
The straight tip is rugged and designed for general probing. Fits
in either probe socket.
PACC-PT001, package of 4.
SHARP TIP
Rugged, titanium tip designed to connect to the smallest vias and
small test points. Fits in either probe socket.
PACC-PT002, package of 4.
ICLEAD TIP
Covered in insulation on all sides (except for a small edge), this
tip was designed to prevent shorting neighboring IC leads. The
gold part of the tip is not insulated and should touch the IC lead
to be tested. It is one-size-fits- all and will work with any IC lead
pitch. Fits in either probe socket.
The IC Lead Tip is an optional accessory for the HFP1000.
PACC-PT003, package of 4.
Tips
Operator’s Manual
922251-00 Rev A 9
Page 16
HFP1000 High Frequency Probe
SMDDISCRETE TIP
The crescent shape of this tip is designed to fit tightly on capacitors,
resistors, transistors and other surface mount components with
discrete leads. Fits in either probe socket.
The SMD Discrete Tip is an optional accessory for the HFP1000.
PACC-PT004, package of 4.
BENT SHARP TIP
Made out of titanium, this tip is ideal for situations that require the
user to hold the probe parallel to the circuit board under test. Also
gives the user more control when holding the probe like a pencil.
Fits in either probe socket.
The Bent Sharp Tip is an optional accessory for the HFP1000.
PACC-PT005, package of 4.
MICRO CLIP (0.5 MM)
A pincher like tip designed to hold onto fine pitch leads and small
components, commonly found in SMD ICs. Fits in either probe
socket, or can be used with a lead.
The Micro Clip is an optional accessory for the HFP1000.
PACC-CL001, package of 4.
Tips, continued
Clips
10 922251-00 Rev A
Page 17
Clips, continued
CLIP (0.8 MM)
A pincher like tip designed to hold onto larger wires and
components than possible with the Micro Clip, including throughhole mounted components.
This clip cannot be connected directly into either of the probe
head sockets; it must be connected to a lead.
PK006-4, package of 2.
GROUND SPRING WITH HOOK
A flexible spring connected to a square pin that fits into either of
the probe head sockets. Designed to be used as a ground lead,
there is a hook on the end of the spring so that it can probe
general circuits.
The Ground Spring with Hook is an optional accessory for the
HFP1000.
PACC-LD001, package of 4.
SQUARE PIN GROUND SPRING
A flexible spring connected to a square pin that fits into either of
the probe sockets. Designed to be attached to a square pin on the
circuit under test.
PACC-LD002, package of 4.
Operator’s Manual
922251-00 Rev A 11
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HFP1000 High Frequency Probe
OFFSET PIN
The offset pin is designed to be attached to either socket of the
probe head. The offset pin is the highest quality grounding
solution and is recommended in high frequency applications.
405400003, package of 1.
SHORT AND LONG RIGHT ANGLE LEAD
This lead has a socket on one end and a bent square pin on the
other to connect to the input or ground socket of the probe body,
and may be used for general purpose probing.
PACC-LD003 (short), PACC LD004 (long), packages of 4.
SHORT SINGLE LEAD
This lead can be used for either ground or input lead.
It has a socket on one end and a square pin on the other and may
be used for general purpose probing.
PACC-LD005 (short), package of 4.
Clips, continued
Leads
While longer leads provide greater flexibility when connecting the probe to a circuit, the added
inductance may degrade the fidelity of high frequency signals.
12 922251-00 RevA
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Probe Holder
The FreeHand Probe Holder lets you focus on the oscilloscope
screen instead of on maintaining contact to multiple test points.
It allows the user to concentrate on what is really important –
the waveform.
It is designed to keep most of the weight on the probe tip and
will prevent lost contact when a bump to the table shakes the
circuit under test.
Additionally, the HFP probe can be mounted horizontally or
vertically in the FreeHand, giving added measurement flexibility.
The FreeHand probe holder is an optional accessory for the
HFP1000.
PACC-MS001, package of 1.
To use the FreeHand probe holder
1. Slide the probe cable through the slot on the bottom of the
translucent holder section.
2. Slide probe backwards in the probe holder.
Operator’s Manual
922251-00 Rev A 13
Page 20
HFP1000 High Frequency Probe
Replaceable Socket Cartridge
If the input tip socket gets damaged, you don’t have to
replace the entire probe, because the HFP series active
probe has a removable tip socket cartridge.
