The TDS8200 Digital Sampling Oscilloscope
is a comprehensive acquisition and measurement instrument capable of processing
very fast signals. It is the prime tool for
research, design evaluation, and manufacturing test in fields of semiconductor test,
components test,TDR,and other applications
requiring bandwidths into tens of GHz.
The TDS8200 acquires data with very low
jitter and at a very fast acquisition rate.
It can acquire the data in several time
windows, each with its own acquisition
parameters and display window.It provides
a comprehensive suite of measurement
capabilities to evaluate the data, as well
as acquisition math and waveform math
functionality to process the results farther,
with histograms, mask testing and statistics.
Acquired data can be stored in waveform
(vector) format, traditionally used for waveforms,and in a 3D database format common
for eye diagram storage.The TDS8200
provides great flexibility of data storage in
database format with four 3D databases
available simultaneously; the databases
offer an industry-first variable data persistence with accurate data ageing. Color-grading
of waveform data adds a third dimension,
sample density,to your signal acquisitions
and analyses; several mappings of sample
density-to-color are available.
Modularity and Flexibility
Building on the success of the
TDS/CSA8000B, with which it is compatible,
the TDS8200 supports a large and growing
Features & Benefits
DC to 70+ GHz*1Bandwidth
Very Low Jitter with the
Phase Reference Mode New!
– Jitter <200 fs
– Both Free Run and Triggered
Modes Available with Same
Low Jitter
–2 to 60 GHz continuous
Up to Eight Signal Channels
TDR ≤ 35ps Reflected Risetime
True Differential TDR/TDT
Up to Four Differential Pairs
for TDR/TDT/Crosstalk
TDR Probes, Static Protection
Modules Available
Four Color Graded
Variable Persistence
Waveform Databases
MS Windows 2000
Operating System
Modular Architecture
Fast Acquisition Rate
Excellent Signal Fidelity
FrameScan
Comprehensive
Measurement System with
Independently Customizable
Measurements
Includes All of the Features of
the CSA8200 Communication
Signal Analyzer
2
*
RMS
™
Acquisition Mode
Applications
High Speed Component Test
TDR/TDT/Crosstalk Test of
Components and Assemblies
Communications Testing
*1Bandwidth is determined by plug-in modules and
may exceed 70 GHz as higher speed modules will
become available in the future.
2
*
Typical,with the new Phase Reference Module,
some conditions apply.Without the module, the jitter
is <800 fs
RMS
(typical).
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Digital Sampling Oscilloscope
TDS8200
family of electrical and optical plug-in modules. This family includes the first 8200
module for the 8200 series, the 82A04, as
well as the 8000 series modules, which work
in both the new TDS/CSA8200 mainframe
as well as in the older TDS/CSA8000 and
TDS/CSA8000B mainframe.This modular
architecture lets you configure the instrument with the right features for a very wide
range of existing standards and applications,
and with new modules for the future needs.
With its differential clock recovery module
the instrument can be used for acquisition
of differential electrical signals even when
there is no trigger available, just lik e a t r ad i tional Real Time Oscilloscope.
The available electrical modules include a
variety of modules with bandwidths up to
70 GHz and specialized features such as
Time Domain Reflectometry (TDR). For the
TDR probing, the P8018 probe supports full
TDR bandwidth, while the 80A02 module
provides protection from the damage by
electrostatic discharge. These features
enable even measurements performed in
manufacturing environment to achieve highly
precise results, while protecting the TDR
module itself.
The probing solutions for the electrical
signals include adaptor for the popular
®
TekConnect
probing system, bringing the
performance of Tektronix’ state-of-the-art
probes (high impedance, differential, etc.)
to the TDS8200 family.An electrical clock
recovery module covering most popular
rates between 50 Mb/s and 12.6 Gb/s is
available; the ranges are broad enough
to cover even future needs.
Optical modules provide complete optical
test solutions for both telecom (155 Mb/s
to 43 Gb/s) and Datacom (Fibre Channel,
InfiniBand and Gigabit Ethernet) applications,
with clock recovery available as an option
for most optical modules; a variable clock
recovery is available for most popular ranges.
Signal acquisition at high frequency ranges
above 2.0 Gb/s will benefit from the ultralow jitter brought to the TDS8200 by the
80A04 Phase Reference module. Using a
customer supplied clock synchronous to the
signal under the test, this module can either
de-jitter traditionally acquired samples, or
dispense with the traditional trigger +
timebase sample placing altogether and
acquire in a free-run (random) mode.
