fall, motion detection and magnetic field
detection
®
, RoHS and “Green” compliant
LSM303D
Datasheet — preliminary data
Description
The LSM303D is a system-in-package featuring a
3D digital linear acceleration sensor and a 3D
digital magnetic sensor.
The LSM303D has linear acceleration full-scales
of ±2g / ±4g / ±6g / ±8g / ±16g and a magnetic
field full-scale of±2 / ±4 / ±8 / ±12 gauss. All fullscales available are fully selectable by the user.
The LSM303D includes an I
that supports standard and fast mode 100 kHz
and 400 kHz and SPI serial standard interface.
The system can be configured to generate an
interrupt signal for free-fall, motion detection and
magnetic field detection. Thresholds and timing of
interrupt generators are programmable by the end
user on the fly.
Magnetic and accelerometer parts can be
enabled or put into power-down mode separately.
The LSM303D is available in plastic land grid
array package (LGA) and is guaranteed to
operate over an extended temperature range from
-40 °C to +85 °C.
Table 1.Device summary
Part number
Temperature
range [°C]
2
C serial bus interface
Package Packaging
LSM303D-40 to +85LGA-16Tray
LSM303DTR-40 to +85LGA-16
June 2012Doc ID 023312 Rev 11/54
This is preliminar y information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
C serial data (SDA)
SPI serial data input (SDI)
3-wire interface serial data output (SDO)
7
SDO
SA0
SPI serial data output (SDO)
2
I
C less significant bit of the device address (SA0)
SPI enable
8CS
2
C/SPI mode selection (1: SPI idle mode / I2C communication
I
enabled; 0: SPI communication mode / I
9INT 2Interrupt 2
10ReservedConnect to GND
11INT 1Interrupt 1
12GND0 V supply
13GND0 V supply
14VddPower supply
15C1Capacitor connection (C1)
16GND0 V supply
2
C disabled)
Doc ID 023312 Rev 19/54
Module specificationsLSM303D
2 Module specifications
2.1 Sensor characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
Table 3.Sensor characteristics
SymbolParameterTest conditionsMin.Typ.
LA_FS
M_FSMagnetic measurement range
LA_SoLinear acceleration sensitivity
M_GNMagnetic sensitivity
LA_TCSo
M_TCSo
LA_TyOff
LA_TCOff
LA_An
Linear acceleration
measurement range
Linear acceleration sensitivity
change vs. temperature
Magnetic sensitivity change
vs. temperature
Linear acceleration typical
zero-g level offset
accuracy
Linear acceleration zero-g
level change vs. temperature
Linear acceleration noise
density
(3),(4)
(2)
Linear acceleration FS=±2g0.061
Linear acceleration FS=±4g0.122
Linear acceleration FS=±6g0.183
Linear acceleration FS=±8g0.244
Linear acceleration FS=±16g0.732
Magnetic FS=±2gauss0.080
Magnetic FS=±4gauss0.160
Magnetic FS=±8gauss0.320
Magnetic FS=±12gauss0.479
Max. delta from 25 °C±0.5m
Linear acceleration FS=2g;
ODR = 100 Hz
(a)
.
(1)
Max.Unit
±2
±4
±6
±8
±16
±2
±4
±8
±12
±0.01%/°C
±0.05%/°C
±60mg
g
gauss
mg/LSB
mgauss/
LSB
g/°C
150
ug/
sqrt(Hz)
a. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
10/54Doc ID 023312 Rev 1
LSM303DModule specifications
Table 3.Sensor characteristics (continued)
SymbolParameterTest conditionsMin.Typ.
(1)
Max.Unit
M_RMagnetic noise density
M_CAS
Magnetic cross-axis
sensitivity
M_EFMaximum exposed field
Magnetic FS = 2gauss;
LR setting
CTRL5 (M_RES [1,0]) = 00b
Cross field = 0.5 gauss
Applied = ±3 gauss
No permitting effect on zero
reading
5
±1
10000gauss
mgauss/
RMS
%FS/
gauss
Sensitivity starts to degrade.
M_DFMagnetic disturbing field
LA_ST
Linear acceleration self-test
positive difference
(6)
Automatic S/R pulse restores
the sensitivity
(5)
±2g range, X, Y-axis
AST = 1 see Table 37
±2g range, Z-axis
AST = 1 see Table 37
70
70
20gauss
1700
1700
TopOperating temperature range-40+85°C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high-pass filter.
5. Set/reset pulse is automatically applied at each conversion cycle.
“Self-test output change” is defined as: OUTPUT[mg]
6.
(CTRL5 AST bit =1)
- OUTPUT[mg]
(
CTRL5 AST bit =0
.