PACC-MS002, package of 1.
High Frequency Cartridge
By having a fixed tip rather than a socket, the High Frequency cartridge is able to increase signal
fidelity at higher frequencies.
The High Frequency Cartridge is an optional accessory for the HFP1000.
PACC-MS003, package of 1.
Removal and Installation of the Replaceable Cartridge
To remove old cartridge:
1. Slide the cable strain relief over the cable away from
the probe body.
2. To release the latch, lift the part closest to the strain
relief away from the probe body and slide the
cartridge toward the strain relief.
To install a new cartridge:
1. Slide the new cartridge onto the probe body until the
latch engages.
2. Slide the cable strain relief forward to cover the back
end of the probe body.
Cartridges
NOTE: The cable strain relief is polarized and fits over the probe body in one direction only.
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Operator’s Manual
Operation
Handling the Probe
Exercise care when handling and storing the probe. Always handle the probe by the probe body or
compensation box. Avoid putting excessive strain or exposing the probe cable to sharp bends.
Connecting the Probe to the Test Instrument
The HFP1000 probe has been designed for use with Teledyne LeCroy’s WavePro™, Waverunner™
and LC oscilloscopes equipped with the ProBus interface. When you attach the probe output
connector to the oscilloscope’s input connector, the oscilloscope will recognize the probe, provide
proper termination and activate the probe control functions in the user interface.
Connecting the Probe to the Test Circuit
To maintain the high performance capability of the probe in measurement applications, care must
be exercised in connecting the probe to the test circuit. Increasing the parasitic capacitance or
inductance in the input paths may introduce a “ring” or slow the rise time of fast signals. Input leads
which form a large loop area will pick up any radiated electromagnetic field which passes through
the loop and may induce noise into the probe input.
Using one of the available accessories makes the HFP1000 probe with its small profile and low mass
head ideally suited for applications in dense circuitry.
Operation with a Teledyne LeCroy Oscilloscope
When the HFP1000 probe is connected to any Teledyne LeCroy oscilloscope, the displayed scale
factor and measurement values will be automatically adjusted. Control through the oscilloscope’s interface can be found in the ’Coupling’ menu of the channel to which the probe is connected.
Turning the Volts/Div knob will control the oscilloscope’s scale factor to give full available dynamic
range up to 2 V/div.
922251-00 Rev A 15
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HFP1000 High Frequency Probe
Use with Non-Teledyne LeCroy Instruments
The HFP1000 can be used with other instruments with the optional ADPPS power supply. The output
of the ADPPS must be terminated into 50 Ω. The AutoColor ID feature will be disabled when the
probe is used with an ADPPS adapter.
Use with Older Teledyne LeCroy Instruments
When used with Teledyne LeCroy instruments with software version lower than 8.7.0, the
oscilloscope will provide the correct scale factor but no AutoColor ID. With V/div settings greater
than 2 V/div, it is possible to display clipped waveforms on screen.
Care and Maintenance
Cleaning
The exterior of the probe and cable should be cleaned only using a soft cloth lightly moistened with
water or isopropyl alcohol. The use of abrasive agents, strong detergents, or other solvents may
damage the probe. Always ensure that the input leads are free of debris.
The probe case is not sealed and should never be immersed in any fluid.
Calibration Interval
The recommended calibration interval is one year. (Performance Verification and Adjustment
Procedures are included in this manual.)
Service Strategy
The HFP1000 probe utilizes fine pitch surface mount devices. It is therefore impractical to attempt
to repair in the field. Defective probes must be returned to a Teledyne LeCroy service facility for
diagnosis and exchange. A defective probe under warranty will be replaced with a factory
refurbished probe.
A probe that is not under warranty can be exchanged for a factory refurbished probe for a modest
fee. You must return the defective probe in order to receive credit for the probe core.
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Operator’s Manual
Returning a Defective Probe
Contact your local Teledyne Lecroy sales representative to find out where to return the product. All
returned products should be identified by model number and serial number. Provide your name and
contact number and if possible describe the defect or failure. In case of products returned to the
factory, a Return Authorization Number (RAN) must be used. Contact your nearest Teledyne Lecroy
office, or the New York Customer Care Center, to receive a RAN.
Return shipment should be prepaid. Teledyne Lecroy cannot accept COD or Collect Return
shipments. We recommend air-freighting.