Uniquely the instrument can accept signal
modules, clock recover y module, and a
Phase Reference module all at the same
time, so the clock recover y Clock Out signal
can be used by the Phase Reference module
to decrease the jitter of the acquired signal.
Superior Performance
With its industry-best horizontal timebase
stability,signal sensitivity and noise perf o r m ance, the instrument ensures the most
accurately acquired signal. The newest
Phase Reference module for the TDS8200
rounds up instrument’s timebase modes for
the state-of-the art with jitter performance,
available with windowed acquisition and
all in all other modes of operation, and for
virtually unlimited timebase depth.
In every mode the TDS8200’s multi-processor
architecture, with dedicated per channel
digital signal processors (DSP), guarantees
a very high acquisition rate.
The TDS8200 T rue differential TDR capability
on as many as 4 differential pairs of signal,
each with rise time well below 35 ps (reflected)
enable complete TDR/TDT/Crosstalk measurements of complex assemblies.TDR Autoset
simplifies the test setup.
The TDS8200 implements the popular
®
FrameScan
acquisition mode, which be
used for scanning of the data bits to isolate
pattern dependent effects, viewing subharmonic interference, or capture the
sequence leading to a mask violation.
Unexpected features such as averaging of
eye diagrams, etc. FrameScan also allows
the user to view an averaged eye diagrams
for applications such as evaluating InterSymbol-Interferences or separating pattern
related Deterministic jitter from Random Jitter.
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Digital Sampling Oscilloscope
TDS8200
8200 Series Sampling
Oscilloscope Platform
TheTDS8200 is built onTektronix’sampling
oscilloscope platform that combines familiar
®
MS Windows
2000-based PC technologies
with world-class waveform acquisition
technology.This platform provides a wide
array of standard instrumentation and
communications interfaces (such as GPIB,
Parallel Printer Port, RS-232-C and USB
Serial Ports and an Ethernet LAN connection).
In addition, the platform includes several
mass storage devices (floppy disk, removable
hard drive and CD-ROM). Gated triggering,
a feature that allows the exclusion of
selected time periods from being measured,
is offered as an option. Finally, because the
system supports an Open Windows environment, new levels of data analysis can be
done directly on the instrument using
commercially available software packages.
™
Additionally,TekVISA,
a standard software
accessory, allows the instrument to be
placed under the control of software applications (e.g., LabVIEW, LabWindows, Visual
Basic, Microsoft Excel, C, etc.) running on
the instrument, or on external PC workstations network connected to the instrument,
without the need for a GPIB hardware
interface. Plug-and-Play drivers for LabVIEW
and other programs are also supplied.
TDS8200 Series
Sampling Oscilloscope
Optical Modules
80C01 Multi-rate Telecom
Optical Sampling Module
The 80C01 module supports waveform conformance testing of long-wavelength (1100
to 1650 nm) signals at 622, 2488 Mb/s
and 9.953 Gb/s as well as general-purpose
testing with up to 20 GHz optical bandwidth.
With its clock recovery option, the 80C01
provides complete testing solutions for 622
and 2488 Mb/s telecom applications.
The 80C02 module is optimized for testing
of long-wavelength (1100 to 1650 nm) signals
at 9.953 Gb/s (SONET OC-192/SDH STM-64).
With its high optical bandwidth of 28 GHz
it is also well suited for general-purpose
high-performance optical component testing.
The 80C02 can be optionally configured
with clock recovery that supports 9.953 Gb/s
telecom standards.A superset of this module’s functionality has been integrated into
the newer, highly flexible 80C11 module.
The 80C07B module is a broad wavelength
(700 to 1650 nm), Single Mode/Multi Mode,
multi-rate, high sensitivity optical sampling
module optimized for the testing of telecom
and datacom signals; built-in and optional
standards include OC-3/STM-1 (155 Mb/s),
OC-12/STM-4 (622 Mb/s), Fibre Channel
(1.063 Gb/s), GbE (1.250 Gb/s), 2G Fibre
Channel (2.125 Gb/s), OC-48/STM-16
(2.488 Gb/s), InfiniBand 2 GbE (2.500 Gb/s).
With its amplified O/E converter design, this
module provides excellent signal-to-noise
performance, allowing users to examine
low-power optical signals.The 80C07B can
be optionally configured with multi-rate
clock recovery that supports rates between
155 and 2.7 Mb/s.
