TLE 4269 AQ67000-A9190P-DIP-8-4
TLE 4269 GQ67006-A9173P-DSO-8-1 (SMD)
TLE 4269 GMQ67006-A9288P-DSO-14-4 (SMD)
▼
TLE 4269 GLQ67006-A9192P-DSO-20-6 (SMD)
▼ New type
Functional Description
This device is a voltage regulator with a fixed 5-V
output, e.g. in a P-DSO-8-1 package. The maximum
operating voltage is 45 V. The output is able to drive a
150 mA load. It is short circuit protected and the
thermal shutdown switches the output off if the junction
temperature is in excess of 150 °C. A reset signal is
V
generated for an output voltage of
<4.6V. The
Q
reset threshold voltage can be decreased by external
connection of a voltage divider. The reset delay time
can be set by an external capacitor. R eset and sense
output have integrated pull up resistors. If the
integrated resistors are not desired TLE 4279 can be
used. It is also possi ble to supervise the input voltage
by using an integrated comparator to give a low voltage
warning.
P-DSO-8-1
P-DSO-20-6
P-DSO-14-4
Semiconductor Group11998-11-01
Pin Configuration
(top view)
TLE 4269
P-DIP-8-4
P-DSO-8-1
18
ΙQ
S
RE
Ι
AEP01813
SO72
R63
GNDD54
Ι
2
ΙS
RE
3
D5
4
8
7
6
AEP01668
Q
SO
R
GND
1
Pin Definitions and Functions (TLE 4269 A and TLE 4269 G)
Pin No.SymbolFunction
1IInput; block directly to GND on the IC with a ceramic capacitor.
2SISense Input; if not needed connect to Q.
3REReset Threshold; if not needed connect to ground.
4DReset Delay; to select delay time, connect to GND via external
capacitor.
5GNDGround
6RReset Output; the open-collector output is internally linked to Q
via a 20 kΩ pull-up resistor.
7SOSense Output; the open-collector output is internally linked to the
output via a 20 kΩ pull-up resistor.
8Q5-V Output; connect to GND with a 10 µF capacitor, ESR < 10 Ω.
Semiconductor Group21998-11-01
Pin Configuration
(top view)
TLE 4269
P-DSO-14-4
RE
GND
GND
GNDGND
GND
1
2
D
3
4
5
6
7SO
R
14
13
12
11
10
9
8
AEP02248
SI
Ι
GND
GND
Q
Pin Definitions and Functions (TLE 4269 GM)
Pin No.SymbolFunction
1REReset Threshold; if not needed connect to GND.
2DReset Delay; connect to GND via external delay capacitor for
via a pull-up resistor of 20 kΩ.
8SOSense Output; open-collector output, internally connected to Q
via a 20 kΩ pull-up resistor.
9Q5-V Output; connect to GND with a 10 µF capacitor, ESR < 10 Ω.
10, 11, 12 GNDGround
13IInput; block to GND directly at the IC by a ceramic capacitor.
14SISense Input; if not needed connect to Q.
Semiconductor Group31998-11-01
Pin Configuration
(top view)
TLE 4269
P-DSO-20-6
RE
D
N.C.
GND
GND
GND
GND
N.C.
N.C.
R
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
AEP01802
Ι
S
Ι
N.C.
GND
GND
GND
GND
N.C.
Q
SO
Pin Definitions and Functions (TLE 4269 GL)
Pin No.SymbolFunction
1REReset Threshold; if not needed connect to GND.
2DReset Delay; to select delay time connect to GND via external
capacitor.
4-7, 14-17GNDGround
10RReset Output; the open-collector output is internally linked to
Q via 20 kΩ pull-up resistor.
11SOSense Output; the open-collector output is internally linked to
Q via 20 kΩ pull-up resistor.
12QOutput; connect to GND with a 10 µF capacitor, ESR < 10 Ω.
19IInput; block directly to GND at the IC by a ceramic capacitor.
