Tektronix TekExpress 100G-TXE Compliance Solution Help User manual

TekExpress® 100G-TXE Compliance Solution
Printable Application Help
*P077129802*
077-1298-02
TekExpress® 100G-TXE Compliance Solution
Printable Application Help
www.tek.com
077-1298-02
Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
Contacting Tektronix
Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA
For product information, sales, service, and technical support:
In North America, call 1-800-833-9200.
Worldwide, visit www.tek.com to find contacts in your area.

Table of Contents

Welcome .............................................................................................................................................. v
Getting help and support
Related documentation ................................................................................................................... 1
Conventions .................................................................................................................................... 2
Technical support ........................................................................................................................... 2
Getting started
Minimum system requirements ...................................................................................................... 5
Instruments and accessories required ............................................................................................. 6
Installing the software .................................................................................................................... 7
View software version .................................................................................................................... 7
Application directories ................................................................................................................... 8
File name extensions ...................................................................................................................... 9
Operating basics
Launch the application .................................................................................................................. 11
Application panels overview ........................................................................................................ 12
Global application controls ........................................................................................................... 13
Application controls ................................................................................................................ 13
Options menu overview ........................................................................................................... 16
TekExpress instrument control settings .................................................................................. 17
View connected instruments ................................................................................................... 18
Configure email settings .......................................................................................................... 19
Setup panel ................................................................................................................................... 20
Setup panel overview .............................................................................................................. 20
Set DUT parameters ................................................................................................................ 21
Select tests ............................................................................................................................... 23
Set acquisition tab parameters ................................................................................................. 25
Set configuration tab parameters ............................................................................................. 26
Set preferences tab parameters ................................................................................................ 29
Status panel ................................................................................................................................... 30
Status panel overview .............................................................................................................. 30
Results panel ................................................................................................................................. 31
Results panel overview ............................................................................................................ 31
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Table of Contents
View test-related files .............................................................................................................. 32
Plots panel ..................................................................................................................................... 33
Plots panel overview ............................................................................................................... 33
Reports panel ................................................................................................................................ 35
Reports panel overview ........................................................................................................... 35
Select report options ................................................................................................................ 36
View a report ........................................................................................................................... 37
Report contents ........................................................................................................................ 38
Running tests
Equipment connection diagram .................................................................................................... 39
Prerequisite ................................................................................................................................... 47
Compensate the signal path ..................................................................................................... 47
Deskew .................................................................................................................................... 47
Running tests ................................................................................................................................ 49
Saving and recalling test setup
Test setup files overview .............................................................................................................. 51
Save a test setup ............................................................................................................................ 51
Open (load) a saved test setup ...................................................................................................... 52
Create a test setup from default settings ....................................................................................... 52
Create a test setup using an existing one ...................................................................................... 52
CAUI4 TXE compliance measurements
DC common mode output voltage ................................................................................................ 53
Diff peak-to-peak output voltage - Tx disabled ............................................................................ 54
Diff peak-to-peak output voltage - Tx enabled ............................................................................ 54
AC common mode output voltage ................................................................................................ 55
Single ended output voltage ......................................................................................................... 56
Signaling rate ................................................................................................................................ 57
Eye width and Eye height ............................................................................................................. 58
Vertical eye closure ...................................................................................................................... 60
Transition time .............................................................................................................................. 61
CR4 / KR4 TXE compliance measurements
DC common mode output voltage ................................................................................................ 63
Diff peak-to-peak output voltage - Tx disabled ............................................................................ 64
ii TekExpress® 100G-TXE Printable Application Help
Diff peak-to-peak output voltage - Tx enabled ............................................................................ 65
AC common mode output voltage ................................................................................................ 66
Signaling rate ................................................................................................................................ 67
Output Jitter .................................................................................................................................. 68
Even-odd jitter peak to peak .................................................................................................... 68
Effective bounded and total uncorrelated jitter peak-to-peak ................................................. 68
Signal to noise and distortion ratio ............................................................................................... 69
Transmitter waveform requirements ............................................................................................ 70
Common procedure for transmitter waveform requirements .................................................. 70
Linear fit pulse peak ................................................................................................................ 71
Steady state voltage ................................................................................................................. 71
Minimum pre-cursor full scale ratio ........................................................................................ 72
Minimum post-cursor full scale ratio ...................................................................................... 72
Normalized coefficient step size ............................................................................................. 73
Coefficient initialization ratio ................................................................................................. 74
Table of Contents
SCPI commands
About SCPI command .................................................................................................................. 77
Socket configuration for SCPI commands ................................................................................... 77
TEKEXP:*IDN? ........................................................................................................................... 85
TEKEXP:*OPC? .......................................................................................................................... 85
TEKEXP:ACQUIRE_MODE ...................................................................................................... 86
TEKEXP:ACQUIRE_MODE? .................................................................................................... 86
TEKEXP:EXPORT ...................................................................................................................... 87
TEKEXP:INFO? ........................................................................................................................... 87
TEKEXP:INSTRUMENT ............................................................................................................ 88
TEKEXP:INSTRUMENT? .......................................................................................................... 88
TEKEXP:LASTERROR? ............................................................................................................. 89
TEKEXP:LIST? ............................................................................................................................ 89
TEKEXP:MODE .......................................................................................................................... 90
TEKEXP:MODE? ........................................................................................................................ 91
TEKEXP:POPUP ......................................................................................................................... 91
TEKEXP:POPUP? ........................................................................................................................ 92
TEKEXP:REPORT ...................................................................................................................... 92
TEKEXP:REPORT? ..................................................................................................................... 93
TEKEXP:RESULT? ..................................................................................................................... 93
TEKEXP:SELECT ....................................................................................................................... 94
TEKEXP:SELECT? ..................................................................................................................... 95
TEKEXP:SETUP .......................................................................................................................... 95
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Table of Contents
TEKEXP:STATE ......................................................................................................................... 96
TEKEXP:STATE? ........................................................................................................................ 96
TEKEXP:VALUE ........................................................................................................................ 97
TEKEXP:VALUE? ...................................................................................................................... 98
Command parameters list ............................................................................................................. 99
Examples ................................................................................................................................... 105
References
Parameters .................................................................................................................................. 107
About application parameters ................................................................................................ 107
Setup panel configuration parameters ................................................................................... 107
Reports panel parameters ...................................................................................................... 111
iv TekExpress® 100G-TXE Printable Application Help

Welcome

Welcome to the Tektronix 100G-TXE, an Tektronix oscilloscope application software that addresses 100GBASE-CR4, 100GBASE-KR4, and CAUI-4 standards of IEEE. These three electrical standards make up the backbone of the current 100G Ethernet industry, and the TekExpress 100G-TXE automation test solution facilitates turnkey electrical transmitter validation of most 100G Ethernet systems today.
The 100G-TXE solution specifically targets Annex 83 of the IEEE 802.3bm standard as well as sections 92 and 93 of the IEEE 802.3bj specification. These tools allow quick verification to these IEEE electrical standards, while offering comprehensive test automation, results margining, data logging, and results reporting in an advanced testing framework.
TekExpress® 100G-TXE Printable Application Help v
Welcome
Key features of TekExpress 100G-TXE include:
100G-TXE offers Transmitter 100GBASE-CR4 time domain transmitter characterization, tracking Table 92-6 Transmitter characteristics at TP2 from the IEEE 802.3bj cabled I/O specification. This offers a checklist approach to performing all jitter, Linear impulse response pulse peak and Signal to Noise and Distortion Ratio measurements, as well as basic AC parametric and timing operations.
100G-TXE also incorporates 100GBASE-KR4 time domain transmitter characterization, tracking Table 93-4 Transmitter characteristics at TP0a from the IEEE 802.3bj backplane specification. While the measurements are identical to 100GBASE-CR4, the electrical limits for 100GBASE-KR4 are more stringent.
100G-TXE includes a third electrical test suite, for Annex 83 of IEEE
802.3bm, tracking Chip-to-module 100 Gb/s four-lane Attachment Unit Interface (CAUI-4), Table 83E-1 at TP1a and TP4. The user can characterize the DUT for Host output and Module output by selecting the required test points. The CAUI-4 support offers advance CTLE scanning provisions to find optimal eye opening/width.
vi TekExpress® 100G-TXE Printable Application Help

Getting help and support

Related documentation

The following documentation is available as part of the TekExpress® 100G-TXE Solution application.
Table 1: Product documentation
Item Purpose Location
Help Application operation
PDF of the help Printable version of the
and User Interface help
compiled help
PDF file that ships with 100G-TXE Solution software distribution (TekExpress 100G-TXE-
Automated-Test-Solution-Software-Printable­Help-EN-US.pdf).
See also
Technical support
TekExpress® 100G-TXE Printable Application Help 1
Getting help and support

Conventions

Help uses the following conventions:
The term "Application," and "Software" refers to the TekExpress 100G-TXE Solution application.
The term "CAUI4" refers to CAUI-4, IEEE 802.3bm standard.
The term "KR4 / CR4" refers to 100GBASE-KR4 or 100GBASE-CR4, IEEE
802.3bj standard.
The term “DUT” is an abbreviation for Device Under Test.
The term “select” is a generic term that applies to the two methods of choosing a screen item (button, control, list item): using a mouse or using the touch screen.
Table 2: Icon descriptions
Icon Meaning
This icon identifies important information.

