Tektronix TDSET3 DATASHEET

Ethernet Compliance Test Software
TDSET3 Data Sheet
Features & Benets
Automated Compliance Testing for 10/100/1000BASE-T PHY
tion
Verica
Designed for use with DPO7000 and MSO/DSA/DPO70000 Series Oscilloscopes
10BASE-T Eth
10BASE-Te Ethernet
100BASE-TX Ethe rnet
1000BASE-T Ethernet
Tektronix offers comprehensive, integrated tool sets for validating the physical layer of IEEE 802.3 Ethernet devices, and for developing and debugging Ethernet-based systems.
The Tektronix TDSET3 Ethernet Compliance Test Software and selected Tektronix oscilloscopes provide one-button testing for 10/100/1000BASE-T test suites as specied by the IEEE standard for compliance testing. TDSET3 automates compliance testing and allows engineers to perform the required te
ernet
sts efciently and reliably right on their bench.
Data Sheet
TDSET3 – Automated Ethernet Physical-layer Compliance Testing
Ethernet compliance testing has some unique measurement challenges:
Generating the "disturbing" signal requires tools to generate both pattern data and noise to provide real-world noise for return loss m easurements
There are many individual amplitude, timing, return loss, and template tests required for each Ethernet variant:
The 10BASE-T standard species 22 tests per port plus fault tolerance and CMRR The 100BASE-TX specication outlines 12 tests per port plus CMRR and more The 1000BASE-T standard calls f or 80 tests per port, plus BER, CMRR, and more
Because of th takes a lot of setup and measurement time, and makes repeatable measurement results difcult to achieve quickly
Performing return loss measurements can be expensive if using a vector network analyzer. Tektronix provides a patented, cost-effective method using an arbitrary waveform generator and oscilloscope
The TDSET3 provides automated compliance testing for 10/100/1000BASE-T PHY verication, including:
Compliance and margin testing for accurate analysis and improved interoperability
Time- and frequency-domain measurements made with a single analysis instrument
Jitter and timing measurements with and without lters
Amplitude, linearity, and droop testing for transmitter performance
Frequency-domain measurements including return loss and power spectral density
User-dened mode enables exible parameter control for character
Detailed test reports with margin and statistical information aid analysis
Wide Range of Tests
To ensure r standards spec ify requirements for the network’s physical layer. The TDSET3 Ethernet Compliance Test Software automates Ethernet physical-layer tests for 10BASE-T, 10BASE -Te, 100BASE-TX, and
e large number of individual tests, compliance testing
ization and margin analysis
eliable information transmission over a network, industry
1000BASE-T Return Loss Measurements.
1000BASE-T in compliance with standards such as IEEE 802.3-2000 and ANSI X3.263-1995. The portfolio of tests includes core PMA and MDI tests like Template, Distortion, Return Loss, Jitter (including the proposed
e jitter method), and Common Mode Voltage.
alternat
Amplitud
The industry standards require the signals to have amplitudes within specifie tests vary with the signal speeds, but include such parameters as peak or peak-to-peak amplitude, overshoot, common mode voltage, and positive/negative pulse symmetry.
e Domain Tests
d ranges to assure interoperability between devices. The amplitude
Return Loss Test
The return loss of the cabling system can also affect interoperability. The standa rds dene the minimum amount of attenuation the reected signal should have relative to the incident signal. The Return Loss test measures the impedance, typically over the range of 100 ±15%. TDSET3
usly performs the Return Loss test for 85, 100, and 115 (111
ingenio for 10BASE-T) impedances as prescribed by the standards, using the same tools such as oscilloscopes and AWG used for other tests, enabling efcient usage of resources.
2 www.tektronix.com
Waveform for 100BASE-TX jitter.
Ethernet Compliance Test Software — TDSET3
TF-GBE-BTP Basic Ethernet Test Fixture.
Waveform for 10BASE-T MAU Ext.
Time Domain Tests
Timing parameters of the signals are also specied by the standards. These tests include timing measurements such as rise time, fall time, and difference or symmetry between rise and fall times.
Jitter Tests
Jitter tests quantify the timing variations of the edges of the signal, using specied test patterns. These jitter measurements include the contributions from duty-cycle distortion and the baseline wander. Jitter is determined by accumulating waveforms, measuring the width of the accumulated points at the eye cros sing , and the peak-to-peak is inferred from minimum and maximum values in the tails of the histogram. For example, the gure above shows the jitter measurement on a 100BASE-TX signal.
Template Tests
Template mask tests are often used to quickly verify that the transmitted signal meets industry standard requirements. These template masks are dened so that signal distortions such as overshoot, jitter, incorrect rise and fall times, etc., will cause the mask test to fail. An
example of a 10BASE-T
template mask test is shown above.
Test Report Generation
The unparalleled automation built into TDSET3 also enables faster validation including the tedious task of generating reports. The user can generate summary or detailed reports at a press of a button.
TF-GBE-EE Test Fixture for Energy Efcient Ethernet measurements on 10BASE-Te.
