Siemens TLE 4269 Technical data

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TLE 4269
5-V Low-Drop Fixed Voltage Regulator
Features
Output voltage tolerance ≤ ± 2 %
Very low current consumption
Early warning
Reset output low doown to V
Overtemperature protection
Reverse polarity proof
Settable reset threshold
Very low drop voltage
Wide temperature range
Integrated pull up resistor at logic outputs
Type Ordering Code Package
= 1 V
Q
TLE 4269
P-DIP-8-4
TLE 4269 A Q67000-A9190 P-DIP-8-4 TLE 4269 G Q67006-A9173 P-DSO-8-1 (SMD) TLE 4269 GM Q67006-A9288 P-DSO-14-4 (SMD)
TLE 4269 GL Q67006-A9192 P-DSO-20-6 (SMD) New type
Functional Description
This device is a voltage regulator with a fixed 5-V output, e.g. in a P-DSO-8-1 package. The maximum operating voltage is 45 V. The output is able to drive a 150 mA load. It is short circuit protected and the thermal shutdown switches the output off if the junction temperature is in excess of 150 °C. A reset signal is
V
generated for an output voltage of
<4.6V. The
Q
reset threshold voltage can be decreased by external connection of a voltage divider. The reset delay time can be set by an external capacitor. R eset and sense output have integrated pull up resistors. If the integrated resistors are not desired TLE 4279 can be used. It is also possi ble to supervise the input voltage by using an integrated comparator to give a low voltage warning.
P-DSO-8-1
P-DSO-20-6
P-DSO-14-4
Semiconductor Group 1 1998-11-01
Pin Configuration (top view)
TLE 4269
P-DIP-8-4
P-DSO-8-1
18
Ι Q
S
RE
Ι
AEP01813
SO72 R63 GNDD54
Ι
2
ΙS
RE
3
D5
4
8 7 6
AEP01668
Q SO R GND
1
Pin Definitions and Functions (TLE 4269 A and TLE 4269 G) Pin No. Symbol Function
1 I Input; block directly to GND on the IC with a ceramic capacitor. 2SISense Input; if not needed connect to Q. 3REReset Threshold; if not needed connect to ground. 4DReset Delay; to select delay time, connect to GND via external
capacitor. 5GNDGround 6RReset Output; the open-collector output is internally linked to Q
via a 20 k pull-up resistor. 7SOSense Output; the open-collector output is internally linked to the
output via a 20 k pull-up resistor. 8Q5-V Output; connect to GND with a 10 µF capacitor, ESR < 10 Ω.
Semiconductor Group 2 1998-11-01
Pin Configuration (top view)
TLE 4269
P-DSO-14-4
RE
GND GND GND GND GND
1 2
D
3 4 5 6 7SO
R
14 13 12 11 10
9 8
AEP02248
SI
Ι
GND GND
Q
Pin Definitions and Functions (TLE 4269 GM) Pin No. Symbol Function
1REReset Threshold; if not needed connect to GND. 2DReset Delay; connect to GND via external delay capacitor for
setting delay time. 3, 4, 5, 6 GND Ground 7RReset Output; open-collector output, internally connected to Q
via a pull-up resistor of 20 kΩ. 8SOSense Output; open-collector output, internally connected to Q
via a 20 k pull-up resistor. 9Q5-V Output; connect to GND with a 10 µF capacitor, ESR < 10 Ω. 10, 11, 12 GND Ground 13 I Input; block to GND directly at the IC by a ceramic capacitor. 14 SI Sense Input; if not needed connect to Q.
Semiconductor Group 3 1998-11-01
Pin Configuration (top view)
TLE 4269
P-DSO-20-6
RE
D
N.C. GND GND GND GND
N.C.
N.C.
