The SPC56EL60 series microcontrollers are system-on-chip devices that are built on Power
Architecture technology and:
●Are 100% user-mode compatible with the classic Power Architecture instruction set
●Contain enhancements that improve the architecture’s fit in embedded applications
●Include additional instruction support for digital signal processing (DSP)
●Integrate technologies such as an enhanced time processor unit, enhanced queued
analog-to-digital converter, Controller Area Network, and an enhanced modular inputoutput system
The SPC56EL60 is a compatible extension to the STMicroelectronics product roadmap for
Safety and Chassis application field. It targets the Electric Power Steering and those
applications requiring a high Safety Integrity Level (SIL).
All devices in this family are built around a dual core safety platform with an innovative safety
concept targeting ISO 26262 ASILD and IEC 61508 SIL3 integrity levels. In order to
minimize additional software and module level features to reach this target, on-chip
redundancy is offered for the critical components of the microcontroller (CPU core, DMA
controller, interrupt controller, crossbar bus system, memory protection unit, flash memory
and RAM controllers, peripheral bus bridge, system timers, and watchdog timer). Lock Step
Redundancy Checking Units are implemented at each output of this Sphere of Replication
(SoR). ECC is available for on-chip RAM and flash memories. A programmable fault
collection and control unit monitors the integrity status of the device and provides flexible
safe state control.
The host processor core of the SPC56EL60 is the latest CPU from the e200 family of
compatible Power Architecture cores. The e200z4d 5-stage pipeline dual issue core
provides a very high level of efficiency, allowing high performance with minimum power
consumption.
The peripheral set is compatible with the SPC56EL60 family, providing high-end electrical
motor control capability with very low CPU intervention, thanks to the on-chip Cross
Triggering Unit (CTU).
This device incorporates high-performance 90 nm embedded Flash-memory technology to
provide substantial cost reduction per feature and significant performance improvement.
The SPC56EL60 operating parameters are listed as follows:
●Operating range 0 – 120 MHz
●–40 to 150 °C junction temperature
●Fabricated in 90 nm low power process
●1.2 V internal logic
●Internal voltage regulator (VREG) with integrated ballast transistor
–Single-supply designs offering high integration level to the customer
–Possibility to use external ballast transistor and for KGD bypass internal ballast
transistor
●3.3 V ±10% for digital I/O input supply voltage
●Low power design
–Dynamic clock gating of core and peripherals
–Software controlled clock gating of peripherals
–Power consumption less than 400 mA
●Selectable current slew rate (slow/medium/fast)
●3.3 V ± 10% Nexus pin rail. Same as digital I/O rail
●Unused pins configurable as GPIO or GPI for unused A/D channel inputs
●3.3–5 V ±10% for A/Donverter reference and analog input pins
●Designed with EMI reduction techniques
–Phase-locked loop (PLL)
–System clock with frequency modulation
–On-chip by-pass capacitance
–Software selectable current slew rate control
–Schmitt trigger on selected inputs
●Configurable pins
–Selectable pull-up, pull-down or no pull on all pins on all SIU controlled pins
–Selectable open drain
●Redundant temperature sensors in separate safety channels
●Multiple low/high voltage detector and inhibit units
–High voltage detection and inhibit with off-line testing capability on 1.2 V only
–Low voltage detection and inhibit with off-line testing capability on 1.2 V and 3.3 V
supply
●Redundant bandgap to duplicate internal reference
●Deep N-well and wide column multiplexing where required to reduce Soft Error Rate
(SER) effect for SRAM
●Physical separation of replicated functional blocks achieved by layout
Doc ID 15461 Rev 510/38
FeaturesSPC56EL60L3, SPC56EL60L5
2.4 Modes of operation
SPC56EL60 devices can operate in two modes of operation:
●Lock Step Mode (LSM)
●Decoupled Parallel Mode (DPM)
One of the two modes is statically selected at power-up. The selected mode may be
changed only going through a full power-on reset.
2.4.1 Lock Step Mode (LSM)
Lock Step Mode (LSM) allows reaching the highest safety level. It has been defined to allow
reaching SIL3 with minimum software overhead.
The Sphere of Replication (SoR) refers to a set of replicated IP modules where at the
outputs a formal check is performed to ensure that the same operations or transactions are
executed on a clock per clock basis (Lock Step Mode of operation).
The current concept assumes as premise that the most important goal for a functional safety
SIL3-capable device is to detect (or diagnose) faults as they leave the SoR. In fact, a fault as
long as it remains confined within the SoR and therefore does not generate an action visible
outside the SoC or influence the effective operability of the periphery (and so the ECU), is
not to be considered as a dangerous fault.
The presence of checkers (RC) at the outputs of the SoR for the periphery bus, the Flashmemory subsystem and the SRAM subsystem represents a minimum guarantee that noncommon cause faults are detected when the two channels redundantly are merged into a
single actuator or recipient, on the action that is to be performed.
2.4.2 Decoupled Parallel Mode (DPM)
In Decoupled Parallel Mode (DPM), each CPU core and connected channel run
independently from the other one and redundancy checkers (RC) are disabled.
The DPM mode increased performances can be estimated in first approximation as about
1.6× the performance of the LSM mode at the same frequency for shared program flash
configuration (up to 2×, depending on software).
SPC56EL60 devices support only static configuration at power-on (either LSM or DPM).
2.5 Mode-specific performance parameters
●LSM:
–Up to 240 million integer instructions per second (dual integer unit)
–Up to 240 million floating point instructions per second (FPU)
–Up to 480 million multiply and accumulate instructions per second (SPE)
●DPM:
–384–480 million integer/floating point instructions per second
–768–960 million multiply and accumulate instructions per second
11/38Doc ID 15461 Rev 5
SPC56EL60L3, SPC56EL60L5Features
2.6 Functional safety suitability
The SPC56EL60 has been successfully assessed by Exida Certification (Official
Certification issued on Nov. 30th 2007) to be fit for purpose to achieve a safety integrity
level 3 (SIL3) as per IEC61508-part 2 standard with an overall SoC PFH of 0.1 FIT in LSM
mode.
The mode of operation which allows to reach the highest safety level with minimum software
requirement is the Lock Step mode (LSM).
●High-performance e200z4d dual core
–32-bit Power Architecture technology CPU
–Core frequency as high as 120 MHz
–Dual issue five-stage pipeline core
–Variable Length Encoding (VLE)
–Memory Management Unit (MMU)
–4 KB instruction cache with error detection code
–Signal processing engine (SPE)
●Memory available
–1 MB Flash memory with ECC
–128 KB on-chip SRAM with ECC
–Built-in RWW capabilities for EEPROM emulation
●SIL3/ASILD innovative safety concept: LockStep mode and Fail-safe protection
–Sphere of replication (SoR) for key components (such as CPU core, DMA,
crossbar switch)
–Fault collection and control unit (FCCU)
–Redundancy control and checker unit (RCCU) on outputs of the SoR connected to
FCCU
–Boot-time Built-In Self-Test for Memory (MBIST) and Logic (LBIST) triggered by
hardware
–Boot-time Built-In Self-Test for ADC and Flash memory triggered by software
–Replicated safety enhanced watchdog
–Replicated junction temperature sensor
–Non-maskable interrupt (NMI)
–16-region memory protection unit (MPU)
–Clock monitoring units (CMU)
–Power management unit (PMU)
–Cyclic redundancy check (CRC) unit
●Decoupled Parallel mode for high performance use of replicated cores
●Nexus Class 3+ interface
●Interrupts
–Replicated 16-priority controller
–Replicated 16-channel eDMA controller
Doc ID 15461 Rev 512/38
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