20SISense Input; if not needed connect to Q.
Semiconductor Group41998-11-01
TLE 4269
Circuit Description
The control amplifier compares a reference voltage, made highly accurate by resistance
balancing, with a voltage propo rtional to the output voltage and drives the base of the
series PNP transistor via a buffe r. Saturation control as a function of the load current
prevents any over-saturation of the power element.
In the reset generator block a comparator compares a reference voltage independent of
the input voltage with the scaled-down output voltage. If the output voltage reaches 4.6 V
the reset delay capaci tor is discharged and the reset output is set to low . This low is
guaranteed down to an output voltage of 1 V. As the output voltage incr eases again,
from 4.6 V onward the reset delay capacitor is charged with constant current. When the
V
capacitor voltage reaches the upper switching threshold
choosing the value of this capaci tor, the reset delay time can be selected over a wide
range. With the reset t hresh old in put RE it is possible to lo we r the res et threshold
pin RE is connected to pin Q vi a a voltage divider, for example, the re set condition is
reached when this voltage is decreased below the switching threshold
, the reset returns to high. By
dT
V
V
of 1.35 V.
re
rt
. If
Another comparator compares the signal of the pin SI, normally fed by a voltage divider
from the input voltage, with the reference and gives an early warning on the pin SO. It is
also possible to superwise an other voltage e.g. of a second regulator, or to build a
watchdog circuit with few external components.
Application Description
C
The input capacitor
approx. 1 Ω in series with
capacita nce c an be damp ed. Th e out put ca pacit or C
is necessary for compensating line influences. Using a resistor of
I
C
, the oscillating circuit consisting of input inductivity and input
I
is necessary for the stability of the
Q
regulating circuit. Stability is guaranteed at values ≥ 10 µF and an ESR ≤ 10 Ω within the
operating temperature rang e. For small tol erances of the rese t delay the s pread of the
capacitance of the delay capacitor and its temperature coefficient should be noted.
Semiconductor Group51998-11-01
TLE 4269
D
RE
Ι
Error
20 kΩΩk20
Q
Amplifier
Reference
Current and
Saturation
Control
Trimming
R
Reference
SO
SI
AEB01669
Block Diagram
Semiconductor Group61998-11-01
Absolute Maximum Ratings
T
= – 40 to 150 °C
j
ParameterSymbolLimit ValuesUnitNotes
min.max.
Input
TLE 4269
Input voltage
Input current
Sense Input
Input voltage
Input current
Reset Threshold
Voltage
Current
Reset Delay
Voltage
V
I
V
I
V
I
V
I
SI
RE
I
SI
RE
D
– 4045V–
–––internal limited
– 0.345V–
11mA–
– 0.37V–
– 1010mA–
– 0.37V–
Current
I
D
–––internal limited
Ground
Current
I
GND
50–mA–
Reset Output
Voltage
Current
Semiconductor Group71998-11-01
V
I
R
R
– 0.37V–
–––internal limited
Absolute Maximum Ratings (cont’d)
T
= – 40 to 150 °C
j
ParameterSymbolLimit ValuesUnitNotes
min.max.
Sense Output
TLE 4269
Voltage
Current
5-V Output
Output voltage
Output current
Temperature
Junction temperature
Storage temperature
Operating Range
Input voltage
Junction temperature
V
I
V
I
T
T
V
T
SO
Q
SO
Q
j
Stg
I
j
– 0.37V–
–––internal limited
– 0.37V–
–5–mA–
–150°C–
– 50150°C–
–45V –
– 40150°C–
Thermal Data
Junction-ambient
Semiconductor Group81998-11-01
R
R
thja
thjc
–100
200
70
70
–60
60
30
30
K/W
K/W
K/W
K/W
K/W
K/W
K/W
K/W
P-DIP-8-4
P-DSO-8-1
P-DSO-14-4
P-DSO-20-6
P-DIP-8-4
P-DSO-8-1
P-DSO-14-4
P-DSO-20-6
TLE 4269
Characteristics
V
=13.5V; Tj= – 40 °C<Tj< 125 °C
I
ParameterSymbolLimit ValuesUnitMeasuring
Condition
min.typ.max.