R
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12
11
AEP01802
Ι
S
Ι
N.C. GND GND GND GND N.C. Q SO
Pin Definitions and Functions (TLE 4269 GL) Pin No. Symbol Function
1REReset Threshold; if not needed connect to GND. 2DReset Delay; to select delay time connect to GND via external
capacitor. 4-7, 14-17 GND Ground 10 R Reset Output; the open-collector output is internally linked to
Q via 20 k pull-up resistor. 11 SO Sense Output; the open-collector output is internally linked to
Q via 20 k pull-up resistor. 12 Q Output; connect to GND with a 10 µF capacitor, ESR < 10 Ω. 19 I Input; block directly to GND at the IC by a ceramic capacitor. 20 SI Sense Input; if not needed connect to Q.
Semiconductor Group 4 1998-11-01
TLE 4269
Circuit Description
The control amplifier compares a reference voltage, made highly accurate by resistance balancing, with a voltage propo rtional to the output voltage and drives the base of the series PNP transistor via a buffe r. Saturation control as a function of the load current prevents any over-saturation of the power element.
In the reset generator block a comparator compares a reference voltage independent of the input voltage with the scaled-down output voltage. If the output voltage reaches 4.6 V the reset delay capaci tor is discharged and the reset output is set to low . This low is guaranteed down to an output voltage of 1 V. As the output voltage incr eases again, from 4.6 V onward the reset delay capacitor is charged with constant current. When the
V
capacitor voltage reaches the upper switching threshold choosing the value of this capaci tor, the reset delay time can be selected over a wide range. With the reset t hresh old in put RE it is possible to lo we r the res et threshold pin RE is connected to pin Q vi a a voltage divider, for example, the re set condition is reached when this voltage is decreased below the switching threshold
, the reset returns to high. By
dT
V
V
of 1.35 V.
re
rt
. If
Another comparator compares the signal of the pin SI, normally fed by a voltage divider from the input voltage, with the reference and gives an early warning on the pin SO. It is also possible to superwise an other voltage e.g. of a second regulator, or to build a watchdog circuit with few external components.
Application Description
C
The input capacitor approx. 1 Ω in series with capacita nce c an be damp ed. Th e out put ca pacit or C
is necessary for compensating line influences. Using a resistor of
I
C
, the oscillating circuit consisting of input inductivity and input
I
is necessary for the stability of the
Q
regulating circuit. Stability is guaranteed at values ≥ 10 µF and an ESR ≤ 10 Ω within the operating temperature rang e. For small tol erances of the rese t delay the s pread of the capacitance of the delay capacitor and its temperature coefficient should be noted.
Semiconductor Group 5 1998-11-01
TLE 4269
D
RE
Ι
Error
20 kΩΩk20
Q
Amplifier
Reference
Current and
Saturation
Control
Trimming
R
Reference
SO
SI
AEB01669
Block Diagram
Semiconductor Group 6 1998-11-01
Absolute Maximum Ratings
T
= – 40 to 150 °C
j
Parameter Symbol Limit Values Unit Notes
min. max.
Input
TLE 4269
Input voltage
Input current
Sense Input
Input voltage Input current
Reset Threshold
Voltage Current
Reset Delay
Voltage
V I
V I
V I
V
I
SI
RE
I
SI
RE
D
40 45 V
internal limited
0.3 45 V
11mA–
0.3 7 V 10 10 mA
0.3 7 V
Current
I
D
internal limited
Ground
Current
I
GND
50 mA
Reset Output
Voltage Current
Semiconductor Group 7 1998-11-01
V I
R
R
0.3 7 V
internal limited
Absolute Maximum Ratings (cont’d)
T
= 40 to 150 °C
j
Parameter Symbol Limit Values Unit Notes
min. max.
Sense Output
TLE 4269
Voltage
Current
5-V Output
Output voltage Output current
Temperature
Junction temperature Storage temperature
Operating Range
Input voltage Junction temperature
V I
V I
T T
V T
SO
Q
SO
Q
j
Stg
I
j
0.3 7 V
internal limited
0.3 7 V
–5 mA
150 °C–
50 150 °C
–45V –
40 150 °C
Thermal Data
Junction-ambient
Semiconductor Group 8 1998-11-01
R
R
thja
thjc
100
200 70 70
–60
60 30 30
K/W K/W K/W K/W
K/W K/W K/W K/W
P-DIP-8-4 P-DSO-8-1 P-DSO-14-4 P-DSO-20-6
P-DIP-8-4 P-DSO-8-1 P-DSO-14-4 P-DSO-20-6
TLE 4269
Characteristics
V
=13.5V; Tj= – 40 °C<Tj< 125 °C
I
Parameter Symbol Limit Values Unit Measuring
Condition
min. typ. max.