Technical support

This icon identifies conditions or practices that could result in loss of data.
This icon identifies additional information that will help you use the application more efficiently.
Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See
Contacting Tektronix at the front of this document for contact information.
When you contact Tektronix Technical Support, please include the following information (be as specific as possible):
2 TekExpress® 100G-TXE Printable Application Help
Getting help and support
General information
All instrument model numbers
Hardware options, if any
Modules used
Your name, company, mailing address, phone number, FAX number
Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.
Application specific
information
Software version number
Description of the problem such that technical support can duplicate the problem
If possible, save the setup files for all the instruments used and the application
If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file
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Getting help and support
4 TekExpress® 100G-TXE Printable Application Help

Getting started

Minimum system requirements

The following table shows the minimum system requirements to install and run the TekExpress 100G-TXE solution.
Table 3: System requirements
Component Description
Oscilloscope
Processor Same as the oscilloscope
Operating System Same as the oscilloscope:
Memory Same as the oscilloscope
Hard Disk Same as the oscilloscope
Display Super VGA resolution or higher video adapter (800 x 600 minimum video
Firmware
Tektronix DPO70K series scope
Opt DJA and DJAN
resolution for small fonts or 1024 x 768 minimum video resolution for large fonts). The application is best viewed at 96 dpi display settings
Frimware Version: 10.6.0 or above
1
Software
IronPython 2.7.3 installed
PyVisa 1.0.0.25 installed
Microsoft .NET 4.0 Framework
Microsoft Internet Explorer 7.0 SP1 or greater, or other Web browser for viewing reports
Adobe Reader software 7.0 or greater for viewing portable document format (PDF) files
1
If TekExpress is running on an instrument that has a video resolution less than 800x600, connect and configure a second monitor to the instrument.
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Getting started

Instruments and accessories required

TekExpress100G-TXE application is launched on DPO70K series scope. The following table lists the instruments and accessories required for this application.
Table 4: Instruments and accessories required for 100G-TXE application
Instrument/Accessory Model number Quantity
Oscilloscope DPO72304SX, DPO72304DX,
MSO72304DX, DPO72504DX, MSO72504DX, DPO73304SX, DPO73304DX, MSO73304DX, DPO75002SX, DPO75902SX, DPO77002SX, DPS75004SX, DPS75904SX, DPS77004SX
Adapter
2
Broadband Balun with bandwidth >= 40 GHz
Cables Compatible SMA cables with
bandwidth greater than 40 GHz for connecting single ended sources ATI channel.
Fixtures
Host compliance board for CAUI4 at TP1a and CR4 at TP2
1
1
1
1
Module compliance board for CAUI4 at TP4
Transmitter test fixture for KR4 at TP0a
3
DC Blocks Compatible DC block with
bandwidth range 50 KHz to 65 GHz
Attenuator 3, 6, or 10 dB attenuators 2
4
Probes
Tektronix P7600 or P7700 series
2
1
2
Required to operate in differential mode for single stack ATI scopes.
3
If required, De-Embed the fixtures using filter files.
4
Required to acquire signal at TP0a test point for KR4 suite.
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Installing the software

Getting started
Complete the following steps to download and install the latest 100G-TXE application. See Minimum system requirements for compatibility.
1. Go to www.tek.com.
2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as
Software and enter 100G-TXE in the MODEL OR KEYWORD field and click SEARCH.
3. Select the latest version of software and follow the instructions to download. Copy the executable file to the oscilloscope.

View software version

4. Double-click the executable and follow the on-screen instructions. The software is installed at C:\Program Files\Tektronix\TekExpress\100G-TXE\.
5. Select Analyze > 100G-TXE from the TekScope menu to Launch the
application.
Use the following instructions to view version information for the application and for the application modules such as the Programmatic Interface and the Programmatic Interface Client.
To view version information for 100G-TXE, click button in the TekExpress application and select About TekExpress.
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Getting started
NOTE. This example shows a typical Version Details dialog box, and may not reflect the actual values as shown when you open this item in the application.

Application directories

TekExpress 100G-TXE
application
The TekExpress 100G-TXE application files are installed at the following location:
C:\Program Files\Tektronix\TekExpress\TekExpress 100G-TXE
The following table lists the application directory names and their purpose.
Table 5: Application directories and usage
Directory names Usage
Bin Contains TekExpress 100G-TXE application libraries
Compliance Suites Contains compliance-specific files
Examples Contains various support files
ICP Contains instrument and TekExpress 100G-TXE application-
specific interface libraries
Images Contains images of the TekExpress 100G-TXE application
Lib Contains utility files specific to the TekExpress 100G-TXE
application
Report Generator Contains style sheets for report generation
Tools Contains instrument and TekExpress 100G-TXE application-
specific files
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Getting started
See also

File name extensions

View test-related files
File name extensions
The TekExpress 100G-TXE application uses the following file name extensions:
File name extension Description
.TekX Application session files (the extensions may not be displayed)
.py Python sequence file
.xml Test-specific configuration information (encrypted) files
Application log files
.csv Test result reports
Plot data
.mht Test result reports (default)
Test reports can also be saved in HTML format
.pdf Test result reports
Application help document
.xslt Style sheet used to generate reports
See also
View test-related files
Application directories
TekExpress® 100G-TXE Printable Application Help 9
Getting started
10 TekExpress® 100G-TXE Printable Application Help

Operating basics

Launch the application

To launch the TekExpress 100G-TXE solution, select Analyze > TekExpress 100G-TXE from the TekScope menu.
When you launch the application for the first time, the file C:\Users\<username> \My Documents\My TekExpress\100G-TXE\Resources.xml is mapped to drive X:. This file contains information about available network-connected instruments. The session files are stored in X:\100G-TXE\. If this file is not found, then the application runs Instrument Discovery Program to detect the network-connected instruments before launching 100G-TXE solution.
If the application is behind the oscilloscope application, click Analyze > TekExpress 100G-TXE to bring it to the front. To keep the 100G-TXE application window on top, select Keep On Top from the 100G-TXE Options
menu.
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Operating basics
See also
Application controls
Application panel overview

Application panels overview

TekExpress 100G-TXE solution uses panels to group Configuration, Results, and Reports settings. Click any button to open the associated panel. A panel may have one or more tabs that list the selections available in that panel. Controls in a tab can change depending on settings made in the same tab or another tab.
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Operating basics
Table 6: Application panels overview
Panel Name Purpose
Setup panel The Setup panel shows the test setup controls. Click the Setup button to
open this panel. Use this panel to:
Set DUT tab parameters
Select tests
Set acquisition tab parameters
Set configuration tab parameters
Set preferences tab parameters
Status panel View the progress and analysis status of the selected tests, and view test
logs.
Results panel View the summary of test results and select result viewing preferences.
Reports panel Browse for reports, save reports as specific file types, specify report
naming conventions, select report content to include (summary information, detailed information, user comments, setup configuration, application configuration), and select report viewing options.
See also