80C08C Multi-rate,
Datacom and Telecom
Optical Sampling Module
for 10 Gb/s
The 80C08C module is a broad wavelength
(700 nm to 1650 nm), Single Mode/Multi
Mode multi-rate optical sampling module
providing datacom rates testing for 10 GbE
applications at 9.95328 Gb/s (10GBase-W,
SONET/STM),10.3125 Gb/s (10GBase-R),
10.51875 Gb/s (10G Fibre Channel),
10 GbE FEC (11.1 Gb/s), and telecom rates
testing for STM64/OC198 (9.953 Gb/s),
ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709
(10.709 Gb/s).With its amplified optical-toelectrical (O/E) converter design, this module
provides excellent signal-to-noise performance and high optical sensitivity,allowing
users to examine low-power level optical
signals.The 80C08C can be optionally configured with a number of clock recovery
solutions in the 9.953 Gb/s, 10.3125 Gb/s,
10.3125 Gb/s, 10.51875 Gb/s rate range,
and with a multi-rate clock recovery.
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3
Digital Sampling Oscilloscope
TDS8200
80C10 65 GHz 40 Gb/s
Optical Sampling Module
The 80C10 module provides integrated
and selectable reference receiver filtering
enabling conformance testing at either
1310 nm or 1550 nm for 39.813 Gb/s
(OC-768/STM-256) and 43.018 Gb/s
(43 Gb/s ITU-T G.709 FEC) rates. In addition
to the filter rates the user may also choose
selectable bandwidths of 30 GHz or 65 GHz
for optimal noise vs. bandwidth performance
for accurate signal characterization.
The 80C11 module is optimized for testing
of long-wavelength (1100 to 1650 nm) signals
at a number of rates around 10 Gb/s with
a highly flexible multi-rate filter.Additionally
the high optical bandwidth of 30 GHz (typical)
of its full BW path is well suited for generalpurpose high-performance optical component
testing.The 80C11 can be optionally configured with clock recovery and with flexible
clock recovery that support rates in the
10 Gb/s band (9.953 Gb/s, 10.3125 Gb/s,
10.3125 Gb/s, 10.51875 Gb/s,
10.664 Gb/s, 10.709 Gb/s, and others).
80C12 High flexibility
Multi-rate Optical
Sampling Module
The 80C12 module is a broad wavelength
(700 to 1650 nm), Single-mode/Multi-mode,
multi-rate, high sensitivity optical sampling
module optimized for the testing of telecom
and datacom signals; two to four filters/optical
reference receivers can be optioned into the
module.The filter selection includes OC-3/STM-1
(155 Mb/s), OC-12/STM-4 (622 Mb/s),
Fibre Channel (1.063 Gb/s), 2G Fibre
Channel (2.125 Gb/s) and 4G Fibre Channel
(4.25 Gb/s), GbE (1.250 Gb/s), OC-48/STM-16
(2.488 Gb/s), InfiniBand 2 GbE (2.500 Gb/s,
10 GbE by four (10GBase-x4 at 3.125 Gb/s),
as well as 10GFC by four at 3188 Gb/s.
The 80C12 also offers electrical out for
e.g. BER testing, or for an electrical clock
recovery module (such as the multi-rate
80A05 Electrical Clock Recovery module).
TDS8200 Series
Sampling Oscilloscope
Electrical Modules
80E01 Sampling Module
The 80E01 is a single channel, 50 GHz
bandwidth sampling module.The 80E01
has a measured bandwidth of 50 GHz or
more and a calculated rise time of 7.0 ps or
less. Displayed noise is typically 1.8 mV
RMS
The front-panel connector is female 2.4 mm
and an adapter is provided (2.4 mm male to
2.92 mm female) to maintain compatibility
with SMA connector systems.
80E02 Low-noise
Sampling Module
The 80E02 is a dual-channel, 12.5 GHz
sampling module specifically designed for
low-noise measurements in digital communications and device characterization applications. It provides an acquisition rise time
of 28 ps and typically 400 µV
of displayed
RMS
noise.The 80E02 is the ideal instrument for
low-noise applications. Common applications
for the 80E02 are capturing and displaying
switching characteristics of high-speed
communications circuits, making accurate
statistical measurements of signal noise
and signal timing jitter or obtaining stable
timing measurements of fast digital ICs.
80E03 Sampling Module
The 80E03 is a dual channel, 20 GHz
sampling module.This sampling module
provides an acquisition rise time of 17.5 ps.