1. Contact your local Teledyne Lecroy sales or service representative to obtain a Return
Authorization Number.
2. Remove all accessories from the probe. Do not include the manual.
3. Pack the probe in its case, surrounded by the original packing material (or equivalent) and
box it.
4. Label the case with a tag containing:
• The RAN
• Name and address of the owner
• Probe model and serial number
• Description of failure
5. Package the probe case in a cardboard shipping box with adequate padding to avoid
damage in transit.
6. Mark the outside of the box with the shipping address given to you by the Teledyne Lecroy
representative; be sure to add the following:
• ATTN: <RAN assigned by the Teledyne Lecroy representative>
• FRAGILE
7. Insure the item for the replacement cost of the probe.
8. If returning a probe to a different country, also:
Mark shipments returned for service as a “Return of US manufactured goods for
warranty repair/recalibration.”
If there is a cost involved in the service, put the service cost in the value column and
the replacement value in the body of the invoice marked “For insurance purposes only.”
Be very specific as to the reason for shipment. Duties may have to be paid on the
value of the service.
922251-00 Rev A 17
Page 24
HFP1000 High Frequency Probe
Item
Teledyne LeCroy P/N
Replacement QTY
Straight Tip
PACC-PT001
4
Sharp Tip
PACC-PT002
4
IC Lead Tip
PACC-PT003
4
SMD Discrete Tip
PACC-PT004
4
Bent Sharp Tip
PACC-PT005
4
Micro Clip
PACC-CL001
4
Clip
PK006-4
2
Ground Spring with Hook
PACC-LD001
4
Square Pin Ground Spring
PACC-LD002
4
Offset Pin
405400003
1
Short Right Angle Lead
PACC-LD003
4
Long Right Angle Lead
PACC-LD004
4
Short Single Lead
PACC-LD005
4
FreeHand Probe Holder
PACC-MS001
1
Replaceable Cartridge
PACC-MS002
1
Low C Cartridge
PACC-MS003
1
Soft Accessory case
SAC-01A
1
Instruction Manual
922251-00
1
Replacement Parts
The probe connection accessories and other common parts can be ordered through the regional
customer care centers. Refer to list below for Teledyne LeCroy part numbers. Defective probes can
be replaced on an exchange basis. The replacement exchange probe will have been factory repaired,
inspected and calibrated to the same standards as a new product. In order to obtain an exchange
probe, you must return the defective probe. The returned probe should be sent back to the regional
customer care center without any accessories, manual or case.
Table 1 Replaceable Parts List
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Operator’s Manual
High Frequency Measurements
Input Loading
When you touch a probe to the circuit under test, the probe will affect your measurement because
of the probe’s input impedance introduced into the circuit. All probes present resistive, capacitive
and inductive loading.
Inductive Loading (Lead Length)
A significant element in this circuit is the inductance shown in the input ground leads of the
oscilloscope probe.
Figure 2 Probe Input Equivalent Circuit
The ground lead is the primary return path for the current resulting from the input voltage acting on
the probe’s input impedance. The ground lead and input lead inductances act with the probe’s input
capacitance to form series L-C network. The impedance of a series LC network will drop dramatically
at its resonant frequency. This is the cause of the "ring" we often see after the leading edge of
pulses in measured waveforms. This effect is referred to as ground lead corruption. Because it is
impossible to eliminate either the L or C from this circuit, the method to improve waveform fidelity
is to raise the resonant frequency beyond the bandwidth of interest in the measurement.
The resonant frequency of a simple LC circuit can be represented by:
The resonant frequency of a series LC circuit can be raised by decreasing the inductance,
capacitance or both.
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HFP1000 High Frequency Probe
Since the input capacitance is already very low and cannot be reduced, you can only try to reduce
the inductance. This can be accomplished by using the shortest possible input lead as well as the
shortest possible ground lead.
For example, to obtain the shortest possible ground lead when measuring IC related signals, attach a
small piece of copper clad material to the top of the IC package and connect this to the package
grounding wires. Using the shortest ground lead and input lead available makes probing signals on
the package easier and makes for the shortest lead length for the best signal fidelity.
To illustrate how dramatic this effect is, we will work a simple example.