Application controls

Global application controls

Application controls
This section describes the application controls.
TekExpress® 100G-TXE Printable Application Help 13
Operating basics
Table 7: Application controls description
Item Description
Options menu
Test Panel buttons
To select global application controls.
Controls that open tabs for configuring test settings and options.
Start / Stop button
Pause / Continue button
Clear button
Use the Start button to start the test run of the measurements in the selected order. If prior acquired measurements are not cleared, then new measurements are added to the existing set. The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.
Use the Pause button to pause the acquisition. When a test is paused, this button changes as Continue.
Use the Clear button to clear all existing measurement results. Adding or deleting a measurement, or changing a configuration parameter of an existing measurement, also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on Results panel.
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Operating basics
Item Description
Application window move icon
Minimize icon
Close icon
Place the cursor over the three-dot pattern in the upper left corner of the application window. When the cursor changes to a hand, drag the window to the desired location.
Click to minimize the application.
Click to close the application.
Mini view / Normal view
Toggles the application between mini view and normal view. Mini view displays the run messages with the time stamp, progress bar, Start / Stop button, and Pause / Continue button. The application moves to mini view when you click the Start button.
See also. Application panel overview
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Operating basics

Options menu overview

To access Options menu, click in the upper-right corner of the application. It has the following:
Options menu
Menu Function
Default Test Setup Opens an untitled test setup with defaults selected
Acquire Live Waveforms
Mode: User Defined Standards: CAUI4 Specification: IEEE802.3bm, Annex 83E.3.1 Data rate: 25.78125 Pattern Type: PRBS9 Source: Single ended
Open Test Setup Opens a saved test setup
Save Test Setup Saves the current test setup
Save Test Setup As Saves the current test setup with a different file name or file type
Open Recent Displays the recently opened test setups to open
Instrument Control Settings
Keep On Top Keeps the TekExpress 100G-TXE application on top of all the application
Email Settings Use to configure email options for test run and results notifications
Deskew Allows to read the skew and attenuation values from the TekScope
Detects, lists, and refreshes the connected instruments found on specified connections (LAN, GPIB, USB, and so on)
application. Before using this option, manually compensate for skew and attenuations in Tekscope application.
16 TekExpress® 100G-TXE Printable Application Help
Menu Function
Help Displays the TekExpress 100G-TXE help
About TekExpress
Displays application details such as software name, version number, and copyright
Provides a link to the end-user license agreement
Provides a link to the Tektronix Web site
Operating basics
See also. Application controls
TekExpress instrument
control settings
Use TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You can use the Search Criteria to search the connected instruments depending on the connection type. The details of the connected instrument is displayed in the Retrieved Instruments window.
You can access this dialog box from the Options menu.
The connected instruments displayed here can be selected for use under Global Settings in the test configuration section.
NOTE. Select GPIB (Default) when using TekExpress 100G-TXE application.
See also. Options menu overview
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Operating basics
View connected
instruments
Use TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The application uses TekVISA to discover the connected instruments.
NOTE. The instruments required for the test setup must be connected and it must be recognized by the application before running the test.
To refresh the list of connected instruments:
1. From the Options menu, select Instrument Control Settings.
2. In the Search Criteria section of the Instrument Control Settings dialog box,
select the connection types of the instruments to search.
Instrument search is based on the VISA layer, but different connections determine the resource type, such as LAN, GPIB, and USB. For example, if you choose LAN, the search will include all the instruments supported by TekExpress that are communicating over the LAN.
3. Click Refresh. TekExpress searches for connected instruments.
4. After searching, the dialog box lists the instrument-related details based on
the search criteria. For example, For the Search Criteria as LAN and GPIB, the application displays all LAN and GPIB instruments connected to the application.
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Operating basics
The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the Last Updated field.
See also. Equipment connection setup

Configure email settings

Use the Email Settings utility to get notified by email when a measurement completes, or produces any error condition. Follow the steps to configure email settings:
1. Select Options > Email Settings to open the Email Settings dialog box.
2. (Required) For Recipient email Address(es), enter one or more recipient
email addresses. To include multiple addresses, separate the addresses with commas.
3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name, followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example: user@yourcompany.com.
4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location, and the SMTP Port number, in the corresponding fields.
If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.
NOTE. If any of the above required fields are left blank, the settings will not be saved and email notifications will not be sent.
5. In the Email Attachments section, select from the following options:
Reports: Select to receive the test report with the notification email.
Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.
6. In the Email Configuration section:
Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 5 MB.
Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.
7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.
8. To test your email settings, click Test Email.
9. To apply your settings, click Apply.
10. Click Close when finished.
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Operating basics
Email Settings

Setup panel

Setup panel overview

The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.
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Operating basics

Set DUT parameters

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also affect the list of available tests in the Test Selection tab.
TekExpress® 100G-TXE Printable Application Help 21
Operating basics
Click Setup > DUT to access the DUT parameters:
Table 8: DUT tab settings
Setting Description
DUT ID Adds an optional text label for the DUT to reports. The default
value is DUT001. The maximum number of characters is 32. You cannot use the following characters in an ID name: (.,..,..., \,/:?”<>|*)
Opens Comments dialog box to enter text to add to the report.
Comments icon (to the
right of the DUT ID field)
Acquire live waveforms Perform analysis on live waveforms.
Use pre-recorded waveform files
Mode
Standards Test Points Specification
1
CAUI4
Maximum size is 256 characters. To enable or disable comments appearing on the test report, see Select report options.
Perform analysis on pre-recorded waveforms.
Compliance
User Defined
TP1a IEEE802.3bm, Annex 83E.3.1
TP4 IEEE802.3bm, Annex 83E.3.2
1
CAUI4 (CAUI-4) is 100G chip-to-module IEEE 802.3bm interface, operating on four 25 Gb/s lanes.
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Operating basics
Setting Description
2
KR4
CR4
3
TP0a IEEE802.3bj, Section 93
TP2 IEEE802.3bj, Section 92
Data Rate Set the data rate to be tested within the range 18 to 28.05. The
default value is 25.78125
Pattern Type Select the pattern type. The available options are PRBS7, 9, 11,
and 15. By default, it is PRBS9.
Source
Differential - Source as differential signal
Single Ended -Source as single-ended signals
Crosstalk Source Select crosstalk source when cross talk generator is connected.
This is applicable for Eye width and Eye height measurements only.
See also. Select tests

Select tests

Use the Test Selection tab to select the tests. The test measurements available depends on the standards selected in the DUT tab.
Figure 1: CAUI4 TX measurements
2
KR4 (100GBASE-KR4) is an Ethernet IEEE 802.3bj standard for 100G backplanes.
3
CR4 (100GBASE-CR4) is an Ethernet IEEE802.3bj standard for 100G over twin-axial cables.
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Operating basics
Figure 2: KR4 TX measurements
Figure 3: CR4 TX measurements
24 TekExpress® 100G-TXE Printable Application Help
Operating basics
Table 9: Test Selection tab settings
Setting Description
Tests Click on a test to select or unselect. Highlight a
test to show details in the Test Description pane.
Test Description Shows brief description of the highlighted test in
the Test field.

