Tektronix TLA500 Series Technical Reference

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TLA5000 Series Logic Analyzer

ZZZ

Product Speciﬁcations & Performance Veriﬁcation

Technical Reference

This document applies to TLA System Software Version

5.1SP1 and above

Warning

These servicing instructions are for use by qualiﬁed personnel only. To avoid personal injury, do not perform any servicing unless you are qualiﬁed to do so. Refer to all safety summaries prior to performing service.

www.tektronix.com

071-2502-00

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions.

Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Speciﬁcations and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

MagniVu and iView are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14200 SW Karl Braun Drive P.O . Bo x 50 0 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

In North America, call 1-800-833-9200. World wi de, vi s it www.tektronix.com to ﬁnd contacts in your area.

Warranty 2

Tektronix warrants that this product will be free from defects in materials and workmanship for a period of one (1) year from the date of shipment. If any such product proves defective during this warranty period, Tektronix, at its option, either will repair the defective product without charge for parts and labor, or will provide a replacement in exchange for the defective product. Parts, modules and replacement products used by Tektronix for warranty work may be ne the property of Tektronix.

w or reconditioned to like new performance. All replaced parts, modules and products become

In order to o the warranty period and make suitable a rrangements for the performance of service. Customer shall be responsible for packaging and shipping the defective product to the service center designated by Tektronix, with shipping charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which the Tektronix service center is located. Customer shall be responsible for paying all shipping charges, duties, taxes, and any other charges for products returned to any other locations.

This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate maintenance and care. Tektronix shall not be obligated to furnish service under this warranty a) to repair damage resulti b) to repair damage resulting from improper use or connection to incompatible equipment; c) to repair any damage or malfunction caused by the use of non-Tektronix supplies; or d) to service a product that has been modiﬁed or integrated with other products when the effect of such modiﬁcation or integration increases the time or difﬁculty of servicing the product.

THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THE PRODUCT IN LIEU OF ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTR AND EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.

btain service under this warranty, Customer must notify Tektronix of the defect before the expiration of

ng from attempts by personnel other than Tektronix representatives to install, repair or service the product;

ONIX’ RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE

Table of Contents

General Safety Summary ......................................................................................... iv

Service Safety Summary........................ ................................ ................................ .. vi

Environmental Considerations .................................................................................. vii

Preface .............................................................................................................. ix

Related Documentation ...................................................................................... ix

Certiﬁcations and Compliances ................ ................................ ................................ ... 1

Speciﬁcations .................. ................................ .................................. ................... 4

External Oscilloscope (iView) Characteristics ................... ................................ .............. 19

Performance Ve riﬁcation Procedures............................................................................ 21

Summary Veri

Certiﬁcation ..................... .................................. ................................ ............ 21

Test Equipment................................................................................................ 22

Functional Veriﬁcation..... ................................ .................................. ................ 23

Performance Veriﬁcation......................... .................................. .......................... 25

Checking the 10 MHz System Clock (CLK10) ........... ................................ ................ 26

Threshold Ac

Setup and Hold.......... .................................. ................................ .................... 30

Test Fixtures............................ .................................. ................................ .......... 34

Threshold Accuracy Test Fixture ........................................................................... 34

Setup and Hold Test Fixture............. ................................ ................................ .... 35

Calibration Data Report........................... ................................ ................................ 37

TLA5000 Ser

Test Data ....................................................................................................... 37

ﬁcation ........................................................................................ 21

curacy .............. ................................ .................................. .......... 27

ies......................................... ................................ ...................... 37

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation i

Table of Contents

List of Figure

Figure 1: Dimensions of the TLA5000 series logic analyzer............. .................................. .. 18

Figure 2: Deﬁ

Figure 3: Setting trigger parameters. ... . ... ... . ... ... . .. . ... .... ... . .. . ... ... . ... ... . ... ... . ... ... . ... ... . ... ... 28

Figure 4: Set the trigger states ......................... .................................. ........................ 32

Figure 5: Threshold Accuracy test ﬁxture ...................................................................... 34

Figure 6: Solder square pins to the SMA connector..................................... ...................... 35

Figure 7: Solder the SMA connectors together ............................ .................................. .. 36

Figure 8: Com

ning group parameters............................................................................ 27

pleted ﬁxture with termination and coupler ........... ................................ ........ 36

ii TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

List of Tables

Table i: Related Documentation ..... .................................. ................................ .......... ix

Table 1: Atmo

Table 2: TLA5000 input parameters with probes .................... ................................ ........... 5

Table 3: TLA5000 timing latencies .............................................................................. 5

Table 4: TLA5000 external signal interface.......................... ................................ ........... 6

Table 5: TLA5000 channel width and depth .................................................................... 7

Table 6: Reference clock (CLK10) ...................... ................................ ......................... 8

Table 7: TLA5

Table 8: TLA5000 trigger system ............................................................................... 11

Table 9: TLA5000 MagniVu feature ............................................................................ 13

Table 10: TLA5000 Data Placement ............................................................................ 13

Table 11: TLA5000 Data handling .............................................................................. 14

Table 12: TLA5000B internal controller........................................................................ 14

Table 13: TLA

Table 14: TLA5000 display system ........... .................................. ................................ 15

Table 15: TLA5000 front-panel interface....................................................................... 16

Table 16: TLA5000 rear-panel interface........ ................................ ................................ 16

Table 17: TLA5000 AC power source ...... .................................. ................................ .. 17

Table 18: TLA5000 cooling...................................................................................... 17

Table 19: TL

Table 20: External oscilloscope (Integrated View or iView) characteristics ... ... . ... .... ... . .. . ... . ... ... . 19

Table 21: TDS1000, TDS1000B, TDS2000, and TDS2000B Series oscilloscope waveform edge

alignment ...................................................................................................... 20

Table 22: Test equipment ....................... ................................ .................................. 22

Table 23: Functional veriﬁcation procedures................. .................................. ................ 23

Table 24: P

spheric characteristics............................................................................. 4

000 clocking ....................................................................................... 9

5000 internal controller.......................................................................... 15

A5000 mechanical characteristics................................................................ 17

arameters checked by veriﬁcation procedures .................................................... 25

Table of Contents

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation iii

General Safety Summary

General Safet

To Avoid Fire or Personal

Injury

ySummary

Review the fol this product or any products connected to it.

To avoid potential hazards, use this product only as speciﬁed.

Only qualiﬁed personnel should perform service procedures.

While using this product, you may need to access other parts of a larger system. Read the safety sections of the other component manuals for warnings and cautions related to operating the system.

Use Proper Power Cord. Use only the power cord speciﬁed for this product and certiﬁed for the country of use.

Connect and Disconnect Properly. Do not connect or disconnect probes or test leads while they are connected to a voltage source.

Ground the Product. This product is grounded through the grounding conductor of the power cord. To avoid electric shock, the grounding conductor must be connected to earth g terminals of the product, ensure that the product is properly grounded.

lowing safety precautions to avoid injury and prevent damage to

round. Before making connections to the input or output

Observe All Terminal Ratings. To avoid ﬁre or shock hazard, observe all ratings and markings on the product. Consult the product manual for further ratings information before making connections to the product.

The inputs are not rated for connection to mains or Category II, III, or IV circuits.

Power Disconnect. The power cord disconnects the product from the power source. Donotblockthepowercord;itmustremain accessible to the user at all times.

Do Not Operate Without Covers. Do not operate this product with covers or panels removed.

Do Not Operate With Suspected Failures. If you suspect that there i s damage to this product, have it inspected by qualiﬁed s ervice personnel.

Avoid Exposed Circuitry. Do not touch exposed connections and components when power is present.

Use Proper Fuse. Useonlythefusetypeandratingspeciﬁed for this product.

Do Not Operate in Wet/Damp Conditions.

Do Not Operate in an Explosive Atmosphere.

Keep Product Surfaces Clean and Dry.

Provide Proper Ventilation. Refer to the manual’s installation instructions for

details on installing the product so it has proper ventilation.

iv TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

General Safety Summary

Terms in this Manual

Symbols and Terms on the

Product

These terms may

WAR N ING. Warning statements identify conditions or practices that could result

in injury or loss of life.

CAUTION. Caution statements identify conditions or practices that could result in

damage to this product or other property.

