NPN Silicon AF Transistor BCP 68
● For general AF application
● High collector current
● High current gain
● Low collector-emitter saturation voltage
● Complementary type: BCP 69 (PNP)
Type Ordering Code
Marking
(tape and reel)
BCP 68
BCP 68-10
BCP 68-16
BCP 68-25
BCP 68
BCP 68-10
BCP 68-16
BCP 68-25
Q62702-C2126
Q62702-C2127
Q62702-C2128
Q62702-C2129
Pin Configuration
1 2 3 4
B C E C
Package
SOT-223
Maximum Ratings
Parameter Symbol Values Unit
Collector-emitter voltage V
CE0
VCES
20
25
V
Collector-base voltage VCB0 25
Emitter-base voltage V
Collector current I
EB0 5
C 1A
Peak collector current ICM 2
Base current I
B 100 mA
1)
Peak base current IBM 200
Total power dissipation, T
S = 124 ˚C
2)
Ptot 1.5 W
Junction temperature Tj 150 ˚C
Storage temperature range T
stg – 65 … + 150
Thermal Resistance
Junction - ambient
2)
Rth JA ≤ 72 K/W
Junction - soldering point Rth JS ≤ 17
1)
For detailed information see chapter Package Outlines.
2)
Package mounted on epoxy pcb 40 mm × 40 mm × 1.5 mm/6 cm2 Cu.
Semiconductor Group 1
01.97
Electrical Characteristics
A = 25 ˚C, unless otherwise specified.
at T
DC characteristics
BCP 68
UnitValuesParameter Symbol
min. typ. max.
V
(BR)CE0 20 – –
C = 30 mA, IB = 0
Collector-emitter breakdown voltage
C = 10 µA, VBE = 0
Collector-base breakdown voltage
C = 10 µA, IB = 0
Emitter-base breakdown voltage
E = 10 µA, IB = 0
Collector-base cutoff current
CB = 25 V
V
CB = 25 V, TA = 150 ˚C
V
EB = 5 V, IC = 0
V
DC current gain
C = 5 mA, VCE = 10 V
C = 500 mA, VCE = 1 V BCP 68
1)
BCP 68-10
BCP 68-16
BCP 68-25
C = 1 A, VCE = 1 V
Collector-emitter saturation voltage
C = 1 A, IB = 100 mA
Base-emitter voltage
C = 5 mA, VCE = 10 V
C = 1 A, VCE = 1 V
1)
1)
V
(BR)CES 25 – –
V
(BR)CB0 25 – –
V
(BR)EB0 5––
CB0
I
–
–
I
EB0 – – 100
FE
h
50
85
85
100
160
60
CEsat – – 0.5
V
V
BE
–
–
–
–
–
–
100
160
250
–
0.6
–
100
100
–
375
160
250
375
–
–
1
VCollector-emitter breakdown voltage
nA
µA
nAEmitter-base cutoff current
–
V
AC characteristics
C = 100 mA, VCE = 5 V, f = 100 MHz
f
T – 100 –
MHzTransition frequency
1)
Pulse test conditions: t ≤ 300 µs, D = 2 %.
Semiconductor Group 2