See also. Set acquisition tab parameters

Set acquisition tab
parameters
Use Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type and the tests selected.
NOTE. 100G-TXE application acquires all waveforms needed by each test group before performing analysis.
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Operating basics
Table 10: Acquisitions tab settings
Setting Description
Show Acquire Parameters Select to view the acquisition parameters.
Signal Validation Sets the application to validate acquisition
signals and perform the specified action to take when acquired signals do not meet requirements. Select the action from the list.
TekExpress 100G-TXE saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder for each session (a session is started when you click the Start button). The folder path is X:\100G-TXE\Untitled Session\<dutid>\<date>_<time>. Images created for each analysis, CSV files with result values, reports, and other information specific to that particular execution are also saved in this folder.
Saving a session moves the session file contents from the Untitled Session folder to the specified folder name, and changes the session name to the specified name.
Set configuration tab
parameters
Use Configuration tab to view and configure the Global Settings and the measurement configurations. The Global Settings and the measurements with configurations available in this tab depends on the Standards selected in the DUT tab.
Figure 4: Configuration tab: Global Settings
26 TekExpress® 100G-TXE Printable Application Help
Operating basics
Table 11: Configuration tab settings
Setting Description
Compliance Mode Select compliance mode. By default Compliance Mode is
selected.
User Defined Mode Select user defined mode
Global Settings
Instruments Detected Displays the instruments connected to this application. Click on
the instrument name to open a list of available (detected) instruments. Select Options > Instrument Control Settings and click Refresh to update the instrument list.
NOTE. Verify that the GPIB search criteria (default setting) in the Instrument Control Settings is selected when using TekExpress 100G-TXE application.
Ref Levels
Absolute Select to set the Ref Levels in Absolute
Percentage Select to set the Ref Levels in Percentage
Mid Level Select the mid level in absolute or percentage
Hysteresis Select the hysteresis in absolute or percentage
Bandwidth Select the bandwidth as Full BW or 50 GHz. By default Full BW
is selected.
Record Length for Jitter measurements
Record Length for Eye measurements
Select the record length for jitter measurements. The available values are 20 M, 30 M, 40 M. By default 40 M is selected.
NOTE. This configuration is applicable for jitter measurements only.
Select the record length for jitter measurements. The available values are 20 M, 30 M, 40 M. By default 40 M is selected.
NOTE. This configuration is applicable for eye measurements only.
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Operating basics
Setting Description
De-Embedding Filter Select to apply the de-embed filter file. Click Browse and select
the de-embedding filter files (.flt). For single ended mode, select filter file for Data Positive and Data Negative.
Source file name for data Positive
Source file name for data negative
For Differential mode, select differential filter file.
Differential source filter file name
NOTE. Browse option is enabled only when you select Use filter file for de-embedding.
CTLE Filter File Select the CTLE Filter File.
Compliance mode
All: Application will run through all CTLE filters from 1 dB ­9 dB (at TP1a) and 1 dB - 2 dB (at TP4)
Best CTLE: After the first run, Best CTLE filter option gets enabled. User can run the measurement with Best CLTE instead of looping through all CTLE filters in the specification.
User Defined mode
User can run the measurement with any specified CTLE filter. The application provides CTLE filters from 0 dB - 9 dB for data rate of 25.78125 Gbps. It is recommended to create custom CTLE filter files for any other data rates.
Select the CTLE filters from the drop-down list or Custom to browse and select the custom CTLE filter files.
NOTE. Custom CTLE filter files is to be named in the format <user defined name>_ndB.flt, where n is the gain of the filter.
Measurements - CAUI4 TXE
Analyze Measurement Range - 20%-80%
De-embedding filter. You can de-embed the signal path from fixture output to the scope channel input. Manual filter files can also be created using SDLA or any other method.
Mid Level. Use to prevent small amounts of noise in a waveform from producing multiple threshold crossings. Use when the rising and falling thresholds for a given reference voltage level are set to the same value.
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Operating basics
Hysteresis. A reference voltage level that defines when the waveform state transition occurs at a given threshold.
Set preferences tab
parameters
Use Preferences tab to set the application action on completion of a measurement.
Table 12: Preferences tab settings
Setting Description
Number of Runs
Acquire/Analyze each test <no> times (not applicable to Custom Tests)
Actions on Test Measurement Failure
On Test Failure, stop and notify me of the failure Select to stop the test run on Test Failure, and
Popup Settings
Select to repeat the test run by setting the number of times. By default, it is selected with 1 run.
to get notified via email. By default, it is unselected. Click Email Settings to configure.
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Operating basics
Setting Description
Auto close Warnings and Informations during Sequencing Auto close after <no> Seconds
Auto close Error Messages during Sequencing. Show in Reports Auto close after <no> Seconds
Select to auto close warnings/informations during sequencing. Set the Auto close time. By default it is unselected.
Select to auto close Error Messages during Sequencing. Set the Auto close time. By default it is unselected.

Status panel

Status panel overview

The Status panel accesses the Test Status and Log View tabs, which provide status on test acquisition and analysis (Test Status) and a listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start a test run. You can select the Test Status or the Log View tab to view these items while tests are running.
Test status view
Log view
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Results panel

Operating basics
Table 13: Status panel Log View controls
Control Description
Message History Lists all executed test operations and timestamp
information.
Auto Scroll Enables automatic scrolling of the log view as
information is added to the log during the test.
Clear Log Clears all messages from the log view.
Save Saves the log file to a text file. Use the standard
Save File window to navigate to and specify the folder and file name to which to save the log text.
See also. Application panel overview

Results panel overview

When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.
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Operating basics
See also. View a report
Application panels overview

View test-related files

Files related to tests are stored in My TekExpress\100G-TXE\ . Each test setup in this folder has both a test setup file and a test setup folder, both with the test setup name.
The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.
Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.
Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside its matching session folder:
Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran tests using prerecorded waveform files, these are included here.
The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\100G-TXE\. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the Untitled Session folder until you run a new test or until you close the 100G-TXE application.
See also. File name extensions
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Operating basics

Plots panel

Plots panel overview

The Plots panel displays the result as a two-dimensional plot for additional measurement analysis. The plots are displayed only during run and only for the measurements which supports plots.
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Operating basics
Toolbar functions in plot windows. The Plot Toolbar window includes the following functions:
Icon Functions
Save
Select & Zoom
Zoom In
Saves the plot.
Expands the selected plot area. Left-click and drag the mouse to mark the region on the plot to zoom.
Expands part of the plot (Horizontal and Vertical); the data appears in more detail.
Contracts part of the plot (Horizontal and Vertical); the data appears in less detail.
Zoom Out
Pan
Hide Gridlines
Reset
Choose Waveform Colors
Moves the plot anywhere within the scale.
Hides the gridlines.
Resets the zoom to 100%.
Sets the plot color. Click and select the color in the Color window and click OK. Click in the plot area to apply the color.
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Reports panel

Icon Functions
Show/Hide Markers
UnDock/Dock
Select Test Select the measurement.
Displays or hides the markers
Click to undock/dock the plot window.
Operating basics

Reports panel overview

Use Reports panel to browse for reports, name and save reports, select test content to include in reports, and select report viewing options.
For information on setting up reports, see Select report options. For information on viewing reports, see View a report.
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Operating basics
See also. Applications panel overview

Select report options

Click Reports panel and use the Reports panel controls to select which test result information to include in the report, and the naming conventions to use for the report. For example, always give the report a unique name or select to have the same name increment each time you run a particular test.
Select report options before running a test or when creating and saving test setups. Report settings are included in saved test setups.
In the Reports panel, select from the following report options:
Table 14: Report options
Setting Description
Report Update Mode
Generate new report Creates a new report. The report can be in either .mht or .pdf file formats.
Append with previous run session Appends the latest test results to the end of the current test results report.
Include header in appended reports Select to include header in appended reports
Replace current test in previous run session Replaces the previous test results with the latest test results. Results from newly added
tests are appended to the end of the report.
Report Creation Settings
Report name Displays the name and location from which to open a 100G-TXE report. The default
location is at \My TekExpress\100G-TXE\Untitled Session. The report file in this folder gets overwritten each time you run a test unless you specify a unique name or select to auto increment the report name. Change the report name or location.
Do one of the following:
In the Report Path field, type over the current folder path and name.
Double-click in the Report Path field and then make selections from the popup keyboard and click the Enter button.
Be sure to include the entire folder path, the file name, and the file extension. For example: C:\Documents and Settings\your user name\My Documents\My TekExpress\100G-TXE \DUT001.mht.
NOTE. You cannot set the file location using the Browse button.
Open an existing report.
Click Browse, locate and select the report file and then click View at the bottom of the panel.
Save as type Saves a report in the specified file type, selected from the drop-down list.
NOTE. If you select a file type different from the default, be sure to change the report file name extension in the Report Name field to match.
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Setting Description
Auto increment report name if duplicate Sets the application to automatically increment the name of the report file if the application
finds a file with the same name as the one being generated. For example: DUT001, DUT002, DUT003. This option is enabled by default.
Create report automatically at the end of the run
Contents To Save
Include pass/fail info in details table Includes pass/fail info in the details table of the report.
Include detailed results Includes detailed results in the report.
Include plot images Includes plot images in the report.
Include setup configuration Sets the application to include hardware and software information in the summary box at
Margin value in percentage Select to include the margin value in percentage in the report.
Include user comments Select to include any comments about the test that you or another user added in the DUT
Group Report By
Test Name Select to group the tests in the report by test name.
Test Result Select to group the tests in the report by test results
Creates report at the end of the run.
the top of the report. Information includes: the oscilloscope model and serial number, the oscilloscope firmware version, and software versions for applications used in the measurements.
tab of the Setup panel. Comments appear in the Comments section, under the summary box at the beginning of each report.
Operating basics
View report after generating Automatically opens the report in a Web browser when the test completes. This option is
selected by default.
View Click to view the most current report.
Generate Report Generates a new report based on the current analysis results.
Save As Specify a name for the report.