These terms may appear on the product:

DANGER ind the marking.

WAR NI NG i read the marking.

CAUTION i

The following symbol(s) may appear on the product:

appear in this manual:

icates an injury hazard immediately accessible as you read

ndicates an injury hazard not immediately accessible as you

ndicates a hazard to p roperty including the product.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation v

Service Safety Summary

Service Safet

y Summary

Only qualiﬁed Safety Summary and the General Safety Summary before performing any service procedures.

Do Not Service Alone. Do not perform internal service or adjustments of this product unless another person capable of rendering ﬁrst aid and resuscitation is present.

Disconnect Power. To avoid electric shock, switch off the instrument power, then disconnect the power cord from the mains power.

Use Care When Servicing With Power On. Dangerous voltages or currents may exist in t disconnect test leads before removing protective panels, soldering, or replacing components.

To avoid electric shock, do not touch exposed connections.

his product. Disconnect power, remove battery (if applicable), and

personnel should perform service procedures. Read this Service

vi TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Environmental Considerations

This section provides information about the environmental impact of the product.

Product End-of-Life

iction of Hazardous

Restr

Handling

Substances

Observe the following guidelines when recycling an instrument or component:

Equipment Recycling. Production of this equipment required the extraction and use of natural resources. The equipment may contain substances that could be harmful to t end of life. In order to avoid release of such substances into the environment and to reduce the use of natural resources, we encourage you to recycle this product in an appropriate system that will ensure that most of the materials are reused or recycled appropriately.

Mercury Notiﬁcation. This product uses an LCD backlight lamp that contains mercury. Disposal may be regulated due to environmental considerations. Please contact your local authorities or, within the United States, the Electronics Industries Alliance (www.eiae.org) for disposal or recycling information.

This product has been classiﬁed as Monitoring and Control equipment, and is outside the scope of the 2002/95/EC RoHS Directive.

he environment or human health if improperly handled at the product’s

This symb requirements according to Directive 2002/96/EC on waste electrical and electronic equipment (WEEE). For information about recycling options, check the Supp

ol indicates that this product complies with the European Union’s

ort/Service section of the Tektronix Web site (ww w.tektronix.com).

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation vii

Environmental Considerations

viii TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Preface

Related Documentation

This document lists the characteristics and speciﬁcations of the TLA5000 and TLA5000B series logic analyzers. It also includes the performance veriﬁcation procedures. otherwise noted. Microprocessor-related products and individual logic analyzer probes have their own documentation for characteristics and speciﬁcations.

To prevent personal injury or damage consider the following requirements before attempting service:

The procedures in this manual should be performed only by qualiﬁed service personnel.

Read the General Safety Summary and Service Safety Summary found at the beginning of this manual.

Be sure to follow all warnings, cautions, and notes in this manual.

The following table lists related documentation available for your logic analyzer. The documentation is available on the TLA Documentation CD included with your logic analyzer, and on the Tektronix Web site (www.Tektronix.com).

All references to TLA5000 also apply to TLA5000B, unless

To obtain documentation not speciﬁed in the table, contact your local Tektronix representative.

Table i: Related Documentation

Item Purpose Location

TLA Quick Start User Manual

Online Help

Installation Quick Reference Cards Basic installation information

Installation Manuals

XYZs of

TLA Product Speci ﬁcations Speciﬁcations for other TLA products

Logic Analyzers

Basic operational overview

In depth operation and UI help

Detailed ﬁrst-time installation information

Introduction to logic analyzer basics

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation ix

Preface

Table i: Related Documentation (cont.)

Item Purpose Location

TPI.NET Documentation

Detailed information for controlling the logic analyzer u sing .NET

Field upgrade kits

Optional Service Manuals Self-service documentation for modules

TLA Application Software Release N otes Software description, compatibility,

Upgrade information for your logic analyzer pro

and mainframes

impactofch installation, upgrade, and operational notes, and known issues.

duct

anges, contact information,

Go to Start→All Programs→Tektronix logic Analyzer→TLA Release Notes

x TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Certiﬁcations and Compliances

The certiﬁcations and compliances apply to all components of the Tektronix Logic Analyzer family unless otherwise noted.

Certiﬁcations and Compliances

EC Declaration of Conformity – EMC

Meets intent of Directive 2004/108/EEC for Electromagnetic Compatibility. Compliance was demonstrated to the following speciﬁcations as listed in the Ofﬁcial Journal of the European Communities:

EN 61326:1997. EMC requirements for Class A electrical equipment for measurement, control, and laboratory use. Annex D.

IEC 61000-4-2:1999. Electrostatic discharge immunity

IEC 61000-4-3:2002. RF electromagnetic ﬁeld immunity

IEC 61000-4-4:2004. Electrical fast transient/burst immunity

IEC 61000-4-5:2005. Power line surge immunity

IEC 61000-4-6:2003. Conducted RF immunity

IEC 61000-4-11:2004. Voltage dips and interruptions immunity

EN 61000-3-2:2000. AC power

EN 61000-3-3:1995. Voltage changes, ﬂuctuations, and ﬂicker

European Contact.

Tektronix UK, Ltd. Western Peninsula Western Road Bracknell, RG12 1RF United Kingdom

line harmonic emissions

Australia / New Zealand

Declaration of

Conformity – EMC

EC Declaration of

Conformity – Low Voltage

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 1

Complies with the EMC provision of the Radiocommunications Act per the following standard, in accordance with ACMA:

EN 61326:1997. EMC requirements for electrical equipment for measurement, control, and laboratory use.

Compliance was demonstrated to the following speciﬁcation as listed in the Ofﬁcial Journal of the European Communities:

Low Voltage Directive2006/96/EC.

EN 61010-1: 2001. Safety requirements for electrical equipment for measurement control and laboratory use.

Certiﬁcations and Compliances

U.S. Nationally Recognized

Testing Laboratory Listing

UL 61010B-1: 20 test equipment.

04, 2

Edition. Standard for electrical measuring and

Canadian Certiﬁcation

Additional Compliances

Equipment

Type

Safety Class

Pollution Degree

Descript

ion

CAN/CSA C22.2 No. 61010-1:2004. Safety requirements for electrical equipment fo

IEC 61010-1: 2001. Safety requirements for electrical equipment for measurement, control, and laboratory use.

Test and measuring equipment.

Class 1 – grounded product.

A measure of the contaminants that could occur in the environment around and withi considered to be the same as the external. Products should be used only in the environment for which they are rated.

n a product. Typically the internal environment inside a product is

Pollution Degree 1. No pollution or only dry, nonconductive pollution occurs. Products in this category are generally encapsulated, hermetically sealed, or located in clean rooms.

Pollution Degree 2. Normally only dry, nonconductive pollution occurs. Occasionally a temporary conductivity that i s caused by condensation must be expected. This location is a typical ofﬁce/home environment. Temporary condensation occurs only when the product is out of service.

r measurement, control, and laboratory use. Part 1.

Pollution Degree 3. Conductive pollution, or dry, nonconductive pollution that becomes conductive due to condensation. These are sheltered locations

e neither temperature nor humidity is controlled. The area is protected

wher from direct sunshine, rain, or direct wind.

lution Degree 4. Pollution that generates persistent conductivity through

Pol conductive dust, rain, or snow. Typical outdoor locations.

Pollution Degree

2 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Pollution Degree 2 (as deﬁned in IEC 61010-1). Note: Rated for indoor use only.

Certiﬁcations and Compliances

Installation (Overvoltage)

Category Descriptions

Overvoltage Category

Termina l s on th designations. The installation categories are:

Measurement C low-voltage installation.

Measurement installation.

Measurement connected to the low-voltage installation.

Measuremen directly connected to MAINS.

Overvoltage Category II (as deﬁned in IEC 61010-1)

is product may have different installation (overvoltage) category

ategory IV. For measurements performed at the source of

Category III. For measurements performed in the building

Category II. For measurements performed on circuits directly

t Category I. For measurements performed on circuits not

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 3

Speciﬁcations

Speciﬁcation

The following

tables list the speciﬁcations for the TLA5000B and TLA5000 series logic analyzers. All references to TLA5000 also apply to TLA5000B, unless otherwise noted. All speciﬁcations are guaranteed unless noted Typical .Typical characteristics describe typical or average performance and provide useful reference information.