Assuming an input capacitance of 0.7 pF and a total lead length (input and ground) of 2 inches
(inductance of ≈ 25 nH/inch) such a setup may cause ringing with a resonant frequency (f0) of:
This frequency is well within the passband of the probe and will therefore show up as part of the
measured signal at faster time/div settings.
To determine how fast a waveform to be measured can be without causing ringing on a probe
like,this divide the BW (ringing frequency) of the probe into 0.35:
Any input signal with a rise time faster than 0.4 ns can cause ringing.
Capacitive Loading
Capacitive loading is usually the most troublesome of the three loading effects.
It can affect the rise time, bandwidth and delay time measurements.
At higher frequencies the capacitive loading can affect the amplitude as well as the waveshape of
the measured signal by introducing an exponential response to the waveform.
For a simple RC network the time constant of this exponential response is:
where Ctotal is the combined probe and circuit capacitance and Rtotal is combined circuit and probe
resistance.
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Operator’s Manual
For a setup where Ct = 0.7 pF and a source resistance is 250 Ω, the measured rise time will be 0.385
ns, which will correspond to a bandwidth of 909 MHz, assuming no inductive loads.
(trise=2.2 x 0.7 X 10-12 x 250 Ω = 0.385 ns)
(parallel combination of 250 Ω and 100 kΩ is still 250 Ω)
Figure 3 Probe input equivalent circuit
To illustrate the effect of capacitive loading at higher frequencies:
At a frequency of 851 MHz the reactance of the 0.7 pF capacitance is 267 Ω, and at 1.0 GHz the
reactance has been lowered to 227 Ω
If, at a given frequency, the source impedance is large with respect to the input impedance, a
measurable reduction in the output signal amplitude may occur.
where: Zprobe is the probe’s input impedance and Zsource is the source impedance
As an example:
At 851 MHz, where the probe input impedance has reduced to 267 Ω, and a source resistance of
250 Ω the probe output amplitude is reduced to:
922251-00 Rev A 21
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HFP1000 High Frequency Probe
Performance Verification
This procedure can be used to verify the warranted characteristics of the HFP1000 High Frequency
Probe.
The recommended calibration interval for the model HFP1000 is one year. The complete
performance verification procedure should be performed as the first step of annual calibration.
Performance verification can be completed without removing the probe covers or exposing the user
to hazardous voltages.
Test results can be recorded on a photocopy of the Test Record provided in Appendix A at the end of
the manual. Adjustment should only be attempted if a parameter measured in the Performance
Verification Procedure is outside the specification limits.
NOTE: Adjustment should only be performed by qualified personnel.
This procedure tests the following specifications:
• Output Zero Voltage
• LF Attenuation Accuracy
Test Equipment Required
Table 2 List of Required Equipment lists the test equipment and accessories (or their equivalents)
that are required for performance verification of the HFP1000 Probe.
This procedure has been developed to minimize the number of calibrated test instruments required.
Only the parameters listed in boldface in the "Minimum requirements" column must be calibrated
to the accuracy indicated.
Because the input and output connectors types may vary on different brands and models of test
instruments, additional adapters or cables may be required.
22 922251-00 RevA
Page 29
Table 2 List of Required Equipment
Description
Minimum Requirements
Example Test Equipment
Digital Oscilloscope
ProBus interface
Teledyne LeCroy WavePro960
Teledyne LeCroy LT344
Digital Multimeter (DMM)
with test probe leads
4.5 digit
DC: 0.1% Accuracy
AC: 0.1% Accuracy
Agilent Technologies 34401A
Fluke 8842A-09
Function Generator
Sine Wave output amplitude
adjustable to 14.14 Vp-p (5
Vrms) into 1 MΩ at 70 Hz
Agilent Technologies 33120A
Stanford Research Model DS340
BNC Coaxial Cable (2 ea.)
Male to Male, 50 Ω, 36" Cable
Pomona 2249-C-36
Pomona 5697-36
BNC Tee Connector
Male to Dual Female
Pomona 3285
Calibration Fixture
ProBus Extender Cable
Teledyne LeCroy PROBUS-CF01
Terminator, Precision, BNC
50 Ω ± 0.05%
Teledyne LeCroy TERM-CF01
Banana Plug Adapter (2 ea.)
Female BNC to Dual Banana
Plug
Pomona 1269
BNC to Mini-grabber
BNC Male to Mini-grabber
Cable, 36"
Pomona 5187-C-36
Operator’s Manual
Preliminary Procedure
1. Connect the HFP1000 probe to the female end of the ProBus Extension Cable. Connect
themale end of the ProBus Extension Cable to channel 1 of the oscilloscope.