80E04 TDR Sampling Module
The 80E04 is a dual-channel,20 GHz sampling
module with TDR capability .The TDR feature
provides high resolution with true differential
capability and rise time below 17.5 ps
(incident)/35 ps (reflected). Acquisition
capabilities match the 80E03 module.
80E06 70+ GHz
Sampling Module
.
The 80E06 is a single channel, 70+ GHz
(typical bandwidth) sampling module with
5.0 ps calculated rise time.Typical RMS noise
is 2.0 mV.This sampling module provides
a 1.85 mm (Type V) front-panel connector
and a precision adapter to 2.92 mm with a
50 Ω SMA termination. 1 meter or 2 meter
length extender cables can be ordered for
remote operation of the sampling module
from the sampling oscilloscope mainframe.
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Digital Sampling Oscilloscope
TDS8200
TDS8200 Series
Sampling Oscilloscope
82A04 Phase
Reference Module
and Other Accessory
Modules
80A01 Pre-Scaled
Trigger Amplifier
The 80A01 module can be used to increase
the amplitude of the clock signal to the
Phase Reference module 82A04 (see below)
for clocks in the 8 to 12.5 GHz range.
Another application for this module is to
increase the sensitivity of the Prescaler
Trigger to ≤200 mV for 8 to 12.5 GHz signals
on the older TDS8000 mainframes; this
functionality is typically not necessary on
the TDS8200 mainframes with their
increased sensitivity prescaler.
80A02 EOS/ESD
Protection module
The 80A02 EOS/ESD Protection module
protects the sampling bridge of Tektronix
electrical sampling module inputs from
damage by electrostatic charge.The 80A02
is intended for use in applications such as
electrical TDR circuit board testing and
cable testing where large static charges
can be stored in the DUT.
The 80A02 plugs into any available electrical
sampling module plug-in slot of the TDS8000
Series oscilloscopes.The unit provides a
front panel SMA connector for connecting
the SMA test cable or probe signal from
the DUT.The 80A02 passes the acquired
DUT signal to a connected electrical sampling module input for measurement after
an actuating control signals the 80A02
that the DUT has been discharged.
When used with the matching P8018 20 GHz
single-ended handheld probe (with probe
tip pressure actuating feature) the 80A02
provides a superior technique and performance capability for single-channel electrical
sampling module EOS/ESD protection of
acquired electrical signal and TDR measurement. (See P8018 product description.)
80A03 TekConnect Probe
Interface Module
The 80A03 plugs into any of the four
electrical sampling module slots on the
TDS8000 and provides probe power and
control for up to two Tektronix P7000 series
probes.The 80A03 is powered through the
oscilloscope and requires no user adjustments
or external power cords.An electrical sampling module can be plugged directly into the
slot on the 80A03 to provide the optimum
signal fidelity and a short electrical path; or
the signal from the probe can be connected
to a module plugged in the mainframe, or
to a mainframe input such as trigger input.
Using the 80A03 with the TDS8000 series
oscilloscope, design engineers benefit from
Tektronix industry-leading active and differential probes to measure signals on SMD pins
and other challenging circuit features.
82A04 Phase
Reference Module
The 82A04 module adds very accurate phase
information to the timebase of the TDS8200.
This enables an extremely low jitter – better
than 200 fs
– signal acquisition. Input
RMS
frequency range of the reference clock is
2 to 60 GHz,continuous (2 to 25 GHz without
option 60G). (An external filter typically is
required below 8 GHz for non-sinusoidal
reference clock signals).The module
occupies any one electrical module slot; the
3 remaining electrical (or 2 optical, 1 electrical;
or 1 optical, 2 electrical) module slots can
be used for signal acquisition.The 82A04
supports both the Triggered mode of operation,
which is similar to usual acquisition, and an
un-triggered Free Run mode where all timing
information comes from the customer-supplied
clock alone (no trigger signal necessary).
When the external clock is not available the
module can accept the clock signal from
the clock recovery output of the 80Cxx
modules, as well as from the 80A05 clock
recovery module.
80A05 Electrical Clock
Recovery Module
The 80A05 Electrical Clock Recovery
Module enables clock recovery for electrical
signals, as well as internal triggering on the
recovered clock.The module recovers clocks
from serial data streams for all of the most
common electrical standards in the 50 Mb/s
to 4.25 Gb/s range. Option 10G adds support
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5
Digital Sampling Oscilloscope
TDS8200
for standard rates up to 12.6 Gb/s.The module
accepts either single-ended or differential
signals as its input, providing both singleended or differential clock recovery.The
signal(s) is/are then passed on to the output
connectors (at about 50% of the input level)
and can be connected to sampling module(s)
for differential or single-ended sampling.