Speciﬁcations that are marked with the

symbol are checked directly (or

indirectly) in the Performance Veriﬁcation chapter of this document.

The performance limits in this speciﬁcation are valid with these conditions:

The instrument must be in an environment with temperature, altitude, humidity, and vibration within the operating limits described in these speciﬁcations.

The instrument must have had a warm-up period of at least 30 minutes.

The instrument must have been calibrated/adjusted at an ambient temperature between +20 °C and +30 °C.

For optimum performance using an external oscilloscope, please consult the documentation for any external o scillosc opes used with your Tektronix logic analyzer to determine the warm-up period and signal-path compensation requirements.

Table 1

Characteristic Description

Temper

Relative humidity

Alti

: Atmospheric characteristics

ature

tude

Operating (no media in CD or DVD drive)

+5 °C to +50 °C, 15 °C/hr maximum gradient, noncondensing (derated 1 °C per 305 m (1000 ft) above 1524 m (5000 ft) altitude)

Nonoperating (no media in drive)

-20 °C to +60 °C, 15 °C/hr maximum gradient, noncondensing

Operating (no media in drive)

20% to 80% relative humidity, noncondensing. Maximum wet bulb temperature: +29 °C (derates rela

Nono

8% to humidity to approximately 22% at +50 °C).

Operating

To 3000 m (9843 ft), (derated 1 °C per 305 m (1000 ft) above 1524 m (5000 ft) altitude.

Nono

12,

tive humidity to approximately 22% at +50 °C).

perating (no media in drive)

80% relative humidity, noncondensing. Maximum wet bulb temperature: +29 °C (derates relative

perating

190 m (40,000 ft )

4 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Speciﬁcations

Table 2: TLA500

0 input parameters with probes

Characteristic Description

Threshold Accuracy

Threshold range and step size

±100 mV

Settable from +4.5 V to -2 V in 5 mV steps

Threshold channel selection 16 threshold g roups assigned to channels. P6410, P6417, P6418, and

P6419 probes have two threshold settings, one for the clock/qualiﬁer channel and one for the data channels. P6434 probes have four threshold settings, one for each of the clock/qualiﬁer channels and two for the data channels (one per 16 data channels).

Channel-to-channel skew

Channel-to-channel skew (Typical)

Sample uncertainty

≤ ±150 ps maximum

≤ ±75 ps

Asynchronous

Sample period

Synchronous

125 ps

Input voltage range –2.5 to +5 V

Probe input resistance (Typical) 20 kΩ

Probe input c

(Typical)

apacitance

P6410, P6417

P6418 1.4 pF data channels

, P 6434

2pF

2 pF CLK/Qual

channels

P6419 < 0.7 pF

Minimum slew rate (Typical) 0.2 V/ns

Maximum operating signal 6.0 V

Probe overdr

ive

P6410, P6417

, P6418,

P6419

P6434

p-p

±250 mV or ±25% of signal swing minimum required beyond threshold, whichever is greater

±300 mV or ±25% of signal swing minimum required beyond threshold, whichever i

s greater

±4 V maximum beyond threshold

Maximum non

Minimum inp

(Typical)

Delay time from probe tip to module input probe

destructive input signal to probe

ut pulse width signal (single channel)

±15 V

1.5 ns (P643

1.25 ns (P6410, P6417, P6418, P6419)

7.33 ns ±100

connector (Typical)

Table 3: TLA5000 timing latencies

Characteristic Description

System Trigger and External Signal Input Latencies

(Typical)

External System Trigger Input to LA Probe Tip

External Signal Input to LA Probe Tip via Signal 3, 4 –656 ns + Clk

External Signal Input to LA Probe Tip via Signal 1, 2

–656 ns

–656 ns + Clk

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 5

Speciﬁcations

Table 3: TLA5000 timing latencies (cont.)

Characteristic Description

System Trigger and External Signal Output Latencies (Typical)

All system trigger and external signal input latencies are measured from a falling-edge transition (active true low) with signals measured in the wired-OR conﬁguration.

In the Waveform window, triggers are always marked immediately except when delayed to the ﬁrst sample. In the Listing window, triggers are always marked on the next sample period following their occurrence.

CLK represents the time to the next master clock at the destination. In Normal clocking, this represents the delta time to the next sample clock. In External clocking, this represents the time to the next master clock generated by the setup of the clocking state machine and the supplied SUT clocks and qualiﬁcation date.

Signals 1 and 2 (ECLTRG 0, 1) are limited to a "broadcast" mode of operation, where only one source is allowed to drive the signal node at any one time. That single source can be used to drive any combination of destinations.

SMPL represents the time from the event to the next valid data sample at the probe tip input. In the Normal Internal clock mode, this represents the delta time to the next sample clock. In the MagniVu Internal clock mode, this represents 125 ps. In the External clock mode, this represents the time to the next masterclock generated by the setup of the clocking state machine, the SUT-supplied clocks, and the qualiﬁcation data.

All signal output latencies are validated to the rising edge of an active (true) high output.

LA Probe Tip to External System Trigger Out

LA Probe Tip to External Signal Out via Signal 3,

LA Probe Tip to External Signal Out via Signal 1, 2

456

OR function 772 ns + SMPL

AND function 772 ns + SMPL

normal function 772 ns + SMPL

inverted logic on backplane

778 ns + SMPL

774 ns + SMPL

Table 4: TLA5000 external signal interface

Characteristic Description

System trigger input

External signal input

Input destination

Input levels

Input mode

Minimum pulse width 12 ns

Active period Accepts system triggers during valid acquisition periods via real-time

Maximum input voltage 0 to +5 V peak

Input destination

Input levels

Input mode

Input bandwidth

Active period Accepts signals during valid acquisition periods via real-time gating.

Maximum input voltage 0 to +5 V peak

TTL compatible input via rear panel mounted BNC connectors

System trigger

TTL compatible input

≥ 2.0 V

≤ 0.8 V

Falling edge sensitive, latched (active low)

gating, resets system trigger input latch between valid acquisition periods.

TTL compatible input via rear panel mounted BNC connectors

Signal 1, 2, 3, 4

TTL compatible input

≥ 2.0 V

≤ 0.8 V

Active (true) low, level sensitive

Signal 1, 2 Signal 3, 4

50 MHz square wave minimum 10 MHz square wave minimum

6 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Speciﬁcations

Table 4: TLA5000 external signal interface (cont.)

Characteristic Description

System trigger output

Source selection System trigger

Source mode Active (true) low, falling edge latched

Active period

Output levels

Output protection Short-circuit protected (to ground)

External signal output

Source selection Signal 1, 2, 3, 4, or 10 MHz clock

Output modes level sensitive

Output levels

Active period

Output protection Short-circuit protected (to ground)

The input bandwidth speciﬁcation only applies to signals to the External Signal input; it does not apply to signals applied to the External Signal input and sent back to the External Signal output.

The output bandwidth speciﬁcation only applies to signals to the External Signal output; it does not apply to signals applied to the External Signal output and sent back to the External Signal input.

TTL compatible output via rear panel mounted BNC connectors

Outputs system trigger state during valid acquisition period, resets system trigger output to false state between valid acquisitions

50 Ω back terminated TTL-compatible output

≥4 V into open circuit

≥ 2Vinto50Ω to ground

≤ 0.7 V sinking 10 mA

TTL compatible outputs via rear panel mounted BNC connectors

User deﬁnable active (true) low or active (true) high

50 Ω back terminated TTL output

≥4 V into open circuit

≥2Vinto50Ω to ground

≤ 0.7 V sinking 10 mA

Signal 1, 2 Signal 3, 4Output bandwidth

50 MHz square wave minimum 10 MHz square wave minimum

Outputs signals during valid acquisition periods, resets signals to false state between valid acquisitions

Outputs 10 MHz clock continuously

Table 5: T

LA5000 channel width and depth

Characteristic Description

Product

TLA5201

TLA5202

TLA5203

TLA5204

ChannelsNumber of channels

32 data an

d2clock

64 data and 4 clock

96 data, 4 clock, and 2 qualiﬁer

128 data,

4 c lock, and 4 qualiﬁer

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 7

Speciﬁcations

Table 5: TLA5000 channel width and depth (cont.)