)
mg
2.2 Temperature sensor characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
Table 4.Temperature sensor characteristics
SymbolParameterTest conditionsMin.Typ.
TSDr
TODRTemperature refresh rate
Top Operating temperature range-40+85°C
1. Typical specifications are not guaranteed.
2. Refer to Table 47: Magnetic data rate configuration.
Temperature sensor output
change vs. temperature
-
b. The product is factory calibrated at 2.5 V.
(b)
.
(1)
8LSB/°C
M_ODR
(2)
[2:0]
Max.Unit
Hz
Doc ID 023312 Rev 111/54
Module specificationsLSM303D
2.3 Electrical characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted.
Table 5.Electrical characteristics
SymbolParameter
Tes t
conditions
Min.Typ.
(1)
Max.Unit
VddSupply voltage2.163.6V
Vdd_IOModule power supply for I/O1.711.8Vdd+0.1
LR setting
Idd
eCompass
in normal mode
(2)
current consumption
(3)
CTRL5 (M_RES
[1,0]) = 00b, see
300µA
Ta bl e 4 5
IddSL
Current consumption in
power-down
(4)
1µA
TopOperating temperature range-40+85
1. Typical specifications are not guaranteed.
2. eCompass
3. Magnetic sensor setting ODR =6.25 Hz, accelerometer sensor ODR = 50 Hz and magnetic high resolution setting.
4. Linear accelerometer and magnetic sensor in power-down mode.
: accelerometer - magnetic sensor.
°C
12/54Doc ID 023312 Rev 1
LSM303DModule specifications
SPC
CS
SDI
SDO
t
su(CS)
t
v(SO)
t
h(SO)
t
h(SI)
t
su(SI)
t
h(CS)
t
dis(SO)
t
c(SPC)
MSB IN
MSB OUT
LSB OUT
LSB IN
(3)
(3)
(3)
(3)
(3)
(3)
(3)
(3)
2.4 Communication interface characteristics
2.4.1 SPI - serial peripheral interface
Subject to general operating conditions for Vdd and Top.
Table 6.SPI slave timing values
(1)
Val ue
SymbolParameter
Min.Max.
tc(SPC)SPI clock cycle100ns
fc(SPC)SPI clock frequency10MHz
tsu(CS)CS setup time5
th(CS)CS hold time20
tsu(SI)SDI input setup time5
th(SI)SDI input hold time15
tv(SO)SDO valid output time50
th(SO)SDO output hold time5
tdis(SO)SDO output disable time50
Unit
ns
1. Values are guaranteed at 10 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results, not
tested in production.
(2)
Figure 3.SPI slave timing diagram
2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both input and output ports.
Doc ID 023312 Rev 113/54
Module specificationsLSM303D
SD A
SCL
t
f(SD A )
t
su(SP)
t
w(SCLL)
t
su(SD A)
t
r(SDA )
t
su(SR)
t
h(ST)
t
w(SCLH )
t
h(SDA )
t
r(SCL)
t
f(SCL)
t
w(SP:SR)
STAR T
REPEATED
STA RT
STO P
STA RT
2.4.2 Sensor I2C - inter IC control interface
Subject to general operating conditions for Vdd and Top.
Table 7.I2C slave timing values
SymbolParameter
I2C standard mode
(1)
I2C fast mode
Min.Max.Min.Max.
(1)
Unit
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
SCL clock frequency01000400kHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time03.4500.9µs
SDA and SCL rise time100020 + 0.1C
SDA and SCL fall time30020 + 0.1C
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
4.71.3
1. Data based on standard I2C protocol requirement, not tested in production.
2. Cb = total capacitance of one bus line, in pF.
Figure 4.I
2
C slave timing diagram
(3)
µs
(2)
b
(2)
b
300
ns
300
µs
3. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both ports.
14/54Doc ID 023312 Rev 1
LSM303DModule specifications
This is a mechanical shock sensitive device, improper handling can cause permanent
damage to the part
This is an ESD sensitive device, improper handling can cause permanent damage to
the part
2.5 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 8.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 4.8V
Vdd_IOI/O pins supply voltage-0.3 to 4.8V
Vin
Input voltage on any control pin (SCL/SPC,
SDA/SDI/SDO, SDO/SA0, CS)
-0.3 to Vdd_IO +0.3V
A
A
T
POW
UNP
T
OP
STG
Acceleration (any axis, powered, Vdd = 2.5 V)
Acceleration (any axis, unpowered)
Operating temperature range-40 to +85°C
Storage temperature range-40 to +125°C
Note:Supply voltage on any pin should never exceed 4.8 V.