Output voltage
Current limit
Current consumption;
I
= I
I
q
I
Q
Current consumption;
I
= I
I
q
I
Q
Current consumption;
I
= I
I
q
I
Q
Drop voltage
V
I I
I
I
V
Q
q
q
q
Load regulation V
Line regulation
V
Reset Generator
Q
4.90 5.00 5.10 V 1 mA IQ≤ 100 mA
V
6V
16 V
I
150 200 500 mA
150 300 µA IQ≤ 1mA,Tj<85°C
250 700 µA IQ=10mA
–28 mAIQ=50mA
dr
Q
Q
–0.250.5VIQ= 100 mA –1030mVIQ= 5 mA to 100 mA –1040mVVI= 6 V to 26 V
I
=1mA
Q
1)
Switching threshold
V
rt
4.50 4.60 4.80 V – Reset pull up 10 20 40 k Reset low voltage Delay switching
V V
R
dt
–0.10.4VR
1.4 1.8 2.2 V
intern
threshold Switching threshold Reset delay low voltage Charge current I
1)
Drop voltage = VI– VQ (measured when the output voltage has dropped 100 mV from the
nominal value obtained at 13.5 V input.)
Semiconductor Group 9 1998-11-01
V V
st
D
d
0.3 0.45 0.60 V
–0.1VVQ< V
RT
3.0 6.5 9.5 µA VD=1V
TLE 4269
Characteristics (cont’d)
V
= 13.5 V; Tj= 40 °C<Tj< 125 °C
I
Parameter Symbol Limit Values Unit Measuring
Condition
min. typ. max.
Delay time L → H
Delay time H → L Switching voltage
t t V
d
t
re
17 28 –msCD=100nF
–1– µs CD=100nF
1.26 1.35 1.44 V VQ>3.5V
Input Voltage Sense
Sense threshold high Sense threshold low Sense output
V
si, high
V
si, low
V
SO, low
1.24 1.31 1.38 V
1.16 1.20 1.28 V
–0.10.4VVSI<1.20V;
low voltage
Sense pull up 10 20 40 k Sense input current
I
SI
– 10.11 µA
V R
i intern
>3V
Semiconductor Group 10 1998-11-01
TLE 4269
Ι
Ι
C
1000 Fµ
V
Ι Q
Ι
470 nF
1
Ι
ΙS
23
4567
V
SΙ
C
D
100 nF
Measuring Circuit (P-DIP-8-4/P-DSO-8-1)
V
Ι
TLE 4269
Ι
Ι
D
GND
V
D
Ι
Q
8
C
Q
22 Fµ
Ι
RE
V
V
R
SO
V
RE
V
AES01670
t
<
V
RT
V
Q
V
D
t
d
V
RO
Power-on-Reset Voltage Dip Secondary Overload
Thermal Shutdown
t
RR
Undervoltage
at Input
Reset Timing Diagram
RR
Ι
V
d
d
=
dt
C
D
at OutputSpike
V
DT
V
ST
AED01542
Semiconductor Group 11 1998-11-01
Sense Input Voltage
V
SI, High
V
SI, Low
Sense Output
TLE 4269
t
High
Low
Sence Timing Diagram
t
AED02559
Semiconductor Group 12 1998-11-01
TLE 4269
Charge Current Id versus
T
Temperature
16
Aµ
Ι
d
14
12
10
8
6
4
2
0
-40
j
V
= 13.5 V
Ι
1.0 V=
V
C
04080120 C 160
AED01803
T
j
Switching Voltage V
T
Temperature
j
3.2 V
V
D
2.8
2.4
2.0
1.6
1.2
0.8
0.4
0
-40
04080120 C 160
and V
dt
V
= 13.5 V
Ι
V
dt
V
st
versus
st
AED01804
T
j
Drop Voltage
V
Output Current
500
V
dr
mV
400
300
T
200
100
0
0
30 60 90 120 180mA
versus
dr
I
Q
j
T
C125=
=25C
j
AED01805
Ι
Q
Reset Switching Threshold versus Temperature Tj
1.7 V
V
re
1.6
1.5
1.4
1.3
1.2
1.1
1.0
0.9
-40
04080120 C 160
V
re
AED01806
T
j
