3D digital accelerometer and 2D pitch and yaw analog gyroscope
Features
■ 2.7 V to 3.6 V power supply operation
■ Low voltage compatible digital IOs, 1.8 V
■ ±2 g/±4 g/±8 g dynamically selectable full-scale
■ ±300 dps absolute analog angular rate output
2
■ I
C/SPI digital linear acceleration interface (16
bit data output)
■ Two separated outputs for pitch and yaw axis
(1x and 4x amplified)
■ Integrated low-pass filters for angular rate
■ 2 independent programmable interrupt
generators for free-fall and motion detection
■ Sleep-to-wakeup function
■ 6D orientation detection
■ Extended operating temperature range (40 °C
to +85 °C)
■ High stability over temperature
■ High shock survivability
■ Embedded self-test
■ Embedded power-down
■ Embedded low-power mode
■ ECOPACK
®
RoHS and “Green” compliant
(see Section 9)
Applications
■ Motion control for smart user interface
■ Display orientation
■ Gaming and virtual reality input devices
■ Industrial and robotics
■ Vibration monitoring and compensation
■ Impact recognition and logging
■ Motion-activated functions
■ Intelligent power-saving for handheld devices
■ Free-fall detection
Description
The LSM320HAY30 is a low-power system-inpackage featuring a 3D digital linear acceleration
sensor and a 2D analog angular rate pitch and
yaw sensor. It provides excellent temperature
stability and high resolution over an extended
operating temperature range (-40°C to +85°C).
ST’s family of sensor modules leverages the
robust and mature manufacturing process already
used for the production of micromachined
accelerometers. The LSM320HAY30 has a
dynamically user-selectable full-scale
acceleration range of ±2 g/±4 g/±8 g, and an
angular rate of ±300 dps capable of detecting
rates with a -3 dB bandwidth up to 140 Hz along
pitch and yaw axes. The LSM320HAY30 is
capable of measuring linear accelerations with
output data rates from 0.5 Hz up to 1 kHz. The
embedded self-test capability allows the user to
check the functioning of each sensor in the final
application. The device can be configured to
generate an interrupt signal by inertial
wakeup/free-fall events as well as by the position
of the device itself. Several years ago ST
successfully pioneered the use of this package for
accelerometers. Today, ST has the widest
manufacturing capability and strongest expertise
in the world for production of sensors in plastic
LGA packages.
Angular rate high-pass filter reset (logic 0: normal operation mode;
logic1: external high-pass filter is reset)
9ARPDAngular rate power-down (see Table 5
10ARSTAngular rate self-test (see Table 5)
11GND0 V supply
12GND0 V supply
13RES0 V supply
14GND0 V supply
15GND0 V supply
16FILTVDDPLL filter connection pin 16
17VCONTPLL filter connection pin 15
18OUT XNot amplified Out X
8/42Doc ID 16917 Rev 1
)
LSM320HAY30Block diagram and pin description
Table 1.Pin description (continued)
Pin#NameFunction
194xIN XInput of 4x amplifier
204xOUT XX rate signal output voltage (amplified)
21VrefReference voltage
224x OUTZZ rate signal output voltage (amplified)
234xIN ZInput of 4x amplifier
24OUT ZNot amplified Out Z
25VDDPower supply
26RESConnected to Vdd
27RESConnected to Vdd
28RESConnected to Vdd
Doc ID 16917 Rev 19/42
Mechanical and electrical specificationsLSM320HAY30
2 Mechanical and electrical specifications
2.1 Mechanical characteristics
@ Vdd=3,0 V, T=25 °C unless otherwise noted.
Table 2.Mechanical characteristics
Symbol
LA_TCSo
AR_TCSo
LA_TyOff
LA_TCOff
AR_TCZrl
(1)
ParameterTest conditionsMin.Typ.
FS bit set to 00±2.0
LA_FS
Linear acceleration measurement
(3)
range
FS bit set to 11±8.0
4x OUT (amplified)±300
AR_FSAngular rate measurement range
OUT (not amplified)±1200
FS bit set to 00 (12 bit)0.911.1
LA_SoLinear acceleration sensitivity
FS bit set to 11 (12 bit)3.53.94.3
AR_SoAngular rate sensitivity
(4)
4x OUT (amplified)3.33mV/dps
OUT (not amplified)0.83mV/dps
Linear acceleration sensitivity
change vs. temperature
Angular rate sensitivity change vs
temperature
Linear acceleration typical zero-g
level offset accuracy
Linear acceleration zero-g level
change vs. temperature
AR_Zrl Zero-rate level
(5),(6)
(6)
FS bit set to 00±0.01%/°C
Delta from 25°C0.07%/°C
FS bit set to 00±20mg
Max delta from 25°C±0.1mg/°C
AR_VrefReference voltage1.5V
Angular rate zero-rate level
change vs. temperature
Max delta from 25°C±0.05dps/°C
LA_AnLinear acceleration noise densityFS bit set to 00218µg/√ Hz
AR_RnAngular rate noise density0.02dps/√ Hz
AR_NLAngular rate non linearityBest fit straight line±1% FS
LA_BWLinear acceleration bandwidth
AR_BWAngular rate bandwidth
(7)
(8)
FS bit set to 00 X axis+500LSb
LA_ST
Linear acceleration self-test
output change
(9),(10),(11)
FS bit set to 00 Y axis-500LSb
FS bit set to 00 Z axis+600LSb
(a)
(2)
Max.Unit
dps
mg/digitFS bit set to 01 (12 bit)1.822.2
1.5V
ODR/2Hz
140Hz
gFS bit set to 01±4.0
a. The product is factory calibrated at 3.0 V. The operational power supply range is from 2.7 V to 3.6 V.