2. Turn the oscilloscope on and allow at least 30 minutes warm-up time for theHFP1000 and
testequipment before performing the Verification Procedure.
3. Turn on the other test equipment and allow these to warm up for the timerecommended by
the manufacturer.
4. While the instruments are reaching operating temperature, make a photocopy ofthe
PerformanceVerification Test Record (located in Appendix A), and fill in the necessary data.
5. Select the channel to which the probe is connected. Set the oscilloscope scalefactor to
20mV/div.
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HFP1000 High Frequency Probe
6. Disconnect the ProBus Extender Cable from the oscilloscope. Verify that the
scalefactorchanges from 20 mV/div to 2 mV/div.
7. Re-connect the ProBus extender Cable to the oscilloscope.
The warranted characteristics of the HFP1000 are valid at any temperature within the
Environmental Characteristics listed in the Specifications. However, some of the other test
equipment used to verify the performance may have environmental limitations required to meet
the accuracy needed for the procedure. Make sure that the ambient conditions meet the
requirements of all the test instruments used in his procedure.
NOTE: The correct operation of the HFP1000 controls requires software version 8.7.0 or higher on
LC series oscilloscopes. The software version in the test oscilloscope can be verified by pushing
SCOPE STATUS, then selecting the System menu option.
Functional Check
The functional check will verify the basic operation of the probe functions. It is recommended the
Functional Check be performed prior to the Performance Verification Procedure.
1. Return to the factory default settings by:
a. Pressing the oscilloscope’s front panel PANELS button.
b. From the Menu buttons press FROM DEFAULT SETUP.
2. Select Channel 1 and enter the Coupling menu.
3. Verify that Probe sensed (HFP1000) is displayed on the right hand menu.
4. If the trace colors have been reassigned or you are unsure, restore the default colors by
pressing the following menus: DISPLAY, More Display Setup, Color Scheme and in the Color Scheme menu press 1.
5. Verify that the probe head LED shows basically the same color as the channel 1 trace color.
6. Disconnect the probe from channel 1 and connect respectively to channel 2, 3 and 4.
7. Verify that in each case the LED color corresponds to the trace color of the channel to which
the probe is connected.
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Procedure
A. Output Zero Voltage
Figure 4 Output Zero Voltage Test Setup
1. Connect one end of a BNC cable to the female BNC connector on the probe end of the
ProBus extender cable. Connect the precision 50 Ω terminator to the other end of the BNC
cable.
2. Connect the banana plugs of the Precision terminator to the input of the DMM. Make sure
that the plug corresponding to the BNC shield (marked "Ground") is connected to the LO or
COMMON input of the DMM. Refer to Figure 4 Output Zero Voltage Test Setup for setup
information.
3. Set the OFFSET on the oscilloscope to zero, as indicated by on-screen display.
4. Set the DMM to read DC Volt on the most sensitive range.
5. Record the voltage measured on the DMM to 10 μV resolution as ’Output Zero Voltage’ in
the Test record.
6. Check that the voltage indicated by the DMM is between ±800 μV.
7. Disconnect the DMM from the precision 50 Ω terminator. Leave the remaining setup in
place for the next step.
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HFP1000 High Frequency Probe
B. LF Attenuation Accuracy
Figure 5 Attenuation Accuracy Test Setup
1. Connect the BNC end of the BNC to mini-grabber cable to a female end of the BNC tee
adapter. (Refer toFigure 5 Attenuation Accuracy Test Setup)
2. Carefully insert the Straight Tips (supplied in accessory kit) into the sockets of the probe
head. Attach the red lead of the mini-grabber to the signal input and the black lead to the
ground input of the probe head.
3. Connect the BNC tee to the output of the function generator. (Use a 50 Ω termination if the
function generator requires such a load).
4. Attach a BNC cable to the unused female port of the BNC tee and connect a dual banana
plug adapter to the other end of the cable and plug the dual banana plug adapter into the
DMM input. Make sure the side of the banana plug adapter corresponding to the BNC shield
(marked "GROUND") is connected to the LOW or COMMON input of the DMM.
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5. Set the DMM to read AC volt and set the range to measure 5.0 Vrms.