3,000 for 0.5 msg
10,000 for 0.1 msg
3,000 for 0.5 msg
10,000 for 0.1 msg
Doc ID 023312 Rev 115/54
TerminologyLSM303D
3 Terminology
3.1 Set/reset pulse
The set/reset pulse is an automatic operation performed before each magnetic acquisition
cycle to de-gauss the sensor and to ensure alignment of the magnetic dipoles and therefore
the linearity of the sensor itself.
3.2 Sensitivity
3.2.1 Linear acceleration sensor sensitivity
Sensitivity describes the gain of the sensor and can be determined, for example, by applying
1 g acceleration to it. As the sensor can measure DC accelerations this can be done easily
by pointing the axis of interest towards the center of the earth, noting the output value,
rotating the sensor by 180 degrees (pointing to the sky) and noting the output value again.
By doing so, ±1 g acceleration is applied to the sensor. Subtracting the larger output value
from the smaller one, and dividing the result by 2, leads to the actual sensitivity of the
sensor. This value changes very little over temperature and also time. The sensitivity
tolerance describes the range of sensitivities of a large population of sensors.
3.2.2 Magnetic sensor sensitivity
Sensitivity describes the gain of the sensor and can be determined, for example, by applying
a magnetic field of 1 gauss to it.
3.3 Zero-g level
Zero-g level offset (TyOff) describes the deviation of an actual output signal from the ideal
output signal if no acceleration is present. A sensor in a steady-state on a horizontal surface
measures 0 g in X-axis and 0 g in Y-axis, whereas the Z-axis measures 1 g. The output is
ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h, data
expressed as 2’s complement). A deviation from the ideal value in this case is called Zero-g
offset. Offset is, to some extent, a result of stress to MEMS sensor and therefore the offset
can slightly change after mounting the sensor onto a printed circuit board or exposing it to
extensive mechanical stress. Offset changes little over temperature, see “Zero-g level
change vs. temperature”. The Zero-g level tolerance (TyOff) describes the standard
deviation of the range of Zero-g levels of a population of sensors.
3.4 Zero-gauss level
Zero-gauss level offset describes the deviation of an actual output signal from the ideal
output if no magnetic field is present. Thanks to the set/reset pulse and to the magnetic
sensor read-out chain, the offset is dynamically cancelled. The Zero-gauss level does not
show any dependencies from temperature and power supply.
16/54Doc ID 023312 Rev 1
LSM303DFunctionality
4 Functionality
4.1 Self-test
Self-test allows to check the linear acceleration sensor functionality without moving it. The
self-test function is off when the self-test bit (ST) is programmed to ‘0‘. When the self-test bit
is programmed to ‘1’, an actuation force is applied to the sensor, simulating a definite input
acceleration. In this case the sensor outputs exhibit a change in their DC levels which are
related to the selected full-scale through the device sensitivity. When self-test is activated,
the device output level is given by the algebraic sum of the signals produced by the
acceleration acting on the sensor and by the electrostatic test-force. If the output signals
change within the amplitude specified inside Section 2.1, then the sensor is working
properly and the parameters of the interface chip are within the defined specifications.
4.2 Temperature sensor
The LSM303D features an internal temperature sensor. Temperature data can be enabled
by setting the TEMP_EN bit on the CTRL5 (24h) register to 1.
Both TEMP_OUT_H and TEMP_OUT_L registers must be read.
Temperature data is stored inside TEMP_OUT_L (05h), TEMP_OUT_H (06h) as 2’s
complement data in 12-bit format, right justified.
The output data rate of the temperature sensor is set by M_ODR [2:0] in CTRL5 (24h) and is
equal to the magnetic sensor output data rate.
4.3 FIFO
The LSM303D embeds an acceleration data FIFO for each of the three output channels, X,
Y and Z. This allows a consistent power saving for the system, as the host processor does
not need to continuously poll data from the sensor, but it can wake up only when needed
and burst the significant data out from the FIFO. This buffer can work according to four
different modes: Bypass mode, FIFO mode, Stream mode and Stream-to-FIFO mode. Each
mode is selected by the FIFO_MODE bits. Programmable threshold level, FIFO_empty or
FIFO_Full events can be enabled to generate dedicated interrupts on the INT1/2 pin.
Bypass mode
In Bypass mode, the FIFO is not operational and for this reason it remains empty. As
described in Figure 5, for each channel only the first address is used. The remaining FIFO
slots are empty.
FIFO mode
In FIFO mode, data from X, Y and Z channels are stored in the FIFO. A FIFO threshold
interrupt can be enabled in order to be raised when the FIFO is filled to the level specified by
the internal register. The FIFO continues filling until it is full. When full, the FIFO stops
collecting data from the input channels.
Doc ID 023312 Rev 117/54
Loading...
+ 37 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.