Characteristic Description

Acquisition memory depth

Product Memory depth

TLA520XB 2 M or optionally 8 M or 32 M

TLA520X 512 K or optionally 2 or 8 M

PowerFlex op

tions

Table 6: Reference clock (CLK10)

Characteristic Description

Clock accuracy

10 MHz ±100 ppm

samples

8 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Speciﬁcations

Table 7: TLA500

0 clocking

Characteristic Description

Asynchronous

Internal sampling period

clocking

500 ps to 50 ms i store data when it has changed (transitional storage)

2 ns minimum for all channels

1nsminimumfo

0.5 ns minimum for quarter channels (using 4:1 demultiplex mode)

Minimum r ecognizable word2(across all channels)

Channel-to-channel skew + sample uncertainty

Example: for a 2 ns sample period and a P6419, or P6434 Probe = 400 ps + 2 ns = 2.4 ns

Synchronous c

Number of mas

locking

ter clock channels

Product

TLA5201

TLA5202

TLA5203

TLA5204

Number of qualiﬁer channels

Product

TLA5201

TLA5202

TLA5203

TLA5204

Setup and hold w indow size

Setup and hold window size (Typical)

1 ns maximum, any clock to any single data or qualiﬁer channel

1.5 ns, all channels

n a 1-2-5 sequence. Storage control can be used to only

r half channels (using 2:1 demultiplex mode)

Clock Channe

Qualiﬁer Channels

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 9

Speciﬁcations

Table 7: TLA5000 clocking (cont.)

Characteristic Description

Setup and hold window range For each channel, the setup and hold window can be moved from +8.0 ns

(Ts) to -8.0 ns (Ts) in 0.125 ns steps. The hold time follows the setup time by the setup and hold window size.

Maximum synchronous clock rate

2X Demux clocking

TLA5203, TLA5204

TLA5201, TLA5202

Time between Demultiplex clock edges (Typical) Same limitations as normal synchronous acquisition

4X Demux clocking

TLA5203, TLA5204

235 MHz in full speed mode (4.25 ns minimum between active clock edges)

Any individual channel may be demulti plexed with its partner channel. Channels demultiplex as follows:

A3(7:0) to/from

A2(7:0) to/from

A1(7:0) to/from

A0(7:0) to/from

C3(7:0) to/from

C2(7:0) to/from

E3(7:0) to/from

E2(7:0) to/from

CK3 to/from

CK2 to/from

CK1 to/from

CK0 to/from

Any individual channel may be demulti plexed with its partner channel. Channels demultiplex as follows:

A3(7:0) to/from

A2(7:0) to/from

A1(7:0) to/from

A0(7:0) to/from

Unlike 2X demultiplexing, the channels within a group of four cannot arbitrarily drive the others.

E3(7:0) to

A3(7:0) to

A1(7:0) to

C3(7:0) to

CK3 to

CK1 to

D3(7:0)

D2(7:0)

D1(7:0)

D0(7:0)

C1(7:0)

C0(7:0)

E1(7:0) (TLA5204 only)

E0(7:0) (TLA5204 only)

Q2 (TLA5204 only)

Q3 (TLA5204 only)

C3(7:0)

C2(7:0)

D1(7:0) (TLA5202 only)

D0(7:0)( TLA5202 only)

E2(7:0), E1(7:0), E0(7:0) (TLA5204 only)

A2(7:0), D3(7:0), D2(7:0)

A0(7:0), D1(7:0), D0(7:0)

C2(7:0), C1(7:0), C0(7:0)

CK2, Q3, Q2 (TLA5204 only)

CK0, Q1, Q0

10 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Speciﬁcations

Table 7: TLA5000 clocking (cont.)

2X Demux clocking

TLA5201, TLA5202

Unlike 2X demultiplexing, the channels within a group of four cannot arbitrarily drive the others.

A1(7:0) to

C3(7:0) to

A0(7:0), D1(7:0), D0(7:0) TL:A5202 only

C2(7:0), A3(7:0), A2(7:0)

Time between Demultiplex clock edges (Typical) Same limitations as normal synchronous acquisition

Clocking state machine

Pipeline delays

Each channel can be programmed with a pipeline delay of 0 through 7 active clock edges.

It is possib

Applies to asynchronous clocking only. Setup and hold window speciﬁcation applies to synchronous clocking only.

Any or all of the clock channels may be enabled. For an enabled clock channel, either the rising, falling, or both edges can be selected as the active clock edges. The clock channels are stored.

All qualiﬁer channels are stored. For custom clocking there are an additional 4 qualiﬁer channels on C2 3:0 regardless of channel width.

le to use storage control and only store data when it has changed (transitional storage).

Table 8: TLA5000 trigger system

Characteristic Description

Triggering Resources

Word/Range recognizers

16 word recognizers. The word recognizers can be combined to form full width, double bounded, range recognizers. The following selections are available:

16 word recognizers

13 word recognizers

10 word recognizers

7 word recognizers

4 word recognizers

Range recognizer channel order

From most-signiﬁcant probe group to least-signiﬁcant probe group: C3 C2 C1 C0 E3 E2 E1 E0 A3 A2 D3 D2 A1 A0 D1 D0 Q3 Q2 Q1 Q0 CK3 CK2 CK1 CK0

Missing channels for instruments with fewer than 136 channels are omitted.

Glitch detector

Channel groups can be enabled to detect glitches.

Glitches are subject to pulse width variations of up to ±125 ps

Minimum detectable glitch pulse width (Typical)

Setup and hold violation detector

1.25 ns (single channel with P6434 probe)

1.0 ns (P6410, P6417, P6418, P6419 probe)

Any channel can be enabled to detect a setup or hold violation. The range is from 8.0 ns before the clock edge to 8.0 ns after the clock edge in 0.125 ns steps. The channel setup and hold violation size can be individually programmed.

The range can be shifted towards the positive region by 0 ns, 4 ns, or 8 ns. With a 0 ns shift, the range is +8 ns to -8 ns; with a 4 ns shift, the range is +12 ns to -4 ns; with an 8 ns shift, the range is +16 ns to 0 ns. The sample point selection region is the same as the setup and hold window.

Any setup value is subject to variation of up to the channel skew speciﬁcation. Any hold value is subject to variation of up to the channel skew speciﬁcation.

0 range recognizers

1 range recognizer

2 range recognizers

3 range recognizers

4 range recognizers

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 11

Speciﬁcations

Table 8: TLA5000 trigger system (cont.)

Characteristic Description

Transition detector

Counter/Timers 2 counter/timers, 51 bits wide, can be clocked up to 500 MHz.

External Signal In

External Trigger In A backplane input signal that causes both the main acquisition and the MagniVu acquisition

Active trigger resources

Trigger States

Trigger State sequence rate

Trigger Mac

Main acquisition trigger Triggers the main acquisition memory.

Main trigger position

MagniVu™ acquisition trigger

MagniVu™ trigger position

Increment

& decrement counter

Reloadable word recognizer

Reloadable word recognizer latency

Start/Stop timer Either of the two counter/timers used as timers can be s tarted or stopped.

Reset counter/timer Either of the two counter/timers can be reset.

Signal out

Trigger o

Storage C

Global st

ontrol

orage

hine Actions

16 transition detectors.

Any channel group can be enabled or disabled to detect a rising transition, a falling transition, or both rising and falling transitions between the current valid data sample and the previous valid data sample.

Maximum count is 2

Maximum time is 4.5 X 10

-1.

seconds or 52 days.

Counters and timers can be set, reset, or tested and have zero reset latency.

A backplane input signal.

to trigger if they are not already triggered.

16 maximum (excluding counter/timers)

Word recognizers are traded off one-by-one as External Signal In, glitch detection, setup and hold detection, or transition detection resources are added.

Same rate as valid data samples received, 500 MHz maximum.

Trigger position is programmable to any data sample (2 ns boundaries).

Triggering of MagniV memory is controlled by the main acquisition trigger machine.

The MagniV trigger position is programmable within 2 ns boundaries and separate from the main acquis

Either of t

Loads the c

ition memory trigger position.

he two counter/timers used as counters can be increased or decreased.

urrent acquired data sample into the reference value of the word recognizer via a trigger machine action. All data channels are loaded into their respective word recognizer reference register on a one-to-one manner.