This module also serves as the clock recovery
module for the 80C12.
Characteristics
Signal Acquisition
Acquisition Modes – Sample (normal), Envelope
and Average.
Number of Sampling Modules Accommodated –
Up to four,dual-channel electrical; up to two optical
sampling modules. (Both single- and dual-channel
modules appropriate the two channels associated
with the slot).
Population of the Ch 1/Ch 2 large slot with any
module other than one requiring power only displaces
functionality of the Ch 1/Ch 2 small slot; population
of the Ch 3/Ch 4 large slot with any module other
than one requiring power only displaces functionality
of the Ch 3/Ch 4 small slot.
Number of Simultaneously Acquired Inputs–
Eight channels maximum.
Vertical Systems
Rise Time/Bandwidth – Determined by the sampling
modules used.
Vertical Resolution – 14 bits over the sampling
modules’ dynamic range.
Horizontal System
Four timebase modes are available:
Triggered Phase Reference*
1
Timebase
Mode – Timing information extracted from a
user supplied phase reference (clock) signal
significantly improves timebase accuracy and
jitter performance of the triggered acquisition.
Horizontal position is referenced to the trigger
signal as with a traditional timebase.
1
Free Run Phase Reference*
Timebase
Mode – All timing is based on a phase refer-
ence signal; accuracy and jitter as above; no
trigger is needed, and correspondingly there
is no timing relation to trigger signal.
Short Term Optimized Sequential*
2
Timebase Mode – Best short-delay perform-
ance for acquisitions without the external
phase reference signal.
Locked to 10 MHz Reference Sequential
Timebase – Provides the best long-delay per-
formance for acquisitions without the external
phase reference signal.The Lock is selectable
between Lock to Internal 10 MHz and Lock to External 10 MHz for highest frequency
accuracy.
Main and Magnification View Timebases –
100 fs/div to 5 ms/div in 1-2-5 sequence or
100 fs increments.
Maximum Trigger Rate – 200 kHz; in Phase
Reference mode: 50 kHz.
Time Interval Accuracy
(Standard Timebase) and
Timing Deviation (Phase
Reference Modes)
Phase Reference Timebase–
Triggered:maximum timing deviation relative to
phase reference signal:
horizontal position >40 ns after trigger event:
0.2% of phase reference signal period (typical).
horizontal position ≤ 40 ns after trigger event:
0.4% of phase reference signal period (typical).
Phase Reference Timebase–
Free Run: maximum timing deviation relative
to phase reference signal:
0.1% or better of phase reference signal
period (typical).
2
Sequential Timebase*
–
Time Interval Accuracy:
Horizontal scale: <21 ps/div:
1 ps + 1% of interval.
Horizontal scale: ≥21 ps/div:
8 ps + 0.1% of interval (Short-term
optimized mode).
8 ps + 0.01% of interval (Locked to
10 MHz mode).
Horizontal Deskew Range Available (Sequential
timebase only) – –500 ps to +100 ns on any
individual channel in 100 fs increments.
Record Length – 20, 50, 100, 250, 500, 1000,
2000 or 4000 samples.
Magnification Views – In addition to the main
timebase, the TDS8200 supports two magnification
views.These magnifications are independently
acquired using separate timebase settings which
allow same or faster time/div than that of the
main timebase.
*1When using the 82A04 Phase Reference Module.
2
Traditional Mode– not using the 82A04 Phase Reference
*
Timebase module.
Trigger System
Trigger Sources
External direct trigger.
External pre-scaled trigger.
Internal clock trigger: Internally connected to
direct trigger.
Clock recovery triggers from optical sampling
modules and from the 80A05 electrical clock
recovery module – signal from the module
(pre-scaled above 2.7 Gb/s) internally connected.
Phase Reference*
faster acquisition module, with f ≥8 GHz, 0.6 V
≤VREF ≤1.8V Phase Reference Signal.
Jitter: system jitter of 280 fs
typical, on a 10 GHz
RMS
or faster acquisition module,in TDS8200 mainframe,
with 2 GHz ≤f ≤8 GHz,0.6 V ≤VREF ≤ 1.8 V Phase
Reference Signal.
The Phase Reference timebase remains operational
to 100 mV (typical) with increased jitter.