View a report

The application automatically generates a report when test execution is complete and displays the report in your default Web browser (unless you cleared the View Report After Generating check box in the Reports panel before running the test). If you cleared this check box, or to view a different test report, do the following:
1. Click the Reports button.
2. Click the Browse button and locate and select the report file to view.
3. In the Reports panel, click View.
For information on changing the file type, file name, and other report options, see
Select report options.
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Operating basics

Report contents

A report shows detailed results and plots, as set in the Reports panel.
Setup configuration information
The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and serial number, optical module model and serial number, and software version numbers of all associated applications.
To exclude this information from a report, clear the Include Setup Configuration check box in the Reports panel before running the test.
User comments
If you selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.
See also. Results panel overview
View test-related files
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Running tests

Equipment connection diagram

Click Setup > Test Selection > Schematic to view the equipment setup diagram(s).
Figure 5: CAUI4 TP1a (Single ended)
Figure 6: CAUI4 TP1a (Differential)
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Running tests
Figure 7: CAUI4 TP4 (Single ended)
Figure 8: CAUI4 TP4 (Differential)
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Running tests
Figure 9: CAUI4 Eye Width / Eye Height TP1a (Single ended)
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Running tests
Figure 10: CAUI4 Eye Width / Eye Height TP1a (Differential)
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Running tests
Figure 11: CAUI4 Eye Width / Eye Height TP4 (Single ended)
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Running tests
Figure 12: CAUI4 Eye Width / Eye Height TP4 (Differential)
Figure 13: CR4 TP2 (Single ended)
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Running tests
Figure 14: CR4 TP2 (Differential)
Figure 15: KR4 TP0a (Single ended)
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Running tests
Figure 16: KR4 TP0a (Differential)
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Prerequisite

Running tests
Compensate the signal
path
Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a week. Failure to do so may result in the instrument not meeting warranted performance levels.
1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.
2. Disconnect any probes you have connected to the input channels.
3. Set the instrument to Menu mode.
4. Select Instrument Calibration from the Utilities menu.
5. Note any instructions that appear in the resulting control window.
6. Click Run SPC to begin the procedure. The procedure may take several
minutes to complete.
7. Verify that the Status changes to Compensated after the procedure is complete. If the Calibration Status field indicates anything other than Compensated, see Signal Path Compensation Status for information on the readout and recommended action.
NOTE. When making measurements at vertical scale settings less than or equal to 5 mV, you should perform the signal path compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at those volts/div settings.

Deskew

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If skew is present between positive and negative channels, then the channels need to be deskewed before being used for waveform measurements. TekExpress 100G-TXE provides support for channel deskew and attenuation using the following method:
1. Determine what the skew is for each channel.
2. From the TekScope menu, select Vertical > Deskew.
3. In the Deskew/Attenuation window, click the channel (1 – 4) button for the
first channel to be deskewed.
4. Click in the Ch(x) Deskew Time entry field and enter the skew. The skew can be +ve or –ve.
5. Click the channel button for the next channel and repeat step 4.
6. After entering the skew for all the channels that require it, from the Options
menu in TekExpress 100G-TXE, select Deskew.
Running tests
7. In the Deskew dialog box, select the desired level:
Less than 100 mV signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is less than 100 mV/division.
100 mV or greater signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is greater than 100 mV/ division.
Figure 17: Deskew
8. Click Read Deskew/Attn.
9. When the status in the dialog box indicates the deskew is finished, click
Close.
Each input channel has its own deskew settings. Deskew compensates individual channels for probes or cables of different lengths. The instrument applies the delay values after each completed acquisition. The deskew values are saved as part of the instrument setup. The deskew values for the selected channel are retained until you change the probe, you restore a saved setup, or you recall the factory setup.
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Running tests

Running tests

Select tests, set acquisition parameters, set configuration parameters, set preferences parameters, and click Start to run the tests. While tests are running,
you cannot access the Setup or Reports panels. To monitor the test progress, switch between the Status panel and the Results panel.
While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using Alt + Tab key combination. To keep the TekExpress 100G-TXE application on top, select Keep On Top from the TekExpress Options menu.
The application displays report when the tests execution is complete.
Prerun checklist
1. Make sure that the instruments are warmed up (approximately 20 minutes) and stabilized.
2. Perform compensation: In the oscilloscope main menu, select Utilities > Instrument Compensation. Click Help in the compensation window for
steps to perform instrument compensation.
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Running tests
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Saving and recalling test setup

Test setup files overview

Saved test setup information (such as the selected oscilloscope, general parameters, acquisition parameters, measurement limits, waveforms (if applicable), and other configuration settings) are saved under the setup name at X:\100G-TXE.
Use test setups to:
Run a new session, acquiring live waveforms, using a saved test configuration.
Create a new test setup using an existing one.
View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results summary.
Run a saved test using saved waveforms.
See also

Save a test setup

Save a test setup
Open (load) a saved test setup
You can save a test setup before or after running a test. You can create a test setup from already created test setup, or using default test setup. When you select the default test setup, the parameters are set to the application’s default value.
Select Options > Save Test Setup to save the opened setup.
Select Options > Save Test Setup As to save the setup with different name.
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Saving and recalling test setup

Open (load) a saved test setup

To Open (load) a saved test setup, do the following:
1. Select Options > Open Test Setup.
2. Select the setup from the list and click Open. Setup files are located at X: \100G-TXE\.
See also
About test setups

Create a test setup using an existing one

Create a test setup from default settings

Create a test setup from default settings
To create a test setup using default settings, follow the steps:
1. Select Options > Default Test Setup. For default test setup, the parameters are set to the application’s default value.
2. Click application Setup and set the parameters
3. Click application Reports and set the report options
4. Optional: Click Start to run the test and verify that it runs correctly and
captures the specified test information and reports. If it does not, then edit the parameters and repeat this step until the test runs to your satisfaction
5. Select Options > Save Test Setup. Enter the file name and click Save. The application saves the file to X:\100G-TXE\<session_name>
Create a test setup using an existing one
To create a test setup using an existing one, follow the steps:
1. Select Options > Open Test Setup
2. Select a setup from the list and then click Open
3. Click application Setup and modify the parameters
4. Click application Reports and modify the report options
5. Select Options > Save Test Setup As
6. Enter test setup name, and click Save
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CAUI4 TXE compliance measurements

DC common mode output voltage

This section verifies that the mean of the common mode signal is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.2, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.1.2, Table 83E-3
Measurement procedure
The supported voltage range of ATI channel of the scope is ±0.3 V and the DC voltage of the DUT can be beyond the supported voltage limits. Hence, use external digital multimeter to measure the voltage and enter it in the application.
Limits
At TP1a: -0.3 V to 2.8 V
At TP4: -0.35 V to 2.85 V
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CAUI4 TXE compliance measurements

Diff peak-to-peak output voltage - Tx disabled

This section verifies that the peak-to-peak differential output voltage when the transmitter is disabled is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.2, Table 83E-1
Inputs
Differential signal created using two single ended sources (Positive and Negative) without any filtering.
Measurement procedure
1. Add Peak-to-Peak measurement.
2. The value of the pk-pk voltage is the differential output voltage (pk-pk).
Limits
At TP1a:
Lower limit: NA
Higher limit: 35 mV