6. Set the mode of the function generator to sine wave, the frequency to 70 Hz and the output
amplitude to 5 Vrms ±10 mV as measured on the DMM.
7. Record the output voltage to 1 mV resolution as ’Generator Output Voltage’ in the Test
Record. Be careful not to alter the output amplitude after the reading is recorded.
8. Divide the reading recorded in step B-7 by 10 and record the result with 100 μV resolution
as “Expected Output Voltage, top range" in the Test Record.
9. Remove the banana plug adapter, connected to the function generator, from the DMM and
connect the precision 50 Ω terminator to the DMM, making sure that the banana plug side
marked ’GROUND" is connected to the LOW or COMMON input of the DMM.
10. After the DMM reading has stabilized, record the reading to 100 μV resolution as ’Measured
Output Voltage, top range’ in the Test Record.
11. Calculate the error by dividing the measured top range output voltage recorded in step B10
by the expected top range output voltage recorded in step B-8. Subtract 1 from this ratio
and multiply by 100% to get the error in percent.
12. Record the calculated error to two decimal places (±0.xx%) as ’Gain Error, top range’ in the
test record.
13. Verify that the error is less than ±1.0 %.
14. Disconnect the precision 50 Ω terminator from the DMM.
15. Connect the banana plug adapter connected via a BNC cable to the BNC tee at the function
generator to the DMM. Verify that the side of the plug marked ’Ground’ is connected to the
LOW or COMMON input of the DMM.
16. Adjust the sine wave generator output amplitude to approximately 2.5 Vrms as measured
on the DMM.
17. Record the reading to 1 mV resolution as ’Generator Output Voltage, mid range’ in the Test
Record. Be careful not to alter the output amplitude after the reading is recorded.
18. Divide the reading recorded in step B-17 by 10.
19. Record the result to 100 μV resolution as ’Expected Output Voltage, mid range’ in the test
record.
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HFP1000 High Frequency Probe
20. Remove the banana plug adapter from the DMM and connect the precision 50 Ω terminator
to the DMM, making sure that the banana plug side marked ’GROUND" is connected to the
LOW or COMMON input of the DMM.
21. After the DMM has stabilized, record the reading to 100 μV resolution as ’Measured Output
Voltage, mid range’ in the Test record.
22. Calculate the error by dividing the measured mid range output voltage recorded in step B-21
by the expected mid range output voltage recorded in step B-19. Subtract 1 from this ratio
and multiply by 100% to get the error in percent.
23. Record the calculated error to two decimal places (±0.xx %) as ’Gain Error, mid range’ in the
Test record.
24. Verify that the mid range gain error is less than ±1.0% This completes the Performance
Verification of the HFP1000. Complete and file the Test Record, as required to support your
internal calibration procedure.
Apply suitable calibration label to the HFP1000 housing as required.
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Operator’s Manual
Adjustment Procedure
You can use this procedure to adjust the HFP1000 probe to meet the warranted specifications. This
procedure should only be performed if the probe fails to meet the Performance verification tests for
Output Zero.
Gain which affects LF attenuation accuracy cannot be adjusted during routine calibration. Probes
which fail LF attenuation accuracy during performance verification must be returned to the factory
for rework.
To assure probe accuracy, check the calibration of the HFP1000 every 1000 hours or once a year if
used infrequently. Before calibration, thoroughly clean and inspect the probe as outlined in the Care
and Maintenance section.
To assure the probe will meet the published specifications over the entire temperature range,
adjustment must be performed in a controlled ambient environment with temperature of 23 °C ±5
°C.
CAUTION: The adjustment procedure will require removal of the probe control circuitry
cover. This cover is part of the ESD protection system of the HFP1000. To protect the
probe, you should perform the entire procedure on a static dissipating work surface. Wear
an antistatic wrist strap and follow standard static control procedures.
Test Equipment Required
Table 3 List of Required Equipment lists the test equipment and accessories (or their equivalents)
that are required for complete calibration of the HFP1000 Probe. Specifications given for the test
equipment are the minimum necessary for accurate calibration. All test equipment is assumed to be
correctly calibrated and operating within the specification listed. Detailed operating instructions for
the test equipment are not given in this procedure. Refer to the test equipment manual if more
information is needed
If alternate test equipment is substituted, control settings or calibration equipment setups may
need to be altered.