*3When using the 82A04 Phase Reference Module.
Short-term Jitter Optimized Sequential Mode –
≤0.8 ps
≤1.2 ps
+5 ppm of position (typical).
RMS
+10 ppm of position (max.).
RMS
Locked to 10 MHz Reference Sequential Mode –
≤1.6 ps
≤2.5 ps
+0.04 ppm of position (typical).
RMS
+0.01 ppm of position (max.).
RMS
Internal Clock – Adjustable from 25 to 200 kHz
(drives TDR,internal clock output and calibrator).
Trigger Level Range – ±1.0 V.
Trigger Input Range – ±1.5 V.
Trigger Holdoff – Adjustable 5 µs to 100 ms in
enables gate, a TTL logic 0 disables gate,
maximum non-destruct input level ±5 V.
Display Features
Touch Screen Display – 264 mm/10.4 in.
diagonal, color.
Colors – 16,777,216 (24 bits).
Video Resolution – 640 horizontal by 480 vertical
displayed pixels.
Math/Measurement
System Measurements
The TDS8200 supports up to eight simultaneous
measurements, updated three times per second
with optional display of per measurement statistics
(min, max, mean and standard deviation).
Measurement Set
Automated Measurements include RZ, NRZ,
and Pulse signal types and the following:
Up to eight math waveforms can be defined and
displayed using the following math functions:Add,
Subtract, Multiply,Divide, Average, Differentiate,
Exponentiate, Integrate, Natural Log, Log,
Magnitude, Min, Max, Square Root and Filter.
In addition, measurement values can be utilized
as scalars in math waveform definitions.
Mask T esting
In addition to user-defined masks,the following
predefined masks are built-in:
Offset CapabilityPower MeterPower Meter RangePower Meter Mask Test
AccuracyOptical Sensitivity*
80C01StandardStandard+4 dBm to –30 dBm5% of reading–8 dBm at 622 Mb/s,
2.488 Gb/s, 9.953 Gb/s;
–5.0 dBm at 20 GHz
5
80C02StandardStandard+4 dBm to –30 dBm5% of reading–9 dBm at 9.953 Gb/s;
–7 dBm at 20 GHz;
–4 dBm at 30 GHz
80C07BStandardStandard+4 dBm to –30 dBm5% of reading–22 dBm at 155 Mb/s,
622 Mb/s; –20 dBm at
2488/2500 Mb/s
80C08CStandardStandard0 dBm to –30 dBm5% of reading–15 dBm at all filter ra tes
80C10StandardStandard+13 dBm to –21 dBm5% of reading0 dBm a t 39.813 Gb/s,
43.018 Gb/s; 0 dBm
at 30 GHz; +3 dBm
at 65 GHz
80C11StandardStandard+4 dBm to –30 dBm5% of reading–10 dBm at all filter rates;
–7 dBm at 20 GHz;
–4 dBm at 30 GHz
80C12StandardStandard0 dBm to –30 dBm5% of reading–15 dBm (for all options
except Option 10G)
–12 dBm (for Option 10G)
*5Smallest power level for mask test.Values represent theoretical typical sensitivity of NRZ eyes for competitive comparison purposes. Assumes instrument peak-peak noise consumes most of the mask margin.
Physical Characteristics for Optical Sampling Modules
80E01Microwave150 ±0.5 Ω2.4 mm female precision50 GHz
General Purposeadapter to 2.92 mm
included with 50 Ω
SMA termination
6
80E02Lo w-level Signals250 ±0.5 Ω3.5 mm female12.5 GHz*
80E03Device Characterization250 ±0.5 Ω3.5 mm female20 GHz*
80E04TDR Impedance250 ±0.5 Ω3.5 mm female20 GHz*
Characterization with
single-ended, common,
differential TDR capability
80E06High-speed Electrical 150 ±0.5 Ω1.85 mm female precision 70+ GHz
Device Characterizationadapter to 2.92 mm
included with 50 Ω
SMA termination
*6Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.