Output voltage
Current limit
Current consumption;
I
= I
– I
q
I
Q
Current consumption;
I
= I
– I
q
I
Q
Current consumption;
I
= I
– I
q
I
Q
Drop voltage
V
I
I
I
I
V
Q
q
q
q
Load regulation∆V
Line regulation∆
V
Reset Generator
Q
4.905.005.10V1 mA ≤ IQ≤ 100 mA
V
6V≤
≤ 16 V
I
150200500mA–
–150300µAIQ≤ 1mA,Tj<85°C
–250700µAIQ=10mA
–28 mAIQ=50mA
dr
Q
Q
–0.250.5VIQ= 100 mA
–1030mVIQ= 5 mA to 100 mA
–1040mVVI= 6 V to 26 V
I
=1mA
Q
1)
Switching threshold
V
rt
4.504.604.80V–
Reset pull up–102040kΩ–
Reset low voltage
Delay switching
V
V
R
dt
–0.10.4VR
1.41.82.2V–
intern
threshold
Switching threshold
Reset delay low voltage
Charge currentI
1)
Drop voltage = VI– VQ (measured when the output voltage has dropped 100 mV from the
nominal value obtained at 13.5 V input.)
Semiconductor Group91998-11-01
V
V
st
D
d
0.30.450.60V–
–0.1VVQ< V
RT
3.06.59.5µAVD=1V
TLE 4269
Characteristics (cont’d)
V
= 13.5 V; Tj= – 40 °C<Tj< 125 °C
I
ParameterSymbolLimit ValuesUnitMeasuring
Condition
min.typ.max.
Delay time L → H
Delay time H → L
Switching voltage
t
t
V
d
t
re
1728–msCD=100nF
–1– µsCD=100nF
1.261.351.44VVQ>3.5V
Input Voltage Sense
Sense threshold high
Sense threshold low
Sense output
V
si, high
V
si, low
V
SO, low
1.241.311.38V–
1.161.201.28V–
–0.10.4VVSI<1.20V;
low voltage
Sense pull up–102040kΩ–
Sense input current
I
SI
– 10.11µA–
V
R
i
intern
>3V
Semiconductor Group101998-11-01
TLE 4269
Ι
Ι
C
1000 Fµ
V
ΙQ
Ι
470 nF
1
Ι
ΙS
23
4567
V
SΙ
C
D
100 nF
Measuring Circuit (P-DIP-8-4/P-DSO-8-1)
V
Ι
TLE 4269
Ι
Ι
D
GND
V
D
Ι
Q
8
C
Q
22 Fµ
Ι
RE
V
V
R
SO
V
RE
V
AES01670
t
<
V
RT
V
Q
V
D
t
d
V
RO
Power-on-ResetVoltage DipSecondaryOverload
Thermal
Shutdown
t
RR
Undervoltage
at Input
Reset Timing Diagram
RR
Ι
V
d
d
=
dt
C
D
at OutputSpike
V
DT
V
ST
AED01542
Semiconductor Group111998-11-01
Sense
Input
Voltage
V
SI, High
V
SI, Low
Sense
Output
TLE 4269
t
High
Low
Sence Timing Diagram
t
AED02559
Semiconductor Group121998-11-01
TLE 4269
Charge Current Id versus
T
Temperature
16
Aµ
Ι
d
14
12
10
8
6
4
2
0
-40
j
V
= 13.5 V
Ι
1.0 V=
V
C
04080120 C 160
AED01803
T
j
Switching Voltage V
T
Temperature
j
3.2
V
V
D
2.8
2.4
2.0
1.6
1.2
0.8
0.4
0
-40
04080120 C 160
and V
dt
V
= 13.5 V
Ι
V
dt
V
st
versus
st
AED01804
T
j
Drop Voltage
V
Output Current
500
V
dr
mV
400
300
T
200
100
0
0
306090120180mA
versus
dr
I
Q
j
T
C125=
=25C
j
AED01805
Ι
Q
Reset Switching Threshold
versus Temperature Tj
1.7
V
V
re
1.6
1.5
1.4
1.3
1.2
1.1
1.0
0.9
-40
04080120 C 160
V
re