378 ns

When a cou

nter/timer is used as a timer and is reset, the timer continues from the started or

stopped state that it was in prior to the reset.

A signal s

A trigger

Storage i

ent to the backplane to be used by other instruments.

out signal sent to the backplane to trigger other instruments.

s allowed only when a speciﬁc condition is met. This condition can use any of the trigger machine resources except for the counter/timers. Storage commands deﬁnedinthe current trigger state will override the global storage control.

Global s

torage can be used to start the acquisition with storage initially turned on (default) or

turned off.

12 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Speciﬁcations

Table 8: TLA5000 trigger system (cont.)

Characteristic Description

By event

Block storage

Glitch violation storage The acquisition memory can be enabled to store glitch violation information with each data

Setup and hold violation storage The acquisition memory can be enabled to store setup and hold violation information with each

Each use of

Any glitch is subject to pulse width variation of up to the channel-to-channel skew speciﬁca tion + 0.25 ns.

Any setup value is subject to variation of up to the channel skew speciﬁcation. Any hold value is subject to variation of the channel skew speciﬁcations.

External Signal In, glitch detector, setup and hold violation detector, or transition detector requires a trade-off of one word recognizer resource.

Storage can be turned on or off; only the current sample can be stored. The event storage control overrides any global storage commands.

When enabled, 31 samples are stored before and after the valid sample.

Not allowed when glitch storage or setup and hold violation is enabled.

sample when asynchronous clocking is used. The probe data storage size is reduced by one half (the other half holds the violation information). The fastest asynchronous clocking rate is reduced to 4 ns.

data sample when synchronous clocking is used. The probe data storage size is reduced by one half (the other half holds the violation information). The maximum clock rate in this mode is 235 MHz.

Table 9: TLA5000 MagniVu feature

Characteristic Description

MagniVu memory depth 16,000 samples per channel

MagniVu sampling period Data is asynchronously sampled and stored every 125 ps in a separate

high resolution memory. The storage speed may be changed (by software) to 250 ps, 500 ps, or 1000 ps so that MagniVu memory covers more time at a lower resolution.

Table 10: TLA5000 Data Placement

Charact

System t

Data cor

eristic

ime zero placement error (Typical)

relation error (Typical)

Descrip

±4 ns + backplane 10 MHz skew

All stor

±200 ps + system time zero placement error

tion

ed data is referenced to this point.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 13

Speciﬁcations

Table 10: TLA5000 Data Placement (cont.)

Characteristic Description

Relative timestamp accuracy (Typical)

Timestamp counter and resolution 125 ps resolution

±100 ps + sample uncertainty + backplane 10 MHz clock jitter and tolerance

This speciﬁcationcanbeusedtoindicatetheaccuracyofatime measurement between samples. When measuring between samples, only the time difference between samples should be used to i ndicate accuracy. For example, if one sample has a timestamp of one hour and another sample has a timestamp of one hour and 10 ms, the 10 ms is the period of time used to determine the amount of error caused by the 10 MHz clock tolerance.

3.25 days duration

Table 11: TLA5000 Data handling

Character

Nonvolati

istic

le memory retention time (Typical)

Descripti

Battery is

integral to the NVRAM. Battery life is > 10 years.

Table 12: TLA5000B internal controller

Characteristic Description

Operating system Microsoft Windows

Microprocessor

Main memory

Cache memory

Real-time clock and CMOS setups NVRAM

Hard disk drive

Style 184 pin DDR2 SDRAM DIMM gold-plated

Speed 266 MHz DDR2 PC2100

Installed conﬁguration

Maximum conﬁguration 4 GB (four 1 GB DIMMs)

Capacity

Style

Intel Celeron, 2.93 GHz

512 MB

Level 2 (L2) Write-back cache

256 KB

Integrated

Real-time clock/calendar. Standard and advanced PC CMOS setups. Battery life is typically > 3 years when the logic analyzer is not connected to line voltage. When connected to line voltage the life of the battery is extended. Lithium battery, CR2032

80 GB standard PC compatible IDE (Integrated Device Electronics) hard disk drive residing on a serial ATA interface.

Continually subject to change due to the fast-moving PC component environment. Storage capacities valid at product introduction.

14 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Table 12: TLA5000B internal controller (cont.)

Characteristic Description

CD-DVD drive Standard PC compatible IDE (Integrated Device Electronics)

CD-RW/DVD-R drive residing on an EIDE interface.

Continually subject to change due to the fast-moving PC component environment.

Floppy disk drive

Standard 3.5 inch 1.44 MB PC compatible high-density, double-sided ﬂoppy disk drive on the USB bus

Table 13: TLA5000 internal controller

Speciﬁcations

Character

Operating

Microprocessor

Main memory

Real-time clock and CMOS setu play NVRAM retention time

Hard disk drive

CD-RW drive Standard PC compatible IDE (Integrated Device Electronics) CD-RW drive

Floppy disk drive

istic

system

ps, plug &

Descripti

Microsoft

Intel Cele

PC2100 DDR

Style 184 pin DI

Speed

Installe

dconﬁguration

100 MHz

512 MB loaded in one socket

Battery l to line voltage. When connected to line voltage the life of the battery is extended. Lithium battery, CR2032

80 GB standard PC compatible IDE (Integrated Device Electronics) hard disk dri

Continually subject to change due to the fast-moving PC component environment. Storage capacities valid at product introduction.

residi

Continually subject to change due to the fast-moving PC component environment.

Standard 3.5 inch 1.44 MB PC compatible high-density, double-sided ﬂoppy d

Windows

ron, 2 GHz

SDRAM

MM, 2 Sockets

ife is typically > 3 years when the logic analyzer is not connected

ve residing on an EIDE interface.

ng on an EIDE interface.

isk drive.

Table 14: TLA5000 display system

Characteristic Description

Display memory

Display selection

8 MB SDRAM-onboard the ATI Mobility I video controller

Hardware sense of external SVGA monitor connected to the external primary display connector prior to the BIOS boot sequence enables the operation of that display output. The internal LCD display is enabled at all times. The internal LCD and the primary external displays operate at the same resolution (limited to 1024 X 768 on current TFT LCD) and display rates. Dynamic Display Conﬁguration 1 (DDC1) support for the external SVGA monitor is provided.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 15

Speciﬁcations

Table 14: TLA5000 display system (cont.)

Characteristic Description

Display modes

External display drive

Internal D isplay

Primary display size (RAGE M1 chip)

Secondary display size (845GV chip)

Classiﬁcation Thin Film Transistor (TFT) 10.4 inch active-matrix color LCD display; CCFL backlight;

Resolution 1024 x 768 pixels

Color Scale

Refresh rate

Three displays can be driven independently, the LCD display and two external displays. The LCD display and one of the external displays are driven from the ATI RAGE Mobility M1 chip and are the primary displays; the two displays are independent. A third display is the second external display port driven from the motherboard (secondary display).

TwoVGa, SVGA, or XGA-compatible analog output ports.

Display size selected via Windows

Resolution (pixels) Colors Refresh rates

1024 x 768, 1280 x 1024, or 1600 x 1200

Resolution (pixels) Colors Refresh rates

640 x 480

800 x 600

1024 x 768

1280 x 1024

1600 x 1200

1920 x 1440

intensity controllable via software.

256K

256, 64 K , 16.8 M 60, 75, 85, 100

256, 64 K , 16.8 M

256, 64K

60, 75, 85

60, 75

Table 15: T

Characteristic Description

QWERTY ASCII to support naming of ﬁles, traces, and keyboard equivalents of

Special Function Knobs Various functions

LA5000 front-panel interface

pointing device inputs for menus.

Table 16: TLA5000 rear-panel interface

Characteristic Description

Parallel Interface Port (LPT) 25-pin sub-D Parallel Port Connector, Extended Parallel Port (EPP), or

Enhanced Capabilities Port (ECP)

Serial Interface Port (COM 1) 9-pin male sub-D connector to support RS-232 serial port

Two USB Ports Two USB 2.0 (Universal Serial Bus) compliant ports

SVGA Output Ports (SVGA OUT) 15-pin sub-D SVGA connectors (two each, one Primary, one Secondary)

16 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Table 16: TLA5000 rear-panel interface (cont.)