80E0110 mV to 1.0 V full scale± [2 mV + 0.007 (Offset) + ±3% or less over the zone 10 ns 1.8 mV ≤2.3 mV (maximum)
0.02 (Vertical Value – Offset)]to 20 ps before step transition;
+12%, –5% or less for the first
300 ps following step transition;
+5.5%, –3% or less over the zone
300 ps to 3 ns following step
transition; ±1% or less over the
zone 3 ns to 100 ns following
step transition; ±0.5% after
100 ns following step transition
9
80E0210 mV to 1.0 V full scale± [2 mV + 0.007 (Offset) + ±3% or less over the zone 10 ns 400 µV ≤800 µV (maximum)
0.02 (Vertical Value – Offset)]to 20 ps before step transition;
+10%, –5% or less for the first
300 ps following step transition;
±3% or less over the zone
300 ps to 5 ns following step
transition; ±1% or less over the
zone 5 ns to 100 ns following step
transition; ±0.5% after 100 ns
following step transition
80E0310 mV to 1.0 V full scale± [2 mV + 0.007 (Offset) + ±3% or less over the zone 10 ns600 µV ≤1.2 mV (maximum)
0.02 (Vertical Value – Offset)]to 20 ps before step transition;
+10%, –5% or less for the first
300 ps following step transition;
±3% or less over the zone
300 ps to 5 ns following step
transition; ±1% or less over the
zone 5 ns to 100 ns following step
transition; ±0.5% after 100 ns
following step transition
80E0410 mV to 1.0 V full scale± [2 mV + 0.007 (Offset) + ±3% or less over the zone 10 ns600 µV ≤1.2 mV (maximum)
0.02 (Vertical Value – Offset)]to 20 ps before step transition;
+10%, –5% or less for the first
300 ps following step transition;
±3% or less over the zone
300 ps to 5 ns following step
transition; ±1% or less over the
zone 5 ns to 100 ns following step
transition; 0.5% after 100 ns
following step transition
80E0610 mV to 1.0 V full scale± [2 mV + 0.007 (Offset) + ±5% or less for first 300 ps 1.8 mV ≤2.4 mV (maximum)
0.02 (Vertical Value – Offset)]following step transition
*9Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.
Oscilloscopes – Sampling Oscilloscopes
•
www.tektronix.com/scopes
13
Digital Sampling Oscilloscope
TDS8200
Physical Characteristics for Electrical Sampling Modules
Channels2
Input Impedance50 ±0.5 Ω
Channel Input Connector3.5 mm
Bandwidth20 GHz
TDR Step Amplitude250 mV (polarity of either step may be inverted)
TDR System Reflected Rise Time≤35 ps each polarity
TDR System Incident Rise Time28 ps (typical)
TDR Step Maximum Repetition Rate200 kHz
TDR System Step Response Aberrations±3% or less over the zone 10 ns to 20 ps before step transition;
+10%, –5% or less typical for the first 400 ps following step transition;
±3% or less over the zone 400 ps to 5 ns following step transition;
±1% or less after 5 ns following step transition
*9Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.
14
Oscilloscopes – Sampling Oscilloscopes
•
www.tektronix.com/scopes
Digital Sampling Oscilloscope
TDS8200
Power Requirements
Line Voltage and Frequency–
100 to 240 VAC ±10% 50/60 Hz.
115 VAC ±10% 400 Hz.
Environmental characteristics
Temperature –
Operating: +10 ºC to +40 ºC.
Nonoperating: –22 ºC to +60 ºC.
Relative Humidity –
Operating (Floppy disk and CD-ROM not installed):
20% to 80% at or below 40 ºC (upper limit
de-rates to 45% relative humidity at 40 ºC).
Nonoperating:
5% to 90% at or below 60 ºC (upper limit
de-rates to 20% relative humidity at +60 ºC).
Altitude –
Operating: 3,048 m (10,000 ft.).
Nonoperating: 12,190 m (40,000 ft.).
Digital Sampling Oscilloscope.
Includes: User manual, quick reference card, MS
Windows 2000 compatible keyboard, MS Windows
2000 compatible mouse, touch screen stylus,
online help, programmer online guide, power cord.
With OpenChoice
enhanced test and measurement analysis with the
capability of full integration of third-party software
on the Open Windows oscilloscopes.By working
with the industry leaders, National Instruments and
The MathWorks,examples of software programs
from these companies are featured on all Tektronix
Open Windows oscilloscopes.
tooling and instructions for converting bench
model to rackmount configuration).
Option GT – Gated Trigger.
™
software,Tektronix provides
Service Options
Opt. C3 – Calibration Service 3 Years.
Opt. C5 – Calibration Service 5 Years.
Opt. D1 – Calibration Data Report.
Opt. D3 – Calibration Data Report 3 Years
(with Option C3).
Opt. D5 – Calibration Data Report 5 Years
(with Option C5).
Opt. R3 – Repair Service 3 Years.