Diff peak-to-peak output voltage - Tx enabled

This section verifies that the peak-to-peak differential output voltage is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.2, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.1.2, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
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CAUI4 TXE compliance measurements
Measurement procedure
1. Add Peak-to-Peak measurement.
2. The value of the pk-pk voltage is the differential output voltage (pk-pk).
Limits
At TP1a and TP4:
Lower limit: NA
Higher limit: 900 mV

AC common mode output voltage

This section verifies that the RMS value of the common mode signal is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.2, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.1.2, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Create a common mode signal using Math = (Data Positive + Data Negative)/
2.
2. Create Vertical histogram on the common mode signal.
3. Add Standard deviation measurement.
4. Standard deviation of the signal is measured as AC common mode voltage.
Limits
At TP1a and TP4:
Lower limit: NA
Higher limit: 17.5 mV
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CAUI4 TXE compliance measurements

Single ended output voltage

This section verifies that the max and min of data positive and negative signals are within conformable limits as per the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.2, Table 83E-1
Inputs
Two single ended sources (Positive and Negative) filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Find the max and min of the signal using base scope measurement option (select Measure > Amplitude. Select Maximum and Minimum).
2. Single Ended output voltage (max) = DC Common mode voltage + Max of
Single Ended signal (without DC).
3. Single Ended output voltage (min) = DC Common mode voltage + Min of Single Ended signal (without DC).
4. Perform Step 2 and 3 on single ended data positive and data negative signals.
Limits
At TP1a:
Lower limit: -0.4 V
Higher limit: 3.3 V
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CAUI4 TXE compliance measurements

Signaling rate

This section verifies that the signaling rate (data rate) of the DUT per lane is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.1, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.1.1, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. This measurement is performed using DPOJET Period measurement as
prerequisite.
2. Period is found edge to edge which gives the Unit interval (UI) of the signal.
3. The result of the period measurement (UI) is used to find the data rate of the
signal. Data Rate = 1/Unit interval.
Limits
At TP1a and TP4:
Lower limit: Configured Date Rate - 100 ppm
Higher limit: Configured Date Rate + 100 ppm
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CAUI4 TXE compliance measurements

Eye width and Eye height

This section verifies that the eye width and eye height are within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.6, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.2.1, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Calibration:
Before running the Eye width / Eye height measurement, the below setup has to be calibrated with a crosstalk generator, as mentioned in the following settings:
For Host (TP1a): Calibrate the crosstalk generator at TP4 with target differential peak-to-peak amplitude of 900 mV and target transition time of 12 ps (section 83E.3.1.6).
For Module (TP4): Calibrate the crosstalk generator at TP1a with target differential peak-to-peak amplitude of 900 mV and target transition time of 19 ps (section 83E.3.2.1).
Measurement procedure
Eye width and Eye height calculation
Signal is captured such that it has more than 1e6 edges. Measurements are done using Dual-Dirac jitter model as specified in section 83E.4.
EW15 = EW6 - 3.19*(RJR + RJL)
Where,
EW15 is the eye width extrapolated to 10-15 probability
EW6 is the eye width at 10-6 probability
RJL is the RMS value of the jitter estimated from CDFL
RJR is the RMS value of the jitter estimated from CDFR
EH15 = EH6 - 3.19*(RN0+RN1)
Where,
EH15 is the eye width extrapolated to 10-15 probability
EH6 is the eye width at 10-6 probability
RN1 is the RMS value of the jitter estimated from CDF1
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CAUI4 TXE compliance measurements
RN0 is the RMS value of the jitter estimated from CDF0
Compliance method to find Eye width and Eye height results
The signal filtered through Bessel Thomson filter is equalized using different CTLE filters (1 dB - 9 dB for Host) and (1 dB - 2 dB for Module). CTLE filter result which has the maximum Eye area (Eye width * Eye height) and passing both Eye height and Eye width results is chosen as reference CTLE filter.
Host (TP1a): The CTLE peaking in the reference receiver shall be set to three values:
1. The recommended CTLE peaking value provided by the host (CTLE 1 dB to 9 dB)
2. The value 1 dB higher if present
3. The value 1 dB lower if present
A compliant host should pass both the eye width and eye height A limit using at least one of the settings and passes eye height B in two or three settings.
Module (TP4): A compliant module has to pass both eye width and eye height at least one of the CTLE settings (CTLE 1 dB to 2 dB).
Limits
At TP1a:
Eye Width: LL: 0.46 UI and UL: NA
Eye Height A: LL: 95 mV and UL: NA
Eye Height B: LL: 80 mV and UL: NA
At TP4:
Eye Width: LL: 0.57 UI and UL: NA
Eye Height: LL: 228 mV and UL: NA
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CAUI4 TXE compliance measurements

Vertical eye closure

This section verifies that the vertical eye closure of the signal is within the conformable limits according to the specification IEEE 802.3bm, and Section 83E.4.2.1.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP4 IEEE 802.3bm, Section 83E.4.2.1, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. The filtered signal is equalized using reference or best CTLE filter. If
reference CTLE filter is not present, the application will loop through required CTLE filters to find the reference CTLE filter.
2. Eye height@BER of 1e-15 and Eye amplitude are calculated for the equalized signal using Dual-Dirac jitter separation model as explained section 83E.3.2.1.
3. Vertical eye closure is calculated using the following formula:
VEC = 20log(AV/EH15)
Where,
VEC is vertical eye closure in dB
AV is the eye amplitude of the equalized waveform. Eye amplitude is defined as the mean value of logic one minus the mean value of logic zero in the central 5% of the eye
EH15 is the eye height at BER of 1e-15
Limits
At TP4:
Lower limit: NA
Higher limit: 5.5 dB
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CAUI4 TXE compliance measurements

Transition time

This section verifies that the transition time of the DUT is within the conformable limits according to the specification.
Required test equipment
Minimum system requirements
Equipment connection diagram
Standards Test points Specification
CAUI4 TP1a IEEE 802.3bm, Section 83E.3.1.5, Table 83E-1
TP4 IEEE 802.3bm, Section 83E.3.1.5, Table 83E-3
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Measure the nominal Unit interval of the filtered signal.
2. For PRBS9, measure Voltage High in region 000001111 for Rise Time and
Voltage Low in region 11111111100000 for fall time. Within these regions, take average amplitude in -3 UI to -2 UI range from edge for finding voltage low. Also take average amplitude in 2 UI to 3 UI range from edge for finding voltage high.
3. Find the transition time in search patterns (000001111 for Rise and 11111111100000 for Fall) by taking difference in time from 20% to 80% of the signal amplitude.
Limits
At TP1a:
Lower limit: 10 ps
Higher limit: NA
At TP4:
Lower limit: 12 ps
Higher limit: NA
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CAUI4 TXE compliance measurements
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CR4 / KR4 TXE compliance measurements

DC common mode output voltage

This section verifies that the mean of the common mode signal is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.1, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.3, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Measurement procedure
The supported voltage range of the scope is ±0.3 V and the DC voltage of the DUT can be beyond the supported voltage limits. Hence, use external digital multimeter to measure the voltage and enter it in the application.
Limits
CR4 0 V to 1.9 V
KR4 0 V to 1.9 V
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Diff peak-to-peak output voltage - Tx disabled

This section verifies that the peak to peak differential output voltage when transmitter is disabled is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.1, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.3, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) without any filtering.
Measurement procedure
1. Add Peak to Peak measurement.
2. The value of the pk-pk voltage is measured as differential output voltage (pk-
pk).
Limits
CR4 Peak-to-Peak Differential output (Tx Disabled)
<= 35 mV
KR4 Peak-to-Peak Differential output (Tx Disabled)
<= 30 mV
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Diff peak-to-peak output voltage - Tx enabled

This section verifies that the peak to peak differential output voltage is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.1, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.3, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Add Peak to Peak measurement.
2. The value of the pk-pk voltage is measured as differential output voltage (pk-
pk).
Limits
CR4 Peak-to-Peak Differential output <= 1200 mV
KR4 Peak-to-Peak Differential output <= 1200 mV
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AC common mode output voltage

This section verifies that the RMS value of the common mode signal is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.1, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.3, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Create a common mode signal using Math = (Data Positive + Data Negative)/
2.
2. Create Vertical histogram on the common mode signal.
3. Add Standard deviation measurement.
4. Standard deviation of the signal is measured as AC common mode voltage.
Limits
CR4 AC Common mode output voltage <= 30 mV
RMS with respect to ground
KR4 AC Common mode output voltage <= 12 mV
RMS with respect to ground
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Signaling rate