Characteristic Description

Mouse Port

Keyboard Port

PS/2 compatible mouse port utilizing a m ini DIN connector

PS/2 compatible keyboard port utilizing a mini DIN connector

Table 17: TLA5000 AC power source

Characteristic Description

Source Voltage and Frequency 100 V

Maximum Power Consumption

Steady-State Input Current

Inrush Surge Current

Power Factor Correction

240 Watts line power maximum

65 A maximum

Yes

On/Standby Switch and Indicator Front Panel On/Standby switch, w ith indicator.

The power c

RMS

maximum

RMS

to 240 V

±10%,47Hzto63Hz

RMS

ord provides main power disconnect.

Speciﬁcations

Table 18: TLA5000 cooling

Characteristic Description

Cooling System Forced air circulation (negative pressurization) utilizing two fans operating

in parallel

Cooling Clearance 51 mm (2 in), sides and rear; unit should be operated on a ﬂat,

unobstructed surface

Table 1

Characteristic Description

Overall Dimensions (See Figure 1.)

Weight

9: TLA5000 mechanical characteristics

Includes empty accessory pouch and front cover

TLA52

TLA5202

TLA5203

TLA520

11.8Kg(25lb15oz)

11.85Kg(26lb2oz)

11. 9 K

12Kg(26lb7oz)

g(26lb4oz)

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 17

Speciﬁcations

Figure 1: Dimensions of the TLA5000 series logic a nalyzer

18 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

External Oscilloscope (iView) Characteristics

External Osci

lloscope (iView) Characteristics

The following

table lists the characteristics for iView (Integrated View) and for the Tektronix logic analyzer when connected to an external oscilloscope. For detailed information on the individual speciﬁcations of the external oscilloscope, refer to the documentation that accompanies the oscilloscope.

Table 20: External oscilloscope (Integrated View or iView) characteristics

Characteri

Supported T

TLA applica

Minimum recommended TLA controller RAM

Supported external oscilloscopes as of January, 2008

(For the lat visit our Web site at www.tektronix.com.)

External oscilloscope software or ﬁrmware version number

Maximum numb

iView cable length

stic

ektronix logic analyzer instruments

tion software version

est list of supported external oscilloscopes,

er of external oscilloscopes

Descriptio

TLA5000 and TLA5000B series

TLA7012, TL

V5.1SP1 or g

256 MB

TDS1000, TDS200023, T DS 1000B and TDS2000B Series

TDS3000 and module required)

DPO4000 and MSO4000 Series

TDS5000 and

TDS6000, TDS6000B, and TDS6000C Series

DPO7000 and DPO7000B Series

DPO70000 an

TDS7000 and TDS7000B Series

CSA7000 and CSA7000B Series

TDS654C, TD

TDS754C, T DS784C, TDS724D, TDS754D, TDS784D, TDS794D

Product Version

TDS684C, TD

TDS3000 series

DPO4000 series

TDS5000 seri

TDS6000 series

DPO7000 series

TDS7000, CSA

One per Tektr

6.56 ft (2 m)

A7016

reater

TDS3000B Series (TDS3GM GPIB/RS-232 communication

TDS5000B Series

d DSA70000 series

S684C, TDS694C

S694C

7000 series

onix logic analyzer mainframe

Any version

Version 1.2 or greater

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 19

External Oscilloscope (iView) Characteristics

Table 20: External oscilloscope (Integrated View or iView) characteristics (cont.)

Characteristic Description

Time correlation uncertainty6(Typical at system trigger)

If RAM is less than 256 MB, the record length of the external oscilloscope may be limited to 1 M.

An GPIB extender is needed to connect the iView cable to the oscilloscope. One end of a standard GPIB cable can be used.

If you encounter possible alignment problems with the logic analyzer and oscilloscope waveform edges, refer to Aligning Logic Analyzer and Oscilloscope Waveform Edges. (See page 20, Aligning Logic Analyzer and Oscilloscope Waveform Edges.)

AGPIBtoUSBa

When used with a TLA7016 mainframe and an external PC (such as TLA7PC1), the instruments must be physically located close together so that the iView cable can span both instruments. Removing the sleeving from the iView cable assembly increases the spacing distance available between the external PC and the TLA7016 mainframe.

Includes sampling uncertainty, typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a typical number for the measurement.

dapter (TEK-USB-488) is required to connect the iView cable to the oscilloscope.

3 ns Logic analyzer triggers external

oscilloscope

(2 ns + logic analyzer sample period + external oscilloscope sample period)

5ns

External oscilloscope triggers logic analyzer

(4 ns + logic analyzer sample period + external oscilloscope sample period)

Aligning Logic Analyzer

and Oscilloscope

Waveform Edges

The ﬁrst time that you take an acquisition after changing the horizontal scale setting on TDS1000, TDS1000B, TDS2000, or TDS2000B series oscilloscopes, the logic analyzer and oscilloscope waveform edges may not be aligned within the listed speciﬁcation. You can realign the waveform positions in the waveform window tha

t contains the oscilloscope data (Menu bar > Data > Time Alignment). Make sure that the external oscilloscope is the data source and then adjust the time offset to align the waveforms. Use the following approximate offsets for various horizontal scale settings. (See Table 21.)

Table 21: TDS1000, TDS1000B, TDS2000, and TDS2000B Series oscilloscope waveform edge alignment

Horizontal scale Time offset

100 ns

250 ns –11 ns

500 ns –18 ns

1 μs –12 ns

2.5 μs –50 ns

5 μs

10 μs –250 ns

25 μs –650 ns

–5 ns

–120 ns

20 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

This chapter contains procedures for functional veriﬁcation, certiﬁcation, and performance veriﬁcation procedures for the TLA5000 and TLA5000B series logic analyzer mai year or following repairs that affect certiﬁcation.

Summary Veriﬁcation

Functional veriﬁcation procedures verify the basic functionality of the instrument inputs, outputs, and basic instrument actions. These procedures include power-on diagnostics, extended diagnostics, and manual check procedures. These procedures can be used for incoming inspection purposes.

Performance veriﬁcation procedures conﬁrm that a product meets or exceeds the performance requirements for the published speciﬁcations documented in the Speciﬁcations chapter of this manual. The performance veriﬁcation procedures certify t standards.

nframes. Generally, you should perform these procedures once per

he accuracy of an instrument and provide a traceability path to national

Certi

ﬁcation

As you co calibration data report to keep on ﬁle with your instrument. A blank copy of the calibration data report is provided with this manual. The calibration data report is intended to be copied and used to record the results of the calibration/certiﬁcation procedures.

The system clock of the controller is checked for accuracy, and the input probe channels are checked for threshold accuracy and setup and hold accuracy. The instr performance veriﬁcation procedures and record the certiﬁable parameters in a copy of the Calibration Data Report at the end of this chapter.

mplete the performance veriﬁcation procedures, you can ﬁll out a

ument is certiﬁable if these parameters meet speciﬁcations. Complete the

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 21

Performance Veriﬁcation Procedures

Test Equipment

These procedures use external, traceable signal sources to directly test characteristics that are designated as checked this manual. Always warm up the equipment for 30 minutes before beginning the procedures.

in the Speciﬁcations chapter of

Table 22: Tes

Item number a description Minimum requirements Example

1. Logic analy

2. Logic analyzer probes

3. Frequency counter

4. Digital ti

generator

5. DC voltage source (see footn

6. Digital multimeter with probes

7. Cable, pr 50 Ω coaxial

8. Setup and Hold test ﬁxture

9. Threshold Accuracy test ﬁxture

Some timing generators (for example, the Tektronix DTG5274) include an internal DC voltage source that can be used instead of a separate power source.

Only needed to verify the output of the voltage source if the source does not meet speciﬁcation. In this case, the DMM becomes the traceable instrument.

t equipment

zer

ming

ote)

ecision

TLA5000 or T

General purpose Tektronix logic analyzer probes; one probe required fo

Frequency 100 MHz

>235 MHz, ± 0.1% accuracy

DC output: 0–5 V, ± 0.1% accuracy

0–5 V, ± 0.1% accuracy Tektronix PS281

6.5 digit display, 35 ppm, 1 year accuracy, 1000 readings per minute

50 Ω,36in

User-built (See page 34, Te st Fi xt u re s .)