Opt. R5 – Repair Service 5 Years.
International Power
Plug Options
Opt. A0 – North America Power.
Opt. A1 – Universal EURO Power.
Opt. A2 – United Kingdom Power.
Opt. A3 – Australia Power.
Opt. A4 – 240 V ,North America Power.
Opt. A5 – Switzerland Power.
Opt. A99 – No Power Cord.
Opt. A10 – China Power.
174-3896-00.This cable can be used to power
one accessory module which doesn’t require
CPU communication (80A01, 80A02; but not
82A04, 80A05).This extender cable plugs into
the “Trigger Power”connector on the mainframe,
or into the “Probe Power”connector on the
electrical sampling module.
82A04 Filter 2 GHz – Filter kit for non-sinusoidal
phase reference clock signal with frequency
between 2 GHz and 4 GHz. Order 020-2566-00.
82A04 Filter 4 GHz – Filter kit for non-sinusoidal
phase reference clock signal with frequency
between 4 GHz and 6 GHz. Order 020-2567-00.
82A04 Filter 6 GHz – Filter kit for non-sinusoidal
phase reference clock signal with frequency
between 6 GHz and 8 GHz. Order 020-2568-00.
2X Attenuator (SMA male-to-female) – DC to
18 GHz. Order 015-1001-01.
5X Attenuator (SMA male-to-female) – DC to
18 GHz. Order 015-1002-01.
Connector Adapter – (2.4 mm or 1.85 mm male
to 2.92 mm female) DC to 40 GHz. Order
011-0157-00.
Power Divider – 50 Ω, impedance matching
power divider,SMA male to two SMA
females. Order 015-0705-00.
Rackmount Kit – Order 016-1791-01.
Wrist Strap (Antistatic) – Order 006-3415-04.
P6209 – 4 GHz Active FET Probe.
P7260 – 6 GHz Active FET Probe.Requires 80A03
interface module (see below).
P7350 – 5 GHz Active FET Probe.Requires 80A03
interface module (see below).
P7350SMA – 5 GHz 50 Ω Differential to Single-
ended Active Probe.Requires 80A03 interface
module (see below). Note that the P7380 probes
are recommended over the P7350 probes for
sampling purposes due to their higher bandwidth
and signal fidelity.
P7380SMA – 8GHz 50 Ω Differential to Single-
ended Active Probe.Requires 80A03 interface
module (see below).
P6150 – 9 GHz Passive Probe; the probe consists
of a very high quality,cca. 20 GHz probe tips, plus
an extremely flexible SMA cable. For higher frequency performance the 015-0560-00, or some
of the accessory cables listed below, can be used.
P8018 – 20 GHz Single-ended TDR Probe.80A02
module (below) recommended for static protection
of the sampling or TDR module.
80A01– Pre-scaled Trigger Amplifier.
Not necessary on the TDS8200 mainframe with its
increased sensitivity prescaler,the Pre-scaled
Trigger Amplifier enhances prescaler sensitivity on
the older TDS8000B and CSA8000B mainframes.
82A04 – Phase Reference Module for low jitter
acquisition (with or without trigger).Accepts
signal from 2 GHz to 25 GHz (external filter
might be required below 8 GHz), or to 60 GHz
with Option 60G.
80A05 – Electrical clock recovery module/clock
recovery for the 80C12.
The standard version of 80A05 supports signals
in the following ranges: 50 Mb/s to 2.700 Gb/s,
2.700 Gb/s to 3.188 Gb/s, and the rate of
4 Gigabit Fibre Channel 4.250 Gb/s. The
Option 10G adds the ranges of 3.267 Gb/s
to 4.250 Gb/s, 4.900 Gb/s to 6.375 Gb/s,
and 9.800 Gb/s to 12.60 Gb/s.
K4000 – Mobile Workstation.
Interconnect Cables
015-0560-00 (450 mm/18 inch; 1 dB loss at
20 GHz) cable is a high quality cable recommended
for work on 20 GHz.
Interconnect Cables
(Third Party)
Tektronix recommends using quality high performance interconnect cables with these high bandwidth products in order to minimize measurement
degradation and variations.The W.L.Gore &
Associates’ cable assemblies listed below are compatible with the 2.92 mm, 2.4 mm,and 1.85 mm
connector interface of the 80E0x modules.
Assemblies can be ordered by contacting Gore
by phone at (800) 356-4622, or on the Web at
www.goreelectronics.com (click on “Contact Us”).