This section verifies that the signaling rate (data rate) of the DUT per lane is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.9, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.2, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. This measurement is performed using DPOJET Period measurement as
prerequisite.
2. Period is found edge to edge which gives the Unit interval (UI) of the signal.
3. The result of the period measurement (UI) is used to find the data rate of the
signal. Data Rate = 1/Unit interval.
Limits
CR4 At TP1a and TP4:
Lower limit: Configured Date Rate ­100 ppm
Higher limit: Configured Date Rate + 100 ppm
KR4 At TP1a and TP4:
Lower limit: Configured Date Rate ­100 ppm
Higher limit: Configured Date Rate + 100 ppm
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CR4 / KR4 TXE compliance measurements

Output Jitter

Even-odd jitter peak to
peak
This section verifies that the value of the even odd jitter is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.8, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.7, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Capture a long sequence of PRBS pattern.
2. Even Odd Jitter is measured as the magnitude of the difference between the
average deviation of all even numbered transitions and the average deviation of all odd numbered transitions, where even odd transitions are not possible transitions, but actual transitions.
Effective bounded and
total uncorrelated jitter
peak-to-peak
3. The Even Odd Jitter is carried out by DPOJET using F/n measurement with n being set to 2.
Limits
CR4 Even Odd Jitter <= 0.035 UI
KR4 Even Odd Jitter <= 0.035 UI
This section verifies that the jitter components are within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.8, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.7, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
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Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
Measurement procedure
1. Capture PRBS signal with minimum of 2e3 edges present in the signal.
2. For calculating jitter application, consider the edges attached with long
sequence of ones and zeros. This makes sure that the only uncorrelated jitter is measured. Application performs this measurement with longer record length to get more accurate results.
3. EBUJ (Effective bounded uncorrelated jitter) and ERJ (Effective random jitter) are calculated from the signal using dual-dirac jitter analysis as given in specification section 92.8.3.8.2.
Effective total uncorrelated jitter is calculated using the equation Effective total uncorrelated jitter = 7.9 * ERJ + EBUJ.
Limits
CR4 and KR4 Effective bounded uncorrelated jitter <= 0.1 UI

Signal to noise and distortion ratio

This section verifies that the signal to noise and distortion ratio of the DUT is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.7, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.6, Table 93-4
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
peak-to-peak
Effective total uncorrelated jitter <= 0.18 UI peak-to-peak
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.
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Measurement procedure
1. Configure the DUT in OPTIMAL state and capture the signal for
measurement.
2. Compute the Linear fit pulse response (Pmax) and the RMS value of the linear fit error σ(e) from the signal.
3. Measure the RMS deviation of voltage from the mean and denote it as (σ(n). This has to be measured at the flat portion of the waveform where the slope is close to zero.
4. Signal to Noise an Distortion ratio is measured using below equation:
Limits
CR4 SNDR > 26 dB
KR4 SNDR > 27 dB

Transmitter waveform requirements

Common procedure for
transmitter waveform
requirements
This section describes the general procedure to be performed for Transmitter output waveform measurements. Perform the general procedure and the measurement specific procedure for each sub-measurements.
Required test equipment
Minimum system requirements
Equipment connection diagram
Inputs
Differential signal created using two single ended sources (Positive and Negative) and filtered through fourth order 33 GHz Bessel Thomson filter.

Common procedure for transmitter waveform requirements

1. Configure the DUT to transmit the PRBS 7, 9, 11, or 15 signal continuously
at the specified data rate.
2. Acquire the signal at a sampling rate of 200 Gbps and record length of 5M samples.
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3. Oversample the signal to get more than 32 samples per bit and average the signal across the PRBS patterns.
4. Process the signal using steps as per specification section 92.8.3.5 to measure the various Transmitter waveform parameters.

Linear fit pulse peak

This section verifies that the linear fit pulse peak value is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.2, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.2, Table 93-4
Measurement procedure
1. Set the DUT in PRESET mode by setting the coefficients C(-1), C(0) and
C(1) to zero.
2. Capture the signal and calculate linear fit filter coefficients of the signal. The peak value of the linear fit curve is measured as Linear Fit pulse peak.
Limits
CR4 Linear Fit Pulse Peak > 0.45 * Steady state
voltage
KR4 Linear Fit Pulse Peak > 0.71 * Steady state
voltage

Steady state voltage

This section verifies that the steady state voltage is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.2, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.2, Table 93-4
Measurement procedure
1. Set the DUT in PRESET mode by setting coefficients C(-1), C(0) and C(1) to
zero.
2. Capture the signal and calculate linear fit pulse of the signal. The average value of the linear fit curve is measured as Steady state output voltage (DC voltage) of the signal.
Limits
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Minimum pre-cursor full
scale ratio
CR4
KR4
Min: 0.34 V
Max: 0.6 V
Min: 0.4 V
Max: 0.6 V
This section verifies that the minimum pre-cursor equalization ratio is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.5, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.5, Table 93-4
Measurement procedure
1. Set the DUT in PRESET mode and compute the filter coefficients.
2. Calculate equalizer coefficients C(-1), C(0) and C(1). Minimum pre-cursor
equalization ratio is calculated as below:
Minimum post-cursor full
scale ratio
Min Pre-Cursor Eq Ratio = [C(0) – C(-1)] / [C(0) + C(-1)]
Limits
CR4 Minimum pre cursor equalization ratio >= 1.54
KR4 Minimum pre cursor equalization ratio >= 1.54
This section verifies that the minimum pre-cursor equalization ratio is within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.5, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.5, Table 93-4
Measurement procedure
1. Set the DUT in PRESET mode and compute the filter coefficients.
2. Calculate equalizer coefficients C(-1), C(0) and C(1). Minimum Post cursor
equalization ratio is calculated as below:
Min Post-Cursor Eq Ratio = [C(0) – C(1)] / [C(0) + C(1)]
Limits
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CR4 Minimum post cursor equalization ratio >= 4
KR4 Minimum post cursor equalization ratio >= 4
Normalized coefficient
step size
This section verifies that the increment and decrement step size of transmitter equalizer coefficients (C(-1), C(0) and C(1)) of the DUT are in conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.4, Table 92-6
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.4, Table 93-4
Measurement procedure
C(-1) Increment step size and C(-1) Decrement step size:
1. Set the DUT in PRESET state; acquire the signal and calculate the filter coefficients.
2. Configure all the DUT’s transmitter equalizer coefficients to INITIALIZE state.
3. Measure the C(-1) coefficient value and denote as C(-1)_Initilaize
4. Configure the DUT’s transmitter equalizer coefficient C(-1) to
INCREMENT, C(0) and C(1) to HOLD state.
5. Measure the C(-1) coefficient value and denote as C(-1)_Increment
6. C(-1) Increment step size is calculated as: Δc = C(-1)_Increment –
C(-1)_Initialize
7. Configure the DUT’s transmitter equalizer coefficient C(-1) to DECREMENT, C(0) and C(1) to HOLD state.
8. Measure the C(-1) coefficient value and denote as C(-1)_Decrement
9. C(-1) Increment step size is calculated as: Δc = C(-1)_Decrement –
C(-1)_Increment
C(0) Increment step size and C(0) Decrement step size:
1. Set the DUT in PRESET state; acquire the signal and calculate the filter coefficients.
2. Configure all the DUT’s transmitter equalizer coefficients to INITIALIZE state.
3. Measure the C(0) coefficient value and denote as C(0)_Initilaize
4. Configure the DUT’s transmitter equalizer coefficient C(0) to INCREMENT,
C(-1) and C(1) to HOLD state.
5. Measure the C(0) coefficient value and denote as C(0)_Increment
6. C(0) Increment step size is calculated as: Δc = C(0)_Increment –
C(0)_Initialize
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7. Configure the DUT’s transmitter equalizer coefficient C(0) to DECREMENT, C(-1) and C(1) to HOLD state.
8. Measure the C(0) coefficient value and denote as C(0)_Decrement
9. C(0) Increment step size is calculated as: Δc = C(0)_Decrement –
C(0)_Increment
C(1) Increment step size and C(1) Decrement step size:
1. Set the DUT in PRESET state; acquire the signal and calculate the filter coefficients.
2. Configure all the DUT’s transmitter equalizer coefficients to INITIALIZE state.
3. Measure the C(1) coefficient value and denote as C(1)_Initilaize
4. Configure the DUT’s transmitter equalizer coefficient C(1) to INCREMENT,
C(-1) and C(0) to HOLD state.
5. Measure the C(1) coefficient value and denote as C(1)_Increment
Coefficient initialization
ratio
6. C(1) Increment step size is calculated as: Δc = C(1)_Increment – C(1)_Initialize
7. Configure the DUT’s transmitter equalizer coefficient C(1) to DECREMENT, C(-1) and C(0) to HOLD state.
8. Measure the C(1) coefficient value and denote as C(1)_Decrement
9. C(1) Increment step size is calculated as: Δc = C(1)_Decrement –
C(1)_Increment
Limits
CR4
KR4
Min: 0.0083
Max: 0.05
Min: 0.0083
Max: 0.05
This section verifies that the equalizer coefficient initialization ratios (Initialization Ratio1 and Initialization Ratio2) of the DUT are within the conformable limits according to the specification.
Standards Test points Specification
CR4 TP2 IEEE 802.3bj, Section 92.8.3.5.3
KR4 TP0a IEEE 802.3bj, Section 93.8.1.5.3
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Measurement procedure
1. Set the DUT in PRESET mode and compute the linear fit pulse.
2. Set the DUT in INITIALIZE mode and compute the linear fit pulse.
3. Compute the equalizer coefficients C(-1), C(0), and C(1) using linear fit
impulse responses of PRESET and INITIALIZE modes.
4. Coefficient Initialization Ratio1 is calculated by the following formula:
Initialization Ratio1 = (c(0)+c(1)–c(–1))/(c(0)+c(1)+c(–1))
5. Coefficient Initialization Ratio2 is calculated by the following formula:
Initialization Ratio2 = (c(0)–c(1)+c(–1))/(c(0)+c(1)+c(–1))
Limits
CR4 and KR4 Coefficient Initialization Ratio1 1.29±10%
Coefficient Initialization Ratio2 2.57±10%
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76 TekExpress® 100G-TXE Printable Application Help