LA5000B series logic analyzer

r every 17 channels.

accuracy: <0.0025% Frequency range: 1 kHz to

, male-to-male BNC connectors

TLA5201, TL TLA5202B, TLA5203, TLA5203B, TLA5204, TLA5204B

P6410, P6417, or P6418

Agilent 33131A

Tektronix DTG5274

Fluke 8845

Tektronix part number 012-0482-XX

A501B, TLA5202,

A/8846A

22 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

Functional Ve

Power-on a

riﬁcation

nd Fan

Operation

The following table lists functional veriﬁcation procedures for the benchtop and portable mainframes. If necessary, refer to the TLA5000B Series Logic Analyzer

Installatio

Table 23: Functional veriﬁcation procedures

Instrument Procedure

TLA5000 Series logic analyzers

Complete the following steps to check the power-on and fan operation of the logic analyzer:

1. Power on the instrument and observe that the On/Standby switch illuminates.

2. Check that the fans spin without undue noise.

3. If there are no failures indicated, the power-on diagnostics pass when you

n Manual for installation instructions.

Power-on and fan operation

Power-up diagnostics

Extended diagnostics

CheckIt Utilities diagnostics

power on the mainframe(s).

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 23

Performance Veriﬁcation Procedures

Extended Diagnostics

Do the followin

NOTE. Running the extended diagnostics will invalidate any acquired data. If

you want to save any of the acquired data, do so before running the extended diagnostics.

Prerequisites Warm-up time: 30 minutes

Perform the following tests to complete the functional veriﬁcation procedure:

1. If you have not already done so, power on the instrument and start the logic analyzer application if it did not start by itself.

2. Go to the System menu and select Calibration and Diagnostics.

3. Verify that all power-on diagnostics pass.

4. Click the Extended Diagnostics tab.

5. Select All

sheet.

All tests status depending on the outcome of the tests.

g steps to run the extended diagnostics:

Modules, All Tests, and then click the Run button on the property

that displayed an "Unknown" status will change to a Pass or Fail

CheckIt Utilities

6. Scroll th

CheckIt Utilities is a comprehensive software application used to check and verify the operation of the hardware in the instrument. To run the software, you must have ei

NOTE. To check the DVD/CD drive, you must have a test disc installed before

starting the CheckIt CD-ROM test. The disc needs to contain a ﬁle with a size between 5 MB and 15 MB.

To run CheckIt Utilities, follow these instructions:

1. Quit the logic analyzer application.

2. Click the Windows Start button.

3. Select All Programs → CheckIt Utilities.

4. Run the tests. If necessary, refer to the CheckIt Utilities online help for

information on running the software and the individual tests.

rough the tests and verify that all tests pass.

ther a keyboard, mouse, or other pointing device.

24 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

Performance V

Tests Performed

eriﬁcation

This section contains procedures to verify that the instrument performs as warranted. Verify instrument performance whenever the accuracy or function of your instrum

Do the following tests to verify the performance of the TLA5000 Series logic analyzers. (See Table 24.) You will need test equipment to complete the performanc equipment, always choose instruments that meet or exceed the minimum requirements speciﬁed.

Also note that setup procedures for your equipment may differ from those described in the procedures, due to changes in the equipment or ﬁrmware. For example, output connectors might be BNC or SMA, and setup menus can differ between models.

Table 24: Parameters checked by veriﬁcation procedures

Parameter Veriﬁcation method

System clock (CLK10) accuracy

Threshold accuracy

Setup and hold window size (data and qualiﬁers)

Channel-to-channel skew Veriﬁed indirectly by the setup and hold

Internal sampling period

Minimum recognizable word (across all channels)

Maximum synchronous clock rate

Counters and timers Veriﬁed by diagnostics

Trigger state sequence rate

tiﬁable parameter

Cer

ent is in question.

everiﬁcation procedures. (See Table 22 on page 22.) If you substitute

Veriﬁed by the 10 MHz system c lock test

Veriﬁed by the threshold a ccuracy test. Certiﬁed by running the certiﬁcation procedure.

Veriﬁed directly by setup and hold procedure.

procedure

Veriﬁed indirectly by the 10 MHz system clock test

Veriﬁed indirectly by the setup and hold procedure and by the Internal Sampling Period

Diagnostics verify the clock detection/sampling circuitry. Bandwidth is veriﬁed indirectly by the at-speed diagnostics, the setup and hold test, and the clock test.

Veriﬁed indirectly by at-speed diagnostics

Prerequisites

Thelogicanalyzer,testﬁxture, and o ther related test equipment must be installed, connected, and operating for at least 30 minutes at an ambient temperature

tween +20 C and +30 C.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 25

Performance Veriﬁcation Procedures

Checking the 1

0 MHz System Clock (CLK10)

The following procedure checks the accuracy of the 10 MHz system clock:

Equipment re

Prerequisite

1. Verify that all of the prerequisites above are met for the procedure.

2. Connect the f

on the instrument.

3. Select Syst

4. In the System Conﬁguration dialog box, select 10 MHz Clock from the list of

routable si

5. Verify that the output frequency at the External Signal Out connector is 10 MHz ±1 kH report and disconnect the frequency counter.

6. In the Syst to None.

quired

requency counter to the External Signal Out BNC connector

em Conﬁguration from the System menu.

gnals in the External Signal Out selection box and click OK.

z. Record the measurement on a copy of the calibration data

em Conﬁguration dialog box, reset the External Signal Out signal

Frequency co

Precision BNC cable

Warm-up time:

unter

30 minutes

26 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Threshold Accuracy

Performance Veriﬁcation Procedures

This procedure veriﬁes the threshold voltage accuracy of the logic analyzer.

Test Equipment Setup

TLA5000 Setup

Equipment required

Prerequisites Warm-up time: 30 minutes

Precision vol generator and precision digital voltmeter

Threshold Accuracy test ﬁxture

Logic analyze

tage reference or a DC signal

r probe

Connect a P6410, P6417, or P6418 probe from the logic analyzer to the voltage source, using the Threshold Accuracy test ﬁxture. If the voltage source does not have the req

uired output accuracy, use a multimeter with the required accuracy to

verify the voltage output levels speciﬁed in the procedure.

To set up the logic analyzer for this test, you must deﬁne the characteristics of the channel t

hat you are testing, and then set the trigger parameters:

1. Open the Setup window, and in the Probe Channel table, delete all the groups. You will

deﬁne new groups in the following steps.

2. In the Group column, enter a name for the probe group that you are testing (“Test”

in the example).

a. Deﬁne the probe channels for the group that you are testing.

Figure 2: Deﬁning group parameters

b. Set the clocking to Internal, 2 ns.

c. Set Acquire to Normal.

d. Set the Memory Depth to 128 K or less.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 27

Performance Veriﬁcation Procedures

4. Go to the Trigge program that triggers the logic analyzer when it doesn’t see all highs or all lows:

a. Click the If Then button.

b. Set the chann

r window and select the Power Trigger tab. Create a trigger

el deﬁnition to match the ﬁgure below.

Figure 3: S etting trigger parameters

c. Click OK.

28 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

Veriﬁcation Procedure

Complete the fo the copy of the Calibration Data Sheet.

1. Go to the Setup voltages to 4 V.

2. Set the volta

3. Start the logic analyzer and verify that it does not trigger.

4. Increase the voltage in 10 mV steps, waiting at least 3 seconds between steps

to make sure that the logic analyzer continues to run without triggering. Continue un

5. Set the voltage source to 4.12 V.

6. Start the logic analyzer and verify that it does not trigger.

7. Decrease the voltage in 10 mV steps, waiting at least 3 seconds between

steps to make sure that the logic analyzer continues to run without triggering. Continue until the logic analyzer triggers and then record the voltage.

8. Add the two voltage values and divide by two. Verify that the result is

4.00 V ±100 m V. Record the voltage on the Calibration Data Sheet.

9. Go to the Setup window and set the logic analyzer threshold volta ges to –2.0 V.

llowing steps to complete this procedure. Record the results on

window of the logic analyzer and set the probe threshold

ge source to 3.88 V.

til the logic analyzer triggers and then record the voltage.