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HFP1000 High Frequency Probe
Description
Minimum Requirements
Example Test Equipment
Digital Oscilloscope
ProBus interface
Teledyne LeCroy LT344
Teledyne LeCroy LC584
Digital Multimeter (DMM) with test
probe leads
4.5 digit DC: 0.1% Accuracy AC:
0.1% accuracy
Agilent Technologies 34401A
Fluke 8842A-09
BNC Coaxial Cable (2 ea.)
Male to Male, 50 Ω, 36" Cable
Pomona 2249-C-36
Pomona 5697-36
Calibration Fixture
ProBus Extender Cable
Teledyne LeCroy PROBUS-CF01
Terminator, Precision, BNC
50 Ω ± 0.05%
Teledyne LeCroy TERM-CF01
Table 3 List of Required Equipment
Preliminary Procedure
1. Remove the two screws that secure the plastic cover on the cable end of the ProBus
interface housing.
2. Gently pull on the probe cable to slide the circuit board assembly from the metal
housing.
3. Connect the HFP1000 probe to the female end of the ProBus extension cable, being
careful to line up all six pins of the probe connector. Connect the male end of the
ProBus extension cable to channel 1 of the oscilloscope.
4. Apply power to the oscilloscope and test equipment.
5. Allow at least 30 minutes warm-up time for the HFP1000 and test equipment before
starting the calibration procedure.
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Procedure
Adjust Output Zero
Figure 6 Output Zero Voltage Adjustment Setup
1. Connect one end of a BNC cable to the probe end of the ProBus extension cable.
Connect the Precision 50 Ω Terminator to the other end of the BNC cable.
Operator’s Manual
2. Connect the banana plugs of the precision 50 Ω terminator to the input of the DMM.
Make sure the plug corresponding to the BNC shield (marked ’Ground’) is connected to
the LO or COMMON input of the DMM. Refer to Figure 6 Output Zero Voltage Adjustment
Setup for setup information.
3. Select the channel to which the probe and ProBus extender is connected. Set OFFSET on
the oscilloscope to zero as indicated on the on-screen display.
4. Set the DMM to read DC Volt on the most sensitive range.
5. Verify that the probe inputs are not connected to any signal.
6. Adjust OUTPUT ZERO on the board until the DMM reads 0 V ±100 μV. Refer to Figure 7
Adjustment Location S/N 1000 and higher for adjustment location.
7. Disconnect the probe from the ProBus extender and re-install the circuit board into the
probe case, being careful to align the ProBus interface connector with the opening on
the other endof the probe.
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HFP1000 High Frequency Probe
Figure 7 Adjustment Location S/N 1000 and higher
Figure 8 Adjustment Location S/N below 1000.
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Verify Calibration
Repeat the Performance Verification procedure to ensure compliance with the warranted
specifications.
Apply a calibration sticker, if required, in accordance with your quality control procedures.
Figure 9 Input Voltage vs. Frequency
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HFP1000 High Frequency Probe
Reference
Certifications
This section contains the probe’s Electromagnetic Compatibility (EMC), Safety and Environmental
certifications.
EMC Compliance
ECDECLARATION OF CONFORMITY -EMC
The probe meets intent of EC Directive 2004/108/EC for Electromagnetic Compatibility. Compliance
was demonstrated to the following specifications as listed in the Official Journal of the European
Communities:
EN 61326-1:2006, EN 61326-2-1:2006 EMC requirements for electrical equipment for measurement,
control, and laboratory use.
Electromagnetic Emissions:
CISPR 11:2003, Radiated and Conducted Emissions Group 1, Class A
Vicom Australia Ltd.
1064 Centre Road
Oakleigh, South Victoria 3167
Australia
Vicom New Zealand Ltd.
60 Grafton Road
Auckland
New Zealand
AUSTRALIA &NEW ZEALAND DECLARATION OF CONFORMITY—EMC
The probe complies with the EMC provision of the Radio Communications Act per the following
standards, in accordance with requirements imposed by Australian Communication and Media
Authority (ACMA):
CISPR 11:2003 Radiated and Conducted Emissions, Group 1, Class A, in accordance with EN613261:2006 and EN61326-2-1:2006.