Semiconductor Group 13 1998-11-01
TLE 4269
Current Consumption IQ versus
V
Input Voltage
30
Ι
q
mA
25
20
15
10
5
0
0
I
33=
R
L
R
=50
L
100=
R
L
= 200
R
L
10 20 30 40
AED01807
V50
V
Ι
Output Voltage Input Voltage
12
V
Q
V
10
8
6
4
2
0
0
V
246
V
versus
Q
I
R
=50
L
AED01808
8 V10
V
Ι
Sense Threshold
V
si
versus Temperature Tj
1.6
V
si
V
V
= 13.5 V
1.5
1.4
1.3
1.2
1.1
1.0
-40 04080120 C 160
Ι
Sense Output High
Sense Output Low
AED01809
T
j
Output Voltage Temperature
5.2
V
Q
V
5.1
5.0
4.9
4.8
4.7
4.6
-40
T
04080
V
j
Q
versus
V
= 13.5 V
Ι
AED01671
120 C 160
T
j
Semiconductor Group 14 1998-11-01
TLE 4269
Output Current IQ versus
V
Input Voltage
350
Ι
mA
Q
300
250
200
150
100
50
0
0
I
=25C
T
j
T
10 20 30
C125=
j
AED01810
40 V50
V
Ι
Current Consumption
I
Output Current
12
Ι
q
mA
10
8
6
4
2
0
0
20 40 60 80 120mA
Q
V T
13.5 V=
Ι
=25 C
j
I
versus
q
AED01811
Ι
Q
Current Consumption
I
10
Q
13.5 V=
V
Ι
=25 C
T
j
20 30 40 50
Output Current
1.6
mA
Ι
q
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
0
I
versus
q
AED01812
mA
Ι
Q
Semiconductor Group 15 1998-11-01
Package Outlines
P-DIP-8-4
(Plastic Dual In-line)
TLE 4269
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
GPD05583
Dimensions in mm
Semiconductor Group 16 1998-11-01
P-DSO-14-4 (SMD)
(Plastic Dual Small Outline)
-0.1
0.2
-0.2
1.45
4
-0.2
1.75 max
TLE 4269
0.35 x 45˚
1)
+0.06
0.19
0.35
1.27
+0.15
2)
0.1
0.2 14x
±0.2
6
0.4
+0.8
8˚ max.
14 8
17
8.75
-0.2
1)
Index Marking
1) Does not include plastic or metal protrusion of 0.15 max. per side
2) Does not include dambar protrusion of 0.05 max. per side
GPS05093
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
Dimensions in mm
SMD = Surface Mounted Device
Semiconductor Group 17 1998-11-01
P-DSO-8-1 (SMD)
(Plastic Dual Small Outline)
TLE 4269
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
SMD = Surface Mounted Device
GPS05121
Dimensions in mm
Semiconductor Group 18 1998-11-01
P-DSO-20-6 (SMD)
(Plastic Dual Small Outline)
1.27
+0.15
0.35
2)
0.2 24x 1120
-0.1
0.2
-0.2
2.45
0.1
7.6
2.65 max
10.3
0.35 x 45˚
1)
-0.2
+0.8
0.4
±0.3
+0.09
0.23
TLE 4269
8˚ max
GPS05094
110
12.8
-0.2
1)
Index Marking
1) Does not include plastic or metal protrusions of 0.15 max per side
2) Does not include dambar protrusion of 0.05 max per side
Sorts of Packing
Package outlines for tubes, trays etc. are contained in our
Data Book “Package Information”
Dimensions in mm
SMD = Surface Mounted Device
Semiconductor Group 19 1998-11-01
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