10. Repeat steps 3 through 8 for –2.12 V and –1.88 V.

11. Repeat the procedure for each probe channel group that you want to verify.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 29

Performance Veriﬁcation Procedures

Setup and Hold

This procedure veriﬁes the setup and hold speci ﬁ cations of the logic analyzer.

Digital Timing Generator

Setup

Equipment re

Prerequisites Warm-up time: 30 minutes

quired

Digital timi

Precision BNC cable

Setup and Hold test ﬁxture

ng generator

1. Verify that the digital timing generator (DTG) has been calibrated so that the channel-to-channel skew is minimized.

2. Set up the DTG so that a channel (CH1 for example), is set to be a clock pattern of alternating 1 and 0 (101010… binary) starting with 1 (rising edge).

3. Set the output frequency to 235MHz. (This may require you to set the DTG base clock

to 470 MHz for this pattern to represent 235 MHz at the channel

output.)

4. Set anoth

er channel of the DTG (CH2 for example) to a data pattern representing half the period of CH1 (for example 001100110011...binary, starting with 00).

5. Connect the setup and hold test ﬁxtures to the DTG channels that you have set up. Connect 50 Ω SMA terminations to the test ﬁxtures.

6. Connect the DTG channel that you set up as a clock to the appropriate TLA CK[x] input.

7. Connect the other DTG channel to two of the TLA data channels that you want to test.

If you want to test other TLA data channels simultaneously and your DTG has additional outputs available, set up those DTG channels like the ﬁrst data channel, and connect them to the other logic analyzer channels that you want to test. (You will need another test ﬁxture for each additional channel pair.) Otherwise, repeat the procedure for each new pair of logic analyzer channels.

8. SettheterminationtoopenoneachDTGchannel.

9. Set the DTG output voltage levels to 2.50V High and 0.0V Low, with no

offset.

30 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

TLA5000 Setup

1. Start the TLA Ap

2. Click the DM button to default the module.

3. Set the following parameters:

a. Clocking: External

b. Acquire: Norm

c. Acquisition Length: 1K or greater

d. Click More… Select the positive edge of the clock line that you will be

using to clock the data (CK[x] in the example).

4. Close the External Clocking dialog box.

5. While still in the Setup window, open the Probes dialog box and select the

Thresholds tab.

6. Enter .62 and click Set All.

With the 50 Ω external termination attached at the SMA ﬁxture end, this sets the logic analyzer threshold voltage levels to one-half the resulting termination voltage, which should be about 620 mV (not 1.25 V).

7. Create a new group: right click in the Group Name column.

plication and open the Setup Window.

8. Select Add Group from the pop-up window. Rename the new group Test.

9. In the Probe Channels column, enter the names of the two adjacent data

channels that will be used to connect to CH2 of the DTG.

Trigger Logic. To complete the setup, you must conﬁgure a trigger to occur whenever the two data lines are neither 00 nor 11 (binary). This will capture the cond common values. To set this up, do the following:

10. Open the

ition when the two data signals are 01 or 10, as they transition to their

LA Trigger window and select the Power Trigger tab. Set up three

states as shown. (See Figure 4 on page 32.)

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 31

Performance Veriﬁcation Procedures

Figure 4: Set the trigger states

32 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Performance Veriﬁcation Procedures

Veriﬁcation Procedure

Complete the fo on the Calibration Data Sheet.

1. Press the RUN b

2. Increase the delay of the DTG clock channel (starting from 0.000 ns), until

triggering b

Note that the logic analyzer might trigger because of a glitch when you make a delay chang transitioning at the same time and at the correct frequency), then ignore this "false trigger" and start the logic analyzer again.

As an alternative, you may want to run the logic analyzer in continuous loop mode if the DTG causes a false trigger on the logic analyzer each time you change the delay. Then observe if the data is correct in the waveform window and ignore any false triggers. Continue increasing the clock delay until the waveform window displays data that was not acquired correctly. Record this delay.

3. Add1.00nstothedelayvaluethatyourecordedinstep2andincreasethe DTG cloc measured 0.85 ns, increase the delay to 1.85 ns.)

4. Press Ru that the setup and hold window is 1.00 ns or less, which is the guaranteed speciﬁcation for a single channel. If you are testing more than one channel, you may need to add 1.50 ns to the value that you recorded in step 2 (1.5 ns is the typical speciﬁcation for multiple channels).

llowing steps to complete this procedure. Record the results

utton and wait a few seconds to verify that it doesn’t trigger.

egins to occur. Record this delay amount.

e. If the data in the waveform window is correct (all data

k delay to match this cumulative value. (For example, if you

n and wait a few seconds to verify that it doesn’t trigger. This veriﬁes

If you want to measure the actual setup and hold window size for your application, slowly decrease the clock delay in steps (waiting a few seconds between steps to verify that it doesn’t trigger), until the logic analyzer triggers.

rd this second value. The difference between this second value and the

Reco value that you measured in step 2 is the measured setup and hold window size.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 33

Test Fixtures

This section includes information and procedures for building the test ﬁxtures used in the performance veriﬁcation tests.

Threshold Accuracy Test Fixture

Use this ﬁxture to gain access to the logic analyzer probe pins. The ﬁxture connects all ground pins together, and all signal pins together.

Equipment Required

Build Procedure

You will need the following items to build the test ﬁxture:

Item Description Example part number

Square-pin strip

Wire 20 gauge

Soldering iron and solder

Use the following procedure to build the test ﬁxture.

1. Set the square-pin strip down and lay a wire across one row of pins on one side of the insulator as shown. Leave some extra wire at one end for connecting to a test lead. (See Figure 5.)

2. Solder the wire to each pin in the row.

3. Repeat for the other row of pins.

0.100 x 0.100, 2 x 8 contacts (or two 1 x 8 contacts )

50 W

SAMTEC part number TSW-102-06-G-S

Figure 5: Threshold Accuracy test ﬁxture

34 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Test Fixt u r es

Setup and Hold

Equipment Required

Build Procedure

Test Fixture

This ﬁxture provides square-pin test points for logic analyzer probes when they are used to probe in-line SMA connections. Note that you need a m inimum of two test ﬁxtures

You will need the following items to build the test ﬁxture:

Item Descriptio

SMA connect required for each ﬁxture)

Square-pin strip

SMA termination 50 Ω, ≥2 GHz bandwidth

SMA adapter

Soldering iron and solder

Use the fo

to complete the procedure.

or (two

Female, PCB

0.100 x 0.1 (or two 1 x 2 contacts )

Male-to-male Johnson part number

50 W

mount

00, 2 x 2 contacts

llowing procedure to build the test ﬁxture.

Example par

SV Microwav 2985-6035, -6036, or -6037

SAMTEC part number TSW-102-06-G-S

Johnson part number 142-0801-866

142-0901-811

t number

e part number

1. Arrange one SMA connector as shown. (See Figure 6.)

2. Align the square pins at a right angle to the connector.

Figure 6: Solder square pins to the SMA connector

3. Solder one set of square pins to the SMA ground conductor.

4. Solder the other set of square pins to the SMA center conductor.

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 35

Test Fixtures

5. Align the secon conductors of the connectors together. (See Figure 7.)

Figure 7: Solder the SMA connectors together

7. Solder the ground conductors of the SMA connectors together.

8. Attach the termination and coupler to the ﬁxture.

d SMA connector to the ﬁrst as shown and solder the center

Figure 8: Completed ﬁxture with termination and coupler

36 TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation

Calibration Data Report

Calibration D

ata Report

Photocopy thi instrument.

s table and use it to record the performance test results for your

TLA5000 Series

Instrument model number:

Serial number:

Certiﬁcate number:

Veriﬁcation performed by:

Veriﬁcation date:

Test Data

Characteristic Speciﬁcation Tolerance Incoming data Outgoing data

Clock frequency

Threshold accuracy

Setup and hold window:

single channel

multiple channels

10 MHz ±1 kHz

(9.9990 MHz-10.0010 MHz)

+4 V ±100 mV

(3.900 V to 4.100 V)

-2 V ±100 mV (–1.900 V to –2.100 V)

≤1.00 ns ≤1.50 ns

none

TLA5000 Series Product Speciﬁcations & Performance Veriﬁcation 37

Tektronix TLA500 Series Technical Reference

Specifications and Main Features

Frequently Asked Questions

User Manual