Australia / New Zealand Contacts:
Safety Compliance
ECDECLARATION OF CONFORMITY – LOW VOLTAGE
The probe meets intent of EC Directive 2006/95/EC for Product Safety. Compliance was
demonstrated to the following specifications as listed in the Official Journal of the European
Communities:
EN 61010-1:2010 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 1: General requirements
EN 61010-2:030:2010 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 2-030: Particular requirements for testing and measuring circuits
EN 61010-031/A1:2008 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 031: Safety requirements for hand-held probe assemblies for electrical
measurement and test.
Environmental Compliance
END-OF-LIFE HANDLING
The probe is marked with this symbol to indicate that it complies with the applicable
European Union requirements to Directives 2002/96/EC and 2006/66/EC on Waste
Electrical and Electronic Equipment (WEEE) and Batteries.
The probe is subject to disposal and recycling regulations that vary by country and
region. Many countries prohibit the disposal of waste electronic equipment in standard
waste receptacles. For more information about proper disposal and recycling of your
This probe has been classified as Industrial Monitoring and Control Equipment and is outside the
scope of the 2011/65/EU RoHS Directive until 22 July 2017 (per Article 4, Paragraph 3).
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HFP1000 High Frequency Probe
Teledyne LeCroy Service Centers
United States and Canada -
World Wide Corporate Office
China
Teledyne LeCroy Corporation Beijing
Rm. 2001 - Office; Rm. 2002 - Service Center
Unit A, Horizon Plaza
No. 6, Zhichun Road, Haidian District
Beijing 100088, China
Ph: ++86 10 8280 0318 / 0319 / 0320
FAX:++86 10 8280 0316
Service:
Rm. 2002
Ph: ++86 10 8280 0245
Korea
Teledyne LeCroy Korea
10th fl.Ildong Bldg.
968-5 Daechi-dong, Gangnam-gu
Seoul 135-280, Korea
Ph: ++ 82 2 3452 0400
FAX: ++ 82 2 3452 0490
Taiwan
LeColn Technology Co Ltd.
Far East Century Park, C3, 9F
No. 2, Chien-8th Road,
Chung-Ho Dist., New Taipei City, Taiwan
Ph: ++ 886 2 8226 1366
FAX: ++ 886 2 8226 1368
Japan
Teledyne LeCroy Japan
Hobunsya Funchu Bldg, 3F
3-11-5, Midori-cho, Fuchu-Shi
Tokyo 183-0006, Japan
Ph: ++ 81 4 2402 9400
FAX: ++ 81 4 2402 9586
teledynelecroy.com/japan
Contact Teledyne LeCroy
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Operator’s Manual
Serial Number:
Asset or Tracking Number:
Date:
Technician:
MODEL
SERIAL NUMBER
CALIBRATION DUE
DATE
OSCILLOSCOPE
DIGITAL MULTIMETER
FUNCTION GENERATOR1
N/A
Appendix A
Performance Verification Test Record
This record can be used to record the results of measurements made during the performance
verification of the HFP1000 High Frequency Probe.
Photocopy this page and record the results on the copy. File the completed record as required by
applicable internal quality procedures.
The section in the test record corresponds to the parameters tested in the performance verification
procedure. The numbers preceding the individual data records correspond to the steps in the
procedure that require the recording of data. Results to be recorded in the column labeled "Test
Result" are the actual specification limit check. The test limits are included in all of these steps.
Other measurements and the results of intermediate calculations that support the limit check are to
be recorded in the column labeled "Intermediate Results".
Permission is granted to reproduce these pages for the purpose of recording test results.
Probe Model: HFP1000
Equipment Used:
1The function generator used in this Performance Verification Procedure is used for making relative
measurements. The output of the generator is measured with a DMM or oscilloscope in this
procedure. Thus, the generator is not required to be calibrated.
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HFP1000 High Frequency Probe
Step
Description
Intermediate Data
Test Result
Output Zero Voltage
A-5
Output Zero Voltage (Test limit ≤± 800 μV)
____________ V
LF Attenuation Accuracy
B-7
Generator Output Voltage
____________ V
B-8
Expected Output Voltage, top range
____________ V
B-10
Measured Output Voltage, top range
____________ V
B-12
Gain Error, top range (Test limit ≤± 1.0%)
___________ %
B-17
Generator Output Voltage
____________ V
B-19
Expected Output Voltage, mid range
____________ V
B-21
Measured Output Voltage, mid rang
____________ V
B-23
Gain Error, mid range (Test limit ≤± 1.0%)
___________ %
HFP1000 TEST RECORD
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