10/42Doc ID 16917 Rev 1
LSM320HAY30Mechanical and electrical specifications
Table 2.Mechanical characteristics (continued)
Symbol
(1)
ParameterTest conditionsMin.Typ.
(2)
Max.Unit
AR_ST
Angular rate self-test output
change
250mV
TopOperating temperature range-40+85°C
1. Linear acceleration (LA), Angular Rate (AR) parameter labeling
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Sensitivity and zero-rate offset are not ratiometric to supply voltage
5. Typical zero-g level offset value after MSL3 preconditioning
6. Offset can be eliminated by enabling the built-in high-pass filter
7. Refer to Table 23 for filter cut-off frequency.
8. The product is capable of measuring angular rates extending from DC to the selected BW.
9. The sign of “Self-test output change” is defined by LA_CTRL_REG4 STsign bit (Table 27), for all axes.
Linear acceleration sensing Self-Test output changes with the power supply. “Self-test output change” is defined as
10.
OUTPUT[LSb]
Full-scale
11. Output data reach 99% of final value after 1/ODR+1ms when enabling
device filtering.
(LA_CTRL_REG4 ST bit=1)
- OUTPUT[LSb]
(LA_CTRL_REG4 ST bit=0)
linear acceleration sensing
. 1LSb=4g/4096 at 12bit representation, ±2 g
self-test mode, due to
2.2 Electrical characteristics
@ Vdd=3,0 V, T=25 °C unless otherwise noted.
(b)
Table 3.Electrical characteristics
SymbolParameterTest conditionMin.Typ.
VddSupply voltage2.73.03.6V
Vdd_IOI/O pins supply voltage
LA_Idd
AR_Idd
LA_IddLP
AR_IddSl
LA_IddPdn
AR_IddPdn
Linear acceleration current
consumption in normal mode
Angular rate current consumption
in normal mode
Linear acceleration current
consumption in low-power mode
Angular rate current consumption
in sleep mode
Linear acceleration current
consumption in power-down mode
Angular rate current consumption
in power-down mode
b. The product is factory calibrated at 3 V.
(2)
1.71Vdd+0.1V
ODR = 50 Hz0.25mA
ARPD pin
connected to GND
= 0.5 Hz10µA
ODR
LP
ARPD, ARST pin
connected to Vdd
ARPD pin
connected to Vdd
(1)
Max.Unit
6.8mA
2.15mA
1µA
15µA
Doc ID 16917 Rev 111/42
Mechanical and electrical specificationsLSM320HAY30
Table 3.Electrical characteristics (continued)
SymbolParameterTest conditionMin.Typ.
(1)
Max.Unit
AR_VSTAngular rate self-test input
AR_VPDAngular rate power-down input
LA_VIH
LA_VIL
LA_VOH
LA_VOL
LA_ODR
LA_ODR
Linear acceleration digital high
level input voltage
Linear acceleration digital low level
input voltage
Linear acceleration high level
output voltage
Linear acceleration low level
output voltage
Linear acceleration output data
rate in normal mode
Linear acceleration output data
LP
rate in low-power mode
Logic 0 level00.2*Vdd
Logic 1 level0.8*VddVdd
Logic 0 level00.2*Vdd
Logic 1 level0.8*VddVdd
0.8*Vdd_IOV
0.2*Vdd_IOV
0.9*Vdd_IOV
0.1*Vdd_IOV
DR bit set to 0050
DR bit set to 01100
DR bit set to 10400
DR bit set to 111000
PM bit set to 0100.5
PM bit set to 0111
PM bit set to 1002
PM bit set to 1015
PM bit set to 11010
V
V
Hz
Hz
LA_TonLinear acceleration turn-on time
AR_TonAngular rate turn-on time
(4)
(3)
ODR = 100 Hz
1/ODR+1
ms
200 ms
TopOperating temperature range-40+85
1. Typical specifications are not guaranteed
2. It is possible to remove Vdd, maintaining Vdd_IO without blocking the communication buses. In this condition the
measurement chain is powered off.
3. Time to obtain valid data after exiting power-down mode
4. Time to obtain valid data after exiting power-down mode
12/42Doc ID 16917 Rev 1
s
°C
LSM320HAY30Absolute maximum ratings
3 Absolute maximum ratings
Stresses above those listed as “Absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 4.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 4.8V
VinInput voltage on any control pin (PD, ST) -0.3 to Vdd +0.3V
AAcceleration
Vdd_IO I/O pin supply voltage-0.3 to 6V
3000 for 0.5 msg
10000 for 0.1 msg
Vin
A
A
T
T
ESDElectrostatic discharge protection2 (HBM)kV
Input voltage on any control pin
(CS, SCL/SPC, SDA/SDI/SDO, SDO/SA0)
Acceleration (any axis, powered, Vdd = 3 V)
POW
Acceleration (any axis, unpowered)
UNP
Operating temperature range-40 to +85°C
OP
Storage temperature range-40 to +125°C
STG
-0.3 to Vdd_IO +0.3V
3000 for 0.5 msg
10000 for 0.1 msg
3000 for 0.5 msg
10000 for 0.1 msg
This is a mechanical shock sensitive device, improper handling can cause permanent
damage to the part.
This is an ESD sensitive device, improper handling can cause permanent damage to
the part.
Doc ID 16917 Rev 113/42
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