SCPI commands

About SCPI command

You can use Standard Commands for Programmable Instruments (SCPI) to communicate with the TekExpress application.

Socket configuration for SCPI commands

This section describes the steps for TCPIP socket configuration and TekVISA configuration to execute the SCPI commands.
TCPIP socket configuration
1. Click Start > Control Panel > System and Security > Windows Firewall >
Advanced settings
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SCPI commands
2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer > Inbound Rules
and click New Rule…
3. In New Inbound Rule Wizard menu a. Select Port and click Next
78 TekExpress® 100G-TXE Printable Application Help
b. Select TCP as rule apply and enter 5000 for Specific local ports and
click Next
SCPI commands
c. Select Allow the connection and click Next
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SCPI commands
d. Select Domain, Private, Public and click Next
e. Enter Name, Description (optional), and click Finish
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SCPI commands
4. Check whether the Rule name is displayed in Windows Firewall with Advanced Security menu > Inbound Rules
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SCPI commands
TekVISA configuration
1. Click Start > All Programs > TekVISA > OpenChoice Instrument
Manager
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SCPI commands
2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of the
TekExpress device in Hostname and type Port as 5000. Click configure the IP address with Port.
Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the TekExpress application system.
to
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SCPI commands
3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager >
Instruments
4. Double-click OpenChoice Takler Listener and enter the Command *IDN?
in command entry field and click Query. Check that the Operation is successful and Talker Listener Readout displays the Command / Data.
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SCPI commands

TEKEXP:*IDN?

This command queries the active TekExpress application name running on the oscilloscope.
Outputs

TEKEXP:*OPC?

Syntax
Inputs
Syntax
Inputs
TEKEXP:*IDN?\n
NA
Returns active TekExpress application name running on the oscilloscope.
TIP. Click here for examples.
This command queries the execution status of the last executed command.
TEKEXP:*OPC?\n
NA
Outputs
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0 - last command execution is not complete
1 - last command execution is complete
TIP. Click here for examples.
SCPI commands

TEKEXP:ACQUIRE_MODE

This command sets the acquire mode as live or pre-recorded.
Syntax
Inputs
Outputs
TEKEXP:ACQUIRE_MODE {LIVE | PRE-RECORDED}\n
{LIVE | PRE-RECORDED}
NA
TIP. Click here for examples.

TEKEXP:ACQUIRE_MODE?

This command queries the acquire mode type.
Syntax
Inputs
TEKEXP:ACQUIRE_MODE?\n
NA
Outputs
{LIVE | PRE-RECORDED}
TIP. Click here for examples.
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SCPI commands

TEKEXP:EXPORT

This command returns all the bytes of data to the specified file.
Syntax Outputs
TEKEXP:EXPORT REPORT\n Returns the report file in bytes
TEKEXP:EXPORT WFM,"<FileName>"\n Returns the specified waveform file in bytes
TEKEXP:EXPORT IMAGE,"<FileName>"\n Returns the specified image file in bytes

TEKEXP:INFO?

Inputs
FileName - Specifies the file name
TIP. Click here for examples.
This command queries the information about the file(s).
Syntax Outputs
TEKEXP:INFO? REPORT\n <ReportFileSize>,"<ReportFileName.mht>"
TEKEXP:INFO? WFM\n <WfmFile1Size>,"<WfmFileName1.wfm>";<Wfm
File2Size>,"<WfmFileName2.wfm>";...
TEKEXP:INFO? IMAGE\n <Image1FileSize>,"<Image1FileName>";<Image
2FileSize>,"<Image2FileName>" ;...
TIP. Click here for examples.
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SCPI commands

TEKEXP:INSTRUMENT

This command sets the value for the selected instrument type.
Syntax
Inputs
Outputs

TEKEXP:INSTRUMENT?

TEKEXP:INSTRUMENT "<InstrumentType>",<Value>"\n
InstrumentType
Value
TIP. Check Command parameters list for InstrumentType and Value parameters.
NA
TIP. Click here for examples.
This command queries the instrument selected for the specified instrument type.
Syntax
Inputs
TEKEXP:INSTRUMENT? "<InstrumentType>"\n
InstrumentType
TIP. Check Command parameters list for InstrumentType parameters.
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SCPI commands
Outputs

TEKEXP:LASTERROR?

Syntax
Inputs
Outputs
Returns the instrument selected for the specified instrument type
TIP. Click here for examples.
This command queries the last error string occurred for the current TCP session. If there are no errors since startup, or since the last call to TEKEXP:LASTERROR?\n, this command returns an empty string.
TEKEXP:LASTERROR?\n
NA
<string>

TEKEXP:LIST?

TIP. Click here for examples.
This command queries the list of available device, suite, test, version or instrument.
Syntax Outputs
TEKEXP:LIST? DEVICE\n Returns the list of available device(s) as comma
separated values.
TEKEXP:LIST? SUITE\n Returns the list of available suite(s) as comma
separated values.
TEKEXP:LIST? TEST\n Returns the list of available test(s) as comma
separated values.
TEKEXP:LIST? VERSION\n Returns the list of available version(s) as comma
separated values.
TEKEXP:LIST? INSTRUMENT,"<InstrumentType>"\n
Returns the list of available instruments' for the given Instrument type as comma separated values.
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SCPI commands
NOTE. This command returns the list of items within double quotes (""). Iterate the receive procedure until the list ends with double quotes otherwise the next query commands won’t work as expected.

TEKEXP:MODE

Inputs
Syntax
Inputs
Outputs
InstrumentType
TIP. Check Command parameters list for InstrumentType parameters.
TIP. Click here for examples.
This command sets the execution mode as compliance or user defined.
TEKEXP:MODE {COMPLIANCE | USER-DEFINED}\n
{COMPLIANCE | USER-DEFINED}
NA
TIP. Click here for examples.
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