Test Fixtures
The TF-GBE Series of test xtures supports many of the Ethernet compliance tests, providing convenient signal access, test points for
te removal of disturbing signals, return loss calibration, and
accura cross-connect circuits to connect to trafc generators and link partners. The TF-GBE-BTP is the basic test package for 10/100/1000BASE-T tests. The TF-GBE-ATP is the advanced test package which also includes a 1000BASE-T jitter test chan nel cable.
The TF-GBE-EE is an additional test xture which is required to perform the Energy Efcient Ethernet measurements.
Simplied Pattern Generation
Tektronix offers a complete solution for creating and managing "dist urbing" signals for accurate stress testing. The Tektronix arbitrary waveform generators provide support for adding an d removing the noise-related
nts of t he disturbing signal. Tektronix offers a complete set
eleme of instruments for Ethernet compliance tests and debug work, from oscilloscopes and probes, to compliance test software, test xtures, and signal sources.
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Data Sheet
Characteristics
General
Characteristic
Mask
10BASE-T / 10BASE-Te Tests
Test Description
Template
MAU Template Scale Amplitude Harmonic Jitter With and without cable Return Loss
100BASE-TX Tests
Test Description
Template Positive and negative polarity Amplitude
Time Domain Tests Jitter Jitter and Duty-cycle Distortion Return Loss
1000BASE-T Tests
Test Description
Template Amplitude
rber Options
Distu Jitter
Return Loss
*185 and 115 plots require four-channel oscilloscopes.
2
If clock inaccuracy is high, results may vary on some oscilloscopes due to limitations on the segmented
*
memory acquisitions.
3
Slave-ltered tests require four-channel oscilloscopes.
*
Description
Auto-t, Waveform/Sample Count
MAU Ext (and Inverted), MAU Int (and Inverted), Link Pulse, and TP_IDL
0.9 and 1.1 Differential Voltage, Common Mode Output Voltage Contentofones
85, 100, 111 Ω*
1
Signal Amplitude, Amplitude Symmetry, Differential Output Voltage, Waveform Overshoot
Rise Time, Fall Time, Rise/Fall Time Symmetry
85, 100, 111 Ω*
1
Points A, B, C, D, F, H Peak Voltage (points A, B), Level Accuracy (points B,
C, D), Droop (points G, J), Distortion (with and without TX_TCLK*
2
), Common Mode Output Voltage
With and without disturber signal
3
r(filtered and unfiltered), Slave*
Maste
ered)
unlt 85, 100, 111 Ω*
1
(ltered and
Ordering Information
TDSET3
Ethernet Compliance Test Software. Includes: Application CD and electronic documentation.
Product New Instrument
DPO/DSA/MSO70000
Orders
Opt. ET3 DPO-UP Opt. ET3 DPOFL-ET3
Series DPO7000 Series Opt. ET3 DPO-UP Opt. ET3 DPOFL-ET3
Recommended Accessories
For most Ethernet signal probing, use a 1-1.5 GHz differential probe.
For 1000BASE-T jitter testing, use two 1-1.5 GHz active probes for slave jitter test, and one 1-1.5 GHz active probe for master jitter test.
Please refer to www.tek.com/probes for further information on the recommended models of probes and any necessary probe adapters.
Ethernet Test Fixture
Product Description
TF-GBE-BTP TF-GBE-ATP
Basic Ethernet Test Package Advanced Ethernet Test Package, includes Jitter
Channel
TF-GBE-EE Energy Efcient Ethernet Test Package (order directly
from Crescent Heart Software http://www.c-h-s.com)
l Source (for Return Loss and Disturbing Signal Tests)
Signa
AFG3102*4, AFG3252*4, AWG5000C, or AWG7000C*5Series arbitrary waveform generator.
Additional Information
Tektronix offers a range of solutions for Ethernet testing, including 10GBASE-T and 40/100G Ethernet. To see a comprehensive listing, and download the latest resources, visit www.tek.com/ethernet.
TDSET3 solution updates and up-to-date instrument software upgrades are available at www.tek.com/downloads.
*4Setup lesandwaveformstobecopiedontotheinstrumentusingamemorystick.
5
Two ampli ers, one for each channel, are required. Tektronix has qualied Picosecond Pulse Labs Amplier
*
Model #5866.
Product
Upgrades
Floating License
4 www.tektronix.com
Product(s) are manufactured in ISO registered facilities.
Ethernet Compliance Test Software — TDSET3
www.tektronix.com 5
Data Sheet
6 www.tektronix.com
Ethernet Compliance Test Software — TDSET3
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Data Sheet
Contact Tektronix:
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Central East Eu
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* European toll-free number. If not accessible, call: +41 52 675 3777
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Asia, and North Africa +41 52 675 3777
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Republic of
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sia (65) 6356 3900
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ublic of China 400 820 5835
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Updated 25 May 2010
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For Further Information. Tektronix maintains a comprehensive, constantly expanding collection of application notes, technical briefs and other resources to help engineers working on the cutting edge of technology. Please visit www.tektronix.com
t © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents,
Copyrigh
d pending. Information in this publication supersedes that in all previously published material.
issued an
tion and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of
Specica
x, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks
Tek tro ni
espective companies.
of their r
14 Oct 2010 61W-16429-10
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