AED01806
T
j
Semiconductor Group131998-11-01
TLE 4269
Current Consumption IQ versus
V
Input Voltage
30
Ι
q
mA
25
20
15
10
5
0
0
I
Ω
33=
R
L
R
=50
Ω
L
Ω
100=
R
L
= 200
R
L
10203040
AED01807
Ω
V50
V
Ι
Output Voltage
Input Voltage
12
V
Q
V
10
8
6
4
2
0
0
V
246
V
versus
Q
I
R
=50
L
AED01808
Ω
8V10
V
Ι
Sense Threshold
V
si
versus Temperature Tj
1.6
V
si
V
V
= 13.5 V
1.5
1.4
1.3
1.2
1.1
1.0
-4004080120 C 160
Ι
Sense Output High
Sense Output Low
AED01809
T
j
Output Voltage
Temperature
5.2
V
Q
V
5.1
5.0
4.9
4.8
4.7
4.6
-40
T
04080
V
j
Q
versus
V
= 13.5 V
Ι
AED01671
120 C 160
T
j
Semiconductor Group141998-11-01
TLE 4269
Output Current IQ versus
V
Input Voltage
350
Ι
mA
Q
300
250
200
150
100
50
0
0
I
=25C
T
j
T
102030
C125=
j
AED01810
40V50
V
Ι
Current Consumption
I
Output Current
12
Ι
q
mA
10
8
6
4
2
0
0
20406080120mA
Q
V
T
13.5 V=
Ι
=25 C
j
I
versus
q
AED01811
Ι
Q
Current Consumption
I
10
Q
13.5 V=
V
Ι
=25 C
T
j
20304050
Output Current
1.6
mA
Ι
q
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
0
I
versus
q
AED01812
mA
Ι
Q
Semiconductor Group151998-11-01
Package Outlines
P-DIP-8-4
(Plastic Dual In-line)
TLE 4269
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
GPD05583
Dimensions in mm
Semiconductor Group161998-11-01
P-DSO-14-4 (SMD)
(Plastic Dual Small Outline)
-0.1
0.2
-0.2
1.45
4
-0.2
1.75 max
TLE 4269
0.35 x 45˚
1)
+0.06
0.19
0.35
1.27
+0.15
2)
0.1
0.2 14x
±0.2
6
0.4
+0.8
8˚ max.
148
17
8.75
-0.2
1)
Index Marking
1) Does not include plastic or metal protrusion of 0.15 max. per side
2) Does not include dambar protrusion of 0.05 max. per side
GPS05093
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
Dimensions in mm
SMD = Surface Mounted Device
Semiconductor Group171998-11-01
P-DSO-8-1 (SMD)
(Plastic Dual Small Outline)
TLE 4269
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
SMD = Surface Mounted Device
GPS05121
Dimensions in mm
Semiconductor Group181998-11-01
P-DSO-20-6 (SMD)
(Plastic Dual Small Outline)
1.27
+0.15
0.35
2)
0.2 24x
1120
-0.1
0.2
-0.2
2.45
0.1
7.6
2.65 max
10.3
0.35 x 45˚
1)
-0.2
+0.8
0.4
±0.3
+0.09
0.23
TLE 4269
8˚ max
GPS05094
110
12.8
-0.2
1)
Index Marking
1) Does not include plastic or metal protrusions of 0.15 max per side
2) Does not include dambar protrusion of 0.05 max per side
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
Dimensions in mm
SMD = Surface Mounted Device
Semiconductor Group191998-11-01
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